CN116027159B - Optocoupler voltage-resistant quality control method and optocoupler voltage-resistant test circuit - Google Patents
Optocoupler voltage-resistant quality control method and optocoupler voltage-resistant test circuit Download PDFInfo
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Abstract
The application relates to an optocoupler voltage-withstanding quality control method and an optocoupler voltage-withstanding test circuit, wherein an optocoupler U1 to be tested is selected to be placed at a designated position, a trigger pulse source is connected to an output side of the optocoupler U1 by a switch K1, test voltage input is gradually improved at an output end of the optocoupler U1, a first test voltage pulse is input at each stage of voltage input, and standard test voltage is input after time delay; and when the first test voltage is input, analyzing the electrical index of the output side of the optical coupler U1, if the index data of the output side of the optical coupler U1 is normal, continuously executing the input of the standard test voltage, otherwise, interrupting the test, taking the value of the first test voltage, and taking the value as the voltage value as the withstand voltage value of the optical coupler U1. By the adoption of the scheme, the withstand voltage value of each optocoupler can be accurately measured, the optocouplers are not damaged, and the requirements of experimental products with different precision can be met.
Description
Technical Field
The application belongs to the technical field of optocoupler testing, and relates to an optocoupler voltage-withstanding quality control method and an optocoupler voltage-withstanding testing circuit.
Background
The optocoupler has the isolation function, the output end of the optocoupler is an optical effect tube, the light-emitting diode at the input side of the optocoupler can change the light-emitting brightness according to the intensity of input current, so that the electrical property of the optical effect tube is changed, the optical signal is converted into an electric signal, the inside of the optocoupler is transferred into the optical signal, the isolation of the electric signal can be realized, and the function of protecting a later-stage circuit is achieved.
The voltage withstand value of the optocoupler device is one of indexes of the optocoupler, when the input is cut off, the external voltage intensity which can be born by the optoeffect tube in the optocoupler is tested, when the voltage withstand value is large, the voltage withstand value has stronger anti-interference capability on noise or abrupt pulse, and although each optocoupler has certain control and estimation on voltage withstand before production or film running, even the optocoupler electrical indexes produced in batches still have slight differences due to factors such as technology, raw materials and the like. In some laboratories, the index of the optocoupler needs to be refined to reduce the disturbance of variable instability or error, and the detailed index of each device needs to be counted when the film is taken.
The voltage withstand test method commonly used for the optocoupler comprises continuous measurement or gradient measurement, because the voltage withstand is the maximum voltage value which can be born by the device, voltage withstand detection of the specific device is often destructive, voltage is gradually and incrementally applied to the device, when the device is damaged, namely, the closing characteristic does not exist, the voltage value is taken as the voltage withstand of the device to be tested, and because the voltage withstand test method is destructive, a sampling investigation method is often adopted, the voltage withstand index of the specific optocoupler is difficult to determine, and the uncontrollable error amount of an experimental circuit is increased.
Disclosure of Invention
The application provides an optocoupler voltage-withstanding quality control method and an optocoupler voltage-withstanding test circuit, and by applying the scheme, the voltage-withstanding value of each optocoupler can be accurately measured, the optocouplers are not damaged, and the requirements of experimental products with different accuracies can be met.
The technical scheme of the application is as follows:
an optocoupler voltage-resistant quality control method selects an optocoupler U1 to be tested to be placed at a designated position, switches on a switch K1 to access a trigger pulse source to the output side of the optocoupler U1,
the output end of the optical coupler U1 is gradually increased in test voltage input, a first test voltage pulse is input into each stage of voltage input, and after time delay, a standard test voltage is input;
and when the first test voltage is input, analyzing the electrical index of the output side of the optical coupler U1, if the index data of the output side of the optical coupler U1 is normal, continuously executing the input of the standard test voltage, otherwise, interrupting the test, taking the value of the first test voltage, and taking the value as the voltage value as the withstand voltage value of the optical coupler U1.
The voltage withstand test circuit of the optocoupler comprises a test voltage generation module, wherein the output end of the test voltage generation module is connected with the positive electrode of the output side of the optocoupler U1 to be tested, a current amount trigger protection module is connected in series between the output end of the test voltage generation module and the power ground, and the input end of the current amount trigger protection module is connected with the negative electrode of the output side of the optocoupler U1.
The working principle and the beneficial effects of the application are as follows:
according to the comparison of the gradient withstand voltage detection method and the continuous detection method, the continuous detection needs uninterrupted linear boosting, the gradient withstand voltage detection method needs to take the point of the voltage value to apply constant voltage, although the continuous detection can detect the voltage value of each point in the form of analog quantity, the burning of the photoelectric tube of the optical coupler still needs a time difference at the actual withstand voltage value, the voltage value still continuously rises in the time difference, the measured withstand voltage value is higher than the actual value, when the gradient points taken in the gradient detection are denser, the gradient detection accuracy is higher and the continuous detection is carried out, the gradient withstand voltage detection method of the optical coupler is optimized, wherein the first test voltage pulse is a pulse with very short duration, the avalanche breakdown of the device can be caused due to the change of a strong electric field, the weaker avalanche breakdown can not evolve into thermal breakdown, the avalanche breakdown has the applicability, the subsequent use of the device cannot be influenced, for example, a voltage stabilizing tube utilizes the principle of avalanche breakdown, because the light effect tube does not need the characteristic of avalanche breakdown, an avalanche breakdown voltage point can be used as a reference quantity of a voltage withstand critical value, when the voltage stabilizing tube is higher than the voltage withstand critical value, the voltage couple can face the risk of thermal breakdown, the method can accurately obtain the avalanche critical voltage, according to the characteristic of avalanche breakdown, the current flowing through the device can be suddenly changed and increased, and then the current is fed back to a front-end voltage supply or a total controller according to the current change, the power supply is stopped, if the output end of the light couple is not influenced by the pulse light of the first test voltage, the voltage value equal to the first test voltage pulse is continuously applied, the method can greatly reduce the damage rate of the test, realize the accurate test of each light couple, and the instant critical avalanche breakdown cannot damage the light couple, therefore, the method can accurately obtain the pressure resistance value of the device, and classify the quality of the product according to the specific pressure resistance interval as the quality index for distinguishing the product.
After a power supply is turned on, the voltage generation module firstly provides a pulse voltage with extremely short wavelength for the to-be-tested, at the moment, voltage sampling is needed to be carried out on the positive electrode of the output end of the to-be-tested optocoupler, meanwhile, current sampling is carried out on the negative electrode of the output end of the optocoupler, if the applied voltage value breaks down the optocoupler, the current quantity triggering protection module is activated, the command system stops powering off the optocoupler, and when the value is normal, the voltage quantity command continues to apply voltage to the optocoupler.
Drawings
The application will be described in further detail with reference to the drawings and the detailed description.
FIG. 1 is a flow chart of a quality control method in the present application;
FIG. 2 is a schematic circuit diagram of an optocoupler voltage withstand test circuit according to the present application;
FIG. 3 is a schematic circuit diagram of a latch switch according to the present application;
FIG. 4 is a schematic circuit diagram of a trigger pulse source according to the present application;
fig. 5 is a variation of the input process of fig. 4.
Detailed Description
The technical solutions of the embodiments of the present application will be clearly and completely described below in conjunction with the embodiments of the present application, and it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
As shown in figure 1 of the specification, in the optocoupler voltage-resistant quality control method, an optocoupler U1 to be tested is selected to be placed at a designated position, a switch K1 is turned on to access test pulses to the output side of the optocoupler U1,
and when the voltage withstand test is carried out by increasing the input voltage value step by step, the first test voltage pulse is used as a primary test, and the avalanche breakdown of the optocoupler U1 is triggered to serve as an index to judge the withstand voltage value which the optocoupler U1 can bear.
When a first test voltage is input, analyzing an electrical index of the output side of the optical coupler U1, if index data of the output side of the optical coupler U1 are normal, continuing to input a standard test voltage, otherwise, interrupting the test, taking the value of the first test voltage as a voltage value of the optical coupler U1, and taking the voltage value as a trigger signal for triggering a subsequent method when the test condition is normal, and driving the standard test voltage to be input; when the test condition is abnormal, the current quantity is taken as a flow cut-off trigger signal, the process is terminated, and a test result is obtained. And the control of the first test voltage value is realized by controlling the charging time length of the trigger pulse source.
According to the application, a certain amount, such as 10%, of the voltage withstand value is regulated according to calculation, the specific value is selected according to an actual process and a simulation result, the test voltage generating module is charged and discharged according to a trigger pulse given by a starting pulse source, and the longer the charging time is, the higher the output voltage is, so that the specific value of the test voltage can be controlled according to the regulation of the charging time, when the optocoupler U1 is normally applied with the test voltage, the optocoupler U1 is in an cut-off state, and the positive electrode of the output side of the optocoupler U1 is basically equal to the test voltage, so that the test voltage is used as an excitation signal of the standard test voltage, and the signal is triggered at a high level; when the optical coupler U1 is subjected to avalanche breakdown, according to the characteristic of avalanche breakdown, intrinsic electrons in a photoelectric tube in the output side of the optical coupler U1 are excited and mutually collide to form a large number of free electron-hole pairs, and the electron-hole pairs continuously excite surrounding atoms, so that the free electron-hole pairs capable of conducting are continuously increased, and the photoelectric tube is changed into a conductor from a semiconductor; therefore, the voltage source is equivalent to being short-circuited, and the current at the output side of the optocoupler is rapidly increased, and the current change is substantially increased at right angles to the time axis during avalanche breakdown, so that the current flowing through the output side of the optocoupler is instantaneously increased; triggering the experiment to stop by the index; when the current is instantaneously increased, the current control device is adopted to realize the closing of the power supply, such as a bidirectional thyristor, a switching tube and the like.
The method can analyze the voltage and current sampling results of each node in the circuit based on a hardware system application computer or a singlechip and the like.
As shown in fig. 2 of the specification, the optocoupler withstand voltage test circuit comprises a test voltage generation module, wherein the output end of the test voltage generation module is connected with the positive electrode of the output side of the optocoupler U1 to be tested, a current amount trigger protection module is connected in series between the output end of the test voltage generation module and the power ground, and the input end of the current amount trigger protection module is connected with the negative electrode of the output side of the optocoupler U1.
In the circuit, a test voltage generating module generates controllable spike pulse and inputs the spike pulse to an optocoupler to provide a primary test voltage for the optocoupler, and a secondary test voltage can also be provided through debugging;
the current quantity triggering protection module is used for taking the current value flowing through the output side of the optocoupler U1, the current quantity triggering protection module is current triggering, and when the module detects the current surge, the fact that the photoelectric tube in the optocoupler is subjected to avalanche breakdown is indicated, so that the voltage input of the optocoupler is isolated.
And a trigger pulse source is matched with the test voltage generation module to provide charge and discharge instructions for the test voltage generation module.
The test voltage generation module comprises an inductor L1, a MOS tube Q6, a diode D1 and an electrolytic capacitor C1, wherein the inductor L1 is connected in series between a voltage source VCC1 and a drain electrode of the switching tube D1, a source electrode of the switching tube D1 is grounded, an anode of the electrolytic capacitor D1 is connected with the drain electrode of the MOS tube Q6, a grid electrode of the MOS tube Q6 is externally connected with a trigger voltage, a cathode of the diode D1 is connected with an anode of the electrolytic capacitor, a cathode of the electrolytic capacitor is grounded, and a connection point between the cathode of the diode D1 and the anode of the electrolytic capacitor C1 is used as an output end of the test voltage generation module.
The device further comprises a diode D4 and a capacitor C4 which are connected in series, wherein the anode of the diode D4 is connected with the same power supply VCC1 of the test voltage generation module, the diode D4 and the capacitor C4 are used for filtering, the unidirectional conductivity of the diode D4 and the characteristics of the capacitor C4 that the capacitor C4 is in a pass-through and direct-blocking mode are applied, and the switch KEY1 is used as a power switch of the device.
In the circuit, when Vcon is 0, the MOS transistor Q1 is cut off, at this moment, the generated current of VCC1 is output to the optocoupler through the diode D4, the resistor R2, the inductor L1 and the diode D1, at this moment, the output voltage is the voltage value at the tail end of the resistor R2, when Q1 is conducted, the current passes through the inductor L1 and then flows through the MOS transistor Q1 to the power ground, because the MOS transistor Q1 is conducted, at this moment, the resistance of Q1 is very small, the current in the inductor L1 is slowly increased, the current is stored, at this moment, the charging process is carried out, when Q1 is cut off, the current of L1 cannot be suddenly changed, an inductance voltage is generated, at this moment, the voltage value output by the test voltage generating module is the superposed value of the inductance voltage and the original pressurization, and the intensity of the inductance voltage can be changed along with the charging time, namely the pulse width of Vcon.
In fig. 2, diodes D2 and D3 and voltage source VCC2 form a clamping circuit, and when the voltage value at the series point of diodes D2 and D3 is greater than the difference between the on voltages of VCC2 and D2, the potential at that point straightens the difference; when the potential of the point is smaller than the difference value of the reference point and the D3 conduction voltage, the reference point charges the series point, so that the test voltage generation module is clamped, and the stability of output is ensured.
The ground to which the diode D3 is connected is also understood to be a voltage value smaller than VCC2 with respect to the voltage source VCC2, and the on-voltage drop of the diode D2 may be aV, and the on-voltage drop of the diode D3 may be bV, so that the clamping module may control the output of the test voltage generating module to be (GND-b, VCC 2-a), and the setting of VCC2 and GND depends on the specific situation of the optocoupler, since the test voltage will raise the voltage through the inductor, and output a higher voltage pulse, which is relatively unstable, the output voltage should be limited by the clamping module, which may play a role in testing more stably.
As shown in fig. 2 of the specification, the current amount trigger protection module includes a silicon controlled rectifier Q7, where the silicon controlled rectifier Q7 is connected in series between the output end of the test voltage generating circuit and the power ground, and the controlled end of the silicon controlled rectifier Q7 is used as the input end of the current amount trigger protection module. The controlled end of the bidirectional thyristor is controlled by current, under normal conditions, in the cut-off state of the photoelectric tube, voltage is shared at the 4 pins of the optocoupler U1, almost no current flows through the optocoupler U1, when the optocoupler U1 is broken down by voltage, large current is generated, the thyristor Q7 is conducted, and as the thyristor Q7 is connected between the 4 pins of the optocoupler U1 and the power ground, the voltage value born by the optocoupler U1 can be directly pulled down by the thyristor Q7, wherein the resistor R5 and the resistor R1 play roles of protecting a circuit and dividing voltage. The controllable silicon Q7 is also connected with a safety F1 as protection, meanwhile, the 3 pin of the optocoupler U1 is also led out of the interface I2, and can be used for connecting an additional current sampling circuit, the current sampling circuit can convert a current signal into a voltage signal through a voltage dividing resistor, the converted voltage information is conditioned into a voltage value applicable to a controllable computer or a singlechip according to an amplifying module, the voltage value is transmitted to a controller for analysis, and an external controller can be used for intervening in the outage condition of the total voltage.
As shown in fig. 3 of the specification, the circuit further comprises a latch switch, the latch switch is arranged on the input side of the optocoupler U1, the latch switch is further connected with a standard voltage generation module, the latch switch comprises a relay K2, a controllable silicon Q12 and a delay module, a switch pin of the relay K2 is used as the input end of the latch switch, a normally closed pin of the relay K2 is connected with the controlled end of the controllable silicon Q12, the controllable silicon Q12 and the coil side of the relay K2 are connected in series between a voltage source VCC and a power ground, and a normally open pin of the relay K2 is connected with the standard voltage generation module through the delay module.
Fig. 3 is a schematic diagram of a latch switch portion, wherein 4 pins of an optocoupler U1 are connected, that is, a positive input end of an output side is connected with the latch switch, other portions are omitted in fig. 3, when the latch switch is in operation, when no voltage is provided by a test voltage generating module, a switch point in the latch switch is connected with a normally closed point, but no current passes through, a thyristor Q12 is cut off, no current is provided at a coil side, when the test voltage generating module releases a first test voltage pulse, if avalanche breakdown does not occur in the optocoupler U1, the 4 pins of the optocoupler U1 are at a high potential, at this time, current passes through the pins 2 and 4 pins, the thyristor Q12 is turned on, a coil side of a relay K2 is electrified, the 2 pins are instantly connected with a normally open point, at this time, voltage is supplied to a delay module, after the delay module receives a potential signal, the delay is transmitted to a standard voltage generating module, the standard voltage generating module can be realized through a step-up voltage reducing circuit, the current circuit is applied, the voltage signal transmitted by the delay module is used as a light emitting switch signal of the standard voltage generating module, when the test voltage generating module detects that the first test voltage pulse, the standard voltage generating module is in a stable voltage, the test voltage generating module is powered on the voltage generating module, and the high voltage is in a stable position, the voltage is required to be a stable, and the test voltage is input to the high voltage generating module, and the voltage is stable, and the voltage 1 is in accordance with the test voltage, the test voltage 1. The controller can be externally connected to perform macro management on the standard voltage generation module, and when the controller calculates that the collected optocoupler U1 generates the surge current, the controller commands the standard voltage generation module to close the voltage output.
As shown in fig. 4, the device further includes a trigger pulse source, the trigger pulse source is used as a control input of the test voltage generating module, the trigger pulse source input V1 is externally connected with a controller, the trigger pulse source includes a phase adjusting unit and a logic unit, the phase adjusting unit adjusts the V1 voltage signal of the same input into two voltage signals with different phases and outputs the two voltage signals to the logic unit, the logic unit calculates the two input signals, an input end of the logic unit is connected with an output end of the phase adjusting unit, and an output end of the logic unit is used as an output end Vcon of the trigger pulse source.
In this embodiment, the logic unit includes NMOS transistors Q3, Q4, Q19, Q20, and Q22, the gates of the NMOS transistors Q1, Q2, Q21, Q15, and Q16 are different from the input V1, the gates of the NMOS transistors Q3, Q19 and the PMOS transistors Q2, Q15 are connected to each other, the gates of the NMOS transistors Q4, Q20 and the PMOS transistors Q1, Q16 are connected to each other, the drain of the NMOS transistor Q3 is connected to a voltage source VCC, the source of the NMOS transistor Q3 is connected to the drain of the NMOS transistor Q4, the source of the NMOS transistor Q4 is connected to the ground after passing through the PMOS transistors Q1 and Q2 connected in parallel, the source of the NMOS transistor Q4 is further connected to the gate of the NMOS transistor Q21 and the NMOS transistor 22, the NMOS transistors Q19 and Q20 are connected in parallel between the voltage source VCC and the drain of the NMOS transistor Q22, the source of the NMOS transistor Q22 is connected to the source of the PMOS transistor Q21 and the drain of the PMOS transistor Q22 is connected to the drain of the PMOS transistor Q21, and the source of the NMOS transistor Q22 is connected to the drain of the PMOS transistor Q21 is connected to the source of the PMOS transistor Q22, and the source of the NMOS transistor is connected to the drain of the PMOS transistor is connected to the source of the PMOS transistor Q21.
The V1 is connected with the controller to receive a high-potential digital signal, and because the conduction potential required by the primary test voltage generating module is very small and an accurate pulse value which is convenient to control is not easy to generate, the trigger pulse source is used for generating, the same waveforms are respectively subjected to different resistance values RP1 and RP2 by utilizing the difference of resistance values RP1 and RP2, the influence on the input of the logic unit is different, the logic unit conditions the signal according to the phase difference, and the ideal signal is output.
If the resistances of the varistors RP1 and RP2 are equal, the voltages of the gates of the input NMOS transistors Q3 and Q4 are synchronous inputs, and the delay is larger by adjusting the resistances of the RP1 and RP2 to be larger. As shown in figure 5 of the specification, after a high potential signal is input, the V1 is conditioned by two parts in the figure, one group is a plurality of varistors connected in parallel, the number and the resistance of the varistors can be selected by a tester according to actual conditions, and the group is a resistor and a diode connected in parallel, so that the effect on a logic unit at the later stage is faster, namely the phase is forward, and the phase conditioning function is realized due to the strong conduction performance of the diode.
The foregoing description of the preferred embodiments of the application is not intended to be limiting, but rather is intended to cover all modifications, equivalents, alternatives, and improvements that fall within the spirit and scope of the application.
Claims (5)
1. An optocoupler voltage-resistant quality control method is characterized in that an optocoupler U1 to be tested is selected to be placed at a designated position, a switch K1 is turned on to access a trigger pulse source to the output side of the optocoupler U1,
the output end of the optical coupler U1 is gradually increased in test voltage input, a first test voltage pulse is input into each stage of voltage input, and after time delay, a standard test voltage is input;
when a first test voltage is input, analyzing the electrical index of the output side of the optical coupler U1, if the index data of the output side of the optical coupler U1 is normal, continuing to input the standard test voltage, otherwise, interrupting the test, taking the value of the first test voltage input currently and taking the value as the voltage value as the withstand voltage value of the optical coupler U1,
when voltage is applied to the output side of the optocoupler U1, the detected electrical index is the voltage amount of the current input point of the output side of the optocoupler U1 and the current amount of the current output point of the output side of the optocoupler U1,
when the input voltage value is increased step by step to perform withstand voltage test, the first test voltage pulse is used as a preliminary test, and the withstand voltage value which can be born by the optocoupler U1 is judged by triggering avalanche breakdown of the optocoupler U1 as an index.
2. The method for controlling an optocoupler voltage according to claim 1, wherein when the test condition is normal, the voltage is taken as a trigger signal for triggering a subsequent method to drive a standard test voltage input; when the test condition is abnormal, the current quantity is taken as a flow cut-off trigger signal, the process is terminated, and a test result is obtained.
3. The method for controlling the optocoupler voltage according to claim 1, wherein the control of the first test voltage value is achieved by controlling the charging duration of the trigger pulse source.
4. The optocoupler withstand voltage test circuit is characterized by comprising a test voltage generation module, wherein the output end of the test voltage generation module is connected with the positive electrode of the output side of the optocoupler U1 to be tested, a current amount trigger protection module is connected in series between the output end of the test voltage generation module and the power ground, the input end of the current amount trigger protection module is connected with the negative electrode of the output side of the optocoupler U1,
the test voltage generation module comprises an inductor L1, an MOS tube Q6, a diode D1 and an electrolytic capacitor C1, wherein the inductor L1 is connected in series between a voltage source VCC1 and a drain electrode of the MOS tube Q6, a source electrode of the MOS tube Q6 is grounded, an anode of the electrolytic capacitor C1 is connected with the drain electrode of the MOS tube Q6, a grid electrode of the MOS tube Q6 is externally connected with a trigger voltage, a cathode of the diode D1 is connected with an anode of the electrolytic capacitor, a cathode of the electrolytic capacitor is grounded, and a connection point between the cathode of the diode D1 and the anode of the electrolytic capacitor C1 is used as an output end of the test voltage generation module;
the current amount triggering protection module comprises a silicon controlled rectifier Q7, wherein the silicon controlled rectifier Q7 is connected in series between the output end of the test voltage generation circuit and the power ground, and the controlled end of the silicon controlled rectifier Q7 is used as the input end of the current amount triggering protection module;
the trigger pulse source is used as a control input of the test voltage generation module, the trigger pulse source input V1 is externally connected with a controller, the trigger pulse source comprises a phase adjustment unit and a logic unit, the same input V1 voltage signal of the phase adjustment unit is adjusted into two paths of voltage signals with different phases, the two paths of voltage signals are output to the logic unit, the logic unit calculates the two paths of input signals, the input end of the logic unit is connected with the output end of the phase adjustment unit, and the output end of the logic unit is used as the output end Vcon of the trigger pulse source.
5. The optocoupler withstand voltage test circuit according to claim 4, further comprising a latch switch, wherein the latch switch is arranged on an input side of the optocoupler U1, the latch switch is further connected with a standard voltage generation module, the latch switch comprises a relay K2, a silicon controlled rectifier Q12 and a delay module, a switch pin of the relay K2 is used as an input end of the latch switch, a normally closed pin of the relay K2 is connected with a controlled end of the silicon controlled rectifier Q12, the silicon controlled rectifier Q12 and a coil side of the relay K2 are connected in series between a voltage source VCC and a power supply ground, and a normally open pin of the relay K2 is connected with the standard voltage generation module through the delay module.
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