CN115931309A - High-low temperature lens transfer function and window transmittance testing optical system - Google Patents
High-low temperature lens transfer function and window transmittance testing optical system Download PDFInfo
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Abstract
The invention discloses an optical system for testing a transfer function and a window transmittance of a high and low temperature lens, which relates to the field of optical systems for measuring the transfer function and the transmittance, wherein a lens to be tested is placed in a incubator to realize the test of the optical transfer function in a temperature range of-40 ℃ to +70 ℃, a visible light image analyzer adopts a broad spectrum flat field apochromatism microscope, and an infrared image analyzer adopts a secondary imaging infrared relay lens; and the optical system of the visible light and infrared image analyzer outside the exit window of the high and low temperature box is replaced by a visible light integrating sphere and a visible light relay optical system or an infrared integrating sphere and an infrared image analyzer optical system to realize the measurement of the high and low temperature transmittance of the measured window at the temperature of between 40 ℃ below zero and 70 ℃. The switching mirror is switched into a light path to refract light emitted by the collimating system into the high-temperature box, and the visible light integrating sphere and the visible light relay optical system or the infrared integrating sphere and the infrared image analyzer optical system are arranged outside the exit window of the high-temperature box, so that the high-temperature transmittance test in the temperature range from +70 ℃ to +400 ℃ of the tested window can be realized.
Description
Technical Field
The invention belongs to the technical field of optical systems for measuring transfer functions and transmittance, and particularly relates to an optical system for testing transfer functions and window transmittance of a high-low temperature lens.
Background
The Modulation Transfer Function (MTF) can quantitatively reflect the comprehensive effect caused by the aperture, the spectral component and the aberration of the optical system, can be directly calculated according to the design result, can be directly measured accurately and objectively, and can effectively carry out comprehensive expression on the quality of the image formed by the optical system, so that the MTF is known as an important index for evaluating the image quality of the modern optical system. When the optical system works in an external severe environment, the change of the environmental temperature causes the change of the refractive index of the material of the optical system and the expansion and contraction of the optics and the structural part, thereby causing the change of the focal length of the system, the displacement (defocusing) of the image plane, the deterioration of the imaging quality and the like. The thermal instability of such optical systems is mainly due to the poor thermal stability of the optical materials, the refractive index of most optical materials varying significantly with temperature. Therefore, the imaging quality of the lens under the high and low temperature conditions is accurately tested, the high and low temperature imaging performance of the lens can be quantitatively evaluated, and the environmental adaptability of the lens can be objectively evaluated.
Under high and low temperature environments (particularly high temperature conditions), the transmission performance of an optical window material of the sensor can be changed to different degrees, so that the imaging quality and the response sensitivity of a system are influenced, and important tactical indexes are reduced. During high-speed missile flight, high-temperature effect is generated due to strong friction. If the missile speed reaches Mach 3, the high altitude temperature reaches 350 ℃ at 10 km. With the rapid rise of the temperature of the head of the missile, the absorption coefficient of an optical window material of a sensor is increased, and the transmittance is attenuated. Therefore, the transmittance of the optical window under the high and low temperature conditions is quantitatively tested to obtain accurate data, and the difference of different optical window materials can be fully measured and compared, so that the most suitable window material is optimized. This is especially important for the new generation of television and infrared sensors applied to missile and laser guidance.
Disclosure of Invention
Aiming at the defects or improvement requirements of the prior art, the invention provides a high-low temperature lens transfer function and window transmittance test optical system which can measure the transfer functions of a visible wave band lens and a medium wave infrared band lens at high and low temperatures and evaluate the imaging quality of the optical system at high and low temperatures; the transmittance of the visible light band window and the medium wave infrared band window at high and low temperatures can be measured, and the transmittance of the window at high and low temperatures can be evaluated.
In order to achieve the above object, the present invention provides an optical system for testing transfer function and window transmittance of a high and low temperature lens, comprising the following components: the device comprises a collimating optical system, a high-low temperature box entrance window, a high-low temperature box exit window, a high-low temperature box body, a visible light image analyzer optical system, an infrared image analyzer optical system, a switching mirror, a turning mirror, a high-temperature box entrance window, a high-temperature box exit window, a high-temperature box body, a visible light integrating sphere, an infrared integrating sphere and a visible light relay optical system;
the collimating optical system is used for collimating a target, simulating an infinite target and providing transmittance light source energy, a light source can directly enter the high-low temperature box body through the high-low temperature box entrance window, or a light path is cut in through the switching mirror, light emitted by the collimating system is turned to the high-temperature box entrance window through the turning mirror and then enters the high-temperature box body through the high-temperature box entrance window;
the high-low temperature box entrance window, the high-low temperature box exit window and the high-low temperature box body form a first closed space, the high-temperature box entrance window, the high-temperature box exit window and the high-low temperature box body form a second closed space, and the first closed space and the second closed space are used for ensuring that the temperatures of the tested lens and the tested window are stabilized at a value to be tested;
the optical system of the visible light image analyzer adopts a wide-spectrum flat-field apochromatic microscope, and the good image quality ensures the testing precision;
the infrared image analyzer optical system adopts a secondary imaging infrared relay lens to lead the detected image point out of the high-low temperature box, and the scanning knife edge is placed on the primary image surface to realize the scanning of the image point outside the exit window of the high-low temperature box;
the visible light relay optical system adopts a primary imaging finite conjugate optical system;
the visible light integrating sphere and the infrared integrating sphere change light emitted by the high-low temperature box and the high-temperature box into Lambertian light sources, and the Lambertian light sources are imaged on a point source detector through the visible light relay optical system and the infrared image analyzer optical system respectively;
the test of transfer functions of visible light wave band and medium wave infrared wave band at high and low temperature and the test of transmittance of optical windows of visible light wave band and medium wave infrared wave band at high and low temperature are completed through the combination of different components.
In some optional embodiments, the collimation system includes a primary mirror and a secondary mirror, the primary mirror is an off-axis parabolic mirror, the secondary mirror is a plane mirror, and light emitted from the light source enters the primary mirror after being reflected by the secondary mirror.
In some optional embodiments, the high-low temperature chamber entrance window, the high-low temperature chamber exit window, the high-temperature chamber entrance window and the high-temperature chamber exit window all use double layers of sapphire materials, so that the temperature change window is not deformed, and an included angle between a sapphire crystal direction and a working surface is less than 1 °.
In some optional embodiments, a vacuum state is provided between the input window and the output window of the high-low temperature chamber, and a vacuum state is provided between the input window and the output window of the high-temperature chamber.
In some alternative embodiments, the measured lens comprises a visible standard mirror optical system and an infrared standard mirror optical system, and the measured window comprises a visible measured window and an infrared measured window.
In some optional embodiments, the test of the transfer function of the visible light standard mirror optical system at high and low temperatures is completed by adopting a collimation system, a high and low temperature box entrance window, a visible light standard mirror optical system, a high and low temperature box exit window and a visible light image analyzer optical system.
In some alternative embodiments, the collimating system, the entrance window of the high and low temperature box, the optical system of the infrared standard mirror, the exit window of the high and low temperature box and the optical system of the infrared image analyzer are used for completing the transfer function test of the optical system of the infrared standard mirror at high and low temperatures.
In some optional embodiments, the transmittance test of the visible light measured window at high and low temperatures is completed by adopting a collimation system, a high and low temperature box entrance window, a visible light measured window, a high and low temperature box exit window, a visible light integrating sphere and a visible light relay optical system.
In some optional embodiments, the infrared measured window transmittance test at high and low temperature is completed by using a collimation system, a high and low temperature box entrance window, an infrared measured window, a high and low temperature box exit window, an infrared integrating sphere and an infrared image analyzer optical system.
In some optional embodiments, the transmittance test of the visible light measured window at high temperature is completed by using a collimating system, a switching mirror, a turning mirror, a high-temperature box entrance window, a visible light measured window, a high-temperature box exit window, a visible light integrating sphere and a visible light relay optical system.
In some optional embodiments, the transmittance test of the infrared window to be tested at high temperature is completed by using a collimating system, a switching mirror, a turning mirror, a high-temperature box entrance window, an infrared window to be tested, a high-temperature box exit window, an infrared integrating sphere and an infrared image analyzer optical system.
In general, compared with the prior art, the above technical solution contemplated by the present invention can achieve the following beneficial effects:
the transfer functions of the visible light wave band and medium wave infrared wave band lens under high and low temperature can be measured, and the imaging quality of the optical system under high and low temperature can be evaluated. The transmittance of the visible light band window and the medium wave infrared band window at high and low temperatures can be measured, and the transmittance of the window at high and low temperatures can be evaluated.
Drawings
FIG. 1 is a schematic diagram of an optical system provided by an embodiment of the present invention;
FIG. 2 is a schematic diagram of a transfer function test of an optical system of a standard visible light mirror provided by an embodiment of the invention at high and low temperatures;
FIG. 3 is a schematic diagram of a transfer function test of an optical system of an infrared standard mirror at high and low temperatures according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a transmittance test of a window under test of visible light at high and low temperatures according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of a transmittance test of an infrared window under high and low temperature conditions according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of a transmittance test of a window under test of visible light at high temperature according to an embodiment of the present invention;
FIG. 7 is a schematic diagram of a transmittance test of an infrared window under high temperature according to an embodiment of the present invention;
FIG. 8 is a visible light image analyzer optical system provided by an embodiment of the present invention;
FIG. 9 is an optical system of an infrared image analyzer according to an embodiment of the present invention;
FIG. 10 is a diagram of a visible light relay optical system provided by an embodiment of the present invention;
FIG. 11 is a visible standard mirror optical system provided by an embodiment of the present invention;
FIG. 12 is an infrared etalon optical system provided by embodiments of the present invention;
in the figure, a secondary mirror 1-1, a primary mirror 1-2, a high-low temperature box entrance window 2-3-1 visible light standard mirror optical system, an infrared standard mirror optical system 3-2, a high-low temperature box exit window 4-5-visible light image analyzer optical system, an infrared image analyzer optical system 6-7-visible light relay optical system, an integrating sphere 8-visible light, an infrared integrating sphere 9-10-switching mirror, an 11-turning mirror, a high-temperature box entrance window 12-13-high-temperature box exit window 14-1 visible light measured window and an infrared measured window 14-2.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. In addition, the technical features involved in the respective embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
In the present examples, "first", "second", etc. are used for distinguishing different objects, and are not used for describing a specific order or sequence.
As shown in fig. 1, an optical system for testing transfer function and window transmittance of a high-low temperature lens according to an embodiment of the present invention includes: the device comprises a collimating optical system, a high and low temperature box entrance window 2, a measured lens, a high and low temperature box exit window 4, a visible light image analyzer optical system 5, an infrared image analyzer optical system 6, a visible light relay optical system 7, a visible light integrating sphere 8, an infrared integrating sphere 9, a switching mirror 10, a turning mirror 11, a high temperature box entrance window 12, a high temperature box exit window 13 and a measured window;
further, the collimating optical system comprises a primary mirror 1-2 and a secondary mirror 1-1, wherein the primary mirror is an off-axis parabolic mirror, the secondary mirror is a plane mirror, and the wave band covers 0.35-14 μm.
Further, high-low temperature case incident window 2, high-low temperature case exit window 4, high temperature case incident window 12, high temperature case exit window 13 all adopt double-deck sapphire material, and the sapphire crystal orientation is less than 1 with the contained angle between the working face, and double-deck warm window and structure component constitute airtight space, are vacuum state between the double-deck warm window.
Further, the measured lens comprises a visible light standard mirror optical system 3-1 and an infrared standard mirror optical system 3-2.
Further, the optical system 5 of the visible light image analyzer adopts a broad spectrum flat field apochromatic microscope, which comprises an objective lens and a tube lens.
Furthermore, the optical system 6 of the infrared image analyzer adopts a secondary imaging infrared relay lens, the image point of the optical system of the infrared standard lens to be detected can be led out of the incubator, and the scanning knife edge is placed on the primary image surface.
Further, the measured windows comprise a visible light measured window 14-1 and an infrared measured window 14-2.
In the embodiment of the invention, a collimating optical system collimates a target, simulates an infinite target and provides transmittance light source energy, a measured lens is placed in a warm box, an optical transfer function test in a temperature range of-40 ℃ to +70 ℃ of the measured lens is realized, a high-low temperature box entrance window, a high-low temperature box exit window and a high-low temperature box body form a first closed space, the temperature of the measured lens and the temperature of the measured window are ensured to be stabilized at a value to be tested, the high-low temperature box entrance window and the high-low temperature box exit window are made of double-layer sapphire materials, the temperature change window is ensured not to be deformed, a visible light image analyzer adopts a wide-spectrum flat-field apochromatism microscope, good image quality ensures test precision, an infrared image analyzer adopts a secondary imaging infrared relay lens, a measured image point can be led out of the warm box, a scanning knife edge is placed on a primary image surface, image point scanning outside the warm box is realized, and the high-low temperature transfer function test is completed; and the high and low temperature transmittance of the window to be measured can be measured by replacing the optical system of the visible light and infrared image analyzer outside the exit window of the high and low temperature box with a visible light integrating sphere and a visible light relay optical system or an infrared integrating sphere and an infrared image analyzer optical system. The switching mirror is switched into a light path to refract light emitted by the collimating system into the high-temperature box, and the visible light integrating sphere and the visible light relay optical system or the infrared integrating sphere and the infrared image analyzer optical system are arranged outside the exit window of the high-temperature box, so that the high-temperature transmittance test of the tested window can be realized.
The optical system adopts a double-layer sapphire optical system, heats a measured lens and a measured window in an incubator to reach the required test temperature, and adopts a collimation system, a high-low temperature chamber entrance window 2, a visible light standard lens optical system 3-1, a high-low temperature chamber exit window 4 and a visible light image analyzer optical system 5 to complete the transfer function test of the visible light standard lens optical system under high and low temperatures as shown in figure 2.
As shown in FIG. 3, the test of the transfer function of the infrared standard mirror optical system under high and low temperature is completed by adopting a collimation system, a high and low temperature box entrance window 2, an infrared standard mirror optical system 3-2, a high and low temperature box exit window 4 and an infrared image analyzer optical system 6.
As shown in fig. 4, the transmittance test of the visible light tested window under high and low temperature is completed by adopting a collimation system, a high and low temperature box entrance window 2, a visible light tested window 14-1, a high and low temperature box exit window 4, a visible light integrating sphere 8 and a visible light relay optical system 7.
As shown in fig. 5, the collimating system, the high and low temperature box entrance window 2, the infrared window to be tested 14-2, the high and low temperature box exit window 4, the infrared integrating sphere 9 and the infrared analyzer optical system 6 are adopted to complete the transmittance test of the infrared window to be tested at high and low temperatures.
As shown in fig. 6, the transmittance test of the visible light measured window at high temperature is completed by using a collimating system, a switching mirror 10, a turning mirror 11, a high-temperature box entrance window 12, a visible light measured window 14-1, a high-temperature box exit window 13, a visible light integrating sphere 8 and a visible light relay optical system 7.
As shown in fig. 7, the transmittance test of the infrared window to be tested at high temperature is completed by using a collimating system, a switching mirror 10, a turning mirror 11, a high-temperature box entrance window 12, an infrared window to be tested 14-2, a high-temperature box exit window 13, an infrared integrating sphere 9 and an infrared image analyzer optical system 6.
Fig. 8 shows an optical system of a visible light image analyzer according to an embodiment of the present invention.
Fig. 9 shows an optical system of an infrared image analyzer according to an embodiment of the present invention.
Fig. 10 shows a visible light relay optical system according to an embodiment of the present invention.
Fig. 11 shows a visible standard mirror optical system according to an embodiment of the present invention.
Fig. 12 shows an infrared standard mirror optical system according to an embodiment of the present invention.
Therefore, the testing capability of the optical system of the invention on the transfer functions of the visible light wave band and the medium wave infrared wave band in the temperature range of-40 ℃ to +70 ℃ is verified; the test capability of the transmittance of the optical window in the visible light wave band and the medium wave infrared wave band in the temperature ranges of-40 to +70 ℃ at high and low temperatures and +70 to +400 ℃ at high temperature.
The invention relates to an optical system for testing transfer functions and window transmittance of a high-low temperature lens, which comprises a collimating optical system, a high-low temperature box incidence window, a tested lens, a high-low temperature box exit window, a visible light image analyzer optical system, an infrared image analyzer optical system, a switching mirror, a turning mirror, a high-temperature box incidence window, a tested window, a high-temperature box exit window, a visible light integrating sphere, an infrared integrating sphere and a visible light relay optical system, wherein the test of the transfer functions in a visible light waveband and a medium wave infrared waveband within a temperature range of-40 ℃ to +70 ℃ can be completed through the combination of different components; and testing the transmittance of the optical window in a visible light wave band and a medium wave infrared wave band within the temperature range of-40 ℃ to +400 ℃.
It should be noted that, according to implementation requirements, each step/component described in the present application can be divided into more steps/components, and two or more steps/components or partial operations of the steps/components can also be combined into a new step/component to achieve the purpose of the present invention.
It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the invention, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. An optical system for testing a transfer function and a window transmittance of a high and low temperature lens is characterized by comprising the following components: the device comprises a collimating optical system, a high-low temperature box entrance window, a high-low temperature box exit window, a high-low temperature box body, a visible light image analyzer optical system, an infrared image analyzer optical system, a switching mirror, a turning mirror, a high-temperature box entrance window, a high-temperature box exit window, a high-temperature box body, a visible light integrating sphere, an infrared integrating sphere and a visible light relay optical system;
the collimating optical system is used for collimating a target, simulating an infinite target and providing energy of a transmittance light source, the light source can directly enter the high-low temperature box body through the high-low temperature box entrance window, or the light path is cut in through the switching mirror, light emitted by the collimating system is converted to the high-temperature box entrance window through the converting mirror, and then enters the high-temperature box body through the high-temperature box entrance window;
the high-low temperature box entrance window, the high-low temperature box exit window and the high-low temperature box body form a first closed space, the high-temperature box entrance window, the high-temperature box exit window and the high-low temperature box body form a second closed space, and the first closed space and the second closed space are used for ensuring that the temperatures of the tested lens and the tested window are stabilized at a value to be tested;
the optical system of the visible light image analyzer adopts a wide-spectrum flat-field apochromatic microscope;
the infrared image analyzer optical system adopts a secondary imaging infrared relay lens to lead the detected image point out of the high-low temperature box, and the scanning knife edge is placed on the primary image surface to realize the scanning of the image point outside the exit window of the high-low temperature box;
the visible light relay optical system adopts a primary imaging finite conjugate optical system;
the visible light integrating sphere and the infrared integrating sphere change light emitted by the high-low temperature box and the high-temperature box into Lambertian light sources, and the Lambertian light sources are imaged on a point source detector through the visible light relay optical system and the infrared image analyzer optical system respectively;
and the transfer functions of the visible light wave band and the medium wave infrared wave band at high and low temperatures and the transmittance of the optical window at the visible light wave band and the medium wave infrared wave band at high and low temperatures are tested by combining different components.
2. The system of claim 1, wherein the input window, the output window, the input window and the output window are made of a double layer of sapphire, and the angle between the sapphire crystal direction and the working surface is less than 1 °.
3. The system of claim 1 or 2, wherein a vacuum state is provided between the high and low temperature chamber entrance window and the high and low temperature chamber exit window, and a vacuum state is provided between the high and low temperature chamber entrance window and the high and low temperature chamber exit window.
4. The system of claim 1, wherein the measured lens comprises a visible light standard mirror optical system and an infrared standard mirror optical system, and the measured window comprises a visible light measured window and an infrared measured window.
5. The system of claim 4, wherein the test of the transfer function of the visible light standard mirror optical system at high and low temperatures is completed by adopting a collimation system, an entrance window of a high and low temperature box, a visible light standard mirror optical system, an exit window of the high and low temperature box and a visible light image analyzer optical system.
6. The system of claim 4, wherein the test of the transfer function of the infrared standard mirror optical system at high and low temperatures is completed by using the collimating system, the entrance window of the high and low temperature box, the infrared standard mirror optical system, the exit window of the high and low temperature box and the infrared image analyzer optical system.
7. The system of claim 4, wherein the transmittance test of the visible light window to be tested at high and low temperatures is completed by adopting a collimation system, a high and low temperature box entrance window, a visible light window to be tested, a high and low temperature box exit window, a visible light integrating sphere and a visible light relay optical system.
8. The system of claim 4, wherein the collimating system, the entrance window of the high-low temperature box, the infrared window to be tested, the exit window of the high-low temperature box, the infrared integrating sphere and the optical system of the infrared analyzer are used for completing the transmittance test of the infrared window to be tested at high and low temperatures.
9. The system of claim 4, wherein the transmittance test of the visible light measured window at high temperature is completed by adopting a collimating system, a switching mirror, a turning mirror, a high-temperature box entrance window, a visible light measured window, a high-temperature box exit window, a visible light integrating sphere and a visible light relay optical system.
10. The system of claim 4, wherein the transmittance test of the infrared window to be tested at high temperature is performed by using a collimating system, a switching mirror, a turning mirror, a high-temperature box entrance window, an infrared window to be tested, a high-temperature box exit window, an infrared integrating sphere and an infrared image analyzer optical system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211547005.7A CN115931309B (en) | 2022-12-05 | High-low temperature lens transfer function and window transmittance test optical system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211547005.7A CN115931309B (en) | 2022-12-05 | High-low temperature lens transfer function and window transmittance test optical system |
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| Publication Number | Publication Date |
|---|---|
| CN115931309A true CN115931309A (en) | 2023-04-07 |
| CN115931309B CN115931309B (en) | 2024-07-09 |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103018014A (en) * | 2012-12-26 | 2013-04-03 | 长春理工大学 | Measuring system for high and low-temperature modulation transfer functions of medium-wave infrared lenses |
| WO2017041335A1 (en) * | 2015-09-07 | 2017-03-16 | 南京华图信息技术有限公司 | Device and method for collaborative moving target detection with imaging and spectrogram detection in full optical waveband |
| CN114486196A (en) * | 2022-01-27 | 2022-05-13 | 中国科学院长春光学精密机械与物理研究所 | Optical transfer function measuring instrument |
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103018014A (en) * | 2012-12-26 | 2013-04-03 | 长春理工大学 | Measuring system for high and low-temperature modulation transfer functions of medium-wave infrared lenses |
| WO2017041335A1 (en) * | 2015-09-07 | 2017-03-16 | 南京华图信息技术有限公司 | Device and method for collaborative moving target detection with imaging and spectrogram detection in full optical waveband |
| CN114486196A (en) * | 2022-01-27 | 2022-05-13 | 中国科学院长春光学精密机械与物理研究所 | Optical transfer function measuring instrument |
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