CN115902683A - Aging test device and method for modular inverter and electronic equipment - Google Patents
Aging test device and method for modular inverter and electronic equipment Download PDFInfo
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Abstract
The invention provides a modular inverter aging test device and method and electronic equipment. The aging test device of the modular inverter at least comprises a first inverter module and a second inverter module, wherein the first inverter module and the second inverter module are used as a module to be tested and a simulation module in turn, and the module to be tested sequentially executes a plurality of working modes to be tested according to a preset sequence; the simulation module executes a simulation working mode corresponding to the current working mode to be tested of the module to be tested so as to provide a test condition of the current working mode to be tested of the module to be tested. The invention can reduce the equipment resources occupied by aging test of the modular inverter.
Description
Technical Field
The invention relates to the technical field of aging tests, in particular to a device and a method for aging test of a modular inverter and electronic equipment.
Background
A converter is an electrical device that changes the voltage, frequency, number of phases and other electrical quantities or characteristics of a power supply system, and is of various types, such as a rectifier (ac to dc), an inverter (dc to ac), an ac converter and a dc converter. With the development of the converter technology, a modular inverter appears, and due to the characteristic of assembly, the modular inverter gradually becomes a key product of each large manufacturer.
At present, before the modularized inverter leaves a factory, an aging test needs to be carried out. However, the aging test of the modular inverter needs a direct current source and a power grid, so that the aging test of the modular inverter occupies more equipment resources.
Disclosure of Invention
The embodiment of the invention provides a modular inverter aging test device and method and electronic equipment, and aims to solve the problem that more equipment resources are occupied during aging test of a modular inverter.
In a first aspect, an embodiment of the present invention provides a modular inverter aging test apparatus, which includes at least a first inverter module and a second inverter module, wherein a PV end of the first inverter module is electrically connected to a PV end of the second inverter module; the battery end of the first inverter module is electrically connected with the battery end of the second inverter module; the load end of the first inverter module is electrically connected with the load end of the second inverter module; the grid-connected end of the first inverter module and the grid-connected end of the second inverter module are both connected with a power grid;
the first inverter module and the second inverter module are used as a module to be tested and a simulation module in turn, wherein the module to be tested sequentially executes a plurality of working modes to be tested according to a preset sequence; the simulation module executes a simulation working mode corresponding to the current working mode to be tested of the module to be tested so as to provide test conditions of the current working mode to be tested of the module to be tested.
In one possible implementation, the plurality of working modes to be tested include a first MPPT mode in which the working path is from the PV to the grid, a second MPPT mode in which the working path is from the PV to the battery, a battery discharge mode in which the working path is from the battery to the grid, and a battery charge mode in which the working path is from the grid to the battery;
the simulation working mode corresponding to the first MPPT mode is a first MPPT simulator mode with a working path from a power grid to a PV, the simulation working mode corresponding to the second MPPT mode is a second MPPT simulator mode with a working path from a battery to a PV, the simulation working mode corresponding to the battery discharge mode is a simulation battery charging mode with a working path from a power grid to a battery, and the simulation working mode corresponding to the battery charging mode is a simulation battery discharge mode with a working path from a battery to a power grid.
In one possible implementation manner, the preset sequence is any one of an arrangement sequence of the first MPPT mode, the second MPPT mode, the battery discharge mode, and the battery charge mode.
In a second aspect, an embodiment of the present invention provides a method for testing aging of a modular inverter, which is applied to the apparatus for testing aging of a modular inverter according to the first aspect or any one of the possible implementations of the first aspect, and the method includes:
the simulation module acquires the current working mode to be tested of the test module;
the simulation module determines a target simulation working mode corresponding to the current working mode to be tested of the test module according to the preset corresponding relation; the preset corresponding relation records a simulation working mode corresponding to any working mode to be tested;
the simulation module executes a target simulation mode of operation.
In a possible implementation manner, before the simulation module obtains the current working mode of the test module to be tested, the method for testing aging of the modular inverter further includes:
the module to be tested sends a first instruction to the simulation module; the first instruction carries a target working mode to be executed by the module to be tested;
after receiving the first instruction, the simulation module returns a second instruction to the module to be tested so that the module to be tested executes the target working mode to be tested;
the simulation module obtains the current mode of operation that awaits measuring of test module, includes:
the simulation module determines the target working mode to be tested as the current working mode to be tested of the test module.
In a possible implementation manner, the acquiring, by the simulation module, a current working mode to be tested of the test module includes:
the simulation module acquires port information of a module to be tested; the port information comprises the electrical states of a PV end, a battery end, a load end and a grid-connected end;
and the simulation module determines the current working mode to be tested of the test module according to the port information.
In a possible implementation manner, the determining, by the simulation module, a target simulation working mode corresponding to a current working mode to be tested of the test module according to a preset corresponding relationship includes:
under the condition that the current working mode to be tested of the test module is the first MPPT mode, the simulation module determines the first MPPT simulator mode as a target simulation working mode;
under the condition that the current working mode to be tested of the test module is the second MPPT mode, the simulation module determines the second MPPT simulator mode as a target simulation working mode;
under the condition that the current working mode to be tested of the test module is a battery discharging mode, the simulation module determines a simulation battery charging mode as a target simulation working mode;
and under the condition that the current working mode to be tested of the test module is a battery charging mode, the simulation module determines the simulated battery discharging mode as a target simulated working mode.
In one possible implementation, the aging test method for the modular inverter further includes:
and the first inverter module sends a third instruction to the second inverter module so that the second inverter module can be used as an analog module.
In one possible implementation, the aging test method for the modular inverter further includes:
and when the first inverter module sequentially executes a plurality of working modes to be tested according to a preset sequence, the first inverter module sends a fourth instruction to the second inverter module so that the second inverter module serves as a module to be tested.
In a third aspect, an embodiment of the present invention provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor executes the computer program to implement the steps of the method according to the second aspect or any possible implementation manner of the second aspect.
The embodiment of the invention provides a modular inverter aging test device, a method and electronic equipment, wherein the modular inverter aging test device at least comprises a first inverter module and a second inverter module, the first inverter module is correspondingly connected with a PV end, a battery end, a load end and a grid-connected end of the second inverter module, and the grid-connected end of the first inverter module and the grid-connected end of the second inverter module are both connected with a power grid. When the aging test is carried out, the first inverter module and the second inverter module in the modularized inverter aging test device are used as a module to be tested and a simulation module in turn, because the module to be tested sequentially executes a plurality of working modes to be tested according to a preset sequence, the simulation module executes a simulation working mode corresponding to the current working mode to be tested of the module to be tested so as to provide a test condition of the current working mode to be tested of the module to be tested, and therefore, the aging test of the two inverter modules in the modularized inverter can be carried out. Therefore, when the aging test device of the modular inverter is used for aging test of the modular inverter, the direct current source does not need to be connected, and therefore equipment resources occupied by the aging test are greatly saved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed for the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a modular inverter aging test apparatus provided in an embodiment of the present invention;
fig. 2 is a flowchart illustrating an implementation of a method for testing aging of a modular inverter according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of an electronic device provided by an embodiment of the invention;
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system structures, techniques, etc. in order to provide a thorough understanding of the embodiments of the invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.
In order to make the objects, technical solutions and advantages of the present invention more apparent, the following description is made by way of specific embodiments with reference to the accompanying drawings.
As introduced in the related art, the existing modular inverter needs a dc source and a power grid to perform the aging test, so that the aging test occupies more equipment resources. In addition, the energy consumption for performing the aging test is also large.
In order to solve the problems in the prior art, the embodiment of the invention provides a modular inverter aging test device and method and electronic equipment. First, the aging test apparatus for a modular inverter according to an embodiment of the present invention will be described.
The embodiment of the present invention provides a modular inverter aging test apparatus, as shown in fig. 1, the test apparatus at least includes a first inverter module 11 and a second inverter module 12, when testing, the first inverter module 11 and the second inverter module 12 need to be connected according to the following connection relationship, that is: the PV end of the first inverter module 11 is electrically connected with the PV end of the second inverter module 12; the battery terminal BAT of the first inverter module 11 is electrically connected to the battery terminal BAT of the second inverter module 12; the LOAD side LOAD of the first inverter module 11 is electrically connected to the LOAD side LOAD of the second inverter module 12; the GRID-connected terminal GRID of the first inverter module 11 is electrically connected to the GRID-connected terminal GRID of the second inverter module 12. In addition, the GRID-connected terminal GRID of the first inverter module 11 and the GRID-connected terminal GRID of the second inverter module 12 are both connected to the GRID AC SOURCE.
It should be noted that, for the PV end and the battery end of each of the first inverter module 11 and the second inverter module 12, the PV end and the battery end may be electrically connected through a converter circuit, such as a DCDC converter circuit or a DCAC converter circuit, so as to ensure that the two inverter modules operate normally.
After the connection between the first inverter module 11 and the second inverter module 12 is completed according to the connection relationship, the aging test of the modular inverter may be started. In the aging test process, the first inverter module 11 and the second inverter module 12 alternately serve as a module to be tested and a simulation module. For the module to be tested, a plurality of working modes to be tested can be sequentially executed according to a preset sequence. For the simulation module, the simulation module can execute a simulation working mode corresponding to the current working mode to be tested of the module to be tested so as to provide the test condition of the current working mode to be tested of the module to be tested. Therefore, different inverter modules in the modularized inverter can be set with different working modes, the purpose of mutual aging test is achieved, energy circulates inside the modularized inverter, and the energy-saving effect is achieved.
Through the above description, it can be found that the aging test device for the modular inverter is essentially a modular inverter, but the modular inverter needs to be configured according to the connection relationship and the test logic of the aging test.
The following describes in detail the to-be-tested operating mode of the to-be-tested module and the simulation operating mode of the simulation module.
For the module to be tested, the plurality of working modes to be tested executed by the module to be tested can comprise a first MPPT mode that a working path is from PV to a power grid, a second MPPT mode that the working path is from PV to a battery, a battery discharging mode that the working path is from the battery to the power grid and a battery charging mode that the working path is from the power grid to the battery.
For the simulation module, the simulation working mode executed by the simulation module corresponding to the working mode to be tested is as follows: the simulation working mode corresponding to the first MPPT mode is a first MPPT simulator mode with a working path from a power grid to PV, the simulation working mode corresponding to the second MPPT mode is a second MPPT simulator mode with a working path from a battery to PV, the simulation working mode corresponding to the battery discharging mode is a simulation battery charging mode with a working path from a power grid to a battery, and the simulation working mode corresponding to the battery charging mode is a simulation battery discharging mode with a working path from a battery to a power grid.
It should be noted that the essence of the burn-in test is to test the operation paths of the inverter modules in the modular inverter, i.e. the above-mentioned PV-to-grid, PV-to-battery, battery-to-grid and grid-to-battery operation paths. Because the inverter module is not connected to the PV in the above connection relationship, and the applicant finds that the inverter module has a function of simulating PV and MPPT (Maximum Power Point Tracking), a test condition can be provided for another inverter module by one inverter module in the modular inverter, so that the purpose of mutual aging test of two inverter modules in the modular inverter can be achieved.
It should be noted that if the modular inverter includes three or more inverter modules, the test can be performed according to the test logic, only any two inverter modules need to be combined into the module to be tested and the simulation module, and after the test of one inverter module is completed, the next inverter module is replaced, so that the mutual aging test of the three or more inverter modules can be completed.
In some embodiments, the preset sequence in which the module to be tested sequentially executes the plurality of working modes to be tested may be various, for example, the preset sequence may be any one of an arrangement sequence of the first MPPT mode, the second MPPT mode, the battery discharge mode, and the battery charge mode. As shown in table one, a preset sequence is provided.
Watch 1
Referring to fig. 2, it shows a flowchart of an implementation of the aging test method for the modular inverter provided in the embodiment of the present invention, the aging test method for the modular inverter is applied to the aging test apparatus for the modular inverter described above, and is detailed as follows:
In some embodiments, a certain inverter module in the modular inverter may be used as a master module in advance, and then the master module determines the delimiting identity. Specifically, the first inverter module may be set as a master control module, and thus, the first inverter module may send a third instruction for setting an identity to the second inverter module, so as to set the second inverter module as a simulation module.
In some embodiments, the simulation module may obtain the current working mode of the test module to be tested in a plurality of ways.
For example, the module to be tested may send a first instruction to the simulation module, where the first instruction carries a target working mode to be tested to be executed by the module to be tested. Therefore, after receiving the first instruction, the simulation module acquires the target to-be-tested working mode to be executed by the test module, and since the target to-be-tested working mode to be executed is executed immediately, the target to-be-tested working mode to be executed is the current to-be-tested working mode of the simulation module, so that the simulation module can determine the target to-be-tested working mode as the current to-be-tested working mode of the test module. In addition, the simulation module needs to notify the module to be tested, for example, a second instruction is returned to the module to be tested to notify the module to be tested that the module to be tested successfully receives the first instruction, and notify the module to be tested to execute the target working mode to be tested.
For another example, the simulation module may obtain the current to-be-tested operating mode of the test module through port information of the to-be-tested module, where the port information includes electrical states of the PV end, the battery end, the load end, and the grid-connected end, such as state signals of a voltage value or a current value. Therefore, the simulation module can acquire the port information of the module to be tested and then determine the current working mode to be tested of the test module according to the port information.
Specifically, the preset corresponding relation records a simulation working mode corresponding to any working mode to be tested. For example, when the current to-be-tested working mode of the test module is the first MPPT mode, the simulation module determines the first MPPT simulator mode as the target simulation working mode. And under the condition that the current working mode to be tested of the test module is the second MPPT mode, the simulation module determines the second MPPT simulator mode as a target simulation working mode. And under the condition that the current working mode to be tested of the test module is a battery discharging mode, the simulation module determines the simulation battery charging mode as a target simulation working mode. And under the condition that the current working mode to be tested of the test module is a battery charging mode, the simulation module determines the simulated battery discharging mode as a target simulated working mode.
Therefore, the module to be tested and the simulation module can sequentially complete the aging test of the module to be tested according to the preset sequence. And then, the module to be tested and the analog module can exchange identities, and then the aging test of the other inverter module is completed according to the test logic.
Taking the first inverter module as the module to be tested as an example, when the first inverter module sequentially executes according to the preset sequence to complete the plurality of working modes to be tested, the first inverter module may send a fourth instruction to the second inverter module, so that the second inverter module serves as the module to be tested, thereby performing the aging test on the second inverter module.
In an embodiment of the present invention, a modular inverter aging test apparatus at least including a first inverter module and a second inverter module is provided, where the first inverter module is correspondingly connected to a PV end, a battery end, a load end, and a grid-connected end of the second inverter module, and both the grid-connected end of the first inverter module and the grid-connected end of the second inverter module are connected to a power grid. When the aging test is carried out, the first inverter module and the second inverter module in the aging test device of the modular inverter are alternately used as the module to be tested and the simulation module, the module to be tested sequentially executes a plurality of working modes to be tested according to the preset sequence, and the simulation module executes the simulation working mode corresponding to the current working mode to be tested of the module to be tested so as to provide the test condition of the current working mode to be tested of the module to be tested, so that the two inverter modules in the modular inverter can be used for carrying out the mutual aging test. Therefore, when the aging test device of the modular inverter is used for aging test of the modular inverter, the direct current source does not need to be connected, and therefore equipment resources occupied by the aging test are greatly saved.
Embodiments of the present invention also provide a computer program product having a program code for performing the steps of any of the above described modular inverter aging test method embodiments, such as steps 210 to 230 shown in fig. 2, when the program code is run in a corresponding processor, controller, computing device or terminal. Those skilled in the art will appreciate that the methods presented in the embodiments of the present invention and the apparatus pertaining thereto may be implemented in various forms of hardware, software, firmware, special purpose processors, or a combination thereof. The special-purpose processor may include an Application Specific Integrated Circuit (ASIC), a Reduced Instruction Set Computer (RISC), and/or a Field Programmable Gate Array (FPGA). The proposed method and apparatus are preferably implemented as a combination of hardware and software. The software is preferably installed as an application program on a program storage device. It is typically a machine based computer platform having hardware such as one or more Central Processing Units (CPU), a Random Access Memory (RAM), and one or more input/output (I/O) interfaces. An operating system is also typically installed on the computer platform. The various processes and functions described herein may either be part of an application program or part of it may be executed by an operating system.
Fig. 3 is a schematic diagram of an electronic device 3 provided in the embodiment of the present invention. As shown in fig. 3, the electronic apparatus 3 of this embodiment includes: a processor 30, a memory 31 and a computer program 32 stored in said memory 31 and executable on said processor 30. The processor 30, when executing the computer program 32, implements the steps in the various modular inverter burn-in test method embodiments described above, such as steps 210-230 shown in fig. 2.
Illustratively, the computer program 32 may be partitioned into one or more modules that are stored in the memory 31 and executed by the processor 30 to implement the present invention. The one or more modules may be a series of computer program instruction segments capable of performing specific functions, which are used to describe the execution of the computer program 32 in the electronic device 3.
The electronic device 3 may include, but is not limited to, a processor 30, a memory 31. Those skilled in the art will appreciate that fig. 3 is merely an example of the electronic device 3 and does not constitute a limitation of the electronic device 3 and may include more or fewer components than those shown, or some of the components may be combined, or different components, e.g., the electronic device may also include input output devices, network access devices, buses, etc.
The Processor 30 may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic device, discrete hardware component, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The memory 31 may be an internal storage unit of the electronic device 3, such as a hard disk or a memory of the electronic device 3. The memory 31 may also be an external storage device of the electronic device 3, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), and the like, which are provided on the electronic device 3. Further, the memory 31 may also include both an internal storage unit and an external storage device of the electronic device 3. The memory 31 is used for storing the computer program and other programs and data required by the electronic device. The memory 31 may also be used to temporarily store data that has been output or is to be output.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-mentioned division of the functional units and modules is illustrated, and in practical applications, the above-mentioned function distribution may be performed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-mentioned functions. Each functional unit and module in the embodiments may be integrated in one processing unit, or each unit may exist alone physically, or two or more units are integrated in one unit, and the integrated unit may be implemented in a form of hardware, or in a form of software functional unit. In addition, specific names of the functional units and modules are only used for distinguishing one functional unit from another, and are not used for limiting the protection scope of the present invention. The specific working processes of the units and modules in the system may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and reference may be made to the related descriptions of other embodiments for parts that are not described or illustrated in a certain embodiment.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
In the embodiments provided in the present invention, it should be understood that the disclosed apparatus/terminal device and method may be implemented in other ways. For example, the above-described embodiments of the apparatus/terminal device are merely illustrative, and for example, the division of the modules or units is only one type of logical function division, and other division manners may be available in actual implementation, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one position, or may be distributed on multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit may be implemented in the form of hardware, or may also be implemented in the form of a software functional unit.
The integrated module, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, all or part of the flow in the method of the embodiments described above may be implemented by a computer program, which may be stored in a computer readable storage medium, and when the computer program is executed by a processor, the steps of the embodiments of the modular inverter aging test method described above may be implemented. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, usb disk, removable hard disk, magnetic disk, optical disk, computer Memory, read-Only Memory (ROM), random Access Memory (RAM), electrical carrier wave signals, telecommunications signals, software distribution medium, etc.
Furthermore, the features of the embodiments shown in the drawings of the invention or of the various embodiments mentioned in the description are not necessarily to be understood as embodiments independent of one another. Rather, each feature described in one example of one embodiment can be combined with one or more other desired features from other embodiments to yield yet further embodiments, which are not described in text or with reference to the accompanying drawings.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the embodiments of the present invention, and they should be construed as being included therein.
Claims (10)
1. The aging test device for the modular inverter is characterized by at least comprising a first inverter module and a second inverter module, wherein a PV end of the first inverter module is electrically connected with a PV end of the second inverter module; the battery end of the first inverter module is electrically connected with the battery end of the second inverter module; the load end of the first inverter module is electrically connected with the load end of the second inverter module; the grid-connected end of the first inverter module is electrically connected with the grid-connected end of the second inverter module, and the grid-connected end of the first inverter module and the grid-connected end of the second inverter module are both connected with a power grid;
the first inverter module and the second inverter module are alternately used as a module to be tested and a simulation module, wherein the module to be tested sequentially executes a plurality of working modes to be tested according to a preset sequence; and the simulation module executes a simulation working mode corresponding to the current working mode to be tested of the module to be tested so as to provide the test condition of the current working mode to be tested of the module to be tested.
2. The modular inverter aging test apparatus of claim 1, wherein the plurality of operating modes under test includes a first MPPT mode in which the operating path is PV to grid, a second MPPT mode in which the operating path is PV to battery, a battery discharge mode in which the operating path is battery to grid, and a battery charge mode in which the operating path is grid to battery;
the simulation working mode that first MPPT mode corresponds is that the working path is the first MPPT simulator mode of electric wire netting to PV, the simulation working mode that second MPPT mode corresponds is that the working path is the second MPPT simulator mode of battery to PV, the simulation working mode that battery discharge mode corresponds is that the working path is the simulation battery charge mode of electric wire netting to battery, the simulation working mode that battery charge mode corresponds is that the working path is the simulation battery discharge mode of battery to electric wire netting.
3. The modular inverter aging test apparatus of claim 2, wherein the preset sequence is any one of the first MPPT mode, the second MPPT mode, the battery discharge mode, and the battery charge mode.
4. A method for aging test of a modular inverter, applied to the apparatus for aging test of a modular inverter according to any one of claims 1 to 3, the method comprising:
the simulation module acquires the current working mode to be tested of the test module;
the simulation module determines a target simulation working mode corresponding to the current working mode to be tested of the test module according to a preset corresponding relation; the preset corresponding relation records a simulation working mode corresponding to any working mode to be tested;
and the simulation module executes the target simulation working mode.
5. The method of claim 4, wherein before the simulation module obtains the current under-test operating mode of the test module, the method further comprises:
the module to be tested sends a first instruction to the simulation module; the first instruction carries a target to-be-tested working mode to be executed by the to-be-tested module;
after receiving the first instruction, the simulation module returns a second instruction to the module to be tested so that the module to be tested executes the target working mode to be tested;
the simulation module obtains the current working mode to be tested of the test module, and the method comprises the following steps:
and the simulation module determines the target working mode to be tested as the current working mode to be tested of the test module.
6. The aging test method for the modular inverter according to claim 4, wherein the obtaining, by the simulation module, the current working mode to be tested of the test module comprises:
the simulation module acquires port information of the module to be tested; the port information comprises the electrical states of a PV end, a battery end, a load end and a grid-connected end;
and the simulation module determines the current working mode to be tested of the test module according to the port information.
7. The aging test method for the modular inverter according to claim 4, wherein the determining, by the simulation module, the target simulation operating mode corresponding to the current operating mode to be tested of the test module according to the preset corresponding relationship comprises:
under the condition that the current working mode to be tested of the test module is the first MPPT mode, the simulation module determines the first MPPT simulator mode as the target simulation working mode;
under the condition that the current working mode to be tested of the test module is a second MPPT mode, the simulation module determines the second MPPT simulator mode as the target simulation working mode;
under the condition that the current working mode to be tested of the test module is a battery discharging mode, the simulation module determines a simulation battery charging mode as the target simulation working mode;
and under the condition that the current working mode to be tested of the test module is a battery charging mode, the simulation module determines a simulated battery discharging mode as the target simulated working mode.
8. The modular inverter aging test method of claim 4, further comprising:
the first inverter module sends a third instruction to the second inverter module to enable the second inverter module to serve as the simulation module.
9. The modular inverter aging test method of claim 8, further comprising:
and when the first inverter module sequentially executes a plurality of working modes to be tested according to a preset sequence, the first inverter module sends a fourth instruction to the second inverter module so that the second inverter module is used as the module to be tested.
10. An electronic device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that the steps of the method according to any of the preceding claims 4 to 9 are implemented when the computer program is executed by the processor.
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