CN217766750U - Power supply testing device - Google Patents
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- CN217766750U CN217766750U CN202221420805.8U CN202221420805U CN217766750U CN 217766750 U CN217766750 U CN 217766750U CN 202221420805 U CN202221420805 U CN 202221420805U CN 217766750 U CN217766750 U CN 217766750U
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Abstract
The utility model discloses a power testing device, include: the device comprises a control unit, a plurality of charging test units and a plurality of discharging test units; the control unit is at least provided with a data acquisition port and a data output port, is connected with the charging test unit at least through the data output port, and is connected with the discharging test unit at least through the data acquisition port; the charging test unit is used for outputting a type of charging test signals, and the charging test signals comprise direct current charging test signals and alternating current charging test signals; the discharging test unit is used for collecting a type of discharging test signals, and the discharging test signals comprise direct current discharging test signals and alternating current discharging test signals.
Description
Technical Field
The embodiment of the utility model provides a relate to the test equipment technique, especially relate to a power testing device.
Background
Before the power supply product leaves a factory, power supply testing is required to determine the performance characteristics of the power supply product under different voltage and current combinations. At present, power supply products in the market are various in types and increasingly diverse in functions, under the common condition, a matched power supply testing device needs to be adopted for completing corresponding power supply tests for one power supply product, when power supply tests are needed for various power supply products, multiple sets of power supply testing devices are needed, the testing cost is high, meanwhile, testers need to be familiar with the using method of each power supply testing device, and if the power supply testing devices are not familiar enough, testing errors easily occur.
Based on the above, there is a need for a power testing apparatus capable of realizing automatic testing and simultaneously meeting the testing requirements of different types of tested products.
SUMMERY OF THE UTILITY MODEL
The utility model provides a power supply testing device to reach the purpose that realizes automatic test and adopt a device to satisfy the test demand of the product under test of different grade type.
An embodiment of the utility model provides a power testing device, include: the device comprises a control unit, a plurality of charging test units and a plurality of discharging test units;
the control unit is at least provided with a data acquisition port and a data output port, is connected with the charging test unit at least through the data output port, and is connected with the discharging test unit at least through the data acquisition port;
the charging test unit is used for outputting a type of charging test signal, and the charging test signal comprises a direct current charging test signal and an alternating current charging test signal;
the discharge test unit is used for collecting a type of discharge test signal, and the discharge test signal comprises a direct current discharge test signal and an alternating current discharge test signal.
Optionally, the system comprises a charging test unit, a first discharging test unit and a second discharging test unit;
the control unit is provided with a first data acquisition port and a second data acquisition port;
the control unit is connected with the first discharge test unit at least through the first data acquisition port;
the control unit is connected with the second discharge test unit at least through the second data acquisition unit.
Optionally, the charging test unit is configured to output a dc charging test signal.
Optionally, the first discharge test unit is configured to collect a first dc discharge test signal.
Optionally, the second discharge test unit is configured to collect a second dc discharge test signal and an ac discharge test signal.
Optionally, the power output port of the charging test unit includes:
the 5525 interface, the 5521 interface, and the MR30 interface.
Optionally, the power output port of the first discharge test unit includes:
USB-A interface and Type-C interface.
Optionally, the power output port of the second discharge test unit includes:
5525 interface, 5521 interface, MR30 interface, and AC interface.
Optionally, the data acquisition port and the data output port include an RS232 interface.
Optionally, the control unit is further configured to be connected to one or more of an upper computer, a mouse, a keyboard, and a code scanning gun.
Compared with the prior art, the beneficial effects of the utility model reside in that: the utility model provides a power testing device, power testing device includes the control unit, the test unit and the test unit that discharges charge, power testing device during operation, the control unit can instruct the test unit that charges or the test unit work that discharges that corresponds according to the test demand, in order to realize the automation test that charges or discharge, furthermore, different test signals that charges can be exported to the different test unit that charges, different test signals that discharge can be gathered to the different test unit that discharges, make this power testing device can satisfy the test demand of the product of being surveyed of different grade type.
Drawings
FIG. 1 is a schematic structural diagram of a power supply test apparatus in an embodiment;
FIG. 2 is a schematic structural diagram of another power supply test device in the embodiment;
FIG. 3 is a schematic structural diagram of another power supply test device in the embodiment;
FIG. 4 is a schematic structural diagram of another power supply testing apparatus in the embodiment.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
The present embodiment provides a power supply testing apparatus, which includes a control unit and one or more of a charging testing unit and a discharging testing unit.
Fig. 1 is a schematic structural diagram of a power supply testing apparatus in an embodiment, and referring to fig. 1, as an embodiment, the power supply testing apparatus includes: a control unit 100, a number of charging test units 200, and a number of discharging test units 300.
Illustratively, in this scheme, the control unit is configured with at least a data acquisition port and a data output port, the control unit 100 is connected to the charging test unit 200 at least through the data output port, and the control unit 100 is connected to the discharging test unit 300 at least through the data acquisition port.
In an exemplary embodiment, a charging test unit is configured to output a type of charging test signal, where the charging test signal includes a dc charging test signal and an ac charging test signal;
the discharging test unit is used for collecting a type of discharging test signals, and the discharging test signals comprise direct current discharging test signals and alternating current discharging test signals.
For example, in this embodiment, the control unit 100 and the charging test unit 200 may be used to perform a charging test on an electrical load, where the charging test unit 200 is connected to the electrical load, and the control unit 100 controls the charging test unit 200 to discharge according to a specified pattern, so as to determine the charging performance of the electrical load.
For example, the charging test unit 200 may be configured to support a single charging test (the test parameters are different each time the test is performed), multiple charging tests, or a cyclic charging test (the test parameters are the same in each test cycle).
Exemplarily, in this embodiment, the functions of the control unit 100 specifically include: the charging test unit 200 is instructed to use what test parameters (e.g., expected test duration, voltage value of the dc charging test signal, current value of the dc charging test signal, voltage value of the ac charging test signal, current value of the ac charging test signal, etc.), what test procedures (one or more of a single power test, multiple power tests, and a cyclic power test, and related test steps in each test), and so on when performing the charging test.
For example, in this embodiment, the control unit 100 may be configured to output a charging test command to the charging test unit 200 through the data output port, where the charging test command is used to instruct which test parameters and which test procedures are adopted when the charging test unit 200 performs the charging test.
For example, in this scheme, the control unit 100 and the discharge test unit 300 may be used for a discharge test of a power supply product, when the discharge test is performed, the discharge test unit 300 is connected to the power supply product, and the control unit 100 acquires discharge test data generated by the discharge test unit 300 through a data acquisition port, so as to determine the discharge performance of the power supply product.
For example, in this scheme, the charging test unit may be configured with a power input port and a power output port, where the power input port is used for accessing a power supply and the power output port is used for connecting with an electrical load.
For example, in this scheme, the structure of the charging test unit is not specifically limited, and the charging test unit includes at least one control chip and a power supply circuit.
In this embodiment, the power circuit may include a plurality of modules designated in a rectifier module, an inverter module, a boost module, a buck module, a filter module, and a driver module according to a difference between power supplies of the charging test unit and a difference between output test signals.
For example, in this scheme, the structure of the discharge test unit is not specifically limited, and the discharge test unit includes at least one discharge test chip and a related peripheral circuit.
For example, in this scheme, the control unit may be configured to obtain the test requirement through an external input mode, and then determine to instruct the charging test unit or the discharging test unit to operate according to a specified mode through the test requirement.
For example, the control unit may be connected to an upper computer, and the upper computer sends the test requirement to the control unit;
the control unit is connected with a mouse and a keyboard, and test requirements are input into the control unit through the mouse and the keyboard, at the moment, the control unit is also correspondingly provided with a display screen, and the display screen is used for displaying a corresponding UI (user interface);
and the code scanning gun is connected with the code scanning gun, and at the moment, the code scanning information of the code scanning gun is used as a test requirement input to the control unit.
In this scheme, the control Unit 100 includes at least one data processing module, and the data processing module is specifically configured to receive and process a test requirement and send a test content, where the data processing module may be a single chip microcomputer or a Micro Controller Unit (MCU), and the like.
This embodiment provides a power testing device, power testing device includes the control unit, the test unit and the test unit that discharges charge, power testing device during operation, the control unit can instruct the test unit that charges or the test unit that discharges that corresponds to work according to the test demand, in order to realize the automatic test that charges or discharge, furthermore, different test units that charge can export different test signals that charge, different test units that discharge can gather different test signals that discharge, make this power testing device can satisfy the test demand of the product under test of different grade type.
Fig. 2 is a schematic structural diagram of another power supply testing apparatus in an embodiment, and referring to fig. 2, based on the scheme shown in fig. 1, the power supply testing apparatus includes a charging testing unit 200, a first discharging testing unit 301, and a second discharging testing unit 302.
In this scheme, for example, the control unit 100 is configured with a first data acquisition port and a second data acquisition port;
the control unit 100 is connected with the first discharge test unit 301 at least through a first data acquisition port; the control unit 100 is connected to the second discharge test unit 302 at least through the second data acquisition unit.
For example, in this solution, the types of the data output port, the first data acquisition port, and the second data acquisition port may be the same or different, for example, the data output port may adopt a CAN interface, and the first data acquisition port and the second data acquisition port may adopt serial ports.
For example, as an implementation scheme, for convenience of design and production, the data output port, the first data acquisition port and the second data acquisition port adopt RS232 interfaces.
Illustratively, as an embodiment, the charging test unit 200 is configured to output a dc charging test signal, and the charging test unit 200 is configured with an 5525 interface, an 5521 interface and an MR30 interface.
For example, in this solution, configuring data parameters of the dc charging test signal includes: the output voltage is 0-32V, and the output current is 0-6A.
In this embodiment, the power supply of the charging test unit 200 is set as the commercial power.
In this embodiment, the data terminal of the control chip and the power output terminal of the power circuit configured inside the charging test unit 200 are connected to the corresponding terminals of the 5525 interface, the 5521 interface and the MR30 interface.
Illustratively, as an embodiment, the first discharge testing unit 301 is configured to collect the first dc discharge testing signal, and the first discharge testing unit 301 is configured to have ase:Sub>A USB-ase:Sub>A interface and ase:Sub>A Type-C interface.
In this embodiment, for example, the first discharge test unit 301 is configured to support the QC2.0, QC3.0, PD2.0, PD3.0, QC2.0, QC3.0, PD2.0, and PD3.0 protocols, and correspondingly, in addition to the control chip, the first discharge test unit 301 is also configured with fast charging chips such as QC2.0, QC3.0, and the like, and corresponding peripheral circuits.
For example, the power output end of the power circuit in the first discharge test unit 301 is connected to the power input end of the fast charging chip, and the control chip may be configured to control the connection or disconnection of the power supply at the power input end of the fast charging chip through the power circuit, so as to control the test duration according to the test content.
Exemplarily, in the scheme, the datase:Sub>A end and the power output end of the quick charging chip are connected with corresponding terminals of the USB-A interface and the Type-C interface.
Illustratively, as an implementation, the second discharge test unit 302 is configured to acquire a second dc discharge test signal and an AC discharge test signal, and the second discharge test unit 302 is configured with a 5525 interface, a 5521 interface, an MR30 interface, and an AC interface.
In this embodiment, for example, the voltage range of the discharge test signal accessed by the second discharge test unit 302 is set to be 0 to 360V, and the input power range is set to be 0 to 150W.
For example, in the present embodiment, the data terminal of the discharge test chip in the second discharge test unit 302 and the dc power output terminal of the peripheral circuit are connected to the corresponding terminals of the 5525 interface, the 5521 interface and the MR30 interface;
the data terminal of the discharge test chip in the second discharge test unit 302 and the AC power output terminal of the peripheral circuit are connected to the AC interface.
In an exemplary embodiment, the 5525 interface, the 5521 interface, and the MR30 interface are used to collect the second dc discharge test signal, and the AC interface is used to collect the AC discharge test signal.
On the basis of the beneficial effects of the scheme shown in fig. 1, in the scheme, the power supply testing device is specifically configured with the charging testing unit, the first discharging testing unit and the second discharging testing unit, and the charging testing of a direct current load product which does not support rapid charging can be realized through the charging testing unit; the first discharge test unit can realize discharge test for the direct-current power supply product supporting quick charge; the second discharge test unit can realize discharge test of the high-voltage direct-current power supply product and the high-voltage alternating-current power supply product, the test range of the power supply test device is wide in coverage, and test requirements of different types of products can be better met.
Fig. 3 is a schematic structural diagram of a power supply testing apparatus in an embodiment, and referring to fig. 3, the power supply testing apparatus includes: a control unit 100, at least two power supply units (power supply units 1 to n).
In this embodiment, the control unit 100 is configured with a data acquisition port and at least two data output ports, and the control unit 100 is connected to a power supply unit through one data output port.
In an exemplary embodiment, the power supply unit is configured with a power input port and a power output port, where the power input port is used for accessing a power supply, and the power output port is used for connecting with a load to be tested.
For example, in this embodiment, the power supply units are configured to implement a charging test for an electrical load, and one power supply unit is configured to output one type of test signal, that is, different power supply units are configured to output different test signals, where the test signals include a direct current test signal and an alternating current test signal.
In this embodiment, the control unit 100 receives test information through the data acquisition port, where the test information may be used to instruct a single power supply test, multiple power supply tests (different test parameters in each test), or a power supply cycling test (same test parameters in each test cycle).
In this embodiment, the test information may be an instruction, and at this time, a preset program (including a single power test, multiple power tests, a cyclic power test, and related test steps and test parameters) may be stored in the control unit 100, where the instruction is used to instruct which test (one or more of the single power test, the multiple power tests, and the cyclic power test) is to be performed.
For example, in this embodiment, the test information may also be a program (a test script), where the program is used to indicate how to perform the test this time, including what test parameters (for example, a desired test duration, a voltage value of the dc test signal, a current value of the dc test signal, a voltage value of the ac test signal, a current value of the ac test signal, etc.) are used when performing the test, what test procedures (one or more of a single power supply test, multiple power supply tests, and a cyclic power supply test, and a test step related to each test) are used.
For example, in the present scheme, the mode of receiving the test information by the data acquisition unit is not specifically limited, for example, the data acquisition unit may be connected to an upper computer, and the test information is launched to the data acquisition unit by the upper computer;
the data acquisition unit is connected with the mouse and the keyboard, test information is input into the data acquisition unit through the mouse and the keyboard, and at the moment, the data acquisition unit is also correspondingly provided with a display screen which is used for displaying a corresponding UI (user interface);
and the code scanning gun is connected with the code scanning gun, and at the moment, code scanning information of the code scanning gun is used as test information input to the data acquisition unit.
For example, in this scheme, the structure of the power supply unit is not specifically limited, and the power supply unit includes at least one control chip and a power supply circuit.
In this embodiment, the power supply may include a plurality of modules designated from a rectifier module, an inverter module, a boost module, a buck module, a filter module, and a driver module according to a difference between power supplies of the power supply unit and a difference between output test signals.
Illustratively, in this scheme, the control unit 100 is connected to a control chip in the corresponding power supply unit through a data output port, and the control chip is configured to control the power supply circuit to output a specified test signal according to the test content sent by the data acquisition unit.
In this exemplary embodiment, the control Unit 100 includes at least one data processing module, and the data processing module is specifically configured to receive and process test information and send test content, where the data processing module may be a single chip microcomputer or a Micro Controller Unit (MCU), and the like.
In this embodiment, the working process of the power supply testing apparatus includes:
the data acquisition unit receives the test information, judges the type of the expected test signal according to the test information, and indicates the corresponding power supply unit to work based on the type of the expected test signal so as to complete the specified program.
This scheme provides a power testing arrangement, power testing arrangement includes the data acquisition unit, a plurality of electrical unit, wherein the data acquisition unit is connected with every electrical unit respectively through data output port, this power testing arrangement during operation, the data acquisition unit receives test information, can instruct corresponding electrical unit work according to test information data acquisition unit, in order to realize automatic test, in addition, different power supply output different test signal, can satisfy the test demand of the product under test of different grade type through the device.
Fig. 4 is a schematic structural diagram of another power supply testing apparatus in an embodiment, and referring to fig. 4, on the basis of the scheme shown in fig. 3, the power supply testing apparatus includes a first power supply unit 201, a second power supply unit 202, and a third power supply unit 203.
Illustratively, in this scheme, the control unit 100 is configured with a first data output port, a second data output port, and a third data output port;
the control unit 100 is connected to the first power supply unit 201, the second power supply unit 202, and the third power supply unit 203 through a first data output port, a second data output port, and a third data output port, respectively.
Illustratively, the types of the first data output port, the second data output port and the third data output port may be the same or different, for example, the first data output port may employ a CAN interface, and the second data output port and the third data output port may employ a serial port.
Illustratively, as an embodiment, for convenience of design and production, the first data output port, the second data output port, and the third data output port all employ RS232 interfaces.
Illustratively, as an embodiment, the first power supply unit 201 is configured to output the first dc test signal, and the first power supply unit 201 is configured with an 5525 interface, an 5521 interface and an MR30 interface.
For example, in this solution, configuring the data parameter of the first dc test signal includes: the output voltage is 0-32V, and the output current is 0-6A.
For example, in this embodiment, the power supply of the first power supply unit 201 is set as the commercial power.
In the present exemplary embodiment, the data terminal of the control chip and the power output terminal of the power circuit are connected to the corresponding terminals of the 5525 interface, the 5521 interface and the MR30 interface.
Illustratively, as an implementation, the second power supply unit 202 is configured to output the second dc test signal, and the second power supply unit 202 is configured to have ase:Sub>A USB-ase:Sub>A interface and ase:Sub>A Type-C interface.
In this embodiment, for example, the second power unit 202 is configured to support the protocols of QC2.0, QC3.0, PD2.0, PD3.0, QC2.0, QC3.0, PD2.0, and PD3.0, and correspondingly, the second power unit is further configured with fast charging chips such as QC2.0, QC3.0, and the like, and corresponding peripheral circuits.
For example, the power output end of the power circuit in the second power unit 202 is connected to the power input end of the fast charging chip, and the control chip may be configured to control the connection or disconnection of the power supply at the power input end of the fast charging chip through the power circuit, so as to control the duration of the test according to the test content.
Exemplarily, in the scheme, the datase:Sub>A end and the power output end of the quick charging chip are connected with corresponding terminals of the USB-A interface and the Type-C interface.
Illustratively, as an embodiment, the third power supply unit 203 is configured to output a third dc test signal and an AC test signal, and the third power supply unit 203 is configured with a 5525 interface, a 5521 interface, an MR30 interface, and an AC interface.
For example, in this scheme, the voltage range of the power supply connected to the third power supply unit 203 is set to be 0 to 360V, and the range of the input power is set to be 0 to 150W, where the power supply may be direct current or alternating current.
For example, in this scheme, the data terminal of the control chip in the third power supply unit 203 and the dc power output terminal of the power supply circuit are connected to corresponding terminals of the 5525 interface, the 5521 interface and the MR30 interface;
the data terminal of the control chip in the third power supply unit 203 and the AC power output terminal of the power supply circuit are connected to the AC interface.
In this embodiment, for example, the 5525 interface, the 5521 interface, and the MR30 interface are configured to output a third dc test signal, and the AC interface is configured to output an AC test signal.
On the basis of the beneficial effects of the scheme shown in fig. 3, in the scheme, the power supply testing device is specifically configured with the first power supply unit, the second power supply unit and the third power supply, and the power supply testing for a direct current power supply product which does not support rapid charging can be realized through the first power supply unit; the power supply test for the direct-current power supply product supporting quick charging can be realized through the second power supply unit; the third power supply unit can be used for realizing power supply testing of high-voltage direct-current power supply products and high-voltage alternating-current power supply products, the testing range of the power supply testing device is wide in coverage, and the power supply testing requirements of different types of power supply products can be better met.
For example, as an implementation, the power supply unit may also be configured to implement a discharge test for the power supply product, and one power supply unit is configured to collect a type of test signal.
For example, when the power supply unit is used for the discharge test, the structure of the power supply test apparatus is substantially the same as that shown in fig. 3 or fig. 4, and details are not repeated.
It should be noted that the foregoing is only a preferred embodiment of the present invention and the technical principles applied. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail with reference to the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the scope of the present invention.
Claims (10)
1. A power supply testing apparatus, comprising: the device comprises a control unit, a plurality of charging test units and a plurality of discharging test units;
the control unit is at least provided with a data acquisition port and a data output port, is connected with the charging test unit at least through the data output port, and is connected with the discharging test unit at least through the data acquisition port;
the charging test unit is used for outputting a type of charging test signals, and the charging test signals comprise direct current charging test signals and alternating current charging test signals;
the discharge test unit is used for collecting a type of discharge test signal, and the discharge test signal comprises a direct current discharge test signal and an alternating current discharge test signal.
2. The power supply test apparatus of claim 1, comprising a charging test unit, a first discharging test unit, a second discharging test unit;
the control unit is provided with a first data acquisition port and a second data acquisition port;
the control unit is connected with the first discharge test unit at least through the first data acquisition port;
the control unit is connected with the second discharge test unit at least through the second data acquisition port.
3. The power supply test device of claim 2, wherein the charging test unit is configured to output a dc charging test signal.
4. The power supply testing device of claim 2, wherein the first discharge testing unit is configured to collect a first dc discharge test signal.
5. The power supply testing device of claim 2, wherein the second discharge testing unit is configured to collect a second dc discharge testing signal and an ac discharge testing signal.
6. The power supply test device of claim 3, wherein the power supply output port of the charging test unit comprises:
5525 interface, 5521 interface, and MR30 interface.
7. The power supply test apparatus of claim 4, wherein the power supply output port of the first discharge test unit comprises:
USB-A interface and Type-C interface.
8. The power supply test apparatus of claim 5, wherein the power supply output port of the second discharge test unit comprises:
5525 interface, 5521 interface, MR30 interface, and AC interface.
9. The power supply testing device of claim 1, wherein the data acquisition port and the data output port comprise RS232 interfaces.
10. The power supply testing device of claim 1, wherein the control unit is further configured to interface with one or more of a host computer, a mouse, a keyboard, and a code scanning gun.
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| CN202221420805.8U CN217766750U (en) | 2022-06-06 | 2022-06-06 | Power supply testing device |
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| CN202221420805.8U CN217766750U (en) | 2022-06-06 | 2022-06-06 | Power supply testing device |
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