CN212873278U - VCU function test signal conversion device and conversion system - Google Patents
VCU function test signal conversion device and conversion system Download PDFInfo
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- CN212873278U CN212873278U CN202021691664.4U CN202021691664U CN212873278U CN 212873278 U CN212873278 U CN 212873278U CN 202021691664 U CN202021691664 U CN 202021691664U CN 212873278 U CN212873278 U CN 212873278U
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Abstract
The utility model provides a VCU functional test signal conversion equipment and conversion system, conversion equipment includes: a signal conversion module including a plurality of conversion circuits integrated on a circuit board, each of the conversion circuits being different in type from each other; each conversion circuit can be coupled with external test signal hardware of a corresponding type, so that the test signal of the corresponding type is converted into a conversion signal, and the conversion signal is a signal obtained by optimizing the test signal; and the VCU connector can be coupled with the outside VCU product that awaits measuring to VCU product output switching signal awaits measuring, the utility model discloses with a plurality of converting circuit welding on a circuit board, the integrated level is high, effectively reduces testing arrangement's size, simplifies the equipment process, has optimized the signal conversion process, shortens equipment development time, has improved efficiency of software testing, and operates more simply, need not change the hardware connection, promotes the test flexibility.
Description
Technical Field
The utility model relates to a new energy automobile VCU functional test, more specifically relates to a VCU functional test signal conversion equipment and switching system.
Background
The functional test equipment of the VCU of the new energy automobile controller mainly comprises a test host, a test fixture, test software and the like. The test host comprises a host, a signal conversion device, a power supply unit, an IO interface and the like, wherein the signal conversion device is mainly connected through a terminal, a connector, a wiring harness and the like, signals are transmitted to the host after being converted for multiple times, and functional tests are executed through software, so that the problem of instability of the signals in the functional tests is caused.
After arrangement, the main problems of the prior art are as follows:
1. the FCT function test system comprises a plurality of connecting terminals, wherein each testing channel corresponds to one connecting terminal in the FCT function test, the connecting terminals are connected to an IO interface through the terminals, and the IO interface is connected to a signal end through a connector, so that the terminals and the connection relation in the signal conversion process are complex, and the integrity and the stability of signals are poor;
2. the expansibility is poor, signal conversion is based on point-to-point, the number and connection of test channels are fixed, and the test channels and hardware connection are required to be added due to the increase of test signals or types, so that the signal expansion operation is complex under the condition of more test items, and the rapid expansion of the test channels cannot be realized;
3. the test stability is poor, the cable and the terminal in the FCT test equipment are mainly connected in a crimping mode at present, the FCT test equipment belongs to hard connection, and the signal stability in the test process is influenced due to virtual connection caused by vibration in the equipment transportation or test process;
4. the universality is poor, the existing equipment basically does not support the FCT/EOL compatible test, namely, one set of equipment cannot realize the FCT test and the EOL test at the same time and cannot realize the universality test.
SUMMERY OF THE UTILITY MODEL
In order to solve at least one of the above problems, a first aspect of the present invention provides a VCU function test signal conversion apparatus, including: the signal conversion module comprises a plurality of conversion circuits integrated on a circuit board, wherein the types of the conversion circuits are different from each other; each conversion circuit can be coupled with external test signal hardware of a corresponding type, so that the test signal of the corresponding type is converted into a conversion signal, and the conversion signal is a signal obtained by optimizing the test signal; and the VCU connector can be coupled with an external VCU product to be tested and outputs a conversion signal to the VCU product to be tested.
In some preferred embodiments, the signal conversion apparatus further comprises: and the signal conversion test interface corresponds to each conversion circuit, and each conversion circuit is coupled with the external test signal hardware through the signal conversion test interface.
In some preferred embodiments, the conversion circuit comprises: at least a plurality of analog signal conversion circuits, digital signal conversion circuits, PWM signal conversion circuits, high-side and low-side drive signal conversion circuits, power conversion circuits, CAN signal conversion circuits, and LIN signal conversion circuits.
In some preferred embodiments, the analog signal conversion circuit includes: an AI analog input circuit and an AO analog output circuit.
In some preferred embodiments, the AI analog input circuit includes:
testing a hardware AI signal input port and a jig end AI signal input port;
two resistors coupled in series between the test hardware AI signal input port and the fixture end AI signal input port;
one end of the first branch of the AI analog input circuit is coupled between the fixture end AI signal input port and the resistor close to the fixture end AI signal input port, the other end of the first branch is grounded, and a first capacitor is arranged on the first branch;
a second branch of the AI analog input circuit, one end of which is coupled between the two resistors, and the other end of which is coupled to a first voltage end, wherein a first diode is arranged on the second branch, the anode of the first diode is coupled to the one end of the second branch, and the cathode of the first diode is coupled to the first voltage end; and
one end of the third branch of the AI analog quantity input circuit is coupled between the test hardware AI signal input port and the resistor close to the test hardware AI signal input port, the other end of the third branch is grounded, and a second capacitor is arranged on the third branch;
the AO analog quantity output circuit includes:
testing a hardware AO signal output port and a jig port AO signal input port;
the first amplifier and the second amplifier are coupled between the test hardware AO signal output port and the jig end AO signal input port in series, the positive input ends of the first amplifier and the second amplifier are coupled between the test hardware AO signal output port and the jig end AO signal input port, the first amplifier is close to the test hardware AO signal output port, and the second amplifier is close to the jig end AO signal input port; the inverting input end of the first amplifier is grounded and is coupled with the output end of the first amplifier;
a first resistor in the AO analog output circuit disposed between the first amplifier and the test hardware AO signal output port;
the second resistor is arranged in the AO analog quantity output circuit of the reverse input end and the grounding end of the first amplifier;
a third resistor in the AO analog output circuit arranged on the connecting wire between the inverted input end and the output end of the first amplifier; and
a fourth resistor in the AO analog output circuit disposed between the first amplifier and the second amplifier.
In some preferred embodiments, the digital signal conversion circuit includes: a DI analog input circuit and a DO analog output circuit.
In some preferred embodiments, the DI analog input circuit includes:
a fixture end DI signal input port and a test hardware DI signal input port;
the inductor and the resistor are coupled between the DI signal input port of the fixture end and the DI signal input port of the test hardware in series, the inductor is close to the DI signal input port of the fixture end, and the resistor is close to the DI signal input port of the test hardware;
the first end and the second end of the MOS tube are coupled between the inductor and the resistor, and the grid electrode of the MOS tube is coupled with a second voltage end;
one end of the DI analog input circuit is coupled between the inductor and the first MOS tube, the other end of the DI analog input circuit is grounded, and a third capacitor is arranged on the first branch;
one end of the DI analog input circuit is coupled between the DI signal input port of the test hardware and the resistor, the other end of the DI analog input circuit is grounded, and a fourth capacitor is arranged on the second branch circuit;
the DO analog quantity output circuit comprises:
testing a hardware DO signal output port and a jig port AO signal input port;
the first triode, the first optocoupler and the second MOS tube are coupled in series between the test hardware AO signal output port and the jig end AO signal input port, the first triode is close to the test hardware DO signal input port, the second MOS tube is close to the jig end DO signal input port, the first optocoupler is arranged between the first triode and the second MOS tube, the first end of the first triode is coupled with the test hardware DO signal output port, the second end of the first triode is coupled with a third voltage end, the third end of the first triode is coupled with the first optocoupler, the first end of the second MOS tube is coupled with the jig end DO signal input port, the second end of the second MOS tube is coupled with a fourth voltage end, and the third end of the second MOS tube is coupled with the first optocoupler;
the first resistor is arranged in the DO analog quantity output circuit on a connecting wire between the third end of the first triode and the grounding end;
the second resistor is arranged in a DO analog quantity output circuit on a connecting wire between the third end of the first triode and the first optocoupler; and
and the third resistor is arranged in a DO analog quantity output circuit on a connecting wire between the first optical coupler and the second end of the second MOS tube.
In some preferred embodiments, the PWM signal conversion circuit includes a PWM signal output circuit;
the PWM signal output circuit includes:
testing a hardware PWM signal output port and a jig end PWM signal input port;
a first resistance-capacitance filter, a second triode, a second optical coupler, a third MOS tube and a second resistance-capacitance filter which are coupled in series between the test hardware PWM signal output port and the jig end PWM signal input port, wherein the first resistance-capacitance filter is close to the test hardware PWM signal output port, the second resistance-capacitance filter is close to the jig end PWM signal input port, the second triode is coupled with the first resistance-capacitance filter, the second optical coupler is arranged between the second triode and the second resistance-capacitance filter, the first end of the second triode is coupled with the test hardware PWM signal output port, the second end of the second triode is connected with a digital ground, the third end of the second triode is coupled with the input end of the second optical coupler, the first end of the third MOS tube is coupled with the jig end PWM signal input port, and the second end of the third MOS tube is coupled with the second resistance-capacitance filter, the third end of the third MOS tube is grounded;
the first resistor is arranged in the PWM signal output circuit on a connecting wire between the input end of the second optocoupler and the fifth voltage end;
and the second resistor is arranged in the PWM signal output circuit on a connecting wire between the output end of the second optocoupler and the cathode of the second diode.
In some preferred embodiments, the high-side low-side drive signal circuit includes a high-side signal input conversion circuit and a low-side signal input conversion circuit;
the high-side signal input conversion circuit includes:
testing a hardware DO signal output port and a jig end high-side driving signal input port;
a third diode and a relay coupled in parallel between the test hardware DO signal output port and the jig end high-side driving signal input port, wherein the anode of the third diode is coupled with the test hardware DO signal output port, the cathode of the third diode is grounded, one end of a relay coil end is coupled with the test hardware DO signal output port, the other end of the relay coil end is grounded, one end of a relay switch end is coupled with the jig end high-side driving signal input port, and the other end of the relay switch end is grounded;
a first resistor in the high-side signal input conversion circuit arranged on a connecting wire between the test hardware DO signal output port and the third diode;
the second resistor is arranged between the relay switch end and the corresponding grounding end, and the high-side signal is input into the conversion circuit;
the low-side signal input conversion circuit includes:
testing a hardware DO signal output port and a jig end low-side driving signal input port;
a fourth diode and a relay coupled in parallel between the test hardware DO signal output port and the jig end low-side driving signal input port, wherein the anode of the fourth diode is coupled with the test hardware DO signal output port, the cathode of the fourth diode is grounded, one end of a relay coil end is coupled with the test hardware DO signal output port, the other end of the relay coil end is grounded, one end of a relay switch end is coupled with the jig end low-side driving signal input port, and the other end of the relay switch end is coupled with a sixth voltage end;
a first resistor in the low-side signal input conversion circuit arranged on a connecting wire between the test hardware DO signal output port and the third diode;
and the low-side signal input conversion circuit is connected with the low-side driving signal input port of the jig end through a second resistor.
A second aspect of the present invention provides a VCU function test signal conversion system, which includes a signal conversion device, test signal hardware, and a test host; the signal conversion apparatus includes: the signal conversion module comprises a plurality of conversion circuits integrated on a circuit board, wherein the types of the conversion circuits are different from each other; each conversion circuit can be coupled with the corresponding type of test signal hardware, so that the corresponding type of test signal is converted into a conversion signal, and the conversion signal is a signal obtained by optimizing the test signal; and
the VCU connector can be coupled with the VCU product to be tested and outputs a conversion signal to the VCU product to be tested;
the test host is coupled to the test signal hardware.
The beneficial effects of the utility model
The utility model provides a VCU functional test signal conversion equipment and conversion system, conversion equipment includes: a signal conversion module including a plurality of conversion circuits integrated on a circuit board, each of the conversion circuits being different in type from each other; each conversion circuit can be coupled with external test signal hardware of a corresponding type, so that the test signal of the corresponding type is converted into a conversion signal, and the conversion signal is a signal obtained by optimizing the test signal; and the VCU connector can be coupled with the outside VCU product that awaits measuring to VCU product output switching signal awaits measuring, the utility model discloses with a plurality of converting circuit welding on a circuit board, the integrated level is high, effectively reduces testing arrangement's size, simplifies the equipment process, has optimized the signal conversion process, shortens equipment development time, has improved efficiency of software testing, and operates more simply, need not change the hardware connection, promotes the test flexibility.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 shows a schematic diagram of a VCU functional test signal conversion apparatus according to an embodiment of the present invention.
Fig. 2 shows a schematic layout of an interface of a VCU functional test signal conversion apparatus according to an embodiment of the present invention.
Fig. 3 shows a schematic diagram of a VCU functional test signal conversion apparatus according to an embodiment of the present invention.
Fig. 4 is a schematic diagram of an AI analog input circuit according to an embodiment of the present invention.
Fig. 5 shows a schematic diagram of an AO analog output circuit according to an embodiment of the present invention.
Fig. 6 is a schematic diagram of a DI analog input circuit according to an embodiment of the present invention.
Fig. 7 is a schematic diagram of a DO analog output circuit according to an embodiment of the present invention.
Fig. 8 shows a schematic diagram of a PWM signal output circuit according to an embodiment of the present invention.
Fig. 9 is a schematic diagram of a high-side signal input conversion circuit according to an embodiment of the present invention.
Fig. 10 is a schematic diagram of a low-side signal input conversion circuit according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work all belong to the protection scope of the present invention.
The following disclosure provides many different embodiments, or examples, for implementing different features of the invention. Specific examples of components and arrangements are described below to simplify the present disclosure. Of course, these are merely examples and are not intended to limit the present invention. For example, in the following description, "coupling" of a first component and a second component may include embodiments in which the first component and the second component are formed in direct contact, and may also include embodiments in which additional components may be formed between the first component and the second component, such that the first component and the second component may not be in direct contact, for example, a and B coupling, and possible embodiments thereof include: a and B are directly electrically connected or signal-connected, and A and B can conduct signals mutually; or a and B are connected by a wire, in which case a and B are indirect electrical or signal connections, but a and B may conduct signals to each other. In addition, the technical solutions in the embodiments can be combined with each other, but it must be based on the realization of those skilled in the art, and when the technical solutions are contradictory or can not be realized, the combination of the technical solutions should not be considered to exist, and is not within the protection scope of the present invention.
As shown in fig. 1, the functional test device of the VCU of the new energy automobile controller mainly includes a test host, a test fixture, test software, and the like. The testing host comprises a host, a signal conversion device, a power supply unit, an IO interface and the like, wherein the signal conversion device is mainly connected through terminals, connectors, wiring harnesses and the like, signals are transmitted to the host after being converted for multiple times, functional testing is executed through software, and after arrangement, the problems of multiple connecting terminals, poor expansibility, poor testing stability, poor universality and the like exist in the FCT testing of the new energy automobile at present.
It is understood that FCT (functional Test) refers to a Test method for providing a simulated operating environment (excitation and load) for a Test target board (UUT: Unit Under Test) to operate in various design states, and acquiring parameters of each state to verify the function of the UUT. Simply put, the UUT is loaded with the appropriate stimulus and the output response is measured for compliance. And after the FCT test is carried out, the functional effect of a single element, a circuit board and a system is checked under the condition of simulating normal use after power supply is provided.
In view of this, the utility model provides a VCU functional test signal conversion equipment and conversion system, conversion equipment includes: a signal conversion module including a plurality of conversion circuits integrated on a circuit board, each of the conversion circuits being different in type from each other; each conversion circuit can be coupled with external test signal hardware of a corresponding type, so that the test signal of the corresponding type is converted into a conversion signal, and the conversion signal is a signal obtained by optimizing the test signal; and the VCU connector can be coupled with an external VCU product to be tested and outputs a conversion signal to the VCU product to be tested.
The utility model discloses with a plurality of switching circuit welding on a circuit board, the integrated level is high, effectively reduces testing arrangement's size, simplifies the equipment process, has optimized the signal conversion process, shortens equipment development time, has improved efficiency of software testing, and the operation is simpler, need not change the hardware connection, promotes the test flexibility.
Fig. 2 is a schematic diagram of a VCU functional test signal conversion apparatus according to an embodiment of the present invention, the apparatus includes a plurality of conversion circuits integrated on a same circuit board, each conversion circuit is different in type from another conversion circuit, and each conversion circuit can be coupled to an external corresponding type of test signal hardware, when a test host sends a test signal, each corresponding conversion circuit converts the corresponding type of test signal into a conversion signal, and the conversion signal optimizes a filtered signal for the test signal; the VCU connector is coupled on the circuit board and can be coupled with an external VCU product to be tested in a matching mode, and the VCU connector outputs a conversion signal to the VCU product to be tested.
The signal conversion device is used as a medium for connecting a VCU product and upper computer test hardware and is mainly used for realizing intermediate conversion of test signals (input and output), the signal conversion device is divided into a front side and a back side based on circuit board design, electronic elements (resistors, capacitors, inductors and the like) are arranged on the two sides of the circuit board, signal interfaces are arranged on the periphery of the circuit board, a signal conversion module is coupled with the VCU product through a VCU connector, when the signal conversion device is used, signals at the end of the VCU product are led into the signal conversion device through the connector, and the signal interface end of the conversion device is coupled with the test signal hardware (board card, universal meter, oscilloscope and the like), so that a complete VCU function test flow is realized.
Preferably, as shown in fig. 3, the VCU connector can be disposed at the outer edge of the circuit board, and is welded on the same circuit board with a plurality of conversion circuits, so that the intermediate connector is not needed for switching, the integration level is high, the size of the testing device is effectively reduced, the assembly process is simplified, and the testing flexibility is improved.
With continued reference to fig. 3, in some preferred embodiments, the signal conversion apparatus further includes: and each conversion circuit corresponds to an input interface and an output interface of each conversion circuit, and is coupled with the external test signal hardware through the input interface and the output interface.
It should be noted that the number of interfaces on the circuit board of the test conversion device is not limited to the number of interfaces in the drawing; the interface on the test conversion device adopts an asymmetric structure arrangement interface, and can also use a symmetric layout; the type of interface, the number of pins of the interface, the pin size are not limited to those shown in the figures; the test conversion device is in a rectangular PCB with round corners, and the shape is not limited to rectangle, circle, ellipse or irregular shape; the arrangement of the test interfaces is distinguished according to the signal types, and the signal type arrangement order is not limited to the order described above, and the order can be adjusted as shown in the figure.
On the circuit board shown in fig. 3, a signal conversion module, a signal conversion test interface, and a VCU interface connector are integrated. The signal conversion module is provided with an analog signal conversion circuit, a digital signal conversion circuit, a PWM signal circuit, a CAN signal, a LIN signal, a power supply circuit and the like according to functions; the signal conversion test interface comprises AI, AO, DI, DO, PWM, high-side and low-side signal interfaces and a VCU product signal input/output interface; the VCU product signal input and output are matched with the VCU product connector and are connected through a finished CABLE CABLE, and the signal conversion test interface is connected to the test hardware module IO through the CABLE CABLE, so that the signal conversion process is simplified, the equipment development time is shortened, and the test efficiency is improved.
Preferably, different types of signal conversion test interfaces are uniform, namely different types of signals are output to the same interface by test hardware, the set number of the interfaces can be consistent with the number of the hardware, but the types of the interfaces are the same, the hardware and the interfaces can be connected at will, the types of the interfaces are defined through the input signals, wiring and connection change do not need to be carried out on each path of signals, and the integrity of the signal conversion process is ensured. By means of the unified interface, the point-to-point connection mode in the prior art is avoided, one-to-one correspondence is not needed, so that the problem of wrong connection is avoided, and high efficiency is ensured.
In some preferred embodiments, the conversion circuit comprises: at least a plurality of analog signal conversion circuits, digital signal conversion circuits, PWM signal conversion circuits, high-side and low-side drive signal conversion circuits, power conversion circuits, CAN signal conversion circuits, and LIN signal conversion circuits.
In some preferred embodiments, the analog signal conversion circuit includes: an AI analog input circuit and an AO analog output circuit.
As shown in fig. 4, in some preferred embodiments, the AI analog input circuit includes:
testing a hardware AI signal input port and a jig end AI signal input port;
two resistors coupled in series between the test hardware AI signal input port and the fixture end AI signal input port;
one end of the first branch of the AI analog input circuit is coupled between the fixture end AI signal input port and the resistor close to the fixture end AI signal input port, the other end of the first branch is grounded, and a first capacitor is arranged on the first branch;
a second branch of the AI analog input circuit, one end of which is coupled between the two resistors, and the other end of which is coupled to a first voltage end, wherein a first diode is arranged on the second branch, the anode of the first diode is coupled to the one end of the second branch, and the cathode of the first diode is coupled to the first voltage end; and
and one end of the third branch of the AI analog quantity input circuit is coupled between the test hardware AI signal input port and the resistor close to the test hardware AI signal input port, the other end of the third branch is grounded, and a second capacitor is arranged on the third branch.
As shown in fig. 5, in some preferred embodiments, the AO analog output circuit includes:
testing a hardware AO signal output port and a jig port AO signal input port;
the first amplifier and the second amplifier are coupled between the test hardware AO signal output port and the jig end AO signal input port in series, the positive input ends of the first amplifier and the second amplifier are coupled between the test hardware AO signal output port and the jig end AO signal input port, the first amplifier is close to the test hardware AO signal output port, and the second amplifier is close to the jig end AO signal input port; the inverting input end of the first amplifier is grounded and is coupled with the output end of the first amplifier;
a first resistor in the AO analog output circuit disposed between the first amplifier and the test hardware AO signal output port;
the second resistor is arranged in the AO analog quantity output circuit of the reverse input end and the grounding end of the first amplifier;
a third resistor in the AO analog output circuit arranged on the connecting wire between the inverted input end and the output end of the first amplifier; and
a fourth resistor in the AO analog output circuit disposed between the first amplifier and the second amplifier.
In some preferred embodiments, the digital signal conversion circuit includes: a DI analog input circuit and a DO analog output circuit.
As shown in fig. 6, in some preferred embodiments, the DI analog input circuit includes:
a fixture end DI signal input port and a test hardware DI signal input port;
the inductor and the resistor are coupled between the DI signal input port of the fixture end and the DI signal input port of the test hardware in series, the inductor is close to the DI signal input port of the fixture end, and the resistor is close to the DI signal input port of the test hardware;
the first end and the second end of the MOS tube are coupled between the inductor and the resistor, and the grid electrode of the MOS tube is coupled with a second voltage end;
one end of the DI analog input circuit is coupled between the inductor and the first MOS tube, the other end of the DI analog input circuit is grounded, and a third capacitor is arranged on the first branch;
one end of the second branch of the DI analog quantity input circuit is coupled between the DI signal input port of the test hardware and the resistor, the other end of the second branch of the DI analog quantity input circuit is grounded, and a fourth capacitor is arranged on the second branch.
As shown in fig. 7, in some preferred embodiments, the DO analog output circuit includes:
testing a hardware DO signal output port and a jig port AO signal input port;
the first triode, the first optocoupler and the second MOS tube are coupled in series between the test hardware AO signal output port and the jig end AO signal input port, the first triode is close to the test hardware DO signal input port, the second MOS tube is close to the jig end DO signal input port, the first optocoupler is arranged between the first triode and the second MOS tube, the first end of the first triode is coupled with the test hardware DO signal output port, the second end of the first triode is coupled with a third voltage end, the third end of the first triode is coupled with the first optocoupler, the first end of the second MOS tube is coupled with the jig end DO signal input port, the second end of the second MOS tube is coupled with a fourth voltage end, and the third end of the second MOS tube is coupled with the first optocoupler;
the first resistor is arranged in the DO analog quantity output circuit on a connecting wire between the third end of the first triode and the grounding end;
the second resistor is arranged in a DO analog quantity output circuit on a connecting wire between the third end of the first triode and the first optocoupler; and
and the third resistor is arranged in a DO analog quantity output circuit on a connecting wire between the first optical coupler and the second end of the second MOS tube.
As shown in fig. 8, in some preferred embodiments, the PWM signal conversion circuit includes a PWM signal output circuit;
the PWM signal output circuit includes:
testing a hardware PWM signal output port and a jig end PWM signal input port;
a first resistance-capacitance filter, a second triode, a second optical coupler, a third MOS tube and a second resistance-capacitance filter which are coupled in series between the test hardware PWM signal output port and the jig end PWM signal input port, wherein the first resistance-capacitance filter is close to the test hardware PWM signal output port, the second resistance-capacitance filter is close to the jig end PWM signal input port, the second triode is coupled with the first resistance-capacitance filter, the second optical coupler is arranged between the second triode and the second resistance-capacitance filter, the first end of the second triode is coupled with the test hardware PWM signal output port, the second end of the second triode is connected with a digital ground, the third end of the second triode is coupled with the input end of the second optical coupler, the first end of the third MOS tube is coupled with the jig end PWM signal input port, and the second end of the third MOS tube is coupled with the second resistance-capacitance filter, the third end of the third MOS tube is grounded;
the first resistor is arranged in the PWM signal output circuit on a connecting wire between the input end of the second optocoupler and the fifth voltage end;
and the second resistor is arranged in the PWM signal output circuit on a connecting wire between the output end of the second optocoupler and the cathode of the second diode.
In some preferred embodiments, the high-side and low-side drive signal circuit includes a high-side signal input conversion circuit and a low-side signal input conversion circuit.
In some preferred embodiments, as shown in fig. 9, the high-side signal input conversion circuit includes:
testing a hardware DO signal output port and a jig end high-side driving signal input port;
a third diode and a relay coupled in parallel between the test hardware DO signal output port and the jig end high-side driving signal input port, wherein the anode of the third diode is coupled with the test hardware DO signal output port, the cathode of the third diode is grounded, one end of a relay coil end is coupled with the test hardware DO signal output port, the other end of the relay coil end is grounded, one end of a relay switch end is coupled with the jig end high-side driving signal input port, and the other end of the relay switch end is grounded;
a first resistor in the high-side signal input conversion circuit arranged on a connecting wire between the test hardware DO signal output port and the third diode;
and the high-side signal arranged between the relay switch end and the corresponding grounding end is input into a second resistor in the conversion circuit.
As shown in fig. 10, in some preferred embodiments, the low-side signal input conversion circuit includes:
testing a hardware DO signal output port and a jig end low-side driving signal input port;
a fourth diode and a relay coupled in parallel between the test hardware DO signal output port and the jig end low-side driving signal input port, wherein the anode of the fourth diode is coupled with the test hardware DO signal output port, the cathode of the fourth diode is grounded, one end of a relay coil end is coupled with the test hardware DO signal output port, the other end of the relay coil end is grounded, one end of a relay switch end is coupled with the jig end low-side driving signal input port, and the other end of the relay switch end is coupled with a sixth voltage end;
a first resistor in the low-side signal input conversion circuit arranged on a connecting wire between the test hardware DO signal output port and the third diode;
and the low-side signal input conversion circuit is connected with the low-side driving signal input port of the jig end through a second resistor.
Preferably, the test conversion device is connected with the test fixture and the test hardware only by using CABLE CABLEs, namely each CABLE CABLE comprises a plurality of test channels, a connector part can be understood as a plurality of pin needles, the number of the pin needles is adjusted according to expansion requirements, and when the test channels need to be expanded, the channels can be automatically defined and expanded only by configuring Labview software.
The utility model discloses signal conversion equipment among the embodiment supports FCT and EOL's compatible test, and test conversion equipment is used in the test, only needs to be equipped with corresponding test fixture when carrying out the test, and testing arrangement can realize multiplexing and the functional test's of passageway compatibility.
Above-mentioned detailed description, can know, the utility model provides a VCU functional test signal conversion equipment's advantage mainly embodies in following aspect:
1. effectively reduce test conversion equipment's size, adopt integrated circuit board's technique, abandon the thought of the binding post + cable that adopts among the prior art, realize signal conversion unit's high integration, effectively reduce test equipment and test conversion equipment's size.
2. The configuration is flexible, the connection between the test equipment and the signal conversion unit is simplified by adopting the uniform interface and the connector, the configuration of the IO interface is more flexible and convenient, the operation is simpler, the hardware connection is not required to be changed, and the test flexibility is improved.
3. The efficiency is improved, and based on the design of integrated circuit board, the signal conversion module is integrated on the circuit board, so that the time of manual design and assembly is saved and shortened, the assembly process is simplified, and the efficiency is improved.
Further, in another aspect of the present invention, based on the same inventive concept, a VCU function test signal conversion system can be provided, which includes a signal conversion device, test signal hardware, and a test host; the signal conversion apparatus includes:
the signal conversion module comprises a plurality of conversion circuits integrated on a circuit board, wherein the types of the conversion circuits are different from each other; each conversion circuit can be coupled with the corresponding type of test signal hardware, so that the corresponding type of test signal is converted into a conversion signal, and the conversion signal is a signal obtained by optimizing the test signal; and
the VCU connector can be coupled with the VCU product to be tested and outputs a conversion signal to the VCU product to be tested;
the test host is coupled to the test signal hardware.
Can know, the utility model provides a conversion system welds a plurality of converting circuit on a circuit board, and the integrated level is high, effectively reduces testing arrangement's size, simplifies the equipment process, has optimized the signal conversion process, shortens equipment development time, has improved efficiency of software testing, and operates simplyr, need not change the hardware connection, promotes the test flexibility.
In the description of the present specification, reference to the description of the terms "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the embodiments of the present specification. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example.
Furthermore, the various embodiments or examples and features of the various embodiments or examples described in this specification can be combined and combined by those skilled in the art without contradiction. The above description is only an embodiment of the present disclosure, and is not intended to limit the present disclosure. Various modifications and changes may occur to those skilled in the art to which the embodiments of the present disclosure pertain. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the embodiments of the present specification should be included in the scope of the claims of the embodiments of the present specification.
Claims (10)
1. A VCU functional test signal conversion apparatus, comprising:
the signal conversion module comprises a plurality of conversion circuits integrated on a circuit board, wherein the types of the conversion circuits are different from each other; each conversion circuit can be coupled with external test signal hardware of a corresponding type, so that the test signal of the corresponding type is converted into a conversion signal, and the conversion signal is a signal obtained by optimizing the test signal; and
and the VCU connector can be coupled with an external VCU product to be tested and outputs a conversion signal to the VCU product to be tested.
2. The signal conversion apparatus of claim 1, further comprising:
and the signal conversion test interface corresponds to each conversion circuit, and each conversion circuit is coupled with the external test signal hardware through the signal conversion test interface.
3. The signal conversion apparatus of claim 1, wherein the conversion circuit comprises: at least a plurality of analog signal conversion circuits, digital signal conversion circuits, PWM signal conversion circuits, high-side and low-side drive signal conversion circuits, power conversion circuits, CAN signal conversion circuits, and LIN signal conversion circuits.
4. The signal conversion apparatus of claim 3, wherein the analog signal conversion circuit comprises: an AI analog input circuit and an AO analog output circuit.
5. The signal conversion apparatus of claim 4,
the AI analog input circuit includes:
testing a hardware AI signal input port and a jig end AI signal input port;
two resistors coupled in series between the test hardware AI signal input port and the fixture end AI signal input port;
one end of the first branch of the AI analog input circuit is coupled between the fixture end AI signal input port and the resistor close to the fixture end AI signal input port, the other end of the first branch is grounded, and a first capacitor is arranged on the first branch;
a second branch of the AI analog input circuit, one end of which is coupled between the two resistors, and the other end of which is coupled to a first voltage end, wherein a first diode is arranged on the second branch, the anode of the first diode is coupled to the one end of the second branch, and the cathode of the first diode is coupled to the first voltage end; and
one end of the third branch of the AI analog quantity input circuit is coupled between the test hardware AI signal input port and the resistor close to the test hardware AI signal input port, the other end of the third branch is grounded, and a second capacitor is arranged on the third branch;
the AO analog quantity output circuit includes:
testing a hardware AO signal output port and a jig port AO signal input port;
the first amplifier and the second amplifier are coupled between the test hardware AO signal output port and the jig end AO signal input port in series, the positive input ends of the first amplifier and the second amplifier are coupled between the test hardware AO signal output port and the jig end AO signal input port, the first amplifier is close to the test hardware AO signal output port, and the second amplifier is close to the jig end AO signal input port; the inverting input end of the first amplifier is grounded and is coupled with the output end of the first amplifier;
a first resistor in the AO analog output circuit disposed between the first amplifier and the test hardware AO signal output port;
the second resistor is arranged in the AO analog quantity output circuit of the reverse input end and the grounding end of the first amplifier;
a third resistor in the AO analog output circuit arranged on the connecting wire between the inverted input end and the output end of the first amplifier; and
a fourth resistor in the AO analog output circuit disposed between the first amplifier and the second amplifier.
6. The signal conversion apparatus of claim 3, wherein the digital signal conversion circuit comprises: a DI analog input circuit and a DO analog output circuit.
7. The signal conversion apparatus of claim 6,
the DI analog input circuit includes:
a fixture end DI signal input port and a test hardware DI signal input port;
the inductor and the resistor are coupled between the DI signal input port of the fixture end and the DI signal input port of the test hardware in series, the inductor is close to the DI signal input port of the fixture end, and the resistor is close to the DI signal input port of the test hardware;
the first end and the second end of the MOS tube are coupled between the inductor and the resistor, and the grid electrode of the MOS tube is coupled with a second voltage end;
one end of the DI analog input circuit is coupled between the inductor and the first MOS tube, the other end of the DI analog input circuit is grounded, and a third capacitor is arranged on the first branch;
one end of the DI analog input circuit is coupled between the DI signal input port of the test hardware and the resistor, the other end of the DI analog input circuit is grounded, and a fourth capacitor is arranged on the second branch circuit;
the DO analog quantity output circuit comprises:
testing a hardware DO signal output port and a jig port AO signal input port;
the first triode, the first optocoupler and the second MOS tube are coupled in series between the test hardware AO signal output port and the jig end AO signal input port, the first triode is close to the test hardware DO signal input port, the second MOS tube is close to the jig end DO signal input port, the first optocoupler is arranged between the first triode and the second MOS tube, the first end of the first triode is coupled with the test hardware DO signal output port, the second end of the first triode is coupled with a third voltage end, the third end of the first triode is coupled with the first optocoupler, the first end of the second MOS tube is coupled with the jig end DO signal input port, the second end of the second MOS tube is coupled with a fourth voltage end, and the third end of the second MOS tube is coupled with the first optocoupler;
the first resistor is arranged in the DO analog quantity output circuit on a connecting wire between the third end of the first triode and the grounding end;
the second resistor is arranged in a DO analog quantity output circuit on a connecting wire between the third end of the first triode and the first optocoupler; and
and the third resistor is arranged in a DO analog quantity output circuit on a connecting wire between the first optical coupler and the second end of the second MOS tube.
8. The signal conversion apparatus according to claim 3, wherein the PWM signal conversion circuit includes a PWM signal output circuit;
the PWM signal output circuit includes:
testing a hardware PWM signal output port and a jig end PWM signal input port;
a first resistance-capacitance filter, a second triode, a second optical coupler, a third MOS tube and a second resistance-capacitance filter which are coupled in series between the test hardware PWM signal output port and the jig end PWM signal input port, wherein the first resistance-capacitance filter is close to the test hardware PWM signal output port, the second resistance-capacitance filter is close to the jig end PWM signal input port, the second triode is coupled with the first resistance-capacitance filter, the second optical coupler is arranged between the second triode and the second resistance-capacitance filter, the first end of the second triode is coupled with the test hardware PWM signal output port, the second end of the second triode is connected with a digital ground, the third end of the second triode is coupled with the input end of the second optical coupler, the first end of the third MOS tube is coupled with the jig end PWM signal input port, and the second end of the third MOS tube is coupled with the second resistance-capacitance filter, the third end of the third MOS tube is grounded;
the first resistor is arranged in the PWM signal output circuit on a connecting wire between the input end of the second optocoupler and the fifth voltage end;
and the second resistor is arranged in the PWM signal output circuit on a connecting wire between the output end of the second optocoupler and the cathode of the second diode.
9. The signal conversion apparatus of claim 3, wherein the high-side and low-side driving signal circuit comprises a high-side signal input conversion circuit and a low-side signal input conversion circuit;
the high-side signal input conversion circuit includes:
testing a hardware DO signal output port and a jig end high-side driving signal input port;
a third diode and a relay coupled in parallel between the test hardware DO signal output port and the jig end high-side driving signal input port, wherein the anode of the third diode is coupled with the test hardware DO signal output port, the cathode of the third diode is grounded, one end of a relay coil end is coupled with the test hardware DO signal output port, the other end of the relay coil end is grounded, one end of a relay switch end is coupled with the jig end high-side driving signal input port, and the other end of the relay switch end is grounded;
a first resistor in the high-side signal input conversion circuit arranged on a connecting wire between the test hardware DO signal output port and the third diode;
the second resistor is arranged between the relay switch end and the corresponding grounding end, and the high-side signal is input into the conversion circuit;
the low-side signal input conversion circuit includes:
testing a hardware DO signal output port and a jig end low-side driving signal input port;
a fourth diode and a relay coupled in parallel between the test hardware DO signal output port and the jig end low-side driving signal input port, wherein the anode of the fourth diode is coupled with the test hardware DO signal output port, the cathode of the fourth diode is grounded, one end of a relay coil end is coupled with the test hardware DO signal output port, the other end of the relay coil end is grounded, one end of a relay switch end is coupled with the jig end low-side driving signal input port, and the other end of the relay switch end is coupled with a sixth voltage end;
a first resistor in the low-side signal input conversion circuit arranged on a connecting wire between the test hardware DO signal output port and the third diode;
and the low-side signal input conversion circuit is connected with the low-side driving signal input port of the jig end through a second resistor.
10. A VCU function test signal conversion system is characterized by comprising a signal conversion device, test signal hardware and a test host; the signal conversion apparatus includes:
the signal conversion module comprises a plurality of conversion circuits integrated on a circuit board, wherein the types of the conversion circuits are different from each other; each conversion circuit can be coupled with the corresponding type of test signal hardware, so that the corresponding type of test signal is converted into a conversion signal, and the conversion signal is a signal obtained by optimizing the test signal; and
the VCU connector can be coupled with the VCU product to be tested and outputs a conversion signal to the VCU product to be tested;
the test host is coupled to the test signal hardware.
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| CN113341938A (en) * | 2021-07-01 | 2021-09-03 | 阳光电源股份有限公司 | Automobile controller test system and control method thereof |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113341938A (en) * | 2021-07-01 | 2021-09-03 | 阳光电源股份有限公司 | Automobile controller test system and control method thereof |
| CN113341938B (en) * | 2021-07-01 | 2023-08-15 | 阳光电源股份有限公司 | Automobile controller testing system and control method thereof |
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