CN115684015A - Chip appearance detection mechanism - Google Patents
Chip appearance detection mechanism Download PDFInfo
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- CN115684015A CN115684015A CN202211357862.0A CN202211357862A CN115684015A CN 115684015 A CN115684015 A CN 115684015A CN 202211357862 A CN202211357862 A CN 202211357862A CN 115684015 A CN115684015 A CN 115684015A
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Abstract
The invention discloses a chip appearance detection mechanism, which relates to the technical field of chip appearance detection and comprises a test platform, a chute base and a test seat body, wherein the chute base and the test seat body are arranged on the test platform, a mounting groove is formed in the inner wall of the bottom of the chute base, the inner wall of the mounting groove is connected with an auxiliary adjusting mechanism, the auxiliary adjusting mechanism is respectively connected with a mounting block and two supporting rods, and a connecting block is arranged on the outer wall of the top of the mounting block. The chip appearance detection mechanism disclosed by the invention utilizes the shadow imaging formed by vertical irradiation to detect the pins of the chip, has more comprehensive and sufficient effect, effectively standardizes the deflection limit of the pins of the CPU and reduces the fault rate of the CPU.
Description
Technical Field
The invention relates to the technical field of chip appearance detection, in particular to a chip appearance detection mechanism.
Background
With the development progress of the science and technology industry, chips become smaller and more advanced, the chips exist in the form of a computer CPU in the application of computer products, pins of the computer CPU are integrally distributed according to a rectangle, meanwhile, the pins of the CPU are arranged in order, after the CPU is produced, the detection needs to be carried out on the overall appearance of the CPU, and the situation that the structure similar to the pins of the CPU is bent and deformed to influence the installation of internal elements of the computer is avoided.
Patent document with application number CN202010818568.X discloses a chip appearance detection mechanism, relates to chip appearance detection technical field, and this chip appearance detection mechanism includes the radio frequency circuit board, and radio frequency circuit board surface is provided with at least one radio frequency signal line and at least one radio frequency spliced pole, and the radio frequency spliced pole sets up with radio frequency signal line one-to-one and an organic whole, and the radio frequency spliced pole is connected with the chip electricity that awaits measuring. However, when the traditional chip appearance detection mechanism is used, only flaws such as CPU appearance abrasion and the like are mainly detected, in addition, only chip pins are detected in a simple distinguishing mode, the deflection degree of the CPU pins cannot be effectively standardized, and the detection effect is not in place; for example: when the partial stitch of the chip is large in deflection degree, on one hand, the chip can not be fully contacted with a corresponding element when in use, so that the work of a CPU (central processing unit) fails, and on the other hand, when the chip is installed, the deflected stitch can not correspond to a notch corresponding to the stitch, so that collision and extrusion are easy to occur, the deflection degree of the stitch is large, and the repair difficulty is large.
Disclosure of Invention
The invention discloses a chip appearance detection mechanism, aiming at solving the technical problems that the deflection degree of a CPU pin cannot be effectively normalized and the detection effect is not in place when the traditional chip appearance detection mechanism is used.
In order to achieve the purpose, the invention adopts the following technical scheme:
the chip appearance detection mechanism comprises a test platform, a chute base and a test seat body, wherein the chute base and the test seat body are arranged on the test platform, a mounting groove is formed in the inner wall of the bottom of the chute base, a threaded rod is arranged on the inner wall of the mounting groove, an auxiliary adjusting mechanism is connected onto the threaded rod, an installation block and two supporting rods are connected onto the auxiliary adjusting mechanism respectively, a connecting block is arranged on the outer wall of the top of the installation block, the top ends of the supporting rods are provided with limiting blocks, the same adjusting frame is arranged on the outer wall of one side, opposite to the limiting blocks, of the limiting blocks, a sliding ring is connected onto the inner wall of the adjusting frame in a sliding mode, fixing mechanisms distributed equidistantly are arranged on the inner wall of the circumference of the sliding ring, tooth grooves distributed equidistantly are formed in the outer wall of the circumference of the sliding ring, a fixing groove is formed in the outer wall of the top of the connecting block, a driving gear is connected onto the inner wall of the bottom of the fixing groove through a bearing, a fine adjustment screw rod is connected onto the inner wall of the installation block, a first thread sleeve block is arranged on the outer wall of the fine adjustment screw rod, a lamp tube is arranged on one side of the outer wall of the first thread sleeve, a side wall of the test platform is provided with a side plate, and a lamp light is arranged on one side of the background plate facing towards one side of the background plate.
In this scheme, compare in traditional chip outward appearance and detect, test procedure after still correcting except simple external detection, put into fixed establishment with the chip that awaits measuring earlier, open the fluorescent tube and use as the light source after that, the light source can be perpendicular to shine to the stitch of chip, the shadow that will shine simultaneously appears on the background board, then through the fine setting driving gear, the fixed chip of fine setting rotates under the meshing effect of driving gear and sliding ring outer wall tooth's socket, the shadow that appears is abundant comprehensive detects the chip stitch, through this preliminary testing procedure, whether comprehensive effectual judgement CPU stitch is crooked, meanwhile, put into the qualified CPU of stitch test and detect on the test seat body, the testing result is convincing more.
In a preferred aspect, the auxiliary adjustment mechanism includes: install the second thread sleeve block of threaded rod outer wall, be equipped with the installation pole on the top outer wall of second thread sleeve block, the top of installation pole is equipped with the fixed station, be equipped with two connecting rods on one side outer wall of fixed station, be equipped with micro motor on one side outer wall of test platform, micro motor's output shaft with the one end of threaded rod links to each other, two the one end of connecting rod respectively with two one side outer wall of bracing piece links to each other, the fixed station is located the top of installation pole.
The auxiliary adjusting mechanism who sets up can remove alignment jig and installation piece in step, in the preliminary detection process, can be close to the two or keep away from the background board and adjust towards the background board through auxiliary adjusting mechanism, changes the shadow definition through the distance of adjusting fluorescent tube light source and background board, guarantees that the formation of image can be clearer at the CPU stitch shadow of different light environment.
In a preferred aspect, the fixing mechanism includes: the novel sliding ring is characterized in that four inner bosses are symmetrically arranged on the inner wall of the circumference of the sliding ring, first reset springs distributed equidistantly are arranged on the inner wall of one side of each inner boss, one supporting pad is arranged at one end of each first reset spring, the supporting pads are far away from the outer wall of one side of each first reset spring and are arranged to be vertical folded angle structures, and the four supporting pads are matched for use.
The fixed establishment who sets up is located the sliding ring, places the chip in interior boss back, and four supporting pads that are perpendicular dog-ear structure will support the four corners of chip fixedly, when carrying out rotation regulation, the chip whole can be more stable.
In a preferable scheme, a correcting table is embedded in the outer wall of the top of the testing platform, a plurality of correcting grooves are arranged on the correcting table, and the inner diameter of each correcting groove is of a structure with a wide upper part and a narrow lower part.
The setting is corrected the groove on correcting the platform and is the same with the chip stitch distribution position that awaits measuring, and the difference wherein is that the notch internal diameter of correcting the groove will be greater than the diameter of stitch, and when the little chip stitch of crooked scope needs to be corrected, along with wide from top to bottom of correcting the groove narrow, the stitch of inserting gradually can be corrected the state of being the perpendicular to chip by correcting the groove, does benefit to follow-up test.
In a preferred scheme, there is the apron one side of test seat body top outer wall through hinged joint, be equipped with the sealing strip on the inside wall of apron, be equipped with the seal groove on the top outer wall of test seat body, the sealing strip with seal groove looks adaptation, be equipped with on the inside wall of apron and gather the chute, be connected with the reposition of redundant personnel passageway that the equidistance distributes on the circumference inner wall of gathering the chute, the central point of the top inner wall of gathering the chute puts and opens there is the derivation hole, install the hose on the inner wall of derivation hole, one side of test platform top outer wall still is equipped with the gas collection bottle that the equidistance distributes, a plurality of the top of gas collection bottle all is equipped with sealed lid, a plurality of one side of sealed lid top outer wall all is equipped with pipe, a plurality of the opposite side of sealed lid top outer wall is equipped with the rubber buffer, be equipped with valve, a plurality of on one side outer wall of pipe the one end of pipe is connected with same shunt tubes, the shunt tubes with the hose is linked together, be equipped with the display screen on one side outer wall of curb plate, just the display screen with test seat body electric connection.
The gas collecting bottle cooperation collection groove and the reposition of redundant personnel passageway that sets up form collection device, and the chip degree of generating heat is different when the chip is in the test procedure, and the collection device that sets up can be collected gas composition under the different environment of generating heat, then through examining respectively, confirms the security that the chip used, has avoided the chip to generate heat the back and produce harmful gas and cause the injury to the user.
In a preferred scheme, all be equipped with the mounting pad on the four corners inner wall of test seat body, four all be equipped with the telescopic link on one side outer wall of mounting pad, the one end of telescopic link piston rod all is equipped with the centre gripping pad, just the second reset spring has been cup jointed on the outer wall of telescopic link piston rod.
The second reset spring cooperation centre gripping pad that sets up can not only fix the centre gripping to the chip that awaits measuring inside the test seat body, can also play direction limiting displacement, is favorable to the correct insertion of chip stitch more, avoids stitch inserted position to make mistakes and causes the stitch to bend impaired.
From the above, a chip appearance detection mechanism comprises a test platform, a chute base and a test seat body, wherein the chute base and the test seat body are arranged on the test platform, a mounting groove is formed in the inner wall of the bottom of the chute base, a threaded rod is arranged on the inner wall of the mounting groove, an auxiliary adjusting mechanism is connected onto the threaded rod, an installation block and two support rods are respectively connected onto the auxiliary adjusting mechanism, a connecting block is arranged on the outer wall of the top of the installation block, limiting blocks are arranged at the top ends of the two support rods, the same adjusting frame is arranged on the outer wall of one side, opposite to the two limiting blocks, of the two limiting blocks, a sliding ring is connected onto the inner wall of the adjusting frame in a sliding manner, and fixing mechanisms distributed at equal intervals are arranged on the circumferential inner wall of the sliding ring, the testing device is characterized in that tooth grooves distributed equidistantly are formed in the circumferential outer wall of the sliding ring, a fixing groove is formed in the top outer wall of the connecting block, a driving gear is connected to the bottom inner wall of the fixing groove through a bearing, the driving gear is meshed with the tooth grooves in the outer wall of the sliding ring, a fine adjustment screw rod is connected to the inner wall of the mounting block through a bearing, a first thread sleeve block is arranged on the outer wall of the fine adjustment screw rod, a lamp tube is arranged on the outer wall of one side of the first thread sleeve block, a side plate is arranged on the outer wall of one side of the testing platform, the side plate is close to a background plate arranged on the outer wall of one side of the adjusting frame, and light of the lamp tube faces one side of the background plate. The chip appearance detection mechanism provided by the invention utilizes the shadow imaging formed by vertical irradiation to detect the pins of the chip, has more comprehensive and sufficient effect, effectively standardizes the deflection limit of the pins of the CPU and reduces the fault rate of the CPU.
Drawings
Fig. 1 is a schematic overall structure diagram of a chip appearance inspection mechanism according to the present invention.
Fig. 2 is a schematic view of an adjusting bracket mounting structure of a chip appearance inspection mechanism according to the present invention.
Fig. 3 is a schematic structural diagram of a fixing table of a chip appearance inspection mechanism according to the present invention.
Fig. 4 is a cross-sectional view of a side structure of a mounting block of a chip appearance inspection mechanism according to the present invention.
Fig. 5 is a slip ring installation structure diagram of a chip appearance inspection mechanism according to the present invention.
Fig. 6 is an enlarged schematic view of the invention at a in fig. 5.
Fig. 7 is a side view of a mounting rod mounting structure of a chip appearance inspection mechanism according to the present invention.
Fig. 8 is a cross-sectional structure diagram of a correction table of a chip appearance inspection mechanism according to the present invention.
Fig. 9 is an enlarged view of the structure of fig. 8 at B according to the present invention.
Fig. 10 is a structural diagram of a test socket body of a chip appearance inspection mechanism according to the present invention.
Fig. 11 is an enlarged view of fig. 10 at D according to the present invention.
Fig. 12 is an enlarged view of the structure of fig. 10 at C according to the present invention.
Fig. 13 is an enlarged view of fig. 10 at E according to the present invention.
In the figure: 1. a test platform; 2. a support frame; 3. a chute base; 4. a support bar; 5. a side plate; 6. a micro motor; 7. a correction table; 8. a test socket body; 9. a gas collection bottle; 10. a display screen; 11. a side slider; 12. a threaded rod; 13. a connecting rod; 14. mounting blocks; 15. a lamp tube; 16. a first fine tuning knob; 17. a limiting block; 18. an adjusting bracket; 20. connecting blocks; 21. a fixed table; 22. a second fine adjustment knob; 23. fine adjustment of the screw rod; 24. a first threaded bushing block; 25. a first bevel gear; 26. a second bevel gear; 27. a slip ring; 28. a tooth socket; 29. an inner boss; 30. a first return spring; 31. a support pad; 32. a driving gear; 33. a background plate; 34. mounting a rod; 36. a correction slot; 37. a cover plate; 38. a seal strip; 39. a sealing groove; 40. a collecting chute; 41. a flow dividing channel; 42. a lead-out hole; 43. a mounting pad; 44. a telescopic rod; 45. a second return spring; 46. a hose; 47. a shunt tube; 48. a valve; 49. a conduit; 50. a sealing cover; 51. a rubber plug; 52. a clamping pad.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.
The chip appearance detection mechanism disclosed by the invention is mainly applied to the situation that when the traditional chip appearance detection mechanism is used, the deflection degree of the pins of the CPU (Central processing Unit) cannot be effectively standardized, and the detection effect is not in place.
Referring to fig. 1, 2, 3, 4, 5, 6 and 7, a chip appearance detection mechanism comprises a test platform 1, a chute base 3 and a test base body 8 which are arranged on the test platform 1, wherein the inner wall of the bottom of the chute base 3 is provided with a mounting groove, the inner wall of the mounting groove is provided with a threaded rod 12, the threaded rod 12 is connected with an auxiliary adjusting mechanism, the auxiliary adjusting mechanism is respectively connected with a mounting block 14 and two support rods 4, the outer wall of the top of the mounting block 14 is provided with a connecting block 20, the top ends of the two support rods 4 are respectively provided with a limiting block 17, the outer wall of one side of the two limiting blocks 17, which is opposite to the mounting block 18, the inner wall of the mounting frame 18 is slidably connected with a sliding ring 27, the inner wall of the circumference of the sliding ring 27 is provided with fixing mechanisms which are distributed equidistantly, the outer wall of the circumference of the sliding ring 27 is provided with tooth sockets 28 which are distributed equidistantly, the outer wall of the top of the connecting block 20 is provided with a fixed groove, the inner wall of the bottom of the fixed groove is connected with a driving gear 32 through a bearing, the driving gear 32 is meshed with a tooth space 28 of the outer wall of the sliding ring 27, the inner wall of the mounting block 14 is connected with a fine adjustment screw 23 through a bearing, the outer wall of the fine adjustment screw 23 is provided with a first thread sleeve block 24, the outer wall of one side of the first thread sleeve block 24 is provided with a lamp tube 15, the outer wall of one side of the testing platform 1 is provided with a side plate 5, the outer wall of one side of the side plate 5, which is close to the adjusting frame 18, is provided with a background plate 33, the light of the lamp tube 15 faces one side of the background plate 33, the inner walls of two sides of the chute base 3 are both provided with chutes, the bottom ends of the two support rods 4 are both provided with side sliding blocks 11, the two side sliding blocks 11 are respectively and slidably connected with the inner walls of the two chutes, the driving gear 32 is connected with a first fine adjustment knob 16, the outer wall of one side of the fixed table 21 is provided with a second fine adjustment knob 22, and one end of the second fine adjustment knob 22 is connected with a first bevel gear 25, the bottom end of the fine adjustment screw 23 is provided with a second bevel gear 26, and the first bevel gear 25 is meshed with the second bevel gear 26.
Wherein, the adjusting bracket 18 is respectively with background board 33 and installation piece 14 and be vertical distribution, and the adjusting bracket 18 is located between background board 33 and the installation piece 14, and when light shines background board 33, the chip stitch formation of image can be vertically demonstrate on background board 33, the crooked condition of more audio-visual detection stitch.
In an actual application scene, the inclination angle of the chute base 3 is within the range of 5-8 degrees, wherein the detection environment required by the pre-detection process cannot be too bright, the adopted background plate 33 adopts a dark color system, and irradiates under the inclination angle of 5-8 degrees, and the shadow imaged on the background plate 33 is not influenced by light rays except the light tube 15 under the external environment, so that the shadow imaging is clearer.
Specifically, compare in traditional chip outward appearance and detect, the preliminary examination process has been added before its step, put into fixed establishment on the chip that will await measuring earlier, open fluorescent tube 15 and use as the light source after that, the light source can be perpendicular to shine to the stitch of chip, the shadow that will shine simultaneously appears on background board 33, then through fine setting driving gear 32, finely tune fixed chip and rotate under the meshing effect of driving gear 32 and sliding ring 27 outer wall tooth's socket 28, the sufficient comprehensive detection to the chip stitch through the shadow that appears, through this preliminary examination process, whether crooked of comprehensive effectual judgement CPU stitch.
The set pre-detection process and the test seat body 8 are arranged on the test platform 1 in a double-station mode, and the two processes can be carried out simultaneously, so that the efficiency is higher.
In an actual use scene, the probe structure can be matched and set again, through being connected with a computer for analysis, threshold setting is carried out on the pin skew angle imaged on the background plate 33, different settings are divided according to the pin skew stress limit, the chips after being detected in advance can be classified through threshold analysis, and whether the chips can be directly subjected to subsequent testing procedures or not is determined, or the testing procedures can be carried out after correction.
Referring to fig. 1 and 7, in a preferred embodiment, the auxiliary adjustment mechanism includes: install the second thread bush piece at threaded rod 12 outer wall, be equipped with installation pole 34 on the top outer wall of second thread bush piece, the top of installation pole 34 is equipped with fixed station 21, be equipped with two connecting rods 13 on one side outer wall of fixed station 21, be equipped with micro motor 6 on one side outer wall of test platform 1, micro motor 6's output shaft links to each other with one end of threaded rod 12, the one end of two connecting rods 13 links to each other with one side outer wall of two bracing pieces 4 respectively, fixed station 21 is located the top of installation pole 34.
Specifically, the auxiliary adjusting mechanism is arranged to move the adjusting frame 18 and the mounting block 14 synchronously, and in the pre-detection process, the auxiliary adjusting mechanism can adjust the adjusting frame and the mounting block towards the background plate 33 or away from the background plate 33, and the shadow definition is changed by adjusting the distance between the light source of the lamp tube 15 and the background plate 33.
Referring to fig. 5 and 6, in a preferred embodiment, the securing mechanism includes: four inner bosses 29 at sliding ring 27 circumference inner wall are installed to the symmetry, all are equipped with the first reset spring 30 that the equidistance distributes on one side inner wall of inner boss 29, and same supporting pad 31 is installed to the one end of the first reset spring 30 of a plurality of, and one side outer wall that first reset spring 30 was kept away from to supporting pad 31 sets up to perpendicular dog-ear structure, and four supporting pads 31 cooperate and use.
The four support pads 31 stably fix the chip on the inner side of the slip ring 27 under the supporting action of the first return spring 30.
Specifically, the fixed establishment that sets up is located the sliding ring 27, places the chip on interior boss 29 after, and four supporting pads 31 that are perpendicular dog-ear structure carry out the centre gripping to the four corners of chip, and under the first reset spring 30 supporting role of a plurality of four interior boss 29 one sides, four supporting pads 31 carry out elastic support to the chip four corners that are located central point and put, guarantee that when it carries out rotation regulation, the chip whole can be more stable.
Referring to fig. 8 and 9, in a preferred embodiment, the outer wall of the top of the testing platform 1 is embedded with the straightening table 7, a plurality of straightening grooves 36 are arranged on the straightening table 7, and the inner diameter of each straightening groove 36 is set to be a structure with a wide top and a narrow bottom.
Specifically, the correction slot 36 disposed on the correction table 7 is the same as the distribution position of the chip pins to be measured, wherein the difference is that the inner diameter of the notch of the correction slot 36 is larger than the diameter of the pins, and when the chip pins with a small skew range need to be corrected, the pins gradually inserted will be corrected to be perpendicular to the chip by the correction slot 36 as the correction slot 36 is wide at the top and narrow at the bottom.
Referring to fig. 1, 10, 11 and 13, in a preferred embodiment, a cover plate 37 is connected to one side of an outer wall of a top of a test socket body 8 through a hinge, a sealing strip 38 is disposed on an inner side wall of the cover plate 37, a sealing groove 39 is disposed on an outer wall of a top of the test socket body 8, the sealing strip 38 is matched with the sealing groove 39, a collecting groove 40 is disposed on an inner side wall of the cover plate 37, flow distribution channels 41 distributed equidistantly are connected to a circumferential inner wall of the collecting groove 40, a guide hole 42 is formed in a central position of the inner wall of the top of the collecting groove 40, a hose 46 is mounted on an inner wall of the guide hole 42, gas collection bottles 9 distributed equidistantly are further disposed on one side of the outer wall of the top of a test platform 1, sealing covers 50 are disposed on tops of the gas collection bottles 9, a guide tube 49 is disposed on one side of the outer wall of the tops of the sealing covers 50, a rubber plug 51 is disposed on the other side of the outer wall of the tops of the sealing covers 50, a valve 48 is disposed on one side of the guide tube 49, one end of the guide tube 49 is connected to the same flow distribution tube 47, the same flow distribution tube 47 is connected to the hose 46, a display screen 10 is disposed on an outer wall of one side plate 5, and the display screen 10 is electrically connected to the test socket body 8.
The flow dividing channels 41 are radially expanded, and air flow can be sufficiently guided in the closed test socket body 8, so that air can be more comprehensively collected.
Specifically, the gas collecting bottle 9 cooperation collection groove 40 and the reposition of redundant personnel passageway 41 that sets up form collection device, and the chip is in the test procedure, and the chip degree of generating heat is different when different working period tests, and the collection device that sets up can be collected the gas composition under the different environment that generates heat, then through examining respectively, confirms the security that the chip used, has avoided the chip to generate harmful gas after generating heat and has caused the injury to the user.
In the in-service use process, at first close valve 48 on the pipe 49, then permeate rubber buffer 51 through the suction instrument and with gas collecting bottle 9 evacuation, when different periods are collected, open different valve 48 in proper order, gas in the test seat body 8 can be naturally sucked under the vacuum effect to corresponding gas collecting bottle 9 in, because gas collecting bottle 9 volume is enough, can fully suck the air current in hose 46 and the shunt tubes 47, avoid the air current of different periods to appear mixing phenomenon, the test result is more accurate.
Referring to fig. 10 and 12, in a preferred embodiment, the four corner inner walls of the test socket body 8 are provided with mounting pads 43, the outer wall of one side of each of the four mounting pads 43 is provided with an expansion link 44, one end of a piston rod of the expansion link 44 is provided with a clamping pad 52, the outer wall of the piston rod of the expansion link 44 is sleeved with a second return spring 45, and the two sides of the outer wall of the bottom of the test platform 1 are provided with support frames 2.
Specifically, the second reset spring 45 cooperation centre gripping pad 52 that sets up can not only fix the centre gripping to the chip that awaits measuring inside the test seat body 8, can also play direction limiting displacement, is favorable to the correct of chip stitch to be inserted more, avoids stitch to insert the position and makes mistakes and cause the stitch to bend impaired.
The working principle is as follows: when the device is used, a chip to be tested is firstly placed on a fixing mechanism, the chip is clamped and fixed by using a supporting pad 31 on the fixing mechanism, pins of the chip are exposed below an adjusting frame 18, then a lamp tube 15 is opened to be used as a light source, the light source can vertically irradiate the pins of the chip, the irradiated shadow is displayed on a background plate 33, then the fixed chip is finely adjusted to rotate under the meshing action of a driving gear 32 and a tooth socket 28 on the outer wall of a sliding ring 27 through fine adjustment of the driving gear 32, the pins of the chip are fully and comprehensively detected through the displayed shadow, the straight and unbent pins can be directly placed on a test seat body 8 to be detected in the detection process, the crooked pins can be placed on a correction table 7 to be corrected in the adjustable threshold range and then placed on the test seat body 8 to be tested, the stitch is collected independently to be reworked and adjusted in the adjustable threshold range, the set pre-detection process and the test seat body 8 are arranged on a test platform 1 in a double-station mode, the two processes can be carried out simultaneously, meanwhile, when the chip is tested, a gas collecting device is formed by matching a gas collecting channel 40 and a shunting channel 41 to monitor whether the gas components are skewed, and whether the safe gas chips are heated or not, and whether the chips are detected.
In the specific preliminary detection step, it should be noted that: as shown in fig. 3, the inner boss 29 and the slip ring 27 for elastically supporting the chip are disposed at the lowest position in the longitudinal direction of the adjusting frame 18, and two thirds of the length of the pins of the chip will be exposed below the adjusting frame after the chip is placed on the inner boss 29 after the arrangement, so as to ensure that the chip can be projected onto the background plate by the light emitted from the lamp tube 15.
In a specific use scene, the light color of the light emitted by the lamp tube 15 can be set in a diversified manner, clear imaging of the light with different colors on different types of background plates 33 is mainly used, and in addition, the color of the background plates 33 is set to be lighter, which is beneficial to imaging of shadows.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and the technical solutions and the inventive concepts thereof according to the present invention should be equivalent or changed within the scope of the present invention.
Claims (10)
1. A chip appearance detection mechanism comprises a test platform (1), a chute base (3) and a test seat body (8), wherein the chute base (3) and the test seat body (8) are arranged on the test platform (1), the bottom inner wall of the chute base (3) is provided with a mounting groove, the inner wall of the mounting groove is provided with a threaded rod (12), the threaded rod (12) is connected with an auxiliary adjusting mechanism, the auxiliary adjusting mechanism is respectively connected with a mounting block (14) and two supporting rods (4), the top outer wall of the mounting block (14) is provided with a connecting block (20), the top ends of the two supporting rods (4) are respectively provided with a limiting block (17), the outer wall of one side opposite to the two limiting blocks (17) is provided with a same adjusting frame (18), the inner wall of the adjusting frame (18) is slidably connected with a sliding ring (27), the circumferential inner wall of the sliding ring (27) is provided with fixing mechanisms which are distributed equidistantly, the circumferential outer wall of the sliding ring (27) is provided with tooth grooves (28) which are distributed equidistantly, the top outer wall of the connecting block (20) is provided with a fixing groove, the bottom inner wall of the fixing groove is connected with a driving gear (32) through a bearing, the bearing (23), the driving gear (32) is meshed with a fine adjusting screw rod (23), be equipped with first screw thread cover block (24) on the outer wall of fine setting screw rod (23), be equipped with fluorescent tube (15) on one side outer wall of first screw thread cover block (24), be equipped with curb plate (5) on one side outer wall of test platform (1), curb plate (5) are close to be equipped with background board (33) on one side outer wall of alignment jig (18), the light orientation of fluorescent tube (15) background board (33) one side.
2. The chip appearance inspection mechanism according to claim 1, wherein the adjusting frames (18) are vertically distributed with the background plate (33) and the mounting block (14), respectively, and the adjusting frames (18) are located between the background plate (33) and the mounting block (14).
3. A chip appearance inspection mechanism according to claim 1, wherein the inclination angle of the chute base (3) is in the range of 5 ° to 8 °.
4. The chip appearance detection mechanism according to claim 3, wherein sliding grooves are formed in inner walls of two sides of the chute base (3), side sliding blocks (11) are arranged at bottom ends of the two support rods (4), and the two side sliding blocks (11) are respectively connected to inner walls of the two sliding grooves in a sliding manner.
5. The chip appearance inspection mechanism according to claim 1, wherein the auxiliary adjustment mechanism comprises: install the second thread sleeve block of threaded rod (12) outer wall, be equipped with installation pole (34) on the top outer wall of second thread sleeve block, the top of installation pole (34) is equipped with fixed station (21), be equipped with two connecting rods (13) on one side outer wall of fixed station (21), be equipped with micro motor (6) on one side outer wall of test platform (1), the output shaft of micro motor (6) with the one end of threaded rod (12) links to each other, two the one end of connecting rod (13) respectively with two one side outer wall of bracing piece (4) links to each other, fixed station (21) are located the top of installation pole (34).
6. The chip appearance inspection mechanism according to claim 5, wherein the fixing mechanism comprises: the novel sliding ring is characterized in that four inner bosses (29) are symmetrically arranged on the inner wall of the circumference of the sliding ring (27), first reset springs (30) distributed equidistantly are arranged on the inner wall of one side of each inner boss (29), one supporting pad (31) is arranged at one end of each first reset spring (30), the supporting pad (31) is far away from the outer wall of one side of each first reset spring (30) and is of a vertical bevel structure, and the supporting pads (31) are matched for use.
7. The chip appearance detecting mechanism according to claim 5, wherein a first fine adjustment knob (16) is connected to the driving gear (32), a second fine adjustment knob (22) is arranged on an outer wall of one side of the fixing table (21), one end of the second fine adjustment knob (22) is connected to a first bevel gear (25), a second bevel gear (26) is arranged at a bottom end of the fine adjustment screw (23), and the first bevel gear (25) is engaged with the second bevel gear (26).
8. The chip appearance detecting mechanism according to claim 1, wherein a correcting table (7) is embedded in an outer wall of the top of the testing platform (1), a plurality of correcting grooves (36) are formed in the correcting table (7), and inner diameters of the correcting grooves (36) are set to be of a structure with a wide upper part and a narrow lower part.
9. The chip appearance detecting mechanism according to claim 1, wherein one side of the outer wall of the top of the test socket body (8) is connected with a cover plate (37) through a hinge, the inner side wall of the cover plate (37) is provided with a sealing strip (38), the outer wall of the top of the test socket body (8) is provided with a sealing groove (39), the sealing strip (38) and the sealing groove (39) are adapted, the inner side wall of the cover plate (37) is provided with a collecting groove (40), the inner wall of the circumference of the collecting groove (40) is connected with a shunting channel (41) distributed equidistantly, the central position of the inner wall of the top of the collecting groove (40) is provided with a guide hole (42), the inner wall of the guide hole (42) is provided with a hose (46), one side of the outer wall of the top of the test platform (1) is further provided with a gas collecting bottle (9) distributed equidistantly, the tops of the gas collecting bottles (9) are provided with a plurality of ducts (50), one side of the outer wall of the top of the sealing covers (50) is provided with a plurality of hoses (49), one side of the outer wall of the sealing covers (50) is provided with a plurality of hoses (47), one end of the ducts (47) is connected with a plurality of ducts (47), and one end of the same duct (47) is connected with a plurality of the hose (47), and a display screen (10) is arranged on the outer wall of one side of the side plate (5), and the display screen (10) is electrically connected with the test seat body (8).
10. The chip appearance detection mechanism according to claim 9, wherein the four corner inner walls of the test socket body (8) are provided with mounting pads (43), the outer wall of one side of each of the four mounting pads (43) is provided with a telescopic rod (44), one end of a piston rod of each telescopic rod (44) is provided with a clamping pad (52), the outer wall of the piston rod of each telescopic rod (44) is sleeved with a second return spring (45), and two sides of the outer wall of the bottom of the test platform (1) are provided with support frames (2).
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211357862.0A CN115684015A (en) | 2022-11-01 | 2022-11-01 | Chip appearance detection mechanism |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211357862.0A CN115684015A (en) | 2022-11-01 | 2022-11-01 | Chip appearance detection mechanism |
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| CN115684015A true CN115684015A (en) | 2023-02-03 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117182943A (en) * | 2023-11-07 | 2023-12-08 | 南京嘉翼精密机器制造股份有限公司 | Seven-axis mechanical arm for printing |
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