CN115616003A - Fresnel optical film inspection equipment and inspection method thereof - Google Patents
Fresnel optical film inspection equipment and inspection method thereof Download PDFInfo
- Publication number
- CN115616003A CN115616003A CN202211267406.7A CN202211267406A CN115616003A CN 115616003 A CN115616003 A CN 115616003A CN 202211267406 A CN202211267406 A CN 202211267406A CN 115616003 A CN115616003 A CN 115616003A
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- CN
- China
- Prior art keywords
- optical film
- fresnel optical
- fresnel
- light source
- inspection apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
- 239000012788 optical film Substances 0.000 title claims abstract description 39
- 238000007689 inspection Methods 0.000 title claims abstract description 21
- 238000000034 method Methods 0.000 title claims abstract description 10
- 239000000758 substrate Substances 0.000 claims abstract description 15
- 238000001179 sorption measurement Methods 0.000 claims abstract description 9
- 238000002834 transmittance Methods 0.000 claims description 3
- 239000012780 transparent material Substances 0.000 claims description 3
- 239000005341 toughened glass Substances 0.000 claims description 2
- 230000003287 optical effect Effects 0.000 abstract description 13
- 230000007547 defect Effects 0.000 abstract description 7
- 239000012528 membrane Substances 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 230000003044 adaptive effect Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The invention discloses Fresnel optical diaphragm inspection equipment which comprises a profile frame, a projector, a light source system and a Fresnel optical diaphragm, wherein the profile frame is provided with a substrate, the Fresnel optical diaphragm is adsorbed on the substrate through an adsorption system, the light source system is arranged on the profile frame, the light source system comprises a top light source arranged at the top of the Fresnel optical diaphragm and a back light source arranged at the back of the Fresnel optical diaphragm, and incident light of the projector is projected on the Fresnel optical diaphragm; the method is simple to operate, low in cost and capable of visually and simply detecting the appearance defects of the Fresnel optical film.
Description
Technical Field
The invention relates to the technical field of projection, in particular to Fresnel optical film checking equipment and a checking method thereof.
Background
Laser televisions are a fourth generation of novel display industry, and are popular with consumers at home and abroad due to the advantages of natural optical eye protection, large-screen display and the like. The Fresnel optical film is used as the most adaptive screen of the laser television, is popular with consumers, and becomes an essential accessory for large-screen display, and the appearance inspection of the large-size Fresnel optical film becomes the technical bottleneck of manufacturers.
Disclosure of Invention
In order to solve the problems in the prior art, the invention aims to provide Fresnel optical film inspection equipment and an inspection method thereof.
In order to achieve the purpose, the invention adopts the technical scheme that: the utility model provides a Fresnel optical film piece check-out set, includes section bar frame, projector, light source system and Fresnel optical film piece, be equipped with the basement on the section bar frame, fresnel optical film piece pass through adsorption system adsorb in on the basement, on light source system located the section bar frame, light source system is including locating the top light source at Fresnel optical film piece top and locating the back light source at Fresnel optical film piece back, the incident light of projector throw in on the Fresnel optical film piece.
As a further improvement of the invention, the bottom of the section bar frame is provided with a supporting system, and the projector is placed on the supporting system.
As a further improvement of the invention, the bottom of the supporting system is also provided with a moving system.
As a further improvement of the invention, the moving system is a caster which is attached with glue, dustproof and silent.
As a further improvement of the invention, the base has an angle with the horizontal.
As a further development of the invention, an adjustment system is also included for adjusting the height of the base in the vertical direction and the width in the horizontal direction.
As a further improvement of the present invention, the substrate is a transparent material with high transmittance and rigidity.
As a further improvement of the invention, the substrate is tempered glass.
As a further improvement of the invention, the adsorption system is a circular magnet, the diameter of the circular magnet is 3cm-8cm, and the thickness of the circular magnet is 2mm-6mm.
The invention also provides a Fresnel optical membrane checking method, which adopts the Fresnel optical membrane checking device and comprises the following steps:
when the top light source is turned on, after the front appearance of the Fresnel optical film is checked through incident light of the projector, the incident light of the projector is turned off, the back light source is turned on, the incident light of the back light source irradiates the back of the Fresnel optical film through the substrate, and the back appearance of the Fresnel optical film is checked.
The invention has the beneficial effects that:
the method is simple to operate, low in cost and capable of visually and simply detecting the appearance defects of the Fresnel optical film, such as point defects, line defects, surface defects and the like.
Drawings
FIG. 1 is a schematic front view of an inspection apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic cross-sectional view of an inspection apparatus according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of the back surface of the inspection apparatus in the embodiment of the present invention.
Reference numerals:
1. projector, 2, moving system, 3, incident light, 4, substrate, 5, profile frame, 6, top light source, 7, adsorption system, 8, adjusting system, 9, back light source, 10, fresnel optical membrane, 11 and support system.
Detailed Description
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
Examples
According to the optical design principle and the human behavior, the embodiment provides a fresnel optical film inspection device, which can simply and clearly inspect the defects of the fresnel optical film and can be used for inspecting large-size fresnel optical films, such as 80 inches to 120 inches, and even 150 inches.
As shown in fig. 1 to 3, a fresnel optical film inspection apparatus includes a projector 1, an aluminum profile frame 5, a substrate 4, a light source system, a moving system 2, an adjusting system 8, a supporting system 11, and an adsorption system 7; the projector 1 is arranged on a support system 11, the substrate 4 is used for placing the Fresnel optical film 10, the light source system is divided into a top light source 6 and a back light source 9 and used for illuminating the detection system, the moving system 2 is convenient for the movement of the detection equipment, the adjusting system 8 is used for adjusting the height and width of the detection equipment, and the support system 11 is used for placing the projector 1.
Specifically, the projector 1 can select an ultra-short-focus laser projector, the aluminum section frame 5 is an industrial aluminum section with higher hardness and is used for supporting and fixing detection equipment, the rigid substrate 4 is made of transparent materials, the transmittance is greater than 95%, the thickness is controlled to be 5-15 mm, the light source is a headlamp with stepless speed change and adjustable angle, the power of the headlamp is controlled to be 100-300W, the mobile system 2 is equipment which can be moved and fixed below the headlamp, the mobile system 2 is composed of rubber-attached, dustproof and silent casters, and the double wheels are preferably braked fully.
The adjusting system 8 is used for adjusting the height and the width by fixing the aluminum profile through the connecting piece, namely the lengths of a, b and c (a is the section width, b is the horizontal width, and c is the vertical height) are suitable for different crowds. The adsorption system 7 is used for fixing the Fresnel optical membrane 10 and preventing the Fresnel optical membrane 10 from sliding to cause defects, the adsorption system 7 is a powerful circular magnet or a magnetic strip, the diameter of the circular magnet is controlled to be 3-8 cm, and the thickness of the circular magnet is controlled to be 2-6 mm.
The present embodiment further provides a fresnel optical film inspecting method, wherein the above-mentioned detecting device is adopted, when the top light source 6 is turned on, after the front appearance of the fresnel optical film 10 is inspected through the incident light of the projector 1, the incident light 3 of the projector 1 is turned off, the back light source 9 is turned on, the incident light of the back light source 9 is irradiated to the back of the fresnel optical film 10 through the substrate 4, and the back appearance of the fresnel optical film 10 is inspected.
The above-mentioned embodiments only express the specific embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention.
Claims (10)
1. The utility model provides a fresnel optics diaphragm check out test set which characterized in that, includes section bar frame, projector, light source system and fresnel optics diaphragm, be equipped with the basement on the section bar frame, fresnel optics diaphragm pass through adsorption system adsorb in on the basement, light source system locates on the section bar frame, light source system is including locating the top light source at fresnel optics diaphragm top and locating the back light source at fresnel optics diaphragm back, the incident light of projector throw in on the fresnel optics diaphragm.
2. The fresnel optical film inspection apparatus of claim 1, wherein a support system is provided at a bottom of the profile frame, the projector being placed on the support system.
3. The fresnel optical film inspection apparatus of claim 2, wherein the bottom of the support system is further provided with a movement system.
4. The fresnel optical film inspection apparatus of claim 3, wherein the movement system is a glue-attached, dust-proof, silent caster.
5. The Fresnel optical film inspection apparatus according to claim 1 or 4, wherein the substrate is at an angle to a horizontal direction.
6. The Fresnel optical film inspection apparatus of claim 5, further comprising an adjustment system for adjusting the height of the substrate in a vertical direction and the width in a horizontal direction.
7. The fresnel optical film inspection apparatus of claim 6, wherein the substrate is a high transmittance, rigid, transparent material.
8. The fresnel optical film inspection apparatus of claim 7, wherein the substrate is tempered glass.
9. The fresnel optical film inspection apparatus of claim 1, wherein the adsorption system is a circular magnet having a diameter of 3cm to 8cm and a thickness of 2mm to 6mm.
10. A fresnel optical film inspecting method, characterized by using the fresnel optical film inspecting apparatus according to any one of claims 1 to 9, the inspecting method comprising:
when the top light source is turned on, after the appearance of the front side of the Fresnel optical film is checked through incident light of the projector, the incident light of the projector is turned off, the back light source is turned on, the incident light of the back light source irradiates the back side of the Fresnel optical film through the substrate, and the appearance of the back side of the Fresnel optical film is checked.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211267406.7A CN115616003B (en) | 2022-10-17 | 2022-10-17 | Fresnel optical film inspection device and inspection method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211267406.7A CN115616003B (en) | 2022-10-17 | 2022-10-17 | Fresnel optical film inspection device and inspection method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN115616003A true CN115616003A (en) | 2023-01-17 |
| CN115616003B CN115616003B (en) | 2024-06-11 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211267406.7A Active CN115616003B (en) | 2022-10-17 | 2022-10-17 | Fresnel optical film inspection device and inspection method thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115616003B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116465826A (en) * | 2023-03-15 | 2023-07-21 | 东阳市诰源闪光材料有限公司 | Device and method for testing polarization rate of optical film |
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|---|---|---|---|---|
| JPH09274157A (en) * | 1996-04-08 | 1997-10-21 | Ricoh Co Ltd | Image reader |
| JPH09325415A (en) * | 1996-06-07 | 1997-12-16 | Randatsuku:Kk | Penetration type projector |
| JP2002071571A (en) * | 2000-08-29 | 2002-03-08 | Olympus Optical Co Ltd | Projector for visual inspection |
| JP2003337106A (en) * | 2002-05-20 | 2003-11-28 | Hitachi Kokusai Electric Inc | Macro inspecting apparatus |
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| JP2008046177A (en) * | 2006-08-11 | 2008-02-28 | Dainippon Printing Co Ltd | Interactive rear projection television system |
| JP2008170254A (en) * | 2007-01-11 | 2008-07-24 | Olympus Corp | Substrate inspection system |
| JP2009092481A (en) * | 2007-10-05 | 2009-04-30 | Olympus Corp | Lighting device for visual inspection and visual inspection device |
| US20120074294A1 (en) * | 2010-09-26 | 2012-03-29 | Raytheon Company | Discrete wavefront sampling using a variable transmission filter |
| TW201520542A (en) * | 2013-11-28 | 2015-06-01 | Nat Applied Res Laboratories | Illumination device for high-speed wide mirror wafer surface detection |
| CN108474652A (en) * | 2016-01-04 | 2018-08-31 | 高通股份有限公司 | Depth map in structured light system generates |
| CN108918543A (en) * | 2018-05-14 | 2018-11-30 | 上海工程技术大学 | A kind of device for dynamically detecting and method of mirror surfaces scuffing |
| CN215525588U (en) * | 2021-08-03 | 2022-01-14 | 世大光电(东莞)有限公司 | Visual inspection device for appearance defects of optical lenses |
-
2022
- 2022-10-17 CN CN202211267406.7A patent/CN115616003B/en active Active
Patent Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09274157A (en) * | 1996-04-08 | 1997-10-21 | Ricoh Co Ltd | Image reader |
| JPH09325415A (en) * | 1996-06-07 | 1997-12-16 | Randatsuku:Kk | Penetration type projector |
| JP2002071571A (en) * | 2000-08-29 | 2002-03-08 | Olympus Optical Co Ltd | Projector for visual inspection |
| JP2003337106A (en) * | 2002-05-20 | 2003-11-28 | Hitachi Kokusai Electric Inc | Macro inspecting apparatus |
| JP2007155575A (en) * | 2005-12-07 | 2007-06-21 | Matsushita Electric Ind Co Ltd | Surface inspection apparatus and surface inspection method |
| DE202006017496U1 (en) * | 2005-12-23 | 2007-03-01 | Ioss Intelligente Optische Sensoren & Systeme Gmbh | Optical inspection system for specular reflection surface, has beamsplitter arranged at angle to optical axis of light source, other than point source, whose minimum dimension in plane equals twice to ten-times pupil diameter |
| JP2008046177A (en) * | 2006-08-11 | 2008-02-28 | Dainippon Printing Co Ltd | Interactive rear projection television system |
| JP2008170254A (en) * | 2007-01-11 | 2008-07-24 | Olympus Corp | Substrate inspection system |
| JP2009092481A (en) * | 2007-10-05 | 2009-04-30 | Olympus Corp | Lighting device for visual inspection and visual inspection device |
| US20120074294A1 (en) * | 2010-09-26 | 2012-03-29 | Raytheon Company | Discrete wavefront sampling using a variable transmission filter |
| TW201520542A (en) * | 2013-11-28 | 2015-06-01 | Nat Applied Res Laboratories | Illumination device for high-speed wide mirror wafer surface detection |
| CN108474652A (en) * | 2016-01-04 | 2018-08-31 | 高通股份有限公司 | Depth map in structured light system generates |
| CN108918543A (en) * | 2018-05-14 | 2018-11-30 | 上海工程技术大学 | A kind of device for dynamically detecting and method of mirror surfaces scuffing |
| CN215525588U (en) * | 2021-08-03 | 2022-01-14 | 世大光电(东莞)有限公司 | Visual inspection device for appearance defects of optical lenses |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116465826A (en) * | 2023-03-15 | 2023-07-21 | 东阳市诰源闪光材料有限公司 | Device and method for testing polarization rate of optical film |
| CN116465826B (en) * | 2023-03-15 | 2023-10-24 | 东阳市诰源闪光材料有限公司 | Device and method for testing polarization rate of optical film |
Also Published As
| Publication number | Publication date |
|---|---|
| CN115616003B (en) | 2024-06-11 |
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