CN115616003B - Fresnel optical film inspection device and inspection method thereof - Google Patents
Fresnel optical film inspection device and inspection method thereof Download PDFInfo
- Publication number
- CN115616003B CN115616003B CN202211267406.7A CN202211267406A CN115616003B CN 115616003 B CN115616003 B CN 115616003B CN 202211267406 A CN202211267406 A CN 202211267406A CN 115616003 B CN115616003 B CN 115616003B
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- China
- Prior art keywords
- optical film
- fresnel optical
- light source
- projector
- substrate
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- 239000012788 optical film Substances 0.000 title claims abstract description 48
- 238000007689 inspection Methods 0.000 title claims abstract description 25
- 238000000034 method Methods 0.000 title claims description 15
- 239000000758 substrate Substances 0.000 claims abstract description 16
- 238000001179 sorption measurement Methods 0.000 claims abstract description 7
- 238000002834 transmittance Methods 0.000 claims description 3
- 239000012780 transparent material Substances 0.000 claims description 3
- 239000000853 adhesive Substances 0.000 claims description 2
- 230000001070 adhesive effect Effects 0.000 claims description 2
- 239000005341 toughened glass Substances 0.000 claims description 2
- 230000007547 defect Effects 0.000 abstract description 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 238000011161 development Methods 0.000 description 4
- 239000000428 dust Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 206010010356 Congenital anomaly Diseases 0.000 description 1
- 230000003044 adaptive effect Effects 0.000 description 1
- 230000006399 behavior Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The invention discloses a Fresnel optical film inspection device, which comprises a section bar frame, a projector, a light source system and a Fresnel optical film, wherein a substrate is arranged on the section bar frame, the Fresnel optical film is adsorbed on the substrate through an adsorption system, the light source system is arranged on the section bar frame, the light source system comprises a top light source arranged at the top of the Fresnel optical film and a back light source arranged at the back of the Fresnel optical film, and incident light of the projector is projected on the Fresnel optical film; the invention has simple operation and low cost, and can visually and simply check the appearance defects of the Fresnel optical film.
Description
Technical Field
The invention relates to the technical field of projection, in particular to Fresnel optical film inspection equipment and an inspection method thereof.
Background
The laser television is taken as a fourth generation novel display industry, and is favored by consumers at home and abroad because of the advantages of congenital optical eye protection, large screen display and the like. The Fresnel optical film is used as the most adaptive screen of the laser television, is deeply favored by consumers, and becomes an indispensable accessory for large-screen display, and the appearance inspection of the large-size Fresnel optical film becomes a technical bottleneck of manufacturers.
Disclosure of Invention
In order to solve the problems in the prior art, the invention aims to provide the Fresnel optical film inspection equipment and the Fresnel optical film inspection method, which are simple in operation, low in cost and capable of visually and simply inspecting the appearance defects of the Fresnel optical film.
In order to achieve the above purpose, the invention adopts the following technical scheme: the utility model provides a Fresnel optics diaphragm check out test set, includes section bar frame, projector, light source system and Fresnel optics diaphragm, be equipped with the basement on the section bar frame, fresnel optics diaphragm adsorb in through adsorption system on the basement, light source system locates on the section bar frame, light source system is including locating the top light source at Fresnel optics diaphragm top and locate the back light source at Fresnel optics diaphragm back, the incident light of projector throw in on the Fresnel optics diaphragm.
As a further development of the invention, the bottom of the profile frame is provided with a support system on which the projector is placed.
As a further development of the invention, the bottom of the support system is also provided with a displacement system.
As a further improvement of the invention, the moving system is a caster with glue, dust prevention and silence.
As a further development of the invention, the base is at an angle to the horizontal.
As a further development of the invention, an adjustment system is also included for adjusting the height of the substrate in the vertical direction and the width in the horizontal direction.
As a further improvement of the present invention, the substrate is a high transmittance, rigid transparent material.
As a further improvement of the present invention, the substrate is tempered glass.
As a further improvement of the invention, the adsorption system is a circular magnet, and the diameter of the circular magnet is 3cm-8cm, and the thickness of the circular magnet is 2mm-6mm.
The invention also provides a Fresnel optical film inspection method, which adopts the Fresnel optical film inspection device, and the detection method comprises the following steps:
When the top light source is turned on, after the appearance of the front surface of the Fresnel optical film is detected through the incident light of the projector, the incident light of the projector is turned off, the back light source is turned on, the incident light of the back light source irradiates the back surface of the Fresnel optical film through the substrate, and the appearance of the back surface of the Fresnel optical film is detected.
The beneficial effects of the invention are as follows:
The invention has simple operation and low cost, and can intuitively and simply detect the appearance defects of the Fresnel optical film, such as point defects, line defects, surface defects and the like.
Drawings
FIG. 1 is a schematic diagram showing the front structure of an inspection apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic cross-sectional view of an inspection apparatus according to an embodiment of the present invention;
fig. 3 is a schematic view showing a back structure of an inspection apparatus according to an embodiment of the present invention.
Reference numerals:
1. projector 2, moving system 3, incident light 4, substrate 5, section bar frame 6, top light source 7, adsorption system 8, adjusting system 9, back light source 10, fresnel optical film 11, supporting system.
Detailed Description
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
Examples
According to the optical design principle and human body behaviors, the embodiment provides the Fresnel optical film inspection device, which can simply and clearly inspect the defects of the Fresnel optical film and can be used for inspecting large-size Fresnel optical films, such as 80-120 inches and even 150 inches.
As shown in fig. 1-3, a fresnel optical film inspection apparatus includes a projector 1, an aluminum profile frame 5, a base 4, a light source system, a moving system 2, an adjusting system 8, a supporting system 11, and an adsorbing system 7; the projector 1 is placed on a supporting system 11, the substrate 4 is used for placing a Fresnel optical film 10, the light source system is divided into a top light source 6 and a back light source 9 for illumination of a detection system, the moving system 2 is convenient for moving inspection equipment, the adjusting system 8 is used for adjusting the height and the width of the inspection equipment, and the supporting system 11 is used for placing the projector 1.
Specifically, the projector 1 can select an ultra-short-focus laser projector, the aluminum profile frame 5 is an industrial aluminum profile with higher hardness and is used for supporting and fixing detection equipment, the rigid substrate 4 is made of transparent materials, the transmittance is more than 95%, the thickness is controlled to be 5mm to 15 mm, the light source is a headlight with stepless speed change and adjustable angle, the power of the headlight is controlled to be 100W to 300W, the moving system 2 is equipment capable of moving and fixing, the moving system 2 is composed of casters with adhesive, dust prevention and silence, and the double wheels are braked preferentially and fully.
The adjusting system 8 is used for adjusting the height and the width by fixing the aluminum profile through the connecting piece, namely, the lengths of a, b and c (a is the section width, b is the horizontal width and c is the vertical height) are suitable for different crowds. The adsorption system 7 is used for fixing the Fresnel optical film 10 and preventing the Fresnel optical film 10 from slipping to cause defects, the adsorption system 7 is a powerful round magnet or a magnetic strip, the round magnet is preferential, the diameter of the round magnet is controlled to be 3 cm to 8 cm, and the thickness of the round magnet is controlled to be 2 mm to 6 mm.
The embodiment also provides a method for inspecting the fresnel optical film, which adopts the detection device as described above, after the appearance of the front surface of the fresnel optical film 10 is inspected by the incident light of the projector 1 when the top light source 6 is turned on, the incident light 3 of the projector 1 is turned off, the back light source 9 is turned on, the incident light of the back light source 9 irradiates the back surface of the fresnel optical film 10 through the substrate 4, and the appearance of the back surface of the fresnel optical film 10 is inspected.
The foregoing examples merely illustrate specific embodiments of the invention, which are described in greater detail and are not to be construed as limiting the scope of the invention. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the invention, which are all within the scope of the invention.
Claims (8)
1. The Fresnel optical film inspection method is characterized by comprising Fresnel optical film inspection equipment, wherein the Fresnel optical film inspection equipment comprises a section bar frame, a projector, a light source system and a Fresnel optical film, a substrate is arranged on the section bar frame, the Fresnel optical film is adsorbed on the substrate through an adsorption system, the light source system is arranged on the section bar frame, the light source system comprises a top light source arranged on the top of the Fresnel optical film and a back light source arranged on the back of the Fresnel optical film, and incident light of the projector is projected on the Fresnel optical film; the substrate is made of a transparent material with high transmittance and rigidity;
The Fresnel optical film inspection method comprises the following steps:
When the top light source is turned on, after the appearance of the front surface of the Fresnel optical film is detected through the incident light of the projector, the incident light of the projector is turned off, the back light source is turned on, the incident light of the back light source irradiates the back surface of the Fresnel optical film through the substrate, and the appearance of the back surface of the Fresnel optical film is detected.
2. The method of claim 1, wherein the bottom of the profile frame is provided with a support system on which the projector is placed.
3. The method of claim 2, wherein the bottom of the support system is further provided with a moving system.
4. A fresnel optical film inspection method according to claim 3, wherein the moving system is an adhesive, dust-proof, silent caster.
5. The method of claim 1 or 4, wherein the substrate has an angle with the horizontal direction.
6. The fresnel optical film inspection method of claim 5, further comprising an adjustment system for adjusting the height of the base in the vertical direction and the width in the horizontal direction.
7. The method of claim 1, wherein the substrate is tempered glass.
8. The method for inspecting a fresnel optical film according to claim 1, wherein the suction system is a circular magnet having a diameter of 3cm to 8cm and a thickness of 2mm to 6mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211267406.7A CN115616003B (en) | 2022-10-17 | 2022-10-17 | Fresnel optical film inspection device and inspection method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211267406.7A CN115616003B (en) | 2022-10-17 | 2022-10-17 | Fresnel optical film inspection device and inspection method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN115616003A CN115616003A (en) | 2023-01-17 |
| CN115616003B true CN115616003B (en) | 2024-06-11 |
Family
ID=84863142
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211267406.7A Active CN115616003B (en) | 2022-10-17 | 2022-10-17 | Fresnel optical film inspection device and inspection method thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115616003B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116465826B (en) * | 2023-03-15 | 2023-10-24 | 东阳市诰源闪光材料有限公司 | Device and method for testing polarization rate of optical film |
Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09274157A (en) * | 1996-04-08 | 1997-10-21 | Ricoh Co Ltd | Image reader |
| JPH09325415A (en) * | 1996-06-07 | 1997-12-16 | Randatsuku:Kk | Penetration type projector |
| JP2002071571A (en) * | 2000-08-29 | 2002-03-08 | Olympus Optical Co Ltd | Projector for visual inspection |
| JP2003337106A (en) * | 2002-05-20 | 2003-11-28 | Hitachi Kokusai Electric Inc | Macro inspecting apparatus |
| DE202006017496U1 (en) * | 2005-12-23 | 2007-03-01 | Ioss Intelligente Optische Sensoren & Systeme Gmbh | Optical inspection system for specular reflection surface, has beamsplitter arranged at angle to optical axis of light source, other than point source, whose minimum dimension in plane equals twice to ten-times pupil diameter |
| JP2007155575A (en) * | 2005-12-07 | 2007-06-21 | Matsushita Electric Ind Co Ltd | Surface inspection apparatus and surface inspection method |
| JP2008046177A (en) * | 2006-08-11 | 2008-02-28 | Dainippon Printing Co Ltd | Interactive rear projection television system |
| JP2008170254A (en) * | 2007-01-11 | 2008-07-24 | Olympus Corp | Substrate inspection system |
| JP2009092481A (en) * | 2007-10-05 | 2009-04-30 | Olympus Corp | Lighting device for visual inspection and visual inspection device |
| TW201520542A (en) * | 2013-11-28 | 2015-06-01 | Nat Applied Res Laboratories | Illumination device for high-speed wide mirror wafer surface detection |
| CN108474652A (en) * | 2016-01-04 | 2018-08-31 | 高通股份有限公司 | Depth map in structured light system generates |
| CN108918543A (en) * | 2018-05-14 | 2018-11-30 | 上海工程技术大学 | A kind of device for dynamically detecting and method of mirror surfaces scuffing |
| CN215525588U (en) * | 2021-08-03 | 2022-01-14 | 世大光电(东莞)有限公司 | Visual inspection device for appearance defects of optical lenses |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8748801B2 (en) * | 2010-09-26 | 2014-06-10 | Raytheon Company | Discrete wavefront sampling using a variable transmission filter |
-
2022
- 2022-10-17 CN CN202211267406.7A patent/CN115616003B/en active Active
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09274157A (en) * | 1996-04-08 | 1997-10-21 | Ricoh Co Ltd | Image reader |
| JPH09325415A (en) * | 1996-06-07 | 1997-12-16 | Randatsuku:Kk | Penetration type projector |
| JP2002071571A (en) * | 2000-08-29 | 2002-03-08 | Olympus Optical Co Ltd | Projector for visual inspection |
| JP2003337106A (en) * | 2002-05-20 | 2003-11-28 | Hitachi Kokusai Electric Inc | Macro inspecting apparatus |
| JP2007155575A (en) * | 2005-12-07 | 2007-06-21 | Matsushita Electric Ind Co Ltd | Surface inspection apparatus and surface inspection method |
| DE202006017496U1 (en) * | 2005-12-23 | 2007-03-01 | Ioss Intelligente Optische Sensoren & Systeme Gmbh | Optical inspection system for specular reflection surface, has beamsplitter arranged at angle to optical axis of light source, other than point source, whose minimum dimension in plane equals twice to ten-times pupil diameter |
| JP2008046177A (en) * | 2006-08-11 | 2008-02-28 | Dainippon Printing Co Ltd | Interactive rear projection television system |
| JP2008170254A (en) * | 2007-01-11 | 2008-07-24 | Olympus Corp | Substrate inspection system |
| JP2009092481A (en) * | 2007-10-05 | 2009-04-30 | Olympus Corp | Lighting device for visual inspection and visual inspection device |
| TW201520542A (en) * | 2013-11-28 | 2015-06-01 | Nat Applied Res Laboratories | Illumination device for high-speed wide mirror wafer surface detection |
| CN108474652A (en) * | 2016-01-04 | 2018-08-31 | 高通股份有限公司 | Depth map in structured light system generates |
| CN108918543A (en) * | 2018-05-14 | 2018-11-30 | 上海工程技术大学 | A kind of device for dynamically detecting and method of mirror surfaces scuffing |
| CN215525588U (en) * | 2021-08-03 | 2022-01-14 | 世大光电(东莞)有限公司 | Visual inspection device for appearance defects of optical lenses |
Also Published As
| Publication number | Publication date |
|---|---|
| CN115616003A (en) | 2023-01-17 |
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