CN115575850A - Testing device for electric core vibration-leveling short circuit - Google Patents
Testing device for electric core vibration-leveling short circuit Download PDFInfo
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- CN115575850A CN115575850A CN202211073576.1A CN202211073576A CN115575850A CN 115575850 A CN115575850 A CN 115575850A CN 202211073576 A CN202211073576 A CN 202211073576A CN 115575850 A CN115575850 A CN 115575850A
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- 238000012360 testing method Methods 0.000 title claims abstract description 113
- 239000000523 sample Substances 0.000 claims abstract description 33
- 230000006835 compression Effects 0.000 claims description 7
- 238000007906 compression Methods 0.000 claims description 7
- 239000013013 elastic material Substances 0.000 claims description 3
- 238000005516 engineering process Methods 0.000 abstract description 2
- 230000000694 effects Effects 0.000 description 6
- 239000000463 material Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000012858 resilient material Substances 0.000 description 1
- 238000013522 software testing Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
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Abstract
The application discloses testing arrangement of flat short circuit is shaken to electric core. In the technical scheme, when the vibration leveling and short circuit test is carried out on the battery cell, the battery cell to be tested is placed on the carrier, the driving cylinder is operated and started, the driving cylinder drives the vibration leveling test platform to move, when the vibration leveling test platform is driven to be in contact with the two electrode conductive parts of the battery cell to be tested, the probe can be in contact with the electrode conductive parts, the positions are the short circuit test station and the vibration leveling test station, the short circuit test and the vibration leveling test can be carried out at the same time, the problem that the operation efficiency is low due to the fact that the placement position of the battery cell to be tested needs to be readjusted to carry out the short circuit test after the vibration leveling test in the related technology is solved, and the test efficiency is effectively improved.
Description
Technical Field
The application relates to the technical field of electric core testing, in particular to a testing device for electric core vibration leveling short circuit.
Background
In the related art, the cell vibration leveling and short circuit test are separated stations. After the vibration leveling, the material needs to be placed on a short-circuit testing instrument for short-circuit testing, and in the process, the material taking and placing actions are carried out twice, so that the workload is increased, the time is consumed, and the efficiency is not improved.
Disclosure of Invention
In view of this, this application provides a testing arrangement of electric core shake flat short circuit, can improve efficiency of software testing.
The application provides a testing arrangement of flat short circuit of electric core shake, includes:
a carrier for placing the electric core to be tested;
the second vibration leveling test platform is used for implementing vibration leveling through conductive parts of two electrodes which are respectively contacted with the electric core to be tested;
the power output rod of the driving cylinder is fixedly connected with at least one vibration flat test platform so that the vibration flat test platform is separated from or attached to at least one electrode conductive part;
and the two probes are electrically connected with a short-circuit tester and are used for fixedly connecting the vibration leveling test board.
Optionally, the probe is convexly arranged at the central part of the vibration testing platform far away from the surface of the driving cylinder.
Optionally, the probe is convexly arranged on the surface of the vibration and leveling test bench through a compression spring.
Optionally, a guide plate is fixedly connected to the power output rod of the driving cylinder, the guide plate is fixedly provided with the vibration leveling test platform, and the guide plate slidably penetrates through the guide pillar.
Optionally, the carrier includes a carrier block and a placement groove formed in the carrier block.
Optionally, the opening of the placing groove is made of an elastic material.
When the cell is subjected to vibration leveling and short circuit testing, the cell to be tested is placed on the carrier, the driving cylinder is operated to start and is driven to drive the vibration leveling test platform to move, when the vibration leveling test platform is driven to be in contact with two electrode conductive parts of the cell to be tested, the probe can be in contact with the electrode conductive parts at the moment, the positions are the short circuit test station and the vibration leveling test station, the short circuit testing and the vibration leveling testing can be simultaneously carried out at the moment, the problem that the operation efficiency is low due to the fact that the placing position of the cell to be tested needs to be readjusted to carry out the short circuit testing after the vibration leveling testing in the related technology is solved, and the testing efficiency is effectively improved.
Drawings
The technical solution and other advantages of the present application will become apparent from the detailed description of the embodiments of the present application with reference to the accompanying drawings.
Fig. 1 is a three-dimensional structure diagram of a device for testing a cell vibration level short circuit provided in an embodiment of the present application.
Fig. 2 is a side view of a cell vibration-leveling short circuit testing apparatus provided in an embodiment of the present application.
Wherein the elements in the figures are identified as follows:
110-short circuit tester; 120-a drive cylinder; 130-a carrier; 141-a guide plate; 142-a guide post; 150-a vibration leveling test bench; 160-a probe; and (5) 200-cell.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In the description of the present application, it is to be understood that the terms "first", "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implying any number of technical features indicated. Thus, features defined as "first", "second", may explicitly or implicitly include one or more of the described features. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.
In the description of the present application, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; may be mechanically connected, may be electrically connected or may be in communication with each other; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.
The following disclosure provides many different embodiments or examples for implementing different features of the application. In order to simplify the disclosure of the present application, specific example components and arrangements are described below. Of course, they are merely examples and are not intended to limit the present application. Further, the present application may repeat reference numerals and/or reference letters in the various examples for simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or arrangements discussed. In addition, examples of various specific processes and materials are provided herein, but one of ordinary skill in the art may recognize the application of other processes and/or the use of other materials.
Before the technical solutions of the present application are introduced, it is necessary to explain the background of the invention of the present application.
It has been common in the related art that the cell 200 leveling and short circuit tests are separate stations. After the vibration leveling, the battery cell is placed on the short-circuit tester 110 for a short-circuit test, and in the process, there are two actions of picking and placing the material, that is, after the short-circuit test is performed, the battery cell 200 to be tested is removed from the test station, and then the battery cell 200 to be tested is placed on the short-circuit test station. This obviously increases the number of steps required for testing, which is time consuming and inefficient.
Based on the above-mentioned problems that the inventor is aware of, the inventor proposes that when performing the vibration leveling and short circuit test on the battery cell 200, the battery cell 200 to be tested is first placed on the carrier 130, and then the driving cylinder 120 is operated and started, and the driving cylinder 120 drives the vibration leveling test platform 150 to move, when the vibration leveling test platform 150 is driven to contact the two electrode conductive parts of the battery cell 200 to be tested, the probes 160 will contact the electrode conductive parts, which are the short circuit test station and the vibration leveling test station, at this time, the short circuit test and the vibration leveling test can be performed at the same time, thereby avoiding the problem that the operation efficiency is slow due to the need to readjust the placement position of the battery cell 200 to be tested to perform the short circuit test after the vibration leveling test in the related art, and effectively improving the test efficiency. Therefore, the invention is created.
Referring to fig. 1 and fig. 2, the present application provides a device for testing a vibration-leveling short circuit of a battery cell 200, including:
a carrier 130 for placing the electrical core 200 to be tested;
a second vibration leveling test platform 150 for performing vibration leveling by contacting conductive portions of the two electrodes of the electrical core 200 to be tested;
a driving cylinder 120, the power output rod of which is fixedly connected with at least one vibration platform so as to separate or attach the vibration platform to at least one electrode conductive part;
two probes 160 electrically connected to the short circuit tester 110, the probes 160 are used to fix the vibration-leveling testing platform 150.
It should be understood that, the probe 160 is fixedly connected to the vibration-leveling testing platform 150, so that the probe 160 can be ensured to synchronously contact the electrode conductive part when the vibration-leveling testing platform 150 contacts the electrode conductive part of the electrical core 200 to be tested, thereby facilitating the simultaneous implementation of the vibration-leveling test and the short-circuit test.
In view of the fact that the short circuit test and the vibration leveling test of the battery cell 200 have been widely applied to the conventional test of the battery cell 200, the test equipment adopted for the short circuit test and the vibration leveling test is known by those skilled in the art, and will not be described again. The vibration table described above in this application may take any form of vibration level testing known to those skilled in the art, and the short circuit tester 110 may take any form of vibration level testing known to those skilled in the art.
As an exemplary implementation of the location of the probe 160 on the vibration-leveling testing table 150, the probe 160 is convexly disposed on the central portion of the vibration-leveling testing table 150 far from the surface of the driving cylinder 120.
Therefore, through the setting of the central position, it is possible to make, as long as the central hole position of the electrical core 200 to be tested is aligned with the central position of the vibration-leveling test platform 150, when the vibration-leveling test platform 150 is driven to the conductive position of the two end electrodes clamping the electrical core 200 to be tested, the fixing force applied by the vibration-leveling test platform 150 to the electrical core 200 to be tested is just located in the central hole of the electrical core 200 to be tested, thereby avoiding the moment change of the electrical core 200 to be tested caused by the fixing force applied by the vibration-leveling test platform 150 to the electrical core 200 to be tested and the turning, which not only causes the fixing of the electrical core 200 to be tested to be damaged, but also causes the deterioration of the effect of the vibration-leveling test platform 150 to the electrical core 200, thereby affecting the accuracy of the vibration-leveling test result. Because the probe 160 is located at the central position of the vibration-leveling testing platform 150, when the vibration-leveling testing platform 150 contacts the conductive part of the two end electrodes of the electrical core 200 to be tested, the probe 160 can be just positioned in the central hole of the electrical core 200 to be tested, so as to obtain a better positioning effect, and avoid the inaccurate short-circuit test result caused by the loose contact of the probe 160 with the conductive part.
In the embodiment where the probe 160 is located at the center of the vibration-leveling testing table 150, the probe 160 is protruded from the surface of the vibration-leveling testing table 150 by a compression spring (not shown).
Therefore, through the arrangement of the compression spring, the compression spring can generate compression elastic force for the vibration flat test table 150, and the positioning firmness of the probe 160 and the center hole of the battery cell 200 to be tested is enhanced. In addition, the compression spring can also buffer the feeding stroke of the probe 160 relative to the battery cell 200 to be tested, so as to avoid the probe 160 from being excessively damaged when the probe 160 is fed along with the vibration-leveling test platform 150.
With respect to the probe 160, in the foregoing functional description of the probe 160, it has been implicitly indicated that the probe 160 is made of a conductive metal. In order to improve the positioning effect between the probe 160 and the battery cell 200 to be tested, a sharp portion may be disposed at an end of the probe 160, so as to facilitate the insertion positioning effect of the probe 160 in the center of gravity hole of the battery cell 200 to be tested.
The phrase "at least one of the driving cylinder 120 makes the vibration platform separate from or attach to at least one of the electrode conductive parts" indicates that the driving cylinder 120 drives the motion of one vibration platform or drives the motion of two vibration platforms.
In order to drive the shake-flat test stand 150 more quickly, the number of the driving cylinders 120 is two as shown in fig. 1, and the two shake-flat test stands 150 are fixedly connected.
It is contemplated that a chute may be provided to support the telescoping action of the driven cylinders 120 of the shake-out test station 150.
As an example of a similar structure, a guide plate 141 is fixed to the power output rod of the driving cylinder 120, the guide plate 141 is fixed to the vibration level testing table 150, and the guide plate 141 slidably penetrates through the guide post 142.
Therefore, the cooperation of the guide post 142 and the guide plate 141 can ensure that the driving force output by the driving cylinder 120 to the vibration-leveling test platform 150 is maintained in a linear reciprocating motion, so as to avoid the driving stroke from being not straight enough to cause the inclination of the positioning of the electric core 200 to be tested (i.e. the positioning of the vibration-leveling test platform 150 and the probe 160 and the electrode conductive part of the electric core 200 to be tested is not firm), and the positioning effect of the vibration-leveling test platform 150 and the probe 160 and the electrode conductive part of the electric core 200 to be tested is damaged.
As an exemplary implementation manner of the specific structure of the carrier 130, the carrier 130 includes a carrier block and a placement groove formed in the carrier block.
Here, the carrier block may be a square block, but may be in any form such as a frame.
The placing groove is beneficial to positioning the battery cell 200 to be tested.
The opening of the placing groove is made of elastic materials. Thus, the battery cell 200 to be tested is prevented from loosening in the placement groove.
In addition to the implementation of the resilient material of the opening of the placement groove here, as a similar alternative to the same effect, a resilient locking member or a bolted locking member is placed in the placement groove. Here, the elastic locker may be a telescopic spring. The bolt locks may be any bolts with fastening.
The operation of the correction of the present application will now be described with respect to a common application scenario. It should be noted that this common embodiment is not to be taken as an identification basis for understanding the essential features of the technical problem to be solved as claimed in the present application, which is merely exemplary.
Again, referring to fig. 1 and 2, the specific flow of the test is as follows:
the cell 200 to be tested is taken out and placed in the carrier of the cell 200, the central cylinder of the vibrating block is aligned with the central hole of the cell 200, the switch is pressed (started) by both hands, and the driving cylinders 120 on both sides of the vibrating test platform 150 push the cell 200 to be tested. When the driving cylinder 120 stops holding after pushing to the set length, and the driving cylinder 120 goes to the set position, a signal for starting short circuit test is given to the short circuit tester 110, and the short circuit test is finished after about 4S. Then, after the short circuit tester 110 performs the discharging operation of the battery cell 200, the two ends of the vibration-leveling test platform drive the cylinders 120 to return to the original position after about 2S. If the test is not qualified, the instrument alarms; and if the test is qualified, the lamp is turned on. And finally, taking out the battery cell 200 and carrying out the next operation. And classifying and placing the qualified and unqualified battery cores 200.
The above description is only for the preferred embodiment of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application.
Claims (6)
1. The utility model provides a testing arrangement of electric core shake flat short circuit which characterized in that includes:
a carrier for placing the electric core to be tested;
the second vibration leveling test platform is used for implementing vibration leveling through conductive parts of two electrodes which are respectively contacted with the electric core to be tested;
the power output rod of the driving cylinder is fixedly connected with at least one vibration flat test platform so as to separate or attach the vibration flat test platform to at least one electrode conductive part;
and the two probes are electrically connected with a short-circuit tester and are used for fixedly connecting the vibration and leveling test board.
2. The testing device of claim 1, wherein the probe is protruded from a central portion of the vibration-leveling testing table away from the surface of the driving cylinder.
3. The testing device of claim 2, wherein the probe is protruded from the surface of the vibration level testing table through a compression spring.
4. The testing device of claim 1, wherein a guide plate is fixedly connected to the power output rod of the driving cylinder, the guide plate is fixedly arranged on the vibration-leveling testing platform, and the guide plate slidably penetrates through the guide post.
5. The testing device of claim 1, wherein the carrier comprises a carrier block and a placement slot opened in the carrier block.
6. The testing device as claimed in claim 5, wherein the opening of the placement groove is made of elastic material.
Priority Applications (1)
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CN202211073576.1A CN115575850A (en) | 2022-09-02 | 2022-09-02 | Testing device for electric core vibration-leveling short circuit |
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CN202211073576.1A CN115575850A (en) | 2022-09-02 | 2022-09-02 | Testing device for electric core vibration-leveling short circuit |
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CN114184971A (en) * | 2022-02-10 | 2022-03-15 | 河南电池研究院有限公司 | Method for accurately detecting short circuit cell after lamination of lithium ion battery |
CN217133335U (en) * | 2021-09-30 | 2022-08-05 | 惠州市好品盈电子科技有限公司 | Core pressing short circuit measuring device |
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2022
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