CN115561554A - Device and method for testing electrical property of heat wave-transmitting material based on spotlight heating - Google Patents
Device and method for testing electrical property of heat wave-transmitting material based on spotlight heating Download PDFInfo
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- CN115561554A CN115561554A CN202211268515.0A CN202211268515A CN115561554A CN 115561554 A CN115561554 A CN 115561554A CN 202211268515 A CN202211268515 A CN 202211268515A CN 115561554 A CN115561554 A CN 115561554A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21S—NON-PORTABLE LIGHTING DEVICES; SYSTEMS THEREOF; VEHICLE LIGHTING DEVICES SPECIALLY ADAPTED FOR VEHICLE EXTERIORS
- F21S2/00—Systems of lighting devices, not provided for in main groups F21S4/00 - F21S10/00 or F21S19/00, e.g. of modular construction
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
- F21V33/00—Structural combinations of lighting devices with other articles, not otherwise provided for
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
- F21V7/00—Reflectors for light sources
- F21V7/04—Optical design
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
- F21V7/00—Reflectors for light sources
- F21V7/04—Optical design
- F21V7/06—Optical design with parabolic curvature
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
- F21V7/00—Reflectors for light sources
- F21V7/04—Optical design
- F21V7/08—Optical design with elliptical curvature
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/30—Automatic controllers with an auxiliary heating device affecting the sensing element, e.g. for anticipating change of temperature
- G05D23/32—Automatic controllers with an auxiliary heating device affecting the sensing element, e.g. for anticipating change of temperature with provision for adjustment of the effect of the auxiliary heating device, e.g. a function of time
Abstract
The embodiment of the invention provides a device and a method for testing the electrical property of a heat wave-transmitting material based on spotlight heating. The device comprises: the plurality of spot lamps are used for heating the thermal wave-transmitting material to be tested to a preset temperature; the transmitting module comprises a transmitting antenna and a guide rail, the transmitting antenna is movably arranged on the guide rail and is used for transmitting microwave signals to the heat-wave-transparent material; the receiving module comprises a receiving antenna and a first support, the receiving antenna is movably arranged on the first support and is used for receiving transmission signals and scattering signals generated by the thermal wave-transmitting material; the supporting module is arranged between the transmitting antenna and the receiving antenna and used for supporting the thermal wave-transmitting material; and the analysis control module is used for controlling the heating temperature and the test angle of the thermal wave-transmitting material and obtaining the electrical property of the thermal wave-transmitting material at a preset temperature according to the transmission signal and the scattering signal received by the receiving antenna. The device can accurately measure the electrical property of the thermal wave-transmitting material at a set temperature.
Description
Technical Field
The embodiment of the invention relates to the technical field of materials, in particular to a device and a method for testing the electrical property of a heat wave-transmitting material based on spotlight heating.
Background
With the development of science and technology, the thermal wave-transmitting material is widely applied to the aircraft antenna housing, and the aircraft antenna housing is located at the head of an aircraft, so that the aircraft antenna housing plays a role in protecting a seeker system from normal operation, and the influence of the seeker system on an antenna is minimized. When the aircraft flies at a hypersonic speed, the appearance and the temperature field distribution of the antenna housing can be changed due to violent pneumatic heating and ablation, and the electrical property of the antenna housing is further changed. Therefore, testing the electrical performance of the radome of the hypersonic aircraft at a set high temperature is an important problem to be solved urgently.
In the prior art, the heat wave-transmitting material is usually heated to a set temperature and then placed in a test system for performance test, however, the temperature of the heat wave-transmitting material is reduced in the moving process, and therefore, the electrical performance of the heat wave-transmitting material at the set temperature cannot be accurately measured in real time.
Therefore, there is a need for a testing apparatus and method for testing electrical properties of a thermal wave-transparent material based on spotlight heating to solve the above-mentioned problems.
Disclosure of Invention
The embodiment of the invention provides a device and a method for testing the electrical property of a heat wave-transmitting material based on spotlight heating, which can accurately measure the electrical property of the heat wave-transmitting material at a set temperature in real time.
In a first aspect, an embodiment of the present invention provides a device for testing an electrical property of a thermal wave-transparent material based on spotlight heating, including:
the plurality of spot lamps are used for heating the thermal wave-transmitting material to be tested to a preset temperature;
the transmitting module comprises a transmitting antenna and a guide rail, the transmitting antenna is movably arranged on the guide rail, and the transmitting antenna is used for transmitting microwave signals to the thermal wave-transmitting material;
the receiving module comprises a receiving antenna and a first support, the receiving antenna is movably arranged on the first support, and the receiving antenna is used for receiving transmission signals and scattering signals generated by the thermal wave-transmitting material;
a support module disposed between the transmitting antenna and the receiving antenna, the support module being configured to support the thermal wave-transmitting material;
and the analysis control module is connected with the spotlight, the transmitting antenna and the receiving antenna, and is used for controlling the heating temperature and the test angle of the thermal wave-transmitting material and obtaining the electrical property of the thermal wave-transmitting material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna.
In one possible design, the support module is a platform;
the heat wave-transmitting material is arranged at the central position of the platform, and wave-absorbing materials are laid in the area outside the heat wave-transmitting material arranged on the platform.
In one possible design, the spotlight further comprises a second bracket, and each spotlight is movably arranged on the second bracket;
controlling the heating temperature of the thermal wave-transmitting material by adjusting the number of the spotlights, the power of each of the spotlights, and the position of each of the spotlights on the second support.
In one possible design, the guide rail is a circular arc guide rail, and the center of the mouth surface of the receiving antenna is superposed with the circle center of the circular arc guide rail;
each of the spotlights is disposed in a region other than a conical region formed by upward 45 ° semicylinders with the center of the aperture plane of the receiving antenna as a vertex.
In one possible design, the spot light is more than 1 meter from the center of the thermally transparent material.
In one possible design, the radius of the circular arc guide rail is not less than 2D 2 And/λ, wherein D is the characteristic size of the receiving antenna, and λ is the wavelength of the microwave signal emitted by the transmitting antenna.
In one possible design, the vertex of the circular arc-shaped guide rail is 0 °, and the transmitting antenna moves along a range with an included angle of ± 30 ° with the vertex.
In one possible design, the spotlight is a focused spotlight or a collimated spotlight.
In a second aspect, an embodiment of the present invention further provides a method for testing electrical properties of a thermal wave-transmitting material based on spotlight heating, where the method is applied to a testing apparatus in any one of the above designs, and the method includes:
placing the thermal wave-transmitting material to be tested at the central position of the supporting module;
heating the thermal wave-transmitting material to a preset temperature by using the plurality of spotlights;
moving the transmitting antenna to a set position of the guide rail and moving the receiving antenna to a set position of the first bracket by using the analysis control module so as to adjust a test angle;
transmitting a microwave signal with a specified waveband to the thermal wave-transmitting material by using the transmitting antenna, wherein the microwave signal is incident to the thermal wave-transmitting material to generate a transmission signal and a scattering signal;
receiving the transmitted signal and the scattered signal with the receiving antenna;
and analyzing the transmission signal and the scattering signal by using the analysis control module to obtain the electrical property of the thermal wave-transmitting material at the preset temperature.
In one possible design, the heating the thermal wave-transmitting material to a preset temperature by the several spotlights includes:
predicting the heat flow distribution of the plurality of spotlights by using an iterative bidirectional Monte Carlo method;
predicting the temperature distribution of the heat wave-transmitting material according to the heat flow distribution of the plurality of spotlights;
determining the target power and the target position of each spotlight by utilizing a genetic algorithm according to the temperature distribution of the heat wave-transmitting material;
adjusting each of the spotlights to the target power and the target position to heat the thermal wave-transmitting material to a preset temperature with the spotlights.
The application provides a testing arrangement of thermal wave-transparent material electrical property, including a plurality of spotlight, emission module, receiving module, support module and analysis control module. The analysis control module is connected with the spotlight, and the heating temperature of the spotlight on the heat wave-transmitting material can be controlled and adjusted in real time through the analysis control module so as to control the temperature of the heat wave-transmitting material to be at a preset temperature; when the thermal wave-transmitting material reaches the preset temperature, transmitting a microwave signal to the thermal wave-transmitting material at the preset temperature through a transmitting antenna, and receiving a transmission signal and a scattering signal generated by the thermal wave-transmitting material at the preset temperature through a receiving antenna; and finally, the analysis control module obtains the electrical property of the thermal wave-transmitting material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna. The application provides a test device of thermal wave-transmitting material electrical property can accurately measure the electrical property of thermal wave-transmitting material under the set temperature.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a testing apparatus for electrical properties of a thermal wave-transparent material based on spotlight heating according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of the working principle of a focus spotlight according to an embodiment of the present invention;
FIG. 3 is a schematic diagram illustrating an operation principle of a parallel light type spotlight according to an embodiment of the present invention;
fig. 4 is a schematic flowchart of a method for testing electrical properties of a thermal wave-transmitting material based on spotlight heating according to an embodiment of the present invention.
Reference numerals:
1-spotlight;
2-a transmitting module;
21-a transmitting antenna;
22-a guide rail;
3-a receiving module;
4-a support module;
5-analysis control module.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer and more complete, the technical solutions in the embodiments of the present invention will be described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention, and based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art without creative efforts belong to the scope of the present invention.
As described above, the prior art cannot accurately measure the electrical properties of the heat wave-transparent material at a set temperature in real time.
In response to this problem, the inventor proposes that a spotlight 1 may be added to the test system, and the heating temperature of the thermal wave-transparent material is controlled in real time by the spotlight 1, so as to accurately measure the electrical property of the thermal wave-transparent material at a set temperature.
As shown in fig. 1, an embodiment of the present invention provides a device for testing electrical properties of a thermal wave-transmitting material based on spotlight heating, the device comprising:
the plurality of spot lamps 1 are used for heating the thermal wave-transmitting material to be tested to a preset temperature;
the transmitting module 2 comprises a transmitting antenna 21 and a guide rail 22, wherein the transmitting antenna 21 is movably arranged on the guide rail 22, and the transmitting antenna 21 is used for transmitting microwave signals to the heat-wave-transparent material;
a receiving module 3 (not shown in the drawings) including a receiving antenna and a first support, wherein the receiving antenna is movably disposed on the first support, and the receiving antenna is used for receiving the transmission signal and the scattering signal generated by the thermal wave-transmitting material;
a support module 4 disposed between the transmitting antenna 21 and the receiving antenna, the support module 4 being configured to support the thermal wave-transparent material;
and the analysis control module 5 is connected with the spotlight 1, the transmitting antenna 21 and the receiving antenna, and the analysis control module 5 is used for controlling the heating temperature and the testing angle of the heat wave-transmitting material and obtaining the electrical property of the heat wave-transmitting material at a preset temperature according to the transmission signal and the scattering signal received by the receiving antenna.
In this embodiment, the testing device comprises several spotlights 1, a transmitting module 2, a receiving module 3, a support module 4 and an analysis control module 5. The analysis control module 5 is connected with the spotlight 1, and the heating temperature of the spotlight 1 on the heat wave-transmitting material can be controlled and adjusted in real time through the analysis control module 5 so as to control the temperature of the heat wave-transmitting material to be at a preset temperature; when the thermal wave-transmitting material reaches the preset temperature, transmitting microwave signals to the thermal wave-transmitting material at the preset temperature through the transmitting antenna 21, and receiving transmission signals and scattering signals generated by the thermal wave-transmitting material at the preset temperature through the receiving antenna; finally, the analysis control module 5 obtains the electrical property of the thermal wave-transmitting material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna. Therefore, the device for testing the electrical property of the thermal wave-transmitting material provided by the embodiment can accurately measure the electrical property of the thermal wave-transmitting material at the set temperature.
In addition, in this embodiment, the preset temperature may be any temperature higher than room temperature, the temperature may be higher than 1000 ℃, and the preset temperature value is determined according to the user requirement, which is not specifically limited in this application.
In some embodiments, the analysis control module 5 comprises a signal transmitting unit, a receiving unit and a control unit. Wherein, the signal transmitting unit is connected with the transmitting antenna 21 in a communication way, the receiving unit is connected with the receiving antenna in a communication way, and the control unit is connected with the spotlight 1, the transmitting antenna 21 and the receiving antenna in a communication way.
When the device works, the signal transmitting unit generates a microwave transmitting signal with a specified waveband, the signal is transmitted to the transmitting antenna 21 and is radiated to the heat-transmission wave material by the transmitting antenna 21, the transmitting signal can be approximately seen as a plane wave in a far field after being transmitted and is incident to the heat-transmission wave material, and the heat-transmission wave material generates a transmission signal and a scattering signal which are received by the receiving antenna; then, the receiving antenna transmits the received transmission signal and the received scattering signal to the receiving unit, and the information such as attenuation, phase shift and time delay of the thermal wave-transmitting material, namely the electrical property of the thermal wave-transmitting material, is obtained after the information is processed by the receiving unit.
The control unit comprises an antenna movement control part, a signal transmitting and receiving control part, a temperature measurement control part and the like. The antenna movement control sets the automatic movement time interval according to the stabilization time, the antenna movement control needs to work in cooperation with signal transmission and signal reception, and the change conditions of wave transmission rate, phase, time delay and other electric properties of the thermal wave transmission material at different measurement angles under the heating condition are obtained by adjusting the relative position and angle of the transmitting antenna 21 and the receiving antenna. After heating, the surface temperature of the thermal wave-transmitting material is measured in a non-contact measurement mode, and the measurement equipment cannot influence the temperature distribution and microwave signal transmission of the thermal wave-transmitting material. The control unit is matched with corresponding control software to provide an interactive interface, perform parameter setting, synchronous control and data acquisition on hardware equipment in the whole device, and display the whole test flow and the measured data in real time.
In some embodiments, the support module 4 is a platform;
the heat wave-transmitting material is arranged at the central position of the platform, and wave-absorbing materials are laid in the region outside the platform for mounting the heat wave-transmitting material.
In the embodiment, the wave-absorbing material is preferably high-temperature-resistant, and the interference of the platform on the test signal can be reduced by arranging the wave-absorbing material. In addition, a heat insulating material is arranged between the wave absorbing material and the platform to ensure that the temperature below the platform is lower than the highest resistant temperature of the receiving antenna and the auxiliary line.
In some embodiments, it further comprises a second bracket, on which each spotlight 1 is movably arranged;
the heating temperature of the heat wave-transmitting material is controlled by adjusting the number of spotlights 1, the power of each spotlight 1 and the position of each spotlight 1 on the second support.
In this embodiment, several spotlights 1 form a spotlight array, and by adjusting the number and arrangement combination of the spotlight arrays, the heating power and the heating area of the spotlight array can be controlled, and further the heat flow radiated to the surface of the heat wave-transparent material can be controlled, so that the heat wave-transparent material can be heated rapidly and a certain temperature distribution can be formed. It should be noted that in this embodiment, the power of each spotlight 1 may be the same or different, and the user may determine the required heat flow distribution.
In some embodiments, the spotlight 1 is a focused spotlight or a collimated spotlight.
As shown in fig. 2, which is a schematic view of the working principle of the focusing spotlight, it can be seen that the focusing spotlight is composed of a light source and a rotary condenser. The collecting mirror is an ellipsoidal mirror, a minor semi-axis corresponding to a first focus of the ellipsoidal mirror is f1, a major semi-axis corresponding to a second focus of the ellipsoidal mirror is f2, the aperture of the ellipsoidal mirror is D1, the diameter of the bottom hole is D, and H is the height of the lampshade. The light source of the short-arc xenon lamp is positioned at the first focal point, and light emitted by the light source is converged on the second focal surface of the ellipsoidal mirror after being reflected by the inner surface. When the light source is not an ideal point light source, the brightness of the light source is decreased from the center to two sides, namely most energy is concentrated near the second focal point, and the incident irradiance of the receiving surface can be adjusted by adjusting the distance from the receiving surface to the focal point.
As shown in fig. 3, which is a schematic diagram of the operation of the parallel light type spotlight, it can be seen that the parallel light type spotlight is composed of a light source and a parabolic reflector. The short half shaft corresponding to the focus of the reflector is f, the caliber of the ellipsoidal mirror is D1, the diameter of the bottom hole is D, and H is the height of the lampshade. If the point light source is placed at the focus of the parabolic reflector, light is reflected by the mirror surface and then is emitted out in parallel with the main shaft of the reflector to irradiate on the heat wave-transmitting material, so that the radiation energy is more uniform and softer.
Of course, the two spotlight forms are only one preferable form as long as the spotlight can heat the wave-transmitting material, and the present application is not particularly limited.
In some embodiments, the guide 22 is a circular arc guide 22, and the center of the aperture plane of the receiving antenna coincides with the center of the circular arc guide 22;
each spotlight 1 is disposed in a region other than a conical region formed upward at a half cone angle of 45 ° with the center of the aperture surface of the receiving antenna as a vertex.
In this embodiment, the circular arc-shaped guide rail 22 facilitates the transmission antenna 21 to slide on the guide rail 22, and the guide rail 22 may be provided with scale marks to facilitate accurate adjustment of the position of the transmission antenna 21 on the guide rail 22. In addition, the spotlight 1 is arranged in a region outside a conical region which is formed by taking the center of the mouth surface of the receiving antenna as a vertex and taking 45 degrees as a semi-cone upwards, so that the interference of the spotlight 1 on a test signal can be reduced, and the test precision can be ensured. Of course, a half cone angle of 45 ° is a preferable mode, and a user may use a half cone angle of 40 ° or 60 °, and the present application is not limited in particular.
In some embodiments, the distance from the spotlight 1 to the center of the thermal wave-transmitting material is greater than 1 meter, so as to further reduce the interference of the spotlight 1 on the test signal and ensure the accuracy of the test.
In some embodiments, the radius of the circular arc-shaped guide rail 22 is not less than 2D 2 Where D is the characteristic dimension of the receiving antenna and λ is the wavelength of the microwave signal emitted by the transmitting antenna 21.
In this embodiment, the radius of the circular arc guide rail 22 is set to be not less than 2D 2 And/λ, the receiving antenna aperture can be made to be in the far field of the transmitting antenna 21 for far field testing.
In some embodiments, the apex of the circular arc-shaped guide 22 is 0 °, and the transmitting antenna 21 moves within a range of ± 30 ° from the apex, within which the test signal emitted by the transmitting antenna 21 does not fall on the spotlight 1, so as to ensure the accuracy of the test. It should be noted that the size of the included angle between the transmitting antenna 21 and the vertex is related to the half cone angle of the spotlight 1, as long as it is ensured that the test signal emitted by the transmitting antenna 21 is not interfered by the position of the spotlight 1.
In some embodiments, the receiving antenna is located below the thermal wave-transparent material, the receiving antenna may be transversely installed on the first support or may be longitudinally installed on the first support, and an included angle between the two installation directions is 90 ° around a vertical central line, so that a test angle for the thermal wave-transparent material is changed by adjusting the installation direction of the receiving antenna.
As shown in fig. 4, an embodiment of the present invention provides a method for testing an electrical property of a thermal wave-transmitting material based on spotlight heating, which is applied to a device for testing an electrical property of a thermal wave-transmitting material based on spotlight heating in any one of the above embodiments, and the method includes:
step 400, placing a thermal wave-transmitting material to be tested at the central position of the support module 4;
step 402, heating the thermal wave-transmitting material to a preset temperature by using a plurality of spot lamps 1;
step 404, using the analysis control module 5 to move the transmitting antenna 21 to the set position of the guide rail 22 and move the receiving antenna to the set position of the first bracket, so as to adjust the test angle;
step 406, transmitting a microwave signal with a specified wave band to the heat wave-transmitting material by using the transmitting antenna 21, wherein the microwave signal is incident to the heat wave-transmitting material to generate a transmission signal and a scattering signal;
step 408, receiving the transmission signal and the scattering signal by using a receiving antenna;
and step 410, analyzing the transmission signal and the scattering signal by using the analysis control module 5 to obtain the electrical property of the thermal wave-transmitting material at the preset temperature.
In this embodiment, after the electrical property of the thermal wave-transmitting material at the preset temperature is determined, the electrical property of the thermal wave-transmitting material under the non-heating condition is compared with the electrical property of the thermal wave-transmitting material, and the influence of the surface temperature change on the electrical property of the thermal wave-transmitting material can be obtained.
In some embodiments, step 402 comprises:
predicting the heat flow distribution of the plurality of spotlights 1 by using an iterative bi-directional Monte Carlo method;
predicting the temperature distribution of the heat wave-transmitting material according to the heat flow distribution of the plurality of spotlights 1;
determining the target power and the target position of each spotlight by utilizing a genetic algorithm according to the temperature distribution of the heat wave-transmitting material;
adjusting each of the spotlights to the target power and the target position to heat the thermal wave-transmitting material to a preset temperature with the spotlights.
In this embodiment, the Monte Carlo method may calculate the convection, radiation, and heat conduction processes of the thermally transparent material, based on which the heat flow profile of the heating module may be predicted.
The following describes a method for testing the electrical properties of the thermal wave-transparent material with an embodiment.
Firstly, after a thermal wave-transmitting material to be tested is placed at the central position of a platform, the arrangement and power of spot lamps are adjusted, and the thermal wave-transmitting material is heated to 1000 ℃;
then, transversely arranging a receiving antenna on the first support, moving the transmitting antenna 21 to a position of minus 30 degrees of the guide rail 22, and testing the thermal wave-transmitting material to obtain the electrical property of the thermal wave-transmitting material at the testing angle;
then, moving the transmitting antenna 21 at an angle of 0.5 degrees as an interval to respectively obtain the electrical properties of the heat wave-transmitting material of the transmitting antenna 21 in a range of-30 degrees to +30 degrees;
finally, the receiving antenna is adjusted from the transverse direction to the longitudinal direction, and the electrical performance of the heat wave-transmitting material of the transmitting antenna 21 in the range of-30 degrees to +30 degrees is retested.
Therefore, the electrical performance of the thermal wave-transmitting material at 1000 ℃ and different test angles can be obtained.
By adopting the method, the electrical property of the thermal wave-transmitting material at any temperature (including normal temperature) can be obtained, and a user can compare the electrical property of the thermal wave-transmitting material at each temperature according to actual needs, so that the influence of the surface temperature change on the electrical property of the thermal wave-transmitting material can be obtained.
It can be understood that the apparatus for testing electrical properties of a thermal wave-transparent material provided in this embodiment and the method for testing electrical properties of a thermal wave-transparent material provided in the foregoing embodiments have the same beneficial effects, and are not described herein again.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising a …" does not exclude the presence of additional like elements in a process, method, article, or apparatus that comprises the element.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A testing arrangement of thermal wave-transparent material electrical property based on spotlight heating, characterized by includes:
a plurality of spotlights (1) for heating the thermal wave-transmitting material to be tested to a preset temperature;
a transmitting module (2) comprising a transmitting antenna (21) and a guide rail (22), wherein the transmitting antenna (21) is movably arranged on the guide rail (22), and the transmitting antenna (21) is used for transmitting microwave signals to the thermal wave-transmitting material;
the receiving module (3) comprises a receiving antenna and a first support, the receiving antenna is movably arranged on the first support, and the receiving antenna is used for receiving the transmission signal and the scattering signal generated by the thermal wave-transmitting material;
a support module (4) disposed between the transmitting antenna (21) and the receiving antenna, the support module (4) being configured to support the thermally transparent material;
and the analysis control module (5) is connected with the spotlight (1), the transmitting antenna (21) and the receiving antenna, and the analysis control module (5) is used for controlling the heating temperature and the test angle of the heat wave-transmitting material and obtaining the electrical property of the heat wave-transmitting material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna.
2. The device according to claim 1, characterized in that the support module (4) is a platform;
the heat wave-transmitting material is arranged at the central position of the platform, and wave-absorbing materials are laid in the region outside the heat wave-transmitting material arranged on the platform.
3. The testing device according to claim 1, characterized in that it further comprises a second support on which each spotlight (1) is movably arranged;
controlling the heating temperature of the heat wave-transmitting material by adjusting the number of the spotlights (1), the power of each of the spotlights (1) and the position of each of the spotlights (1) on the second support.
4. The testing device according to claim 3, characterized in that the guide rail (22) is a circular arc guide rail (22), and the center of the mouth surface of the receiving antenna coincides with the center of the circular arc guide rail (22);
each spotlight (1) is arranged in a region outside a conical region which is formed by taking the center of the mouth surface of the receiving antenna as a vertex and taking 45 degrees as a semi-cone upwards.
5. A test device according to claim 3, characterized in that the distance of the spotlight (1) to the center of the heat wave-transmitting material is more than 1 meter.
6. Testing device according to claim 4, characterized in that the radius of the circular arc-shaped guide rail (22) is not less than 2D 2 λ, where D is the characteristic dimension of the receiving antenna and λ is the wavelength of the microwave signal emitted by the transmitting antenna (21).
7. The testing device according to claim 4, characterized in that the apex of the circular arc-shaped guide rail (22) is 0 °, and the transmitting antenna (21) is moved within a range of ± 30 ° from the apex.
8. A testing device according to claim 3, characterized in that the spotlight (1) is a focus spotlight or a parallel spotlight.
9. A method for testing the electrical properties of a heat wave-transmitting material based on spotlight heating, which is applied to the testing device of any one of claims 1 to 8, and comprises the following steps:
placing the thermal wave-transmitting material to be tested at the central position of the supporting module (4);
heating the thermal wave-transmitting material to a preset temperature by using the plurality of spotlights (1);
moving the transmitting antenna (21) to a set position of the guide rail (22) and the receiving antenna to a set position of the first bracket by using the analysis control module (5) to adjust a test angle;
transmitting a microwave signal with a specified waveband to the thermal wave-transmitting material by using the transmitting antenna (21), wherein the microwave signal is incident to the thermal wave-transmitting material to generate a transmission signal and a scattering signal;
receiving the transmitted signal and the scattered signal with the receiving antenna;
and analyzing the transmission signal and the scattering signal by using the analysis control module (5) to obtain the electrical property of the thermal wave-transmitting material at the preset temperature.
10. The testing method according to claim 9, wherein said heating the thermal wave-transparent material to a preset temperature with said number of spotlights (1) comprises:
predicting the heat flow distribution of said several spotlights (1) by means of an iterative bi-directional monte carlo method;
predicting the temperature distribution of the heat wave-transmitting material according to the heat flow distribution of the plurality of spotlights (1);
determining the target power and the target position of each spotlight by utilizing a genetic algorithm according to the temperature distribution of the heat wave-transmitting material;
adjusting each of the spotlights to the target power and the target position to heat the thermal wave-transmitting material to a preset temperature with the spotlights.
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5103182A (en) * | 1990-04-02 | 1992-04-07 | Texas Instruments Incorporated | Electromagnetic wave measurement of conductive layers of a semiconductor wafer during processing in a fabrication chamber |
| US20020079796A1 (en) * | 2000-12-22 | 2002-06-27 | Okamitsu Jeffrey K. | Wavelength selective optical reflector with integral light trap |
| US20070020784A1 (en) * | 2005-07-05 | 2007-01-25 | Mattson Technology, Inc. | Method and system for determining optical properties of semiconductor wafers |
| US20080224044A1 (en) * | 2005-06-09 | 2008-09-18 | Semprimoschnig Christoph | Equipment for Non-Contact Temperature Measurement of Samples of Materials Arranged Under Vacuum |
| US20100208242A1 (en) * | 2009-02-12 | 2010-08-19 | Consejo Nacional De Investigaciones Cientificas Y Tecnicas (Conicet) | Method and apparatus for determining the thermal expansion of a material |
| CN113970561A (en) * | 2020-07-22 | 2022-01-25 | 航天特种材料及工艺技术研究所 | System and method for testing high-temperature wave transmittance of flat plate material |
| CN115112683A (en) * | 2022-05-27 | 2022-09-27 | 航天特种材料及工艺技术研究所 | High-temperature flat plate electrical thickness measuring system and measuring method |
-
2022
- 2022-10-17 CN CN202211268515.0A patent/CN115561554B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5103182A (en) * | 1990-04-02 | 1992-04-07 | Texas Instruments Incorporated | Electromagnetic wave measurement of conductive layers of a semiconductor wafer during processing in a fabrication chamber |
| US20020079796A1 (en) * | 2000-12-22 | 2002-06-27 | Okamitsu Jeffrey K. | Wavelength selective optical reflector with integral light trap |
| US20080224044A1 (en) * | 2005-06-09 | 2008-09-18 | Semprimoschnig Christoph | Equipment for Non-Contact Temperature Measurement of Samples of Materials Arranged Under Vacuum |
| US20070020784A1 (en) * | 2005-07-05 | 2007-01-25 | Mattson Technology, Inc. | Method and system for determining optical properties of semiconductor wafers |
| US20100208242A1 (en) * | 2009-02-12 | 2010-08-19 | Consejo Nacional De Investigaciones Cientificas Y Tecnicas (Conicet) | Method and apparatus for determining the thermal expansion of a material |
| CN113970561A (en) * | 2020-07-22 | 2022-01-25 | 航天特种材料及工艺技术研究所 | System and method for testing high-temperature wave transmittance of flat plate material |
| CN115112683A (en) * | 2022-05-27 | 2022-09-27 | 航天特种材料及工艺技术研究所 | High-temperature flat plate electrical thickness measuring system and measuring method |
Non-Patent Citations (3)
| Title |
|---|
| 钱壬章 等, vol. 15010, 高等教育出版社, pages: 423 - 427 * |
| 陈聪慧;何凤梅;李恩;李琦;: "透波材料高温介电性能评价表征", no. 02, pages 38 - 41 * |
| 黎义,李建保,张大海,敖明: "航天透波多功能复合材料的介电性能分析", no. 06, pages 7 - 12 * |
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