CN115561554B - Device and method for testing electric performance of heat wave-transparent material based on spotlight heating - Google Patents
Device and method for testing electric performance of heat wave-transparent material based on spotlight heating Download PDFInfo
- Publication number
- CN115561554B CN115561554B CN202211268515.0A CN202211268515A CN115561554B CN 115561554 B CN115561554 B CN 115561554B CN 202211268515 A CN202211268515 A CN 202211268515A CN 115561554 B CN115561554 B CN 115561554B
- Authority
- CN
- China
- Prior art keywords
- heat
- wave
- transmitting
- spotlight
- transparent material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21S—NON-PORTABLE LIGHTING DEVICES; SYSTEMS THEREOF; VEHICLE LIGHTING DEVICES SPECIALLY ADAPTED FOR VEHICLE EXTERIORS
- F21S2/00—Systems of lighting devices, not provided for in main groups F21S4/00 - F21S10/00 or F21S19/00, e.g. of modular construction
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
- F21V33/00—Structural combinations of lighting devices with other articles, not otherwise provided for
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
- F21V7/00—Reflectors for light sources
- F21V7/04—Optical design
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
- F21V7/00—Reflectors for light sources
- F21V7/04—Optical design
- F21V7/06—Optical design with parabolic curvature
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
- F21V7/00—Reflectors for light sources
- F21V7/04—Optical design
- F21V7/08—Optical design with elliptical curvature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/30—Automatic controllers with an auxiliary heating device affecting the sensing element, e.g. for anticipating change of temperature
- G05D23/32—Automatic controllers with an auxiliary heating device affecting the sensing element, e.g. for anticipating change of temperature with provision for adjustment of the effect of the auxiliary heating device, e.g. a function of time
Abstract
The embodiment of the invention provides a device and a method for testing the electrical performance of a heat wave-transparent material based on spotlight heating. The device comprises: the heat transmission device comprises a plurality of spotlights, a plurality of heat transmission lamps and a plurality of heat transmission lamps, wherein the spotlights are used for heating a heat transmission material to be tested to a preset temperature; the transmitting module comprises a transmitting antenna and a guide rail, wherein the transmitting antenna is movably arranged on the guide rail and is used for transmitting microwave signals to the heat wave-transmitting material; the receiving module comprises a receiving antenna and a first bracket, wherein the receiving antenna is movably arranged on the first bracket and is used for receiving transmission signals and scattering signals generated by the heat wave-transparent material; the support module is arranged between the transmitting antenna and the receiving antenna and is used for supporting the heat wave-transmitting material; the analysis control module is used for controlling the heating temperature and the testing angle of the heat-wave-transmitting material and obtaining the electrical performance of the heat-wave-transmitting material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna. The device can accurately measure the electrical property of the heat wave-transparent material at a set temperature.
Description
Technical Field
The embodiment of the invention relates to the technical field of materials, in particular to a device and a method for testing the electrical property of a heat wave-transparent material based on spotlight heating.
Background
With the development of technology, the heat wave-transmitting material is widely applied to an aircraft radome, and the aircraft radome is positioned at the head of an aircraft, so that on one hand, the function of protecting the normal operation of a seeker system is achieved, and on the other hand, the influence of the heat wave-transmitting material on an antenna is minimized. When the aircraft flies at hypersonic speeds, the shape and the temperature field distribution of the radome can be changed due to severe pneumatic heating and ablation, so that the electrical performance of the radome is changed. Therefore, testing the electrical performance of hypersonic aircraft radomes at a set high temperature has become an important issue to be resolved urgently.
In the prior art, the heat-wave-transmitting material is heated to a set temperature and then placed in a test system for performance test, however, the temperature of the heat-wave-transmitting material is reduced in the moving process, so that the electrical performance of the heat-wave-transmitting material at the set temperature cannot be accurately and real-timely measured.
Therefore, there is a need for a device and a method for testing the electrical properties of heat-transparent materials based on spotlight heating to solve the above-mentioned problems.
Disclosure of Invention
The embodiment of the invention provides a device and a method for testing the electrical performance of a heat-wave-transmitting material based on spotlight heating, which can accurately measure the electrical performance of the heat-wave-transmitting material at a set temperature in real time.
In a first aspect, an embodiment of the present invention provides a device for testing electrical properties of a heat-transparent material based on spotlight heating, including:
the heat transmission device comprises a plurality of spotlights, a plurality of heat transmission lamps and a plurality of heat transmission lamps, wherein the spotlights are used for heating a heat transmission material to be tested to a preset temperature;
the transmitting module comprises a transmitting antenna and a guide rail, wherein the transmitting antenna is movably arranged on the guide rail and is used for transmitting microwave signals to the heat wave-transmitting material;
the receiving module comprises a receiving antenna and a first bracket, wherein the receiving antenna is movably arranged on the first bracket and is used for receiving transmission signals and scattering signals generated by the heat wave-transparent material;
the supporting module is arranged between the transmitting antenna and the receiving antenna and is used for supporting the heat wave-transmitting material;
the analysis control module is connected with the spotlight, the transmitting antenna and the receiving antenna and is used for controlling the heating temperature and the testing angle of the heat wave-transmitting material and obtaining the electrical property of the heat wave-transmitting material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna.
In one possible design, the support module is a platform;
the heat wave-transmitting material is arranged at the center of the platform, and the area outside the heat wave-transmitting material is laid with wave-absorbing material.
In one possible design, the device further comprises a second bracket, each of the spotlights being movably arranged on the second bracket;
and controlling the heating temperature of the heat wave-transparent material by adjusting the number of the spotlights, the power of each spotlight and the position of each spotlight on the second bracket.
In one possible design, the guide rail is a circular arc guide rail, and the center of the mouth surface of the receiving antenna is coincident with the circle center of the circular arc guide rail;
each of the spotlights is disposed in an area other than a conical area formed upwardly with a half cone angle of 45 ° with the center of the aperture face of the receiving antenna as a vertex.
In one possible design, the distance of the spotlight from the centre of the heat-transparent material is greater than 1 meter.
In one possible design, the radius of the circular arc-shaped guide rail is not smaller than 2D 2 And lambda, wherein D is the characteristic size of the receiving antenna, and lambda is the wavelength of the microwave signal transmitted by the transmitting antenna.
In one possible design, the apex of the circular arc-shaped guide rail is 0 °, and the transmitting antenna moves along a range of ±30° with the apex.
In one possible design, the spotlight is a focused spotlight or a parallel-light spotlight.
In a second aspect, an embodiment of the present invention further provides a method for testing an electrical property of a heat-transparent material based on spotlight heating, where the method is applied to a testing device in any of the designs, and the method includes:
placing the thermal wave-transparent material to be tested in the central position of the supporting module;
heating the heat wave-transparent material to a preset temperature by utilizing the plurality of spotlights;
moving the transmitting antenna to the set position of the guide rail and the receiving antenna to the set position of the first bracket by using the analysis control module so as to adjust a test angle;
transmitting a microwave signal with a specified wave band to the heat-permeable material by using the transmitting antenna, wherein the microwave signal is incident to the heat-permeable material to generate a transmission signal and a scattering signal;
receiving the transmitted signal and the scattered signal with the receiving antenna;
and analyzing the transmission signal and the scattering signal by using the analysis control module to obtain the electrical property of the heat wave-transparent material at the preset temperature.
In one possible design, the heating the heat-transparent material to a preset temperature using the plurality of spotlights includes:
predicting the heat flow distribution of the plurality of spotlights by using an iterative bidirectional Monte Carlo method;
predicting the temperature distribution of the heat wave-transmitting material according to the heat flow distribution of the plurality of spotlights;
determining a target power and a target position of each spotlight by using a genetic algorithm according to the temperature distribution of the heat wave-transparent material;
and adjusting each spotlight to the target power and the target position so as to heat the heat-permeable material to a preset temperature by using the spotlight.
The application provides a testing arrangement of heat wave-transparent material electric property, including a plurality of spotlight, emission module, receiving module, supporting module and analysis control module. The analysis control module is connected with the spotlight, and can control and adjust the heating temperature of the spotlight on the heat wave-transmitting material in real time through the analysis control module so as to control the temperature of the heat wave-transmitting material at a preset temperature; when the heat wave-transmitting material reaches the preset temperature, transmitting microwave signals to the heat wave-transmitting material with the preset temperature through a transmitting antenna, and receiving transmission signals and scattering signals generated by the heat wave-transmitting material with the preset temperature through a receiving antenna; finally, the analysis control module obtains the electrical property of the heat wave-transparent material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna. The testing device for the electrical performance of the heat-wave-transmitting material can accurately measure the electrical performance of the heat-wave-transmitting material at a set temperature.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic structural diagram of a device for testing electrical properties of heat-transparent materials based on spotlight heating according to an embodiment of the present invention;
fig. 2 is a schematic diagram of the working principle of a focusing spotlight according to an embodiment of the present invention;
fig. 3 is a schematic diagram illustrating an operation principle of a parallel light spotlight according to an embodiment of the present invention;
fig. 4 is a flow chart of a method for testing electrical properties of a heat-transparent material based on spotlight heating according to an embodiment of the present invention.
Reference numerals:
1-spotlight;
2-a transmitting module;
21-a transmitting antenna;
22-a guide rail;
3-a receiving module;
4-a support module;
5-an analysis control module.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments, and all other embodiments obtained by those skilled in the art without making any inventive effort based on the embodiments of the present invention are within the scope of protection of the present invention.
As described above, the prior art cannot accurately and real-time measure the electrical properties of the heat-permeable material at a set temperature.
In order to solve the problem, the inventor proposes that a spotlight 1 can be added in the test system, and the heating temperature of the heat-permeable material is controlled in real time through the spotlight 1 so as to accurately measure the electrical property of the heat-permeable material at a set temperature.
As shown in fig. 1, an embodiment of the present invention provides a device for testing electrical properties of a heat-transparent material heated by a spotlight, the device comprising:
the heat transmission device comprises a plurality of spotlights 1, a plurality of heat transmission modules and a plurality of heat transmission modules, wherein the spotlights 1 are used for heating a heat transmission material to be tested to a preset temperature;
the transmitting module 2 comprises a transmitting antenna 21 and a guide rail 22, wherein the transmitting antenna 21 is movably arranged on the guide rail 22, and the transmitting antenna 21 is used for transmitting microwave signals to the heat wave-transparent material;
a receiving module 3 (not shown in the figure) including a receiving antenna and a first bracket, the receiving antenna being movably disposed on the first bracket, the receiving antenna being used for receiving transmission signals and scattering signals generated by the heat wave-transparent material;
the supporting module 4 is arranged between the transmitting antenna 21 and the receiving antenna, and the supporting module 4 is used for supporting the heat wave-transmitting material;
the analysis control module 5 is connected with the spotlight 1, the transmitting antenna 21 and the receiving antenna, and the analysis control module 5 is used for controlling the heating temperature and the testing angle of the heat-transmitting material and obtaining the electrical performance of the heat-transmitting material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna.
In this embodiment, the testing device comprises several spotlights 1, a transmitting module 2, a receiving module 3, a supporting module 4 and an analysis control module 5. The analysis control module 5 is connected with the spotlight 1, and the heating temperature of the spotlight 1 on the heat wave-transmitting material can be controlled and adjusted in real time through the analysis control module 5 so as to control the temperature of the heat wave-transmitting material at a preset temperature; when the temperature of the heat-permeable material reaches the preset temperature, transmitting microwave signals to the heat-permeable material with the preset temperature through the transmitting antenna 21, and receiving transmission signals and scattering signals generated by the heat-permeable material with the preset temperature through the receiving antenna; finally, the analysis control module 5 obtains the electrical property of the heat wave-transparent material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna. Therefore, the testing device for the electrical performance of the heat-wave-transmitting material provided by the embodiment can accurately measure the electrical performance of the heat-wave-transmitting material at the set temperature.
In addition, in this embodiment, the preset temperature may be any temperature higher than room temperature, the temperature may be higher than 1000 ℃ or higher, and the preset temperature value is determined according to the user's requirement, which is not particularly limited in this application.
In some embodiments, the analysis control module 5 includes a signal transmitting unit, a receiving unit, and a control unit. The signal transmitting unit is in communication connection with the transmitting antenna 21, the receiving unit is in communication connection with the receiving antenna, and the control unit is in communication connection with the spotlight 1, the transmitting antenna 21 and the receiving antenna.
When the device works, the signal transmitting unit generates a microwave transmitting signal with a specified wave band, the signal is transmitted to the transmitting antenna 21, the transmitting signal is radiated to the heat-transmitting material by the transmitting antenna 21, the transmitting signal can be approximately seen as plane waves in a far field after being transmitted and is incident on the heat-transmitting material, and the heat-transmitting material generates a transmission signal and a scattering signal which are received by the receiving antenna; then, the receiving antenna transmits the received transmission signal and the received scattering signal to the receiving unit, and the information such as attenuation, phase shift, time delay and the like of the heat-transmitting material, namely the electrical property of the heat-transmitting material, is obtained after the information is processed by the receiving unit.
The control unit comprises an antenna movement control part, a signal transmitting and receiving control part, a temperature measurement control part and the like. The antenna movement control sets an automatic movement time interval according to the stable time, the antenna movement control needs to work cooperatively with signal transmission and reception, and the change conditions of the electrical properties such as wave transmittance, phase and time delay of the heat wave-transparent material under the heating condition and different measurement angles are obtained by adjusting the relative positions and angles of the transmitting antenna 21 and the receiving antenna. After heating, the surface temperature of the heat-permeable material is measured in a non-contact measurement mode, and the measurement equipment cannot influence the temperature distribution and microwave signal transmission of the heat-permeable material. The control unit is matched with corresponding control software to provide an interactive interface, parameter setting, synchronous control and data acquisition are carried out on hardware equipment in the whole device, and the whole test flow and the measurement number are displayed in real time.
In some embodiments, the support module 4 is a platform;
the heat wave-transmitting material is arranged at the center of the platform, and the wave-absorbing material is laid in the area outside the heat wave-transmitting material.
In this embodiment, the wave-absorbing material is preferably a high temperature resistant wave-absorbing material, and by providing the wave-absorbing material, the interference of the platform on the test signal can be reduced. In addition, a heat insulation material is arranged between the wave absorbing material and the platform so as to ensure that the temperature under the platform is less than the highest resistant temperature of the receiving antenna and the auxiliary circuit.
In some embodiments, further comprising a second bracket, each spotlight 1 being movably arranged on the second bracket;
by adjusting the number of spotlights 1, the power of each spotlight 1 and the position of each spotlight 1 on the second support, the heating temperature of the heat-transparent material is controlled.
In this embodiment, the plurality of spotlights 1 form a spotlight array, and by adjusting the number and the arrangement and combination manner of the spotlight arrays, the heating power and the heating area of the spotlight array can be controlled, and further the heat flow radiated to the surface of the heat-transparent material can be controlled, so that the heat-transparent material can be rapidly heated and a certain temperature distribution can be formed. It should be noted that, in this embodiment, the power of each spotlight 1 may be the same or different, and the user may determine according to the required heat flow distribution.
In some embodiments, the spotlight 1 is a focused spotlight or a parallel-light spotlight.
As shown in fig. 2, which is a schematic diagram of the working principle of the focusing spotlight, it can be seen from the figure that the focusing spotlight is composed of a light source and a rotating condenser. The condenser is an ellipsoidal mirror, a short half shaft corresponding to a first focus of the ellipsoidal mirror is f1, a long half shaft corresponding to a second focus of the ellipsoidal mirror is f2, the caliber of the ellipsoidal mirror is D1, the diameter of a bottom hole is D, and H is the height of the lampshade. The short-arc xenon lamp light source is positioned at the first focus, and light emitted by the light source is converged on the second focus surface of the ellipsoidal mirror after being reflected by the inner surface. When the light source is not an ideal point light source, the brightness of the light source is decreased from the center to two sides, namely most of energy is concentrated near the second focus, and the incident irradiance of the receiving surface can be adjusted by adjusting the distance from the receiving surface to the focus.
As shown in fig. 3, which is a schematic diagram of the operation of the parallel light spotlight, it can be seen that the parallel light spotlight is composed of a light source and a parabolic reflector. The focal point of the reflector corresponds to a short half shaft f, the caliber of the ellipsoidal mirror is D1, the diameter of the bottom hole is D, and H is the height of the lampshade. If the parabolic reflector is placed on its focal point, the light will be emitted parallel to the main axis of the reflector after being reflected by the mirror surface, and irradiated onto the heat-transparent material, so that the radiation energy will be more uniform and soft.
Of course, the two types of spotlights are only a preferred way, as long as the spotlights can heat the wave-transparent material, and the present application is not particularly limited.
In some embodiments, the guide rail 22 is a circular arc guide rail 22, and the center of the mouth surface of the receiving antenna coincides with the center of the circular arc guide rail 22;
each spotlight 1 is disposed in an area other than a conical area formed upwardly with a half cone of 45 ° with the center of the aperture face of the receiving antenna as the apex.
In this embodiment, the circular arc shaped guide rail 22 facilitates the sliding of the transmitting antenna 21 on the guide rail 22, and graduation marks may be provided on the guide rail 22 to facilitate accurate adjustment of the position of the transmitting antenna 21 on the guide rail 22. In addition, the spotlight 1 is arranged in an area other than the conical area which takes the center of the mouth surface of the receiving antenna as the vertex and takes the angle of 45 degrees as the half cone angle upwards, so that the interference of the spotlight 1 on a test signal can be reduced, and the test precision can be ensured. Of course, a half cone angle of 45 ° is a preferred manner, and the user may also use an equal angle of 40 ° or 60 ° as a half cone angle, which is not particularly limited in this application.
In some embodiments, the distance from the spotlight 1 to the center of the heat-transparent material is greater than 1 meter, so as to further reduce the interference of the spotlight 1 on the test signal and ensure the accuracy of the test.
In some embodiments, the radius of the circular arc shaped rail 22 is not less than 2D 2 λ, where D is the characteristic dimension of the receiving antenna and λ is the wavelength of the microwave signal emitted by the transmitting antenna 21.
In this embodiment, the radius of the circular arc-shaped guide rail 22 is not smaller than 2D 2 And/lambda, the receiving antenna port face can be located far-field of the transmitting antenna 21 for far-field testing.
In some embodiments, the apex of the circular arc-shaped guide rail 22 is 0 °, and the transmitting antenna 21 moves along a range of ±30° with respect to the apex, in which the test signal emitted by the transmitting antenna 21 does not fall on the spotlight 1, so as to ensure the accuracy of the test. It should be noted that, the angle between the transmitting antenna 21 and the vertex is related to the half cone angle of the spotlight 1, so long as the test signal emitted by the transmitting antenna 21 is not interfered by the position of the spotlight 1.
In some embodiments, the receiving antenna is located below the heat wave-transmitting material, and the receiving antenna may be transversely mounted on the first support, or may be longitudinally mounted on the first support, where the two mounting directions form an included angle with each other that is integrally rotated by 90 ° around the vertical center line, and by adjusting the mounting direction of the receiving antenna, the testing angle of the heat wave-transmitting material is changed.
As shown in fig. 4, an embodiment of the present invention provides a method for testing electrical properties of a heat-transparent material based on spotlight heating, which is applied to a device for testing electrical properties of a heat-transparent material based on spotlight heating in any of the above embodiments, and the method includes:
step 400, placing a thermal wave-transparent material to be tested in the center position of the support module 4;
step 402, heating the heat wave-transparent material to a preset temperature by using a plurality of spotlights 1;
step 404, moving the transmitting antenna 21 to the set position of the guide rail 22 and the receiving antenna to the set position of the first bracket by using the analysis control module 5 to adjust the test angle;
step 406, transmitting a microwave signal with a specified wave band to the heat-transparent material by using the transmitting antenna 21, and generating a transmission signal and a scattering signal after the microwave signal is incident to the heat-transparent material;
step 408, receiving the transmission signal and the scattering signal by using a receiving antenna;
in step 410, the analysis control module 5 is used to analyze the transmission signal and the scattering signal to obtain the electrical performance of the heat-transparent material at the preset temperature.
In this embodiment, after determining the electrical performance of the heat-transparent material at the preset temperature, the effect of the surface temperature change on the electrical performance of the heat-transparent material can be obtained by comparing the electrical performance of the heat-transparent material with the electrical performance of the heat-transparent material under the non-heating condition.
In some embodiments, step 402 comprises:
predicting the heat flow distribution of the plurality of spotlights 1 by using an iterative bi-directional monte carlo method;
predicting the temperature distribution of the heat-transparent material according to the heat flow distribution of the plurality of spotlights 1;
determining a target power and a target position of each spotlight by using a genetic algorithm according to the temperature distribution of the heat wave-transparent material;
and adjusting each spotlight to the target power and the target position so as to heat the heat-permeable material to a preset temperature by using the spotlight.
In this embodiment, the Monte Carlo method may calculate the convection, radiation, and heat conduction processes of the heat-transparent material, and based on the calculation process, the heat flow distribution of the heating module may be predicted.
The method for testing the electrical properties of the heat-permeable material is described in detail below with reference to one specific example.
Firstly, placing a heat wave-transmitting material to be tested at the center of a platform, and then adjusting the arrangement and power of a spotlight to heat the heat wave-transmitting material to 1000 ℃;
then, transversely arranging a receiving antenna on a first bracket, moving a transmitting antenna 21 to the position of-30 degrees of a guide rail 22, and testing the heat wave-transmitting material to obtain the electrical performance of the heat wave-transmitting material under the test angle;
then, the transmitting antenna 21 is moved at intervals of 0.5 degrees to respectively obtain the electrical properties of the heat wave-transmitting material of the transmitting antenna 21 within the range of-30 degrees to +30 degrees;
finally, the receiving antenna is adjusted from the transverse direction to the longitudinal direction, and the electrical properties of the heat-transmitting material of the transmitting antenna 21 are retested within the range of-30 degrees to +30 degrees.
Thus, the electric performance of the heat wave-transmitting material at 1000 ℃ under different testing angles can be obtained.
By adopting the method, the electrical performance of the heat-wave-transmitting material at any temperature (including normal temperature) can be obtained, and a user can compare the electrical performance of the heat-wave-transmitting material at each temperature according to actual needs, so that the influence of the surface temperature change on the electrical performance of the heat-wave-transmitting material can be obtained.
It can be understood that the device for testing the electrical performance of the heat-permeable material provided in this embodiment and the method for testing the electrical performance of the heat-permeable material provided in the foregoing embodiments have the same beneficial effects, and are not described in detail herein.
It is noted that relational terms such as first and second, and the like, are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one …" does not exclude the presence of additional identical elements in a process, method, article or apparatus that comprises the element.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (5)
1. A device for testing the electrical properties of a heat-transparent material based on spotlight heating, comprising:
a plurality of spotlights (1) for heating a heat wave-transparent material to be tested to a preset temperature;
a transmitting module (2) comprising a transmitting antenna (21) and a guide rail (22), wherein the transmitting antenna (21) is movably arranged on the guide rail (22), and the transmitting antenna (21) is used for transmitting microwave signals to the heat wave-transparent material;
the receiving module (3) comprises a receiving antenna and a first bracket, wherein the receiving antenna is movably arranged on the first bracket and is used for receiving transmission signals and scattering signals generated by the heat wave-transparent material;
a support module (4) disposed between the transmitting antenna (21) and the receiving antenna, the support module (4) being configured to support the heat wave-transparent material;
the analysis control module (5) is connected with the spotlight (1), the transmitting antenna (21) and the receiving antenna, and the analysis control module (5) is used for controlling the heating temperature and the testing angle of the heat wave-transparent material and obtaining the electrical performance of the heat wave-transparent material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna; the preset temperature is higher than 1000 ℃, and the electrical properties comprise the wave transmission rate, the phase and the time delay of the heat wave transmission material; the supporting module (4) is a platform;
the heat wave-transmitting material is arranged at the center of the platform, and a wave-absorbing material is laid in a region outside the platform where the heat wave-transmitting material is arranged; the wave-absorbing material is a high-temperature-resistant wave-absorbing material;
the spotlight further comprises a second bracket, and each spotlight (1) is movably arranged on the second bracket;
controlling the heating temperature of the heat-transparent material by adjusting the number of spotlights (1), the power of each of the spotlights (1) and the position of each of the spotlights (1) on the second support;
the guide rail (22) is a circular arc guide rail (22), and the center of the mouth surface of the receiving antenna is coincident with the circle center of the circular arc guide rail (22);
each spotlight (1) is arranged in an area outside a conical area taking the center of the mouth surface of the receiving antenna as a vertex and taking 45 degrees as a half cone upwards;
the vertex of the circular arc-shaped guide rail (22) is 0 DEG, and the transmitting antenna (21) moves along the range of an included angle of +/-30 DEG with the vertex;
the distance from the spotlight (1) to the centre of the heat-transparent material is more than 1 meter.
2. The test device according to claim 1, wherein the radius of the circular arc-shaped guide rail (22) is not smaller than2D 2 And lambda, wherein D is the characteristic dimension of the receiving antenna and lambda is the wavelength of the microwave signal emitted by the transmitting antenna (21).
3. The test device according to claim 1, characterized in that the spotlight (1) is a focused spotlight or a parallel-light spotlight.
4. A method for testing the electrical properties of a heat-transparent material based on spotlight heating, applied to the testing device of any of claims 1-3, said method comprising:
placing the thermal wave-transparent material to be tested in the central position of the supporting module (4);
heating the heat wave-transparent material to a preset temperature by using the plurality of spotlights (1);
-moving the transmitting antenna (21) to a set position of the guide rail (22) and the receiving antenna to a set position of the first bracket with the analysis control module (5) to adjust a test angle;
transmitting a microwave signal with a specified wave band to the heat-permeable material by utilizing the transmitting antenna (21), wherein the microwave signal generates a transmission signal and a scattering signal after being incident to the heat-permeable material;
receiving the transmitted signal and the scattered signal with the receiving antenna;
and analyzing the transmission signal and the scattering signal by using the analysis control module (5) to obtain the electrical property of the heat wave-transparent material at the preset temperature.
5. The testing method according to claim 4, wherein heating the heat-transparent material to a preset temperature with the number of spotlights (1) comprises:
predicting the heat flow distribution of the plurality of spotlights (1) by using an iterative bi-directional monte carlo method;
predicting the temperature distribution of the heat wave-transparent material according to the heat flow distribution of the plurality of spotlights (1);
determining a target power and a target position of each spotlight by using a genetic algorithm according to the temperature distribution of the heat wave-transparent material;
and adjusting each spotlight to the target power and the target position so as to heat the heat-permeable material to a preset temperature by using the spotlight.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211268515.0A CN115561554B (en) | 2022-10-17 | 2022-10-17 | Device and method for testing electric performance of heat wave-transparent material based on spotlight heating |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211268515.0A CN115561554B (en) | 2022-10-17 | 2022-10-17 | Device and method for testing electric performance of heat wave-transparent material based on spotlight heating |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN115561554A CN115561554A (en) | 2023-01-03 |
| CN115561554B true CN115561554B (en) | 2023-07-14 |
Family
ID=84767372
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211268515.0A Active CN115561554B (en) | 2022-10-17 | 2022-10-17 | Device and method for testing electric performance of heat wave-transparent material based on spotlight heating |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115561554B (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113970561A (en) * | 2020-07-22 | 2022-01-25 | 航天特种材料及工艺技术研究所 | System and method for testing high-temperature wave transmittance of flat plate material |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5103182A (en) * | 1990-04-02 | 1992-04-07 | Texas Instruments Incorporated | Electromagnetic wave measurement of conductive layers of a semiconductor wafer during processing in a fabrication chamber |
| US20020079796A1 (en) * | 2000-12-22 | 2002-06-27 | Okamitsu Jeffrey K. | Wavelength selective optical reflector with integral light trap |
| FR2887029B1 (en) * | 2005-06-09 | 2007-08-03 | Agence Spatiale Europeenne | APPARATUS FOR NON-CONTACT TEMPERATURE MEASUREMENT OF SAMPLES OF VACUUM MATERIALS |
| JP2009500851A (en) * | 2005-07-05 | 2009-01-08 | マットソン テクノロジー インコーポレイテッド | Method and system for determining optical properties of a semiconductor wafer |
| AR070418A1 (en) * | 2009-02-12 | 2010-04-07 | Consejo Nac Invest Cient Tec | METHOD AND APPLIANCE TO DETERMINE THE EXPANSION OF A MATERIAL THROUGH A FOCUS ERROR SENSOR DEVICE |
| CN115112683A (en) * | 2022-05-27 | 2022-09-27 | 航天特种材料及工艺技术研究所 | High-temperature flat plate electrical thickness measuring system and measuring method |
-
2022
- 2022-10-17 CN CN202211268515.0A patent/CN115561554B/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113970561A (en) * | 2020-07-22 | 2022-01-25 | 航天特种材料及工艺技术研究所 | System and method for testing high-temperature wave transmittance of flat plate material |
Also Published As
| Publication number | Publication date |
|---|---|
| CN115561554A (en) | 2023-01-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109142890B (en) | Terahertz leaky-wave antenna measuring system | |
| US7965228B2 (en) | Quasi-compact range | |
| RU2708908C2 (en) | System, apparatus and method for tuning remote antenna | |
| CN107290595B (en) | high-temperature test method for relative complex dielectric constant of material based on ellipsoidal reflector | |
| CN110530525A (en) | A kind of direction emissivity measuring device and measuring method based on bounce technique | |
| CN106482581A (en) | A kind of Compact Range millimeter wave/infrared complex target device | |
| CN105889843A (en) | Compound light target simulator | |
| CN115112683A (en) | High-temperature flat plate electrical thickness measuring system and measuring method | |
| CN115561554B (en) | Device and method for testing electric performance of heat wave-transparent material based on spotlight heating | |
| US5910787A (en) | Integrated projector-low radar cross-section (RCS) source support pylon and low RCS measurement system employing same | |
| CN103900422B (en) | Multiband target/Background generation device | |
| CN110544826B (en) | High-temperature-resistant focusing lens antenna for high-temperature plasma diagnosis technology | |
| TW202018310A (en) | An automatic system for antenna measurement | |
| CN112558001A (en) | Pulse high-power field calibration device and method | |
| CN115561557B (en) | Device and method for testing electrical properties of heat wave-transparent material based on laser heating | |
| CN109060317B (en) | Characteristic parameter testing system for long-distance transmission of laser beam and working process thereof | |
| CN110530524A (en) | A kind of direction emissivity rapid measurement device based on energy method | |
| Krueger et al. | Operational performance of the university of Minnesota 45kWe high-flux solar simulator | |
| CN113865716A (en) | Thermal infrared imager test system | |
| CN105891157A (en) | Solid material reverse reflection characteristic measuring device | |
| Bassett et al. | New techniques for implementing microwave biological-exposure systems | |
| CN117630511B (en) | Equivalent far-field RCS measurement method and system based on Longber lens antenna | |
| RU152937U1 (en) | DEVICE FOR MEASURING ELECTROMAGNETIC RESPONSE FROM FLAT-PARALLEL PLATES IN MILLIMETER RANGE | |
| RU143511U1 (en) | SMALL ANCHOROUS CAMERA | |
| CN112904583B (en) | Radio frequency/optical composite target simulation device and method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |