CN115542106A - On-line working sampling circuit - Google Patents
On-line working sampling circuit Download PDFInfo
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- CN115542106A CN115542106A CN202211347560.5A CN202211347560A CN115542106A CN 115542106 A CN115542106 A CN 115542106A CN 202211347560 A CN202211347560 A CN 202211347560A CN 115542106 A CN115542106 A CN 115542106A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
An online working sampling circuit comprising: the second voltage sampling unit is suitable for acquiring a second conduction saturation voltage drop of the main power switching tube to be detected on line, and the second current sampling unit is suitable for acquiring a second conduction current of the main power switching tube to be detected on line; the second voltage sampling unit includes: the first-stage operational amplifier unit is used for being connected with a main power switch tube to be tested; and the amplitude modulation unit is electrically connected with the first-stage operational amplifier unit and comprises a subtracter and a proportional amplifier with adjustable transformation ratio, the voltage of a reference voltage end of the subtracter is adjustable, and the output end of the subtracter is connected with the input end of the proportional amplifier. The online working sampling circuit gives consideration to high test precision and low test cost.
Description
The application is a division on the basis of an invention patent with the application number of 202110268954.0 and the name of 'a high-precision junction temperature on-line monitoring method and system'.
Technical Field
The invention relates to the field of power semiconductor device testing, in particular to an online working sampling circuit.
Background
Junction temperature is an important parameter characterizing the operating and health status of power semiconductor devices. And the chip in the power semiconductor device is packaged in the module and works in a high-voltage large-current environment, so that the junction temperature of the chip cannot be directly measured. Therefore, the online monitoring of the junction temperature of the power semiconductor device in the working state is very difficult, and is also a hot spot of current research.
The traditional method for detecting the junction temperature of the power semiconductor chip is mainly based on the research of Si IGBT, and comprises four major methods, namely a physical contact method, an optical measurement method, a model prediction method and a thermal inductance parameter method (TSEPs). The thermosensitive electrical parameter method uses the chip as a temperature sensor, reflects the change of the average junction temperature of the chip by measuring the change of the temperature sensitive electrical parameter, can realize non-invasive measurement of the power module to be measured, and is theoretically the most suitable method for online monitoring of the junction temperature.
The thermosensitive electrical parameter sensing method is divided into a plurality of types according to different sensitive parameters. The method for measuring the junction temperature by applying the conduction voltage drop under the condition of large current has low requirement on the measurement time sequence, does not influence the original control algorithm of the controller, has low hardware invasiveness, and has been widely researched at present on the laboratory level.
However, the current method for measuring the junction temperature by applying the conduction voltage drop under the condition of large current cannot give consideration to high test precision and low test cost. The accuracy of the on-line test of the conduction saturation voltage drop needs to be improved, and the test cost needs to be improved.
Disclosure of Invention
The invention aims to solve the technical problem that the prior art cannot give consideration to high test precision and low test cost.
In order to solve the above technical problem, the present invention provides an online working sampling circuit, including: the second voltage sampling unit is suitable for acquiring a second conduction saturation voltage drop of the main power switching tube to be detected on line, and the second current sampling unit is suitable for acquiring a second conduction current of the main power switching tube to be detected on line; the second voltage sampling unit includes: the first-stage operational amplifier unit is used for being connected with a main power switch tube to be tested; the amplitude modulation unit is electrically connected with the first-stage operational amplification unit and comprises a subtracter and a proportional amplifier with adjustable transformation ratio, the voltage of a reference voltage end of the subtracter is adjustable, and an output end of the subtracter is connected with an input end of the proportional amplifier.
Optionally, a voltage at the output terminal of the subtractor is equal to a voltage at the input terminal of the subtractor minus a voltage at the reference voltage terminal.
Optionally, the second voltage sampling units further include: and the input end of the first low-pass filter is connected with the output end of the first-stage operational amplifier unit, and the output end of the first low-pass filter is connected with the input end of the subtracter.
Optionally, the first-stage operational amplifier unit includes a first current-voltage conversion operational amplifier, a bias current source, a seventh diode, an eighth diode, a ninth diode, a first resistor and a second resistor, and an anode input end of the first current-voltage conversion operational amplifier is connected to a positive connection end of the seventh diode, a negative connection end of the eighth diode, and a positive connection end of the ninth diode; the positive connecting end of the eighth diode is connected with the negative connecting end of the ninth diode, one end of the first resistor and the bias current source, the other end of the first resistor is connected with the negative input end of the first current-voltage conversion operational amplifier and one end of the second resistor, the other end of the second resistor is connected with the output end of the first current-voltage conversion operational amplifier, the negative connecting end of the seventh diode serves as the input end of the first-stage operational amplifier unit, and the output end of the first current-voltage conversion operational amplifier serves as the output end of the first-stage operational amplifier unit.
Optionally, the resistance of the first resistor is equal to the resistance of the second resistor.
Optionally, a conduction voltage drop of the eighth diode is equal to a conduction voltage drop of the seventh diode.
Optionally, a distance between the eighth diode and the seventh diode is less than or equal to 10mm.
Optionally, the second voltage sampling unit further includes: and the input end of the analog signal isolation unit is connected with the output end of the proportional amplifier.
Optionally, the second voltage sampling units further include: and the current discharge unit is connected with the first-stage operational amplifier unit and is suitable for discharging current in the first-stage operational amplifier unit when a main power switch tube to be tested is turned off.
Optionally, the current bleeding unit includes a MOS transistor.
Optionally, the second current sampling unit is further configured to calibrate a first conduction saturation voltage drop of the main power switching tube to be tested in an offline state.
Optionally, the main power switch tube to be tested is a working element of a power equipment module, the power equipment module includes a converter circuit unit, a current sampling internal module and a main control module, the converter circuit unit includes a plurality of main power switch tubes, an output end of the current sampling internal module is suitable for being connected to an input end of the main control module, and an output end of the main control module is suitable for providing a working time sequence for each main power switch tube in the converter circuit unit; the second current sampling unit is formed by adopting the current sampling internal module.
The technical scheme of the invention has the following beneficial effects:
according to the on-line working sampling circuit provided by the technical scheme of the invention, the second voltage sampling unit in the on-line working sampling circuit tests and obtains the second conduction saturation voltage drop. Because the second voltage sampling units each include: the first-stage operational amplifier unit is connected with a main power switch tube to be tested; and the amplitude modulation unit is electrically connected with the first-stage operational amplifier unit and comprises a subtracter and a proportional amplifier, and the output end of the subtracter is connected with the input end of the proportional amplifier. In the process of online sampling, invalid range data can be removed by the aid of the subtracter, and the data output by the subtracter is amplified through the proportional amplifier, so that the accuracy of second conduction saturation voltage drop sampled by the second voltage sampling unit is improved. The resolution of the second conduction saturation voltage drop to the junction temperature is improved. According to the scheme, a high-precision voltage testing instrument does not need to be relied on, so that the testing cost is reduced. In conclusion, the scheme gives consideration to high test precision and low test cost.
Furthermore, the second current sampling units are formed by adopting the current sampling internal modules. According to the scheme, the current sampling internal module in the power equipment module is used as the second current sampling unit, and the current sampling internal module is used for testing in the online sampling process to obtain the second breakover current. Therefore, a module for sampling the current is not required to be additionally arranged, and the cost is reduced.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a graph of T at different conduction currents for junction temperature calibration in the prior art j And V CE The relation between the two is shown;
FIG. 2 is a typical three-phase bridge converter;
fig. 3 is a schematic diagram of a high-precision junction temperature online monitoring system according to an embodiment of the present invention;
fig. 4 is a schematic diagram of a junction temperature calibration module according to an embodiment of the present invention;
fig. 5 is a schematic diagram of a working sampling module according to an embodiment of the present invention;
fig. 6 is a schematic diagram of a power equipment module and a second voltage sampling unit according to an embodiment of the present invention;
fig. 7 is a schematic diagram of online sampling by a second voltage sampling unit according to an embodiment of the present invention;
fig. 8 is a schematic diagram of online sampling by the second current sampling unit according to an embodiment of the present invention;
fig. 9 is a schematic diagram of a junction temperature calibration process performed by the junction temperature calibration module on the main power switching tube to be tested according to an embodiment of the present invention;
fig. 10 is a flowchart of a high-precision junction temperature online monitoring method according to an embodiment of the present invention;
fig. 11 is a timing diagram of online sampling by the current sampling internal module according to an embodiment of the present invention.
Detailed Description
As described in the background, the prior art cannot combine high test accuracy with low test cost.
The current research of the large-current conduction voltage drop method is basically limited to theoretical level, the conduction voltage drop and the junction temperature are considered to present monotonous correlation under a certain current, and a laboratory stage principle model proves that the mapping calculation of the junction temperature can be realized by measuring the conduction current and the conduction voltage drop under a specific condition. T is j ＝f(V CE I), wherein T j Is junction temperature, V CE For conduction voltage drop, I is the conduction current.
The method for measuring the junction temperature by using the conduction voltage drop method has the following problems in the practical engineering application. For most power devices (for convenience of discussion, an IGBT example is applied, and for visual representation, a 1700V/1000A IG BT power module is selected for example, T j And V CE FIG. 1 shows the mapping relationship between I and II. The different lines represent T at different conduction currents j And V CE The relationship between them. The different lines in fig. 1 show different conduction currents, the conduction voltage drop V at 6.25mA CE For the junction temperature T j The resolution of (2) is-2.77 mV/DEG C, and the conduction voltage drop V is 100A CE For the junction temperature T j The resolution of (A) is-0.90 mV/DEG C, and the conduction voltage drop V is at 200A CE For junction temperature T j The resolution of (A) is-0.15 mV/DEG CThe conduction voltage drop V is reduced when the current is 300A CE For the junction temperature T j The resolution of (2) is 0.56 mV/DEG C, and the conduction voltage drop V is 400A when the conduction current is CE For junction temperature T j The resolution of (1.07 mV/DEG C), and the conduction voltage drop V at the conduction current of 500A CE For the junction temperature T j The resolution of (1.62 mV/DEG C), and the conduction voltage drop V at the conduction current of 600A CE For the junction temperature T j The resolution of (2.10 mV/DEG C), and the conduction voltage drop V when the conduction current is 700A CE For junction temperature T j The resolution of (2.59 mV/DEG C), and the conduction voltage drop V at the conduction current of 800A CE For junction temperature T j The resolution of (1) is 3.09 mV/DEG C, and the conduction voltage drop V is reduced when the conduction current is 900A CE For the junction temperature T j The resolution of (A) is 3.54 mV/DEG C, and the conduction voltage drop V is reduced when the conduction current is 1000A CE For junction temperature T j The resolution of (a) was 4.02 mV/deg.C.
As can be seen from FIG. 1, the conduction voltage drop V CE For junction temperature T j Is not high, so the voltage sampling precision is high, and the conduction voltage drop V is low CE Is influenced by the conduction current I coupling more than the junction temperature, so that the conduction voltage drop V in the temperature change range of 25-150 ℃ under the fixed current value is larger than the conduction voltage drop V in the order of 3V CE The variation range is only about 0.5V.
A typical three-phase bridge converter is shown in fig. 2, where the device under test is T6 'in this example, and T6' is in an alternating on-off state in the operating state. At the time of stable conduction of T6', sampling the current I flowing through T6 6 And a turn-on voltage V CE6 (ii) a When T6' is cut off and T5' is conducted, the voltage at two ends of T6' is the direct current bus voltage Udc of the converter, generally 300-1000V, so that the high voltage needs to be isolated to protect the circuit to be tested. However, for a circuit with a higher isolation voltage and a lower measured voltage, it is difficult to ensure the measurement accuracy.
The current coupling influence is large, and the current sampling precision requirement is high. The current sampling accuracy seriously affects the junction temperature estimation accuracy. Theoretically achieving a temperature resolution of 1 c requires a current sensor with 0.2% accuracy. Only current sensors in laboratory measurement level can meet the precision requirement, most current sensors applied to industrial equipment generally adopt open-loop Hall current sensors or connect precise resistors in series in a loop, the current measurement precision is about 3 percent generally, and the requirement of junction temperature measurement precision can not be met far away. Table 1 shows the effect of voltage current sampling error on the results of the temperature measurement.
TABLE 1
Secondly, the junction temperature testing process has high requirements on sampling time sequence and noise suppression. In order to obtain accurate junction temperature, it is required that voltage and current sampling must be kept synchronous; meanwhile, as the converter works in an alternate conduction state, other switch actions generate high dv/dt and di/dt to generate great interference on a tested device, the sampling time sequence needs to be controlled, and filtering is added in a sampling link to inhibit the interference; and meanwhile, the sampling and filtering processing algorithm is independently controlled, and the normal control function is not interfered.
Based on the above problems, most of researches based on the large current conduction voltage drop method are based on expensive and precise measurement equipment in a laboratory, and measurement results are obtained under specific timing sequence and specific working conditions. For practical engineering application, the junction temperature measurement function needs to be realized by applying lower cost and volume under the existing hardware condition, and certain precision requirement can be met.
On this basis, an embodiment of the present invention provides a high-precision junction temperature online monitoring system 1, which is combined with fig. 3 to 5, and includes:
the junction temperature calibration module 10 is used for calibrating the junction temperature, the junction temperature calibration module 10 comprises a first voltage sampling unit 101 and a first current sampling unit 102, and the junction temperature calibration module 10 is suitable for injecting current to a main power switching tube to be tested in the forward direction in the junction temperature calibration process and acquiring a first conduction saturation voltage drop of the main power switching tube to be tested in an off-line state and a mapping relation between the first conduction current and the junction temperature of the main power switching tube to be tested;
the data fitting module 20 is adapted to fit data in the mapping relation to obtain a characteristic function relation, wherein the characteristic function relation takes the first conduction saturation voltage drop and the first conduction current as independent variables, and takes the junction temperature of the main power switch tube to be measured as a dependent variable;
the working sampling module 30, the working sampling module 30 includes a second voltage sampling unit 301 and a second current sampling unit 302, the second voltage sampling unit 301 is adapted to obtain a second conduction saturation voltage drop of the main power switching tube to be tested on line, and the second current sampling unit 302 is adapted to obtain a second conduction current of the main power switching tube to be tested on line;
the first voltage sampling unit 101 and the second voltage sampling unit 301 each include: the first-stage operational amplifier unit is connected with a main power switch tube to be tested; the amplitude modulation unit is electrically connected with the first-stage operational amplifier unit and comprises a subtracter and a proportional amplifier, and the output end of the subtracter is connected with the input end of the proportional amplifier;
and the junction temperature test obtaining unit 40 is adapted to obtain a junction temperature value corresponding to the second conduction saturation voltage drop and the second conduction current in the characteristic function relationship by the junction temperature test obtaining unit 40.
The junction temperature calibration module 10 can execute a junction temperature calibration step, and the junction temperature calibration step is performed in an offline state of the processing of the main power switching tube to be tested. The main power switch tube to be tested is a working element of the power equipment module, and the processing of the main power switch tube to be tested in an off-line state refers to: except for the main power switch tube to be tested, other active devices in the power equipment module are all in a closed state.
The working sampling module 30 can perform the step of on-line sampling. The online sampling refers to: and testing the main power switch tube to be tested in the working state of the power equipment module, and applying alternately conducted voltage on the grid electrode of the main power switch tube to be tested.
The first voltage sampling unit 101 is adapted to obtain a first conduction saturation voltage drop of a main power switching tube to be tested in an offline state in a junction temperature calibration process, and the first current sampling unit 102 is adapted to obtain a first conduction current of the main power switching tube to be tested in the offline state in the junction temperature calibration process.
The second voltage sampling unit 301 is adapted to obtain a second conduction saturation voltage drop of the main power switch tube to be tested on line, and the second current sampling unit 302 is adapted to obtain a second conduction current of the main power switch tube to be tested on line.
In this embodiment, the first voltage sampling unit 101 and the second voltage sampling unit 301 have the same structure.
The main power switch tube to be tested is a working element of the power equipment module.
Referring to fig. 6, the power equipment module includes a converter circuit unit W, a current sampling internal module Q1 and a main control module 41, the converter circuit unit W includes a plurality of main power switch tubes, an output end of the current sampling internal module Q1 is adapted to be connected to an input end of the main control module 41, and an output end of the main control module 41 is adapted to provide a working timing sequence for each main power switch tube in the converter circuit unit W.
Referring to fig. 6, the converter circuit unit W includes: direct current network, alternating current network and bridge type power switch tube circuit, have a plurality of power switch tube units in the bridge type power switch tube circuit, each power switch tube unit includes: the power supply comprises a main power switch tube and a diode reversely connected in parallel with the main power switch tube; the alternating current network comprises a load inductor electrically connected with the main power switch tube, and the direct current network comprises a load resistor and a direct current bus power supply U which are connected in series dc 。
In an embodiment, the converter circuit unit is a three-phase full-bridge converter circuit as an example, and referring to fig. 6, the bridge type power switch tube circuit in the converter circuit unit W includes a first power switch tube unit, a second power switch tube unit, a third power switch tube unit, a fourth power switch tube unit, a fifth power switch tube unit, and a sixth power switch tube unit. The first power switch tube unit comprises a first main power switch tube T1 and a first diode D1 reversely connected with the first main power switch tube T1 in parallel; the second power switch tube unit comprisesThe second main power switch tube T2 and a second diode D2 which is reversely connected with the second main power switch tube T2 in parallel; the third power switch tube unit comprises a third main power switch tube T3 and a third diode D3 which is reversely connected with the third main power switch tube T3 in parallel; the fourth power switch tube unit comprises a fourth main power switch tube T4 and a fourth diode D4 which is reversely connected with the fourth main power switch tube T4 in parallel; the fifth power switch tube unit comprises a fifth main power switch tube T5 and a fifth diode D5 which is reversely connected with the fifth main power switch tube T5 in parallel; the sixth power switch tube unit comprises a sixth main power switch tube T6 and a sixth diode D6 which is connected with the sixth main power switch tube T6 in an inverse parallel mode. The collector of the first main power switch tube T1, the collector of the third main power switch tube T3 and the collector of the fifth main power switch tube T5 are connected together and connected with a direct current bus power supply U DC The emitter of the second main power switch tube T2, the emitter of the fourth main power switch tube T4 and the emitter of the sixth main power switch tube T6 are connected together and connected with a direct current bus power supply U dc Is connected. The first main power switch tube T1, the second main power switch tube T2, the third main power switch tube T3, the fourth main power switch tube T4, the fifth main power switch tube T5 and the sixth main power switch tube T6 are all IGBTs (insulated gate bipolar transistors). In the embodiment, the IGBT is selected as the main power switch tube to be tested. Of course, in other embodiments, a power switch such as a MOSFET may also be selected as the main power switch to be tested.
Referring to fig. 6, the converter circuit unit W further includes: first load inductance L A First load inductance L A One end of the first primary power switch tube is electrically connected with an emitting electrode of the first primary power switch tube T1 and a collector electrode of the second primary power switch tube T2; and a first load inductor L A A first load resistor R connected in series A First load inductance L A And the other end of the first load resistor R A Is connected with one end of the connecting rod; second load inductance L B Second load inductance L B One end of the first switch is electrically connected with an emitter of a third main power switch tube T3 and a collector of a fourth main power switch tube T4; and a second load inductance L B Second load resistor R connected in series B Second load inductance L B And the other end of the first resistor and a second load resistor R B Is connected with one end of the connecting rod; third load inductance L C Third load inductance L C One end of the first switch is electrically connected with the emitter of the fifth main power switch tube T5 and the collector of the sixth main power switch tube T6; and a third load inductance L C Third load resistor R connected in series C Third load inductance L C And the other end of the third load resistor R C Is connected with one end of the connecting rod; a first load resistor R A The other end of (1), a second load resistor R B And the other end of the third load resistor R C And the other ends are connected together. In this embodiment, the sixth main power switch transistor T6 is selected as the main power switch transistor to be tested. Of course, in other embodiments, other main power switch tubes may be arbitrarily selected as the main power switch tube to be tested.
The power equipment module further includes: a CPU (central processing unit) 42. The main control module 41, the CPU (central processing unit) 42 and the junction temperature obtaining unit 40 are integrated together to form a structure of a control unit.
Fig. 7 shows a specific circuit configuration of the second voltage sampling unit 301. The second voltage sampling unit 301 includes a bias current source Y11.
The second voltage sampling unit 301 includes: the first-stage operational amplifier unit Y1 is connected with a main power switching tube to be tested; and the amplitude modulation unit Y3 is electrically connected with the first-stage operational amplifier unit Y1, the amplitude modulation unit Y3 comprises a subtracter Y31 and a proportional amplifier Y32, and the output end of the subtracter Y31 is connected with the input end of the proportional amplifier Y32.
In this embodiment, the second voltage sampling unit 301 includes: the circuit comprises a first-stage operational amplifier unit Y1, a first low-pass filter Y2, an amplitude modulation unit Y3, an analog signal isolation unit Y4 and a current leakage unit S1. The input end of the first low-pass filter Y2 is connected with the output end of the first-stage operational amplifier unit Y1, and the output end of the first low-pass filter Y2 is connected with the input end of the subtracter Y31. The voltage signal at the output of the proportional amplifier Y32 is greater than the voltage signal at the input of the proportional amplifier Y32. The input end of the analog signal isolation unit Y4 is connected with the output end of the proportional amplifier Y32.
The current leakage unit S1 is connected with the first-stage operational amplifier unit Y1, and the current leakage unit S1 is suitable for discharging current in the first-stage operational amplifier unit Y1 when a main power switch tube to be tested is turned off. The current bleeding unit S1 includes a MOS transistor.
The output end of the analog signal isolation unit Y4 is adapted to output a conduction voltage, and specifically, when the second voltage sampling unit 301 performs online sampling, the output end of the analog signal isolation unit Y4 outputs a second conduction saturation voltage drop.
The first-stage operational amplifier unit Y1 comprises a first current-voltage conversion operational amplifier Y12, a bias current source Y11, a seventh diode D7, an eighth diode D8, a ninth diode D9, a first resistor R1 and a second resistor R2, wherein an anode input end of the first current-voltage conversion operational amplifier Y12 is connected with a positive connection end of the seventh diode D7, a negative connection end of the eighth diode D8, a positive connection end of the ninth diode D9 and the current leakage unit S1. The positive connecting end of the eighth diode D8 is connected with the negative connecting end of the ninth diode D9, one end of the first resistor R1 and the bias current source Y11, the other end of the first resistor R1 is connected with the negative input end of the first current-voltage conversion operational amplifier Y12 and one end of the second resistor R2, the other end of the second resistor R2 is connected with the output end of the first current-voltage conversion operational amplifier Y12, the negative connecting end of the seventh diode D7 serves as the input end of the first-stage operational amplifier unit Y1, and the output end of the first current-voltage conversion operational amplifier Y12 serves as the output end of the first-stage operational amplifier unit Y1.
In this embodiment, taking the sixth main power switch tube T6 as the main power switch tube to be tested as an example, correspondingly, the negative connection end of the seventh diode D7 is connected to the collector of the sixth main power switch tube T6.
In this embodiment, the current bleeding unit S1 includes an MOS transistor, a source of the MOS transistor is connected to the negative connection terminal of the eighth diode D8, a drain of the MOS transistor is grounded, and a voltage applied to a gate of the MOS transistor is opposite to a voltage applied to a gate of the main power switching tube to be measured.
In this embodiment, when the main power switch to be tested is turned on, that is, the sixth main power switch T6 is turned on, the potential difference between the M point and the GNDH point is the intrinsic conduction voltage drop Vce of the sixth main power switch T6, and at this time, the first-stage operational amplifier unit Y1 makes the intrinsic conduction voltage drop Vce follow 1: the proportion of 1 is converted and output to a post-stage circuit to realize impedance isolation. When the fifth main power switch tube T5 is turned on, the potential difference of the point M with respect to the point GNDH is the dc bus voltage Udc, and at this time, the seventh diode D7 is cut off, and due to the existence of the first-stage operational amplifier unit Y1, the voltage sampling unit 101 can prevent the post-stage circuit from being damaged by overvoltage in the online sampling process.
When the resistance value of the first resistor R1 is equal to that of the second resistor R2, the potential difference V of the point N relative to the point GNDH N ＝2Va—V b ＝2V CE +2V D7 —(V CE +V D7 +V D8 )＝V CE
In order to counteract the interference of the voltage drop of the seventh diode D7 to the measurement, the eighth diode D8 is a high-voltage fast recovery diode of the same type as the seventh diode D7, and the seventh diode D7 and the eighth diode D8 are required to be closely arranged at the same ambient temperature, so as to eliminate the inconsistency between the voltage drop of the seventh diode D7 caused by the temperature and the voltage drop of the eighth diode D8 caused by the temperature.
When T6 is off, the MOS transistor provides a bleed-off loop for bias current source Y11.
In a specific embodiment, the conduction voltage drop of the eighth diode D8 and the conduction voltage drop of the seventh diode D7 are equal.
In a specific embodiment, the distance between the eighth diode D8 and the seventh diode D7 is less than or equal to 10mm. The seventh diode D7 and the eighth diode D8 are closely arranged and have similar ambient temperature, so as to eliminate the inconsistency between the voltage drop of the seventh diode D7 caused by temperature and the voltage drop of the eighth diode D8 caused by temperature.
The first low-pass filter Y2 comprises a third resistor R3, a fourth resistor R4, a first capacitor C1, a second capacitor C2 and a second operational amplifier Y21, one end of the third resistor R3 is connected with the output end of the first-stage operational amplifier Y1, the other end of the third resistor R3 is connected with one end of the fourth resistor R4 and one end of the first capacitor C1, the other end of the first capacitor C1 is connected with the negative electrode input end of the second operational amplifier Y21, the positive electrode input end of the second operational amplifier Y21 is connected with the other end of the fourth resistor R4 and one end of the second capacitor C2, the other end of the second capacitor is grounded, and the negative electrode input end of the second operational amplifier Y21 is connected with the output end of the second operational amplifier Y21.
The first low-pass filter Y2 filters out high-frequency interference generated in the switching process of a main power switch tube (T1-T6 in the embodiment).
The subtractor Y31 has a reference voltage terminal, the voltage V of which REF Adjustable, the voltage of the output end of the subtracter Y31 is equal to the voltage of the input end of the subtracter Y31 minus the voltage V of the reference voltage end REF 。
The amplitude modulation unit Y3 adjusts the voltage range input to the amplitude modulation unit Y3 to an appropriate range and outputs the adjusted voltage range.
Most sampling circuit amplification is fixed. As can be seen from fig. 1 (three-dimensional correspondence of on-state voltage-junction temperature-current), a segment with temperature resolution only occupies a narrow part of the whole measurement range. In this embodiment, in order to improve the temperature resolution, a subtracter Y31 is used to remove invalid range data, where in this embodiment, the invalid range data refers to: below V REF The data of (1). After the invalid range data is removed, the potential difference V of the point P relative to the point GNDH is adjusted by a variable ratio adjustable proportional amplifier Y32 P And adjusting the range required by the circuit at the later stage.
Selecting a high-precision voltage reference chip as V under the condition of knowing a characteristic curve of a main power switch tube to be tested REF A reference value of (d); under the condition that a main power switch tube to be tested is uncertain or the condition that the characteristic range of the main power switch tube to be tested is greatly changed along with current, selecting a programmable voltage signal as V REF Of the reference value of (c).
The analog signal isolation unit Y4 realizes the analog signal isolation function and is used for isolating strong current interference and ensuring the safe operation of equipment and the safety of personnel. The method for isolating the analog signal isolation unit Y4 can select high-resistance isolation, optical coupling isolation, magnetic isolation or capacitance isolation.
Referring to fig. 8, the second current sampling unit 302 includes: the power supply circuit comprises a hall sampling unit 4203, a second initial operational amplifier unit 4201 and a second low-pass filter 4202, wherein a current input end of the hall sampling unit 4203 is suitable for being electrically connected with a main power switch tube to be tested, when the main power switch tube to be tested is an IGBT, the current input end of the hall sampling unit 4203 is suitable for being electrically connected with a collector back emitter of the main power switch tube to be tested, and when the main power switch tube to be tested is a MOSFET, the current input end of the hall sampling unit 4203 is suitable for being electrically connected with a source or a drain of the main power switch tube to be tested. Two voltage output ends of the hall sampling unit 4203 are electrically connected to a first input end and a second input end of the second initial operational amplifier unit 4201, respectively, an output end of the second initial operational amplifier unit 4201 is connected to an input end of the second low pass filter 4202, and an output end of the second low pass filter 4202 is adapted to obtain a second on-current of the main power switch to be tested on line.
The hall sampling unit 4203 includes a first magnetic core, the first magnetic core is in an annular structure and has a notch, a first hall element is placed at the notch of the first magnetic core, a first guide rod is arranged in the first magnetic core, the first magnetic core surrounds the first guide rod, specifically, the first guide rod is suitable for being electrically connected with a power switch tube of a main to be tested, and one end of the first guide rod is used as a current input end of the first hall sampling unit.
The second initial operational amplifier unit 4201 is adapted to output the differential voltage output by the hall sampling unit 4203 as a single-ended fixed constant voltage.
In this embodiment, the structure of the second low-pass filter 4202 is the same as the structure of the first low-pass filter Y42, and is not described in detail.
In this embodiment, the second low-pass filter 4202 is adopted to adjust the delay of the second current sampling unit 302, so that the second conduction saturation voltage drop sampled by the working sampling module 30 for the main power switch to be tested is synchronized with the signal of the second conduction current. Fig. 9 is a schematic diagram of a junction temperature calibration process performed by the junction temperature calibration module on the main power switching tube to be tested according to an embodiment of the present invention.
Referring to fig. 9, a half-bridge single-pulse test circuit is built with a main power switch (DUT) to be tested, and the junction temperature calibration module 10 includes: a voltage source 60; a capacitor C; a heated platen 64; a fifth main power switch tube, a fifth diode, a resistor 63, a sixth main power switch tube T6 and a sixth diode D6; a first voltage sampling unit 101 and a first current sampling unit 102.
The structure of the first voltage sampling unit 101 refers to the structure of the second voltage sampling unit 301, and is not described in detail.
In the process of performing junction temperature calibration by using the junction temperature calibration module 10, the power equipment module is in a state of stopping working, the main power switch tube to be tested is kept in a conducting state, a bias current source of the first voltage sampling unit 101 injects a current into the main power switch tube to be tested in a forward direction, the first voltage sampling unit 101 outputs a first conducting saturation voltage drop, and the first current sampling unit 102 tests a first conducting current of the main power switch tube to be tested. The magnitude of the forward injection current of the bias current source of the first voltage sampling unit 101 to the main power switch tube to be tested is 5mA-200mA, such as 5mA, 10mA, 50mA, 100mA, 150mA or 200mA, so that the constant current is small, and the phenomenon that the conduction current inside the main power switch tube to be tested is too large and generates heat can be avoided.
Specifically, in the process of performing junction temperature calibration by using the junction temperature calibration module 10, the main power switch tube to be tested is placed on the heating platform 64, specifically, a chip corresponding to the main power switch tube to be tested is placed on the heating platform 64, the main power switch tube to be tested is heated to a predetermined temperature by the heating platform 64, a gate of the main power switch tube to be tested is conducted, and a bias current source of the first voltage sampling unit 101 injects a current to the main power switch tube to be tested in a forward direction. In the process of calibrating the main power switching tube to be tested by the junction temperature calibration module 10, the temperature of the heating platform 64 is adjusted to obtain different junction temperatures T of the main power switching tube to be tested at different junction temperatures j1 First conduction saturation voltage drop V CE1 And a first on-current I D1 To obtain the main power switch to be testedFirst conduction saturation voltage drop V of the tube in an off-line state and a conduction state CE1 And a first on-current I D1 Junction temperature T with main power switch tube to be tested j1 A first mapping relationship therebetween. The junction temperature of the main power switch tube to be measured in the first mapping relationship is calibrated by the temperature of the heating platform 64.
The characteristic functional relationship to which the data fitting module 20 fits may be a polynomial or trigonometric function. It should be noted that, in this embodiment, the specific data fitting module 20 is not limited, as long as the data fitting module 20 realizes fitting according to the mapping relationship as the characteristic function relationship.
In one embodiment, the first current sampling unit 102 and the second current sampling unit 302 are the same current sampling unit, and the detailed structure of the first current sampling unit 102 refers to the foregoing description of the second current sampling unit 302. The output end of the second low-pass filter in the first current sampling unit 102 is adapted to output the first on-current of the main power switch tube to be tested in the junction temperature calibration process.
Because the first current sampling unit 102 and the second current sampling unit 302 are the same current sampling unit, the first conduction current tested in the junction temperature calibration process brings in a determination error, and the second conduction current tested in the online sampling process also brings in a determination error, so that the determination error in the second conduction current offsets the determination error in the first conduction current, the current testing precision is improved, and the precision of the junction temperature value obtained by the junction temperature obtaining unit is finally improved.
It should be noted that, in other embodiments, the first current sampling unit and the second current sampling unit may be different sampling units.
In one embodiment, the first current sampling unit 102 and the second current sampling unit 302 are both formed by using the current sampling internal module Q1. In the scheme, a current sampling internal module in the power equipment module is used as the first current sampling unit 102 and the second current sampling unit 302, that is, a first conduction current is obtained by using a current sampling internal module test in a junction temperature calibration process, and a second conduction current is obtained by using a current sampling internal module test in an online sampling process. This requires an additional module for sampling the current, thus reducing costs.
In one embodiment, the sampling error of the current sampling internal module Q1 is less than or equal to 3%. In this embodiment, even if the sampling error of the current sampling internal module Q1 is large, a high sampling precision for the current can be achieved, that is, the determination error of the first conduction current and the second conduction current is compensated in the calibration process, so that the precision of the junction temperature value finally tested by the junction temperature test obtaining unit is improved.
In this embodiment, the first current sampling unit 102 includes an open-loop hall current sensor; the second current sampling unit 302 includes an open loop hall current sensor.
In this embodiment, the junction temperature calibration module is used to inject a current into the main power switching tube to be tested in a forward direction, and obtain a first conduction saturation voltage drop of the main power switching tube to be tested in an off-line state and a mapping relationship between the first conduction current and the junction temperature of the main power switching tube to be tested. And the working sampling module is adopted to obtain a second conduction saturation voltage drop and a second conduction current of the main power switching tube to be tested on line. A first voltage sampling unit in the junction temperature calibration module tests and obtains a first conduction saturation voltage drop. And a second voltage sampling unit in the working sampling module tests and obtains a second conduction saturation voltage drop. Because the first voltage sampling unit and the second voltage sampling unit both comprise: the first-stage operational amplifier unit is connected with a main power switch tube to be tested; and the amplitude modulation unit is electrically connected with the first-stage operational amplification unit and comprises a subtracter and a proportional amplifier, and the output end of the subtracter is connected with the input end of the proportional amplifier. Therefore, in the junction temperature calibration process or the online sampling process, the invalid range data can be removed by the subtracter, and the data output by the subtracter is amplified by the proportional amplifier, so that the resolution of the first conduction saturation voltage drop sampled by the first voltage sampling unit to the junction temperature in the mapping relation is improved. The second conduction saturation voltage drop is obtained by adopting a second voltage sampling unit for testing, and the second voltage sampling unit and the first voltage sampling unit have the same structure. Because the resolution of the first conduction saturation voltage drop sampled by the first voltage sampling unit in the mapping relation to the junction temperature is improved, the accuracy of the junction temperature obtained by the junction temperature test obtaining unit is improved after the junction temperature obtaining unit is adopted to obtain the junction temperature values corresponding to the second conduction saturation voltage drop and the second conduction current in the characteristic function relation. In addition, a high-precision voltage testing instrument does not need to be relied on in the scheme, so that the testing cost is reduced. In conclusion, the scheme gives consideration to high test precision and low test cost.
Further, the first current sampling unit and the second current sampling unit are the same current sampling unit. The first conduction current tested in the junction temperature calibration process is brought into a determined error, and the second conduction current tested in the online sampling process is also brought into the determined error, so that the determined error in the second conduction current offsets the determined error in the first conduction current, the precision of the current test is improved, and the precision of the junction temperature value obtained by the junction temperature test obtaining unit is improved finally.
Further, the first current sampling unit and the second current sampling unit are both formed by adopting the current sampling internal module. According to the scheme, the current sampling internal module in the power equipment module is used as the first current sampling unit and the second current sampling unit, namely, the current sampling internal module is used for testing and obtaining the first breakover current in the junction temperature calibration process, and the current sampling internal module is used for testing and obtaining the second breakover current in the online sampling process. Therefore, a module for sampling the current is not required to be additionally arranged, and the cost is reduced.
Correspondingly, another embodiment of the present invention further provides a high-precision junction temperature online monitoring method, referring to fig. 10, including the following steps:
s01: the junction temperature calibration module is adopted to inject current into the main power switching tube to be tested in a forward direction, and a mapping relation between a first conduction saturation voltage drop of the main power switching tube to be tested in an off-line state and a first conduction current and the junction temperature of the main power switching tube to be tested is obtained;
s02: fitting the data in the mapping relation by adopting a data fitting module to obtain a characteristic function relation, wherein the characteristic function relation takes the first conduction saturation voltage drop and the first conduction current as independent variables and takes the junction temperature of the main power switch tube to be measured as a dependent variable;
s03: the working sampling module is adopted to obtain a second conduction saturation voltage drop and a second conduction current of the main power switching tube to be detected on line;
s04: and acquiring junction temperature values corresponding to the second conduction saturation voltage drop and the second conduction current in the characteristic function relation by using the test junction temperature acquisition unit.
In the process of injecting current to the main power switch tube to be tested in the forward direction, the main power switch tube to be tested is suitable for being placed on the heating platform 64, and the junction temperature of the main power switch tube to be tested in the mapping relation is calibrated by the temperature of the heating platform 64.
The working sampling module 30 is used to obtain the second conduction saturation voltage drop and the second conduction current of the main power switching tube to be tested on line, and specifically, the second voltage sampling unit 301 is used to obtain the second conduction saturation voltage drop V of the main power switching tube to be tested on line CE2 A second current sampling unit 302 is adopted to obtain a second on-current I of the main power switch tube to be tested on line D2 。
In one embodiment, the first current sampling unit and the second current sampling unit are both formed by using the current sampling internal module, and the first on-state current and the second on-state current are both obtained by testing the current sampling internal module.
The current sampling internal module samples current for the main control module in a first characteristic time period, and the current sampling internal module samples second conduction current in a second characteristic time period. The first characteristic period and the second characteristic period are spaced apart from each other. This allows the data of the second conduction current and the current data sampled for the main control module to be non-interfering with each other.
Referring to fig. 11, during operation of the power equipment module, the main control module 41 performs timing control using a carrier as a time standard. In this embodiment, the main power switch tube to be tested is a lower bridge, the specific sixth main power switch tube is a lower bridge, and correspondingly, the fifth main power switch tube is an upper bridge of the sixth main power switch tube, a timing sequence applied to the upper bridge is opposite to a timing sequence applied to the lower bridge, and when the carrier wave overflows and is interrupted, the main control module 41 performs related analog sampling and calculation; sampling the second conduction current when the carrier underflow is interrupted, and synchronously performing the second conduction saturation voltage drop V in the second conduction current sampling process CE2 Sampling of (3).
The converter circuit unit comprises a plurality of half bridges, and each half bridge consists of two main power switch tubes which are connected in series; at least in one half bridge, when one main power switch tube is used as the main power switch tube to be tested, the other main power switch tube is used as the geminate tube of the main power switch tube to be tested. When the power equipment module is in a working state, a first high level and a first low level are alternately applied to the pair transistor of the main power switch tube to be tested. The first characteristic period has a first start timing which selects an intermediate timing of a period corresponding to an arbitrary first high level.
When the power equipment module is in a working state, applying alternate second high level and second low level to a main power switch tube to be tested; the second characteristic period has a second start time, and the second start time selects a middle time of a period corresponding to any second high level.
When a second high level is applied to the main power switch tube to be tested, a first low level is applied to the geminate transistor of the main power switch tube to be tested, and when a second low level is applied to the main power switch tube to be tested, a first high level is applied to the geminate transistor of the main power switch tube to be tested.
In this embodiment, the accuracy of the junction temperature value finally output by the junction temperature test obtaining unit is high, and in a specific embodiment, the resolution of the junction temperature value finally output by the junction temperature test obtaining unit is less than or equal to 1 ℃, for example, 0.8 ℃ or 1 ℃.
Another embodiment of the present invention further provides an online working sampling circuit, including: the second voltage sampling unit is suitable for acquiring a second conduction saturation voltage drop of the main power switching tube to be detected on line, and the second current sampling unit is suitable for acquiring a second conduction current of the main power switching tube to be detected on line; the second voltage sampling unit includes: the first-stage operational amplifier unit is used for being connected with a main power switch tube to be tested; the amplitude modulation unit is electrically connected with the first-stage operational amplification unit and comprises a subtracter and a proportional amplifier with adjustable transformation ratio, the voltage of a reference voltage end of the subtracter is adjustable, and an output end of the subtracter is connected with an input end of the proportional amplifier.
The voltage of the output end of the subtracter is equal to the voltage of the input end of the subtracter minus the voltage of the reference voltage end.
The second voltage sampling units further each include: and the input end of the first low-pass filter is connected with the output end of the first-stage operational amplifier unit, and the output end of the first low-pass filter is connected with the input end of the subtracter.
In one embodiment, the first-stage operational amplifier unit comprises a first current-voltage conversion operational amplifier, a bias current source, a seventh diode, an eighth diode, a ninth diode, a first resistor and a second resistor, wherein an anode input end of the first current-voltage conversion operational amplifier is connected with a positive connecting end of the seventh diode, a negative connecting end of the eighth diode and a positive connecting end of the ninth diode; the positive connecting end of the eighth diode is connected with the negative connecting end of the ninth diode, one end of the first resistor and the bias current source, the other end of the first resistor is connected with the negative input end of the first current-voltage conversion operational amplifier and one end of the second resistor, the other end of the second resistor is connected with the output end of the first current-voltage conversion operational amplifier, the negative connecting end of the seventh diode serves as the input end of the first-stage operational amplifier unit, and the output end of the first current-voltage conversion operational amplifier serves as the output end of the first-stage operational amplifier unit.
In one embodiment, the resistance value of the first resistor is equal to the resistance value of the second resistor.
In one embodiment, the conduction voltage drop of the eighth diode and the conduction voltage drop of the seventh diode are equal.
In one embodiment, the distance between the eighth diode and the seventh diode is less than or equal to 10mm.
In one embodiment, the second voltage sampling unit further includes: and the input end of the analog signal isolation unit is connected with the output end of the proportional amplifier.
In one embodiment, the second voltage sampling units each further include: and the current relief unit is connected with the first-stage operational amplifier unit and is suitable for relieving the current in the first-stage operational amplifier unit when the main power switch tube to be tested is turned off.
In one embodiment, the current bleeding unit includes a MOS transistor.
In an embodiment, the second current sampling unit is further configured to calibrate a first conduction saturation voltage drop of the main power switch tube to be tested in an offline state.
In one embodiment, the main power switch tube to be tested is a working element of a power equipment module, the power equipment module comprises a converter circuit unit, a current sampling internal module and a main control module, the converter circuit unit comprises a plurality of main power switch tubes, the output end of the current sampling internal module is suitable for being connected with the input end of the main control module, and the output end of the main control module is suitable for providing a working time sequence for each main power switch tube in the converter circuit unit. The second current sampling unit is formed by adopting the current sampling internal module.
The on-line working sampling circuit of the embodiment refers to the content of the working sampling module, and is not described again.
It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications derived therefrom are intended to be within the scope of the invention.
Claims (12)
1. An on-line working sampling circuit, comprising:
the second voltage sampling unit is suitable for acquiring a second conduction saturation voltage drop of the main power switching tube to be detected on line, and the second current sampling unit is suitable for acquiring a second conduction current of the main power switching tube to be detected on line;
the second voltage sampling unit includes: the first-stage operational amplifier unit is used for being connected with a main power switch tube to be tested; and the amplitude modulation unit is electrically connected with the first-stage operational amplifier unit and comprises a subtracter and a proportional amplifier with adjustable transformation ratio, the voltage of a reference voltage end of the subtracter is adjustable, and the output end of the subtracter is connected with the input end of the proportional amplifier.
2. The on-line sampling circuit of claim 1, wherein the voltage at the output of the subtractor is equal to the voltage at the input of the subtractor minus the voltage at the reference voltage terminal.
3. The on-line sampling circuit of claim 1, wherein the second voltage sampling units each further comprise: and the input end of the first low-pass filter is connected with the output end of the first-stage operational amplifier unit, and the output end of the first low-pass filter is connected with the input end of the subtracter.
4. The on-line working sampling circuit according to claim 1, wherein the first-stage operational amplifier unit comprises a first current-voltage conversion operational amplifier, a bias current source, a seventh diode, an eighth diode, a ninth diode, a first resistor and a second resistor, and an anode input end of the first current-voltage conversion operational amplifier is connected with a positive connection end of the seventh diode, a negative connection end of the eighth diode and a positive connection end of the ninth diode; the positive connecting end of the eighth diode is connected with the negative connecting end of the ninth diode, one end of the first resistor and the bias current source, the other end of the first resistor is connected with the negative input end of the first current-voltage conversion operational amplifier and one end of the second resistor, the other end of the second resistor is connected with the output end of the first current-voltage conversion operational amplifier, the negative connecting end of the seventh diode serves as the input end of the first-stage operational amplifier unit, and the output end of the first current-voltage conversion operational amplifier serves as the output end of the first-stage operational amplifier unit.
5. The on-line sampling circuit of claim 4, wherein the first resistor has a resistance equal to the second resistor.
6. The on-line sampling circuit of claim 4 or 5, wherein the conduction voltage drop of the eighth diode and the conduction voltage drop of the seventh diode are equal.
7. An on-line working sampling circuit according to claim 4 or 5, wherein the distance between the eighth diode and the seventh diode is less than or equal to 10mm.
8. The on-line sampling circuit of any one of claims 1 to 4, wherein the second voltage sampling unit further comprises: and the input end of the analog signal isolation unit is connected with the output end of the proportional amplifier.
9. The on-line sampling circuit of any one of claims 1 to 4, wherein the second voltage sampling units each further comprise: and the current relief unit is connected with the first-stage operational amplifier unit and is suitable for relieving the current in the first-stage operational amplifier unit when the main power switch tube to be tested is turned off.
10. The on-line sampling circuit of claim 9, wherein the current bleeding unit comprises a MOS transistor.
11. The on-line working sampling circuit of claim 1, wherein the second current sampling unit is further configured to calibrate a first conduction saturation voltage drop of the main power switch tube to be tested in an off-line state.
12. The on-line operation sampling circuit according to claim 1, wherein the main power switch tube to be tested is an operating element of a power equipment module, the power equipment module comprises a converter circuit unit, a current sampling internal module and a main control module, the converter circuit unit comprises a plurality of main power switch tubes, an output end of the current sampling internal module is suitable for being connected with an input end of the main control module, and an output end of the main control module is suitable for providing an operating time sequence for each main power switch tube in the converter circuit unit;
the second current sampling unit is formed by adopting the current sampling internal module.
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| CN116430213B (en) * | 2021-12-31 | 2024-06-25 | 芯海科技（深圳）股份有限公司 | Signal detection circuit, signal detection method, integrated circuit, detection device and electronic equipment |
| CN117031227B (en) * | 2023-06-12 | 2024-04-30 | 湖南栏海电气工程有限公司 | Nondestructive on-line monitoring circuit for conduction voltage drop of power semiconductor device |
| CN118112389B (en) * | 2024-04-28 | 2024-07-09 | 忱芯科技(上海)有限公司 | On-line junction temperature detection circuit and method for power semiconductor device |
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| FR3002646B1 (en) * | 2013-02-22 | 2015-04-17 | Technofan | ELECTRONIC TEMPERATURE SENSOR FOR MEASURING THE JUNCTION TEMPERATURE OF AN ELECTRONIC POWER SWITCH IN OPERATION AND METHOD OF MEASURING THE TEMPERATURE OF JUNCTION BY THE ELECTRONIC SENSOR |
| CN103728037B (en) * | 2014-01-07 | 2017-01-11 | 武汉纺织大学 | Junction temperature monitoring circuit system for high-power LED reliability test |
| CN106771951A (en) * | 2016-12-31 | 2017-05-31 | 徐州中矿大传动与自动化有限公司 | Electronic power switch device junction temperature on-Line Monitor Device, detection circuit and method of testing |
| CN110108999B (en) * | 2019-05-07 | 2021-10-22 | 阳光电源股份有限公司 | IGBT module working junction temperature online detection system and method |
| CN112229530B (en) * | 2020-09-30 | 2023-10-03 | 中国科学院电工研究所 | SiC-based MOSFET junction temperature online monitoring system and online monitoring method |
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