CN115468866B - Test method for Hopkinson one-dimensional dynamic compression force-electricity characteristics of piezoelectric material - Google Patents
Test method for Hopkinson one-dimensional dynamic compression force-electricity characteristics of piezoelectric material Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/30—Investigating strength properties of solid materials by application of mechanical stress by applying a single impulsive force, e.g. by falling weight
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
- G01N2203/0069—Fatigue, creep, strain-stress relations or elastic constants
- G01N2203/0075—Strain-stress relations or elastic constants
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/025—Geometry of the test
- G01N2203/0252—Monoaxial, i.e. the forces being applied along a single axis of the specimen
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/026—Specifications of the specimen
- G01N2203/0262—Shape of the specimen
- G01N2203/0266—Cylindrical specimens
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/067—Parameter measured for estimating the property
- G01N2203/0676—Force, weight, load, energy, speed or acceleration
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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Abstract
The invention discloses a method for testing the one-dimensional dynamic compression force and electricity characteristics of a piezoelectric material, which is characterized in that a cylindrical piezoelectric material test piece is coaxially placed into a one-dimensional dynamic compression test device of the Hopkinson after insulation treatment, and a lead is connected to an incident rod and a transmission rod and grounded; the piezoelectric material test piece compression impact test device has the advantages that during the impact compression test, higher voltage generated by the special piezoelectric effect of the piezoelectric material is grounded, interference to the acquisition of strain signals of the incident rod and the transmission rod is avoided, and the acquired test data has effectiveness during the compression impact test of the piezoelectric material test piece; and the resistor is connected in parallel on the test piece, and the dynamic force-electricity response verification of the piezoelectric material can be carried out by collecting the voltages at two ends of the test piece, so that the change rule of the force-electricity dynamic performance of the piezoelectric material test piece under impact load can be obtained.
Description
Technical Field
The invention relates to a method for testing performance characteristics of a piezoelectric material, in particular to a method for testing one-dimensional dynamic compression force electric characteristics of a Hopkinson of the piezoelectric material.
Background
Along with the large-scale use of concrete in civil engineering and architectural engineering, an intelligent detection system is adopted to implement on-line health detection and prediction on a major civil engineering structure, and the research progress in the aspects of composition and preparation, testing and characterization, performance and regulation, mechanism and model, engineering application and the like of an intelligent material system has become the research direction of the front edge of the civil engineering field in the global scope. The piezoelectric material in the intelligent material, in particular to a cement-based piezoelectric composite material, has higher piezoelectric strain coefficient, dielectric constant and interface compatibility, and has the advantages of high response speed, high measurement precision, stable performance and good durability, so that the intelligent material has the attribute of excellent health detection. Knowledge of the mechano-electrical response of piezoelectric materials under impact loading conditions would greatly facilitate engineering applications and engineering of these materials.
The Hopkinson separation type compression bar test technology has been 70 years old since 1949 by Kolsky invention, and has become one of the main means for measuring the dynamic mechanical properties of materials. The research of the microstructure of the piezoelectric brittle material (such as quartz, piezoelectric ceramic, piezoelectric composite material and the like), the evolution of damage and the dynamic constitutive property of the material has become a interdisciplinary frontier research hotspot of common attention in the current force and material industries. However, due to the special piezoelectric effect of the piezoelectric material, larger pulse voltage is generated on two end faces of the piezoelectric material during impact compression test, signal acquisition of the strain gauge is interfered, and effective signals cannot be acquired by the strain gauge, so that measurement of the piezoelectric material in the force-electricity characteristics under impact load is affected.
Disclosure of Invention
The invention aims to provide a Hopkinson one-dimensional dynamic compression force-electricity characteristic test method of a piezoelectric material, which is used for accurately measuring the force-electricity characteristic of the piezoelectric material under impact load and ensuring the effectiveness of collected force-electric signals.
The technical scheme adopted for solving the technical problems is as follows: the test method of the Hopkinson one-dimensional dynamic compression force-electricity characteristic of the piezoelectric material comprises the following specific steps:
(1) Respectively fixing conductive sheets on two end surfaces of a cylindrical piezoelectric material test piece, pasting an insulating film on the outer side of the conductive sheets, and coaxially placing the piezoelectric material test piece subjected to insulation treatment into a Hopkinson one-dimensional dynamic compression test device;
(2) The two conductive plates are respectively connected with an oscilloscope by leads, and a resistor (R) is connected in parallel with the oscilloscope 1 ）；
(3) Respectively sticking strain gauges on an incident rod and a transmission rod of the test device, and connecting the strain gauges with a super dynamic strain gauge;
(4) The fixed points of the wires on the incidence rod or the transmission rod are positioned between the test piece and the corresponding strain gauge, and the wires are connected to form a loop and then grounded;
(5) The impact rod impacts the incident rod, one-dimensional stress wave reaches the piezoelectric material test piece through the incident rod, one part forms reflected wave to propagate back to the incident rod, the other part propagates to the transmission rod through the test piece to form transmitted wave, and the strain gauge on the incident rod measures the incident wave signalε i (t) And reflected wave signalsε r (t) The strain gauge on the transmission rod measures the transmitted wave signalε t (t) The super dynamic strain gauge records the time-dependent signal of the strain in the incident and transmission rods, while the oscilloscope records the resistance (R 1 ) Current I (t) and voltage V (t) at (I);
(6) Obtaining stress time course of piezoelectric material test piece by stress wave theoryTime course of strainStrain rateThe relation of (2) is:
wherein: e (E) 0 、C 0 、A 0 The elastic modulus, the elastic wave velocity and the cross-sectional area of the incident rod or the transmission rod are respectively represented; as and Ls respectively represent the initial cross-sectional area and the initial length of the piezoelectric material test piece, and the stress-strain curve of the piezoelectric material test piece is obtained after calculation through the relational expression;
(7) Obtaining the electric displacement D (t) generated by the piezoelectric material test piece under the impact load through the relation:
wherein: q (t) represents discharge charge of two ends of the piezoelectric material test piece under impact load, and R is resistance R 1 Resistance value of (2);
(8) Changing the impact speed of the impact rod, and repeating the steps (5) - (7) to obtain stress-strain curves of the piezoelectric material test piece under different strain rates and electric displacement D (t) of the piezoelectric material test piece under different impact loads, and fitting the stress and the electric displacement of the piezoelectric material test piece under different impact loads for a plurality of times to obtain a stress-electric displacement change curve, wherein the slope of a linear section of the stress-electric displacement change curve is the dynamic sensitivity K of the piezoelectric material test piece d Expressed as:。
further, the conducting strip is aluminum foil and is adhered and fixed with the end face of the piezoelectric material test piece through conductive silver adhesive.
Further, the insulating film is a polyimide film with the thickness of 0-0.35 mm.
Further, the Hopkinson one-dimensional dynamic compression test device comprises an impact rod, an incident rod and a transmission rod which are coaxially and sequentially arranged, wherein the incident rod and the transmission rod are identical in material and size, and a piezoelectric material test piece is positioned between the incident rod and the transmission rod and is coaxially attached to each other.
Further, two strain gauges are respectively adhered to the incident rod and the transmission rod, and the two strain gauges are arranged on the surface of the incident rod or the transmission rod in a vertically opposite mode.
Further, the lead is fixed at the edge of the outer circumferential surface of one end of the incidence rod or the transmission rod facing the piezoelectric material test piece.
Compared with the prior art, the invention has the advantages that:
(1) The lead wires are connected to the incidence rod and the transmission rod and grounded, so that higher voltage generated by the special piezoelectric effect of the piezoelectric material is grounded during impact compression test, interference to the acquisition of strain signals of the incidence rod and the transmission rod is avoided, and the acquired test data have effectiveness during the compression impact test of the piezoelectric material test piece;
(2) The test piece is insulated, so that the interference of current generated by the piezoelectric material in the impact compression test on the acquisition of the strain gauge signal is further avoided, the test piece is connected with the resistor in parallel, and the dynamic force-electricity response verification of the piezoelectric material can be performed by acquiring the voltages at two ends of the test piece, so that the change rule of the dynamic force-electricity performance of the piezoelectric material test piece under the impact load can be obtained.
Drawings
FIG. 1 is a schematic view of the installation of a test piece of the present invention in a test apparatus;
FIG. 2 is a schematic diagram of the structure of a piezoelectric material test piece after insulation treatment according to the present invention;
FIG. 3 is a schematic diagram of the loading wave waveform (incident wave + reflected wave) in the incident beam of the present invention;
FIG. 4 is a schematic representation of a transmitted wave waveform on a transmission rod of the present invention;
FIG. 5 is a graph showing stress-strain curves for test pieces at different strain rates according to the present invention;
FIG. 6 is a graph showing the electrical displacement time of a test piece according to the present invention;
FIG. 7 is a graph showing the stress-electrical displacement variation of a test piece according to the present invention.
Detailed Description
The invention is described in further detail below with reference to the embodiments of the drawings.
As shown in the figure, the Hopkinson one-dimensional dynamic compression force electric characteristic test method of the piezoelectric material comprises the following specific steps:
(1) The two end surfaces of a cylindrical piezoelectric material test piece 1 are respectively stuck with a fixed conductive sheet 2 through conductive silver adhesive, an insulating film 3 is stuck on the outer side of the conductive sheet 2, then the piezoelectric material test piece 1 subjected to insulation treatment is coaxially put into a Hopkinson one-dimensional dynamic compression test device, the Hopkinson one-dimensional dynamic compression test device comprises an impact rod 4, an incident rod 5 and a transmission rod 6 which are coaxially and sequentially arranged, the materials and the sizes of the incident rod 5 and the transmission rod 6 are the same, and the piezoelectric material test piece 1 is positioned between the incident rod 5 and the transmission rod 6 and is coaxially stuck with the transmission rod 6;
(2) The two conducting strips 2 are respectively connected with an oscilloscope 7 through leads, and a resistor R is connected in parallel with the oscilloscope 7 1 ；
(3) Two strain gauges 8 are respectively stuck on the incidence rod 5 and the transmission rod 6, the two strain gauges 8 are arranged on the surface of the incidence rod 5 or the transmission rod 6 in a vertically opposite way, and the strain gauges 8 are connected with a super dynamic strain gauge (not shown in the figure);
(4) The lead wires 9 are respectively fixed on the incidence rod 5 and the transmission rod 6, the fixed points of the lead wires 9 on the incidence rod or the transmission rod are positioned between the test piece 1 and the corresponding strain gauge 8, and the two lead wires 9 are connected to form a loop and then grounded;
(5) The impact rod 4 impacts the incidence rod 5, one-dimensional stress wave reaches the piezoelectric material test piece 1 through the incidence rod 5, one part forms reflected wave to propagate back to the incidence rod 5, the other part propagates to the transmission rod 6 through the test piece 1 to form transmitted wave, and the strain gauge 8 on the incidence rod 5 measures the incident wave signalε i (t) And reflected wave signalsε r (t) The strain gauge 8 on the transmission rod 6 measures the transmitted wave signalε t (t) The super dynamic strain gauge records the strain in the incident rod 5 and the transmission rod 6The time-dependent signal is recorded by the oscilloscope 7 in the current measuring mode 1 Current I (t) and voltage V (t) at (I);
(6) Obtaining the stress time course of the piezoelectric material test piece 1 by stress wave theoryTime course of strainStrain rateThe relation of (2) is:
wherein: e (E) 0 、C 0 、A 0 The elastic modulus, the elastic wave velocity and the cross-sectional area of the incident beam 5 or the transmission beam 6 are shown, respectively; as and Ls respectively represent the initial cross-sectional area and the initial length of the piezoelectric material test piece 1, and the stress-strain curve of the piezoelectric material test piece 1 is obtained after the calculation of the relational expression;
(7) The electrical displacement D (t) generated by the piezoelectric material test piece 1 under the impact load is obtained through the relation:
wherein: q (t) represents discharge charge of two ends of the piezoelectric material test piece 1 under impact load, and R is resistance R 1 Resistance value of (2);
(8) Changing the impact speed of the impact rod 4, and repeating the steps (5) - (7) to obtain stress-strain curves of the piezoelectric material test piece 1 under different strain rates (namely different impact speeds) and electric displacement D (t) of the piezoelectric material test piece 1 under different impact loads, and fitting the stress and the electric displacement of the piezoelectric material test piece 1 under multiple different impact loads to obtain a stress-electric displacement change curve, wherein the slope of the linear section of the stress-electric displacement change curve is the dynamic sensitivity K of the piezoelectric material test piece d Expressed as:。
in the above embodiment, the conductive sheet 2 may be an aluminum foil; the insulating film 3 may be a polyimide film having a thickness of 0 to 0.35mm. In addition, the fixing point of the lead 9 on the incidence rod 5 or the transmission rod 6 can be as close to the test piece 1 as possible, so that a current loop can be formed in advance, interference of current on electric signal acquisition of the strain gauge 8 stuck on the incidence rod 5 and the transmission rod 6 is avoided, and even the lead 9 can be fixed at the edge of the outer circumference of one end of the incidence rod 5 or the transmission rod 6 facing the piezoelectric material test piece 1.
The following is a feasibility verification of the above test method:
taking an impact rod 1, an incident rod 2 and a transmission rod 3 with diameters of 14.5mm, wherein the lengths of the impact rod 1, the incident rod 2 and the transmission rod 3 are respectively 300mm, 1500mm and 1500mm, the piezoelectric material test piece 1 is made of piezoelectric ceramics, the size of the test piece 1 is phi 10mm multiplied by 5mm, and the resistor R is formed by the piezoelectric ceramics 1 The resistance of (2) is 5 ohms, the conducting strip adopts aluminum foil with the thickness of 20 mu m, and the conducting strip is flatly bonded on the end face of the test piece 1 through conducting silver colloid, so that the problem of uneven stress of the test piece in the test process caused by uneven end face is avoided, and then an insulating film is flatly adhered to the outer side of the conducting strip.
The striking rod 4 strikes the incident rod 5, and when the load of the incident wave is transmitted to the test piece 1, the reflected wave is propagated into the incident rod 5 and into the transmission rod 6Transmitting the transmitted wave, and measuring the incident wave signal by the strain gauge 8 on the incident beam 5ε i (t) And reflected wave signalsε r (t) The strain gauge 8 on the transmission rod 6 measures the transmitted wave signalε t (t) As shown in fig. 3 and 4, the stress-strain curve of the piezoelectric material test piece 1 is then obtained by calculation of the relational expression, as shown in fig. 5. Meanwhile, in the impact compression process, the oscilloscope 7 measures the resistance R 1 The electric current I (t) and the voltage V (t) are obtained by the relational expression, and the electric displacement D (t) generated by the piezoelectric material test piece 1 under the impact load is obtained as shown in fig. 6.
Changing the impact speed of the impact rod 4 for a plurality of times, and repeating the steps (5) - (7) in the method to obtain stress-strain curves of the piezoelectric material test piece 1 under different strain rates (namely different impact speeds), as shown in fig. 5; and the electric displacement D (t) generated by the piezoelectric material test piece 1 under different impact loads, and fitting the stress and the electric displacement generated by the piezoelectric material test piece 1 under different impact loads for a plurality of times to obtain a change curve of stress-electric displacement, as shown in fig. 7. Through the verification, the test method provided by the invention is proved to be accurate and effective in measuring the electromechanical properties of the piezoelectric material under impact compression, and is beneficial to researching the dynamic constitutive properties of the piezoelectric material.
The protection scope of the present invention includes, but is not limited to, the above embodiments, the protection scope of which is subject to the claims, and any substitutions, modifications, and improvements made by those skilled in the art are within the protection scope of the present invention.
Claims (6)
1. The test method of the Hopkinson one-dimensional dynamic compression force-electricity characteristic of the piezoelectric material is characterized by comprising the following specific steps of:
(1) Respectively fixing conductive sheets on two end surfaces of a cylindrical piezoelectric material test piece, pasting an insulating film on the outer side of the conductive sheets, and coaxially placing the piezoelectric material test piece subjected to insulation treatment into a Hopkinson one-dimensional dynamic compression test device;
(2) The two conductive sheets are respectively connected with the oscillography through the lead wiresThe device is connected with an oscilloscope in parallel with a resistor R 1 ；
(3) Respectively sticking strain gauges on an incident rod and a transmission rod of the test device, and connecting the strain gauges with a super dynamic strain gauge;
(4) The fixed points of the wires on the incidence rod or the transmission rod are positioned between the test piece and the corresponding strain gauge, and the two wires are connected to form a loop and then grounded;
(5) The impact rod impacts the incident rod, one-dimensional stress wave reaches the piezoelectric material test piece through the incident rod, one part forms reflected wave to propagate back to the incident rod, the other part propagates to the transmission rod through the test piece to form transmitted wave, and the strain gauge on the incident rod measures the incident wave signalε i (t) And reflected wave signalsε r (t) The strain gauge on the transmission rod measures the transmitted wave signalε t (t) The super dynamic strain gauge records the time-dependent change signals of strain in the incident rod and the transmission rod, and meanwhile, the oscilloscope records the resistance R in a current measurement mode 1 Current I (t) and voltage V (t) at (I);
(6) Obtaining stress time course of piezoelectric material test piece by stress wave theoryTime course of strain->Strain rate->The relation of (2) is:
wherein: e (E) 0 、C 0 、A 0 The elastic modulus, the elastic wave velocity and the cross-sectional area of the incident rod or the transmission rod are respectively represented; as and Ls respectively represent the initial cross-sectional area and the initial length of the piezoelectric material test piece, and the stress-strain curve of the piezoelectric material test piece is obtained after calculation through the relational expression;
(7) Obtaining the electric displacement D (t) generated by the piezoelectric material test piece under the impact load through the relation:
wherein: q (t) represents discharge charge of two ends of the piezoelectric material test piece under impact load, and R is resistance R 1 Resistance value of (2);
(8) Changing the impact speed of the impact rod, and repeating the steps (5) - (7) to obtain stress-strain curves of the piezoelectric material test piece under different strain rates and electric displacement D (t) of the piezoelectric material test piece under different impact loads, and fitting the stress and the electric displacement of the piezoelectric material test piece under different impact loads for a plurality of times to obtain a stress-electric displacement change curve, wherein the slope of a linear section of the stress-electric displacement change curve is the dynamic sensitivity K of the piezoelectric material test piece d Expressed as:。
2. the method for testing the hopkinson one-dimensional dynamic compression mechatronic characteristics of a piezoelectric material according to claim 1, characterized by: the conducting strip is aluminum foil and is adhered and fixed with the end face of the piezoelectric material test piece through conductive silver adhesive.
3. The method for testing the hopkinson one-dimensional dynamic compression mechatronic characteristics of a piezoelectric material according to claim 1, characterized by: the insulating film is a polyimide film with the thickness of 0-0.35 mm.
4. The method for testing the hopkinson one-dimensional dynamic compression mechatronic characteristics of a piezoelectric material according to claim 1, characterized by: the Hopkinson one-dimensional dynamic compression test device comprises an impact rod, an incident rod and a transmission rod which are coaxially and sequentially arranged, wherein the incident rod and the transmission rod are identical in material and size, and a piezoelectric material test piece is positioned between the incident rod and the transmission rod and is coaxially attached to each other.
5. The method for testing the hopkinson one-dimensional dynamic compression mechatronic characteristics of a piezoelectric material according to claim 1, characterized by: two strain gauges are respectively adhered to the incident rod and the transmission rod, and the two strain gauges are arranged on the surface of the incident rod or the transmission rod in a vertically opposite mode.
6. The method for testing the hopkinson one-dimensional dynamic compression mechatronic characteristics of a piezoelectric material according to claim 1, characterized by: the lead is fixed at the edge of the outer circumferential surface of one end of the incident rod or the transmission rod facing the piezoelectric material test piece.
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