CN115409182A - Quantum chip testing method, system, storage medium and quantum computer - Google Patents
Quantum chip testing method, system, storage medium and quantum computer Download PDFInfo
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Abstract
The application discloses a quantum chip testing method, a system, a storage medium and a quantum computer, wherein the method comprises the following steps: receiving an experiment process configuration instruction; acquiring experiment parameters of each experiment flow corresponding to the experiment flow configuration instruction; responding to an experiment operation instruction, and applying a test signal corresponding to the experiment parameter to the quantum chip; and responding to the first display instruction, and displaying a test result fed back by the quantum chip based on the test signal. The method and the device can provide the visualization of the experiment parameter configuration and the test result of the experiment process through the interface, and improve the operation efficiency and the user experience.
Description
Technical Field
The application belongs to the field of quantum computing, and particularly relates to a quantum chip testing method, a quantum chip testing system, a quantum chip testing storage medium and a quantum computer.
Background
In the prior art, a parameter testing process for a quantum chip is generally performed after a tester manually configures test parameters of a testing device. Specifically, the tester needs to manually and frequently set various test parameters of the quantum measurement and control instrument and then manually measure the parameters, and after the measurement data of each experimental process is frequently collected, the test result is analyzed, so that the method is time-consuming and labor-consuming, and the test efficiency is influenced.
Disclosure of Invention
The application aims to provide a quantum chip testing method, a quantum chip testing system, a quantum chip testing storage medium and a quantum computer, so that the defects in the prior art are overcome, experimental parameter configuration and testing results of an experimental process can be visualized through an interface, and the operating efficiency and user experience are improved.
The technical scheme of the application is as follows:
one aspect of the present application provides a method for testing a quantum chip, the method comprising:
receiving an experiment process configuration instruction; acquiring experiment parameters of each experiment flow corresponding to the experiment flow configuration instruction; responding to an experiment operation instruction, and applying a test signal corresponding to the experiment parameter to the quantum chip; and responding to the first display instruction, and displaying a test result fed back by the quantum chip based on the test signal.
The method as described above, further, the experimental parameters include a channel number and channel parameters, and the step of applying the test signal corresponding to the experimental parameters to the quantum chip includes: and applying a test signal corresponding to the channel parameter to a qubit corresponding to the channel number on the quantum chip.
The method as described above, further the applying a test signal corresponding to the channel parameter to the qubit on the quantum chip corresponding to the channel number includes: sequentially applying the test signals to the quantum bits corresponding to the channel numbers on the quantum chips; or simultaneously applying the test signal to the qubits on the quantum chip corresponding to the channel numbers.
The method as described above, further, the channel parameters include threshold information and step information, and the applying a test signal corresponding to the channel parameters to the qubit on the quantum chip corresponding to the channel number includes: acquiring the channel number; and sequentially generating corresponding test signals according to the threshold information and the step length information and outputting the test signals to the quantum bits corresponding to the channel numbers.
The method as described above, further comprising: and responding to the second display instruction, and displaying the real-time test result fed back by the quantum chip based on the corresponding test signal.
The method as described above, further comprising: and generating a corresponding parameter configuration file based on the test result.
Another aspect of the present application provides a quantum chip test system, including: the instruction configuration module is used for receiving an experiment flow configuration instruction of a quantum chip test experiment; the acquisition module is used for acquiring the experiment parameters of each experiment flow corresponding to the experiment flow configuration instruction; the test module is used for responding to an experiment operation instruction and applying a test signal corresponding to the experiment parameter to the quantum chip; and the display module is used for responding to the first display instruction and displaying the test result fed back by the quantum chip based on the test signal.
Yet another aspect of the application provides a computer-readable storage medium comprising a stored computer program, wherein the computer program, when executed by a processor, controls an apparatus in which the storage medium is located to perform the method of any one of claims 1 to 6.
Yet another aspect of the present application provides a quantum chip test apparatus, including: a memory for storing a computer program; a processor for implementing the method of any one of claims 1 to 6 when executing the computer program.
A further aspect of the application provides a quantum computer comprising a quantum chip testing apparatus or a quantum chip testing system as described above, or which implements quantum chip testing according to any of the methods described above.
Compared with the prior art, the method and the device have the advantages that the experiment parameters of the corresponding experiment processes are obtained by receiving the experiment program configuration instructions, the experiment parameters of the experiment processes can be directly displayed and set in the interface, the parameters of a testing instrument are prevented from being repeatedly set, the operation is simple, and the workload is small; and then responding to the test operation instruction, applying a test signal corresponding to the experiment parameter to the quantum chip, testing the parameter of the quantum chip, and displaying the test result in an interface form, so that a user can visually obtain the test result of the quantum chip, and the test efficiency and the user experience are improved.
Drawings
FIG. 1 is a diagram illustrating a method for testing a quantum chip according to an embodiment of the present disclosure;
fig. 2 is a schematic diagram of a channel numbering configuration according to an embodiment of the present disclosure;
fig. 3 is a schematic diagram of a channel parameter configuration according to an embodiment of the present application;
FIG. 4 is a schematic diagram of a test signal output according to an embodiment of the present disclosure;
fig. 5 is a schematic diagram illustrating a real-time test result of a quantum chip according to an embodiment of the present disclosure;
fig. 6 is a schematic diagram of a parameter configuration file of a quantum chip according to an embodiment of the present disclosure;
fig. 7 is a structural diagram of a quantum chip system according to an embodiment of the present disclosure;
fig. 8 is a structural diagram of a quantum chip device according to an embodiment of the present disclosure.
Description of reference numerals: the method comprises the following steps of 1-a quantum chip testing device, 10-an instruction configuration module, 11-an interaction module, 12-a processor, 13-a memory, 20-an acquisition module, 30-a testing module and 40-a display module.
Detailed Description
The embodiments described below with reference to the accompanying drawings are exemplary only for explaining the present application and are not construed as limiting the present application.
In the field of quantum computers, quantum chips are the core components of quantum computers, just like CPUs are in place in traditional computers. With the continuous research advance of the quantum computing related technology, the number of qubits on a quantum chip is also increasing year by year, and it is expected that larger-scale quantum chips will appear later. The quantum chip has a large number of performance parameters, each performance parameter needs to pass through one or more experimental procedures during testing, and each experimental procedure contains a large number of experimental parameters.
In the initial research stage, the inventor manually sets the performance parameters of the quantum measurement and control instrument according to different performance parameter test requirements of the quantum chip, tests and represents the parameters of each quantum bit on the quantum chip one by one, the workload is very large, and the test work needs 3-5 days for a 6-bit quantum chip. Through continuous test summarization and improvement of the inventor of the application, a new test method of the quantum chip is provided.
As shown in fig. 1, an embodiment of the present application provides a quantum chip testing method, including the following steps:
s100, receiving an experiment flow configuration instruction;
specifically, the experimental processes are processes for testing performance parameters of the quantum chip, such as a cavity frequency spectrum experiment for testing a frequency parameter of a read cavity on the quantum chip, a bit spectrum experiment for testing a frequency parameter of a qubit, a Ramsey experiment for testing a relaxation time of the qubit, and the like, and the experimental processes are preset and can be selected through an experimental process interface. When a user needs to test the performance parameters of the quantum chip, an experiment flow corresponding to the performance parameters is selected, namely an experiment flow configuration instruction is sent.
S200, acquiring experiment parameters of each experiment flow corresponding to the experiment flow configuration instruction;
s300, responding to an experiment operation instruction, and applying a test signal corresponding to the experiment parameter to the quantum chip;
specifically, each experiment flow configuration instruction includes experiment parameters of an experiment flow, that is, parameters of a test signal that needs to be applied to the quantum chip when testing performance parameters of the quantum chip. The test signal is output by the measurement and control instrument, the experimental parameter is the configuration parameter of the measurement and control instrument, and the measurement and control instrument outputs the test signal corresponding to the configuration parameter to the quantum chip by configuring the configuration parameter of the measurement and control instrument. And automatically completing the configured experimental process by receiving an operation instruction sent by a user. Through the experiment parameter of directly configuring the experiment flow at software operation interface, compare in directly carrying out the parameter to observing and controling the instrument and join in marriage, easy operation is and directly perceived, is difficult to the maloperation to appear, triggers experimental operation instruction through the instruction mode moreover, later can obtain the test result, need not carry out other operations, has improved efficiency of software testing.
And S400, responding to the first display instruction, and displaying a test result fed back by the quantum chip based on the test signal.
Specifically, after the test signals corresponding to the experiment parameters of the experiment processes are transmitted to the quantum chip, the test results after the operation of each experiment process, namely the performance parameters of the quantum chip, can be obtained by acquiring the feedback signals output by the quantum chip and processing the feedback signals, and the performance parameters are displayed on a software interface through the display instructions, so that the direct reading of a user is facilitated.
The experimental process of the performance parameters of the quantum chip is packaged in the form of a software package, the software package of the experimental process is called through a software interface and displayed in the software interface, a user sets the experimental parameters of the experimental process in the software interface, and after the experimental parameters are set, an experimental operation instruction is triggered, so that a test result displayed on the interface can be obtained. In the whole operation process, the operation is simple and visual. Especially when the method is applied to batch test of the quantum chips, repeated modification is not needed, and the test can be repeated.
As shown in fig. 2 and fig. 3, as an implementation manner, the experimental parameters in the embodiment of the present application include a channel number and a channel parameter, and the step of applying the test signal corresponding to the experimental parameters to the quantum chip includes: applying a test signal corresponding to the channel parameter to a qubit on the quantum chip corresponding to the channel number.
Specifically, the test signal is output by the measurement and control instrument, because the integration has a plurality of qubits on the quantum chip, all need exert the test signal through the measurement and control instrument when testing the parameter of every qubit, this application inventor selects the measurement and control instrument of multichannel when selecting the measurement and control instrument, and measurement and control instrument has a plurality of output channels promptly, and every output channel all has the channel number, can set up according to the qubit that awaits measuring. Each output channel can output a test signal to one quantum bit on the quantum chip, namely, the channel number of the measurement and control instrument corresponds to the bit number on the quantum chip. When a user needs to test a quantum bit on the quantum chip, the channel number of the measurement and control instrument corresponding to the bit number is selected, and parameters of a test signal output by the channel number are set.
Illustratively, as shown in the "channel" toolbar of fig. 2, "Z _ dc _ channel" represents a channel for providing a dc voltage signal to the Z control line of a qubit, "Z _ flux _ channel" represents a channel for providing a pulse signal to the Z control line of a qubit, "XY _ channel" represents a channel for providing a microwave signal to the XY control line of a qubit, and "readout _ channel" represents a channel for providing a read signal to the read bus of a qubit. The direct current voltage signal and the pulse signal provided on the Z control line are used for controlling the frequency parameter of the qubit, the microwave signal provided on the XY control line is used for controlling the quantum state information of the qubit, and the reading signal provided on the reading bus is used for reading the quantum state information of the qubit. It should be noted that, as mentioned above, the test of the quantum chip includes a plurality of experimental procedures and a very large number of experimental parameters, and this example only illustrates the channel number setting interface of one of the experimental procedures, and other identical or similar setting interfaces and setting methods are all within the scope of the present application.
For example, as shown in FIG. 3, the "experimental param" tool column is an experimental parameter column, the "drive power" below represents the power parameter of the read signal provided on the read bus, and the "z amp" represents the amplitude parameter of the read signal provided on the read bus; the "Gaussian Square" toolbar is a waveform parameter setting column of the applied read signal, below which "time" represents a time duration parameter of the waveform of the applied read signal on the read bus, "amp" represents the amplitude of the waveform of the applied read signal, and "sigma" represents the number of times the waveform of the applied read signal is applied. It should be noted that, as mentioned above, the test of the quantum chip includes a plurality of experimental procedures and a very large number of experimental parameters, and this example only illustrates the channel parameter setting interface of one of the experimental procedures, and other identical or similar setting interfaces and setting methods are all within the scope of the present application.
As an implementation manner, in the embodiment of the present application, the step of applying the test signal corresponding to the channel parameter to the qubit corresponding to the channel number on the quantum chip includes: sequentially applying the test signals to the quantum bits corresponding to the channel numbers on the quantum chips; or simultaneously applying the test signal to the qubits on the quantum chip corresponding to the channel numbers.
Specifically, the measurement and control instrument outputs the test signal to the qubit through the port of each channel number, and when the experimental process is operated, one qubit on the quantum chip can be tested, that is, the test signal is output only through the port of the channel number of the measurement and control instrument corresponding to the bit number. In addition, a plurality of quantum bits can also be tested simultaneously, that is, according to the experiment parameters corresponding to the experiment flow configuration instruction of the user, the channel number of the test signal required to be output by the measurement and control instrument and the test signal corresponding to the channel parameter are determined, and the test signals are output to the quantum bits corresponding to the channel number on the quantum chip simultaneously, so that the simultaneous testing of the plurality of quantum bits is realized, and the measurement efficiency of the quantum chip can be effectively improved.
As shown in fig. 4, as an implementation manner, the applying a test signal corresponding to the channel parameter to a qubit on the quantum chip corresponding to the channel number includes:
step S310: acquiring the channel number;
step S320: and sequentially generating corresponding test signals according to the threshold information and the step length information and outputting the test signals to the quantum bits corresponding to the channel numbers.
With reference to the channel parameter configuration interface shown in fig. 3, the channel parameters are parameters of the test signals output by each channel of the measurement and control instrument, such as the amplitude, the power, the duration, the phase, and the like, and when the test signals are set based on the parameters, a fixed value of the parameters is determined, so that a corresponding test signal can be obtained. When testing the quantum chip, the inventor sets the channel parameters as traversal parameters including threshold information and step length information. That is, a parameter is set to a combination consisting of a plurality of sub-parameters within a fixed threshold range through threshold information, and each sub-parameter has a fixed step interval, and a plurality of test signals are correspondingly formed. And applying the test signals corresponding to the sub-parameters to the quantum bits corresponding to the channel numbers on the quantum chips in sequence according to the step length information to obtain a plurality of test results. According to the method and the device, traversing test of the plurality of test signals is realized by setting the threshold information and the step length information, results corresponding to the plurality of test signals are obtained, the plurality of results are analyzed and processed, an accurate measurement result is obtained, and the test on the quantum chip is more accurate.
As shown in fig. 5, as an embodiment, the quantum chip testing method in the embodiment of the present application further includes: and responding to a second display instruction, and displaying a real-time test result fed back by the quantum chip based on the corresponding test signal. Specifically, when an experiment flow configuration instruction sent by a user is received to obtain experiment parameters of an experiment flow and test signals corresponding to the experiment parameters are output to the quantum chip to operate an experiment, a second display instruction sent by the user can be received to display a feedback implementation test result when the quantum chip operates the experiment flow on a software interface. By displaying the test result of the quantum chip in real time, a user can be helped to know the operation of the experimental flow in real time, and the user experience is improved.
As shown in fig. 6, as an embodiment, the quantum chip testing method in the embodiment of the present application further includes: and generating a corresponding parameter configuration file based on the test result. Specifically, when the test of the quantum chip is completed, the test result of the quantum chip generates a corresponding parameter configuration file for storage. The performance parameters of the quantum chip can be updated conveniently by updating the parameter configuration file when the quantum chip is used for quantum calculation or calibration. For example, the first column numbers 1-6 in fig. 6 represent 6 qubit numbers on the qubit chip, and the numerical value of one row corresponding to each qubit number represents the influence coefficient of the dc voltage signal applied to other qubits on the frequency parameter of the qubit. In addition, other parameters of the qubits can be stored by forming corresponding parameter configuration files through testing.
As shown in fig. 7, as an embodiment, an embodiment of the present application provides a quantum chip testing system, including: the instruction configuration module 10 is configured to receive an experiment flow configuration instruction of a quantum chip test experiment; an obtaining module 20, configured to obtain experiment parameters of each experiment flow corresponding to the experiment flow configuration instruction; the test module 30 is used for responding to an experiment operation instruction and applying a test signal corresponding to the experiment parameter to the quantum chip; and the display module 40 is used for displaying the test result fed back by the quantum chip based on the test signal.
Corresponding to the quantum chip testing method provided by the embodiment of the invention, the quantum chip testing system provided by the embodiment of the invention aims at the current quantum chip testing work, testers often need to manually set the performance parameters of a quantum measurement and control instrument according to different performance parameter testing requirements of a quantum chip, and test and represent the parameters of each quantum bit on the quantum chip one by one, so that the workload is very large, the testing efficiency is very low, the embodiment of the invention obtains the corresponding experimental parameters of each experimental process by receiving an experimental program configuration instruction, can directly display the experimental parameters and adjust the experimental parameters in an interface, avoids repeatedly setting the parameters of the testing instrument, and is simple to operate and small in workload; and then responding to the test operation instruction, applying a test signal corresponding to the experiment parameter to the quantum chip, testing the parameter of the quantum chip, and displaying the test result in an interface form, so that a user can visually obtain the test result of the quantum chip, and the test efficiency and the user experience are improved.
As shown in fig. 8, as an implementation manner, an embodiment of the present application provides a quantum chip testing device, in an embodiment, a quantum chip testing apparatus 1 may be a computer device, and quantum chip testing software is loaded on the computer device. The quantum chip testing device 1 comprises an interaction module 11, at least one processor 12 and a memory 13.
The interaction module 11 may include an input/output device of the apparatus, such as a display screen, a mouse, a keyboard, a touch screen, and the like, the interaction module 11 is configured to receive an input instruction and provide a configuration interface, for example, a user triggers a quantum chip test software icon on the computer apparatus, the display screen may provide the configuration interface of the quantum chip test, and the user may select different types of quantum chip test experiments on the configuration interface through the keyboard, the mouse, or the touch screen and input a parameter sweep configuration instruction for the quantum chip test experiments, so as to generate experiment parameter configurations for the quantum chip test.
The memory 13 is in communication connection with the at least one processor 12, the memory 13 stores instructions executable by the at least one memory 13, and when the instructions are executed by the at least one processor 12, the at least one processor 12 executes the quantum chip testing method, so that the quantum chip testing is realized, and the operation is simple and easy to realize.
As an implementation manner, the present application provides a computer-readable storage medium, where the computer-readable storage medium includes a stored computer program, where when the computer program is executed by the processor 12, the apparatus in the storage medium is controlled to execute any one of the above quantum chip testing methods.
Specifically, in the present embodiment, the above-mentioned storage medium may be configured to store a computer program for executing steps S10 to S40 below, wherein:
s100, receiving an experiment flow configuration instruction;
s200, acquiring experiment parameters of each experiment flow corresponding to the experiment flow configuration instruction;
s300, responding to an experiment operation instruction, and applying a test signal corresponding to the experiment parameter to the quantum chip;
and S400, responding to the first display instruction, and displaying the test result fed back by the quantum chip based on the test signal.
Specifically, in this embodiment, the storage medium may include, but is not limited to: a U-disk, a Read-Only Memory 13 (ROM), a Random Access Memory 13 (RAM), a removable hard disk, a magnetic disk, or an optical disk, and various media capable of storing computer programs.
As an implementation manner, an embodiment of the present application provides a quantum chip testing apparatus, including:
a memory 13 for storing a computer program;
and the processor 12 is used for realizing the quantum chip testing method when the computer program is executed.
As an implementation manner, an embodiment of the present application provides a quantum computer, where the quantum computer includes the above-mentioned quantum computer operating system, or the quantum computer implements a quantum chip test according to the above-mentioned method.
Compared with the prior art, the method and the device have the advantages that the experiment parameters of the corresponding experiment processes are obtained by receiving the experiment program configuration instructions, the experiment parameters can be directly displayed and adjusted in the interface, repeated setting of parameters of a testing instrument is avoided, the operation is simple, and the workload is small; and then responding to the test operation instruction, applying a test signal corresponding to the experiment parameter to the quantum chip to test the parameter of the quantum chip, and displaying the test result in an interface form, so that a user can visually obtain the test result of the quantum chip, and the test efficiency and the user experience are improved.
It should be appreciated that reference throughout this specification to "some embodiments," "an embodiment," or "an implementation" means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the present application. Thus, the appearances of the phrases "in some embodiments," "in one embodiment," or "in an embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising a component of' 8230; \8230;" does not exclude the presence of another like element in a process, method, article, or apparatus that comprises the element.
In the several embodiments provided in the present application, it should be understood that the disclosed method, apparatus, and system may be implemented in other ways. The above-described embodiments are merely illustrative, for example, the division of the modules and units is only one logical function division, and in actual implementation, there may be other division ways, such as: multiple units or components may be combined, or may be integrated into another system, or some features may be omitted, or not implemented. In addition, the coupling, direct coupling or connection between the components shown or discussed may be through some interfaces, indirect coupling or communication connection between devices or units, and may be electrical, mechanical or other forms.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units; can be located in one place or distributed on a plurality of network units; some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, all functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may be separately regarded as one unit, or two or more units may be integrated into one unit; the integrated unit can be realized in a form of hardware, or in a form of hardware plus a software functional unit.
Those of ordinary skill in the art will understand that: all or part of the steps for realizing the method embodiments can be completed by hardware related to program instructions, the program can be stored in a computer readable storage medium, and the program executes the steps comprising the method embodiments when executed; and the aforementioned storage medium includes: various media that can store program codes, such as a removable Memory device, a Read Only Memory (ROM) 13, a magnetic disk, and an optical disk.
Alternatively, the integrated units described above in the present application may be stored in a computer-readable storage medium if they are implemented in the form of software functional modules and sold or used as independent products. Based on such understanding, the technical solutions of the embodiments of the present application may be essentially implemented or portions thereof that contribute to the prior art may be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for enabling a device (which may be a computer, a server, etc.) that implements resource change to execute all or part of the methods described in the embodiments of the present application. And the aforementioned storage medium includes: various media that can store program code, such as removable storage devices, ROMs, magnetic or optical disks, etc.
The above description is only for the embodiments of the present invention, but the scope of the present invention is not limited thereto, and all equivalent embodiments modified or modified by the idea of the present invention should be within the scope of the present invention without departing from the spirit of the description and the drawings.
Claims (10)
1. A quantum chip testing method is characterized by comprising the following steps:
receiving an experiment process configuration instruction;
acquiring experiment parameters of each experiment flow corresponding to the experiment flow configuration instruction;
responding to an experiment operation instruction, and applying a test signal corresponding to the experiment parameter to the quantum chip;
and responding to the first display instruction, and displaying a test result fed back by the quantum chip based on the test signal.
2. The quantum chip testing method of claim 1, wherein the experimental parameters comprise a channel number and a channel parameter, and the step of applying the test signal corresponding to the experimental parameters to the quantum chip comprises:
and applying a test signal corresponding to the channel parameter to a qubit corresponding to the channel number on the quantum chip.
3. The method of claim 2, wherein the applying a test signal corresponding to the channel parameter to the qubit on the quantum chip corresponding to the channel number comprises:
sequentially applying the test signals to the quantum bits corresponding to the channel numbers on the quantum chips; or
And simultaneously applying the test signal to the quantum bit corresponding to the channel number on the quantum chip.
4. The quantum chip testing method of claim 2, wherein the channel parameters comprise threshold information and step information, and the applying the test signal corresponding to the channel parameters to the qubit on the quantum chip corresponding to the channel number comprises:
acquiring the channel number;
and sequentially generating corresponding test signals according to the threshold information and the step length information and outputting the test signals to the quantum bits corresponding to the channel numbers.
5. The quantum chip testing method of claim 1, further comprising:
and responding to a second display instruction, and displaying a real-time test result fed back by the quantum chip based on the corresponding test signal.
6. The quantum chip testing method of claim 1, further comprising:
and generating a corresponding parameter configuration file based on the test result.
7. A quantum chip test system, comprising:
the instruction configuration module is used for receiving an experiment flow configuration instruction of a quantum chip test experiment;
the acquisition module is used for acquiring the experiment parameters of each experiment flow corresponding to the experiment flow configuration instruction;
the test module is used for responding to an experiment operation instruction and applying a test signal corresponding to the experiment parameter to the quantum chip;
and the display module is used for responding to the first display instruction and displaying the test result fed back by the quantum chip based on the test signal.
8. A computer-readable storage medium, comprising a stored computer program, wherein the computer program, when executed by a processor, controls an apparatus in which the storage medium is located to perform the method of any one of claims 1 to 6.
9. A quantum chip test apparatus, comprising:
a memory for storing a computer program;
a processor for implementing the method of any one of claims 1 to 6 when executing the computer program.
10. A quantum computer comprising the quantum chip testing apparatus of claim 9 or the quantum chip testing system of claim 7, or the quantum computer implementing quantum chip testing according to the method of any one of claims 1 to 6.
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| CN106443242A (en) * | 2016-08-30 | 2017-02-22 | 江苏浩峰汽车附件有限公司 | Automatic test systematic framework for automobile electronic products and test method |
| CN110737209A (en) * | 2019-11-04 | 2020-01-31 | 成都锐能科技有限公司 | Control display assembly simulation method and device, electronic equipment and storage medium |
| CN112131065A (en) * | 2020-11-03 | 2020-12-25 | 珠海格力电器股份有限公司 | Method, device and system for verifying DAC (digital-to-analog converter) interface |
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