CN115308216A - Device and method for online detecting surface defects of aluminum profile - Google Patents
Device and method for online detecting surface defects of aluminum profile Download PDFInfo
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- CN115308216A CN115308216A CN202211243504.7A CN202211243504A CN115308216A CN 115308216 A CN115308216 A CN 115308216A CN 202211243504 A CN202211243504 A CN 202211243504A CN 115308216 A CN115308216 A CN 115308216A
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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Abstract
The device for detecting the surface defects of the aluminum profile on line comprises at least one group of detection components, wherein each group of detection components comprises a light source unit, a light path conversion unit, an imaging unit and a processing unit, the light source unit is used for emitting detection laser, and the detection laser irradiates the surface of an object to be detected and is reflected to form reflected laser; the light path conversion unit is positioned on the light paths of the detection laser and the reflected laser and is used for converting the light path of the reflected laser reflected by the object to be detected; the imaging unit is used for receiving the reflected laser emitted by the light path conversion unit and generating a gray image to be detected; the processing unit compares the gray values of each pixel point in the gray image to be detected and each pixel point in the standard gray image, and can quickly detect whether the surface of the section bar has defects.
Description
Technical Field
The application relates to the technical field of section bar detection, in particular to a device and a method for detecting surface defects of an aluminum section bar on line.
Background
In the related technical field, whether newly manufactured section bars and section bars for return field detection have defects on the surfaces or not needs to be detected, and the problems of too slow manual detection and inaccurate detection exist in the prior art.
Disclosure of Invention
The embodiment of the application provides a device and a method for detecting surface defects of an aluminum profile on line, which can be used for rapidly detecting whether the surface of the aluminum profile has defects.
In a first aspect, an embodiment of the present application provides an apparatus for online detection of surface defects of aluminum profiles, including at least one set of detection components, each set of detection components includes:
the light source unit is used for emitting detection laser, and the detection laser irradiates the surface of an object to be detected and is reflected to form reflected laser;
the light path conversion unit is positioned on the light paths of the detection laser and the reflected laser and is used for converting the light path of the reflected laser reflected by the object to be detected;
the imaging unit is used for receiving the reflected laser emitted by the light path conversion unit and generating a gray image to be detected;
and the processing unit is used for comparing the gray values of each pixel point in the gray image to be detected with the gray values of each pixel point in the standard gray image.
In some embodiments of the present application, the imaging unit comprises:
the thin film optical filter is arranged on a light path of the reflected laser, and the thin film optical filter can only pass light with the wavelength larger than 1100 nm;
and the imaging part is used for acquiring the reflected laser and generating a gray image to be detected, and is positioned on the rear side of the thin film optical filter along the light path of the reflected laser.
In some embodiments of the present application, the light source unit includes:
a light emitting member for emitting the detection laser;
the focusing piece is arranged on the light emitting side of the light emitting piece, is positioned on the light path of the detection laser, and is used for receiving the detection laser emitted by the light emitting piece and collecting the detection laser;
and the light homogenizing part is arranged on one side of the focusing part, which is far away from the light emitting part, is positioned on the light path of the detection laser and is used for receiving the detection laser emitted by the focusing part and homogenizing the detection laser.
In some embodiments of the present application, the detection laser emitted from the light emitting element has a wavelength greater than that of natural light.
In some embodiments of the present application, the optical path conversion unit includes:
the polarization splitting prism is arranged on the light outlet side of the light source unit and can transmit the light of the P polarization component and reflect the light of the S polarization component;
the 1/4 glass slide is arranged on one side, away from the light source unit, of the polarization splitting prism and can enable the phase angle of the detection laser and the reflected laser to rotate by 45 degrees;
the detection laser emitted by the light source unit sequentially transmits the polarization beam splitter prism and the 1/4 glass slide and irradiates the object to be detected, and the reflection laser reflected by the object to be detected transmits the 1/4 glass slide and irradiates the polarization beam splitter prism and is reflected to the imaging unit.
In a second aspect, an embodiment of the present application provides a method for detecting surface defects of an aluminum profile on line, including the following steps:
acquiring a standard gray scale image;
irradiating the surface of an object to be detected by using detection laser;
changing the light path of the reflected laser reflected by the surface of the object to be detected;
receiving the reflected laser to form a gray image to be detected
And comparing the gray-scale image to be detected with the standard gray-scale image.
In some embodiments of the present application, the obtaining the standard gray scale map comprises:
detecting a plurality of qualified sectional materials and forming a plurality of gray-scale images;
acquiring each pixel point in each gray scale image and endowing the gray scale value corresponding to each pixel point;
and calculating the average value of the pixel points in the gray level images to form a standard gray level image.
In some embodiments of the present application, the obtaining the standard gray scale map further includes:
the acquiring of the standard gray scale map further comprises:
detecting the object to be detected to obtain the gray-scale image to be detected;
acquiring each pixel point to be detected in the gray-scale image to be detected;
calculating the mean value of the gray values of all the pixels to be detected in the gray image to be detected and the mean value of the gray values of all the standard pixels in the standard gray image;
comparing the gray values of the pixel points to be detected in the gray image to be detected with the corresponding standard pixel points in the standard gray image, and comparing the mean value of the gray values of the pixel points to be detected in the gray image to be detected with the mean value of the gray values of the standard pixel points in the standard gray image;
if the difference value of the gray values of the pixel points to be detected in the gray image to be detected and the corresponding standard pixel points in the standard gray image is smaller than a first preset value, and the difference value of the mean value of the gray values of the pixel points to be detected in the gray image to be detected and the mean value of the gray values of the standard pixel points in the standard gray image is smaller than a second preset value, calculating the mean value of the pixel points to be detected in the gray image to be detected and the standard pixel points in the corresponding standard gray image and endowing the mean value of the pixel points to be detected and the standard pixel points in the standard gray image.
In some embodiments of the present application, the changing the optical path of the reflected laser light reflected by the surface of the object to be detected includes:
converting the reflected laser light into circularly polarized light from linearly polarized light by using a 1/4 wave plate;
a polarization beam splitter prism is used to reflect the reflected laser light of circular polarization component.
In some embodiments of the present application, the receiving the reflected laser light comprises: filtering the reflected laser light by using a thin film filter;
and (3) acquiring the reflected laser by using an imaging piece and generating a gray-scale image to be detected.
Based on the device for detecting the surface defect of the aluminum profile on line in the embodiment of the application, after the detection laser emitted by the light source unit irradiates the surface of the object to be detected, if the surface of the object to be detected has defects, such as scratches, bumps, paint (or part of paint falls off), rust and the like, the reflection amount of the detection laser at the defect position on the surface of the object to be detected will have differences, such as increased roughness, scratches, bumps, rust and the like, the detection laser generates diffuse reflection at the position, that is, the brightness of the reflection laser returning along the original path of the light path irradiated by the detection laser to the object to be detected will decrease, the light path conversion unit converts the light path of the reflection laser to enable the imaging unit to acquire the reflection laser and generate a gray-scale image to be detected, pixels with different colors are formed in the gray-scale image to be detected at different brightness positions of the reflection laser (the gray-scale value is larger when the brightness is brighter, the gray-scale value is smaller, the gray-scale value of each pixel to be detected in the gray-scale image is compared with the gray-scale value of each standard pixel in the corresponding to be detected, and the gray-scale image corresponding to be detected has the defect at the gray-scale value corresponding to be detected when the gray-scale image.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the embodiments or the prior art descriptions will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a schematic structural relationship diagram of an apparatus for online detecting surface defects of aluminum profiles in an embodiment of the present application;
fig. 2 is a schematic flow chart of a method for online detecting surface defects of an aluminum profile in an embodiment of the present application;
fig. 3 is a schematic flow chart illustrating a process of obtaining a standard gray scale map according to an embodiment of the present application.
Reference numerals: 10. a light source unit; 20. an optical path conversion unit; 21. a polarization splitting prism; 22. 1/4 wave plate; 30. an imaging unit; 40. an object to be detected; A. detecting laser; B. the laser light is reflected.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
Referring to fig. 1, a first aspect of the embodiments of the present application provides an apparatus for online detecting surface defects of an aluminum profile, which is capable of rapidly detecting whether the surface of the aluminum profile has defects.
It can be understood that the detection equipment of this application not only can be used for detecting the aluminium alloy, can all detect the section bar homoenergetic of arbitrary material, for example, steel section bar, plastic material or wooden section bar etc. and this application is particularly useful for the less section bar of roughness.
Referring to fig. 1, the apparatus for on-line detecting surface defects of an aluminum profile includes at least one group of detection assemblies, each group of detection assemblies includes a light source unit 10, a light source conversion unit, an imaging unit 30 and a processing unit, the light source unit 10 is configured to emit a detection laser a, and the detection laser a irradiates the surface of an object to be detected and is reflected to form a reflected laser B; the light path conversion unit 20 is positioned on the light paths of the detection laser A and the reflected laser B and is used for converting the light path of the reflected laser B reflected by the object to be detected; the imaging unit 30 is used for receiving the reflected laser B emitted by the optical path conversion unit 20 and generating a gray image to be detected; the processing unit compares the gray value of each pixel point in the gray image to be detected with the gray value of each pixel point in the standard gray image.
It will be appreciated that, because of the various shapes of the profiles, the profiles usually have multiple sides, and therefore, in some embodiments of the present application, the device for online detecting surface defects of aluminum profiles may include multiple detection assemblies, for example, when the profile is circular, the device for online detecting surface defects of aluminum profiles may include two sets of detection assemblies disposed oppositely, that is, the entire peripheral wall of the circular profile may be detected; for example, when the profile is triangular, the device for detecting the surface defects of the aluminum profile on line can comprise three groups of detection assemblies, and the three groups of detection assemblies are respectively arranged corresponding to three side surfaces of the triangular profile.
Based on the device for detecting defects on the surface of the aluminum profile, according to the embodiment of the present application, after the detection laser a emitted from the light source unit 10 irradiates the surface of the object 40 to be detected, if there is a defect on the surface of the object 40 to be detected, such as a scratch, a bump, paint (or a part of the paint surface falls off), rust, etc., there will be a difference in the reflection amount of the detection laser a at the defect on the surface of the object 40 to be detected, for example, the roughness of the scratch, the bump, the rust, etc. increases, the detection laser a will be diffusely reflected at this position, that is, the brightness of the reflected laser B returned along the original path of the light path from the detection laser a to the object 40 to be detected will decrease, the light path conversion unit 20 converts the light path of the reflected laser B, and then the imaging unit 30 obtains the reflected laser B to generate a to-be-detected gray map, pixels to be detected with different colors are formed in the to-be-detected gray map at different brightness positions of the reflected laser B (the gray value is larger when the brightness is brighter, and the gray value is smaller when the brightness is smaller), the gray value of each pixel to be detected in the to-be-detected gray map is compared with the gray value of each standard pixel in the corresponding standard gray map, and when the difference value between the gray value of each pixel to be detected in the to-be-detected gray map and the gray value of each standard pixel in the corresponding standard gray map exceeds a preset range value, the defect on the surface of the profile corresponding to the pixel to be detected at the position can be determined.
In some embodiments of the present application, the imaging unit 30 includes a thin film filter and an imaging element, the thin film filter is disposed on the optical path of the reflected laser light B, and the thin film filter can only pass light with a wavelength greater than 1100 nm; the imaging piece obtains the reflected laser B and generates a gray image to be detected, the gray image to be detected is located on the rear side of the thin film optical filter along the light path of the reflected laser B, the wavelength range of natural light is approximately 150nm-1100nm, the wavelength range of light visible to human eyes is approximately 200nm-760nm, and in order to avoid the influence of the natural light on a detection result, the thin film optical filter only passes light with the wavelength larger than 1100nm, so that the imaging piece only receives the reflected laser B and does not receive the natural light, and the gray image to be detected is only formed by the reflected laser B, and therefore the accuracy of the device for detecting the surface defects of the aluminum profile on line is improved.
The specific type of the imaging member is not limited in the embodiments of the present application, and in some embodiments of the present application, the imaging member may be a high frequency camera.
In some embodiments of the present application, the light source unit 10 includes a light emitting member for emitting the detection laser light a; the focusing part is arranged on the light emitting side of the light emitting part and is positioned on the light path of the detection laser A, and is used for receiving the detection laser A emitted by the light emitting part and collecting the detection laser A; the light homogenizing piece is arranged on one side of the focusing piece, which is far away from the light emitting piece, is positioned on a light path of the detection laser A, and is used for receiving the detection laser A emitted by the focusing piece and homogenizing the detection laser A.
In combination with the above-mentioned thin film filter, only light with a wavelength greater than 1100nm can pass through, and since the thin film filter is mostly used as an infrared filter, in some embodiments of the present application, the wavelength of the detection laser a emitted by the light emitting element is greater than that of natural light, specifically, the detection laser a is infrared with a wavelength greater than 1100nm, and correspondingly, the light emitting element may be configured as an infrared light emitter, for example, an infrared light emitting diode.
The focusing piece is used for gathering together detection laser A so that detection laser A gathers in, is convenient for detect laser A and is difficult for dispersing in long distance light path, can make the light beam that detects laser A edge in the transmission course promptly, and in some embodiments of this application, the focusing piece sets up to optic fibre focusing mirror or collimating lens.
Even light piece is used for making the light energy of everywhere in the detection laser A even, and light luminance is the same everywhere promptly, can understand, for the homogeneity that improves all places energy in the detection laser A, can set up a plurality of even light pieces in this application embodiment, and in some embodiments of this application, even light piece sets up to even piece of laser, laser homogenization DOE or even facula diffraction element etc..
Referring to fig. 1, in some embodiments of the present disclosure, the optical path conversion unit 20 includes a polarization beam splitter prism 21 and a 1/4 wave plate 22, where the polarization beam splitter prism 21 is disposed on the light emitting side of the light source unit 10, and is capable of transmitting the light of the P-polarization component and reflecting the light of the S-polarization component; the 1/4 glass slide is arranged on one side of the polarization beam splitter prism 21, which is far away from the light source unit 10, and can rotate the phase angle of the detection laser A and the reflected laser B by 45 degrees; the detection laser A emitted from the light source unit 10 sequentially transmits through the polarization beam splitter prism 21 and the 1/4 glass slide and irradiates to the object to be detected, and the reflected laser B reflected by the object to be detected transmits through the 1/4 glass slide and irradiates to the polarization beam splitter prism 21 and is reflected to the imaging unit 30.
The polarization beam splitter prism 21 is formed by gluing a pair of high-precision right-angle prisms, a polarization beam splitting dielectric film is plated on the oblique side of one prism, the polarization beam splitter prism 21 makes use of the property that when laser is incident at a Brewster angle, the transmissivity of P polarized light is 1, and the transmissivity of S polarized light is less than 1, so that the P polarized light completely penetrates through the polarization beam splitter prism 21 to form a light beam, the S polarized light is reflected to form a light beam, and the detection of the incident angle of the laser A, namely the difference of the Brewster angle, only influences the transmission amount of the polarization beam splitter prism 21 to the P polarized light and the refraction amount of the S polarized light; in order to maximize the transmission of the P-polarized light and the refraction of the S-polarized light, further, in some embodiments of the present application, the incident angle of the detection laser a is 90 °, that is, the detection laser a forms an included angle of 45 ° with the glue layer of the polarization splitting prism 21, at this time, the transmission of the P-polarized light and the refraction of the S-polarized light both reach 100%, so as to utilize the detection laser a maximally.
The phase angle of the P-polarized light transmitted through the polarization beam splitter prism 21 in the detection laser a is rotated by 45 ° after passing through the 1/4 wave plate 22, and then after the detection laser a irradiates the surface of the object to be detected and is reflected, the reflected laser B passes through the 1/4 wave plate 22 again, that is, the phase angle of the reflected laser B is rotated by 45 ° again to form S-polarized light, at this time, the P-polarized light caused by the polarization beam splitter prism 21 completely penetrates through the polarization beam splitter prism 21 to form a light beam, so that the S-polarized light is reflected to form a light beam, the polarization beam splitter prism 21 reflects the reflected laser B, and in combination with the incident angle of the detection laser a being 90 °, the reflected laser B will be perpendicular to the detection laser a.
Referring to fig. 2, in a second aspect, an embodiment of the present application provides a method for online detecting surface defects of an aluminum profile, including the following steps:
s10, acquiring a standard gray scale image;
s20, irradiating the surface of the object to be detected by using detection laser A;
s30, changing the light path of the reflected laser B reflected by the surface of the object to be detected;
s40, receiving the reflected laser B to form a gray-scale image to be detected
And S50, comparing the gray-scale image to be detected with the standard gray-scale image.
Referring to fig. 3, in some embodiments of the present application, obtaining a standard gray scale map includes:
s11, detecting a plurality of qualified sectional materials and forming a plurality of gray-scale images;
and S12, acquiring each pixel point in each gray map and endowing the gray value corresponding to each pixel point, wherein the endowment of the gray value is given according to the depth of the color of the corresponding pixel point.
And S13, calculating the mean value of corresponding pixel points in the gray maps to form a standard gray map, specifically, giving the calculated mean value of each corresponding pixel point to any gray map, taking the gray map as the standard gray map, and in a specific embodiment of the application, giving the calculated mean value of each corresponding pixel point to a first gray map generated by a qualified sectional material.
Referring to fig. 3, in some embodiments of the present application, the obtaining the standard gray scale further includes:
s14, detecting the object to be detected 40 to obtain a gray-scale image to be detected;
s15, acquiring each pixel point to be detected in the gray-scale image to be detected;
s16, calculating the mean value of the gray values of all the pixels to be detected in the gray image to be detected and the mean value of the gray values of all the standard pixels in the standard gray image;
s17, comparing the gray values of the pixel points to be detected in the gray image to be detected with the corresponding standard pixel points in the standard gray image, and comparing the mean value of the gray values of all the pixel points to be detected in the gray image to be detected with the mean value of the gray values of all the standard pixel points in the standard gray image;
s18, if the difference value of the gray values of the pixel points to be detected in the gray image to be detected and the corresponding standard pixel points in the standard gray image is smaller than a first preset value, and the difference value of the mean value of the gray values of all the pixel points to be detected in the gray image to be detected and the mean value of the gray values of all the standard pixel points in the standard gray image is smaller than a second preset value, calculating the mean value of all the pixel points to be detected in the gray image to be detected and all the standard pixel points in the corresponding standard gray image and endowing all the standard pixel points in the standard gray image; the first preset value and the second preset value are set according to the detection precision required in the actual production process.
In some embodiments of the present application, changing the optical path of the reflected laser light B reflected by the surface of the object to be detected includes:
the 1/4 wave plate 22 is used for converting the reflected laser B from linearly polarized light into circularly polarized light;
the reflected laser light B of the circular polarization component is reflected using the polarization splitting prism 21.
In some embodiments of the present application, receiving the reflected laser light B includes:
filtering the reflected laser B by using a thin film optical filter;
and (3) acquiring the reflected laser B by using an imaging piece and generating a gray-scale image to be detected.
The same or similar reference numerals in the drawings of the present embodiment correspond to the same or similar components; in the description of the present application, it should be understood that if there is an orientation or positional relationship indicated by the terms "upper", "lower", "left", "right", etc., based on the orientation or positional relationship shown in the drawings, it is only for convenience of description and simplification of the description, but it is not intended to indicate or imply that the device or element referred to must have a specific orientation, be constructed in a specific orientation and operate, and therefore the terms describing the positional relationship in the drawings are only used for illustrative purposes and are not to be construed as limiting the present patent, and the specific meaning of the above terms can be understood according to the specific situation by those skilled in the art.
The present invention is not intended to be limited to the particular embodiments shown and described, but is to be accorded the widest scope consistent with the principles and novel features herein disclosed.
Claims (10)
1. The utility model provides a device of on-line measuring aluminium alloy surface defect, its characterized in that includes at least a set of determine module, every group determine module includes:
the light source unit is used for emitting detection laser, and the detection laser irradiates the surface of an object to be detected and is reflected to form reflected laser;
the light path conversion unit is positioned on the light paths of the detection laser and the reflected laser and is used for converting the light path of the reflected laser reflected by the object to be detected;
the imaging unit is used for receiving the reflected laser emitted by the light path conversion unit and generating a gray image to be detected;
and the processing unit is used for comparing the gray values of each pixel point in the gray image to be detected with the gray values of each pixel point in the standard gray image.
2. The apparatus for on-line detecting surface defects of aluminum profiles as set forth in claim 1, wherein the imaging unit comprises:
the thin film optical filter is arranged on a light path of the reflected laser, and the thin film optical filter can only pass light with the wavelength larger than 1100 nm;
and the imaging part is used for acquiring the reflected laser and generating a gray image to be detected, and is positioned on the rear side of the thin film optical filter along the optical path of the reflected laser.
3. The apparatus for on-line detecting surface defects of aluminum profiles as set forth in claim 1, wherein the light source unit includes:
a light emitting member for emitting the detection laser;
the focusing piece is arranged on the light emitting side of the light emitting piece, is positioned on the light path of the detection laser, and is used for receiving the detection laser emitted by the light emitting piece and collecting the detection laser;
and the light homogenizing part is arranged on one side of the focusing part, which is far away from the light emitting part, is positioned on the light path of the detection laser and is used for receiving the detection laser emitted by the focusing part and homogenizing the detection laser.
4. The apparatus for on-line detecting the surface defect of the aluminum profile as claimed in claim 3, wherein the wavelength of the detection laser emitted by the light emitting member is larger than that of natural light.
5. The apparatus for on-line detecting surface defects of aluminum profiles as set forth in claim 1, wherein the light path conversion unit comprises:
the polarization splitting prism is arranged on the light outlet side of the light source unit and can transmit the light of the P polarization component and reflect the light of the S polarization component;
the 1/4 glass slide is arranged on one side, away from the light source unit, of the polarization splitting prism and can enable the phase angle of the detection laser and the reflected laser to rotate by 45 degrees;
the detection laser emitted by the light source unit sequentially transmits the polarization beam splitter prism and the 1/4 glass slide and irradiates the object to be detected, and the reflection laser reflected by the object to be detected transmits the 1/4 glass slide and irradiates the polarization beam splitter prism and is reflected to the imaging unit.
6. The method for detecting the surface defects of the aluminum profile on line is characterized by comprising the following steps:
acquiring a standard gray scale image;
irradiating the surface of an object to be detected by using detection laser;
changing the light path of the reflected laser reflected by the surface of the object to be detected;
receiving the reflected laser to form a gray image to be detected;
and comparing the gray-scale image to be detected with the standard gray-scale image.
7. The method for detecting the surface defects of the aluminum profile in an online manner as claimed in claim 6, wherein the step of obtaining the standard gray scale map comprises the following steps:
detecting a plurality of qualified sectional materials and forming a plurality of gray-scale images;
acquiring each pixel point in each gray scale image and endowing the gray scale value corresponding to each pixel point;
and calculating the average value of the pixel points in the gray level images to form a standard gray level image.
8. The method for detecting the surface defects of the aluminum profile in an online manner as claimed in claim 7, wherein the step of obtaining the standard gray scale further comprises the following steps:
detecting the object to be detected to obtain the gray-scale image to be detected;
acquiring each pixel point to be detected in the gray-scale image to be detected;
calculating the mean value of the gray values of all the pixels to be detected in the gray image to be detected and the mean value of the gray values of all the standard pixels in the standard gray image;
comparing the gray values of the pixel points to be detected in the gray image to be detected with the corresponding standard pixel points in the standard gray image, and comparing the mean value of the gray values of all the pixel points to be detected in the gray image to be detected with the mean value of the gray values of all the standard pixel points in the standard gray image;
if the difference value of the gray values of the pixel points to be detected in the gray image to be detected and the corresponding standard pixel points in the standard gray image is smaller than a first preset value, and the difference value of the mean value of the gray values of the pixel points to be detected in the gray image to be detected and the mean value of the gray values of the standard pixel points in the standard gray image is smaller than a second preset value, calculating the mean value of the pixel points to be detected in the gray image to be detected and the standard pixel points in the corresponding standard gray image and endowing the mean value of the pixel points to be detected and the standard pixel points in the standard gray image.
9. The method for detecting the surface defects of the aluminum profile on line as claimed in claim 6, wherein the changing of the light path of the reflected laser reflected by the surface of the object to be detected comprises:
converting the reflected laser light into circularly polarized light from linearly polarized light by using a 1/4 wave plate;
a polarization beam splitter prism is used to reflect the reflected laser light of circular polarization component.
10. The method for detecting the surface defects of the aluminum profile in an online manner as claimed in claim 6, wherein the receiving the reflected laser comprises: filtering the reflected laser light by using a thin film filter;
and (3) acquiring the reflected laser by using an imaging piece and generating a gray-scale image to be detected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211243504.7A CN115308216B (en) | 2022-10-12 | 2022-10-12 | Device and method for online detection of aluminum profile surface defects |
Applications Claiming Priority (1)
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