CN115298827A - 一种多层薄膜制备方法及多层薄膜 - Google Patents

一种多层薄膜制备方法及多层薄膜 Download PDF

Info

Publication number
CN115298827A
CN115298827A CN202080098589.7A CN202080098589A CN115298827A CN 115298827 A CN115298827 A CN 115298827A CN 202080098589 A CN202080098589 A CN 202080098589A CN 115298827 A CN115298827 A CN 115298827A
Authority
CN
China
Prior art keywords
layer
material layer
substrate
intermediate layer
layers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202080098589.7A
Other languages
English (en)
Inventor
秦健鹰
杨喜超
邢彦敏
张岩
魏侠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Huawei Technologies Co Ltd
Original Assignee
Huawei Technologies Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Huawei Technologies Co Ltd filed Critical Huawei Technologies Co Ltd
Publication of CN115298827A publication Critical patent/CN115298827A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B18/00Layered products essentially comprising ceramics, e.g. refractory products
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES OR LIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
    • H01G4/00Fixed capacitors; Processes of their manufacture
    • H01G4/33Thin- or thick-film capacitors 
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B51/00Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory transistors
    • H10B51/30Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory transistors characterised by the memory core region

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Semiconductor Memories (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)

Abstract

本申请公开了一种多层薄膜制备方法及多层薄膜,其中方法主要包括:制备第一材料层,进而在第一材料层的表面层叠设置多个第二材料层。本申请实施例中,每个第二材料层包括第二衬底,第二衬底由铁电单晶材料构成。采用上述方法,可以在多层薄膜中制备多个由铁电单晶材料构成的薄膜层,有利于扩大铁电单晶材料在多层薄膜中的应用。

Description

PCT国内申请,说明书已公开。

Claims (22)

  1. PCT国内申请,权利要求书已公开。
CN202080098589.7A 2020-03-17 2020-03-17 一种多层薄膜制备方法及多层薄膜 Pending CN115298827A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2020/079554 WO2021184171A1 (zh) 2020-03-17 2020-03-17 一种多层薄膜制备方法及多层薄膜

Publications (1)

Publication Number Publication Date
CN115298827A true CN115298827A (zh) 2022-11-04

Family

ID=77768006

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202080098589.7A Pending CN115298827A (zh) 2020-03-17 2020-03-17 一种多层薄膜制备方法及多层薄膜

Country Status (2)

Country Link
CN (1) CN115298827A (zh)
WO (1) WO2021184171A1 (zh)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040175585A1 (en) * 2003-03-05 2004-09-09 Qin Zou Barium strontium titanate containing multilayer structures on metal foils
CN102693837B (zh) * 2011-03-23 2015-11-18 成都锐华光电技术有限责任公司 一种具有周期叠层铁电薄膜的电容及其制备方法
CN102683577B (zh) * 2011-10-28 2013-10-30 闫静 BiFe1-yMnyO3外延复合薄膜及其制备方法
CN109980014B (zh) * 2019-03-26 2023-04-18 湘潭大学 一种后栅极铁电栅场效应晶体管及其制备方法

Also Published As

Publication number Publication date
WO2021184171A1 (zh) 2021-09-23

Similar Documents

Publication Publication Date Title
CN100479195C (zh) 具有执行器的半导体装置
US6998940B2 (en) Component operating with bulk acoustic waves and a method for producing the component
JP6627647B2 (ja) 積層膜、電子デバイス基板、電子デバイス及び積層膜の製造方法
CA2968643C (en) Method and apparatus for a thin film dielectric stack
US20210104596A1 (en) Method and apparatus for a thin film dielectric stack
CA2922956A1 (en) A thin film dielectric stack
US20020164827A1 (en) Microelectronic piezoelectric structure and method of forming the same
US20070020955A1 (en) Fabrication method of composite metal oxide dielectric film, and composite metal oxide dielectric film fabricated thereby
US20170330688A1 (en) Thin film capacitor and manufacturing method thereof
TW201607090A (zh) 壓電式層裝置的製造方法以及相關的壓電式層裝置
JP3435633B2 (ja) 薄膜積層体、薄膜キャパシタ、およびその製造方法
CN115298827A (zh) 一种多层薄膜制备方法及多层薄膜
JPH08116103A (ja) 圧電アクチュエータおよびその製造方法
KR20050102642A (ko) 적층 구조물의 제조방법
US11657981B2 (en) Method and apparatus for compensating for high Thermal Expansion Coefficient mismatch of a stacked device
JP3608459B2 (ja) 薄膜積層体、強誘電体薄膜素子およびそれらの製造方法
US8950057B2 (en) Parallel-plate structure fabrication method
CN115332435A (zh) 一种含有双极性压电结构的pmut器件及其制备方法
KR20180023657A (ko) 박막 커패시터 및 그 제조방법
WO2003010834A2 (en) Microelectronic piezoelectric structure
US20020153524A1 (en) Structure and method for fabricating semiconductor structures and devices utilizing perovskite stacks
US11581476B2 (en) Semiconductor structure and method for manufacturing thereof
JP6282735B2 (ja) Pzt薄膜積層体の製造方法
JP2005286037A (ja) 薄膜圧電体素子及びその製造方法
CN115347113A (zh) 一种含有双极性压电结构的pmut器件及其制备方法

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination