CN115219752A - Circuit board split type flying probe testing unit and testing method - Google Patents
Circuit board split type flying probe testing unit and testing method Download PDFInfo
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- CN115219752A CN115219752A CN202210998271.5A CN202210998271A CN115219752A CN 115219752 A CN115219752 A CN 115219752A CN 202210998271 A CN202210998271 A CN 202210998271A CN 115219752 A CN115219752 A CN 115219752A
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- circuit board
- flying
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- flying probe
- testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The application discloses a flying probe testing unit and a flying probe testing method of a circuit board in a split mode. This flying probe test unit of circuit board disconnect-type includes: the testing device comprises a plurality of n flying needle testing machines which are connected in pairs and positioned on the same horizontal line, wherein the flying needle testing machines are connected through a horizontal transmission device which moves horizontally, the horizontal transmission device is used for enabling a circuit board with the length of m entering a first flying needle testing machine in a flying needle testing unit to sequentially pass through the n flying needle testing machines, and each flying needle testing module is arranged between (m/n) × (x-1) and (m/n) × of the length of an inner closed plane and used for testing the m/n) × (x-1) and (m/n) × of the length of the circuit board. The flying probe test unit can realize that a circuit board is subjected to split test by a plurality of flying probe test machines, so that the test efficiency of the circuit board is improved.
Description
Technical Field
The invention relates to the technical field of chip testing, in particular to a flying probe testing unit and a flying probe testing method for a circuit board in a split mode.
Background
A PCB (Printed Circuit Board) is an important electronic component, a component support, and a carrier for electrical connection of the electronic component. It is called a "printed" circuit board because it is made using electronic printing. The printed circuit board PCB is an upstream basic industry of the electronic industry, and determines competitiveness of electronic products.
A flying probe tester is a system that tests PCBs in a manufacturing environment. Instead of using all of the conventional needle bed interfaces on a conventional in-line testing machine, flying probe testing uses four independently controlled probes that are moved to the element under test. The Unit Under Test (UUT) is transported into the tester by means of a belt or other UUT transport system. Then, fixed, the probe of the tester contacts the test pad (test pad) and the via hole (via) to test the single element of the Unit Under Test (UUT). How to meet the rapidly increasing PCB production requirement and improve the PCB testing efficiency becomes an urgent problem to be solved.
Disclosure of Invention
The embodiment of the invention provides a circuit board split type flying probe testing unit and a testing method, which aim to solve the problem that the PCB production requirement which is increased at a high speed is met and the PCB testing efficiency is improved.
A flying probe testing unit of circuit board disconnect-type includes:
the system comprises a plurality of n flying needle testing machines which are connected in pairs and are positioned on the same horizontal line, wherein the flying needle testing machines are connected through a horizontal transmission device which advances horizontally, the horizontal transmission device is used for enabling a circuit board with the length of m entering a first flying needle testing machine in a flying needle testing unit to sequentially pass through the n flying needle testing machines, and the system comprises:
each flying probe tester includes: the test device comprises a support frame, at least eight flying probe test modules which are arranged on the support frame and are even number, and a test machine serial number x, wherein the support frame forms an inner closed plane, and all the flying probe test modules are uniformly distributed on two sides of the inner closed plane. And taking one side entering the flying probe testing machine as a zero point, wherein each flying probe testing module is arranged between (m/n) × (x-1) and (m/n) × x of the length of the inner closed plane and is used for testing (m/n) × (x-1) and (m/n) × x of the length of the circuit board, wherein the serial number corresponding to the first flying probe testing machine entering the flying probe testing unit is one, and the adjacent flying probe testing machines are increased by one.
Further, the support frame includes: two vertical supporting frames which are vertical to the ground, and two horizontal supporting arms which are respectively and horizontally connected with the upper end and the lower end of each vertical supporting frame form an inner closed plane for the supporting frames.
Furthermore, the flying probe testing machine comprises a circuit board clamping structure which is detachably arranged on the horizontal transmission device and used for fixing the circuit board along the inner closed plane.
Furthermore, the head and the tail of the flying probe testing machine set correspond to the machine set entering side and the machine set exiting side respectively, the circuit board clamping structures on the machine set entering side and the machine set exiting side comprise a horizontal upper clamping frame and a horizontal lower clamping frame which are used for clamping a circuit board, and the length of the horizontal upper clamping frame and the length of the horizontal lower clamping frame are larger than that of the circuit board.
Furthermore, the automatic circuit board feeding device further comprises a feeding machine, a feeding robot, a material receiving machine and a material receiving robot, wherein the feeding machine is arranged on the side of the feeding machine set and used for placing a plurality of circuit boards, the feeding robot is used for clamping each circuit board to the circuit board clamping structure after the circuit board is taken from the feeding machine, the material receiving machine is arranged on the side of the discharging machine set, and the material receiving robot is used for taking down the circuit boards from the circuit board clamping structure and placing the circuit boards on the material receiving machine.
Furthermore, the feeding robot is arranged between the feeding machines respectively corresponding to the two adjacent flying probe testing units and used for realizing the replacement type circuit board conveying for the adjacent feeding machines.
Further, the feeder is movable stack pallet, and the bottom of stack pallet sets up three at least wheels.
Furthermore, each flying probe testing machine also comprises an outer machine shell, and a visual window is arranged on the outer machine shell at a position corresponding to the inner closed plane.
Further, the visual window is an openable visual window.
A circuit board split type test method adopts the circuit board split type flying probe test unit to realize the following steps:
and acquiring the serial number x of the testing machines, the number n of the testing machines and the length m of the circuit board.
And based on the serial number x of the testing machines, the number n of the testing machines and the length m of the circuit board, moving all the flying probe testing modules to the position between m/n (x-1) and m/n x of the length of the inner closed plane.
And acquiring a starting test instruction, and performing line test on the circuit board by using the flying probe on the flying probe test module for testing the circuit part of the circuit board from m/n x (x-1) to m/n x.
According to the circuit board split type flying probe test unit and the test method, the n flying probe test machines which are connected in pairs and are positioned on the same horizontal line are connected through the horizontal transmission device which advances horizontally, the horizontal transmission device is used for performing the cutting type test on the circuit board with the length of m entering the flying probe test unit, each flying probe test machine measures 1/n on the circuit board, and the rest parts are tested by other flying probe test machines of the flying probe test unit, so that the circuit board is split type tested by the multiple flying probe test machines, and the test efficiency of the circuit board is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments of the present invention will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without inventive labor.
FIG. 1 is a schematic diagram of a flying probe testing machine set with a circuit board separated according to an embodiment of the present invention;
FIG. 2 is a flow chart showing a circuit board separation type testing method according to an embodiment of the invention.
Description of reference numerals:
10. a circuit board;
100. a flying probe testing unit;
101. a horizontal transfer device; 102. a support frame; 103. a flying probe testing module; 104. an inner enclosed plane;
110. and entering a first flying probe testing machine in the flying probe testing unit.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
A flying probe testing machine set 100 with a circuit board 10 divided, as shown in fig. 1, includes:
the test system comprises a plurality of n flying needle testers which are connected in pairs and are positioned on the same horizontal line, wherein the flying needle testers are connected through a horizontal transmission device 101 which horizontally advances, the horizontal transmission device 101 is used for enabling a circuit board 10 with the length of m of a first flying needle tester entering a flying needle test unit 100 to sequentially pass through the n flying needle testers, and the test system comprises:
each flying probe testing machine includes: the test device comprises a support frame 102, at least eight and even flying probe test modules 103 arranged on the support frame 102 and a tester serial number x, wherein the support frame 102 forms an inner closed plane 104, and all the flying probe test modules 103 are uniformly distributed on two sides of the inner closed plane 104. Taking one side entering the flying-needle testing machine as a zero point, each flying-needle testing module 103 is arranged between (m/n) × (x-1) to (m/n) × x of the length of the inner closed plane 104 and is used for testing (m/n) × (x-1) to (m/n) × of the length of the circuit board 10, wherein the serial number corresponding to the first flying-needle testing machine entering the flying-needle testing unit 100 is one, and the serial numbers of the adjacent flying-needle testing machines are increased by one.
Specifically, the minimum value of x is 1 for testing m/n lengths dividing the length m into n, i.e. the length of each flying probe testing machine in sequence is 0 to m/n, (m/n) to 2 (m/n) until the last nth test station tests the position with the length of (m/n) ((n-1) to m).
In the flying probe test unit of the circuit board split type provided by the embodiment, n flying probe test machines which are connected in pairs and are positioned on the same horizontal line are connected through a horizontal transmission device which advances horizontally, the horizontal transmission device is used for performing the split type test on the circuit board with the length of m entering the flying probe test unit, each flying probe test machine measures 1/n on the circuit board, and the rest parts are tested by other flying probe test machines of the flying probe test unit, so that the circuit board is split type tested by the multiple flying probe test machines, and the test efficiency of the circuit board is improved.
In a particular embodiment, the support frame 102 includes: two vertical supports arranged perpendicular to the ground, and two horizontal support arms horizontally connected to the upper and lower ends of the vertical supports, respectively, form the support frame 102 into an inner closed plane 104.
In one embodiment, the flying probe tester includes a circuit board 10 holding structure removably disposed on the horizontal transport device 101 for holding the circuit board 10 along the inner enclosure plane 104.
In a specific embodiment, the two flying probe testing machines at the head and the tail of the flying probe testing machine set 100 correspond to the in-set side and the out-set side respectively, the circuit board 10 clamping structure at the in-set side and the out-set side comprises a horizontal upper clamping frame and a horizontal lower clamping frame for clamping the circuit board 10, and the length of the horizontal upper clamping frame and the length of the horizontal lower clamping frame are greater than the length of the circuit board 10.
In an embodiment, the system further comprises a feeding machine arranged on the side of the feeding unit for placing a plurality of circuit boards, a feeding robot for clamping each circuit board 10 to the circuit board clamping structure after being taken from the feeding machine, a material receiving machine arranged on the side of the discharging unit, and a material receiving robot for taking down the circuit board 10 from the circuit board clamping structure and placing the circuit board on the material receiving machine.
In an embodiment, the feeding robot is disposed between the feeding machines corresponding to two adjacent flying probe testing units 100, and is configured to alternately convey the circuit board 10 to the adjacent feeding machines.
In one embodiment, the feeder is a movable feeding cart, and at least three wheels are arranged at the bottom of the feeding cart.
In one embodiment, each flying probe testing machine further comprises an outer housing having a viewing window disposed at a location corresponding to the inner enclosed plane 104.
In one embodiment, the viewable window is an openable viewable window.
A circuit board split type test method adopts the circuit board split type flying probe test unit to realize the following steps:
s10, obtaining the serial number x of the testing machines, the number n of the testing machines and the length m of the circuit board.
And S20, moving all the flying probe testing modules 103 to a position between m/n (x-1) and m/n x of the length of the inner closed plane based on the serial number x of the testing machines, the number n of the testing machines and the length m of the circuit board.
And S30, acquiring a starting test instruction, and performing line test on the circuit board by using the flying probe on the flying probe test module 103 to test the circuit part of the circuit board from m/n (x-1) to m/n x.
Specifically, the minimum value of x is 1 for testing m/n lengths dividing the length m into n, i.e. the length of each flying probe testing machine in sequence is 0 to m/n, (m/n) to 2 (m/n) until the last nth test station tests the position with the length of (m/n) ((n-1) to m).
In the circuit board split-type testing method provided by the embodiment, a plurality of n flying probe testing machines which are connected in pairs and are positioned on the same horizontal line are connected through a horizontal transmission device which moves horizontally, the horizontal transmission device is used for performing a cutting-type test on a circuit board with the length of m entering a flying probe testing unit, each flying probe testing machine measures 1/n of the circuit board, and the rest parts are tested by other flying probes of the flying probe testing unit, so that the circuit board is split-type tested by the plurality of flying probe testing machines, and the testing efficiency of the circuit board testing machine is improved.
The above examples are only for illustrating the technical solutions of the present invention, and are not limited thereto. Although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: modifications of the technical solutions described in the embodiments or equivalent replacements of some technical features may still be made. Such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present invention, and are intended to be included within the scope of the present invention.
Claims (10)
1. The utility model provides a flying probe test unit of circuit board disconnect-type which characterized in that includes:
the test machine set comprises a plurality of n flying needle test machines which are connected in pairs and positioned on the same horizontal line, wherein the flying needle test machines are connected through a horizontal transmission device which advances horizontally, the horizontal transmission device is used for enabling a circuit board with the length of m entering a first flying needle test machine in the flying needle test machine set to sequentially pass through the n flying needle test machines, and the test machine set comprises:
each of the flying probe testing machines includes: the test device comprises a support frame, at least eight flying needle test modules which are arranged on the support frame and are in even number, and a test machine serial number x, wherein the support frame forms an inner closed plane, all the flying needle test modules are uniformly distributed on two sides of the inner closed plane, one side entering the flying needle test machine is taken as a zero point, each flying needle test module is arranged between (m/n) × (x-1) and (m/n) × of the length of the inner closed plane and is used for testing the length of the circuit board from (m/n) × (x-1) to (m/n) ×, wherein the serial number corresponding to the first flying needle test machine entering the flying needle test unit is one, and the adjacent flying needle test machines are increased by one.
2. The circuit board-separated flying probe testing machine set according to claim 1, wherein the support frame comprises: the two vertical supporting frames are arranged perpendicular to the ground, and the two horizontal supporting arms are horizontally connected with the upper end and the lower end of each vertical supporting frame respectively, so that the supporting frames form the inner closed plane.
3. The flying probe testing machine set of claim 1, wherein the flying probe testing machine comprises a circuit board clamping structure detachably disposed on the horizontal transport device for fixing the circuit board along the inner closed plane.
4. The flying probe testing machine set of claim 3, wherein the flying probe testing machines of the flying probe testing machine set are respectively corresponding to an input side and an output side, the circuit board clamping structures of the input side and the output side comprise a horizontal upper clamping frame and a horizontal lower clamping frame for clamping the circuit board, and the lengths of the horizontal upper clamping frame and the horizontal lower clamping frame are greater than the length of the circuit board.
5. The flying probe testing machine set of claim 4, further comprising a feeding machine disposed on the side of the incoming machine set for placing a plurality of circuit boards, a feeding robot for taking each circuit board from the feeding machine and clamping the circuit board to the circuit board clamping structure, a receiving machine disposed on the side of the outgoing machine set, and a receiving robot for taking down the circuit board from the circuit board clamping structure and placing the circuit board on the receiving machine.
6. The circuit board split type flying probe testing unit set according to claim 5, wherein the feeding robot is arranged between the feeding machines respectively corresponding to two adjacent flying probe testing units, and is used for realizing the replacement type circuit board conveying for the adjacent feeding machines.
7. The circuit board separated flying probe testing unit set according to claim 5, wherein the feeding machine is a movable feeding car, and at least three wheels are arranged at the bottom of the feeding car.
8. The circuit board-divided flying probe testing machine set according to claim 1, wherein each flying probe testing machine further comprises an outer housing, and the outer housing is provided with a visible window at a position corresponding to the inner closed plane.
9. The circuit board-separated flying probe testing machine set according to claim 8, wherein the visual window is an openable visual window.
10. A circuit board separation type test method, which is characterized in that the following steps are realized by adopting the circuit board separation type flying probe test machine set according to any one of claims 1 to 9:
acquiring a serial number x of a tester, the number n of the testers and the length m of a circuit board;
based on the test machine serial number x, the test machine number n and the circuit board length m, moving all flying probe test modules to the position between (m/n) × (x-1) and (m/n) × x of the length of the inner closed plane;
and acquiring a starting test instruction, and performing line test on the circuit board by using the flying probe on the flying probe test module for testing the circuit part from (m/n) × (x-1) to (m/n) × of the length of the circuit board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210998271.5A CN115219752A (en) | 2022-08-19 | 2022-08-19 | Circuit board split type flying probe testing unit and testing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210998271.5A CN115219752A (en) | 2022-08-19 | 2022-08-19 | Circuit board split type flying probe testing unit and testing method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115219752A true CN115219752A (en) | 2022-10-21 |
Family
ID=83616134
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210998271.5A Pending CN115219752A (en) | 2022-08-19 | 2022-08-19 | Circuit board split type flying probe testing unit and testing method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115219752A (en) |
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2022
- 2022-08-19 CN CN202210998271.5A patent/CN115219752A/en active Pending
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