CN217901850U - Flying probe testing unit with circuit board divided - Google Patents
Flying probe testing unit with circuit board divided Download PDFInfo
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- CN217901850U CN217901850U CN202222199100.4U CN202222199100U CN217901850U CN 217901850 U CN217901850 U CN 217901850U CN 202222199100 U CN202222199100 U CN 202222199100U CN 217901850 U CN217901850 U CN 217901850U
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Abstract
The application discloses flying probe test unit of circuit board partition type. This flying probe test unit of circuit board disconnect-type includes: the testing device comprises a plurality of n flying needle testing machines which are connected in pairs and positioned on the same horizontal line, wherein the flying needle testing machines are connected through a horizontal transmission device which moves horizontally, the horizontal transmission device is used for enabling a circuit board with the length of m entering a first flying needle testing machine in a flying needle testing unit to sequentially pass through the n flying needle testing machines, and each flying needle testing module is arranged between (m/n) × (x-1) and (m/n) × of the length of an inner closed plane and used for testing the m/n) × (x-1) and (m/n) × of the length of the circuit board. The flying probe test unit can realize that a circuit board is subjected to split test by a plurality of flying probe test machines, so that the test efficiency of the circuit board is improved.
Description
Technical Field
The utility model relates to a chip test technical field especially relates to a flying probe test unit of circuit board formula of cutting apart.
Background
A PCB (Printed Circuit Board) is an important electronic component, a component support, and a carrier for electrical connection of the electronic component. It is called a "printed" circuit board because it is made using electronic printing. The printed circuit board PCB is an upstream basic industry of the electronic industry, and determines competitiveness of electronic products.
A flying probe tester is a system that tests PCBs in a manufacturing environment. Instead of using all of the conventional needle bed interfaces on a conventional in-line testing machine, flying probe testing uses four independently controlled probes that are moved to the element under test. The Unit Under Test (UUT) is transported into the tester by a belt or other UUT transport system. Then, fixed, the probe of the tester contacts the test pad (test pad) and the via hole (via) to test the single element of the Unit Under Test (UUT). How to meet the rapidly increasing PCB production requirement and improve the PCB testing efficiency becomes an urgent problem to be solved.
Disclosure of Invention
An embodiment of the utility model provides a flying probe test unit of circuit board formula of cutting apart to the solution satisfies the high-speed PCB production demand that increases and improves the problem of the efficiency of PCB test.
A flying probe test set of circuit board disconnect-type includes:
the system comprises a plurality of n flying needle testing machines which are connected in pairs and are positioned on the same horizontal line, wherein the flying needle testing machines are connected through a horizontal transmission device which advances horizontally, the horizontal transmission device is used for enabling a circuit board with the length of m entering a first flying needle testing machine in a flying needle testing unit to sequentially pass through the n flying needle testing machines, and the system comprises:
each flying probe testing machine includes: the test device comprises a support frame, at least eight flying needle test modules which are arranged on the support frame and are in even number, and a test machine serial number x, wherein the support frame forms an inner closed plane, all flying needle test modules are uniformly distributed on two sides of the inner closed plane, one side entering the flying needle test machine is used as a zero point, each flying needle test module is arranged between (m/n) × (x-1) to (m/n) × of the length of the inner closed plane and is used for testing the (m/n) (x-1) to (m/n) × of the length of a circuit board, the serial number corresponding to a first flying needle test machine entering a flying needle test machine set is one, and adjacent flying needle test machines are sequentially increased by one.
Further, the support frame includes: two vertical supporting frames which are vertical to the ground, and two horizontal supporting arms which are respectively and horizontally connected with the upper end and the lower end of each vertical supporting frame form an inner closed plane for the supporting frames.
Furthermore, the flying probe testing machine comprises a circuit board clamping structure which is detachably arranged on the horizontal transmission device and used for fixing the circuit board along the inner closed plane.
Furthermore, the head and the tail of the flying probe testing machine set correspond to the machine set entering side and the machine set exiting side respectively, the circuit board clamping structures on the machine set entering side and the machine set exiting side comprise a horizontal upper clamping frame and a horizontal lower clamping frame which are used for clamping a circuit board, and the length of the horizontal upper clamping frame and the length of the horizontal lower clamping frame are larger than that of the circuit board.
The circuit board receiving machine further comprises a feeding machine arranged on the side of the incoming machine set, a feeding robot used for placing the circuit board on the feeding machine, a receiving machine arranged on the side of the outgoing machine set and a receiving robot used for taking the circuit board off the receiving machine.
Furthermore, the feeding robot is arranged between the feeding machines respectively corresponding to the two adjacent flying probe testing units and used for realizing the replacement type circuit board conveying for the adjacent feeding machines.
Further, the feeder is movable stack pallet, and the bottom of stack pallet sets up three at least wheels.
Furthermore, each flying probe testing machine also comprises an outer machine shell, and a visual window is arranged on the outer machine shell at a position corresponding to the inner closed plane.
Further, the visual window is a visual window that is openable.
A circuit board split type test method adopts the circuit board split type flying probe test unit to realize the following steps:
and acquiring the serial number x of the testing machines, the number n of the testing machines and the length m of the circuit board.
And based on the serial number x of the testing machines, the number n of the testing machines and the length m of the circuit board, moving all the flying probe testing modules to the position between m/n (x-1) and m/n x of the length of the inner closed plane.
And acquiring a test starting instruction, and performing circuit test on the circuit board by using the flying probe on the flying probe test module for testing the circuit part of the circuit board with the length of m/n x (x-1) to m/n x.
The flying probe test unit comprises a plurality of flying probe test machines which are connected in pairs and are positioned on the same horizontal line, wherein the flying probe test machines are connected through a horizontal transmission device which advances horizontally, the horizontal transmission device is used for cutting a circuit board with the length of m entering the flying probe test unit, each flying probe test machine measures 1/n of the circuit board, and the rest parts are tested by other flying probes of the flying probe test unit, so that the circuit board is subjected to the split test by the plurality of flying probe test machines, and the test efficiency of the circuit board test machines is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required to be used in the description of the embodiments of the present invention will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive labor.
Fig. 1 is a schematic structural diagram of a flying probe testing machine set with a circuit board divided according to an embodiment of the present invention.
Description of reference numerals:
10. a circuit board;
100. a flying probe testing unit;
101. a horizontal transfer device; 102. a support frame; 103. a flying probe testing module; 104. an inner enclosed plane;
110. and entering a first flying probe testing machine in the flying probe testing unit.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, of the embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
A flying probe testing machine set 100 with a circuit board 10 divided, as shown in fig. 1, includes:
the testing machine comprises a plurality of n flying probe testing machines which are connected in pairs and are positioned on the same horizontal line, the flying probe testing machines are connected through a horizontal transmission device 101 which advances horizontally, the horizontal transmission device 101 is used for enabling a circuit board 10 with the length of m of a first flying probe testing machine entering a flying probe testing unit 100 to pass through the n flying probe testing machines in sequence, and the testing machine comprises:
each flying probe testing machine includes: the test device comprises a support frame 102, at least eight and even flying probe test modules 103 arranged on the support frame 102 and a tester serial number x, wherein the support frame 102 forms an inner closed plane 104, and all the flying probe test modules 103 are uniformly distributed on two sides of the inner closed plane 104. Taking one side entering the flying-needle testing machine as a zero point, each flying-needle testing module 103 is arranged between (m/n) × (x-1) to (m/n) × x of the length of the inner closed plane 104 and is used for testing (m/n) × (x-1) to (m/n) × of the length of the circuit board 10, wherein the serial number corresponding to the first flying-needle testing machine entering the flying-needle testing unit 100 is one, and the serial numbers of the adjacent flying-needle testing machines are increased by one.
Specifically, the minimum value of x is 1, which is used for testing m/n length dividing the length m into n, namely, the length of each flying probe tester in sequence is 0 to m/n, (m/n) to 2 (m/n) until the last nth testing position with the length of (m/n) (n-1) to m.
According to the circuit board split type flying probe testing unit provided by the embodiment, n flying probe testing machines which are connected in pairs and are positioned on the same horizontal line are connected through the horizontal transmission device which horizontally advances, the horizontal transmission device is used for performing the split type test on a circuit board with the length of m entering the flying probe testing unit, each flying probe testing machine measures 1/n on the circuit board, and the rest parts are tested by other flying probes of the flying probe testing unit, so that the split type test of one circuit board by the multiple flying probe testing machines is realized, and the test efficiency of the circuit board is improved.
In a particular embodiment, the support frame 102 includes: two vertical supports arranged perpendicular to the ground and two horizontal support arms horizontally connected to the upper and lower ends of the vertical supports, respectively, form an inner closed plane 104 for the support frame 102.
In one embodiment, the flying probe tester includes a circuit board 10 holding structure removably disposed on the horizontal transport device 101 for holding the circuit board 10 along the inner enclosure plane 104.
In a specific embodiment, the two flying probe testing machines at the head and the tail of the flying probe testing machine set 100 correspond to the in-set side and the out-set side respectively, the circuit board 10 clamping structure at the in-set side and the out-set side comprises a horizontal upper clamping frame and a horizontal lower clamping frame for clamping the circuit board 10, and the length of the horizontal upper clamping frame and the length of the horizontal lower clamping frame are greater than the length of the circuit board 10.
In a specific embodiment, the system further comprises a feeding machine arranged on the input unit side, a feeding robot used for placing the circuit board 10 on the feeding machine, a receiving machine arranged on the output unit side, and a receiving robot used for taking the circuit board 10 off the receiving machine.
In an embodiment, the feeding robot is disposed between the feeding machines corresponding to two adjacent flying probe testing units 100, and is configured to alternately convey the circuit board 10 to the adjacent feeding machines.
In one embodiment, the feeder is a movable feeding cart, and at least three wheels are arranged at the bottom of the feeding cart.
In one embodiment, each flying probe testing machine further comprises an outer housing having a viewing window disposed at a location corresponding to the inner enclosed plane 104.
In one embodiment, the viewable window is an openable viewable window.
In the circuit board split-type testing method provided by the embodiment, the n flying probe testing machines which are connected in pairs and located on the same horizontal line are connected through the horizontal transmission device which advances horizontally, the horizontal transmission device is used for performing the split-type testing on the circuit board with the length of m entering the flying probe testing unit, each flying probe testing machine measures 1/n of the circuit board, and the rest parts are tested by other flying probes of the flying probe testing unit, so that the circuit board is split-type tested by the multiple flying probe testing machines, and the testing efficiency of the circuit board testing machine is improved.
The above embodiments are only used to illustrate the technical solution of the present invention, and not to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art will understand that: modifications of the technical solutions described in the embodiments or equivalent replacements of some technical features may still be made. Such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present invention, and are intended to be included within the scope of the present invention.
Claims (10)
1. The utility model provides a flying probe test unit of circuit board disconnect-type which characterized in that includes:
the test machine set comprises a plurality of n flying needle test machines which are connected in pairs and positioned on the same horizontal line, wherein the flying needle test machines are connected through a horizontal transmission device which advances horizontally, the horizontal transmission device is used for enabling a circuit board with the length of m entering a first flying needle test machine in the flying needle test machine set to sequentially pass through the n flying needle test machines, and the test machine set comprises:
each of the flying probe testing machines includes: the test device comprises a support frame, at least eight flying needle test modules and a test machine serial number x, wherein the flying needle test modules are arranged on the support frame, the number of the flying needle test modules is even, the support frame forms an inner closed plane, all the flying needle test modules are uniformly distributed on two sides of the inner closed plane, one side entering the flying needle test machine is taken as a zero point, each flying needle test module is arranged between (m/n) × (x-1) and (m/n) × of the length of the inner closed plane and used for testing (m/n) × (x-1) to (m/n) × of the length of the circuit board, the serial number corresponding to the first flying needle test machine entering the flying needle test unit is one, and the adjacent flying needle test machines are increased by one.
2. The circuit board-separated flying probe testing machine set according to claim 1, wherein the support frame comprises: the two vertical supporting frames are arranged perpendicular to the ground, and the two horizontal supporting arms are horizontally connected with the upper end and the lower end of each vertical supporting frame respectively, so that the supporting frames form the inner closed plane.
3. The flying probe test machine set of claim 1, wherein the flying probe test machine comprises a circuit board clamping structure detachably disposed on the horizontal transport device for fixing the circuit board along the inner closed plane.
4. The circuit board split type flying probe testing unit according to claim 3, wherein the flying probe testing machines at the head and the tail of the flying probe testing unit respectively correspond to an entering unit side and an exiting unit side, the circuit board clamping structures at the entering unit side and the exiting unit side include a horizontal upper clamping frame and a horizontal lower clamping frame for clamping a circuit board, and the lengths of the horizontal upper clamping frame and the horizontal lower clamping frame are greater than the length of the circuit board.
5. The flying probe testing machine set of claim 4, further comprising a feeding machine disposed on the side of the incoming machine set for placing a plurality of circuit boards, a feeding robot for taking each circuit board from the feeding machine and clamping the circuit board to the circuit board clamping structure, a receiving machine disposed on the side of the outgoing machine set, and a receiving robot for taking down the circuit board from the circuit board clamping structure and placing the circuit board on the receiving machine.
6. The circuit board split type flying probe testing unit set according to claim 5, wherein the feeding robot is arranged between the feeding machines respectively corresponding to two adjacent flying probe testing units, and is used for realizing the replacement type circuit board conveying for the adjacent feeding machines.
7. The circuit board separated flying probe testing unit set according to claim 5, wherein the feeding machine is a movable feeding car, and at least three wheels are arranged at the bottom of the feeding car.
8. The flying probe testing machine set of claim 3, wherein the circuit board clamping structure is provided with a height-adjustable clamp for adjusting the retention space of the clamp according to different circuit board heights, and the retention space is used for holding the circuit board.
9. The circuit board-divided flying probe testing machine set according to claim 1, wherein each flying probe testing machine further comprises an outer housing, and the outer housing is provided with a visible window at a position corresponding to the inner closed plane.
10. The circuit board-separated flying probe testing machine set according to claim 9, wherein the visual window is an openable visual window.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222199100.4U CN217901850U (en) | 2022-08-19 | 2022-08-19 | Flying probe testing unit with circuit board divided |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222199100.4U CN217901850U (en) | 2022-08-19 | 2022-08-19 | Flying probe testing unit with circuit board divided |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217901850U true CN217901850U (en) | 2022-11-25 |
Family
ID=84143675
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202222199100.4U Active CN217901850U (en) | 2022-08-19 | 2022-08-19 | Flying probe testing unit with circuit board divided |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217901850U (en) |
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2022
- 2022-08-19 CN CN202222199100.4U patent/CN217901850U/en active Active
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