CN220552919U - Device for aging test of resistor - Google Patents
Device for aging test of resistor Download PDFInfo
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- CN220552919U CN220552919U CN202321775566.2U CN202321775566U CN220552919U CN 220552919 U CN220552919 U CN 220552919U CN 202321775566 U CN202321775566 U CN 202321775566U CN 220552919 U CN220552919 U CN 220552919U
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- 238000012360 testing method Methods 0.000 title claims abstract description 37
- 230000002431 foraging effect Effects 0.000 title claims description 6
- 230000007246 mechanism Effects 0.000 claims abstract description 72
- 238000009434 installation Methods 0.000 claims abstract description 35
- 230000032683 aging Effects 0.000 claims abstract description 21
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 83
- 229910052802 copper Inorganic materials 0.000 claims description 83
- 239000010949 copper Substances 0.000 claims description 83
- 238000004088 simulation Methods 0.000 abstract description 7
- 238000001514 detection method Methods 0.000 abstract description 4
- 230000007613 environmental effect Effects 0.000 abstract description 3
- 238000010586 diagram Methods 0.000 description 4
- 238000003780 insertion Methods 0.000 description 4
- 230000037431 insertion Effects 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000010354 integration Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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Abstract
The application provides a device of ageing test resistance, which comprises a mounting plate, be equipped with the installation mechanism of multirow flow distribution board that awaits measuring on the mounting plate, the afterbody and the afterbody of the installation mechanism of adjacent row flow distribution board that awaits measuring or the head and the head of the installation mechanism of adjacent row flow distribution board that awaits measuring are connected for the installation mechanism of multirow flow distribution board that awaits measuring forms the S type and concatenates and distribute, the design of S type can save space and hold more sub-installation mechanism, through the simulation that carries out ageing environment in the thermostated container of setting for with the device of ageing test resistance is placed in to the temperature simultaneously to the sub-installation mechanism through the current-carrying, can directly carry out the calibration test of the resistance of every ageing over the flow distribution board after the simulation environmental condition finishes, the time has been practiced thrift greatly, can bear more flow distribution boards simultaneously, the detection efficiency is improved.
Description
Technical Field
The utility model relates to the technical field of resistance testing, in particular to a device for aging testing resistance.
Background
Some current dividers require testing prior to installation on the product, sometimes requiring scene condition simulation at a specific temperature, a specific current, and then calibration of the test voltage to infer resistance.
The existing test mode is as follows: for example, chinese patent publication CN 217424596U discloses a multistation tray structure for thermistor chip constant temperature and humidity detects, which comprises a supporting plate, the upper surface of layer board is provided with at least one chip carrier assembly, chip carrier assembly is including setting up fixed block, the chip plummer that is used for bearing thermistor chip and the setting are in the outside of chip plummer can the regulation from top to bottom, the pressing block is in the outside of chip plummer is adjusted from top to bottom through the pressing means for thermistor chip is exposed or is surrounded fixedly on the chip plummer, is equipped with chip carrier assembly, can prevent that thermistor chip from dropping.
However, this design can only make things convenient for the operation of taking of thermistor chip, improves the convenience and the stability of taking of thermistor chip when constant temperature and humidity detects, and can once only bear a plurality of thermistor chips, improves detection efficiency, but many products, like the flow distribution plate, need to lead to the electric current simultaneously under the homothermal condition, and current device can not satisfy both bear a plurality of flow distribution plates and have the test environment that can lead to the electric current simultaneously.
Therefore, how to develop a device to meet the test environment that can bear a plurality of current distribution plates and can simultaneously supply current is a problem to be solved at present.
Disclosure of Invention
The utility model aims to provide a device for testing resistance through ageing, which comprises a mounting plate 1, wherein the mounting plate 1 is provided with a plurality of rows of mounting mechanisms of current-dividing plates 18 to be tested, the tail parts and tail parts of the mounting mechanisms of the current-dividing plates 18 to be tested in adjacent rows or the head parts and head parts of the mounting mechanisms of the current-dividing plates 18 to be tested in adjacent rows are connected, so that the mounting mechanisms of the current-dividing plates 18 to be tested in multiple rows form S-shaped series connection distribution, the S-shaped design can save space and accommodate more sub-mounting mechanisms 2, and the device for testing resistance through ageing is placed in a constant temperature box with set temperature for simulating the ageing environment through current-passing the sub-mounting mechanisms 2.
The utility model provides a device of ageing test resistance, includes mounting panel 1, be equipped with the installation mechanism of multirow flow distribution plate 18 that awaits measuring on the mounting panel 1, its characterized in that: the tail parts of the mounting mechanisms of the adjacent rows of to-be-measured current distribution plates 18 are connected with the tail parts or the head parts of the mounting mechanisms of the adjacent rows of to-be-measured current distribution plates 18 are connected with the head parts of the mounting mechanisms of the adjacent rows of to-be-measured current distribution plates 18, so that the mounting mechanisms of the multi-row of to-be-measured current distribution plates 18 form S-shaped series connection distribution, each row of to-be-measured current distribution plates 18 consists of sub-mounting mechanisms 2 which are connected end to end, the free ends of the first sub-mounting mechanism 2 and the last sub-mounting mechanism 2 are respectively connected with an external power supply, and after the external power supply is electrified, each sub-mounting mechanism 2 has current to pass through.
In some embodiments, two first clamp plates 3 with symmetrical intervals are arranged on each adjacent sub-mounting mechanism 2 in the same row, and are used for limiting two ends of the to-be-tested splitter plate 18 mounted on each first clamp plate.
Further, the free ends of the first sub-mounting mechanism 2 and the last sub-mounting mechanism 2 are respectively provided with a third clamp plate 17 for limiting one end of the to-be-tested splitter plate 18 mounted on the first sub-mounting mechanism 2 and the last sub-mounting mechanism 2.
Further, the second clamp plates 10 are respectively arranged at the tail and tail connection parts of the installation mechanisms of the adjacent-row to-be-detected splitter plates 18 and at the head and head connection parts of the installation mechanisms of the adjacent-row to-be-detected splitter plates 18, and are used for playing a limiting role on the tail or head of the to-be-detected splitter plates 18 of the installation mechanisms of the adjacent-row to-be-detected splitter plates 18 when playing a limiting role on the two ends of the to-be-detected splitter plates 18 correspondingly installed after being matched with the first clamp plates 3 at one end of the to-be-detected splitter plates 18 correspondingly installed.
Further, the contact surfaces of the first clamp plate 3, the second clamp plate 10 and the third clamp plate 17 and the to-be-measured splitter plate 18 are concave 4, and contact angles between two corners of the concave 4 and the to-be-measured splitter plate 18 are provided with clearance holes 5 for protecting four corners of the to-be-measured splitter plate 18.
Further, a first copper bar 6 is arranged at the lower part of each first clamp plate 3, two ends of the first copper bar 6 are respectively connected with the to-be-tested current distribution plates 18 adjacent to two ends of the first copper bar, so that the first copper bar 6 of the same row is connected with the to-be-tested current distribution plates 18 in series.
Further, a second copper bar 11 is disposed at the lower portion of each second fixture plate 10, and two ends of the second copper bar 11 are connected with the tail portion and the tail portion of the to-be-tested current-dividing plate 18 of the adjacent row or the head portion and the head portion of the to-be-tested current-dividing plate 18 of the adjacent row respectively, so that the second copper bar 11 of the adjacent row and the to-be-tested current-dividing plate 18 are connected in series and conducted.
Further, the lower part of each first copper bar 6 is provided with a first copper bar mounting groove 7 for mounting the limiting first copper bar 6.
Further, the lower part of each second copper bar 11 is provided with a second copper bar mounting groove 12 for mounting the limiting second copper bar 11.
Further, one end of the first copper bar installation groove 7 far away from the adjacent first copper bar installation groove 7 is provided with a first insertion hole 8, one end of the last first copper bar installation groove 7 far away from the adjacent first copper bar installation groove 7 is provided with a second insertion hole 9, one part of the first copper bar 6 is arranged on the first copper bar installation groove 7 and is clamped with the first copper bar installation groove 7, the other part of the first copper bar 6 passes through the first insertion hole 8 to be arranged on the lower part of the lower installation plate 1 and is connected with an external power line, one part of the last first copper bar 6 is arranged on the last first copper bar installation groove 7 and is clamped with the last first copper bar installation groove 7, the other part of the first copper bar 6 passes through the second insertion hole 9 to be arranged on the lower part of the lower installation plate 1 and is connected with the external power line, so that all current-dividing plates 18 to be tested are connected in series for current-passing through the current dividing plates 18 to be tested.
Further, a positive power supply connection port 13 and a negative power supply connection port 14 are arranged on one side edge of the mounting plate 1, the positive power supply connection port 13 is connected with a first copper bar 6 at the first jack 8 through an external power supply line, and the negative power supply connection port 14 is connected with a last first copper bar 6 at the second jack 9 through the external power supply line.
Further, the back of the mounting board 1 is provided with a plurality of wire grooves 15 for external power lines, and the wire grooves 15 are used for placing the external power lines therein, so that the external power lines are arranged and protected.
In some embodiments, each diverter plate 18 to be tested is provided with a pressing device 16 for pressing the corresponding diverter plate 18 to be tested, and the pressing device 16 is mounted on the mounting plate 1.
The utility model has the beneficial effects that: the utility model provides a device of ageing test resistance, including mounting panel 1, be equipped with the installation mechanism of multirow flow distribution plate 18 that awaits measuring on the mounting panel 1, the afterbody and the afterbody of the installation mechanism of adjacent row flow distribution plate 18 that awaits measuring are connected or the head and the head of the installation mechanism of adjacent row flow distribution plate 18 that awaits measuring are connected for the installation mechanism of multirow flow distribution plate 18 that awaits measuring forms the S type and concatenates and distribute, the design of S type can save space and hold more sub-installation mechanism 2, through the simulation of ageing environment is carried out in the thermostated container that sets for with ageing test resistance' S device placed in to sub-installation mechanism 2 simultaneously, can directly carry out the calibration test of the resistance of every ageing overage flow distribution plate after the simulation environmental condition is finished, the time is saved greatly, can bear more flow distribution plates simultaneously, the detection efficiency is improved.
Drawings
Fig. 1 is a schematic structural diagram of a device for burn-in testing a resistor according to the present application.
Fig. 2 is a side view of the device for burn-in testing resistance of the present application.
Fig. 3 is a schematic diagram of a back structure of the device for burn-in testing resistance of the present application.
Fig. 4 is a schematic diagram of a partial structure of a device for burn-in testing a resistor according to the present application.
Fig. 5 is an installation structure diagram of the device for burn-in testing resistance of the present application.
Description of main reference numerals:
the device comprises a mounting plate 1, a sub-mounting mechanism 2, a first clamp plate 3, a concave type 4, a clearance hole 5, a first copper bar 6, a first copper bar mounting groove 7, a first jack 8, a second jack 9, a second clamp plate 10, a second copper bar 11, a second copper bar mounting groove 12, a positive electrode power supply connection port 13, a negative electrode power supply connection port 14, a wire groove 15, a pressing device 16, a third clamp plate 17 and a to-be-tested splitter plate 18.
Detailed Description
The following examples are described to aid in the understanding of the present application and are not, nor should they be construed in any way to limit the scope of the present application.
In the following description, those skilled in the art will recognize that components may be described as separate functional units (which may include sub-units) throughout this discussion, but those skilled in the art will recognize that various components or portions thereof may be divided into separate components or may be integrated together (including integration within a single system or component). Meanwhile, the connection between components or systems is not intended to be limited to a direct connection. Rather, data between these components may be modified, reformatted, or otherwise changed by intermediate components. In addition, additional or fewer connections may be used. It should also be noted that the terms "coupled," "connected," or "input" are to be construed as including direct connection, indirect connection or fixation through one or more intermediaries.
In the description of the present application, it should be noted that, directions or positional relationships indicated by terms such as "center", "upper", "lower", "left", "right", "side", "vertical", "horizontal", "inner", "outer", etc., are directions or positional relationships based on those shown in the drawings, or directions or positional relationships as used or conventionally recognized in the product of the application, are merely for convenience of description of the present application and simplification of description, and are not indicative or implying that the apparatus or element to be referred to must have a specific direction, be configured and operated in a specific direction, and thus should not be construed as limiting the present application. Furthermore, the terms "horizontal," "vertical," and the like do not denote a requirement that the component be absolutely horizontal or overhang, but rather may be slightly inclined. As "horizontal" merely means that its direction is more horizontal than "vertical", and does not mean that the structure must be perfectly horizontal, but may be slightly inclined.
As shown in fig. 1 and 2, a device for testing resistance by aging comprises a mounting plate 1, wherein the mounting plate 1 is provided with a plurality of rows of mounting mechanisms of current-dividing plates 18 to be tested, the tail parts and tail parts of the mounting mechanisms of the current-dividing plates 18 to be tested in adjacent rows or the head parts and head parts of the mounting mechanisms of the current-dividing plates 18 to be tested in adjacent rows are connected, so that the mounting mechanisms of the current-dividing plates 18 to be tested in multiple rows form S-shaped serial distribution, each row of mounting mechanisms of the current-dividing plates 18 to be tested consists of sub-mounting mechanisms 2 which are connected end to end, the free ends of a first sub-mounting mechanism 2 and a last sub-mounting mechanism 2 are respectively connected with an external power supply, after the external power supply is electrified, each sub-mounting mechanism 2 is provided with current passing through, two first clamp plates 3 which are symmetrically arranged at intervals are arranged on the adjacent sub-mounting mechanisms 2 in the same row and are used for limiting the two ends of the current-dividing plates 18 to be tested, the free ends of the first sub-mounting mechanism 2 and the last sub-mounting mechanism 2 are respectively provided with a third clamp plate 17, which is used for limiting one end of the to-be-tested splitter plate 18 mounted on the first sub-mounting mechanism 2 and the last sub-mounting mechanism 2, the tail and tail connection parts of the mounting mechanisms of the adjacent rows of to-be-tested splitter plates 18 and the head and head connection parts of the mounting mechanisms of the adjacent rows of to-be-tested splitter plates 18 are respectively provided with a second clamp plate 10, which is used for limiting the tail or head of the to-be-tested splitter plate 18 of the mounting mechanism of the adjacent row of to-be-tested splitter plates 18 after being matched with the first clamp plate 3 of one end of the to-be-tested splitter plate 18 which is correspondingly mounted.
One side of the mounting plate 1 is provided with a positive power supply connection port 13 and a negative power supply connection port 14, the positive power supply connection port 13 is connected with a first copper bar 6 at the first jack 8 through an external power supply line, and the negative power supply connection port 14 is connected with a last first copper bar 6 at the second jack 9 through the external power supply line.
Each diverter plate 18 to be tested is provided with a pressing device 16 for pressing the corresponding diverter plate 18 to be tested, and the pressing device 16 is mounted on the mounting plate 1.
As shown in fig. 5, the contact surfaces of the first clamp plate 3, the second clamp plate 10 and the third clamp plate 17 with the to-be-measured splitter plate 18 are concave 4, and contact angles between two corners of the concave 4 and the to-be-measured splitter plate 18 are provided with clearance holes 5 for protecting four corners of the to-be-measured splitter plate 18.
As shown in fig. 2 and fig. 4, a first copper bar 6 is disposed at the lower portion of each first fixture plate 3, and two ends of the first copper bar 6 are respectively connected to the to-be-tested current distribution plates 18 adjacent to two ends of the first copper bar, so that the first copper bar 6 and the to-be-tested current distribution plates 18 in the same row are connected in series and conducted.
The lower part of each second fixture plate 10 is provided with a second copper bar 11, and both ends of the second copper bar 11 are respectively connected with the tail part and the tail part of the to-be-tested current-distributing plate 18 of the adjacent row or the head part and the head part of the to-be-tested current-distributing plate 18 of the adjacent row, so that the second copper bar 11 of the adjacent row and the to-be-tested current-distributing plate 18 are connected in series and conducted.
The lower part of each first copper bar 6 is provided with a first copper bar mounting groove 7 for mounting a limiting first copper bar 6, the lower part of each second copper bar 11 is provided with a second copper bar mounting groove 12 for mounting a limiting second copper bar 11, one end of the first copper bar mounting groove 7, which is far away from the adjacent first copper bar mounting groove 7, is provided with a first jack 8, one end of the last first copper bar mounting groove 7, which is far away from the adjacent first copper bar mounting groove 7, is provided with a second jack 9, one part of the first copper bar 6 is arranged on the first copper bar mounting groove 7 and is clamped with the first copper bar mounting groove 7, the other part passes through the first jack 8 to be arranged at the lower part of the lower mounting plate 1 and is connected with an external power line, one part of the last first copper bar 6 is arranged on the last first copper bar mounting groove 7 and is clamped with the last first copper bar mounting groove 7, the other part passes through the second jack 9 to be arranged at the lower part of the lower mounting plate 1 and is connected with the external power line, so that all the current distribution plates 18 to be tested are connected in series for supplying current to the current distribution plates 18 to be tested.
As shown in fig. 3, the back of the mounting board 1 is provided with a plurality of wire grooves 15 for external power wires, which are used for placing the external power wires in the wire grooves 15 and have the functions of arranging and protecting the external power wires.
The utility model has the beneficial effects that: the utility model provides a device of ageing test resistance, including mounting panel 1, be equipped with the installation mechanism of multirow flow distribution plate 18 that awaits measuring on the mounting panel 1, the afterbody and the afterbody of the installation mechanism of adjacent row flow distribution plate 18 that awaits measuring are connected or the head and the head of the installation mechanism of adjacent row flow distribution plate 18 that awaits measuring are connected for the installation mechanism of multirow flow distribution plate 18 that awaits measuring forms the S type and concatenates and distribute, the design of S type can save space and hold more sub-installation mechanism 2, through the simulation of ageing environment is carried out in the thermostated container that sets for with ageing test resistance' S device placed in to sub-installation mechanism 2 simultaneously, can directly carry out the calibration test of the resistance of every ageing overage flow distribution plate after the simulation environmental condition is finished, the time is saved greatly, can bear more flow distribution plates simultaneously, the detection efficiency is improved.
While various aspects and embodiments have been disclosed, other aspects and embodiments will be apparent to those skilled in the art, and many changes and modifications can be made without departing from the spirit of the application, which is intended to be within the scope of the utility model. The various aspects and embodiments disclosed herein are for illustration only and are not intended to limit the application, the actual scope of which is subject to the claims.
Claims (10)
1. The utility model provides a device of ageing test resistance, includes mounting panel (1), be equipped with the installation mechanism of multirow flow distribution plate (18) that awaits measuring on mounting panel (1), its characterized in that: the tail parts of the mounting mechanisms of the adjacent rows of to-be-tested current distribution plates (18) are connected with the tail parts or the head parts of the mounting mechanisms of the adjacent rows of to-be-tested current distribution plates (18) are connected with the head parts of the mounting mechanisms of the adjacent rows of to-be-tested current distribution plates (18) so that the mounting mechanisms of the rows of to-be-tested current distribution plates (18) form S-shaped series connection distribution, each row of to-be-tested current distribution plates (18) consists of sub-mounting mechanisms (2) connected end to end, the free ends of the first sub-mounting mechanism (2) and the last sub-mounting mechanism (2) are respectively connected with an external power supply, and after the external power supply is electrified, each sub-mounting mechanism (2) has current to pass.
2. A device for testing electrical resistance according to claim 1, wherein two first clamping plates (3) are arranged on adjacent sub-mounting mechanisms (2) in the same row at intervals and are used for limiting two ends of a to-be-tested splitter plate (18) mounted on the first clamping plates.
3. The device for testing resistance according to claim 1, wherein the second clamping plates (10) are respectively arranged at the tail and tail connection parts of the mounting mechanisms of the adjacent-row to-be-tested splitter plates (18) and at the head and head connection parts of the mounting mechanisms of the adjacent-row to-be-tested splitter plates (18), and are used for limiting the tail or head of the to-be-tested splitter plate (18) of the mounting mechanism of the adjacent-row to-be-tested splitter plate (18) after being matched with the first clamping plates (3) at one end of the to-be-tested splitter plate (18) correspondingly mounted.
4. The device for testing the resistor through ageing according to claim 1, wherein the contact surfaces of the first clamp plate (3), the second clamp plate (10) and the third clamp plate (17) and the to-be-tested current dividing plate (18) are concave shapes (4), and the contact angles of two corners of the concave shapes (4) and the to-be-tested current dividing plate (18) are provided with avoidance holes (5) for protecting four corners of the to-be-tested current dividing plate (18).
5. The device for testing the resistor through aging according to claim 1, wherein a first copper bar (6) is arranged at the lower part of each first clamp plate (3), and two ends of each first copper bar (6) are respectively connected with the to-be-tested current-dividing plates (18) adjacent to two ends of each first copper bar, so that the first copper bars (6) of the same row are connected in series with the to-be-tested current-dividing plates (18).
6. The device for testing the resistor for aging according to claim 1, wherein a second copper bar (11) is arranged at the lower part of each second clamp plate (10), and two ends of each second copper bar (11) are respectively connected with the tail part and the tail part of the to-be-tested current-dividing plate (18) of the adjacent row or the head part and the head part of the to-be-tested current-dividing plate (18) of the adjacent row, so that the second copper bars (11) of the adjacent row are connected in series with the to-be-tested current-dividing plate (18).
7. The device for testing the resistor through aging according to claim 1, wherein the lower part of each first copper bar (6) is provided with a first copper bar mounting groove (7) for mounting a limiting first copper bar (6), and the lower part of each second copper bar (11) is provided with a second copper bar mounting groove (12) for mounting a limiting second copper bar (11).
8. The device for testing the resistor for aging according to claim 7, wherein one end of the first copper bar mounting groove (7) far away from the adjacent first copper bar mounting groove (7) is provided with a first jack (8), one end of the last first copper bar mounting groove (7) far away from the adjacent first copper bar mounting groove (7) is provided with a second jack (9), one part of the first copper bar (6) is arranged on the first copper bar mounting groove (7) and is clamped with the first copper bar mounting groove (7), the other part of the first copper bar (6) passes through the first jack (8) to be arranged on the lower part of the lower mounting plate (1) and is connected with an external power line, one part of the last first copper bar (6) is arranged on the last first copper bar mounting groove (7) and is clamped with the last first copper bar mounting groove (7), and the other part of the first copper bar mounting groove (7) passes through the second jack (9) to be arranged on the lower part of the lower mounting plate (1) and is connected with the external power line, so that all current-dividing plates (18) to be tested are connected in series.
9. The device for testing the resistor for aging according to claim 1, wherein one side of the mounting plate (1) is provided with a positive power supply connection port (13) and a negative power supply connection port (14), the positive power supply connection port (13) is connected with a first copper bar (6) at the first jack (8) through an external power supply line, and the negative power supply connection port (14) is connected with a last first copper bar (6) at the second jack (9) through the external power supply line.
10. The device for testing resistance according to claim 1, wherein the back of the mounting plate (1) is provided with a plurality of wire grooves (15) for external power wires, and the wire grooves (15) are used for placing the external power wires therein, so that the external power wires are arranged and protected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321775566.2U CN220552919U (en) | 2023-07-07 | 2023-07-07 | Device for aging test of resistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321775566.2U CN220552919U (en) | 2023-07-07 | 2023-07-07 | Device for aging test of resistor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220552919U true CN220552919U (en) | 2024-03-01 |
Family
ID=90007913
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321775566.2U Active CN220552919U (en) | 2023-07-07 | 2023-07-07 | Device for aging test of resistor |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220552919U (en) |
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2023
- 2023-07-07 CN CN202321775566.2U patent/CN220552919U/en active Active
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