CN115201339A - Detection device, turnout rail bottom flaw detection equipment and method - Google Patents
Detection device, turnout rail bottom flaw detection equipment and method Download PDFInfo
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- CN115201339A CN115201339A CN202211134004.XA CN202211134004A CN115201339A CN 115201339 A CN115201339 A CN 115201339A CN 202211134004 A CN202211134004 A CN 202211134004A CN 115201339 A CN115201339 A CN 115201339A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
- G01N29/4427—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
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- B61K9/08—Measuring installations for surveying permanent way
- B61K9/10—Measuring installations for surveying permanent way for detecting cracks in rails or welds thereof
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Abstract
The invention provides a detection device, turnout rail bottom flaw detection equipment and a method, wherein the detection device comprises a fixed seat, a piezoelectric wafer and a magnetic suction block, the piezoelectric wafer is arranged on the fixed seat, and the piezoelectric wafer and a horizontal plane form a preset included angle and is used for being connected with an ultrasonic device; the magnetic block is arranged at the bottom of the fixed seat and used for magnetically attracting the bottom of the turnout rail. The turnout rail bottom flaw detection equipment comprises the detection device, an ultrasonic device and a controller, wherein the ultrasonic device is connected with the piezoelectric wafer and is used for generating and collecting ultrasonic guided wave signals; the controller is connected with the ultrasonic device and is provided with a display for displaying the detection oscillogram. The detection device, the turnout rail bottom flaw detection equipment and the method provided by the invention can realize the detection of the damage condition of the rail in complex areas such as the turnout switch rail bottom, are beneficial to timely replacement and avoid the occurrence of accidents.
Description
Technical Field
The invention belongs to the technical field of railway tracks, and particularly relates to a detection device, turnout rail bottom flaw detection equipment and a method.
Background
The railway switch tongue (including long point rail) plays an important role in guiding the locomotive to change the line, and is one of the key points influencing the safety of the engineering equipment. When the wheels are transited from the stock rail to the switch rail, the train changes the running direction suddenly, so that huge vertical and transverse impact force is generated on the switch rail and the point rail, the switch rail and the point rail are always in an ultra-strong load state, and the switch rail and the point rail become one of the weakest parts and the most problematic parts on a railway line due to the characteristics.
At present, with the rapid development of railway industry in China, the running speed and the transportation quantity of trains are continuously improved, so that the rail bottom damage of switch rails has the tendency of continuously increasing and accelerating, the threat to the railway transportation safety is formed, and how to discover the rail bottom damage of the switch rails as early as possible and ensure the road transportation safety is a new challenge faced by railway workers.
At present, the detection method for the damage of the serving steel rail at home and abroad comprises two methods of manual detection and instrument detection, wherein the manual detection usually utilizes measuring tools such as a gauging rule, a straight ruler and the like, the detection efficiency is low, the influence of human factors is large, and missed detection and erroneous judgment are easy to occur; the instrument detection comprises a hand-push type flaw detection trolley, a large steel rail flaw detection vehicle, a rail circuit detection method, eddy current detection, mechanical vision detection, a steel rail stress detection method, ray detection, magnetic flux leakage detection and the like. Although the detection technology is various, the detection technology is only suitable for detecting the stock rail damage, the parts with complex structures like turnouts are provided with detection blind areas about 3m inward from the thin ends of switch rails, and an effective and convenient detection method is not available at present.
Disclosure of Invention
The embodiment of the invention provides a detection device, turnout rail bottom flaw detection equipment and a method, and aims to solve the technical problem that the conventional turnout rail bottom is inconvenient to detect.
In a first aspect, an embodiment of the present invention further provides a turnout rail bottom flaw detection method, including:
s10: establishing a database of damage waveform diagrams, wherein the database comprises waveform diagrams corresponding to the defect states 1-n, and the defect degrees of the defect states 1-n are sequentially increased;
s20: fixing the detection device at the bottom of the turnout rail and at a distance d from the point end of the switch rail 1 ；
S30: starting an ultrasonic device, wherein the ultrasonic device transmits ultrasonic guided wave signals to a piezoelectric wafer on the detection device, and the piezoelectric wafer transmits the ultrasonic guided wave signals back and forth along the extension direction of the rail bottom of the switch rail to form a current detection oscillogram;
s40: and comparing the currently detected oscillogram with the database, and selecting the oscillogram which is closest to the currently detected oscillogram in the database to determine the current defect state.
Compared with the prior art, the scheme shown in the embodiment of the application has the advantages that in the actual detection process, the detection device is fixed to the bottom of the switch rail, different positions of the detection device on the bottom of the switch rail are fixed, the detection device is connected with the ultrasonic device to transmit and receive ultrasonic guided wave signals, the ultrasonic guided wave signals are transmitted and returned in the extending direction of the bottom of the switch rail, a flaw detection oscillogram of the measured bottom of the switch rail is formed on the ultrasonic device, the damage condition of the bottom of the switch rail is determined according to the oscillogram, if the damage condition reaches the specified degree, the switch rail needs to be replaced, and accidents are prevented. The scheme shown in the embodiment of the application can realize the detection of the damage condition of the track in complex areas such as the bottom of the switch tongue rail and the like, is favorable for timely replacement, and avoids accidents.
With reference to the first aspect, in a possible implementation manner, the step S10 includes:
s11: marking a plurality of point positions on the first track along the extending direction of the first track, wherein the distance d between every two adjacent point positions 2 ；
S12: sequentially placing the detection device on each point location to obtain a oscillogram corresponding to each point location on the first track;
s13: on the second track at a distance d from the tip 3 A first transverse hole is arranged at the position of (A), and the diameter of the first transverse hole is phi 10 Depth h of 1 ；
S14: on the second track at a distance d from the first transverse hole 2 、2d 2 、3d 2 、……、nd 2 The positions of the first transverse holes and the second transverse holes are respectively detected by the detection device, and oscillograms with different distances from the first transverse holes on the second track are obtained;
s15: carrying out multiple reaming treatments on the first transverse hole to obtain the diameter phi in sequence 20 、φ 30 、φ 40 、……、φ n0 Is enlarged by a diameter of 10 、φ 20 、φ 30 、φ 40 、……、φ n0 After each reaming treatment, the step S14 is repeated once to obtain diameters phi respectively 10 、φ 20 、φ 30 、φ 40 、……、φ n0 The holes of the display are respectively corresponding to the oscillogram groups;
s16: comparing all the oscillograms obtained in the step S12, the step S14 and the step S15, calculating a variation relation of wave crests under different distances and different apertures, and completing the establishment of the damage oscillogram database.
In some embodiments, the step S16 is followed by:
s17: at a distance d from the first transverse hole 3 A second transverse hole is arranged at the position of (2), and the diameter of the second transverse hole is phi 11 Depth h of 2 ；
S18: one side of the second track departing from the first transverse hole is respectively away from the second transverse hole by d 2 、2d 2 、3d 2 、……、nd 2 The positions of the first transverse holes and the second transverse holes are respectively detected by the detection device, and oscillograms with different distances from the second transverse holes on the second track are obtained;
s19: carrying out multiple reaming treatments on the second transverse hole to obtain the diameter phi in sequence 21 、φ 31 、φ 41 、……、φ n1 Is enlarged by a diameter of 11 、φ 21 、φ 31 、φ 41 、……、φ n1 After each hole expanding treatment, the step S17 is circulated once to obtain the diameter phi 11 、φ 21 、φ 31 、φ 41 、……、φ n1 The holes of the display are respectively corresponding to the oscillogram groups;
s110: and comparing the oscillogram obtained in the step S15 with the oscillogram obtained in the step S19, and calculating the change relation of the wave peak again.
In some embodiments, the second transverse holes are sequentially provided with a side opposite to the first transverse holes, and the side is provided with a diameter phi 12 、φ 13 、……、φ 1n Each time the hole is opened, the steps S17 to S110 are correspondingly repeated, wherein phi is 10 、φ 11 、φ 12 、φ 13 、……、φ 1n Is equal to said phi n0 、φ n1 、φ n2 、φ n3 、……、φ nn Increasing in arithmetic progression.
In a second aspect, an embodiment of the present invention provides a detection apparatus for implementing steps S20 and S30 in the switch rail foot flaw detection method, including:
a fixed seat;
the piezoelectric wafer is arranged on the fixed seat, and the piezoelectric wafer and the horizontal plane form a preset included angle and is used for being connected with an ultrasonic device; and
the magnetic block is arranged at the bottom of the fixed seat and used for magnetically attracting the bottom of the turnout rail.
With reference to the second aspect, in a possible implementation manner, the magnetic blocks are multiple, and the multiple magnetic blocks are uniformly distributed at the bottom of the fixing base.
With reference to the second aspect, in a possible implementation manner, the detection apparatus further includes a rail thermometer disposed at the bottom of the fixing base, and a detection end of the rail thermometer is parallel and level to and exposed at the bottom surface of the fixing base.
In a third aspect, an embodiment of the present invention further provides a switch rail bottom flaw detection device, which is used for implementing the switch rail bottom flaw detection method, and includes:
the above-mentioned detection device;
the ultrasonic device is connected with the piezoelectric wafer and is used for generating and collecting ultrasonic guided wave signals; and
and the controller is connected with the ultrasonic device and is provided with a display for displaying the detection oscillogram.
With reference to the third aspect, in one possible implementation manner, the ultrasound apparatus includes a signal generator, a power amplifier, and an oscilloscope that are integrated with each other.
With reference to the third aspect, in a possible implementation manner, the detecting device is provided in plural, and the plural detecting devices are arranged at intervals along the extending direction of the tongue rail bottom and are respectively connected with the ultrasonic device.
Drawings
Fig. 1 is a schematic perspective view of a detection apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic perspective view of a railroad switch rail bottom flaw detection device provided by an embodiment of the present invention;
FIG. 3 is a schematic diagram of a railroad switch rail bottom flaw detection device provided by the embodiment of the invention.
Description of reference numerals:
10-a fixed seat;
20-a piezoelectric wafer;
30-magnetic block;
40-temperature sheet;
50-an ultrasonic device; 51-a signal generator; 52-a power amplifier; 53-oscilloscope;
60-a controller; 61-display.
Detailed Description
In order to make the technical problems, technical solutions and advantageous effects to be solved by the present invention more clearly apparent, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The method for detecting flaws at the bottom of a switch rail provided by the invention will now be explained. A switch rail bottom flaw detection method is implemented by the switch rail bottom flaw detection equipment, and comprises the following steps:
s10: establishing a damage waveform database, wherein the database comprises waveform diagrams corresponding to the defect states 1-n, and the defect degrees of the defect states 1-n are sequentially increased;
s20: fixing the detecting device at the bottom of the turnout rail and at a distance d from the point of the switch rail 1 ；
S30: starting the ultrasonic device 50, wherein the ultrasonic device 50 transmits ultrasonic guided wave signals to the piezoelectric wafer 20 on the detection device, and the piezoelectric wafer 20 transmits the ultrasonic guided wave signals back and forth along the extension direction of the rail bottom of the switch rail to form a current detection oscillogram;
s40: and comparing the currently detected oscillogram with the database, and selecting the oscillogram which is closest to the currently detected oscillogram in the database to determine the current defect state.
Compared with the prior art, in the actual detection process, the turnout rail bottom flaw detection method provided by the embodiment has the advantages that the turnout rail bottom flaw detection equipment is used for directly detecting, the current detected rail state forms a current detected oscillogram, each oscillogram in the database is obtained through the defect of the preset size detected at the preset distance through comparison with the oscillogram in the database, comparison of the oscillograms is directly carried out, and the defect state of the current detected rail is conveniently and directly confirmed in the database through comparison. The detection process of the turnout rail bottom flaw detection method is convenient for the detection process, the turnout rail bottom flaw detection equipment is used for directly detecting the turnout rail bottom flaw, and the detected turnout rail bottom flaw detection equipment is compared in the database of the controller 60 to obtain the defect degree of the rail, the detection efficiency is high, the time consumption is short, the labor intensity is reduced, and when the defect degree exceeds the standard, the rail can be replaced in time, so that the occurrence of accidents is reduced.
In some embodiments, the step S10 includes:
s11: marking a plurality of point positions on the first track along the extending direction of the first track, wherein the distance d between every two adjacent point positions 2 ；
S12: sequentially placing the detected device on each point location to obtain a oscillogram corresponding to each point location on the first track;
s13: on the second track at a distance d from the tip 3 A first transverse hole is arranged at the position of (A), and the diameter of the first transverse hole is phi 10 Deep, deepDegree h 1 ；
S14: on the second track at a distance d from the first transverse hole 2 、2d 2 、3d 2 、……、nd 2 The positions of the first and second tracks are respectively detected by a detection device to obtain oscillograms with different distances from the first transverse hole on the second track;
s15: carrying out multiple reaming treatments on the first transverse hole to obtain the diameter phi in sequence 20 、φ 30 、φ 40 、……、φ n0 Hole enlargement of (phi) 10 、φ 20 、φ 30 、φ 40 、……、φ n0 After each hole-enlarging process, the step S14 is repeated once to obtain the diameter phi 10 、φ 20 、φ 30 、φ 40 、……、φ n0 The holes of the display are respectively corresponding to the oscillogram groups;
s16: and comparing all the oscillograms obtained in the steps S12, S14 and S15, calculating a variation relation of wave crests under different distances and different apertures, and finishing establishing a damage oscillogram database.
The first rail is not subjected to etching damage treatment and is a nondestructive turnout; the second track is subjected to a damage test of the first transverse hole, and a plurality of oscillograms for detecting the first transverse hole at different distances are obtained; by reaming the first transverse hole, different apertures (different apertures, same depth, all h) are obtained 1 ) And correspondingly, obtaining the waveform diagram during detection of different distances, thereby obtaining the variation trend of the wave crest under the condition that one damage exists on the second track through multiple calculations, and obtaining a damage waveform diagram database. During actual detection, the obtained current detection oscillogram is compared with the oscillograms in the database to find the closest oscillogram, so that the aperture and the depth corresponding to the oscillogram and the distance between the current detection oscillogram and the hole during detection can be determined, and the size and the position of the current detection damage can be further determined.
In some embodiments, the step S16 further includes:
s17: at a distance d from the first transverse hole 3 A second transverse hole is arranged at the position of the first transverse hole, and the diameter of the second transverse hole is phi 11 Depth h of 2 ；
S18: on the second rail, a side departing from the first transverse hole and respectively separated from the second transverse hole by d 2 、2d 2 、3d 2 、……、nd 2 The positions of the first and second transverse holes are respectively detected by a detection device to obtain oscillograms with different distances from the second transverse hole on the second track;
s19: carrying out multiple reaming treatments on the second transverse hole to obtain the diameter phi in sequence 21 、φ 31 、φ 41 、……、φ n1 Hole enlargement of (phi) 11 、φ 21 、φ 31 、φ 41 、……、φ n1 After each hole-enlarging process, the step S18 is repeated once to obtain the diameter phi 11 、φ 21 、φ 31 、φ 41 、……、φ n1 The holes of the display are respectively corresponding to the oscillogram groups;
s110: and (5) comparing the oscillogram obtained in the step (S15) with the oscillogram obtained in the step (S19), and calculating the change relational expression of the wave crest again.
And comparing the peak change relational expression with the change relational expression obtained in the step S15, greatly calculating to reduce errors, and further obtaining the closest change relational expression, so that the waveform of the oscillogram obtained by detection is brought into the relational expression to obtain corresponding detection defect information in the actual detection.
In some embodiments, the side of the second transverse hole opposite to the first transverse hole is provided with a hole with diameter phi in sequence 12 、φ 13 、……、φ 1n Each time the hole is opened, repeating S17-S110 steps, phi 10 、φ 11 、φ 12 、φ 13 、……、φ 1n Is equal to phi n0 、φ n1 、φ n2 、φ n3 、……、φ nn Increase in arithmetic progression.
It should be noted that, when the first transverse hole, the second transverse hole, the … … and the nth transverse hole are formed, the corresponding dimension of each transverse hole is (phi) 10 ，h 1 ）、（φ 11 ，h 2 ）、（φ 12 ，h 3 ）……（φ 13 ，h 4 ) Wherein phi is known 10 、φ 11 、φ 12 、φ 13 、……、φ 1n Equal, h 1 、h 2 、……h n May be the same or different.
Based on the same inventive concept, the embodiment of the application further provides a detection device, which is used for implementing the step S20 and the step S30 in the turnout rail bottom flaw detection method. Referring to fig. 1, the detecting device includes a fixing base 10, a piezoelectric wafer 20 and a magnetic attraction block 30, the piezoelectric wafer 20 is disposed on the fixing base 10, and the piezoelectric wafer 20 and the horizontal plane form a preset included angle and is used for connecting with an ultrasonic device 50; the magnetic block 30 is disposed at the bottom of the fixing base 10 for magnetically attracting the bottom of the turnout rail.
It should be noted that the fixing base 10 is an organic glass member, and can be used as a medium for ultrasonic guided-wave signal transmission, so that the ultrasonic guided-wave signal emitted by the piezoelectric wafer 20 can be conveniently injected into the rail bottom of the switch rail.
The detection device that this embodiment provided, compared with the prior art, in the actual testing process, fix detection device on the switch rail bottom, the mode of magnetism absorption through magnetism piece 30 is convenient fixed and take, detection device is fixed and is connected transmission and receipt supersound guided wave signal with ultrasonic device 50 in the different positions on the switch rail bottom, through supersound guided wave signal conveying and return on the extending direction of switch rail bottom, form the wave form picture of detecting a flaw at the switch rail bottom of measuring on ultrasonic device 50, and then confirm the damage condition at the switch rail bottom according to the wave form picture, reach the regulation degree if the damage condition, then need change the switch rail, prevent the occurence of failure. The detection device is convenient to fix on the switch rail bottom, simple in structure and convenient to take, can detect the damage condition of the rail in complex areas such as the switch rail bottom and the like, is beneficial to timely replacement, and avoids accidents.
In some embodiments, a modified embodiment of the magnet block 30 can be configured as shown in FIG. 1. Referring to fig. 1, a plurality of magnetic blocks 30 are provided, and the plurality of magnetic blocks 30 are uniformly distributed at the bottom of the fixing base 10. Through setting up a plurality of magnetism pieces 30 of inhaling to and inhale piece 30 and carry out reasonable overall arrangement in the bottom of fixing base 10, improve the fixed stability of fixing base 10, guarantee piezoelectric wafer 20 measurement process's accuracy.
In some embodiments, a modified embodiment of the detection device described above may be configured as shown in fig. 1. Referring to fig. 1, the detection device further includes a rail thermal sheet 40 disposed at the bottom of the fixing base 10, and a detection end of the rail thermal sheet 40 is exposed on the bottom surface of the fixing base 10. Through setting up rail temperature piece 40, conveniently detect orbital temperature in the in-process real-time detection that detects, through the detection to the track temperature, make things convenient for the influence of analysis temperature to supersound guided wave signal transmission rate, and then confirm suitable detection temperature.
Based on the same inventive concept, referring to fig. 2 to 3, the embodiment of the present application further provides a switch rail bottom flaw detection apparatus, which is used for implementing the switch rail bottom flaw detection method, and includes the detection device, the ultrasonic device 50 and the controller 60, where the ultrasonic device 50 is connected with the piezoelectric wafer 20 and is used for generating and collecting ultrasonic guided wave signals; the controller 60 is connected to the ultrasonic apparatus 50, and the controller 60 has a display 61 for displaying a detected waveform pattern.
It should be noted that the waveform shown on the display 61 is divided into a time domain waveform and a frequency domain waveform; the controller 60 displays the oscillogram mainly by the internal guided wave detection and analysis software; the switch rail bottom is the tongue rail bottom described below.
The switch rail foot equipment of detecting a flaw that this embodiment provided, compared with the prior art, in the actual testing process, fix detection device on the switch rail foot, the mode of magnetism through magnetism piece 30 is inhaled is convenient fixed and is taken, detection device is fixed and be connected transmission and receipt supersound guided wave signal with ultrasonic device 50 in the different positions on the switch rail foot, through supersound guided wave signal conveying and pass back in the extending direction at the switch rail foot, transmit to the controller 60 in show measured oscillogram, and then confirm the damage condition at the switch rail foot according to the oscillogram, reach the regulation degree if the damage condition, then need change the switch rail, prevent the occurence of failure. The turnout rail bottom flaw detection equipment is convenient to fix on the switch rail bottom, simple in structure and convenient to take, can detect the damage condition of the rail in complex areas such as the turnout switch rail bottom, is beneficial to timely replacement, and avoids accidents.
In some embodiments, the ultrasound device 50 may be configured as shown in FIG. 3. Referring to fig. 3, the ultrasonic apparatus 50 includes a signal generator 51, a power amplifier 52, and an oscilloscope 53, which are integrated with each other. Normal ultrasonic guided wave signal transmission and receiving processes can be realized through the signal generator 51, the power amplifier 52 and the oscilloscope 53, and the release power of the ultrasonic guided wave signal can be ensured through the power amplifier 52 so as to ensure that the defect is successfully detected; the oscilloscope 53 converts the detected ultrasonic guided wave signals into a oscillogram, and transmits the oscillogram to the display 61 for convenient observation.
In some embodiments, a modified embodiment of the switch rail bottom flaw detection device may be configured as described below, and a plurality of detection devices are provided, and are arranged at intervals along the extending direction of the switch rail bottom and are respectively connected with the ultrasonic device 50. By arranging a plurality of detection devices, relevant parameters (such as a receiving and transmitting mode) in the ultrasonic device connected with each detection device are set, and each detection device is further set to realize self-sending and self-receiving without mutual influence; certainly also can realize that one of them detection device is responsible for sending supersound guided wave signal, and other detection device are responsible for receiving supersound guided wave signal, and then realize the switching of single channel and multichannel detection when the in-service use, help adapting to different detection demands.
It should be noted that when one detection device is provided, the detection device is self-generating and self-receiving, i.e. single-channel detection.
As a specific implementation manner of this embodiment, the steps are as follows:
the turnout to be measured is No. 18 turnout, and the extension length is 21450mm;
(1) Marking a mark every 1m from a rail point (namely a switch rail point) on the bottom surface of the upper rail of the first rail, marking 21 point locations, sequentially placing a detection device on the 20 point locations, sequentially measuring on each point location, observing and recording a time domain waveform diagram and a frequency domain waveform diagram on a display 61;
(2) Arranging a first transverse hole with the diameter of 1.8mm and the depth of 3mm at the position 1m from the rail point on the bottom surface of the upper rail of the second rail, measuring a point position at the position 1m away from the first transverse hole, measuring 20 point positions in total, and observing and recording a time domain waveform diagram and a frequency domain waveform diagram displayed on a display 61;
(3) And (3) comparing the recording result obtained in the step (2) with the recording result obtained in the step (1), observing the change of the peak values on the wave packet of the oscillogram under the condition of no defect and the defect, comprehensively analyzing the conditions of the measured 20 point positions, and calculating the error between the actual damage condition (size and position) and the theoretical value of the rail bottom of the switch rail.
(4) Changing the aperture of the first transverse hole into phi 2mm, phi 2.2mm, phi 2.4mm, phi 2.6mm, phi 2.8mm and phi 3mm in sequence through hole expansion, and repeating the steps (2) to (3) once after hole expansion;
(5) And (4) comparing the comprehensive analysis conditions in the step (3) and the step (4), fitting a change relation between wave packet peak values, preliminarily estimating the size and the position of the damage, and comparing the size and the position of the damage with the size and the position of the actual damage and carrying out error analysis.
(6) Randomly taking several point positions at the rail bottom of the second rail for detection by using the change relational expression obtained in the step (5), calculating to obtain the size and the position of the damage, and judging the evaluation accuracy of the damage positioning and size by using the comparative analysis with an actual value;
(7) Arranging a second transverse hole with the diameter of 1.8mm and the depth of 3mm at the rail bottom 3m away from the point of the switch rail on the second rail, measuring a point location every 1m away from the second transverse hole, measuring 18 point locations in total, observing the change conditions of a time domain waveform diagram and a frequency domain waveform diagram displayed on the display 61, and recording;
(8) And (4) comparing the recorded result in the step (7) with the recorded result in the experimental database in the steps (1) to (6), observing the peak value change of a single defect and two defect waveform wave packets, comprehensively analyzing the measured 18-point position condition, and calculating the error between the actual damage condition (size and position) and the theoretical value of the curved switch rail base.
(9) Changing the hole diameters of the second transverse holes into phi 2mm, phi 2.2mm, phi 2.4mm, phi 2.6mm, phi 2.8mm, phi 3mm and phi 3.2mm in sequence through hole expansion, and repeating the steps (7) to (8) after hole expansion once.
(10) And arranging a third transverse hole with the diameter of 1.8mm and the depth of 3mm at the rail bottom of the second rail 7m away from the point of the switch rail, measuring a point location every 1m away from the third transverse hole, measuring 14 point locations in total, observing the change conditions of the time domain oscillogram and the frequency domain oscillogram displayed on the display 61, and recording.
(11) And (3) comparing the recorded result of the step (10) with the recorded result in the experimental database of the steps (1) to (10), observing the peak value change of waveform wave packets of a single defect and three defects, comprehensively analyzing the measured 14 point position conditions, and calculating the error between the actual damage condition (size and position) and the theoretical value of the rail bottom of the curved switch rail.
(12) Changing the aperture of the third transverse hole into phi 2mm, phi 2.2mm, phi 2.4mm, phi 2.6mm, phi 2.8mm, phi 3mm, phi 3.2mm and phi 3.4mm in sequence through hole expansion, and repeating the steps (10) to (11) after hole expansion once.
(13) And arranging a fourth transverse hole with the diameter of 1.8mm and the depth of 3mm at the rail bottom of the second rail at a position 13m away from the point of the switch rail, measuring a point location every other 1m away from the fourth transverse hole, measuring 8 point locations in total, observing the change conditions of the time domain oscillogram and the frequency domain oscillogram displayed on the display 61, and recording.
(14) And (4) comparing the recording result of the step (S13) with the recording results in the experimental database of the steps (1) to (13), observing the peak value change of waveform wave packets of a single defect and four defects, comprehensively analyzing the measured 8-point position condition, and calculating the error between the actual damage condition (size and position) and the theoretical value of the rail bottom of the curved switch rail.
(15) Changing the aperture of the fourth transverse hole into phi 2mm, phi 2.2mm, phi 2.4mm, phi 2.6mm, phi 2.8mm, phi 3mm, phi 3.2mm, phi 3.4mm and phi 3.6mm in sequence through hole expansion, and repeating the steps (13) to (14) after hole expansion once.
(16) Integrating the experimental results of (1) - (15) to form a final arithmetic expression.
It should be noted that, calculating the error between the actual damage condition (size and position) and the theoretical value actually is: carrying out actual measurement according to the wave packet peak value relational expression obtained by calculation, substituting the wave packet peak value obtained by actual measurement into the relational expression, and calculating the theoretical damage condition (size and position); and then, carrying out actual measurement on the site to obtain the actual damage condition (size and position), and comparing the theoretical damage condition with the actual damage condition to obtain an error.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. A switch rail bottom flaw detection method is characterized by comprising the following steps:
s10: establishing a damage waveform graph database, wherein the database comprises waveform graphs corresponding to the defect states 1-n, and the defect degrees of the defect states 1-n are sequentially increased;
s20: fixing the detecting device at the bottom of the turnout rail and at a distance d from the point of the switch rail 1 ；
S30: starting an ultrasonic device, wherein the ultrasonic device transmits ultrasonic guided wave signals to a piezoelectric wafer on the detection device, and the piezoelectric wafer transmits the ultrasonic guided wave signals back and forth along the extension direction of the rail bottom of the switch rail to form a current detection oscillogram;
s40: and comparing the currently detected oscillogram with the database, and selecting the oscillogram closest to the currently detected oscillogram in the database to determine the current defect state.
2. The turnout rail base flaw detection method of claim 1, wherein the step S10 comprises:
s11: marking a plurality of point positions on the first track along the extending direction of the first track, wherein the distance d is between every two adjacent point positions 2 ；
S12: sequentially placing the detection device on each point location to obtain a oscillogram corresponding to each point location on the first track;
s13: on the second track at a distance d from the tip 3 A first transverse hole is arranged at the position of (A), and the diameter of the first transverse hole is phi 10 Depth h of 1 ；
S14: on the second track at a distance d from the first transverse hole 2 、2d 2 、3d 2 、……、nd 2 The positions of the first transverse holes and the second transverse holes are respectively detected by the detection device, and oscillograms with different distances from the first transverse holes on the second track are obtained;
s15: carrying out multiple reaming treatments on the first transverse hole to obtain the diameter phi in sequence 20 、φ 30 、φ 40 、……、φ n0 Is enlarged by a diameter of 10 、φ 20 、φ 30 、φ 40 、……、φ n0 After each hole-expanding treatment, the step S14 is circulated once to obtain the diameter phi 10 、φ 20 、φ 30 、φ 40 、……、φ n0 The holes of the display are respectively corresponding to the oscillogram groups;
s16: and comparing all the oscillograms obtained in the step S12, the step S14 and the step S15, calculating a variation relation of wave crests under different distances and different apertures, and completing the establishment of the damage oscillogram database.
3. The turnout rail base flaw detection method according to claim 2, further comprising, after the step S16:
s17: at a distance d from the first transverse hole 3 A second transverse hole is arranged at the position of (2), and the diameter of the second transverse hole is phi 11 Depth h of 2 ；
S18: one side of the second track departing from the first transverse hole is respectively away from the second transverse hole by d 2 、2d 2 、3d 2 、……、nd 2 The positions of the first transverse holes and the second transverse holes are respectively detected by the detection device, and oscillograms with different distances from the second transverse holes on the second track are obtained;
s19: carrying out multiple reaming treatments on the second transverse hole to obtain the diameter phi in sequence 21 、φ 31 、φ 41 、……、φ n1 Hole enlargement of (phi) 11 、φ 21 、φ 31 、φ 41 、……、φ n1 After each reaming process, the step S18 is repeated once to obtain the diameter phi 11 、φ 21 、φ 31 、φ 41 、……、φ n1 The holes of the display are respectively corresponding to the oscillogram groups;
s110: and comparing the oscillogram obtained in the step S15 with the oscillogram obtained in the step S19, and calculating the change relation of the wave peak again.
4. The method for detecting the flaw of the bottom of the turnout rail as claimed in claim 3, wherein the second cross hole is provided with a diameter phi on the side opposite to the first cross hole in sequence 12 、φ 13 、……、φ 1n The steps S17 to S110 are correspondingly repeated every time the hole is opened;
phi is 10 、φ 11 、φ 12 、φ 13 、……、φ 1n Equal;
phi is said n0 、φ n1 、φ n2 、φ n3 、……、φ nn Increase in arithmetic progression.
5. A detecting device, for implementing the step S20 and the step S30 in the switch rail bottom flaw detection method according to any one of claims 1 to 4, comprising:
a fixed seat;
the piezoelectric wafer is arranged on the fixed seat, and the piezoelectric wafer and the horizontal plane form a preset included angle and is used for being connected with an ultrasonic device; and
and the magnetic absorption block is arranged at the bottom of the fixed seat and used for magnetically absorbing the magnetic absorption block to the bottom of the turnout rail.
6. The detecting device for detecting the rotation of a motor rotor as claimed in claim 5, wherein a plurality of the magnetic blocks are uniformly distributed at the bottom of the fixing base.
7. The detecting device for detecting the rotation of a motor rotor as claimed in claim 5, wherein the detecting device further comprises a rail thermometer disposed at the bottom of the fixing seat, and a detecting end of the rail thermometer is exposed on the bottom of the fixing seat in a flush manner.
8. A railroad switch rail bottom flaw detection device for carrying out the railroad switch rail bottom flaw detection method according to any one of claims 1 to 4, comprising:
the test device of any one of claims 5-7;
the ultrasonic device is connected with the piezoelectric wafer and is used for generating and collecting ultrasonic guided wave signals; and
and the controller is connected with the ultrasonic device and is provided with a display for displaying the detection oscillogram.
9. The turnout rail base flaw detection apparatus of claim 8 wherein the ultrasonic device comprises a signal generator, a power amplifier and an oscilloscope integrated with each other.
10. The switch rail foot flaw detection device of claim 8, wherein a plurality of said detection means are provided, and a plurality of said detection means are provided at intervals along the extension direction of the switch rail foot and are respectively connected to the ultrasonic means.
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| CN116575273A (en) * | 2023-07-14 | 2023-08-11 | 太原矿机电气股份有限公司 | Modular ground rail clamping rail, turnout and vehicle meeting method |
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