CN115184652B - Slender steady flow test probe - Google Patents
Slender steady flow test probe Download PDFInfo
- Publication number
- CN115184652B CN115184652B CN202210800575.6A CN202210800575A CN115184652B CN 115184652 B CN115184652 B CN 115184652B CN 202210800575 A CN202210800575 A CN 202210800575A CN 115184652 B CN115184652 B CN 115184652B
- Authority
- CN
- China
- Prior art keywords
- needle
- head
- needle head
- test
- steady flow
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 56
- 239000000523 sample Substances 0.000 title claims abstract description 28
- 238000012545 processing Methods 0.000 claims description 13
- 230000006835 compression Effects 0.000 claims description 4
- 238000007906 compression Methods 0.000 claims description 4
- 230000005540 biological transmission Effects 0.000 abstract description 6
- 238000000034 method Methods 0.000 abstract description 4
- 238000013461 design Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Abstract
The invention discloses an elongated steady flow test probe, which comprises a needle bar; the elastic piece is sleeved outside the needle bar; one end of the needle rod is telescopically assembled at the tail part of the first needle head; and the other end of the needle rod is telescopically assembled at the tail part of the second needle head. The slender steady flow test probe solves the problems that the conventional slender test probe is easy to swing due to the needle head in the test process, so that the false test rate of test data is high and the test transmission is unstable.
Description
Technical Field
The invention belongs to the technical field of semiconductor detection, and particularly relates to an elongated steady flow test probe.
Background
In the process of producing the printed circuit board, an electrical test is required to be performed on the printed circuit board to determine whether electrical parameters (such as resistance, capacitance or inductance) of each component of the printed circuit board meet standard requirements.
The common test method of the printed circuit board is to set a test point on the printed circuit board, print solder paste on the surface of the test point, and obtain relevant electrical parameters by using a probe to directly contact the solder paste part of the test point through automatic test equipment or on-line test equipment.
The probe head type in the current online test equipment has different requirements according to different test points, such as single-head single-action, double-head double-action and the like, and the factors such as high false test rate, unstable test transmission and the like of test data caused by the swing of the probe head are often caused in the test process of the slender test probe.
Disclosure of Invention
The invention aims to provide an elongated steady flow test probe, which solves the problems of high false test rate and unstable test transmission of test data caused by easy swing of a needle head in the test process of the conventional elongated test probe.
In order to solve the technical problems, the invention discloses an elongated steady flow test probe, which comprises:
A needle bar;
the elastic piece is sleeved outside the needle bar;
One end of the needle rod is telescopically assembled at the tail part of the first needle head;
and the other end of the needle rod is telescopically assembled at the tail part of the second needle head.
The technical scheme of the invention also has the following characteristics:
Further, an annular limiting groove is formed in the outer edge of one end of the needle rod, and a pit processing station is arranged on the outer wall of the tail of the first needle head.
Further, the number of the pit processing stations is multiple, and the pit processing stations are circumferentially arranged along the tail part of the first needle head at equal angles.
Further, the other end of the needle rod is provided with a limiting annular table, and the tail part of the second needle head is provided with a necking.
Further, the elastic member is a compression spring.
Further, the head of the first needle is cylindrical, and the head of the second needle is plum-blossom-shaped.
Compared with the prior art, the invention has the following advantages: (1) According to the slender steady flow test probe, the needle rod is clamped in the first needle head and the second needle head, so that the design mode that the first needle head and the second needle head are clamped in the needle tube is abandoned, the first needle head and the second needle head are not easy to swing, and the problems of high false test rate and unstable test transmission of test data are avoided; (2) The slender steady flow test probe provided by the invention has the advantages of simple integral structure, convenience in operation, lower manufacturing cost and better market popularization and use prospect.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and do not constitute a limitation on the invention. In the drawings:
FIG. 1 is a schematic diagram of an elongate steady flow test probe of the present invention;
FIG. 2 is a cross-sectional view of an elongate steady flow test probe of the present invention;
FIG. 3 is an exploded view of an elongate steady flow test probe of the present invention.
In the figure: 1. the needle comprises a first needle head, a needle rod, an elastic piece, a second needle head, a pit processing station, an annular limiting groove and a limiting annular table.
Detailed Description
Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative only and are not to be construed as limiting the invention.
In the description of the present invention, the description of the first and second is only for the purpose of distinguishing technical features, and should not be construed as indicating or implying relative importance or implying the number of technical features indicated or the precedence of the technical features indicated.
In the description of the present invention, unless explicitly defined otherwise, terms such as arrangement, installation, connection, etc. should be construed broadly and the specific meaning of the terms in the present invention can be reasonably determined by a person skilled in the art in combination with the specific contents of the technical scheme.
As shown in fig. 1, the present invention discloses an elongated steady flow test probe, comprising:
A needle bar 2;
The elastic piece 3, the elastic piece 3 is sleeved outside the needle bar 2;
a first needle head 1, one end of a needle rod 2 is telescopically assembled at the tail part of the first needle head 1;
the second needle 4, the other end of the needle bar 2 is telescopically assembled at the tail of the second needle 4.
In combination with fig. 2 and 3, the elastic element 3 is sleeved outside the needle bar 2 during assembly, and then two ends of the needle bar 2 are respectively inserted into tail holes of the first needle head 1 and the second needle head 4 and are limited and fixed, so that two ends of the needle bar 2 are telescopically limited in the tail parts of the first needle head 1 and the second needle head 4. The elastic member 3 is now trapped between the first needle 1 and the second needle 4.
In operation, the first needle 1 is connected to the testing device and the second needle 4 is in contact with the product to be tested. Compared with the existing design mode that the first needle head and the second needle head are clamped in the needle tube (needle rod), the slender steady flow test probe has the advantages that the needle rod 2 is clamped in the first needle head 1 and the second needle head 4, the fact that the first needle head 1 and the second needle head 4 are not easy to swing can be better ensured, and the problems that the test data is high in false test rate and unstable in test transmission are avoided.
Referring to fig. 2 and 3, in an elongated steady flow test probe of the present invention, an annular limit groove 6 is provided at an outer edge of one end of a needle bar 2, and a pit processing station 5 is provided on an outer wall of a tail portion of a first needle 1.
When one end of the needle bar 2 stretches into the tail of the first needle head 1, the pit processing station 5 is positioned outside the annular limiting groove 6, pits are processed at the pit processing station 5, the outer wall of the tail of the first needle head 1 can be inwards sunk into the annular limiting groove 6, so that the sliding assembly between the first needle head 1 and the needle bar 2 can be completed through limiting, and the sliding displacement is determined by the width of the annular limiting groove 6.
In combination with fig. 2 and 3, in the slender steady flow test probe of the present invention, the number of the concave point processing stations 5 is plural, and the concave point processing stations 5 are circumferentially arranged along the tail of the first needle head 1 at equal angles, so that the sliding limit can be implemented through the plurality of concave point processing stations 5, and it is ensured that the first needle head 1 and the needle rod 2 do not deviate from each other when moving.
Referring to fig. 2 and 3, in an elongated steady flow test probe of the present invention, the other end of the needle bar 2 is provided with a limiting annular table 7, and the tail of the second needle 4 is formed with a constriction.
After the limiting annular table 7 arranged at the other end of the needle bar 2 stretches into the hole at the tail of the second needle head 4, a necking can be processed in a riveting mode at the hole at the tail of the second needle head 4, so that sliding assembly between the needle bar 2 and the second needle head 4 is completed.
In an elongate steady flow test probe according to the invention, in combination with fig. 2 and 3, the resilient member 3 is preferably a compression spring.
The compression spring can provide relatively uniform elastic force with relatively high straightness for the first needle head 1 and the second needle head 4, so that good contact between the second needle head 4 and a tested product is ensured.
Referring to fig. 2 and 3, in an elongated steady flow test probe of the present invention, the head of the first needle 1 is cylindrical to facilitate connection with a test device, and the head of the second needle 4 is plum blossom-shaped to facilitate contact with a product to be tested.
In summary, compared with the prior art, the slender steady flow test probe provided by the invention has the advantages that the needle rod is clamped in the first needle head and the second needle head, the design mode that the first needle head and the second needle head are clamped in the needle tube is abandoned, the first needle head and the second needle head are not easy to swing, and the problems of high false test rate and unstable test transmission of test data are avoided.
In addition, the slender steady flow test probe provided by the invention has the advantages of simple integral structure, convenience in operation, lower manufacturing cost and better market popularization and application prospect.
While the foregoing description illustrates and describes several preferred embodiments of the invention, it is to be understood that the invention is not limited to the forms disclosed herein, but is not to be construed as limited to other embodiments, and is capable of use in various other combinations, modifications and environments and is capable of changes or modifications within the spirit of the invention described herein, either as a result of the foregoing teachings or as a result of the knowledge or skill of the relevant art. And that modifications and variations which do not depart from the spirit and scope of the invention are intended to be within the scope of the appended claims.
Claims (1)
1. An elongate steady flow test probe comprising:
A needle bar (2);
the elastic piece (3), the said elastic piece (3) is sleeved outside the said needle bar (2);
One end of the needle bar (2) is telescopically assembled at the tail part of the first needle head (1);
The other end of the needle bar (2) is telescopically assembled at the tail part of the second needle head (4);
An annular limiting groove (6) is formed in the outer edge of one end of the needle bar (2), and a pit processing station (5) is formed in the outer wall of the tail of the first needle head (1);
the number of the pit processing stations (5) is multiple, and the pit processing stations are circumferentially arranged at equal angles along the tail part of the first needle head (1);
the other end of the needle bar (2) is provided with a limiting annular table (7), and the tail part of the second needle head (4) is provided with a necking;
the elastic piece (3) is a compression spring;
the head of the first needle head (1) is cylindrical, and the head of the second needle head (4) is plum-blossom-shaped.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210800575.6A CN115184652B (en) | 2022-07-06 | Slender steady flow test probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210800575.6A CN115184652B (en) | 2022-07-06 | Slender steady flow test probe |
Publications (2)
Publication Number | Publication Date |
---|---|
CN115184652A CN115184652A (en) | 2022-10-14 |
CN115184652B true CN115184652B (en) | 2024-07-09 |
Family
ID=
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015105209A1 (en) * | 2014-01-09 | 2015-07-16 | 주식회사 아이에스시 | Probe device |
CN213210235U (en) * | 2020-05-19 | 2021-05-14 | 渭南高新区木王科技有限公司 | Double-end single-rotation type test probe |
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015105209A1 (en) * | 2014-01-09 | 2015-07-16 | 주식회사 아이에스시 | Probe device |
CN213210235U (en) * | 2020-05-19 | 2021-05-14 | 渭南高新区木王科技有限公司 | Double-end single-rotation type test probe |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN115184652B (en) | Slender steady flow test probe | |
CN213023251U (en) | Spring probe for testing integrated circuit | |
CN206193056U (en) | Heavy current single -end single action probe | |
CN115184652A (en) | Slender steady-flow test probe | |
CN113109607A (en) | Double-end double-acting heavy current test probe | |
CN218036993U (en) | Double-end test probe | |
CN117214488A (en) | Semiconductor steady flow test module | |
CN213517437U (en) | Mixed-voltage circuit board electrical property detection device | |
CN115267279A (en) | Test probe suitable for detecting oxide layer and rosin layer test points | |
CN200989912Y (en) | Probe for detection | |
CN115980412A (en) | Semiconductor probe test fixture with prepressing function | |
CN215116425U (en) | Large-current test probe | |
CN115047316A (en) | Detachable slender probe | |
CN215497188U (en) | Spring needle with limiting needle shaft | |
CN106940412B (en) | System for quick capacitance polarity measurement | |
CN220122161U (en) | Button probe | |
CN217846411U (en) | Test probe | |
CN220650725U (en) | Resistance test probe fixture | |
CN219758350U (en) | High-current stamping aging test probe | |
CN216248083U (en) | Probe for integrated circuit test | |
CN215493752U (en) | Detachable probe | |
CN220933027U (en) | Connection plate leading-out measurement component | |
CN215678495U (en) | Spring plate needle | |
CN116338267A (en) | Double-head single-action semiconductor test probe capable of preventing instantaneous break | |
CN210723430U (en) | Uninterrupted power connector |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant |