CN115113385A - Cultural relic image processing system and method - Google Patents

Abstract

The application provides a cultural relic image processing system and a cultural relic image processing method, wherein the system comprises: the system comprises a microscope bracket, a digital microscope and an industrial control all-in-one machine; the industrial control all-in-one machine is connected with the digital microscope and is used for displaying a reference image of the target cultural relic and corresponding acquisition parameters when the reference image is acquired according to the cultural relic acquisition task of the target cultural relic so as to guide the adjustment of the microscope bracket and the adjustment of the digital microscope through the reference image and the acquisition parameters; the digital microscope is used for collecting an image to be identified of the target cultural relic and uploading the image to be identified to the industrial control all-in-one machine; the industrial control all-in-one machine is also used for comparing the reference image with the image to be identified and displaying the comparison result. By adopting the method and the device, reliable reference data can be provided for an appraiser, and the fatigue of the appraiser for observing the microscope for a long time is relieved, so that the efficiency and the accuracy of cultural relic appraisal are improved.

Description

Cultural relic image processing system and method

Technical Field

The application relates to the technical field of cultural relic identification, in particular to a cultural relic image processing system and method.

Background

At present, the work of comparing and identifying the cultural relics mainly depends on the experience of an identification worker, and the identification worker usually uses a microscope to repeatedly observe the cultural relics for a plurality of hours to obtain an identification result. The fatigue of the microscope is easy to affect the accuracy of the identification result after long-time observation, and the degree of knowledge reserve and identification experience of the identification workers also affects the accuracy of the identification result of the cultural relics. Aiming at the problems of low efficiency and poor accuracy caused by manual implementation in the cultural relic identification process, an effective solution is not provided at present.

Disclosure of Invention

The application aims to provide a cultural relic image processing system and method, so that reliable reference data are provided for an appraiser, fatigue of the appraiser for observing a microscope for a long time is relieved, and efficiency and accuracy of cultural relic appraisal are improved.

The embodiment of the application provides a historical relic image processing system, the system includes: the system comprises a microscope bracket, a digital microscope and an industrial control all-in-one machine, wherein scale marking information is arranged at the movable part of the microscope bracket; the industrial control all-in-one machine is connected with the digital microscope and is used for displaying a reference image of a target cultural relic and corresponding acquisition parameters when the reference image is acquired according to a cultural relic acquisition task of the target cultural relic so as to guide the adjustment of the microscope support and the adjustment of the digital microscope through the reference image and the acquisition parameters; the acquisition parameters comprise target scale information corresponding to the movable part of the microscope support, magnification factor information and optical parameter information of the digital microscope; the digital microscope is used for collecting an image to be identified of the target cultural relic and uploading the image to be identified to the industrial control all-in-one machine; and the industrial control all-in-one machine is also used for comparing the reference image with the image to be identified and displaying a comparison result.

With reference to the first aspect, an embodiment of the present application provides a first possible implementation manner of the first aspect, where the industrial-control all-in-one machine is connected to a server, and is further configured to obtain, from the server, a reference image of the target cultural relic and an acquisition parameter corresponding to the reference image according to the identification information of the target cultural relic in the cultural relic acquisition task; the reference image and the acquisition parameters are uploaded to the server by the industrial control all-in-one machine or other industrial control all-in-one machines in advance.

In combination with the first aspect, an embodiment of the present application provides a second possible implementation manner of the first aspect, where the digital microscope is provided with an LED light source, the LED light source is disposed at an objective end of the digital microscope, the LED light source is connected to the industrial personal computer, and the industrial personal computer is further configured to set and collect optical parameters of the LED light source of the image to be identified according to the optical parameter information corresponding to the reference image.

With reference to the first aspect, an embodiment of the present application provides a third possible implementation manner of the first aspect, where the industrial personal computer is further configured to provide an adjustable range of optical parameters of the LED light source according to a type of a cultural relic to which the target cultural relic belongs; and responding to a parameter adjusting operation aiming at the adjustable range of the light parameter, and setting the light parameter of the LED light source according to the parameter adjusting operation.

With reference to the first aspect, the present application provides a fourth possible implementation manner of the first aspect, where the microscope stand includes a support rod with scale information and a first support moving up and down along the support rod; the target scale information includes linear scale information guiding a position of the first bracket in the support bar.

With reference to the first aspect, the present application provides a fifth possible implementation manner of the first aspect, where the microscope stand further includes a second stand connected to the first stand, and a third stand connected to the second stand; the second bracket and the third bracket are connected through a connecting shaft, and the third bracket can rotate around the connecting shaft within a set angle range so as to change the horizontal position of the digital microscope; the end part of the second support close to the connecting shaft is provided with an angle dial, and the end part of the third support close to the connecting shaft is provided with an angle pointer mark.

With reference to the first aspect, an embodiment of the present application provides a sixth possible implementation manner of the first aspect, where the reference image is marked with sample points; the industrial and control integrated machine is also used for displaying the sampling points on the reference image, responding to the selected operation of the target sampling points on the reference image, displaying the corresponding local image of the target sampling points on the reference image, and displaying the corresponding sub-image of the target sampling points currently acquired by the digital microscope on the image to be identified.

With reference to the first aspect, an embodiment of the present application provides a seventh possible implementation manner of the first aspect, where the industrial personal computer is further configured to store the image to be authenticated of the target cultural relic and the comparison result in a server connected to the industrial personal computer by using a block chain storage technology.

In combination with the first aspect, an embodiment of the present application provides an eighth possible implementation manner of the first aspect, where a positioning sensor is installed at a movable portion of the microscope stand, and the positioning sensor is connected to the industrial control all-in-one machine and configured to send target scale information of the movable portion to the industrial control all-in-one machine.

With reference to the first aspect, an embodiment of the present application provides a ninth possible implementation manner of the first aspect, where the reference image is a global image of the target cultural relic; the global image is used for representing the placing information of the target cultural relic.

In a second aspect, the embodiment of the application further provides a cultural relic image processing method, the method is applied to an industrial control all-in-one machine, the industrial control all-in-one machine is connected with a digital microscope arranged on a microscope support, and scale marking information is arranged on a movable part of the microscope support; the method comprises the following steps: responding to a cultural relic collection task of a target cultural relic, displaying a reference image of the target cultural relic and corresponding collection parameters when the reference image is collected so as to guide the adjustment of the microscope support and the adjustment of the digital microscope through the reference image and the collection parameters; the acquisition parameters comprise target scale information corresponding to the movable part of the microscope support, magnification factor information and optical parameter information of the digital microscope; responding to the image to be identified of the target cultural relic uploaded by the digital microscope; and comparing the reference image with the image to be identified, and displaying a comparison result.

With reference to the second aspect, an embodiment of the present application provides a first possible implementation manner of the second aspect, where the industrial personal computer is connected to a server, and the method further includes: acquiring a reference image of the target cultural relic and acquisition parameters corresponding to the reference image from the server according to the identification information of the target cultural relic in the cultural relic acquisition task; the reference image and the acquisition parameters are uploaded to the server by the industrial control all-in-one machine or other industrial control all-in-one machines in advance.

With reference to the second aspect, an embodiment of the present application provides a second possible implementation manner of the second aspect, where the digital microscope is provided with an LED light source, the LED light source is disposed at an objective lens end of the digital microscope, and the LED light source is connected to the integrated industrial personal computer, and the method further includes: and setting the optical parameters of the LED light source for acquiring the image to be identified according to the optical parameter information corresponding to the reference image.

In combination with the second aspect, the present embodiments provide a third possible implementation manner of the second aspect, wherein the microscope stand includes a support bar with scale information and a first stand moving up and down along the support bar; the target scale information includes linear scale information guiding a position of the first bracket in the support bar.

In combination with the second aspect, the present application provides a fourth possible implementation manner of the second aspect, wherein the microscope stand further includes a second stand connected to the first stand, and a third stand connected to the second stand; the second bracket and the third bracket are connected through a connecting shaft, and the third bracket can rotate around the connecting shaft within a set angle range so as to change the horizontal position of the digital microscope; the end part of the second support close to the connecting shaft is provided with an angle dial, and the end part of the third support close to the connecting shaft is provided with an angle pointer mark.

In combination with the second aspect, embodiments of the present application provide a fifth possible implementation manner of the second aspect, where the reference image is marked with sampling points; the method further comprises the following steps: displaying the sampling points on the reference image, responding to the selected operation of the target sampling points on the reference image, displaying the corresponding local image of the target sampling points on the reference image, and displaying the corresponding sub-image of the target sampling points currently acquired by the digital microscope on the image to be identified.

The embodiment of the application provides a cultural relic image processing system and method, scale marking information is arranged at the movable part of a microscope support, a reference image of a target cultural relic can be associated with acquisition parameters corresponding to the acquisition of the reference image, and further, when secondary image acquisition is carried out on the target cultural relic, the acquisition parameters are displayed to guide the adjustment of the microscope support and a digital microscope in the secondary image acquisition process, so that the acquired image to be identified is consistent with the reference image, the comparison accuracy can be improved, the identification image and the reference image are compared through an industrial control all-in-one machine, the comparison efficiency is effectively improved, reliable reference data are provided for an identification worker, the fatigue of the identification worker for observing the microscope for a long time is relieved, and the accuracy of an identification result is improved.

Drawings

In order to more clearly illustrate the detailed description of the present application or the technical solutions in the prior art, the drawings needed to be used in the detailed description of the present application or the prior art description will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative efforts.

Fig. 1 is a schematic structural diagram of a cultural relic image processing system according to an embodiment of the present application;

fig. 2 is a schematic structural diagram of another cultural relic image processing system provided in the embodiment of the present application;

fig. 3 is a schematic structural diagram of another cultural relic image processing system provided in the embodiment of the present application;

fig. 4 is a diagram illustrating an exemplary hardware configuration of a cultural relic image processing system in the embodiment of the present application;

FIG. 5 is a partial structural example of a microscope stand according to an embodiment of the present application;

FIG. 6 is a partial structural example view of a microscope stand according to an embodiment of the present application;

FIG. 7 is a partial structural example of a microscope stand according to an embodiment of the present application;

FIG. 8 is a partial structural example of a microscope stand according to an embodiment of the present application;

FIG. 9 is a partial structural example of a microscope stand according to an embodiment of the present application;

FIG. 10 is a partial structural example of a microscope stand according to an embodiment of the present application;

FIG. 11 is a diagram illustrating an example of a display of an industrial personal computer in an embodiment of the present application;

fig. 12 is a flowchart illustrating a cultural relic image processing method according to an embodiment of the present application.

Detailed Description

The technical solutions of the present application will be described clearly and completely with reference to the following embodiments, and it should be understood that the described embodiments are some, but not all embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

In order to reduce the workload of a cultural relic appraiser for detecting the cultural relic through a microscope and improve the efficiency and the accuracy of the cultural relic appraisal, the embodiment of the application provides a cultural relic image processing system and a cultural relic image processing method, which can provide reliable reference data for the cultural relic appraisal worker and relieve the fatigue of the appraisal worker for observing the microscope for a long time, thereby improving the efficiency and the accuracy of the cultural relic appraisal.

For convenience of understanding, a description is first made of a cultural relic image processing system provided in the embodiment of the present application.

Referring to fig. 1, a schematic structural diagram of a cultural relic image processing system is shown, which includes a microscope stand 100, a digital microscope 200 and an industrial personal computer 300. The industrial control all-in-one machine 300 is connected with the digital microscope 200 and is used for displaying the reference image of the target cultural relic and the corresponding acquisition parameters when the reference image is acquired according to the cultural relic acquisition task of the target cultural relic so as to guide the adjustment of the microscope support 100 and the adjustment of the digital microscope 200 through the reference image and the acquisition parameters. The acquisition parameters include target scale information corresponding to the movable part of the microscope stand 100, magnification information of the digital microscope 200, and optical parameter information. The digital microscope 200 is used for collecting an image to be identified of the target cultural relic and uploading the image to be identified to the industrial control integrated machine 300. The industrial personal computer 300 is further configured to compare the reference image with the image to be identified, and display a comparison result.

Specifically, the microscope stand 100 may include one or more movable portions, and the microscope stand 100 is connected to the digital microscope 200, and is configured to support the digital microscope 200 and adjust the position and posture of the digital microscope 200. The position of the digital microscope 200 may specifically refer to a horizontal position, a vertical position, and the like of the digital microscope 200; the attitude of the digital microscope 200 may specifically refer to the objective end orientation of the digital microscope 200.

The shape, size, etc. of the microscope stand 100 can be determined according to actual needs, for example, one or more movable mechanical arms, etc., without limitation.

The cultural relic collection task of the target cultural relic usually comprises information such as the category and the name of the target cultural relic, wherein the category of the target cultural relic is used for representing the classification to which the target cultural relic belongs, and usually the category is related to the material of the target cultural relic. The reference image of the target cultural relic is pre-stored in the industrial personal computer 300 or other equipment in communication connection with the industrial personal computer 300.

The reference image of the target cultural relic is an image of the cultural relic which is consistent with the identification information of the target cultural relic (namely the category and the name of the target cultural relic). In general, a reference image is an image of a genuine cultural relic identified by a cultural relic specialist, and the reference image may be one image or a group of images including a plurality of images.

The categories of the target cultural relics can comprise: the name of the target cultural relic is usually named in the relevant specification of the cultural relic, for example, the name can contain relevant information such as the age, author, style and the like.

The optical parameter information is related to the type and model of the digital microscope 200, and may specifically include light intensity, illuminance, numerical aperture, resolution, focal depth, field width, and the like, and may be determined according to actual needs, without limitation.

The historical relic image processing system that this application embodiment provided, through being provided with scale mark information at the activity position of microscope stand, can be relevant with the reference image of target historical relic and the collection parameter that corresponds when gathering this reference image, and then when carrying out secondary image collection to this target historical relic, show these collection parameters in order to guide the regulation of microscope stand and digital microscope in the secondary image collection process, and then make the image of waiting to appraise of gathering unanimous with the reference image, can promote the degree of accuracy of comparison, and treat appraisal image and reference image through the comparison of industrial control all-in-one machine, the comparison efficiency has effectively been promoted, provide reliable reference data for appraisal worker, the tired sense of appraisal worker's long-time observation microscope has been alleviated, the accuracy of appraisal result has been promoted.

Based on the above historical relic image processing system, another historical relic image processing system is provided in the embodiment of the present application, as shown in fig. 2, the industrial control all-in-one machine 300 is connected to the server 400, and is further configured to obtain a reference image of the target historical relic and an acquisition parameter corresponding to the reference image from the server 400 according to the identification information of the target historical relic in the historical relic acquisition task; the reference image and the acquisition parameter are uploaded to the server 400 by the industrial personal computer 300 or other industrial personal computers in advance.

Specifically, before the identification of the target cultural relic is carried out, the relevant personnel can record the acquisition parameters into a designated industrial control all-in-one machine (such as the industrial control all-in-one machine 300 or other industrial control all-in-one machines); the designated industrial control integrated machine stores a reference image of a target cultural relic and acquisition parameters corresponding to the acquisition of the reference image as a cultural relic file of the target cultural relic, and allocates identification information of the target cultural relic to the cultural relic file, wherein the identification information can specifically comprise related information used for representing the target cultural relic, such as the name, the number, the category and the like of the target cultural relic; then, the designated industrial control all-in-one machine uploads the cultural relic file with the identification information to the server 400, so that the industrial control all-in-one machine 300 can acquire the reference image of the target cultural relic and the acquisition parameters corresponding to the reference image from the server 400 according to the identification information of the target cultural relic in the cultural relic acquisition task when identifying the target cultural relic.

By adopting the embodiment, the industrial control all-in-one machine 300 can conveniently acquire the reference image of the target cultural relic and the corresponding acquisition parameters during acquiring the reference image, thereby being beneficial to improving the identification efficiency of the target cultural relic.

In addition, due to the difference of photosensitivity among the cultural relics of different cultural relic categories, if the brightness of the surface imaging of the cultural relics is low, the surface texture features of the cultural relics are not true enough, so that the accuracy of identification of the cultural relics is reduced; if the brightness of the image on the surface of the cultural relic is too high, the cultural relic is easy to be damaged irreversibly. Based on this, on the basis of the above-mentioned historical relic image processing system, another historical relic image processing system is provided in the embodiment of the present application, as shown in fig. 3, the digital microscope 200 is provided with an LED light source 201, the LED light source 201 is arranged at an objective end of the digital microscope 200, the LED light source 201 is connected with the industrial personal computer 300, and the industrial personal computer 300 is further configured to set the optical parameters of the LED light source 201 for acquiring the image to be identified according to the optical parameter information corresponding to the reference image.

The LED light source 201 may be a single light source or a combination of multiple light sources, and the optical parameters of the LED light source 201 may include light intensity, illuminance, wavelength, frequency, color, and the like of each light source, which may be determined according to actual needs, and are not limited thereto.

As a possible implementation manner, the all-in-one industrial control machine 300 is further configured to provide an adjustable range of optical parameters of the LED light source 201 according to a cultural relic category to which the target cultural relic belongs; and setting the light parameters of the LED light source 201 in accordance with the parameter adjustment operation in response to the parameter adjustment operation for the light parameter adjustable range. For example, when a relevant person newly builds a cultural relic collection task of a target cultural relic through the industrial personal computer 300, the industrial personal computer 300 provides an optical parameter setting interface, a parameter input field corresponding to an optical parameter of the LED light source 201 is displayed at a preset position of the interface, and each parameter input field corresponds to a value range in which a parameter can be input; the relevant personnel can input corresponding parameter values to the target input fields (the parameter value input operation is the parameter adjustment operation at this time), and the all-in-one industrial personal computer 300 obtains the parameter values in all the parameter input fields after responding to the parameter adjustment operation, and correspondingly sets the optical parameters of the LED light source 201 as the parameter values in all the parameter input fields.

The adjustable range of the optical parameters can be defined by self according to the actual situation based on the type of the cultural relic to which the target cultural relic belongs, and the adjustable range of the optical parameters is not limited. Illustratively, if the class of the cultural relics to which the target cultural relics belong is metal, jade, glass, enamel and the like, the illumination adjustable range of the LED light source 201 provided by the industrial personal computer 300 does not exceed 300 lx; if the cultural relic category to which the target cultural relic belongs is painting, silk, pigment, colored leather and the like, the illumination adjustable range of the LED light source 201 provided by the industrial personal computer 300 is not more than 50 lx.

By adopting the implementation mode of setting the LED light source and setting the optical parameters of the LED light source through the industrial control all-in-one machine, the optical parameters when the image to be identified of the target cultural relic is acquired can be more reasonable, so that the accuracy of identification of the target cultural relic is improved, and the target cultural relic is prevented from being irreversibly damaged due to unreasonable optical parameters.

As one possible embodiment, referring to fig. 4, the microscope stand 100 may include a support rod 101 with scale information and a first stand 102 moving up and down along the support rod 101; the above-mentioned target scale information includes linear scale information for guiding the position of the first support 102 in the support bar 101, i.e., scale information of a straight edge type, typically in units of centimeters, millimeters, and the like.

For example, in fig. 5, scales are linearly distributed on the support rod 101 along the length direction thereof, and the first bracket 102 is sleeved on the support rod 101; the linear scale information is a scale value indicated by a portion of the first bracket 102 sleeved on the support rod 101, such as a scale indicated by an upper port of the portion or a scale value indicated by a lower port of the portion.

As a possible embodiment, referring to fig. 4, the microscope stand 100 may further include a second stand 103 connected to the first stand 102, and a third stand 104 connected to the second stand 103; the second bracket 103 and the third bracket 104 are connected through a connecting shaft, and the third bracket 104 can rotate around the connecting shaft within a set angle range to change the horizontal position of the digital microscope 200; the above target scale information may further include first angle scale information guiding a rotation angle of the third bracket 104 about the connection shaft. For example, fig. 6, the end of the second bracket 103 near the connecting shaft 402 is provided with an angle dial 1031, and the end of the third bracket 104 near the connecting shaft 402 is provided with an angle pointer mark 1041; the first angle scale information is an angle scale value correspondingly indicated by the angle pointer identifier 1041 of the third bracket 104.

As a possible embodiment, referring to fig. 4, the microscope stand 100 may further include a fourth stand 105 connected to the third stand 104; the third bracket 104 and the fourth bracket 105 are connected through a connecting shaft, and the third bracket 104 can rotate around the connecting shaft within a set angle range to change the horizontal position of the digital microscope 200; the above target scale information may further include second angle scale information guiding a rotation angle of the third bracket 104 about the connection shaft. For example, fig. 7, the end of the fourth bracket 105 near the connecting shaft 403 is provided with an angle dial 1051, and the end of the third bracket 104 near the connecting shaft 403 is provided with an angle pointer 1042; the second angle scale information is an angle scale value correspondingly indicated by the angle pointer identification 1042 of the third bracket 104.

As a possible embodiment, referring to fig. 4, the first bracket 102 and the second bracket 103 are connected by a connecting shaft, and the second bracket 103 can rotate around the connecting shaft within a set angle range to change the horizontal position of the digital microscope 200; the above target scale information may further include third angle scale information guiding a rotation angle of the second bracket 103 about the connection shaft. For example, fig. 8, the end of the first bracket 102 near the connecting shaft 401 is provided with an angle dial 1021, and the end of the second bracket 103 near the connecting shaft 401 is provided with an angle pointer mark 1032; the third angle scale information is an angle scale value correspondingly indicated by the angle pointer identifier 1032 of the second support 103.

As a possible embodiment, referring to fig. 4, one end of the third bracket 104 is hinged with a connecting block 601, and a connecting shaft for connecting the third bracket 104 and the second bracket 103 passes through the connecting block 601; the other end of the third bracket 104 is hinged with a connecting block 602, and a connecting shaft for connecting the third bracket 104 and the fourth bracket 105 penetrates through the connecting block 602; one end of the third bracket 104 can swing around the connecting block 601 within a set angle range, and the connecting block 602 can swing around the other end of the third bracket 104 within a set angle range, so as to change the posture of the digital microscope 200 (which may specifically refer to the objective lens end orientation of the digital microscope 200); the target scale information may further include fourth angle scale information for guiding an angle of the third support 104 swinging around the connection block 601 and fifth angle scale information for guiding the connection block 602 swinging around the other end of the third support 104. For example, in fig. 9, an angle dial 6011 is disposed at the upper portion of the connection block 601 near the end of the third bracket 104, and an angle pointer mark 1043 is disposed at the end of the third bracket 104 near the upper portion of the connection block 601; the fourth angle scale information is an angle scale value correspondingly indicated by the angle pointer identifier 1043 of the third bracket 104. For example, in fig. 10, an angle dial 6021 is arranged at the end of the upper part of the connection block 602 close to the third support 104, and an angle pointer identifier 1044 is arranged at the end of the third support 104 close to the upper part of the connection block 602; the fifth angle scale information is an angle scale value correspondingly indicated by the angle pointer identification 1044 of the third support 104.

For the convenience of understanding, the hardware structure of the above-mentioned cultural relic image processing system is exemplarily described as follows by taking fig. 4 as an example:

the microscope stand 100 includes a support bar 101, a first stand 102, a second stand 103, a third stand 104, a fourth stand 105, and a focusing bracket 106; the first bracket 102 is sleeved on the support rod 101, and the position of the first bracket 102 on the support rod 101 is locked by a positioning screw 501; the second bracket 103 is rotatably connected with the first bracket 102 through a connecting shaft, and the horizontal rotation angle of the second bracket 103 around the connecting shaft is locked through a positioning screw 502; one end of the third bracket 104 is hinged with a connecting block 601, the second bracket 103 is rotatably connected with the connecting block 602 through a connecting shaft, and the horizontal rotation angle of the third bracket 104 around the connecting shaft is locked through a positioning screw 503; the other end of the third bracket 104 is hinged with a connecting block 602, the connecting block 602 is rotatably connected with the fourth bracket 105 through a connecting shaft, and the angle of the horizontal rotation of the fourth bracket 103 around the connecting shaft is locked through a positioning screw 504; the angle of the one end of the third bracket 104 swinging around the connecting block 601 along the vertical plane and the angle of the connecting block 602 swinging around the other end of the third bracket 104 along the vertical plane are locked by the position locking device.

One end, far away from the connecting block 602, of the fourth bracket 105 is hinged with a connecting rod, and the angle of the connecting rod swinging along a vertical plane around one end, far away from the connecting block 602, of the fourth bracket 105 is locked through a position locking device; focusing bracket 106 is sleeved on the connecting rod, and the position of focusing bracket 106 on the connecting rod is locked by set screw 505.

The digital microscope 200 includes a CCD camera 203, a monocular microscope lens 202, and an objective lens 204; the upper port of the monocular microscope lens 202 is hermetically connected with the CCD camera 203, and the lower port of the monocular microscope lens 202 is hermetically connected with the objective lens 204; the monocular microscope lens 202 is fixedly mounted on the focusing bracket 106; a focusing knob is disposed on the focusing bracket 106, and the position of the focusing bracket 106 on the connecting rod can be adjusted by the focusing knob, so as to focus the digital microscope 200.

An LED annular lamp 201a (i.e., one form of the LED light source 201 in fig. 3) is disposed at a position close to the objective lens 204 at a lower port of the monocular microscope lens 202, and the LED annular lamp 201a is internally provided with an illuminance control module and a wireless transmission module; the LED annular lamp 201a is connected with the industrial control all-in-one machine 300; the illuminance of the LED ring lamp 201a is adjusted by the integrated industrial control machine 300, for example, the integrated industrial control machine 300 sends an illuminance adjusting instruction to the brightness control module through the wireless transmission module, so that the illuminance control module adjusts the illuminance of the LED ring lamp 201 a; the CCD camera 203 is connected with the industrial personal computer 300.

In order to facilitate the operation, the display screen 301 of the industrial personal computer 300 is movably connected with the support rod 101.

In order to further facilitate the identification of the target cultural relic by an identification worker on the basis of the cultural relic image processing system, the reference image can be marked with sampling points. Based on this, the all-in-one industrial control machine 300 is further configured to display the sampling point on the reference image, and to display a local image corresponding to the target sampling point on the reference image in response to the selection operation on the target sampling point on the reference image, and to display a sub-image corresponding to the target sampling point currently acquired by the digital microscope 200 on the image to be identified.

The sampling points are feature points having a prominent visual feature on the reference image. Specifically, after the integrated industrial control machine 300 acquires the reference image, an identification worker may select tens of feature points with significant visual features on the reference image as sampling points, and acquire a local image of a corresponding area of each sampling point on the reference image through a designated image acquisition device (such as the digital microscope 200 or other image acquisition devices); the designated image acquisition equipment can upload all the acquired local images to the industrial personal computer 300; the appraiser can mark each sampling point on the reference image through the industrial personal computer 300; after the marking is finished, the digital microscope 200 collects an image to be identified of the target cultural relic, and uploads the image to be identified to the industrial control all-in-one machine 300; the all-in-one machine 300 displays sampling points on the reference image, an identification worker can perform selection operation (such as mouse click) on target sampling points on the reference image, the all-in-one machine 300 can display a corresponding local image of the target sampling points on the reference image after responding to the selection operation, and simultaneously display a corresponding sub-image of the target sampling points currently acquired by the digital microscope 200 on the image to be identified, so that the identification worker can perform comparison identification on the local area of the target cultural relic.

Illustratively, for example, as shown in fig. 11, a reference image (i.e., image i) is displayed on a display screen of the integrated industrial personal computer 300, and a sampling point a is located on the image i; the identification worker performs mouse click operation on the sampling point A, the industrial control all-in-one machine 300 displays a corresponding local image (namely an image II) of the sampling point A on the reference image I after corresponding to the operation, and simultaneously displays a corresponding sub-image (namely an image III) of the sampling point A currently acquired by the digital microscope 200 on the image to be identified; and the appraiser can compare and appraise the images II and III.

By adopting the operation mode, the eye of the appraiser can not only see the extremely fine traces on the surface and the surface layer of the cultural relic, but also record the seen traces and compare the traces with the traces of the reference image, thereby obtaining more accurate appraisal results.

In order to further facilitate the comparison and identification of the local region of the target cultural relic, a corresponding auxiliary line can be provided through the industrial control all-in-one machine 300 to assist the identification worker in performing the comparison and identification of the local region of the target cultural relic.

Continuing with the previous example, for example, as shown in fig. 11, the all-in-one industrial personal computer 300 may further divide the image ii and the image iii into a plurality of cells with completely equal sizes during the process of displaying the image ii and the image iii; in addition, the morphology of the object in the real-time image (i.e. image iii) and the morphology of the object in the target image (image ii) can be kept consistent as much as possible by the mobile digital microscope 200 or the mobile target cultural relic, so that the optimal comparison effect is achieved. The size parameters (such as size, aspect ratio, etc.) of the cells may be determined according to actual needs, for example, the size of the cell is 4 × 6, which is not limited herein.

By adopting the operation mode, when the appraiser carries out comparison and appraisal of the target cultural relic, the sight of the appraiser only needs to care about the content in the cell, thereby further reducing the difficulty of the comparison and appraisal of the cultural relic and improving the efficiency of the comparison and appraisal of the cultural relic.

In addition, in order to further reduce the identification workload of the identification workers and improve the accuracy of the identification of the cultural relics, the local images corresponding to the target sampling points on the reference image and the sub-images corresponding to the target sampling points on the image to be identified, which are currently acquired by the digital microscope 200, can be subjected to image alignment and feature point matching through the industrial-control all-in-one machine 300, and the identity identification confidence (also called similarity) between the two images is obtained according to the matching result, so as to represent whether the reference image and the image to be identified belong to the image of the same cultural relic.

Continuing with the previous example, for example, as shown in fig. 11, after displaying the image ii and the image iii, the all-in-one machine 300 also aligns an object in the image ii with an object in the image iii to obtain an image iv corresponding to the image ii and an image v corresponding to the image iii; the industrial personal computer 300 performs characteristic point matching on the image IV and the image V by adopting a characteristic point matching algorithm, wherein characteristic points P1, P2 and P3 on the image IV are correspondingly matched with characteristic points Q1, Q2 and Q3 on the image V respectively; the all-in-one machine 300 also generates an image (i.e., an image vi) representing the feature point matching result, and the displayed content of the image vi includes the number of feature points in the image iv, the number of feature points in the image v, the number of mutually matched feature points in the image iv and the image v, and the similarity between the image iv and the image v.

By adopting the characteristic point matching implementation mode, reliable reference data can be provided for an appraiser, so that the appraiser can reasonably arrange corresponding cultural relic appraisal work according to the characteristic point matching result, and the efficiency and the accuracy of the cultural relic appraisal are improved.

On the basis of the cultural relic image processing system, in order to further prevent the cultural relic identification data from being tampered in one way, the industrial personal computer 300 can be further used for storing the image to be identified and the comparison result of the target cultural relic in the server 400 connected with the industrial personal computer 300 by adopting a block chain storage technology.

For example, the all-in-one industrial personal computer 300 may package the image to be authenticated and the comparison result collected within a preset time period into a data block, generate a corresponding unique hash value for the packaged data block, encrypt the data block with the hash value, and store the encrypted data in an assigned storage node of the server 400; after the next time period of the preset time period, the industrial personal computer 300 may package the data blocks in a similar operation manner and generate corresponding hash values, but it is necessary to connect the hash value corresponding to the data block packaged this time with the hash value of the data block packaged last time, encrypt the data block packaged this time with the connected values, and store the encrypted data in other storage nodes except the designated storage node of the server 400.

The block chain storage mode is adopted to store the images to be identified and the comparison result of the target cultural relics, the evidence storage and the traceability of the data of the whole process of the cultural relics identification can be realized through the block chain, so that the data of the whole process of the cultural relics identification can not be tampered on one side, the data of the whole process of the cultural relics identification can be shared by related parties as electronic evidence, the risk control cost of the cultural relics being borrowed outside the cultural relics collection place is reduced, and the serious accident that the cultural relics are falsely exchanged is avoided.

On the basis of the cultural relic image processing system, in order to further facilitate the industrial control all-in-one machine to acquire the target scale information corresponding to the movable part of the microscope support, the movable part of the microscope support can be further provided with a positioning sensor, and the positioning sensor is connected with the industrial control all-in-one machine and used for sending the target scale information of the movable part to the industrial control all-in-one machine. Of course, on the basis that the positioning sensor is installed on the movable part, the scale information of the movable part can be directly obtained through the positioning sensor without being marked on the movable part.

On the basis of the cultural relic image processing system, in order to further adjust the placement position, the placement angle and the like of the cultural relic in the second cultural relic image acquisition as much as possible to be the same as the first cultural relic image acquisition, the reference image is a global image of the target cultural relic; the global image is used for representing the placing information of the target cultural relic.

The global image may be acquired by the digital microscope 200, or may be acquired by other image acquisition devices, which is not limited herein. For example, the magnification of the digital microscope 200 is set to 1, and the CCD camera 203 is used to take a global picture of a target cultural relic or a plurality of global pictures of the target cultural relics at different angles as the placing guide of the target cultural relic; as another example, a global picture of the target cultural relic is taken by other cameras or global pictures of different angles of a plurality of target cultural relics are taken.

The content of the placing information may include a placing position, a placing angle, and the like of the target cultural relic. For example, the target cultural relic is a cultural relic with a two-dimensional plane structure such as calligraphy and painting, and the placement information mainly comprises the placement position of the target cultural relic; for another example, the target cultural relic is a cultural relic with a three-dimensional structure such as ceramic, and the placement information needs to include the placement position and the placement angle of the target cultural relic in addition to the placement position of the target cultural relic.

By adopting the operation mode, the placement of the target cultural relics can be guided through the global image of the target cultural relics, and the accuracy of the comparison and identification of the cultural relics is further improved.

As another possible implementation manner, in case that the target cultural relic has a small volume, for example, the target cultural relic is a cultural relic with a small volume such as jade, the system may further include a cultural relic positioning bottom plate, and the cultural relic positioning bottom plate is configured with positioning information; the positioning information is used for prompting an appraiser to put the target cultural relic at the position on the cultural relic positioning bottom plate.

The positioning information may include auxiliary information such as linear scales, angular scales, one or more coordinate systems, and the like. The appraiser can dispose the locating information according to the historical relic location bottom plate and adjust the locating position of target historical relic, can improve the accuracy that the appraiser put the target historical relic.

Based on the object image processing system, the embodiment of the application also provides a cultural relic image processing method, the method is applied to the industrial control all-in-one machine 300, the industrial control all-in-one machine 300 is connected with the digital microscope 200 arranged on the microscope support 100, and the movable part of the microscope support 100 is provided with scale marking information; referring to fig. 12, the method includes the steps of:

step S1202, responding to a cultural relic collection task of the target cultural relic, displaying a reference image of the target cultural relic and corresponding collection parameters when the reference image is collected so as to guide the regulation of the microscope support and the regulation of the digital microscope through the reference image and the collection parameters; the acquisition parameters comprise target scale information corresponding to the movable part of the microscope support, magnification factor information of the digital microscope and optical parameter information.

And step S1204, responding to the image to be identified of the target cultural relic uploaded by the digital microscope.

And step S1206, comparing the reference image with the image to be identified, and displaying a comparison result.

According to the cultural relic image processing method provided by the embodiment of the application, the scale marking information is arranged at the movable part of the microscope support, the reference image of the target cultural relic can be associated with the corresponding acquisition parameters when the reference image is acquired, and further when the target cultural relic is subjected to secondary image acquisition, the acquisition parameters are displayed to guide the adjustment of the microscope support and the digital microscope in the secondary image acquisition process, so that the acquired image to be identified is consistent with the reference image, the comparison accuracy can be improved, the image to be identified and the reference image are compared through the industrial control integrated machine, the comparison efficiency is effectively improved, reliable reference data are provided for an identification worker, the fatigue of the identification worker for observing the microscope for a long time is relieved, and the accuracy of the identification result is improved.

The industrial control all-in-one machine is connected with the server, and the method can further comprise the following steps: acquiring a reference image of the target cultural relic and acquisition parameters corresponding to the reference image from the server according to the identification information of the target cultural relic in the cultural relic acquisition task; and the reference image and the acquisition parameters are uploaded to the server in advance by the industrial control all-in-one machine or other industrial control all-in-one machines.

The digital microscope is provided with an LED light source, the LED light source is arranged at the objective lens end of the digital microscope, and the LED light source is connected with the industrial control all-in-one machine, and the method further comprises the following steps: and setting the optical parameters of the LED light source for acquiring the image to be identified according to the optical parameter information corresponding to the reference image.

The step of setting the optical parameters of the LED light source for collecting the image to be identified according to the optical parameter information corresponding to the reference image may include: providing an adjustable range of optical parameters of the LED light source according to the type of the cultural relic to which the target cultural relic belongs; and responding to the parameter adjusting operation aiming at the adjustable range of the light parameter, and setting the light parameter of the LED light source according to the parameter adjusting operation.

The microscope support comprises a support rod with scale information and a first support moving up and down along the support rod; the target scale information includes linear scale information guiding a position of the first bracket in the support bar.

The microscope support also comprises a second support connected with the first support and a third support connected with the second support; the second bracket and the third bracket are connected through a connecting shaft, and the third bracket can rotate around the connecting shaft within a set angle range so as to change the horizontal position of the digital microscope; an angle dial is arranged at the end part of the second support close to the connecting shaft, and an angle pointer mark is arranged at the end part of the third support close to the connecting shaft.

The microscope support also comprises a fourth support connected with the third support; the third support and the fourth support are connected through a connecting shaft, and the third support can rotate around the connecting shaft within a set angle range so as to change the horizontal position of the digital microscope; the target scale information further comprises second angle scale information for guiding the third support to rotate around the connecting shaft. An angle dial is arranged at the end part of the second bracket close to the connecting shaft, and an angle pointer mark is arranged at the end part of the third bracket close to the connecting shaft; the second angle scale information is an angle scale value correspondingly indicated by the angle pointer identification of the third support.

The first bracket and the second bracket are connected through a connecting shaft, and the second bracket can rotate around the connecting shaft within a set angle range so as to change the horizontal position of the digital microscope; the target scale information may further include third angle scale information guiding a rotation angle of the second bracket about the connection shaft. An angle dial is arranged at the end part of the second bracket close to the connecting shaft, and an angle pointer mark is arranged at the end part of the second bracket close to the connecting shaft; the third angle scale information is an angle scale value correspondingly indicated by the angle pointer identification of the second support.

One end of the third bracket is hinged with a connecting block, and a connecting shaft for connecting the third bracket and the second bracket penetrates through the connecting block; the other end of the third bracket is hinged with a connecting block, and a connecting shaft for connecting the third bracket and the fourth bracket penetrates through the connecting block; one end of the third bracket can swing around the connecting block within a set angle range, and the connecting block can swing around the other end of the third bracket within the set angle range so as to change the posture of the digital microscope (specifically, the posture can refer to the orientation of an objective lens end of the digital microscope); the target scale information may further include fourth angle scale information guiding one end of the third support to swing around the connection block and fifth angle scale information guiding the connection block to swing around the other end of the third support. An angle dial is arranged at the upper part of the connecting block close to the end part of the third bracket, and an angle pointer mark is arranged at the end part of the third bracket close to the upper part of the connecting block; the fourth angle scale information is an angle scale value correspondingly indicated by the angle pointer identification of the third support. An angle dial is arranged at the upper part of the connecting block close to the end part of the third bracket, and an angle pointer mark is arranged at the end part of the third bracket close to the upper part of the connecting block; the fifth angle scale information is an angle scale value correspondingly indicated by the angle pointer identification of the third support.

Marking sampling points on the reference image; the method further comprises the following steps: displaying the sampling points on the reference image, responding to the selection operation of the target sampling points on the reference image, displaying the corresponding local image of the target sampling points on the reference image, and displaying the corresponding sub-image of the target sampling points currently acquired by the digital microscope on the image to be identified.

The method further comprises the following steps: and storing the image to be identified of the target cultural relic and the comparison result in a server connected with the industrial personal computer by adopting a block chain storage technology.

A positioning sensor is arranged at the movable part of the microscope bracket and is connected with the industrial control all-in-one machine; the method further comprises the following steps: and receiving the target scale information of the movable part sent by the positioning sensor.

The reference image is a global image of the target cultural relic; the global image is used for representing the placing information of the target cultural relic.

The implementation principle and the generated technical effect of the method for processing the cultural relic image provided by the embodiment of the application are the same as those of the embodiment of the system, and for the sake of brief description, corresponding contents in the embodiment of the system for processing the cultural relic image can be referred to where the embodiment of the method for processing the cultural relic image is not mentioned.

In the description of the present application, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present application. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

Finally, it should be noted that: the above-mentioned embodiments are only specific embodiments of the present application, and are used for illustrating the technical solutions of the present application, but not limiting the same, and the scope of the present application is not limited thereto, and although the present application is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: any person skilled in the art can modify or easily conceive the technical solutions described in the foregoing embodiments or equivalent substitutes for some technical features within the technical scope disclosed in the present application; such modifications, changes or substitutions do not depart from the spirit and scope of the embodiments of the present application and are intended to be covered by the appended claims. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims (16)

1. A cultural relic image processing system, the system comprising: the system comprises a microscope bracket, a digital microscope and an industrial control all-in-one machine, wherein scale marking information is arranged at the movable part of the microscope bracket;

the industrial control all-in-one machine is connected with the digital microscope and used for displaying a reference image of a target cultural relic and corresponding acquisition parameters when the reference image is acquired according to a cultural relic acquisition task of the target cultural relic so as to guide the adjustment of the microscope support and the adjustment of the digital microscope through the reference image and the acquisition parameters; the acquisition parameters comprise target scale information corresponding to the movable part of the microscope support, magnification factor information and optical parameter information of the digital microscope;

the digital microscope is used for collecting an image to be identified of the target cultural relic and uploading the image to be identified to the industrial control all-in-one machine;

and the industrial control all-in-one machine is also used for comparing the reference image with the image to be identified and displaying a comparison result.

2. The system according to claim 1, wherein the industrial-control all-in-one machine is connected to a server and is further configured to acquire a reference image of the target cultural relic and acquisition parameters corresponding to the reference image from the server according to the identification information of the target cultural relic in the cultural relic acquisition task; the reference image and the acquisition parameters are uploaded to the server by the industrial control all-in-one machine or other industrial control all-in-one machines in advance.

3. The system according to claim 1, wherein the digital microscope is provided with an LED light source, the LED light source is disposed at an objective end of the digital microscope, and the LED light source is connected to the industrial personal computer, and the industrial personal computer is further configured to set an optical parameter of the LED light source for acquiring the image to be authenticated according to the optical parameter information corresponding to the reference image.

4. The system of claim 3, wherein the industrial personal computer is further configured to provide an adjustable range of optical parameters of the LED light source according to the cultural relic category to which the target cultural relic belongs; and responding to a parameter adjusting operation aiming at the adjustable range of the light parameter, and setting the light parameter of the LED light source according to the parameter adjusting operation.

5. The system of claim 1, wherein the microscope stand comprises a support bar with scale information and a first support that moves up and down the support bar; the target scale information includes linear scale information guiding a position of the first bracket in the support bar.

6. The system of claim 5, wherein the microscope stand further comprises a second stand connected to the first stand, and a third stand connected to the second stand; the second bracket and the third bracket are connected through a connecting shaft, and the third bracket can rotate around the connecting shaft within a set angle range so as to change the horizontal position of the digital microscope; the end part of the second support close to the connecting shaft is provided with an angle dial, and the end part of the third support close to the connecting shaft is provided with an angle pointer mark.

7. The system of claim 1, wherein the reference image is labeled with sample points; the industrial and control integrated machine is also used for displaying the sampling points on the reference image, responding to the selected operation of the target sampling points on the reference image, displaying the corresponding local image of the target sampling points on the reference image, and displaying the corresponding sub-image of the target sampling points currently acquired by the digital microscope on the image to be identified.

8. The system of claim 1, wherein the all-in-one industrial personal computer is further configured to store the image to be authenticated of the target cultural relic and the comparison result in a server connected to the all-in-one industrial personal computer by using a block chain storage technology.

9. The system of claim 1, wherein a positioning sensor is mounted at the movable part of the microscope stand, and the positioning sensor is connected with the industrial personal computer and used for sending target scale information of the movable part to the industrial personal computer.

10. The system of claim 1, wherein the reference image is a global image of the target cultural relic; the global image is used for representing the placing information of the target cultural relic.

11. The cultural relic image processing method is characterized in that the method is applied to an industrial control all-in-one machine, the industrial control all-in-one machine is connected with a digital microscope arranged on a microscope support, and scale marking information is arranged on the movable part of the microscope support; the method comprises the following steps:

responding to a cultural relic collection task of a target cultural relic, displaying a reference image of the target cultural relic and corresponding collection parameters when the reference image is collected so as to guide the adjustment of the microscope support and the adjustment of the digital microscope through the reference image and the collection parameters; the acquisition parameters comprise target scale information corresponding to the movable part of the microscope support, magnification factor information and optical parameter information of the digital microscope;

responding to the image to be identified of the target cultural relic uploaded by the digital microscope;

and comparing the reference image with the image to be identified, and displaying a comparison result.

12. The method of claim 11, wherein the industrial personal computer is connected to a server, the method further comprising: acquiring a reference image of the target cultural relic and acquisition parameters corresponding to the reference image from the server according to the identification information of the target cultural relic in the cultural relic acquisition task; the reference image and the acquisition parameters are uploaded to the server by the industrial control all-in-one machine or other industrial control all-in-one machines in advance.

13. The method of claim 11, wherein the digital microscope is provided with an LED light source, the LED light source is provided at an objective end of the digital microscope, and the LED light source is connected to the integrated industrial personal computer, the method further comprising: and setting the optical parameters of the LED light source for acquiring the image to be identified according to the optical parameter information corresponding to the reference image.

14. The method of claim 11, wherein the microscope stand comprises a support bar with scale information and a first stand that moves up and down the support bar; the target scale information includes linear scale information guiding a position of the first bracket in the support bar.

15. The method of claim 14, wherein the microscope stand further comprises a second stand connected to the first stand, and a third stand connected to the second stand; the second bracket and the third bracket are connected through a connecting shaft, and the third bracket can rotate around the connecting shaft within a set angle range so as to change the horizontal position of the digital microscope; the second support is close to the tip of connecting axle is provided with the angle calibrated scale, the third support is close to the tip of connecting axle is provided with angle pointer sign.

16. The method according to claim 11, wherein the reference image is labeled with sample points; the method further comprises the following steps: displaying the sampling points on the reference image, responding to the selected operation of the target sampling points on the reference image, displaying the corresponding local image of the target sampling points on the reference image, and displaying the corresponding sub-image of the target sampling points currently acquired by the digital microscope on the image to be identified.

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