CN115097014A - Ultrasonic device for nondestructive testing of thin plate - Google Patents
Ultrasonic device for nondestructive testing of thin plate Download PDFInfo
- Publication number
- CN115097014A CN115097014A CN202210701179.8A CN202210701179A CN115097014A CN 115097014 A CN115097014 A CN 115097014A CN 202210701179 A CN202210701179 A CN 202210701179A CN 115097014 A CN115097014 A CN 115097014A
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- CN
- China
- Prior art keywords
- layer
- electrode coating
- thin plate
- ultrasonic device
- nondestructive testing
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
- 238000009659 non-destructive testing Methods 0.000 title claims abstract description 18
- 239000011248 coating agent Substances 0.000 claims abstract description 48
- 238000000576 coating method Methods 0.000 claims abstract description 48
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 10
- 239000000463 material Substances 0.000 claims description 7
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 5
- 229910052802 copper Inorganic materials 0.000 claims description 5
- 239000010949 copper Substances 0.000 claims description 5
- 229910052759 nickel Inorganic materials 0.000 claims description 5
- 239000000956 alloy Substances 0.000 claims description 4
- 239000007769 metal material Substances 0.000 claims description 4
- 239000000919 ceramic Substances 0.000 claims description 3
- 239000013078 crystal Substances 0.000 claims description 3
- 229910001092 metal group alloy Inorganic materials 0.000 claims description 3
- 229910052763 palladium Inorganic materials 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims description 2
- 239000010410 layer Substances 0.000 claims 25
- 239000011247 coating layer Substances 0.000 claims 1
- 238000012360 testing method Methods 0.000 abstract description 9
- 239000000523 sample Substances 0.000 description 10
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- WSMQKESQZFQMFW-UHFFFAOYSA-N 5-methyl-pyrazole-3-carboxylic acid Chemical compound CC1=CC(C(O)=O)=NN1 WSMQKESQZFQMFW-UHFFFAOYSA-N 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- MNKMDLVKGZBOEW-UHFFFAOYSA-M lithium;3,4,5-trihydroxybenzoate Chemical compound [Li+].OC1=CC(C([O-])=O)=CC(O)=C1O MNKMDLVKGZBOEW-UHFFFAOYSA-M 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 229910000859 α-Fe Inorganic materials 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/023—Solids
- G01N2291/0237—Thin materials, e.g. paper, membranes, thin films
Abstract
The invention discloses an ultrasonic device for nondestructive testing of a thin plate, which comprises: the detecting head, it includes in proper order from the outside inwards: a first layer, a second layer, and a third layer; wherein the inner and outer surfaces of the first layer are both spherical crown surfaces, and the outer surface of the first layer is coated with a first electrode coating and the inner surface of the first layer is coated with a second electrode coating; the second layer is a connecting layer, and the first layer and the third layer are connected through the second layer; the inner surface and the outer surface of the second layer are spherical crown surfaces, and the outer surface of the second layer is tightly attached to the second electrode coating; and the radius of curvature of the outer surface of the second layer is greater than the radius of curvature of the inner surface of the second layer; the third layer is a buffer layer which is a columnar body, the top surface of the third layer is a spherical crown surface, and the top surface is tightly attached to the inner surface of the second layer. The invention provides an ultrasonic device for nondestructive testing of a thin plate, which can enlarge the area of the thin plate to be tested and improve the accuracy of the test.
Description
Technical Field
The invention belongs to the technical field of sheet nondestructive testing devices, and particularly relates to an ultrasonic device for sheet nondestructive testing.
Background
After the thin plate is damaged at a certain position of the structure, the dynamic characteristics of the thin plate are changed, and the most obvious characteristic is that the rigidity of the structure is reduced. With the development of the aerospace, aviation and automobile industries, the demand for metal sheets is increasing, and the fields have extremely high requirements on the rigidity of thin sheets. It is therefore essential to accurately monitor the structural damage of the sheet.
Ultrasonic monitoring is a common nondestructive testing device, but when the existing ultrasonic testing device tests a thin plate, the problems that the testing area is small and the testing result is inaccurate due to the side lobe in the testing image exist.
Disclosure of Invention
The invention aims to provide an ultrasonic device for nondestructive testing of a thin plate, which can increase the area of the thin plate for testing and improve the accuracy of the testing.
The technical scheme provided by the invention is as follows:
an ultrasonic apparatus for non-destructive inspection of thin sheets, comprising:
the detecting head, it includes in proper order from the outside inwards: a first layer, a second layer, and a third layer;
wherein the inner and outer surfaces of the first layer are both spherical crown surfaces, and the outer surface of the first layer is coated with a first electrode coating, and the inner surface of the first layer is coated with a second electrode coating;
the second layer is a connecting layer, and the first layer and the third layer are connected through the second layer;
the inner surface and the outer surface of the second layer are both spherical crown surfaces, and the outer surface of the second layer is tightly attached to the second electrode coating; and the radius of curvature of the outer surface of the second layer is greater than the radius of curvature of the inner surface of the second layer;
the third layer is a buffer layer which is a columnar body, the top surface of the third layer is a spherical crown surface, and the top surface is tightly attached to the inner surface of the second layer.
Preferably, the ultrasonic device for nondestructive testing of a thin plate further comprises: a third electrode coating surrounding-coated on an outer side of the third layer.
Preferably, the first electrode coating is made of a conductive metal material or a metal alloy material.
Preferably, the second layer is made of a metal bonding material.
Preferably, a piezoelectric layer is disposed between the first electrode coating and the second electrode coating.
Preferably, the piezoelectric layer is made of piezoelectric crystal or piezoelectric ceramic.
Preferably, the radius of curvature of the outer surface of the second layer is 1.02 to 1.1 times the radius of curvature of the inner surface of the second layer.
Preferably, the second electrode coating is nickel, copper or palladium.
Preferably, the first electrode coating, the second electrode coating, and the third electrode coating have the same thickness.
The invention has the beneficial effects that:
the invention provides an ultrasonic device for nondestructive testing of a thin plate, which can enlarge the area of the thin plate to be tested and improve the accuracy of the test.
Drawings
FIG. 1 is a schematic diagram of the general structure of an ultrasonic apparatus for nondestructive testing of a thin plate according to the present invention.
Figure 2 is a cross-sectional schematic view of a probe head according to the present invention.
Detailed Description
The present invention is further described in detail below with reference to the attached drawings so that those skilled in the art can implement the invention by referring to the description text.
As shown in fig. 1-2, the present invention provides an ultrasonic apparatus for nondestructive testing of a thin plate, which mainly comprises: a probe head 110 and a host computer 120.
The probe head 110 comprises a first layer 111, a second layer 112 and a third layer 113 from outside to inside in sequence. Both the outer surface and the inner surface of the first layer 111 are spherical crown surfaces protruding to the outer side of the probe 110, and the outer surface of the first layer 111 is uniformly coated with a first electrode coating 1111 and the inner surface of the first layer is uniformly coated with a second electrode coating 1112. The first electrode coating 1111 and the second electrode coating 1112 form two electrodes on the probe head 110, respectively. The first electrode coating 1111 is made of a conductive metal material or a metal alloy material.
As a preferable example, the first electrode coating 1111 is formed of one of gold, silver, copper, and nickel, or an alloy of two or more metals selected from gold, silver, copper, and nickel.
Preferably, the second electrode coating 1112 is made of a metal material selected from nickel, copper, and palladium.
A piezoelectric layer 1113 is provided between the first electrode coating 1111 and the second electrode coating 1112. Both the inner surface and the outer surface of the piezoelectric layer 1113 are spherical crown surfaces, the outer surface of the piezoelectric layer 1113 is tightly attached to the first electrode coating 1111, and the inner surface of the piezoelectric layer 1113 is tightly attached to the second electrode coating 1112. The piezoelectric layer 1113 is made of piezoelectric crystal or piezoelectric ceramic.
Preferably, the piezoelectric layer 1113 is made of lithium gallate, lithium germanate, titanium germanate or lithium tantalate.
By providing the probe 110 with a spherical crown surface at the top, the ultrasonic waves oscillated by the probe 110 can be dispersed over a relatively large range. Therefore, the ultrasonic device can detect a larger detection area, and the detection efficiency is improved.
The second layer 112 is a connection layer, and the first layer 111 and the third layer 113 are connected by the second layer 112. Wherein, both the inner surface and the outer surface of the second layer 112 are spherical cap surfaces, and the outer surface 1121 of the second layer 112 is tightly attached to the second electrode coating 1112; and the radius of curvature of the outer surface 1121 of the second layer 112 is greater than the radius of curvature of the inner surface 1122 of the second layer 112; the thickness of the central region of the second layer 112 is made smaller than the thickness of the edge region of the second layer 112. The thickness of the edge region of the second layer 112 is greater than the thickness of the central region, which can attenuate the vibrations propagating from the center of the probe head 110 to the sides of the probe head 110, and serves to suppress side lobes.
More preferably, the radius of curvature of the outer surface 1121 of the second layer 112 is 1.02 to 1.1 times the radius of curvature of the inner surface 1122 of the second layer 112.
By reasonably setting the multiple relationship between the curvature radius of the outer surface 1121 of the second layer 112 and the curvature radius of the inner surface 1122 of the second layer 112, the second layer 112 can obtain an appropriate thickness variation range, thereby more effectively suppressing side lobes generated by the ultrasonic device and improving the detection accuracy.
The third layer 113 is a buffer layer, and is entirely a column, the top surface of the third layer 113 is a spherical crown surface, the lower portion of the third layer 113 is a cylinder, and the top surface of the third layer 113 is tightly attached to the inner surface 1122 of the second layer 112. The third layer 113 serves to buffer and attenuate the ultrasonic waves emitted from the inner surface of the first layer 111, thereby achieving the purpose of eliminating residual vibration. The third layer 113 may employ ferrite rubber or a porous ceramic material.
The side and bottom surfaces of the cylindrical portion of the third layer 113 near the circular ring portion of the side are coated with a third electrode coating 1131, and the third electrode coating 1131 forms a third electrode of the probe 110.
The material of the third electrode coating 1131 is the same as the material of the second electrode coating 1112. The first electrode coating 1111, the second electrode coating 1112, and the third electrode coating 1131 have the same thickness.
Preferably, the second layer 112 is made of a conductive metal bonding material, and the third electrode coating 1131 and the second electrode coating 1112 are connected through the second layer 112.
Further preferably, solder is used as the bonding material for the second layer 112.
The host computer 120 is used for emitting and controlling ultrasonic waves, and the host computer 120 is electrically connected with the first electrode coating 1111 (first electrode) and the second electrode coating 1112 (second electrode) through the first lead 121; and is electrically connected to the third electrode coating 1131 (third electrode) through the second wire 122.
While embodiments of the invention have been described above, it is not intended to be limited to the details shown, described and illustrated herein, but is to be accorded the widest scope consistent with the principles and novel features herein disclosed, and to such extent that such modifications are readily available to those skilled in the art, and it is not intended to be limited to the details shown and described herein without departing from the general concept as defined by the appended claims and their equivalents.
Claims (9)
1. An ultrasonic apparatus for nondestructive testing of a sheet, comprising:
the detecting head comprises from outside to inside in sequence: a first layer, a second layer, and a third layer;
wherein the inner and outer surfaces of the first layer are both spherical crown surfaces, and the outer surface of the first layer is coated with a first electrode coating and the inner surface of the first layer is coated with a second electrode coating;
the second layer is a connecting layer, and the first layer and the third layer are connected through the second layer;
the inner surface and the outer surface of the second layer are both spherical crown surfaces, and the outer surface of the second layer is tightly attached to the second electrode coating; and the radius of curvature of the outer surface of the second layer is greater than the radius of curvature of the inner surface of the second layer;
the third layer is a buffer layer which is a columnar body, the top surface of the third layer is a spherical crown surface, and the top surface is tightly attached to the inner surface of the second layer.
2. The ultrasonic apparatus for nondestructive inspection of thin plate of claim 1, further comprising: a third electrode coating surrounding-coated on an outer side of the third layer.
3. The ultrasonic device for the nondestructive examination of the thin plate as claimed in claim 2, wherein said first electrode coating layer is made of a conductive metal material or a metal alloy material.
4. The ultrasonic apparatus for nondestructive testing of thin plate of claim 3 wherein said second layer is a metallic bonding material.
5. The ultrasonic device for nondestructive testing of thin plate according to claim 3 or 4, wherein a piezoelectric layer is provided between said first electrode coating and said second electrode coating.
6. The ultrasonic device for the nondestructive examination of a thin plate of claim 5, wherein the material of the piezoelectric layer is piezoelectric crystal or piezoelectric ceramic.
7. The ultrasonic device for nondestructive testing of a thin plate of claim 6 wherein the radius of curvature of the outer surface of said second layer is 1.02 to 1.1 times the radius of curvature of the inner surface of said second layer.
8. The ultrasonic device for nondestructive testing of thin plates of claim 7, wherein said second electrode coating is nickel, copper or palladium.
9. The ultrasonic device for nondestructive testing of thin plate of claim 8 wherein the thickness of said first electrode coating, said second electrode coating and said third electrode coating are the same.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210701179.8A CN115097014A (en) | 2022-06-21 | 2022-06-21 | Ultrasonic device for nondestructive testing of thin plate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210701179.8A CN115097014A (en) | 2022-06-21 | 2022-06-21 | Ultrasonic device for nondestructive testing of thin plate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115097014A true CN115097014A (en) | 2022-09-23 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210701179.8A Pending CN115097014A (en) | 2022-06-21 | 2022-06-21 | Ultrasonic device for nondestructive testing of thin plate |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115097014A (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006334074A (en) * | 2005-06-01 | 2006-12-14 | Matsushita Electric Ind Co Ltd | Ultrasonic probe and ultrasonic diagnostic equipment |
| JP2006339968A (en) * | 2005-06-01 | 2006-12-14 | Matsushita Electric Ind Co Ltd | Ultrasonic search unit and ultrasonic diagnostic device |
| CN104677399A (en) * | 2014-11-24 | 2015-06-03 | 麦克思智慧资本股份有限公司 | Ultrasonic sensor |
| CN112313968A (en) * | 2018-06-25 | 2021-02-02 | 松下知识产权经营株式会社 | Ultrasonic sensor |
| WO2021227261A1 (en) * | 2020-05-15 | 2021-11-18 | 苏州希声科技有限公司 | Flexible ultrasonic probe, ultrasonic imaging measurement system, and measurement method |
| CN215639321U (en) * | 2021-08-13 | 2022-01-25 | 北京信泰智合科技发展有限公司 | Piezoelectric ultrasonic sensor and detection system for high-temperature pipeline |
| EP3971566A1 (en) * | 2020-09-17 | 2022-03-23 | Kabushiki Kaisha Toshiba | Ultrasonic probe and ultrasonic inspection device |
-
2022
- 2022-06-21 CN CN202210701179.8A patent/CN115097014A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006334074A (en) * | 2005-06-01 | 2006-12-14 | Matsushita Electric Ind Co Ltd | Ultrasonic probe and ultrasonic diagnostic equipment |
| JP2006339968A (en) * | 2005-06-01 | 2006-12-14 | Matsushita Electric Ind Co Ltd | Ultrasonic search unit and ultrasonic diagnostic device |
| CN104677399A (en) * | 2014-11-24 | 2015-06-03 | 麦克思智慧资本股份有限公司 | Ultrasonic sensor |
| CN112313968A (en) * | 2018-06-25 | 2021-02-02 | 松下知识产权经营株式会社 | Ultrasonic sensor |
| WO2021227261A1 (en) * | 2020-05-15 | 2021-11-18 | 苏州希声科技有限公司 | Flexible ultrasonic probe, ultrasonic imaging measurement system, and measurement method |
| EP3971566A1 (en) * | 2020-09-17 | 2022-03-23 | Kabushiki Kaisha Toshiba | Ultrasonic probe and ultrasonic inspection device |
| CN215639321U (en) * | 2021-08-13 | 2022-01-25 | 北京信泰智合科技发展有限公司 | Piezoelectric ultrasonic sensor and detection system for high-temperature pipeline |
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