CN114994062B - Method and system for detecting surface quality of material and storage medium - Google Patents
Method and system for detecting surface quality of material and storage medium Download PDFInfo
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- CN114994062B CN114994062B CN202210935669.4A CN202210935669A CN114994062B CN 114994062 B CN114994062 B CN 114994062B CN 202210935669 A CN202210935669 A CN 202210935669A CN 114994062 B CN114994062 B CN 114994062B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8861—Determining coordinates of flaws
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Abstract
The invention is suitable for the technical field of material surface detection, and provides a material surface quality detection method, a system and a storage medium, wherein the method comprises the following steps: collecting and obtaining a material surface picture; emitting detection light by a detection light emitting device, wherein the detection light emitting device moves in the detection process; acquiring whether the reflected light is received in the light receiving area or not by detecting the light receiving device; and when the reflected light is not received in the light receiving area, acquiring the detection position coordinates corresponding to the detected light, and identifying on the corresponding position coordinates of the material surface picture. The detection light ray emitted by the detection light ray emitting device irradiates the surface of the material comprehensively, the detection light ray is reflected after irradiating the surface of the material, and if the surface of the material has no defect, the reflected light ray enters the receiving area of the detection light ray receiving device.
Description
Technical Field
The invention relates to the technical field of material surface detection, in particular to a material surface quality detection method, a material surface quality detection system and a storage medium.
Background
With the continuous deepening and development of high-end manufacturing industry, the manufactured products gradually shift from quantity expansion to quality improvement, and the jump of product competitiveness can be realized. Quality inspection needs to be enhanced to improve product quality, and relatively fine detection needs to be carried out on the surface of the material. The existing detection process for the surface quality of the material needs more steps of human intervention, has limited automation degree, can not directly automatically identify the position with the defect on the surface, and is not convenient to use. Therefore, it is desirable to provide a method, a system and a storage medium for detecting the surface quality of a material, which aim to solve the above problems.
Disclosure of Invention
In view of the defects in the prior art, the present invention provides a method, a system and a storage medium for detecting the surface quality of a material, so as to solve the problems in the background art.
The invention is realized in such a way that a material surface quality detection method comprises the following steps:
collecting and obtaining a material surface picture;
the detection light ray is emitted by the detection light ray emitting device, and the detection light ray emitting device moves in the detection process so as to ensure that the detection light ray can comprehensively detect the surface of the material;
acquiring whether reflected light is received in a light receiving area or not by a detection light receiving device, wherein the detection light receiving device moves synchronously along with the detection light receiving device;
and when the reflected light is not received in the light receiving area, acquiring the detection position coordinates corresponding to the detected light, and identifying on the corresponding position coordinates of the material surface picture.
As a further scheme of the invention: the step of emitting the detection light by the detection light emitting device specifically includes:
receiving an operation program of a detection light emitting device, wherein the operation program comprises an operation speed and an operation direction;
starting a detection light emitting device and a driving device, wherein the driving device enables the detection light emitting device to move according to an operation program;
and obtaining the detection position coordinates of the detection light in real time according to the running program.
As a further scheme of the invention: the step of detecting whether the light receiving device receives the reflected light at the light receiving area specifically includes:
receiving a range determination value of the light receiving area;
determining the area of the light receiving area according to the range determination value;
and judging whether the light receiving area on the light receiving device continuously receives the reflected light.
As a further scheme of the invention: when the reflected light is not received in the light receiving area, the detection position coordinates corresponding to the detected light are obtained, and the step of marking is carried out on the corresponding position coordinates of the material surface picture, which specifically comprises the following steps:
when the light receiving area on the light receiving device is detected to have certain moment and not receive the reflected light, recording the corresponding moment;
acquiring the detection position coordinates corresponding to the detection light according to the moment, wherein when the detection is started, the running program is attached with time information, and the detection position coordinates can be obtained according to the time information;
and identifying the corresponding position coordinates of the material surface picture.
As a further scheme of the invention: the method further comprises the following steps: and after the operation of the light emitting device is detected, judging whether the detected material needs to be scrapped or not.
As a further scheme of the invention: the step of determining whether the detected material needs to be scrapped specifically includes:
receiving a quantity threshold;
counting the number of the position coordinates of the marks to obtain a defect number value;
and comparing the defect quantity value with a quantity threshold value to obtain whether scrapping treatment is required.
It is another object of the present invention to provide a material surface quality inspection system, the system comprising:
the picture acquisition module is used for acquiring and obtaining a material surface picture;
the detection light emitting module is used for emitting detection light through the detection light emitting device, and the detection light emitting device moves in the detection process so as to ensure that the detection light can comprehensively detect the surface of the material;
the device comprises a reflected light ray detection module, a light ray detection module and a light ray detection module, wherein the reflected light ray detection module is used for acquiring whether reflected light rays are received in a light ray receiving area or not through a detected light ray receiving device, and the detected light ray receiving device moves synchronously along with the detected light ray receiving device;
and the defect identification module is used for acquiring the detection position coordinates corresponding to the detection light rays when the reflected light rays are not received in the light ray receiving area, and identifying the position coordinates corresponding to the material surface picture.
As a further scheme of the invention: the detection light emitting module includes:
the running program receiving unit is used for receiving a running program of the detection light emitting device, and the running program comprises a running speed and a running direction;
the emission driving starting unit is used for starting the detection light emitting device and the driving device, and the driving device enables the detection light emitting device to move according to the running program;
and the detection position coordinate determination unit is used for obtaining the detection position coordinates of the detection light rays in real time according to the running program.
As a further scheme of the invention: the reflected light detection module includes:
a range value receiving unit for receiving a range determination value of the light receiving area;
a receiving area region determining unit for determining a region area of the light receiving area according to the range determination value;
and a reflected light detection unit for determining whether the light receiving area on the light receiving device continuously receives the reflected light.
Another object of the present invention is to provide a readable storage medium, on which a program or instructions are stored, which when executed by a processor implement the steps of the material surface quality detection method.
Compared with the prior art, the invention has the beneficial effects that:
the detection light emitted by the detection light emitting device irradiates the surface of a material comprehensively, the detection light is reflected after irradiating the surface of the material, if the surface of the material has no defect, the reflected light enters a receiving area of the detection light receiving device, the detection light receiving device moves synchronously along with the detection light receiving device, if the reflected light is not received in the light receiving area, the surface of the material has defects, such as scratches and unevenness, and the original angle of the reflected light is changed, at the moment, the detection position coordinate corresponding to the detection light is automatically obtained, and the identification is carried out on the corresponding position coordinate of the picture on the surface of the material; the invention can carry out high-precision detection on the surface of the material, automatically marks the position with the defect on the surface of the material and is convenient to use.
Drawings
FIG. 1 is a flow chart of a method for detecting the surface quality of a material.
FIG. 2 is a schematic diagram of the detection in a material surface quality detection method.
Fig. 3 is a flowchart of a method for detecting surface quality of a material by emitting detection light by a detection light emitting device.
Fig. 4 is a flowchart illustrating a method for detecting surface quality of a material by detecting a light receiving device to determine whether reflected light is received in a light receiving area.
Fig. 5 is a flowchart of identifying corresponding position coordinates of a material surface picture in a material surface quality detection method.
Fig. 6 is a flowchart of a method for determining whether a detected material needs to be scrapped in a material surface quality detection method.
Fig. 7 is a schematic structural diagram of a material surface quality detection system.
FIG. 8 is a schematic structural diagram of a light-emitting module in a material surface quality detection system.
Fig. 9 is a schematic structural diagram of a reflected light detection module in a material surface quality detection system.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more clear, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Specific implementations of the present invention are described in detail below with reference to specific embodiments.
As shown in fig. 1, an embodiment of the present invention provides a method for detecting a surface quality of a material, where the method includes the following steps:
s100, collecting and obtaining a material surface picture;
s200, emitting detection light through a detection light emitting device, wherein the detection light emitting device moves in the detection process so as to ensure that the detection light can comprehensively detect the surface of a material;
s300, acquiring whether the reflected light is received in a light receiving area or not through a detection light receiving device, wherein the detection light receiving device moves synchronously along with the detection light receiving device;
s400, when the reflected light is not received in the light receiving area, the detection position coordinates corresponding to the detected light are obtained, and identification is carried out on the corresponding position coordinates of the material surface picture.
It should be noted that, with the deepening and development of high-end manufacturing industry, the manufactured products gradually shift from quantity increase to quality increase, and the jump of product competitiveness can be realized. Quality inspection needs to be enhanced to improve product quality, and relatively fine detection needs to be carried out on the surface of the material. The existing detection process for the surface quality of the material needs a plurality of human intervention steps, and the part with the surface defect cannot be directly and automatically identified.
In the embodiment of the invention, firstly, a material to be detected is placed on a detection platform, a material surface picture is acquired through a picture acquisition device arranged on the detection platform, then detection can be formally started, a detection light emitting device is started, the detection light emitting device emits detection light to irradiate the material surface, the detection light emitting device moves in the detection process to ensure that the detection light can comprehensively detect the material surface, the detection light reflects after irradiating the material surface, if the material surface has no defects, the reflection light enters a receiving area of the detection light receiving device, the detection light receiving device and the detection light emitting device are fixedly connected, the detection light receiving device moves synchronously along with the detection light receiving device, if the reflection light is not received in the light receiving area, defects such as scratches and unevenness exist on the material surface, and the original angle of the reflection light is changed, at the moment, the embodiment of the invention automatically acquires detection position coordinates corresponding to the detection light, marks on the corresponding position coordinates of the material surface picture, the position irradiated on the material surface is detected to be the detection position coordinates, the embodiment of the invention can automatically mark the material surface with high accuracy, and is suitable for the invention, for example, the invention.
As shown in fig. 2 and fig. 3, as a preferred embodiment of the present invention, the step of emitting the detection light by the detection light emitting device specifically includes:
s201, receiving an operation program of the detection light emitting device, wherein the operation program comprises an operation speed and an operation direction, and the real-time coordinate of the detection light emitting device is conveniently determined;
s202, starting a detection light emitting device and a driving device, wherein the driving device enables the detection light emitting device to move according to an operation program;
and S203, obtaining the detection position coordinates of the detection light in real time according to the running program.
In the embodiment of the present invention, in order to ensure that the detection light can comprehensively detect the surface of the material, an operation program needs to be written in advance according to the shape of the surface of the material, the operation program is uploaded to a driving device, and then the detection light emitting device and the driving device are started, so that the driving device can move the detection light emitting device according to the operation program, the driving device can at least drive the detection light emitting device in the x direction and the y direction, and then the detection position coordinates of the detection light are obtained in real time according to the operation program, so that it is easy to understand that the operation plane of the detection light emitting device is parallel to the detection surface of the material, the emission angle of the detection light is kept fixed, the detection position coordinates are easily obtained according to the position of the detection light emitting device, and a detection position coordinate determination formula is written in advance, for example, a represents the detection light emitting device, B represents the detection light receiving device, the height of the detection light emitting device from the surface of the material is H, the emission angle of the detection light is Q, the coordinates of a is (x, y), the detection position coordinates are (x + H, tan Q, y) on the plane are used for reflecting no height information.
As shown in fig. 4, as a preferred embodiment of the present invention, the step of obtaining whether the reflected light is received at the light receiving area by detecting the light receiving device specifically includes:
s301, receiving a range determination value of a light receiving area;
s302, determining the area of the light receiving area according to the range determination value;
s303, judging whether the light receiving area on the light receiving device continuously receives the reflected light.
In the embodiment of the invention, the size of the light receiving area on the detection light receiving device can be adjusted, so that the detection precision is higher as the light receiving area is smaller, the detection device is suitable for detecting the surfaces of materials with different precision requirements, the range determination value of the light receiving area is preset, the area of the light receiving area is determined according to the range determination value, and then whether the light receiving area on the detection light receiving device continuously receives the reflected light is judged during formal detection.
As shown in fig. 5, as a preferred embodiment of the present invention, the step of obtaining the detection position coordinates of the corresponding detection light when the reflected light is not received in the light receiving area, and identifying the corresponding position coordinates of the material surface picture specifically includes:
s401, when the light receiving area on the light receiving device is detected to have certain moment and not receive the reflected light, recording the corresponding moment;
s402, acquiring the detection position coordinates corresponding to the detection light according to the time, wherein when the detection is started, the running program is attached with time information, and the detection position coordinates can be obtained according to the time information;
and S403, marking on the corresponding position coordinates of the material surface picture.
In the embodiment of the invention, when the light receiving area on the detection light receiving device does not receive the reflected light at a certain moment, the reflected light does not enter the light receiving area at the moment, the corresponding moment is recorded, the detection position coordinate corresponding to the detection light is obtained according to the moment, when the detection light emitting device and the driving device are started, the running program is attached with time information, the detection position coordinate can be obtained according to the time information, and finally, the corresponding position coordinate of the material surface picture is marked, and the material surface picture is provided with a coordinate system.
As shown in fig. 6, as a preferred embodiment of the present invention, the method further includes: after the operation of the light emitting device is detected, whether the detected material needs to be scrapped or not is judged, and the method specifically comprises the following steps:
s501, receiving a quantity threshold;
s502, counting the number of the position coordinates of the identifier to obtain a defect number value;
s503, comparing the defect quantity value with a quantity threshold value to obtain whether the scrapping treatment is required.
In the embodiment of the invention, it is easy to understand that if the surface of a large material has only a few defects, the material can be used or can be subjected to rework and repair treatment, and only when the number of the defects is large, the material needs to be directly scrapped.
As shown in fig. 7, an embodiment of the present invention further provides a system for detecting a surface quality of a material, where the system includes:
the picture acquisition module 100 is used for acquiring and obtaining a material surface picture;
the detection light emitting module 200 is used for emitting detection light through a detection light emitting device, and the detection light emitting device moves in the detection process so as to ensure that the detection light can comprehensively detect the surface of the material;
a reflected light detection module 300, configured to obtain whether a reflected light is received at a light receiving area by a detection light receiving device, where the detection light receiving device moves synchronously with the detection light receiving device;
and a defect identification module 400, which acquires the detection position coordinates corresponding to the detection light when the reflected light is not received in the light receiving area, and identifies the position coordinates corresponding to the material surface picture.
In the embodiment of the invention, firstly, a material to be detected is placed on a detection platform, a material surface picture is acquired, then, detection can be formally started, a detection light emitting device is started, the detection light emitting device emits detection light to irradiate the material surface, it is required to be explained that the detection light emitting device moves in the detection process to ensure that the detection light can comprehensively detect the material surface, the detection light reflects after irradiating the material surface, if no defect exists on the material surface, the reflection light enters a receiving area of a detection light receiving device, the detection light receiving device and the detection light emitting device are fixedly connected, the detection light receiving device moves synchronously along with the detection light receiving device, if the reflection light is not received in the light receiving area, the material surface has defects such as scratches and unevenness, and the original angle of the reflection light is changed, at the moment, the embodiment of the invention automatically acquires the detection position coordinates corresponding to the detection light, the position where the detection light irradiates the material surface picture is the detection position coordinates, and the embodiment of the invention can carry out high-precision detection on the material surface, and is suitable for example, for the invention, and the invention can carry out automatic detection on the screen surface defects.
As shown in fig. 8, as a preferred embodiment of the present invention, the detection light emitting module 200 includes:
an operating program receiving unit 201, configured to receive an operating program of the detection light emitting device, where the operating program includes an operating speed and an operating direction;
an emission drive starting unit 202 for starting the detection light emitting device and a driving device which moves the detection light emitting device according to the operation program;
and a detection position coordinate determination unit 203 for obtaining the detection position coordinates of the detection light in real time according to the running program.
In the embodiment of the invention, in order to ensure that the detection light can comprehensively detect the surface of the material, an operation program is compiled in advance according to the shape of the surface of the material, the operation program is uploaded to the driving device, and then the detection light emitting device and the driving device are started, so that the driving device can move the detection light emitting device according to the operation program, the driving device can at least drive the detection light emitting device in the x direction and the y direction, and then the detection position coordinates of the detection light are obtained in real time according to the operation program, so that the detection light emitting device is easy to understand, the operation plane of the detection light emitting device is parallel to the detection surface of the material, the emission angle of the detection light is kept fixed, the detection position coordinates are easily obtained according to the position of the detection light emitting device, and a detection position coordinate determination formula is compiled in advance.
As shown in fig. 9, as a preferred embodiment of the present invention, the reflected light detecting module 300 includes:
a range value receiving unit 301 for receiving a range determination value of the light receiving area;
a receiving area region determining unit 302 for determining a region area of the light receiving area according to the range determination value;
and a reflected light detecting unit 303 for determining whether the light receiving area on the light receiving device continuously receives the reflected light.
In the embodiment of the invention, the size of the light receiving area on the detection light receiving device can be adjusted, so that the detection precision is higher as the light receiving area is smaller, the detection device is suitable for detecting the surfaces of materials with different precision requirements, the range determination value of the light receiving area is preset, the area of the light receiving area is determined according to the range determination value, and then whether the light receiving area on the detection light receiving device continuously receives the reflected light is judged during formal detection.
The embodiment of the invention also provides a readable storage medium, wherein a program or an instruction is stored on the readable storage medium, and the program or the instruction is executed by a processor to realize the steps of the material surface quality detection method.
The present invention has been described in detail with reference to the preferred embodiments thereof, and it should be understood that the invention is not limited thereto, but is intended to cover modifications, equivalents, and improvements within the spirit and scope of the present invention.
It should be understood that, although the steps in the flowcharts of the embodiments of the present invention are shown in sequence as indicated by the arrows, the steps are not necessarily performed in sequence as indicated by the arrows. The steps are not limited to being performed in the exact order illustrated and, unless explicitly stated herein, may be performed in other orders. Moreover, at least a portion of the steps in various embodiments may include multiple sub-steps or multiple stages that are not necessarily performed at the same time, but may be performed at different times, and the order of performance of the sub-steps or stages is not necessarily sequential, but may be performed in turn or alternately with other steps or at least a portion of the sub-steps or stages of other steps.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by a computer program, which can be stored in a non-volatile computer-readable storage medium, and can include the processes of the embodiments of the methods described above when the program is executed. Any reference to memory, storage, database or other medium used in the embodiments provided herein can include non-volatile and/or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically Programmable ROM (EPROM), electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double Data Rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous Link DRAM (SLDRAM), rambus (Rambus) direct RAM (RDRAM), direct Rambus Dynamic RAM (DRDRAM), and Rambus Dynamic RAM (RDRAM), among others.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure herein. This application is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice in the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
Claims (6)
1. A method for detecting the surface quality of a material, which is characterized by comprising the following steps:
collecting and obtaining a material surface picture;
the detection light ray emitting device emits detection light rays, and the detection light ray emitting device moves in the detection process so as to ensure that the detection light rays can comprehensively detect the surface of the material;
acquiring whether reflected light is received in a light receiving area or not by a detection light receiving device, wherein the detection light receiving device moves synchronously along with the detection light receiving device;
when the reflected light is not received in the light receiving area, obtaining detection position coordinates corresponding to the detected light, and marking on the corresponding position coordinates of the material surface picture;
wherein, through the step of detecting light emission device transmission detection light, specifically include: receiving an operation program of a detection light emitting device, wherein the operation program comprises an operation speed and an operation direction; starting a detection light emitting device and a driving device, wherein the driving device enables the detection light emitting device to move according to an operation program; obtaining the detection position coordinates of the detection light in real time according to the running program; the driving device can drive the detection light emitting device in the x direction and the y direction, and then the detection position coordinates of the detection light are obtained in real time according to the running program; the running plane of the detection light emitting device is parallel to the material detection surface, the emission angle of the detection light is fixed, the detection position coordinate is obtained according to the position of the detection light emitting device, specifically, if A represents the detection light emitting device, B represents the detection light receiving device, the height of the detection light emitting device from the material surface is H, the emission angle of the detection light is Q, the coordinate of A is (x, y), the detection position coordinate is (x + H tan Q, y), and the coordinate represents the position on the plane and does not reflect height information;
wherein, whether the step of receiving the reflection light at the light receiving area is obtained through detecting the light receiving device specifically includes: receiving a range determination value of the light receiving area; determining the area of the light receiving area according to the range determination value; and judging whether the light receiving area on the light receiving device continuously receives the reflected light.
2. The method for detecting the surface quality of the material according to claim 1, wherein the step of obtaining the detection position coordinates of the corresponding detection light when the reflected light is not received in the light receiving area and identifying the corresponding position coordinates of the material surface picture comprises:
when the light receiving area on the light receiving device is detected to have certain moment and not receive the reflected light, recording the corresponding moment;
acquiring detection position coordinates corresponding to the detection light according to the moment, attaching time information to the running program when the detection is started, and acquiring the detection position coordinates according to the time information;
and identifying the corresponding position coordinates of the material surface picture.
3. The method for detecting the surface quality of the material as claimed in claim 1, wherein the method further comprises: and after the operation of the light emitting device is detected, judging whether the detected material needs to be scrapped or not.
4. The method for detecting the surface quality of the material as claimed in claim 3, wherein the step of determining whether the detected material needs to be scrapped specifically comprises:
receiving a quantity threshold;
counting the number of the position coordinates of the marks to obtain a defect number value;
and comparing the defect quantity value with a quantity threshold value to obtain whether scrapping treatment is required.
5. A material surface quality inspection system, the system comprising:
the picture acquisition module is used for acquiring and obtaining a material surface picture;
the detection light emitting module is used for emitting detection light through the detection light emitting device, and the detection light emitting device moves in the detection process so as to ensure that the detection light can comprehensively detect the surface of the material;
the reflected light detection module is used for acquiring whether the reflected light is received in the light receiving area or not through the detection light receiving device, and the detection light receiving device moves synchronously along with the detection light receiving device;
the defect identification module is used for acquiring the detection position coordinates corresponding to the detection light rays when the reflected light rays are not received in the light ray receiving area, and identifying the position coordinates corresponding to the material surface picture;
wherein, the detection light emission module includes: the running program receiving unit is used for receiving a running program of the detection light emitting device, and the running program comprises a running speed and a running direction; the emission driving starting unit is used for starting the detection light emitting device and the driving device, and the driving device enables the detection light emitting device to move according to the running program; the detection position coordinate determination unit is used for obtaining the detection position coordinates of the detection light rays in real time according to the running program; the driving device can drive the detection light emitting device in the x direction and the y direction, and then the detection position coordinates of the detection light are obtained in real time according to the running program; the running plane of the detection light emitting device is parallel to the material detection surface, the emission angle of the detection light is fixed, the detection position coordinate is obtained according to the position of the detection light emitting device, specifically, if A represents the detection light emitting device, B represents the detection light receiving device, the height of the detection light emitting device from the material surface is H, the emission angle of the detection light is Q, the coordinate of A is (x, y), the detection position coordinate is (x + H tan Q, y), and the coordinate represents the position on the plane and does not reflect height information;
wherein, the reflection ray detection module includes: a range value receiving unit for receiving a range determination value of the light receiving area; a receiving area region determining unit for determining a region area of the light receiving area according to the range determination value; and a reflected light detection unit for determining whether the light receiving area on the light receiving device continuously receives the reflected light.
6. A readable storage medium, characterized in that it stores thereon a program or instructions which, when executed by a processor, implement the steps of the material surface quality detection method according to any one of claims 1 to 4.
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Citations (7)
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| CN101339143A (en) * | 2007-07-06 | 2009-01-07 | 奥林巴斯株式会社 | Appearance inspecting device for substrate |
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