CN114978365B - Multi-node time-frequency signal inspection and data processing method based on center reference - Google Patents
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- 238000012545 processing Methods 0.000 claims description 35
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/11—Monitoring; Testing of transmitters for calibration
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
- H04B17/21—Monitoring; Testing of receivers for calibration; for correcting measurements
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- H—ELECTRICITY
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- H04B17/30—Monitoring; Testing of propagation channels
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- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
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Abstract
The invention provides a multi-node time-frequency signal inspection and data processing method based on a center reference, which realizes inspection tests on indexes such as time delay, phase noise, frequency stability and the like of multi-node time-frequency signals by utilizing a time-frequency signal inspection device with time keeping capability by means of high-precision time-frequency signals of a high-stability center reference, can effectively solve the problem that a large number of nodes lack of time-frequency references and are difficult to perform accurate test on the time-frequency signals, and can provide high-time-frequency signal test guarantee and service for various electronic information systems.
Description
Technical Field
The invention relates to the field of time-frequency signal testing, in particular to a multi-node time-frequency signal inspection and data processing method based on a central reference.
Background
Electronic information systems often have large ground support systems, and cooperative operation of complex and large ground systems requires multiple types of time-frequency equipment support. In order to maintain accuracy, stability and synchronization performance of the time-frequency signal, it is necessary to perform inspection maintenance on the time-frequency devices distributed in the ground system. Currently, the high-precision measurement method facing the inspection and maintenance requirements is less, and the method for constructing additional time comparison measurement links or carrying clocks to carry out inspection quantity on various time-frequency devices distributed in a ground system is generally adopted, and the clock difference data, the phase noise data and the frequency stability data obtained by measurement are generally processed by adopting a method for measuring for a plurality of times and then obtaining the average value of the clock difference data, the phase noise data and the frequency stability data. Due to the multi-node and relatively far-distance distributivity of various complicated and huge ground systems in physical space, the workload and time consumption of measurement can be increased by multiple times or several times when repeated measurement is carried out no matter additional time is built to compare the measurement link or the measurement is carried out by adopting a carrying clock. Even, as the measurement time is lengthened, early measurement data has approached failure or has failed, resulting in a deterioration of the measurement result after the mean value processing. Therefore, a method for implementing inspection measurement of various time-frequency devices distributed in a ground system by single measurement and superposition of advanced data processing strategies is needed.
Disclosure of Invention
In view of the above, the invention provides a multi-node time-frequency signal inspection and data processing method based on a central reference aiming at the inspection and maintenance requirements of a large number of time-frequency devices of an electronic information system, and can realize inspection calibration of indexes such as time delay, phase noise, frequency stability and the like of time-frequency signals.
The purpose of the invention is realized in the following way:
a multinode time-frequency signal inspection and data processing method based on center reference, the method uses the time-frequency signal inspection device with time keeping capability to realize the inspection test of time delay, phase noise and frequency stability of multinode time-frequency signal by means of the high precision time-frequency signal of high stable center reference; the method comprises the following steps:
(1) Calibrating an initial value of the time-frequency signal inspection device at a central reference; the specific method is as follows:
1pps of inspection device acquired by using time interval counter XJ With a central time-frequency reference of 1pps Ref The time difference of (2) is stored in a data processing computer, the data acquisition frequency is 1 time/second, the data acquisition length is L, and L is more than or equal to 9 and is an odd number, so as to obtain { t } s1 ,t s2 ,…,t sL Time difference data { Δt } corresponding to time instant s1 ,Δt s2 ,…,Δt sL }；
(2) Performing inspection of time delay indexes on a node i, wherein i is a positive integer, i is more than or equal to 1 and less than or equal to N, and N is the number of all nodes needing inspection; the specific method is as follows:
measuring 1pps to be measured by using time interval counter i 1pps with inspection device XJ And store the time difference in (2) in a data processing computer, and data acquisitionThe collection frequency is 1 time/second, the data acquisition length is L, and { t } i1 ,t i2 ,…,t iL Time difference data { Δt } corresponding to time instant i1 ,Δt i2 ,…,Δt iL }；
(3) Performing inspection of the phase noise index at the node i; the specific method is as follows:
measuring 10MHz by inspection device i 10MHz relative to inspection device Ref And storing the phase noise into a data processing computer, and measuring M times, wherein M is more than or equal to 3 and is an odd number, so as to obtain M groups of phase noise data:
{(α i11 @1Hz),(α i12 @10Hz),(α i13 @100Hz),(α i14 @1kHz),(α i15 @10kHz)}
{(α i21 @1Hz),(α i22 @10Hz),(α i23 @100Hz),(α i24 @1kHz),(α i25 @10kHz)}
......
{(α iM1 @1Hz),(α iM2 @10Hz),(α iM3 @100Hz),(α iM4 @1kHz),(α iM5 @10kHz)}
each set of data includes 1Hz, 10Hz, 100Hz, 1kHz, 10kHz phase noise;
(4) Performing inspection of the frequency stability index at the node i; the specific method is as follows:
measuring 10MHz by inspection device i 10MHz relative to inspection device Ref And storing the frequency stability of the frequency stability data into a data processing computer, and measuring M times to obtain M groups of frequency stability data:
{(β i11 @1s),(β i12 @10s),(β i13 @100s),(β i14 @1000s),(β i15 @10000s)}
{(β i21 @1s),(β i22 @10s),(β i23 @100s),(β i24 @1000s),(β i25 @10000s)}
......
{(β iM1 @1s),(β iM2 @10s),(β iM3 @100s),(β iM4 @1000s),(β iM5 @10000s)}
each set of data includes a frequency stability of 1s, 10s, 100s, 1000s, 10000 s;
(5) Repeating the steps (2) - (4) until the inspection tasks of all N nodes are completed;
(6) Returning to the center reference, and calibrating the final value of the time-frequency signal inspection device; the specific method is as follows:
1pps of inspection device acquired by using time interval counter XJ With a central time-frequency reference of 1pps Ref The time difference of (2) is stored in a data processing computer, the data acquisition frequency is 1 time/second, the data acquisition length is L, and { t } e1 ,t e2 ,…,t eL Time difference data { Δt } corresponding to time instant e1 ,Δt e2 ,…,Δt eL }；
(7) Processing the time delay data of all the nodes to obtain 1pps of all the nodes i 1pps relative to the center reference Ref Is a delay value of (2);
(8) Processing the phase noise data of all nodes to obtain 10MHz of all nodes i 10MHz relative to center reference Ref Is a phase noise value of (1);
(9) Processing the frequency stability data of all nodes to obtain 10MHz of all nodes i 10MHz relative to center reference Ref Frequency stability values of (2).
Further, the specific mode of the step (7) is as follows:
(701) For the initial value time difference data { delta t of the inspection device s1 ,Δt s2 ,…,Δt sL Weighted average:
(702) Final value time difference data { delta t for inspection device e1 ,Δt e2 ,…,Δt eL Weighted average:
(703) On the premise that the time difference offset of the default inspection device is linear, deltat s Corresponding time t s,(L+1)/2 ，Δt e Corresponding time t e,(L+1)/2 The frequency deviation of the inspection device is calculated as follows:
thus, the inspection device 1pps XJ 1pps relative to the center reference Ref Is expressed as:
(704) Correcting the delay data of the node i:
thus, the delay value of node i is obtained as:
(705) Step 704 is repeated until the time delay data correction of all N nodes is completed.
Further, the specific mode of the step (8) is as follows:
(801) Weighting the phase noise data of the node i:
the obtained phase noise of the node i measured 10MHz is:
{(α i1 @1Hz),(α i2 @10Hz),(α i3 @100Hz),(α i4 @1kHz),(α i5 @10kHz)}；
(802) Step (801) is repeated until correction of the phase noise data of all N nodes is completed.
Further, the specific mode of the step (9) is as follows:
(901) And (3) weighting the frequency stability data of the node i:
the frequency stability of the node i measured 10MHz is obtained as follows:
{(β i1 @1s),(β i2 @10s),(β i3 @100s),(β i4 @1000s),(β i5 @10000s)}；
(902) And (3) repeating the step (901) until the correction of the frequency stability data of all N nodes is completed.
The invention has the beneficial effects that:
the invention realizes the inspection test of the indexes such as time delay, phase noise, frequency stability and the like of the multi-node time-frequency signal by utilizing the time-frequency signal inspection device with time keeping capability by means of the high-precision time-frequency signal of the high-stability center reference, solves the problem that a large number of nodes lack the time-frequency reference and are difficult to perform the accurate test of the time-frequency signal, and can provide high time-frequency signal test guarantee and service for various electronic information systems.
Drawings
FIG. 1 is a flow chart of a patrol test according to an embodiment of the invention.
Detailed Description
The invention will be further described with reference to the accompanying drawings.
A multi-node time-frequency signal inspection and data processing method based on a central reference can realize inspection and data processing with the delay data length of L and the phase noise and frequency stability data group number of M for N nodes. The method comprises the following steps:
(1) And calibrating an initial value of the time-frequency signal inspection device at the center reference.
1pps of inspection device acquired by using time interval counter XJ With a central time-frequency reference of 1pps Ref The time difference of (2) is stored in a data processing computer, the data acquisition frequency is 1 time/second, the data acquisition length is L (the odd number of L is more than or equal to 9), and { t) s1 ,t s2 ,…,t sL Time difference data { Δt } corresponding to time instant s1 ,Δt s2 ,…,Δt sL }。
(2) And (3) performing inspection of the time delay index on the node i (i is a positive integer, i is more than or equal to 1 and less than or equal to N, and N is the number of all nodes needing inspection).
Measuring 1pps to be measured by using time interval counter i 1pps with inspection device XJ The time difference of (2) is stored in a data processing computer, the data acquisition frequency is 1 time/second, the data acquisition length is L, and { t } i1 ,t i2 ,…,t iL Time difference data { Δt } corresponding to time instant i1 ,Δt i2 ,…,Δt iL }。
(3) And (5) performing inspection of the phase noise index at the node i.
Measuring 10MHz by inspection device i 10MHz relative to inspection device Ref And storing the phase noise into a data processing computer, and measuring M times (M is not less than 3 odd numbers) to obtain M groups of phase noise data:
{(α i11 @1Hz),(α i12 @10Hz),(α i13 @100Hz),(α i14 @1kHz),(α i15 @10kHz)}
{(α i21 @1Hz),(α i22 @10Hz),(α i23 @100Hz),(α i24 @1kHz),(α i25 @10kHz)}
......
{(α iM1 @1Hz),(α iM2 @10Hz),(α iM3 @100Hz),(α iM4 @1kHz),(α iM5 @10kHz)}。
(4) And (5) carrying out inspection of the frequency stability index at the node i.
Measuring 10MHz by inspection device i 10MHz relative to inspection device Ref And storing the frequency stability of the frequency stability data into a data processing computer, and measuring M times to obtain M groups of frequency stability data:
{(β i11 @1s),(β i12 @10s),(β i13 @100s),(β i14 @1000s),(β i15 @10000s)}
{(β i21 @1s),(β i22 @10s),(β i23 @100s),(β i24 @1000s),(β i25 @10000s)}
......
{(β iM1 @1s),(β iM2 @10s),(β iM3 @100s),(β iM4 @1000s),(β iM5 @10000s)}。
(5) Repeating the steps (2) - (4) until the inspection tasks of all N nodes are completed.
(6) And returning to the center reference, and calibrating the final value of the time-frequency signal inspection device.
1pps of inspection device acquired by using time interval counter XJ With a central time-frequency reference of 1pps Ref The time difference of (2) is stored in a data processing computer, the data acquisition frequency is 1 time/second, the data acquisition length is L (the odd number of L is more than or equal to 9), and { t) e1 ,t e2 ,…,t eL Time difference data { Δt } corresponding to time instant e1 ,Δt e2 ,…,Δt eL }。
(7) Processing the time delay data of all the nodes to obtain 1pps of all the nodes i 1pps relative to the center reference Ref Is a delay value of (a).
(8) Processing the phase noise data of all nodes to obtain 10MHz of all nodes i 10MHz relative to center reference Ref Is used for the phase noise value of (a).
(9) Processing the frequency stability data of all nodes to obtain 10MHz of all nodes i 10MHz relative to center reference Ref Frequency stability values of (2).
Taking the case of parameters n=6, l=599, m=3 as an example:
as shown in fig. 1, the multi-node time-frequency signal inspection and data processing method based on the center reference specifically includes the following steps:
(1) And calibrating an initial value of the time-frequency signal inspection device at the center reference.
By time intervalSeparate counter acquisition inspection device 1pps XJ With a central time-frequency reference of 1pps Ref Is stored in a data processing computer, the data acquisition frequency is 1 time/second, the data acquisition length is 599, and { t } s1 ,t s2 ,…,t s599 Time difference data { Δt } corresponding to time instant s1 ,Δt s2 ,…,Δt s599 }。
(2) And (3) carrying out inspection of the time delay index at a node i (i is a positive integer, and i is more than or equal to 1 and less than or equal to 6).
Measuring 1pps to be measured by using time interval counter i 1pps with inspection device XJ Is stored in a data processing computer, the data acquisition frequency is 1 time/second, the data acquisition length is 599, and { t } i1 ,t i2 ,…,t i599 Time difference data { Δt } corresponding to time instant i1 ,Δt i2 ,…,Δt i599 }。
(3) And (5) performing inspection of the phase noise index at the node i.
Measuring 10MHz by inspection device i 10MHz relative to inspection device Ref And stored in a data processing computer, and measured 3 times to obtain 3 groups of phase noise data:
{(α i11 @1Hz),(α i12 @10Hz),(α i13 @100Hz),(α i14 @1kHz),(α i15 @10kHz)}
{(α i21 @1Hz),(α i22 @10Hz),(α i23 @100Hz),(α i24 @1kHz),(α i25 @10kHz)}
......
{(α i31 @1Hz),(α i32 @10Hz),(α i33 @100Hz),(α i34 @1kHz),(α i35 @10kHz)}。
(4) And (5) carrying out inspection of the frequency stability index at the node i.
Measuring 10MHz by inspection device i 10MHz relative to inspection device Ref And storing the frequency stability of the frequency stability data into a data processing computer, and measuring 3 times to obtain 3 groups of frequency stability data:
{(β i11 @1s),(β i12 @10s),(β i13 @100s),(β i14 @1000s),(β i15 @10000s)}
{(β i21 @1s),(β i22 @10s),(β i23 @100s),(β i24 @1000s),(β i25 @10000s)}
......
{(β i31 @1s),(β i32 @10s),(β i33 @100s),(β i34 @1000s),(β i35 @10000s)}。
(5) Repeating the steps (2) - (4) until the inspection tasks of all 6 nodes are completed.
(6) And returning to the center reference, and calibrating the final value of the time-frequency signal inspection device.
1pps of inspection device acquired by using time interval counter XJ With a central time-frequency reference of 1pps Ref Is stored in a data processing computer, the data acquisition frequency is 1 time/second, the data acquisition length is 599, and { t } e1 ,t e2 ,…,t e599 Time difference data { Δt } corresponding to time instant e1 ,Δt e2 ,…,Δt e599 }。
(7) Processing the time delay data of all the nodes to obtain 1pps of all the nodes i 1pps relative to the center reference Ref Is a delay value of (a).
(8) Processing the phase noise data of all nodes to obtain 10MHz of all nodes i 10MHz relative to center reference Ref Is used for the phase noise value of (a).
(9) Processing the frequency stability data of all nodes to obtain 10MHz of all nodes i 10MHz relative to center reference Ref Frequency stability values of (2).
The step (7) specifically comprises the following steps:
(701) For the initial value time difference data { delta t of the inspection device s1 ,Δt s2 ,…,Δt s599 Weighted average is:
(702) Final value time difference data { delta t for inspection device e1 ,Δt e2 ,…,Δt e599 Weighted average is:
(703) On the premise that the time difference offset of the default inspection device is linear, deltat s Corresponding time t s300 ，Δt e Corresponding time t e300 The frequency deviation of the inspection device is calculated as follows:
then the inspection device 1pps XJ 1pps relative to the center reference Ref The clock difference function can be expressed as:
(704) Correcting the delay data of the node i:
the delay value of node i may be expressed as:
(705) Step 704 is repeated until the time delay data correction of all 6 nodes is completed. The step (8) specifically comprises the following steps:
(801) Weighting the phase noise measurement value of the node i:
the phase noise of the node i measured 10MHz is:
{(α i1 @1Hz),(α i2 @10Hz),(α i3 @100Hz),(α i4 @1kHz),(α i5 @10kHz)}；
(802) Step (801) is repeated until phase noise data correction of all N nodes is completed. The step (9) specifically comprises the following steps:
(901) Weighting the frequency stability measurement value of the node i:
the frequency stability of the node i measured 10MHz is:
{(β i1 @1s),(β i2 @10s),(β i3 @100s),(β i4 @1000s),(β i5 @10000s)}；
(902) And (3) repeating the step (901) until the frequency stability data correction of all 6 nodes is completed.
The multi-node time-frequency signal inspection and data processing method based on the center reference is a specific embodiment of the multi-node time-frequency signal inspection and data processing method based on the parameters (N=6, L=599 and M=3), various users can utilize the method to realize inspection test and data processing of corresponding nodes by setting matched parameters according to specific requirements, and the method has good universality.
In a word, the invention provides a multi-node time-frequency signal inspection and data processing method based on a center reference, which utilizes a time-frequency signal inspection device with time keeping capability to realize inspection tests on indexes such as time delay, phase noise, frequency stability and the like of multi-node time-frequency signals by means of high-precision time-frequency signals of a high-stability center reference, can effectively solve the problem that a large number of nodes lack of time-frequency references and are difficult to perform accurate test on the time-frequency signals, and can provide high-time-frequency signal test guarantee and service for various electronic information systems.
Claims (4)
1. A multi-node time-frequency signal inspection and data processing method based on a center reference is characterized in that the inspection test of time delay, phase noise and frequency stability of the multi-node time-frequency signal is realized by utilizing a time-frequency signal inspection device with time keeping capability by means of a high-precision time-frequency signal of a high-stability center reference; the method comprises the following steps:
(1) Calibrating an initial value of the time-frequency signal inspection device at a central reference; the specific method is as follows:
1pps of inspection device acquired by using time interval counter XJ With a central time-frequency reference of 1pps Ref The time difference of (2) is stored in a data processing computer, the data acquisition frequency is 1 time/second, the data acquisition length is L, and L is more than or equal to 9 and is an odd number, so as to obtain { t } s1 ,t s2 ,…,t sL Time difference data { Δt } corresponding to time instant s1 ,Δt s2 ,…,Δt sL }；
(2) Performing inspection of time delay indexes on a node i, wherein i is a positive integer, i is more than or equal to 1 and less than or equal to N, and N is the number of all nodes needing inspection; the specific method is as follows:
measuring 1pps to be measured by using time interval counter i 1pps with inspection device XJ The time difference of (2) is stored in a data processing computer, the data acquisition frequency is 1 time/second, the data acquisition length is L, and { t } i1 ,t i2 ,…,t iL Time difference data { Δt } corresponding to time instant i1 ,Δt i2 ,…,Δt iL }；
(3) Performing inspection of the phase noise index at the node i; the specific method is as follows:
measuring 10MHz by inspection device i 10MHz relative to inspection device Ref And storing the phase noise into a data processing computer, and measuring M times, wherein M is more than or equal to 3 and is an odd number, so as to obtain M groups of phase noise data:
{(α i11 @1Hz),(α i12 @10Hz),(α i13 @100Hz),(α i14 @1kHz),(α i15 @10kHz)}
{(α i21 @1Hz),(α i22 @10Hz),(α i23 @100Hz),(α i24 @1kHz),(α i25 @10kHz)}
......
{(α iM1 @1Hz),(α iM2 @10Hz),(α iM3 @100Hz),(α iM4 @1kHz),(α iM5 @10kHz)}
each set of data includes 1Hz, 10Hz, 100Hz, 1kHz, 10kHz phase noise;
(4) Performing inspection of the frequency stability index at the node i; the specific method is as follows:
measuring 10MHz by inspection device i 10MHz relative to inspection device Ref And storing the frequency stability of the frequency stability data into a data processing computer, and measuring M times to obtain M groups of frequency stability data:
{(β i11 @1s),(β i12 @10s),(β i13 @100s),(β i14 @1000s),(β i15 @10000s)}
{(β i21 @1s),(β i22 @10s),(β i23 @100s),(β i24 @1000s),(β i25 @10000s)}
......
{(β iM1 @1s),(β iM2 @10s),(β iM3 @100s),(β iM4 @1000s),(β iM5 @10000s)}
each set of data includes a frequency stability of 1s, 10s, 100s, 1000s, 10000 s;
(5) Repeating the steps (2) - (4) until the inspection tasks of all N nodes are completed;
(6) Returning to the center reference, and calibrating the final value of the time-frequency signal inspection device; the specific method is as follows:
1pps of inspection device acquired by using time interval counter XJ With a central time-frequency reference of 1pps Ref The time difference of (2) is stored in a data processing computer, the data acquisition frequency is 1 time/second, the data acquisition length is L, and { t } e1 ,t e2 ,…,t eL Time difference data { Δt } corresponding to time instant e1 ,Δt e2 ,…,Δt eL }；
(7) Processing the time delay data of all the nodes to obtain 1pps of all the nodes i 1pps relative to the center reference Ref Is a delay value of (2);
(8) Phase noise for all nodesData are processed to obtain 10MHz of all nodes i 10MHz relative to center reference Ref Is a phase noise value of (1);
(9) Processing the frequency stability data of all nodes to obtain 10MHz of all nodes i 10MHz relative to center reference Ref Frequency stability values of (2).
2. The multi-node time-frequency signal inspection and data processing method based on the center reference as claimed in claim 1, wherein the specific mode of the step (7) is as follows:
(701) For the initial value time difference data { delta t of the inspection device s1 ,Δt s2 ,…,Δt sL Weighted average:
(702) Final value time difference data { delta t for inspection device e1 ,Δt e2 ,…,Δt eL Weighted average:
(703) On the premise that the time difference offset of the default inspection device is linear, deltat s Corresponding time t s,(L+1)/2 ，Δt e Corresponding time t e,(L+1)/2 The frequency deviation of the inspection device is calculated as follows:
thus, the inspection device 1pps XJ 1pps relative to the center reference Ref Is expressed as:
(704) Correcting the delay data of the node i:
thus, the delay value of node i is obtained as:
(705) Step 704 is repeated until the time delay data correction of all N nodes is completed.
3. The multi-node time-frequency signal inspection and data processing method based on the center reference as claimed in claim 1, wherein the specific mode of the step (8) is as follows:
(801) Weighting the phase noise data of the node i:
the obtained phase noise of the node i measured 10MHz is:
{(α i1 @1Hz),(α i2 @10Hz),(α i3 @100Hz),(α i4 @1kHz),(α i5 @10kHz)}；
(802) Step (801) is repeated until correction of the phase noise data of all N nodes is completed.
4. The multi-node time-frequency signal inspection and data processing method based on the center reference as claimed in claim 1, wherein the specific mode of the step (9) is as follows:
(901) And (3) weighting the frequency stability data of the node i:
the frequency stability of the node i measured 10MHz is obtained as follows:
{(β i1 @1s),(β i2 @10s),(β i3 @100s),(β i4 @1000s),(β i5 @10000s)}；
(902) And (3) repeating the step (901) until the correction of the frequency stability data of all N nodes is completed.
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| JP2002243778A (en) * | 2001-02-21 | 2002-08-28 | Seiko Epson Corp | Device and method for inspecting frequency stability |
| CN113872894A (en) * | 2021-09-17 | 2021-12-31 | 上海电机学院 | Unmanned aerial vehicle, routing inspection communication system and channel estimation method |
| CN114337980A (en) * | 2021-12-23 | 2022-04-12 | 中国电建集团河南省电力勘测设计院有限公司 | High-precision clock synchronization method for 5G smart power grid |
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