CN114973970A - Display panel - Google Patents

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Publication number
CN114973970A
CN114973970A CN202210742639.1A CN202210742639A CN114973970A CN 114973970 A CN114973970 A CN 114973970A CN 202210742639 A CN202210742639 A CN 202210742639A CN 114973970 A CN114973970 A CN 114973970A
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CN
China
Prior art keywords
pad
epitaxial
display panel
pads
area
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Pending
Application number
CN202210742639.1A
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Chinese (zh)
Inventor
张宏刚
彭兆基
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Vicino Technology Co ltd
Hefei Visionox Technology Co Ltd
Original Assignee
Vicino Technology Co ltd
Hefei Visionox Technology Co Ltd
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Publication date
Application filed by Vicino Technology Co ltd, Hefei Visionox Technology Co Ltd filed Critical Vicino Technology Co ltd
Priority to CN202210742639.1A priority Critical patent/CN114973970A/en
Publication of CN114973970A publication Critical patent/CN114973970A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09FDISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • G09F9/30Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits
    • H05K1/115Via connections; Lands around holes or via connections
    • H05K1/116Lands, clearance holes or other lay-out details concerning the surrounding of a via

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

The embodiment of the application provides a display panel, relates to and shows technical field for the probe of solving the connection frock easily appears the skew with between the display panel's of making pad, thereby leads to contact failure's technical problem between probe and the pad. The display panel of the embodiment of the application is provided with a display area and a binding area connected to one side of the display area; the binding region is provided with a plurality of connecting welding pads which are arranged at intervals along a first direction; one end of each connecting pad, which deviates from the display area, is connected with an epitaxial pad, a plurality of epitaxial pads are arranged at intervals along the first direction, and the area of each epitaxial pad is larger than that of each connecting pad. The display panel increases the area for connecting the probe, has high tolerance to the position precision of the probe, avoids misjudgment on the detection result of the display panel in process, and can reduce or avoid production loss.

Description

Display panel
Technical Field
The application relates to the technical field of display, in particular to a display panel.
Background
In order to ensure the product quality of the display panel, in the production process of the display panel, detection equipment is required to detect the performance of the manufactured display panel.
In the related art, a plurality of pads for inspection are provided in the bonding region of the display panel. The detection equipment is equipped with the connection frock, connects the frock and has a plurality of probes of interval setting. When the display panel in process is detected, the connecting tool is pressed in the binding area, so that the plurality of probes are connected with the plurality of bonding pads in a one-to-one correspondence mode, the detection equipment can input test signals such as voltage, current and time sequence to the display panel in process, and the performance of the display panel in process is detected.
However, the probes connected to the tooling are prone to shift or rotate with the pads of the display panel under production, so that poor contact between the probes and the pads is caused, the display panel under production cannot be detected by the detection equipment, the detection result of the display panel under production is misjudged, and good products are misjudged as defective products, so that production loss is caused.
Disclosure of Invention
In view of the above problems, embodiments of the present application provide a display panel to solve the technical problem that a deviation is likely to occur between a probe connected to a tool and a pad of a manufactured display panel, thereby causing a poor contact between the probe and the pad.
In order to achieve the above object, the embodiments of the present application provide the following technical solutions:
the embodiment of the application provides a display panel, which is provided with a display area and a binding area connected to one side of the display area; the binding region is provided with a plurality of connecting welding pads which are arranged at intervals along a first direction; every the one end that the connection pad deviates from the display area all is connected with epitaxial pad, and is a plurality of epitaxial pad is followed first direction interval sets up, the area of epitaxial pad is greater than the area of connection pad.
According to the display panel, the extension bonding pad is arranged at one end of the connection bonding pad, the area of the extension bonding pad is larger than that of the connection bonding pad, the area for connecting with the probe is increased, the tolerance on the position accuracy of the probe is high, and even if the position of the probe deviates or rotates, the extension bonding pad can still be connected with the extension bonding pad, so that the detection equipment can detect the display panel under production, the misjudgment on the detection result of the display panel under production is avoided, and the production loss can be reduced or avoided; in addition, the tolerance to the deformation of the probe can be improved, and the service life of the probe can be prolonged.
In a possible implementation manner, the plurality of epitaxial pads are arranged in at least two rows along the second direction, each row comprises a plurality of epitaxial pads arranged along the first direction, and the epitaxial pads in two adjacent rows are arranged in a staggered manner; the second direction is perpendicular to the first direction.
By the arrangement, compared with the arrangement that the plurality of epitaxial bonding pads are arranged in a row, the space of the binding area occupied by the plurality of epitaxial bonding pads can be reduced, so that space is reserved for other lines or elements in the binding area, and the space utilization rate of the binding area is improved; in addition, the distance of the plurality of probes of the connecting tool arranged in the first direction does not need to be changed, and the adaptability between the display panel and the connecting tool is improved.
In one possible implementation manner, along the first direction, any one of the epitaxial pads in each row has a second width, and the second width is greater than a spacing between any two adjacent epitaxial pads in an adjacent row.
So set up, can be located between two adjacent connection pads in this row with the epitaxial pad in its adjacent row to make full use of the space between two connection pads improves the compactness of a plurality of epitaxial pad overall arrangement, makes a plurality of epitaxial pads can carry out reasonable overall arrangement in binding the district, improves the space utilization who binds the district.
In one possible implementation, the connection pad has a first width and the epitaxial pad has a second width along the first direction, the second width being greater than the first width.
According to the arrangement, when the display panel under production is detected, the second width is larger than the first width, when the connecting tool deviates in the first direction, namely, the deviation in the horizontal direction, the probe of the connecting tool can still be connected with the epitaxial bonding pad of the display panel, so that the detection equipment can input voltage, current, time sequence and other test signals to the display panel under production, the detection abnormity of the display panel under production is avoided, the misjudgment of a detection result is avoided, and the production loss can be reduced or avoided.
In one possible implementation, the second width is greater than or equal to 300 μm and less than or equal to 320 μm.
According to the arrangement, the second width of the epitaxial bonding pad is 300-320 mu m, so that the area of the epitaxial bonding pad in the first direction can be increased, the space of the bonding area can be fully utilized, the space is reserved for other circuits or elements in the bonding area, and the space utilization rate of the bonding area is improved.
In one possible implementation, the epitaxial pad has a third width in a second direction perpendicular to the first direction, the third width being greater than or equal to 200 μm and less than or equal to 400 μm.
According to the arrangement, when the display panel under production is detected, the third width of the extension bonding pad is 200-400 microns, when the connecting tool deviates in the second direction, namely, the deviation in the vertical direction, the probe of the connecting tool can still be connected with the extension bonding pad of the display panel, so that the detection equipment can input voltage, current, time sequence and other test signals to the display panel under production, the detection abnormity of the display panel under production and the misjudgment of a detection result are avoided, and the production loss can be reduced or avoided.
In a possible implementation manner, the shape of the extension pad is rectangular, and one end of the connection pad, which is back to the display area, is connected to the center of one side of the extension pad.
So set up, the epitaxial pad of rectangle all has great width in first direction and second direction for epitaxial pad all has great tolerance to the position accuracy of probe in first direction and second direction, even the probe shifts in first direction and second direction position, still can be connected with epitaxial pad.
In one possible implementation manner, four corners of the epitaxial pad are rounded.
So set up, be connected with the pad of extending when the probe, check out test set is to when the display panel input detected signal of making, because four angles of pad of extending are the radius angle, can avoid the pad of extending to appear the closed angle, prevent that the pad of extending from producing electrostatic breakdown, guaranteed display panel's reliability, prolonged display panel's life-span.
In one possible implementation, the shape of the epitaxial pad is a diamond.
In one possible implementation, the epitaxial pad has a first diagonal line and a second diagonal line, the first diagonal line has a length greater than a length of the second diagonal line, and the first diagonal line is disposed along a second direction perpendicular to the first direction; the corners of the epitaxial pad corresponding to the first diagonal line are connected to the connection pads.
With the arrangement, the rhombic epitaxial bonding pad has larger width in the second direction, so that the epitaxial bonding pad has larger tolerance on the position precision of the probe in the second direction, and can be connected with the epitaxial bonding pad even if the position of the probe in the second direction deviates.
In one possible implementation, the shape of the epitaxial pad is an ellipse.
So set up, oval-shaped epitaxial pad does not have the closed angle, is connected with epitaxial pad when the probe, and check out test set can prevent to produce when the display panel input detected signal of making, and epitaxial pad produces electrostatic breakdown, has guaranteed display panel's reliability, has prolonged display panel's life-span.
In one possible implementation, the long axis of the epitaxial pad is disposed along a second direction perpendicular to the first direction, and the short axis of the epitaxial pad is disposed along the first direction.
So set up, oval-shaped epitaxial pad all has great width in first direction and second direction for epitaxial pad all has great tolerance to the position accuracy of probe in first direction and second direction, even the probe shifts in first direction and second direction position, still can be connected with epitaxial pad.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a schematic diagram illustrating a display panel according to an embodiment of the present disclosure;
FIG. 2 is a schematic structural view of the connection tool shown in FIG. 1;
FIG. 3 is a partial schematic view of the display panel of FIG. 1;
FIG. 4 is a partial schematic view of a display panel in some implementations of embodiments of the present application;
FIG. 5 is a schematic diagram of a portion of a display panel in another implementation manner of the embodiment of the present application;
FIG. 6 is a partial schematic view of a display panel in other implementations of embodiments of the present application;
fig. 7 is a schematic structural diagram of a display panel and a connection tool in other implementation manners of the embodiment of the present application.
Description of the reference numerals:
10. a display panel;
110. a connection pad;
120. an epitaxial bonding pad;
20. connecting a tool;
210. a probe;
211. a protrusion;
220. a cylinder;
221. a piston;
222. an air inlet;
223. an air outlet;
AA. A display area;
BB. A binding region;
h1, first width;
h2, second width;
h3, third width;
D. and (4) spacing.
Detailed Description
In the related art, a probe for connecting a tool and a pad of a manufactured display panel are prone to shift, so that poor contact between the probe and the pad is caused. As a result of long-term research, the inventors found that the main cause of the problem is that, when a manufactured display panel is inspected, in order to improve the inspection efficiency, a connection tool is generally pressed onto a plurality of manufactured display panels so as to inspect the plurality of manufactured display panels at the same time. Due to the reasons that the manufacturing precision of the connecting tool is low or the probes of the connecting tool deform and the like, the connecting tool deviates or rotates, poor contact is generated between the plurality of probes of the connecting tool and at least part of the bonding pads of the display panel under production, so that the detection equipment cannot input test signals such as voltage, current, time sequence and the like to the display panel under production, the display panel under production is detected abnormally, the display panel under production is judged as a defective product by mistake, meanwhile, the production line is paused to check abnormal reasons, and the production loss of time, materials and the like is caused.
In view of the above technical problems, in the display panel of the embodiment of the application, the extension pad is arranged at one end of the connection pad, the area of the extension pad is larger than that of the connection pad, the area for connecting with the probe is increased, the tolerance on the position precision of the probe is large, and even if the position of the probe deviates, the extension pad can still be connected with the probe, so that the detection equipment can detect the display panel under production, the misjudgment on the detection result of the display panel under production is avoided, and the production loss can be reduced or avoided; in addition, the tolerance to the deformation of the probe can be improved, and the service life of the probe can be prolonged.
In order to make the aforementioned objects, features and advantages of the embodiments of the present application more comprehensible, embodiments of the present application are described in detail below with reference to the accompanying drawings. It should be apparent that the described embodiments are only a few embodiments of the present application, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that the sizes and shapes of the figures in the drawings are not to be considered true scale, but are merely illustrative of the contents of the embodiments of the present application. And the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout.
Referring to fig. 1, an embodiment of the present application provides a display panel 10. In the production process of the display panel 10, it is necessary to detect the performance of the display panel 10 under production using a detection apparatus. Referring to fig. 2, the inspection apparatus is equipped with a connection tool 20, and the connection tool 20 has a plurality of probes 210 arranged at intervals. When inspecting the manufactured display panel 10, the connection tool 20 is pressed against the display panel 10. Illustratively, the end of the probe 210 is provided with a protrusion 211, and when the connection tool 20 is pressed against the display panel 10, the protrusion 211 contacts the display panel 10.
Referring to fig. 1, the display panel 10 has a display area AA and a binding area BB connected to one side of the display area AA. Illustratively, the display area AA has a plurality of pixels arranged in a matrix. The display area AA also has a plurality of pixel driving circuits therein. The display pixels can be controlled to emit light by controlling the pixel driving circuit to display an image.
Referring to fig. 1 and 3, the bonding region BB has a plurality of connection pads 110, and the plurality of connection pads 110 are arranged at intervals along the first direction x. One end of each connection pad 110 facing the display area AA is used to connect a respective driving circuit. An end of each connection pad 110 facing away from the display area AA is connected to an epitaxial pad 120. The plurality of epitaxial pads 120 are disposed at intervals in the first direction x, and the area of the epitaxial pads 120 is larger than that of the connection pads 110.
When the display panel 10 under production is detected and the connection tool 20 is pressed on the display panel 10, because the area of the epitaxial bonding pad 120 is larger than that of the connection bonding pad 110, the area for connecting with the probe 210 is increased, the tolerance to the position precision of the probe 210 is large, even if the position of the probe 210 deviates or rotates, the probe can still be connected with the epitaxial bonding pad 120, so that the detection equipment can input test signals such as voltage, current and time sequence to the display panel 10 under production, the misjudgment of a detection result caused by the detection abnormity of the display panel 10 under production is avoided, and the production loss can be reduced or avoided; in addition, the tolerance to the deformation of the probe 210 can be improved, and the service life of the probe 210 can be prolonged.
Note that the first direction refers to a horizontal direction as shown in fig. 3, i.e., an x direction. For the convenience of understanding the technical solution of the embodiments of the present application, the first direction x is hereinafter referred to.
Exemplarily, referring to fig. 3, the connection pad 110 has a first width H1 along the first direction x. The epitaxial pad 120 has a second width H2, the second width H2 being greater than the first width H1. When the display panel 10 under production is detected, because the second width H2 is greater than the first width H1, when the connection tool 20 has a deviation in the first direction x, that is, a deviation in the horizontal direction, the probe 210 of the connection tool 20 can still be connected with the epitaxial pad 120 of the display panel 10, so that the detection equipment can input test signals such as voltage, current, and time sequence to the display panel 10 under production, thereby avoiding the detection result from being misjudged due to detection abnormality of the display panel 10 under production, and reducing or avoiding production loss.
Note that the second direction refers to a vertical direction as shown in fig. 3, i.e., the y direction. For the convenience of understanding of the technical solutions of the embodiments of the present application, the second direction y is hereinafter referred to.
Illustratively, the second width H2 may be greater than or equal to 300 μm and less than or equal to 320 μm. For example, the second width H2 may be 300 μm, 310 μm, or 320 μm. The second width H2 of the epitaxial pad 120 is 300-320 μm, which not only can increase the area in the first direction x, but also can make full use of the space of the bonding area BB to reserve space for other circuits or elements in the bonding area BB, thereby improving the space utilization rate of the bonding area BB.
Referring to fig. 3, the epitaxial pad 120 has a third width H3 in a second direction y perpendicular to the first direction x. Illustratively, the third width H3 is greater than or equal to 200 μm and less than or equal to 400 μm. For example, the third width H3 may be 200 μm, 250 μm, 300 μm, 350 μm, or 400 μm. When the display panel 10 under production is detected, the third width H3 of the epitaxial pad 120 is 200-400 μm, and when the connection tool 20 is deviated in the second direction y, that is, in the vertical direction, the probe 210 of the connection tool 20 can still be connected with the epitaxial pad 120 of the display panel 10, so that the detection equipment can input test signals such as voltage, current and time sequence to the display panel 10 under production, thereby avoiding the detection result from being misjudged due to the detection abnormality of the display panel 10 under production, and reducing or avoiding the production loss.
The plurality of epitaxial pads 120 may be arranged in a row along the second direction y; the plurality of epitaxial pads 120 may also be arranged in at least two rows along the second direction y.
Exemplarily, referring to fig. 3, the plurality of epitaxial pads 120 may be arranged in two rows along the second direction y, each row including several epitaxial pads 120 arranged along the first direction x. The epitaxial pads 120 in two adjacent rows are staggered. Compared with the arrangement of the plurality of epitaxial bonding pads 120 in a line, the space of the bonding area BB occupied by the plurality of epitaxial bonding pads 120 can be reduced to reserve space for other lines or elements in the bonding area BB, thereby improving the space utilization rate of the bonding area BB; in addition, the distance of the plurality of probes 210 of the connection tool 20 arranged in the first direction x does not need to be changed, and the adaptability between the display panel 10 and the connection tool 20 is improved.
Accordingly, referring to fig. 3, the plurality of probes 210 of the connection tool 20 are disposed along the second direction y in a staggered manner, so that the plurality of probes 210 can be matched with the plurality of epitaxial pads 120, and thus the plurality of probes 210 can be correspondingly connected with the plurality of epitaxial pads 120.
It is understood that the plurality of epi pads 120 may also be arranged in three or more rows. The epi pads 120 in any one of the three rows or three rows may be offset from the epi pads 120 in its adjacent row.
Referring to fig. 3, when the epitaxial pads 120 of every two adjacent rows are disposed in a staggered manner, the second width H2 of the epitaxial pad 120 in any one row is greater than the distance D between any two adjacent epitaxial pads 120 in its adjacent row. With such an arrangement, the epitaxial pads 120 in the adjacent row can be located between two adjacent connection pads 110 in the row, so that the compactness of the layout of the plurality of epitaxial pads 120 is improved, the plurality of epitaxial pads 120 can be reasonably arranged in the binding area BB, and the space utilization rate of the binding area BB is improved.
Illustratively, referring to fig. 3, the shape of the epitaxial pad 120 may be rectangular. An end of the connection pad 110 facing away from the display area AA may be connected to a center of one side of the extension pad 120. The rectangular epitaxial pad 120 has a larger width in the first direction x and the second direction y, so that the epitaxial pad 120 has a larger tolerance for the position accuracy of the probe 210 in the first direction x and the second direction y, and can be connected with the epitaxial pad 120 even if the position of the probe 210 in the first direction x and the second direction y is shifted. Illustratively, the epitaxial pad 120 may be rectangular 300 μm by 300 μm.
In some implementations of embodiments of the present application, referring to fig. 4, the four corners of the epi pad 120 may each be rounded. When the probe 210 is connected with the extension bonding pad 120, and the detection equipment inputs a detection signal to the display panel 10 under production, because four corners of the extension bonding pad 120 are fillets, sharp corners of the extension bonding pad 120 can be avoided, the extension bonding pad 120 is prevented from electrostatic breakdown, the reliability of the display panel 10 is ensured, and the service life of the display panel 10 is prolonged.
In other implementations of embodiments of the present application, referring to fig. 5, the shape of the epi pad 120 may be a diamond shape. Illustratively, the epitaxial pad 120 has a first diagonal line and a second diagonal line, the first diagonal line having a length greater than a length of the second diagonal line, the first diagonal line being disposed along the second direction y; the corners of the extension pads 120 corresponding to the first diagonal line are connected to the connection pads 110. The diamond-shaped epitaxial pad 120 has a larger width in the second direction y, so that the epitaxial pad 120 has a larger tolerance for the position accuracy of the probe 210 in the second direction y, and can be connected with the epitaxial pad 120 even if the position of the probe 210 in the second direction y is shifted. Illustratively, the length of the first diagonal line of the epitaxial pad 120 may be 400 μm, and the length of the second diagonal line of the epitaxial pad 120 may be 300 μm.
In other implementations of embodiments of the present application, referring to fig. 6, the shape of the epi pad 120 may be an ellipse. The oval epitaxial pad 120 has no sharp corner, and when the probe 210 is connected with the epitaxial pad 120 and the detection equipment inputs a detection signal to the display panel 10 under production, the electrostatic breakdown of the epitaxial pad 120 can be prevented, the reliability of the display panel 10 is ensured, and the service life of the display panel 10 is prolonged.
Illustratively, the long axis of the epitaxial pad 120 is disposed along the second direction y, and the short axis of the epitaxial pad 120 is disposed along the first direction x. Compared with the rhombic epitaxial pad 120, the area of the elliptic epitaxial pad 120 between the first direction x and the second direction y has larger width, so that the area of the epitaxial pad 120 between the first direction x and the second direction y has larger tolerance on the position accuracy of the probe 210, and the probe 210 can be connected with the epitaxial pad 120 even if the position of the area between the first direction x and the second direction y is deviated. Illustratively, the long axis of the epi pad 120 may be 400 μm and the short axis of the epi pad 120 may be 300 μm.
It is understood that the epitaxial pad 120 may have other shapes as long as the area of the epitaxial pad 120 is larger than that of the connection pad 110, and this embodiment of the present application is not particularly limited thereto.
The connection tool 20 may further be provided with a telescopic mechanism, and the telescopic mechanism has a telescopic function in the second direction y. The number of the telescopic mechanisms can be one or more, the one or more telescopic mechanisms are correspondingly connected with at least part of the probes 210, and the telescopic mechanisms can drive the probes 210 to move in the second direction y so as to adjust the positions of the probes 210, so that the probes 210 can be prevented from deviating in the second direction y and being in poor contact with the epitaxial bonding pads 120; in addition, at least part of the probes 210 are connected with the telescopic mechanism, so that at least part of the probes 210 can be independently debugged, and when the problem that the contact between the probes 210 and the epitaxial bonding pad 120 is poor occurs, the positions of at least part of the probes 210 in the second direction y can be independently adjusted, so that the positions of all the probes 210 are prevented from being adjusted, the debugging time of the connecting tool 20 is shortened, and the detection efficiency of the display panel 10 under production is improved.
For example, the telescoping mechanism may be controlled by a Controller of the detection device, such as a Programmable Logic Controller (PLC). The performance of the manufactured display panel 10 is usually tested in a nitrogen environment, and when the probe 210 has poor contact with the epitaxial pad 120, the controller can remotely control the telescopic mechanism to adjust the position of the probe 210 in the second direction y, so that the nitrogen environment does not need to be released, the efficiency of adjusting the probe 210 is improved, and the cost loss caused by environmental change is reduced.
Referring to fig. 7, the telescopic mechanism may include a cylinder 220. The cylinder 220 is a sealed cylinder body. The cylinder 220 has a piston 221 sliding in the second direction y therein, and the probe 210 is connected to the piston 221. The side of the cylinder 220 opposite to the extending direction of the probe 210 is further provided with an air inlet 222 and an air outlet 223, the air inlet 222 is used for charging air into the cylinder 220, and the air outlet 223 is used for discharging the air in the cylinder 220. The position of the piston 221 within the cylinder 220, and thus the probe 210 in the second direction y, can be adjusted by adjusting the pressure within the cylinder 220 by adjusting the amount of gas entering the cylinder 220 via the inlet port 222 and the amount of gas exiting the cylinder 220 via the outlet port 223.
It can be understood that the telescopic mechanism may further include a hydraulic cylinder or an electric cylinder, and the details of the embodiment of the present application are not described herein.
In the present specification, each implementation manner of the embodiment is described in a progressive manner, each implementation manner focuses on differences from other implementation manners, and like parts between the implementation manners may be referred to each other.
It should be noted that references in the specification to "one implementation," "an implementation," etc., indicate that the implementation described may include a particular feature, structure, or characteristic, but every implementation does not necessarily include the particular feature, structure, or characteristic. Moreover, such phrases are not necessarily referring to the same implementation. Further, when a particular feature, structure, or characteristic is described in connection with an implementation, it is within the knowledge of one skilled in the art to effect such feature, structure, or characteristic in connection with other implementations whether or not explicitly described.
In general, terminology should be understood, at least in part, by the use of the context. For example, the term "one or more" as used herein may be used to describe any feature, structure, or characteristic in the singular or may be used to describe a combination of features, structures, or characteristics in the plural, depending, at least in part, on the context. Similarly, terms such as "a" or "the" may also be understood to convey a singular use or to convey a plural use, depending at least in part on the context.
It should be readily understood that "on.. above", "in.. above" and "over.. once" in this disclosure should be interpreted in the broadest manner such that "on.. above" not only means "directly on something", but also includes the meaning of "on something" with intervening features or layers therebetween, and "on.. above" or "over.. includes not only the meaning of" above "or" over "but also the meaning of" above "or" over "without intervening features or layers therebetween (i.e., directly on something).
Finally, it should be noted that: the above embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and these modifications or substitutions do not depart from the scope of the technical solutions of the embodiments of the present application.

Claims (10)

1. The display panel is characterized by comprising a display area and a binding area connected to one side of the display area; the binding region is provided with a plurality of connecting welding pads which are arranged at intervals along a first direction;
every the one end that the connection pad deviates from the display area all is connected with epitaxial pad, and is a plurality of epitaxial pad is followed first direction interval sets up, the area of epitaxial pad is greater than the area of connection pad.
2. The display panel according to claim 1, wherein the plurality of epitaxial pads are arranged in at least two rows in the second direction, each row includes a plurality of epitaxial pads arranged in the first direction, and the epitaxial pads in two adjacent rows are arranged in a staggered manner; the second direction is perpendicular to the first direction.
3. The display panel according to claim 2, wherein in the first direction, any one of the epitaxial pads in each row has a second width that is greater than a pitch between any adjacent two of the epitaxial pads in its adjacent row.
4. The display panel according to any one of claims 1 to 3, wherein the connection pad has a first width and the epitaxial pad has a second width in the first direction, the second width being greater than the first width;
preferably, the second width is greater than or equal to 300 μm and less than or equal to 320 μm.
5. The display panel according to any one of claims 1 to 3, wherein the epitaxial pad has a third width in a second direction perpendicular to the first direction, the third width being greater than or equal to 200 μm and less than or equal to 400 μm.
6. The display panel according to any one of claims 1 to 3, wherein the extension pad has a rectangular shape, and an end of the connection pad facing away from the display region is connected to a center of one side edge of the extension pad.
7. The display panel of claim 6, wherein the epitaxial pads are rounded at each of four corners.
8. A display panel as claimed in any one of claims 1 to 3 wherein the epitaxial pad is diamond shaped.
9. The display panel according to claim 8, wherein the epitaxial pad has a first diagonal line and a second diagonal line, the first diagonal line having a length greater than a length of the second diagonal line, the first diagonal line being disposed in a second direction perpendicular to the first direction; and corners of the epitaxial bonding pad corresponding to the first diagonal line are connected with the connecting bonding pad.
10. The display panel according to any one of claims 1 to 3, wherein the shape of the epitaxial pad is an ellipse;
preferably, a long axis of the epitaxial pad is disposed in a second direction perpendicular to the first direction, and a short axis of the epitaxial pad is disposed in the first direction.
CN202210742639.1A 2022-06-28 2022-06-28 Display panel Pending CN114973970A (en)

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JPH10253980A (en) * 1997-03-17 1998-09-25 Sharp Corp Liquid crystal display device
JPH11295755A (en) * 1998-04-09 1999-10-29 Seiko Epson Corp Method for inspecting wiring board and manufacture of liquid crystal device
JP2004177870A (en) * 2002-11-29 2004-06-24 Kyocera Corp Liquid crystal display and short circuit measuring probe member used for liquid crystal display
JP2005303199A (en) * 2004-04-15 2005-10-27 Kamaya Denki Kk Collecting board for electronic components, and manufacturing method of the electronic components
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CN112305454A (en) * 2020-10-30 2021-02-02 京东方科技集团股份有限公司 Circuit board for testing display panel, testing device and testing method for display panel
CN114255683A (en) * 2021-12-21 2022-03-29 武汉华星光电技术有限公司 Display panel

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