CN114858059B - Apparatus, method and system for reducing systematic error in integrating measured position along line of sight - Google Patents
Apparatus, method and system for reducing systematic error in integrating measured position along line of sight Download PDFInfo
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- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
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Abstract
The invention provides a device, a method and a system for reducing system errors of an integral measurement position along a sight line, relates to the technical field of optical measurement, and is applied to an integral measurement system along the sight line; the integral measurement system along the sight line includes: a measuring signal generator and a signal receiving sensor; further comprising: a refraction field calibration sheet; the refraction field calibration sheet is arranged between the measuring signal generator and the signal receiving sensor; a measurement signal generator for providing a source measurement signal for the line-of-sight integral measurement system; the signal receiving sensor is used for receiving a measuring signal after passing through a measuring field to be measured; the refraction field calibration sheet is a scattered point distribution film with preset distribution characteristics and is used for calibrating the refraction field along the measurement path of the sight integration measurement system. The invention alleviates the technical problem of errors caused by refraction phenomena in the prior art.
Description
Technical Field
The invention relates to the technical field of optical measurement, in particular to a device, a method and a system for reducing systematic errors of integral measurement positions along a sight line.
Background
The main measurement methods at present are contact measurement and non-contact measurement, which are classified according to whether the flow field is invaded or not, wherein the non-contact measurement is mainly based on various optical measurement methods. The method can measure information of fluent integral along the sight line to be measured while not interfering a flow field, common integral measuring methods along the sight line include laser interferometry, flame free radical shooting, ultrasonic measurement and the like, the methods can realize measurement of high space-time resolution, and the method is widely applied to engineering use and scientific research.
These measurement techniques of integration along a line of sight can be basically considered as measurements based on the transmission of waves (light waves, sound waves, etc.) which, when traversing or undergoing changes in the medium, produce changes in the direction of propagation. The refraction of light is the most easily observed refraction phenomenon, such as the deformation of chopsticks in water, and the fluctuation of air above a high-temperature road surface is caused by the refraction phenomenon. Similarly, when the measurement is performed by using the integral along the line of sight, since most of the information carriers are parallel light (or parallel wave), the refraction phenomenon is obvious, and the refraction phenomenon also occurs, so that a certain error exists between the measurement result and the actual result.
Disclosure of Invention
In view of the above, the present invention provides an apparatus, a method and a system for reducing systematic errors in integral measurement of position along line of sight, so as to alleviate the technical problems of errors due to refraction phenomena in the prior art.
In a first aspect, an embodiment of the present invention provides an apparatus for reducing a system error of a position measured along a line of sight integral, where the apparatus is applied to a system for measuring along the line of sight integral; the integral along line of sight measurement system comprises: a measuring signal generator and a signal receiving sensor; the method comprises the following steps: a refraction field calibration sheet; the refraction field calibration sheet is arranged between the measuring signal generator and the signal receiving sensor; the measurement signal generator is used for providing a source measurement signal for the integral measurement system along the sight line; the signal receiving sensor is used for receiving a measuring signal after passing through a measuring field to be measured; the refraction field calibration sheet is a scattered point distribution film with preset distribution characteristics and is used for calibrating the refraction field along the measurement path of the sight line integral measurement system.
Further, the predetermined distribution characteristic is a poisson disc distribution.
Further, the measurement signal generator comprises a laser or an ultrasonic generator.
In a second aspect, an embodiment of the present invention further provides a method for reducing a systematic error of a position measured along a line-of-sight integral, which is applied to the apparatus in the first aspect; the method comprises the following steps: acquiring a standard coordinate field formed by the source measurement signal after passing through the refraction field calibration sheet when the measurement field to be measured is absent in the sight line integral measurement system; acquiring a change coordinate field formed by the source measurement signal after passing through the refraction field calibration sheet when the sight line integral measurement system is placed in the measurement field to be measured; and determining a correction matrix of the measurement field to be measured based on the position offset of the changed coordinate field relative to the standard coordinate field.
Further, the method further comprises: measuring the measurement field to be measured through the sight line integral measurement system to obtain an initial measurement result; and correcting the initial measurement result based on the correction matrix to obtain a corrected measurement result.
Further, determining a correction matrix of the measurement field to be measured based on the position offset of the changed coordinate field relative to the standard coordinate field, including: performing local cross-correlation processing on the changed coordinate field and the standard coordinate field, and determining the deformation direction of each position coordinate in the changed coordinate field relative to the corresponding position coordinate in the standard coordinate field; determining the rectification matrix based on the deformation direction.
In a third aspect, an embodiment of the present invention further provides a system for reducing a system error of a position measured along a line of sight integral, where the system is applied to the apparatus in the first aspect; the method comprises the following steps: the device comprises a first acquisition module, a second acquisition module and a determination module; the first acquisition module is used for acquiring a standard coordinate field formed by the source measurement signal after passing through the refraction field calibration sheet when the measurement field to be measured does not exist in the line-of-sight integral measurement system; the second acquisition module is used for acquiring a change coordinate field formed by the source measurement signal after passing through the refraction field calibration sheet when the measurement system along the sight line integral is placed in the measurement field to be measured; the determining module is used for determining the correction matrix of the measurement field to be measured based on the position deviation of the changed coordinate field relative to the standard coordinate field.
Further, still include: a correction module to: measuring the measurement field to be measured through the sight line integral measurement system to obtain an initial measurement result; and correcting the initial measurement result based on the correction matrix to obtain a corrected measurement result.
In a fourth aspect, an embodiment of the present invention further provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor implements the steps of the method according to the second aspect when executing the computer program.
In a fifth aspect, the present invention further provides a computer-readable medium having a non-volatile program code executable by a processor, where the program code causes the processor to execute the method according to the second aspect.
The invention provides a device, a method and a system for reducing the systematic error of a position measured along sight line integral.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a schematic diagram of an apparatus for reducing systematic errors in integrating measured positions along a line of sight according to an embodiment of the present invention;
FIG. 2 is a schematic view of a scattering point distribution of a refraction field calibration sheet according to an embodiment of the present invention;
FIG. 3 is a flowchart of a method for reducing system error in integrating measured positions along a line of sight according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a method for measuring the effect of a field on the path of light according to an embodiment of the present invention;
fig. 5 is a schematic diagram illustrating a measurement result of a measurement field to be measured based on an integral measurement system along a line of sight according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of a measurement result of an apparatus for measuring a position based on reduction of systematic error along line-of-sight integration according to an embodiment of the present invention;
FIG. 7 is a diagram illustrating a difference between a corrected result and an unprocessed measurement result according to an embodiment of the present invention;
FIG. 8 is a schematic diagram of a system for reducing systematic errors in integrating measured positions along a line of sight according to an embodiment of the present invention;
fig. 9 is a schematic diagram of another system for reducing systematic error in integrating measured positions along a line of sight according to an embodiment of the present invention.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The first embodiment is as follows:
fig. 1 is a schematic diagram of an apparatus for reducing systematic errors in an integral measurement position along a line of sight according to an embodiment of the present invention, where the apparatus is applied to an integral measurement system along a line of sight. Specifically, as shown in fig. 1, the integral measurement system along the line of sight includes: a measurement signal generator 10 and a signal receiving sensor 20. As shown in fig. 1, the apparatus further comprises: a refractive field calibration sheet 30 and signal processing means 40. Wherein the refraction field calibration sheet 30 is disposed at a position between the measurement signal generator 10 and the signal receiving sensor 20.
In particular, a measurement signal generator 10 is provided for providing a source measurement signal to the line-of-sight integral measurement system.
In an embodiment of the invention, the measurement signal generator 10 provides a source signal for the entire measurement system for a transmitting instrument that uses a carrier signal for making line-of-sight integral measurements.
Optionally, the measurement signal generator 10 comprises a laser or an ultrasonic generator.
Optionally, as shown in fig. 1, the measurement signal generator 10 is a laser and a beam expansion system, and generates strong-coherence single-wavelength laser by the laser, and expands the laser beam to a laser beam with a desired diameter by the beam expansion system, so as to provide measurement light for the system.
The signal receiving sensor 20 is used for receiving the measuring signal after passing through the measuring field 50 to be measured.
In the embodiment of the present invention, the signal receiving sensor 20 is a receiving instrument for measuring signals, and can implement field measurement of the measuring signals, so as to obtain the refractive field correction matrix through subsequent processing. If the measuring signal is laser, the signal receiving sensor 20 is a high-speed camera with a fixed-focus lens, the laser beam is attenuated by an attenuation sheet and then directly imaged on the sensor of the high-speed camera, the high-speed camera is triggered by an external shutter, the number of the camera frames is more than ten thousand hertz, and transient refraction field correction on a hundred microsecond time scale can be realized.
The refraction field calibration sheet 30 is a discrete point distribution film having a predetermined distribution characteristic for calibrating the refraction field along the measurement path of the line-of-sight integral measurement system.
In the embodiment of the present invention, the refraction field calibration sheet 30 is an instrument capable of calibrating the refraction field of the original measurement path, so that the measurement signal has a specific distribution, is placed in the original measurement path to provide a standard coordinate field, and is a core component of the present invention, and if the measurement signal is a laser, the refraction field calibration sheet 30 is a film with a specific scatter distribution.
FIG. 2 is a schematic diagram of a scatter distribution of a refractive field calibration sheet according to an embodiment of the present invention. In an embodiment of the invention, the predetermined distribution characteristic is a poisson disk distribution, as shown in fig. 2.
The signal processing device 40 adopts a PC terminal with matrix processing capability, and the specific functions include measurement two-dimensional signal reading, signal preprocessing, measurement signal demodulation, calculation of a refraction field correction matrix, and measurement signal correction.
The invention provides a device for reducing the systematic error of a position measured along sight line integral, which can quantitatively measure the systematic error of the position generated by refraction by adding a position correction device along the measurement path of the sight line integral measurement system, thereby relieving the technical problem of the error generated by the refraction phenomenon in the prior art. The device provided by the invention has little change on the original measuring equipment, only needs to design and add the refraction field calibration sheet, and has simple system and easy realization.
Fig. 3 is a flow chart of a method for reducing systematic error in integrating measured positions along a line of sight according to an embodiment of the present invention, which is implemented by an apparatus according to the present invention. As shown in fig. 3, the method specifically includes the following steps:
step S302, a standard coordinate field formed by the source measurement signal after passing through the refraction field calibration sheet when the measurement field to be measured does not exist along the sight line integral measurement system is obtained.
Step S304, acquiring a change coordinate field formed by the source measurement signal after passing through the refraction field calibration sheet when the measurement field to be measured is placed in the sight line integral measurement system.
And S306, determining a correction matrix of the measurement field to be measured based on the position offset of the variable coordinate field relative to the standard coordinate field.
Specifically, firstly, local cross-correlation processing is performed on a changed coordinate field and a standard coordinate field, and the deformation direction of each position coordinate in the changed coordinate field relative to the corresponding position coordinate in the standard coordinate field is determined; then, based on the deformation direction, a rectification matrix is determined.
And step S308, measuring the measurement field to be measured by the sight line integral measurement system to obtain an initial measurement result.
And S310, correcting the initial measurement result based on the correction matrix to obtain a corrected measurement result.
As can be seen from the above description, the operation process of the apparatus for reducing the systematic error of the integral measurement position along the line of sight according to the embodiment of the present invention is as follows: the measuring signal sent by the measuring signal generator penetrates through the fluid to be measured, the carried fluid information is collected by the signal receiving sensor, and then the signal receiving sensor is processed by the signal processing device to obtain the field measuring information of the measured fluid. After the basic information measurement is completed, the refraction field calibration sheet is placed in the measurement path, firstly, a standard coordinate field without a flow field to be measured is recorded, then, a calibration field which changes after the flow field to be measured is placed is recorded, a refraction field correction matrix is obtained through calculation, the previously recorded field measurement information is processed, the measurement signal correction is completed, and the effect of reducing the system error of the integral measurement position along the sight line is achieved.
In the embodiment of the present invention, the method for calculating the refractive field correction matrix is as follows:
comparing the standard coordinate field without the flow field to be measured with the calibration field after the fluid to be measured is put in, selecting a proper window size, and determining the coordinate field deformation direction generated by the refraction field at each position of the original coordinate position by using local cross-correlation processing on the two matrixes. The deformation direction is the deformation direction from the position of a certain point measuring signal without the smoothness to be measured to the same measuring signal falling on the signal receiving sensor after the smoothness to be measured is applied, namely the deformation direction from the position of the real measuring point to the displacement of the same point measuring position obtained by measuring due to the influence of the refraction effect. Therefore, the correction matrix of the refraction field should be the correction matrix of the refraction field obtained by traversing the process for each discrete coordinate because the deformation direction of the measured position offset of the same point obtained by measuring is directed to the position of the real measuring point due to the influence of the refraction effect.
Fig. 4 is a schematic diagram of measuring an influence of a field on a path of light according to an embodiment of the present invention. As shown in fig. 4, due to the influence of the refractive index on the path of the light, a certain deviation exists between the actual measurement position (point a) and the acquired image position (point C), the method provided by the embodiment of the present invention may measure the offset from the point a 'to the point C during the processing, finally, the data at the point C is moved to the point a', and the process is repeated for all the processing results to obtain the corrected actual measurement result.
Measuring a correction matrix of a calibration refraction field by using the device and the method provided by the embodiment of the invention, and processing an original measurement result, wherein the original measurement result and the measurement result corrected by using the method are respectively shown in fig. 5 and 6, wherein fig. 5 is a schematic diagram of a measurement result of a measurement field to be measured based on an integral measurement system along a sight line, and fig. 6 is a schematic diagram of a measurement result of a device for reducing the system error of an integral measurement position along the sight line; fig. 7 is a schematic diagram of a difference between a corrected result and an unprocessed original measurement result according to an embodiment of the present invention.
As shown in fig. 5, 6 and 7, it can be found by comparison that, due to the existence of the refraction field, the original measurement result has a certain error of the measurement position, and especially for the place where the refractive index change is large in the fluid to be measured, there is a significant refraction effect.
From the above description, it can be seen that the present invention provides an apparatus and a method for reducing systematic errors of integral measurement positions along the line of sight, wherein a refraction field calibration sheet is innovatively added to the existing integral measurement path along the line of sight, and a correction matrix of a refraction field considering refraction effect can be obtained through two measurements, so that the original measurement result is processed, and the systematic errors of measurement position deviation caused by refraction in the existing integral measurement method along the line of sight can be eliminated.
The device and the method for reducing the systematic error of the integral measurement position along the sight line provided by the embodiment of the invention are widely suitable for correcting various refraction effect errors of integral measurement along the sight line, are not only suitable for laser measurement, but also can be used in measurement systems such as ultrasonic measurement, ray measurement and the like. The core principle of the method is refraction effect, and errors generated by the refraction effect can be evaluated and even eliminated by the device and the method provided by the invention.
The error correction of the invention is based on the refraction effect, in fact implying the assumption: the deviation of the measuring signal in the fluid to be measured due to the influence of the refraction effect is far smaller than the deviation of the measuring signal from the fluid to be measured to the signal receiving sensor due to the real measuring point of the refraction effect. This is naturally true in most cases, where the actually measured flow field area is small, and there is a certain distance from the measured fluid to the sensor, and meanwhile, the measured wave is continuously refracted in the fluid to be measured, and then reaches the sensor plane at the maximum refraction angle when the fluid is transmitted, which may cause a large error in the measurement position.
Example two:
fig. 8 is a schematic diagram of a system for reducing the systematic error of the integral-along-line-of-sight measurement position according to an embodiment of the present invention, which is applied to the apparatus in the first embodiment. As shown in fig. 8, the system includes: a first acquisition module 100, a second acquisition module 200, and a determination module 300.
Specifically, the first obtaining module 100 is configured to obtain a standard coordinate field formed by the source measurement signal passing through the refraction field calibration sheet when the measurement field to be measured does not exist along the sight integration measurement system.
The second obtaining module 200 is configured to obtain a changing coordinate field formed after the source measurement signal passes through the refraction field calibration sheet when the measurement field to be measured is placed in the line-of-sight integral measurement system.
The determining module 300 is configured to determine a correction matrix of the measurement field to be measured based on a position offset of the changed coordinate field with respect to the standard coordinate field.
The invention provides a system for reducing the systematic error of a position measured along sight line integral, which can quantitatively measure the systematic error of the position generated by refraction by adding a position correction device along the measurement path of the sight line integral measurement system, thereby relieving the technical problem of the error generated by the refraction phenomenon in the prior art.
Alternatively, fig. 9 is a schematic diagram of another system for reducing the systematic error of the integral measurement of the position along the line of sight according to an embodiment of the present invention. As shown in fig. 9, the system further includes: a modification module 400 for: measuring a measurement field to be measured by an integral measurement system along the sight line to obtain an initial measurement result; and correcting the initial measurement result based on the correction matrix to obtain a corrected measurement result.
The embodiment of the present invention further provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and capable of running on the processor, and when the processor executes the computer program, the steps of the method in the first embodiment are implemented.
The embodiment of the invention also provides a computer readable medium with a non-volatile program code executable by a processor, wherein the program code causes the processor to execute the method in the first embodiment.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.
Claims (9)
1. A device for reducing the systematic error of the integral measurement position along the sight line is applied to the integral measurement system along the sight line; the integral along line of sight measurement system comprises: a measuring signal generator and a signal receiving sensor; it is characterized by comprising: a refraction field calibration sheet; the refraction field calibration sheet is arranged between the measuring signal generator and the signal receiving sensor;
the measurement signal generator is used for providing a source measurement signal for the integral measurement system along the sight line; the measuring signal generator is specifically used for generating strong-coherence single-wavelength laser through the laser and expanding the laser beam to a laser beam with a required diameter through the beam expanding system so as to provide the source measuring signal for the integral measuring system along the sight line;
the signal receiving sensor is used for receiving a measuring signal after passing through a measuring field to be measured;
the refraction field calibration sheet is a scattered point distribution film with preset distribution characteristics and is used for calibrating the refraction field along the measurement path of the sight line integral measurement system; wherein the preset distribution characteristics are poisson disc distribution.
2. The apparatus of claim 1, wherein the measurement signal generator comprises a laser or an ultrasonic generator.
3. A method of reducing systematic error in integrating measured positions along a line of sight, for use in an apparatus as claimed in any one of claims 1 to 2; the method comprises the following steps:
acquiring a standard coordinate field formed by the source measurement signal after passing through the refraction field calibration sheet when the measurement field to be measured is absent in the sight line integral measurement system;
acquiring a change coordinate field formed by the source measurement signal after passing through the refraction field calibration sheet when the sight line integral measurement system is placed in the measurement field to be measured;
and determining a correction matrix of the measurement field to be measured based on the position offset of the changed coordinate field relative to the standard coordinate field.
4. The method of claim 3, further comprising:
measuring the measurement field to be measured through the sight line integral measurement system to obtain an initial measurement result;
and correcting the initial measurement result based on the correction matrix to obtain a corrected measurement result.
5. The method of claim 3, wherein determining a rectification matrix for the measurement field to be measured based on a positional offset of the varying coordinate field relative to the standard coordinate field comprises:
performing local cross-correlation processing on the changed coordinate field and the standard coordinate field, and determining the deformation direction of each position coordinate in the changed coordinate field relative to the corresponding position coordinate in the standard coordinate field;
determining the rectification matrix based on the deformation direction.
6. A system for reducing systematic errors in integrating measured positions along a line of sight, for use in the apparatus of any one of claims 1-2; the method comprises the following steps: the device comprises a first acquisition module, a second acquisition module and a determination module; wherein the content of the first and second substances,
the first acquisition module is used for acquiring a standard coordinate field formed by the source measurement signal after passing through the refraction field calibration sheet when the measurement field to be measured does not exist in the sight line integral measurement system;
the second acquisition module is used for acquiring a change coordinate field formed by the source measurement signal after passing through the refraction field calibration sheet when the measurement system along the sight line integral is placed in the measurement field to be measured;
the determining module is used for determining the correction matrix of the measurement field to be measured based on the position deviation of the changed coordinate field relative to the standard coordinate field.
7. The system of claim 6, further comprising: a correction module to:
measuring the measurement field to be measured through the sight line integral measurement system to obtain an initial measurement result;
and correcting the initial measurement result based on the correction matrix to obtain a corrected measurement result.
8. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the steps of the method of any of the preceding claims 3 to 5 are implemented when the computer program is executed by the processor.
9. A computer-readable medium having non-volatile program code executable by a processor, wherein the program code causes the processor to perform the method of any of claims 3-5.
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| EP1430270A4 (en) * | 2001-09-21 | 2006-10-25 | Kmac | Apparatus for measuring thickness profile and refractive index distribution of multiple layers of thin films by means of two-dimensional reflectometry and method of measuring the same |
| CN101493311A (en) * | 2009-01-16 | 2009-07-29 | 哈尔滨工业大学 | Idle running error automatic compensation apparatus for laser heterodyne interferometer |
| JP2011220903A (en) * | 2010-04-13 | 2011-11-04 | Panasonic Corp | Refractive-index measurement method and device |
| CN107063145B (en) * | 2017-01-26 | 2018-07-24 | 大连理工大学 | Incident drift angle in ultrasonic thickness measurement recognizes automatically and error compensating method |
| CN107218904B (en) * | 2017-07-14 | 2020-03-17 | 北京航空航天大学 | Line structured light vision sensor calibration method based on sawtooth target |
| CN107401977B (en) * | 2017-08-15 | 2019-04-30 | 合肥工业大学 | The imaging compensating method of refraction deviation is considered in the measurement of high temperature binocular stereo vision |
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