CN113701669A - Method for quickly and accurately measuring profile characteristics of inner section of deep hole - Google Patents
Method for quickly and accurately measuring profile characteristics of inner section of deep hole Download PDFInfo
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- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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Abstract
The invention belongs to the technical field of geometric quantity precision measurement based on machine vision, and provides a method for quickly and accurately measuring the profile characteristics of a deep hole inner section. The ring laser emits stable ring-shaped structured light, and the convex lens photopolymerizes the discrete ring-shaped structure into parallel light; the triangular imaging lens group is used for constructing a mapping relation between the profile characteristics of the inner section of the deep hole and the optical center of the image annular structure, calibrating the space mapping relation between the geometric parameters of the small hole and the image coordinates with high precision, amplifying the profile characteristics of the inner section and improving the high-resolution acquisition of the features in the hole; the right-angle prism vertically redirects the parallel light output by the triangular imaging lens group; the magnifying lens group optically magnifies the parallel light; and the industrial camera receives the output parallel light information and acquires the profile characteristics of the inner section of the deep hole. The invention optically amplifies the offset in the hole, and can effectively improve the resolution and the measurement precision of imaging.
Description
Technical Field
The invention belongs to the technical field of geometric quantity precision measurement based on machine vision, and particularly relates to a deep hole inner section profile feature high-precision measurement method.
Background
In recent years, core equipment in important and large projects such as nuclear power, energy power, aerospace and the like in China is widely applied to small-aperture deep-hole parts, the machining precision and quality of the small-aperture deep-hole parts determine the performance of the core equipment in the important projects, and the machining precision of small-aperture deep-hole inner section contour characteristics is determined by accurately and quickly acquiring the small-aperture deep-hole inner section contour characteristics. Therefore, the research on how to obtain the characteristics of the cross section profile in the deep hole has profound significance.
A plurality of research works in the aspect are carried out by some research institutions and universities at home and abroad, and fruitful results are obtained. The method comprises the steps of researching the influence brought by assembly error and refraction distortion Based on a Laser Triangulation principle in an A Laser Triangulation-Based 3D Measurement System for Inner Surface of Deep Holes in the national Zhai-published of China, providing a flexible Laser plane calibration technology Based on binocular vision, and accurately obtaining the profile characteristics of the Inner section of a Deep hole. However, the method is limited by the size of a measuring system, and the measurement of the inner surface of a small-aperture part cannot be realized; a laser non-contact large-size inner diameter automatic measurement system of Sujie et al, Tianjin university adopts a halo section method to project a halo ring to the inner wall of a pipeline, information of the inner surface is shot through a CCD, a PC end analyzes a gray image of the ring, the appearance and defect conditions of the inner wall are detected, and the profile characteristics of the inner section of a deep hole are obtained. However, the method requires that the visual sensor and the aperture to be measured are necessarily on the same axis, which results in low applicability and poor field adaptability.
In view of this, in the existing deep hole inner surface geometric characteristic measurement, the measurement parameters are simplified, the measurement data are discontinuous, and the inner surface parameters need to be measured step by step for multiple times, so that the problems of complex measurement process, low measurement efficiency, poor precision and the like exist. The quick high accuracy measuring unit of profile characteristic adopts this group's patent to peep formula deep hole internal surface multiplication image device in the deep hole built by this patent, and application number is 202110952431.8.
Disclosure of Invention
The invention mainly solves the problems that the measurement parameters are simplified in the measurement of the geometric characteristics of the inner surface of the deep hole, the measurement data is discontinuous, the inner surface parameters need to be measured step by step for multiple times, the measurement process is complex, the measurement efficiency is low, the precision is poor and the like, and provides a method for rapidly and highly accurately measuring the profile characteristics of the inner section of the deep hole.
The technical scheme of the invention is as follows:
in order to realize the restoration of the profile characteristics of the inner section of the deep hole, the rapid high-precision measuring method for the profile characteristics of the inner section of the deep hole is based on the construction of a rapid high-precision measuring unit for the profile characteristics of the inner section of the deep hole, and mainly comprises an annular laser, a convex lens, a triangular imaging lens group, a right-angle prism, an amplifying lens group and an industrial camera.
Wherein the ring laser functions to emit stable ring-shaped structured light; the lenticular lens sheet functions to photopolymerize the discrete annular structure into parallel light; the triangular imaging lens group has the functions of constructing a mapping relation between the profile characteristics of the inner section of the deep hole and the optical center of the image annular structure, calibrating the space mapping relation between the geometric parameters of the small hole and the image coordinates with high precision, amplifying the profile characteristics of the inner section and improving the high-resolution acquisition of the characteristics in the hole; the right-angle prism has the function of vertically redirecting the parallel light output by the triangular imaging lens group; the magnifying lens group is used for optically magnifying the parallel light; the industrial camera has the function of receiving the output parallel light information and acquiring the profile characteristics of the inner section of the deep hole.
In order to ensure the stable light input of the annular structure, the annular laser is adopted, and the influence of external factors is eliminated to the maximum extent. In order to realize the light precision calibration result of the deep hole inner section outline characteristic, the invention adopts a triangular imaging lens group to construct a model between the deep hole inner section outline characteristic and the image annular structure light center, thereby obtaining the high precision calibration result. In order to improve the calibration precision, the invention adopts the triangular imaging lens group to amplify the profile of the cross section in the deep hole, thereby improving the resolution acquisition of the features in the hole and further improving the calibration precision. In order to ensure the precision of measuring the profile of the inner section of the deep hole, the invention adopts the magnifying lens to carry out secondary magnification on the profile characteristics of the inner section, and obtains a tiny physical quantity by measuring the magnified physical quantity, thereby ensuring the measuring precision.
The invention has the advantages that: the invention can efficiently realize the accurate measurement of the geometric parameters of the inner surface of the small caliber of the deep hole; the invention discloses a mapping rule between geometric parameters of the section of the small hole and pixel coordinates of an image by using the prior knowledge of the angle, the refractive index and the like of the lens. The invention optically amplifies the offset in the hole, and can effectively improve the resolution and the measurement precision of imaging.
Drawings
FIG. 1 is a flow chart of a method for quickly and accurately measuring the profile characteristics of the inner section of a deep hole.
Fig. 2 is a structure diagram of a device for quickly and accurately measuring the profile characteristics of the inner section of a deep hole.
FIG. 3 is a schematic diagram of a method for rapidly and accurately measuring the profile characteristics of the inner section of a deep hole.
In the figure: a ring laser; incident light; ③ convex lens; fourthly, right-angle prism; measuring the inner wall of the cylinder; sixthly, a refraction prism; seventhly, reflecting prism; eighthly, forming a triangular imaging lens group; ninthly, an amplifier group; an industrial camera in r.
Detailed Description
The following further describes a specific embodiment of the present invention with reference to the drawings and technical solutions.
A method for quickly and accurately measuring the profile characteristics of the inner section of a deep hole comprises the following steps:
the method comprises the following steps of 1, building a deep hole inner section profile characteristic rapid high-precision measuring unit, and building the deep hole inner section profile characteristic rapid high-precision measuring unit in order to realize reduction of the deep hole inner section profile characteristic and further realize high-precision measurement of the deep hole inner section profile characteristic. The system consists of an annular laser, a convex lens, a triangular imaging lens group, a right-angle prism, an amplifying lens group and an industrial camera.
Wherein the ring laser functions to emit stable ring-shaped structured light; the lenticular lens sheet functions to photopolymerize the discrete annular structure into parallel light; the triangular imaging device group has the functions of constructing the mapping relation between the profile characteristics of the inner section of the deep hole and the optical center of the image annular structure, calibrating the space mapping relation between the geometric parameters of the small hole and the image coordinates with high precision, amplifying the profile characteristics of the inner section and improving the high-resolution acquisition of the features in the hole. The right-angle prism has the function of vertically redirecting the parallel light output by the triangular imaging mirror group; the magnifying lens group is used for optically magnifying the parallel light, enlarging the profile characteristics of the inner section of the deep hole and further improving the high-resolution acquisition of the inner characteristics of the deep hole; the industrial camera has the function of receiving the output parallel light information and acquiring the profile characteristics of the inner section of the deep hole. The structure is shown in fig. 2.
Step 2 input of Ring structured light
Aiming at the rapid high-precision measuring unit for the profile characteristics of the inner section of the deep hole built in the step 1, in order to ensure the stable input of the annular structure light, the invention adopts a first annular laser, and stably and rapidly inputs the annular structure light to the measuring unit to be used as a second incident light, so as to ensure the rapid measurement of the profile characteristics of the inner section of the deep hole. In order to reduce the loss of luminous flux and further improve the image quality of the profile characteristics of the inner section of the deep hole. In order to control the size of an input light spot, the annular laser device is moved leftwards and rightwards, and the purpose of controlling the size of the light spot is achieved by controlling the distance between the annular laser device and the convex lens and converging the light spot through a small aperture. In order to ensure the measurement precision, the invention adopts the convex lens, and the incident light is polymerized, parallelly redirected and converted into parallel light, thereby reducing the loss of luminous flux and further ensuring the measurement precision.
And (3) inputting the triangular imaging mirror group aiming at the parallel light in the step (2). In order to realize high-precision calibration of the space mapping relation between the geometric parameters of the inner surface profile of the small hole and the image profile coordinates, the invention constructs that after the micro-displacement deviation Delta S of the profile characteristics of the inner section of the deep hole is optically reflected by a triangular imaging device and a reflecting prism, the micro-displacement deviation Delta S of the inner wall of the measuring cylinder is accurately mapped into Delta K and a relation model is constructed, namely the invention
ΔK＝cos(α-90°)·cos(270°-2α)·ΔS
Wherein alpha is the apex angle of the left triangular prism
Aiming at the relation model, after optical refraction is carried out by a triangular imaging device, the Delta K is accurately mapped into Delta h, and the relation model, namely the relation model is constructed
Wherein deltaminThe minimum deflection angle of the right triangular prism; alpha is alpha1The vertex angle of the right triangular prism; n represents the refractive index of the refractive prism;
aiming at the two relation models, a model between the profile characteristics of the inner section of the deep hole and the optical center of the image annular structure is constructed, namely
Wherein deltaminThe minimum deflection angle of the right triangular prism; alpha is alpha1The vertex angle of the right triangular prism; alpha is the apex angle of the left prism
Aiming at the model, the invention analyzes the cone angles alpha and alpha of different conical reflectors in the triangular imaging area1Cone angle alpha of conical projection prism1The generated primary amplification multiplication imaging effect realizes the optical amplification of the radial tiny displacement change signal delta S into delta h; and carrying out high-precision calibration on the space mapping relation between the geometric parameters of the small holes and the image coordinates. In order to extract effective contour features in the hole or capture micro-disturbance of the contour of the inner section of the hole, the invention adopts the triangular lens to amplify the parallel light spots so as to amplify the contour features of the inner section of the deep hole, improve the resolution acquisition of the features in the hole and extract the effective contour features or the micro-disturbance. In order to retain effective contour characteristics and improve calibration precision, the invention adopts a triangular lens to retain extractedAnd the profile characteristics are effectively obtained, and the sizes of the parallel light spots are simultaneously scaled, so that the calibration precision is improved, and the profile characteristics of the inner surface of the deep hole are accurately represented.
Aiming at the accurate representation of the deep hole inner surface profile characteristics in the step 3, in order to solve the problems of low physical resolution and poor measurement precision of direct imaging, the offset delta h obtained in the step 3 is adopted for optical amplification, so that the resolution and the measurement precision are improved. In order to ensure the stable steering of the parallel light, the invention adopts a right-angle prism to receive the parallel light processed by the triangular imaging mirror group for vertical steering, thereby realizing the stable steering of the parallel light; in order to further improve the high-resolution acquisition of the features in the hole, the invention designs a secondary optical nine-amplifying lens group at the front section of the imaging lens and constructs a secondary optical amplification model, namely
Wherein: f. of1Is the focal length of the upper convex lens; f. of2The focal length of the lower convex lens; n is1Is the refractive index of the upper convex lens material; n is2Is the refractive index of the underlying convex lens material; r is1The radius of the upper spherical surface of the upper convex lens;
r2the radius of the lower spherical surface of the upper convex lens; r is3The radius of the upper spherical surface of the lower convex lens; r is4The radius of the lower spherical surface of the lower convex lens; d1Is the thickness of the upper convex lens; d2Is the thickness of the lower convex lens.
Aiming at the model, the invention designs and determines the combination mode and parameters of the optical magnifier group, and further magnifies the Delta S in the step 3 into Delta R which is
The above description of exemplary embodiments is presented only to illustrate the technical solution of the invention and is not intended to be exhaustive or to limit the invention to the precise form described. Obviously, many modifications and variations are possible in light of the above teaching to those skilled in the art. The exemplary embodiments were chosen and described in order to explain certain principles of the invention and its practical application to thereby enable others skilled in the art to understand, implement and utilize the invention in various exemplary embodiments and with various alternatives and modifications. It is intended that the scope of the invention be defined by the following claims and their equivalents.
Claims (1)
1. A method for quickly and accurately measuring the profile characteristics of the inner section of a deep hole is characterized by comprising the following steps:
step 1, building a deep hole inner section outline characteristic rapid high-precision measuring unit
The rapid high-precision measuring unit for the profile characteristics of the inner section of the deep hole mainly comprises an annular laser, a convex lens, a triangular imaging lens group, a right-angle prism, an amplifying lens group and an industrial camera;
the ring laser is used for emitting stable ring-shaped structured light; the lenticular lens photopolymerizes the discrete annular structure into parallel light; the triangular imaging lens group is used for constructing a mapping relation between the profile characteristics of the inner section of the deep hole and the optical center of the annular structure, calibrating the space mapping relation between the geometric parameters of the small hole and the image coordinates, and amplifying the profile characteristics of the inner section, so that the high-resolution acquisition of the features in the hole is improved; the right-angle prism is used for vertically redirecting the parallel light output by the triangular imaging lens group; the magnifying lens group optically magnifies the parallel light, enlarges the profile characteristics of the inner section of the deep hole, and further improves the high-resolution acquisition of the characteristics in the hole; the industrial camera receives the output parallel light information and obtains the profile characteristics of the inner section of the deep hole;
step 2, inputting annular structure light
In order to control the size of an input light spot, a ring laser is moved back and forth, and the size of the light spot is controlled by controlling the distance between the ring laser and a convex lens and converging through a small aperture; the convex lens is adopted to receive light spots input by the annular laser and polymerize the scattered light spots into parallel light;
step 3, triangular imaging
Inputting the parallel light polymerized in the step 2 into a triangular imaging lens group; in order to realize high-precision calibration of a space mapping relation between geometric parameters of an inner surface profile of a small hole and image profile coordinates, the method comprises the steps of constructing a deep hole inner section profile characteristic micro-displacement deviation delta S, performing optical reflection on the deep hole inner section profile characteristic micro-displacement deviation delta S through a reflecting prism in a triangular imaging mirror group, accurately mapping the deep hole inner section profile characteristic micro-displacement deviation delta S into delta K, and constructing a relation model, namely, the delta K is cos (alpha-90 degrees), cos (270-2 alpha) and delta S; wherein alpha is the apex angle of the left triangular prism;
after the optical refraction is carried out on the relation model through the triangular imaging mirror group refraction prism, the delta K is accurately mapped into delta h, and the relation model, namely the relation model is constructed
Wherein, deltaminThe minimum deflection angle of the right triangular prism; alpha is alpha1The vertex angle of the right triangular prism; n represents the refractive index of the refractive prism;
the two relation models are used for constructing a model between the profile characteristics of the inner section of the deep hole and the optical center of the annular structure, namely
Step 4, restoring the profile characteristics of the inner section of the deep hole
Aiming at the accurate representation of the deep hole inner surface profile characteristics in the step 3, in order to solve the problems of low physical resolution and poor measurement precision of direct imaging, the offset delta h obtained in the step 3 is adopted for optical amplification, so that the resolution and the measurement precision are improved; in order to further improve the high-resolution acquisition of the features in the hole, a secondary optical amplifying lens group is designed at the front section of the imaging lens, and a secondary optical amplifying model is constructed, namely
Wherein: f. of1Is the focal length of the upper convex lens; f. of2The focal length of the lower convex lens; n is1Is the refractive index of the upper convex lens material; n is2Is the refractive index of the underlying convex lens material; r is1The radius of the upper spherical surface of the upper convex lens; r is2The radius of the lower spherical surface of the upper convex lens; r is3The radius of the upper spherical surface of the lower convex lens; r is4The radius of the lower spherical surface of the lower convex lens; d1Is the thickness of the upper convex lens; d2Is the thickness of the lower convex lens;
determining the combination mode and parameters of the optical magnifier based on the model design, further magnifying Δ S in step 3 to Δ R,
expanding the tiny disturbance of the profile characteristics of the inner surface of the deep hole to generate obvious change; in order to realize high-precision calibration of a space mapping relation between geometric parameters of the small hole and image coordinates, a standard deep hole piece with known parameters is measured by using a secondary amplified image to obtain a high-precision calibration result; in order to further improve the precision of visual measurement, the method and the device have the advantages that the in-hole offset delta S and the image coordinate relation are combined, the resolution ratio under an image coordinate system is determined, the high-precision reduction of the profile characteristics of the inner section of the deep hole is further realized, and the rapid high-precision measurement of the profile characteristics of the inner section of the deep hole is completed through an industrial camera.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114264249A (en) * | 2021-12-14 | 2022-04-01 | 中国石油大学(华东) | Three-dimensional measuring system and method for deep hole narrow inner cavity |
| CN114858059A (en) * | 2022-07-06 | 2022-08-05 | 北京航空航天大学 | Apparatus, method and system for reducing systematic errors in integrating measured positions along a line of sight |
| CN115265361A (en) * | 2022-06-27 | 2022-11-01 | 赛赫智能设备（上海）股份有限公司 | Method for measuring parameters of inner hole of flat pad of fastener by using non-contact cone mirror |
| CN115900600A (en) * | 2023-02-21 | 2023-04-04 | 陕西深孔智越科技有限公司 | Deep hole straightness and contour detection device and detection method |
| CN117433421A (en) * | 2023-12-20 | 2024-01-23 | 中北大学 | Multi-geometric-quantity deep hole measuring instrument based on microscope and measuring method thereof |
| CN117781909A (en) * | 2024-02-27 | 2024-03-29 | 中北大学 | Deep hole measuring device and measuring method |
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2021
- 2021-09-26 CN CN202111126069.5A patent/CN113701669A/en not_active Withdrawn
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114264249A (en) * | 2021-12-14 | 2022-04-01 | 中国石油大学(华东) | Three-dimensional measuring system and method for deep hole narrow inner cavity |
| CN115265361A (en) * | 2022-06-27 | 2022-11-01 | 赛赫智能设备（上海）股份有限公司 | Method for measuring parameters of inner hole of flat pad of fastener by using non-contact cone mirror |
| CN114858059A (en) * | 2022-07-06 | 2022-08-05 | 北京航空航天大学 | Apparatus, method and system for reducing systematic errors in integrating measured positions along a line of sight |
| CN115900600A (en) * | 2023-02-21 | 2023-04-04 | 陕西深孔智越科技有限公司 | Deep hole straightness and contour detection device and detection method |
| CN115900600B (en) * | 2023-02-21 | 2023-05-12 | 陕西深孔智越科技有限公司 | Deep hole straightness and contour detection device and detection method |
| CN117433421A (en) * | 2023-12-20 | 2024-01-23 | 中北大学 | Multi-geometric-quantity deep hole measuring instrument based on microscope and measuring method thereof |
| CN117433421B (en) * | 2023-12-20 | 2024-03-08 | 中北大学 | Multi-geometric-quantity deep hole measuring instrument based on microscope and measuring method thereof |
| CN117781909A (en) * | 2024-02-27 | 2024-03-29 | 中北大学 | Deep hole measuring device and measuring method |
| CN117781909B (en) * | 2024-02-27 | 2024-04-26 | 中北大学 | Deep hole measuring device and measuring method |
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Application publication date: 20211126 |