CN114609625A

CN114609625A - Reflective continuous rotation radar scanning device, measuring system and material measuring method

Info

Publication number: CN114609625A
Application number: CN202210056386.2A
Authority: CN
Inventors: 呼秀山; 李圆圆
Original assignee: Beijing Ruida Instrument Co ltd
Current assignee: Beijing Ruida Instrument Co ltd
Priority date: 2022-01-18
Filing date: 2022-01-18
Publication date: 2022-06-10
Anticipated expiration: 2042-01-18
Also published as: CN114609625B

Abstract

The present disclosure provides a reflective continuous rotation radar scanning device, comprising: a microwave module capable of forming a transmit beam and receiving an incident beam; the reflecting structure is arranged at a preset distance from the microwave module, and a reflecting surface of the reflecting structure forms a first angle with a transmitting beam of the microwave module and reflects the received transmitting beam to form an emergent beam of a second angle; and the driving mechanism is used for driving the reflecting structure to rotate, the first angle is changed by the rotation of the reflecting structure, so that the second angle is changed, the emergent beams with different second angles form rotating beams, and different measuring points on the surface of the material in one two-dimensional scanning plane are measured in a time-sharing manner based on the rotating beams, so that the two-dimensional measurement of the surface profile of the material is realized. The disclosure also provides a material three-dimensional shape measuring system and a material measuring method.

Description

Reflective continuous rotation radar scanning device, measuring system and material measuring method

Technical Field

The disclosure relates to a reflective continuous rotation radar scanning device, a material three-dimensional form measuring system and a material measuring method.

Background

In the process of level measurement, level detection is increasingly required due to the non-uniformity of the distribution of the material. Not only the position value of a certain measuring point of the material needs to be obtained, but also the distribution form information of the material needs to be obtained, so that the distribution condition of the material can be better known, and more accurate measuring information can be obtained. Provides guidance basis for subsequent process control, improves production efficiency, reduces cost and the like. At present, in the process of measuring the material form, a video monitoring technology, an infrared imaging technology, a laser scanning measurement method and a microwave radar measurement technology are generally adopted to detect the distribution of the material form.

The video monitoring technology obtains material images through camera shooting, but the light of the measuring environment is sufficient. The infrared imaging technology is used for processing an infrared image on the surface of a material, detecting the temperature distribution of a discharge surface and distinguishing the temperature distribution by using a color image, but the infrared imaging technology is easily influenced by dust, high-temperature airflow and the like. The laser scanning measurement technology obtains the shape of the surface of a material by transmitting laser signals in multiple directions and measuring the direct proportion relationship between the distance and the time for receiving the reflected signals, but the technology is very susceptible to the adverse conditions of dust, water mist and the like. The radar measurement technology adopts a plurality of single-point radars to measure in a combined mode to display the approximate form of the material, but the installation points are more, so that the requirement on the installation environment is high, the cost required by arranging the plurality of single-point radars is also high, the more accurate the material form measurement is, the more the number of the required single-point radars is, and the higher the cost correspondence is. In addition, material data of each azimuth can be measured by rotating/swinging a radar using a rotation/swing mechanism, but the structure is complicated.

Because the radar measurement technology can accurately measure the material information in a completely dark environment and can overcome the condition of complex working conditions, the device or the system which has a simple structure and adopts the radar measurement technology has a good application prospect.

Disclosure of Invention

In order to solve one of the above technical problems, the present disclosure provides a reflective continuous rotation radar scanning device, a material three-dimensional shape measurement system and a material measurement method.

According to one aspect of the present disclosure, there is provided a reflective continuous rotation radar scanning device for measuring material and acquiring material information, comprising:

a microwave module capable of forming a transmit beam and receiving an incident beam;

a reflective structure disposed at a predetermined distance from the microwave module, and a reflective surface of the reflective structure forming a first angle with a transmission beam of the microwave module and reflecting the received transmission beam to form an exit beam of a second angle; and

the driving mechanism is used for driving the reflecting structure to rotate, the rotating direction of the reflecting structure is a single-direction anticlockwise or clockwise continuous rotation or a reciprocating rotation within a certain angle range of clockwise and anticlockwise, the first angle is changed by the rotation of the reflecting structure, so that the second angle is changed, the emergent beams with different second angles form rotating beams, different measuring points on the surface of the material in a two-dimensional scanning plane are measured in a time-sharing manner based on the rotating beams, and the two-dimensional measurement of the surface profile of the material is realized,

in each measurement process of each measurement point of different measurement points, the transmitting beam is transmitted to the reflecting structure, the transmitting beam is reflected by the reflecting structure to form an emergent beam, the emergent beam reaches the measurement point of the material surface and then is reflected to form a reflected beam, the reflected beam is received by the reflecting structure and is reflected by the reflecting structure to form an incident beam, and the incident beam is provided to the microwave module to form a measurement signal, so that the measurement of the measurement point is realized, wherein in each measurement process of each measurement point, the reflecting structure is driven by the driving mechanism to be in a rotating state all the time, the angle formed by the reflecting beam corresponding to each measurement point and the reflecting structure is different from a second angle, and the angle formed by the incident beam and the reflecting structure is different from a first angle.

According to the reflective continuous rotation radar scanning device of at least one embodiment of the present disclosure, the reflective surface of the reflective structure is at least one of a plane, a curved surface, a broken line surface, or a paraboloid.

According to the reflective continuous rotation radar scanning device of at least one embodiment of the present disclosure, the transmission beam is a narrow beam, and the beam angle of the narrow beam is less than or equal to 3 degrees.

According to the reflective continuous rotation radar scanning device of at least one embodiment of the present disclosure, the microwave signals in the frequency range of 60 to 300GHz are converged by the horn antenna or the lens antenna to form the narrow beam.

According to the reflective continuous rotation radar scanning device of at least one embodiment of the present disclosure, the microwave module can be controlled to generate different types and/or frequencies of transmission beams.

According to the reflective continuous rotation radar scanning device of at least one embodiment of the present disclosure, the transmission beam is a linear polarized beam in a single direction or a circular polarized beam in a single direction; or a mixed beam in which a plurality of linearly polarized beams and circularly polarized beams are mixed; or a linearly polarized beam and a circularly polarized beam that can be switched.

According to the reflective continuous rotation radar scanning device of at least one embodiment of the present disclosure, the measurement signal includes at least one of a measured distance, an incident beam waveform characteristic, an incident beam amplitude characteristic, and an incident beam width characteristic.

According to the reflective continuous rotation radar scanning device in at least one embodiment of the present disclosure, in the time-sharing measurement, the microwave module emits a transmission beam at every preset fixed time interval or at every preset regularly-changing time interval, and in the every measurement process, the driving mechanism drives the reflection structure to be in a rotation state at a preset fixed rotation speed or at a regularly-changing rotation speed.

The reflective continuous rotation radar scanning device according to at least one embodiment of the present disclosure further includes a detection device for detecting angle/position information of the reflective structure.

According to the reflective continuous rotation radar scanning device of at least one embodiment of the present disclosure, the two-dimensional information of the material surface profile is obtained based on the angle/position information of the reflective structure of each measurement point and the measurement signal.

The reflective continuous rotation radar scanning device according to at least one embodiment of the present disclosure further includes a horn antenna or a lens antenna that converges at least the outgoing beam.

According to another aspect of the present disclosure, there is provided a material three-dimensional shape measurement system, including:

the reflective continuous rotation radar scanning device as described in any one of the above embodiments, the reflective structure and the incident angle of the transmitting beam are switched between different two-dimensional scanning planes by the displacement mechanism and/or by adjusting the incident angle of the reflective structure and the transmitting beam, so as to measure the surface of the material in the two-dimensional scanning planes, and finally, the three-dimensional measurement of the profile of the surface of the material is realized based on the measurement information of the two-dimensional scanning planes.

According to the material three-dimensional shape measuring system in at least one embodiment of the present disclosure, the displacement mechanism controls the radar scanning device to move in a direction forming a preset included angle with the two-dimensional scanning surface, so as to realize measurement on the surface of the material in a plurality of two-dimensional scanning surfaces.

According to the material three-dimensional shape measuring system of at least one embodiment of the present disclosure, the predetermined included angle is 90 °.

According to the material three-dimensional shape measuring system of at least one embodiment of the present disclosure, incident angles of the reflection structure and the transmission beam are adjusted, and each incident angle corresponds to one two-dimensional scanning plane, so as to realize measurement of the material surface in a plurality of two-dimensional scanning planes.

According to still another aspect of the present disclosure, there is provided a material measuring method including:

a transmitting step: forming a transmission beam through a microwave module;

a rotating step, wherein the reflecting structure is driven to be in a rotating state all the time by a driving mechanism;

a reflection step: reflecting the transmitted beam by a reflecting structure and generating an outgoing beam, which forms a reflected beam via reflection of one measuring point of the material surface and reflects the transmitted beam by the reflecting structure to generate an incoming beam;

a receiving step: receiving, by the microwave module, the incident beam and generating a measurement signal for the one measurement point;

repeating the transmitting, rotating, reflecting and receiving steps to form measurement signals for a plurality of measurement points of a two-dimensional scan plane, an

A generation step: generating the material profile curve based on the measurement signals of the plurality of measurement points.

The material measuring method according to at least one embodiment of the present disclosure further includes detecting angle/position information of the reflection structure, and generating the material profile curve based on measurement signals of the plurality of measurement points and the angle/position information of the reflection structure corresponding to each of the plurality of measurement points.

According to the material measuring method of at least one embodiment of the present disclosure, the transmission beam is a narrow beam, and a beam angle of the narrow beam is less than or equal to 3 degrees.

According to the material measuring method of at least one embodiment of the disclosure, microwave signals in a frequency range of 60-300 GHz are converged through a horn antenna or a lens antenna to form the narrow beam.

According to a material measuring method of at least one embodiment of the present disclosure, the microwave module can be controlled to generate different types and/or frequencies of transmission beams.

According to the material measuring method of at least one embodiment of the present disclosure, the transmission beam is a linear polarized beam in a single direction or a circular polarized beam in a single direction; or a hybrid beam of a plurality of linearly polarized beams mixed with a circularly polarized beam; or a linearly polarized beam and a circularly polarized beam that can be switched.

According to a material measuring method of at least one embodiment of the present disclosure, the measurement signal includes at least one of a measured distance, an incident beam waveform characteristic, an incident beam amplitude characteristic, and an incident beam width characteristic.

According to the material measuring method of at least one embodiment of the present disclosure, in the measuring process of each measuring point, the microwave module emits a transmission beam at each time according to a preset fixed time interval or a time interval changing according to a preset rule, and the driving mechanism drives the reflection structure to be in a rotation state according to a preset fixed rotation speed or a rotation speed changing regularly.

The material measuring method according to at least one embodiment of the present disclosure further includes:

a switching step of switching from one two-dimensional scanning surface to another two-dimensional scanning surface, and repeating the transmitting step, the rotating step, the reflecting step, the receiving step and the switching step to obtain measurement signals of a plurality of measurement points of a plurality of two-dimensional scanning surfaces; and

a three-dimensional form generation step: a three-dimensional shape of the material profile is generated based on measurement signals of a plurality of measurement points of the plurality of two-dimensional scan planes.

The material measuring method according to at least one embodiment of the present disclosure further includes: and detecting movement information of the displacement mechanism and/or incident angle adjustment information of the reflection structure and the emission beam, and generating the three-dimensional shape of the material profile based on measurement signals of a plurality of measurement points, angle/position information of the reflection structure corresponding to each measurement point, and movement information of the displacement mechanism and/or incident angle adjustment information of the reflection structure and the incident beam.

Drawings

The accompanying drawings, which are included to provide a further understanding of the disclosure and are incorporated in and constitute a part of this specification, illustrate exemplary embodiments of the disclosure and together with the description serve to explain the principles of the disclosure.

Fig. 1 is a schematic structural diagram of a radar scanning apparatus according to an embodiment of the present disclosure.

Fig. 2 is a schematic structural diagram of a radar scanning device according to an embodiment of the present disclosure.

Fig. 3 is a schematic structural diagram of a radar scanning apparatus according to an embodiment of the present disclosure.

Fig. 4 is a schematic structural diagram of a control system according to an embodiment of the present disclosure.

Fig. 5 is a schematic structural diagram of a main control board and a microwave module according to an embodiment of the present disclosure.

Fig. 6 is a flow chart of a control method according to an embodiment of the present disclosure.

Fig. 7 is a flowchart of a control method according to an embodiment of the present disclosure.

Description of reference numerals:

100 microwave module

101 power supply module

102 communication module

103 processor

104 phase-locked loop

105 signal transmitting module

106 antenna module

107 signal receiving module

108 mixer

109 intermediate frequency amplifier

110 AD collector

200 reflective structure

300 driving mechanism

310 electric machine

320 output shaft

330 fixing device

400 casing

410 mounting bracket

500 protective cover

600 master control board

601 power supply module

602 process control module

603 communication module

700, an upper computer.

Detailed Description

The present disclosure will be described in further detail with reference to the drawings and embodiments. It is to be understood that the specific embodiments described herein are for purposes of illustration only and are not to be construed as limitations of the present disclosure. It should be further noted that, for the convenience of description, only the portions relevant to the present disclosure are shown in the drawings.

It should be noted that the embodiments and features of the embodiments in the present disclosure may be combined with each other without conflict. Technical solutions of the present disclosure will be described in detail below with reference to the accompanying drawings in conjunction with embodiments.

Unless otherwise indicated, the illustrated exemplary embodiments/examples are to be understood as providing exemplary features of various details of some ways in which the technical concepts of the present disclosure may be practiced. Accordingly, unless otherwise indicated, features of the various embodiments may be additionally combined, separated, interchanged, and/or rearranged without departing from the technical concept of the present disclosure.

The use of cross-hatching and/or shading in the drawings is generally used to clarify the boundaries between adjacent components. As such, unless otherwise noted, the presence or absence of cross-hatching or shading does not convey or indicate any preference or requirement for a particular material, material property, size, proportion, commonality between the illustrated components and/or any other characteristic, attribute, property, etc., of a component. Further, in the drawings, the size and relative sizes of components may be exaggerated for clarity and/or descriptive purposes. While example embodiments may be practiced differently, the specific process sequence may be performed in a different order than that described. For example, two processes described consecutively may be performed substantially simultaneously or in reverse order to that described. In addition, like reference numerals denote like parts.

When an element is referred to as being "on" or "on," "connected to" or "coupled to" another element, it can be directly on, connected or coupled to the other element or intervening elements may be present. However, when an element is referred to as being "directly on," "directly connected to" or "directly coupled to" another element, there are no intervening elements present. For purposes of this disclosure, the term "connected" may refer to physically connected, electrically connected, and the like, with or without intervening components.

For descriptive purposes, the present disclosure may use spatially relative terms such as "below … …," below … …, "" below … …, "" below, "" above … …, "" above … …, "" higher "and" side (e.g., as in "side walls") to describe one component's relationship to another (other) component as illustrated in the figures. Spatially relative terms are intended to encompass different orientations of the device in use, operation, and/or manufacture in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as "below" or "beneath" other elements or features would then be oriented "above" the other elements or features. Thus, the exemplary term "below … …" can encompass both an orientation of "above" and "below". Further, the devices may be otherwise positioned (e.g., rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

The terminology used herein is for the purpose of describing particular embodiments and is not intended to be limiting. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. Furthermore, when the terms "comprises" and/or "comprising" and variations thereof are used in this specification, the presence of stated features, integers, steps, operations, elements, components and/or groups thereof are stated but does not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components and/or groups thereof. It is also noted that, as used herein, the terms "substantially," "about," and other similar terms are used as approximate terms and not as degree terms, and as such, are used to interpret inherent deviations in measured values, calculated values, and/or provided values that would be recognized by one of ordinary skill in the art.

According to an embodiment of the present disclosure, there is provided a reflective continuous rotation radar scanning apparatus (hereinafter, referred to as a radar scanning apparatus).

FIG. 1 illustrates a radar scanning apparatus according to one embodiment of the present disclosure. As shown in fig. 1, the radar scanning apparatus may include a microwave module 100, a reflection structure 200, and a driving mechanism 300.

In the present disclosure, a microwave beam emitted from the microwave module 100 (which may be a processed beam of a microwave beam emitted from a transmitting antenna module of the microwave module) is referred to as a transmitting beam, and the transmitting beam is reflected by the reflecting structure 200 to form an outgoing beam. The microwave beam formed by the surface of the material after the outgoing beam is transmitted to the material is called as a reflected beam. The reflected beam is then reflected to the reflecting structure 200, the microwave beam generated by the reflecting structure is referred to as the incident beam, and the incident beam is received by the receiving antenna module of the microwave module 100.

The microwave module 100 is capable of forming a transmit beam as well as receiving an incident beam. The transmission beam formed by the microwave module 100 may be a narrow beam, and the beam angle of the narrow beam may be controlled to be ≦ 3 °. For example, a microwave antenna may be included in the microwave module and may emit a microwave beam. The microwave beam can be focused into a narrow beam by a horn antenna or a lens antenna in the microwave module.

The microwave module 100 may be controlled to generate different types and/or frequencies of transmit beams. For example, the frequency range of the transmitted beam may be 60-300 GHz. The transmitting beam can be a linear polarized beam in a single direction or a circular polarized beam in a single direction; or may be a hybrid beam of a plurality of linearly polarized beams mixed with a circularly polarized beam; or may be a linearly polarized beam and a circularly polarized beam that can be switched. For example, the microwave antennas in the microwave module 100 may be antenna arrays to implement mutual switching of multiple polarization modes or to simultaneously emit multiple polarized microwave beams, which may be linear polarized beams and circular polarized beams, where the linear polarized beams may be horizontally polarized beams and/or vertically polarized beams. In the present disclosure, a hybrid beam in which a plurality of linearly polarized beams are mixed with a circularly polarized beam or a linearly polarized beam and a circularly polarized beam that can be switched may be preferably employed. Therefore, the surface of the material can be scanned by microwave beams with different polarization forms, so that reflected beams with different reflection performances can be obtained in one measurement. Compared with the prior art, the method can better improve the analysis capability of the material surface.

The reflection structure 200 is disposed at a predetermined distance from the microwave module 100. The reflecting surface of the reflecting structure 200 forms a first angle with the transmission beam of the microwave module 100 and reflects the transmission beam received by it to form an exit beam of a second angle. The reflecting surface of the reflecting structure 200 is at least one of a plane, a curved surface, a polygonal line surface, or a paraboloid. The reflection structure 200 is driven by the driving structure 300 to rotate, and when the position of the microwave module 100 is fixed, the direction of the emitted beam of the microwave module 100 is not changed, but the first angle of the reflection surface of the reflection structure 200 relative to the emitted beam will be changed because the reflection structure 200 is in a rotating state. Accordingly, the direction of the outgoing beam generated by reflection from the reflecting surface will be shifted with respect to the previous outgoing beam. Thus, the last outgoing beam is used to measure one measuring point of the material surface, and the outgoing beam formed after the reflection structure 200 rotates this time is used to measure another measuring point of the material surface. By continuously rotating the reflecting structure 200, the radar scanning device will achieve a measurement of the material surface of the scanning surface consisting of a plurality of measuring points. For example, in fig. 1 and 2, dashed lines show the reflective structure 200 after rotation.

In each measurement process of each measurement point of different measurement points, a transmitting beam is transmitted to the reflecting structure 200, an emergent beam is formed after the transmitting beam is reflected by a reflecting surface of the reflecting structure 200, the emergent beam reaches the measurement point on the surface of the material and then is reflected to form a reflecting beam, the reflecting beam is received by the reflecting structure and is reflected by the reflecting structure to form an incident beam, and the incident beam is provided to the microwave module to form a measurement signal, so that the measurement of the measurement point is realized, wherein in each measurement process of each measurement point, the reflecting structure is driven by the driving mechanism to be in a rotating state all the time, an angle formed by the reflecting beam corresponding to each measurement point and the reflecting structure is different from a second angle, and an angle formed by the incident beam and the reflecting structure is different from a first angle.

The rotation of the reflective structure 200 may be driven by a drive mechanism 300. The driving mechanism 300 is used for driving the reflection structure 200 to rotate, so that the first angle is changed, the second angle is changed, the emergent beams with different second angles form rotating beams, and different measuring points on the surface of the material in one two-dimensional scanning plane are measured in a time-sharing manner based on the rotating beams, so that the two-dimensional measurement of the surface profile of the material is realized. The drive mechanism 300 may be in the form of a motor 310 or the like. The reflective structure 200 may be mounted on the output shaft 320 of the motor 310, for example, by a fixture 330. The output shaft 320 rotates to drive the reflection structure 200 to rotate, for example, the direction of the reflection structure 200 driven by the motor 310 may be a single direction of continuous counterclockwise rotation or clockwise rotation, or may be a clockwise rotation and a counterclockwise rotation within a certain angle range.

The rotational speed of the motor 310 can be adjusted to adjust the rotational speed of the reflective structure 200 accordingly, and control of the rotational speed of the reflective structure 200 can be achieved by controlling the rotational speed of the motor. Since the rotation speed of the reflecting structure is adjustable, in some cases a faster measurement of the material can be achieved. Furthermore, the angle/position information of the reflection structure may be detected, and the measurement of the angle/position information of the reflection structure 200 may be realized by detecting the rotation angle of the output shaft 320, for example, by conversion to obtain the angle/position information of the reflection structure 200 at different times. The measurement of the angle/position information may be performed by a rotary encoder provided at the output shaft 320, or may be performed by a position sensor, such as an angular displacement sensor.

Although it is shown in fig. 1 and 2 that the reflecting structure 200 may be connected to the output shaft 320 of the motor by a fixing device 330. It should be understood that other forms of connection may be used. For example, as shown in fig. 3, the output shaft 320 may be coupled to the reflective structure 200 by a coupling mechanism provided with a spherical ball member, such as a universal joint or the like. The rotation of the output shaft drives the reflection structure 200 to rotate to change the emitting direction of the emergent beam. Finally, rotation of the reflective structure 200 may cause each of the exit beams to emerge as a rotating beam, thereby forming a scan plane. In the present disclosure, the microwave module 100 emits the transmission beam at a preset fixed time interval or a time interval changing according to a preset rule each time, for example, the transmission beam is emitted at a first time, reaches the reflection structure 200 to form a first angle at the first time, is reflected by the reflection structure to form an emission beam, forms a second angle at the first time with the reflection structure 200, reaches the surface of the material to form a measurement point, is reflected by the surface of the material to form a reflection beam, then the reflection beam reaches the reflection structure 200, is reflected to form an incident beam, and is received by the microwave module 100, wherein in a process that each measurement point reaches the incident beam from the transmission beam, the driving mechanism 300 drives the reflection structure 200 to rotate according to a preset fixed rotation speed or a regularly changing rotation speed. Then, at a second time, the step … … is repeated, so that after the reflection structure 200 rotates for a circle or a certain angle, measurement signals of a plurality of material surface measurement points can be obtained, and a two-dimensional curve of the material surface profile is constructed according to the measurement signals of the measurement points and the angle/position information of the corresponding reflection structure.

In addition to the two-dimensional scanning plane formed by rotating the reflecting structure 200 in the direction perpendicular to the paper surface, i.e., in the direction perpendicular to the paper surface, as shown in fig. 1 and 2, the rotating direction of the reflecting structure 200 may be a direction perpendicular to the paper surface, and the rotating direction of the reflecting structure 200 may be a direction (left-right direction) that oscillates in the direction of the paper surface of fig. 1 and 2 to form a two-dimensional scanning plane.

According to a further embodiment of the present disclosure, the radar scanning device according to the present disclosure may further include a housing 400, wherein the microwave module 100, the reflection structure 200, and the driving mechanism 300 may be disposed inside the housing 400, and may be fixed with respect to the housing 400. For example, the microwave module 100 may be secured to an interior side wall of the housing 400 (e.g., as shown in fig. 3) or may be mounted to the housing 400 via a mounting bracket 410 (e.g., as shown in fig. 1 and 2). Other mounting arrangements may of course be used. The driving mechanism 300, such as a motor, may be mounted on an inner sidewall of the housing 400, but may be mounted to the housing 400 by a mounting bracket. The reflective structure 200 may be coupled to an output shaft 320 of the drive mechanism 300. According to an embodiment of the present disclosure, a shield 500 may be formed on a sidewall of the case 400. The shield 500 is formed of a material that allows the microwave beam to pass through, which may be, for example, glass, plastic, or ceramic. The outgoing and reflected beams may propagate through the shield 500.

In the above description, it is explained that the horn antenna or the lens antenna in the microwave module can converge the microwave beam into a narrow beam, and according to the embodiments of the present disclosure, it is more preferable that the horn antenna or the lens antenna is also provided after the reflection structure 200, so that the beam angle of the microwave beam can be further compressed. A horn antenna or a lens antenna is disposed in the propagation path of the outgoing beam and the reflected beam. The horn antenna or the lens antenna may be disposed inside the shield or may be disposed outside the shield.

Two-dimensional measurement is introduced, but in practical situations, the material is not uniform in shape. Accurate measurement of the three-dimensional morphology of the material is therefore required. The disclosure also provides a material three-dimensional shape measuring system.

The material three-dimensional shape measuring system can comprise the reflection type continuous rotation radar scanning device and the displacement mechanism, wherein the displacement mechanism is used for enabling the reflection type continuous rotation radar scanning device to move, the moving direction of the reflection type continuous rotation radar scanning device can form a preset included angle with the two-dimensional scanning surface, and therefore after one two-dimensional scanning surface finishes scanning, the reflection type continuous rotation radar scanning device can move to the next two-dimensional scanning surface to scan, and a plurality of two-dimensional scanning surfaces are obtained through scanning repeatedly. The position information corresponding to each two-dimensional scanning surface can be obtained by detecting the moving information position of the displacement mechanism, such as the moving speed and the moving direction, and finally the three-dimensional form of the material can be obtained by fusing the measurement information of the plurality of two-dimensional scanning surfaces. In the present disclosure, the predetermined included angle may be 90 °, that is, the moving direction of the reflective continuous radar scanning device is perpendicular to the two-dimensional scanning plane. The microwave module 100, the reflection structure 200, and the driving mechanism 300 may be regarded as a surface scanning apparatus, and in the present disclosure, the displacement mechanism causes the surface scanning apparatus to move. The displacement mechanism may be in the form of a motor, a push rod, a guide rail, or the like. As one example, when the two-dimensional scanning plane is in a direction perpendicular to the paper plane, the moved direction of the plane scanning device may be the direction of the paper plane. When the two-dimensional scanning plane is in the paper surface direction, the moved direction of the plane scanning device may be a direction perpendicular to the paper surface.

The displacement mechanism may be provided outside the housing, and the movement of the surface scanning apparatus is realized by pushing the entire housing to move. For example, the housing 400 may be pushed to move by connecting various types of displacement mechanisms, such as a motor type, a push rod type, and a guide rail, to the outer side surface of the housing 400. Further, a displacement mechanism may be provided for the microwave module 100 and the driving mechanism 300, respectively, and for example, the microwave module 100 may be moved by being pushed by a displacement mechanism in various forms such as a motor form, a push rod form, and a guide rail, and the driving mechanism 300 may be moved by being pushed by a displacement mechanism in various forms such as a motor form, a push rod form, and a guide rail, and the movement of the surface scanning device may be similarly realized.

In the process of performing three-dimensional scanning, the surface scanning device may be moved to the first position, and the reflection structure 200 may be rotated to complete the detection of the first two-dimensional scanning surface (the specific process may refer to the foregoing description), and then the surface scanning device may be moved to the second position, and the reflection structure 200 may be rotated to complete the detection of the second two-dimensional scanning surface, … …, until all the two-dimensional scanning surfaces are measured by moving to all the positions. And then, the measurement results of all the two-dimensional scanning surfaces can be combined, and the position information corresponding to each two-dimensional scanning surface can be obtained by combining the moving speed and the moving direction of the moving surface scanning device of the displacement mechanism, so that the three-dimensional scanning result can be obtained.

In the above description, the form in which the area scanning apparatus performs translation to realize three-dimensional scanning is described. However, the angle of the surface scanning device can be changed to realize three-dimensional scanning, for example, by rotating the surface scanning device, the emergent light beam will be emitted to different measuring points, and the measurement result of another two-dimensional scanning surface can be obtained by matching with the rotation of the reflecting structure. In addition, according to an optional embodiment of the present disclosure, on the basis of the above surface scanning device, the three-dimensional scanning may also be achieved by controlling and adjusting only the angle of the reflection structure or the microwave module, that is, adjusting the incident angle of the reflection structure 200 and the transmission beam to switch among different two-dimensional scanning surfaces, thereby achieving measurement of the surface of the material in the two-dimensional scanning surfaces, and finally achieving three-dimensional measurement of the surface profile of the material based on the measurement information of the two-dimensional scanning surfaces.

As illustrated with reference to fig. 1, for example, in fig. 1, for a two-dimensional scanning plane that may be formed in a direction perpendicular to a paper surface (i.e., the reflection structure may be rotated in a direction perpendicular to the paper surface to complete scanning of a two-dimensional scanning plane), when the output shaft 320 is connected to the reflection structure 200 through a connection mechanism provided with a spherical member, a rotation direction of the reflection structure 200 may be adjusted to swing in the direction along the paper surface of fig. 1 and 2, a locking switch may be provided at the connection mechanism, and the locking switch may be an electric switch, and an on-off state of the electric switch may be controlled by the main control board. When the electrical switch is in the off state, the reflective structure 200 will not be swung; when the electric switch is in an open state, the reflection structure 200 may be swung to be adjusted in angle, and in the process that the reflection structure 200 swings along the paper surface direction of fig. 1 and 2, the incident angle between the emission beam and the reflection structure 200 is adjusted, so that the direction of the emission beam is correspondingly changed, and thus, a plurality of two-dimensional scanning surfaces may be obtained to implement three-dimensional scanning. The same principle is applied to control and adjust the angle of the microwave module to realize three-dimensional scanning, and details are not described herein. That is to say, the incident angles of the reflecting structure and the transmitting beam are adjusted, and each incident angle corresponds to one two-dimensional scanning surface, so that a plurality of two-dimensional scanning surfaces can be formed to realize three-dimensional measurement of the material.

According to a further embodiment of the present disclosure, for the reflective continuous rotation radar scanning device and the material three-dimensional shape measurement system described above, a main control board 600 may be further included, and the main control board 600 may be disposed inside the housing. As shown in fig. 4, the main control board 600 may provide a driving control signal to the driving mechanism 300, and may acquire angle/position information from the driving mechanism 300 and/or a detection device of the reflection structure 200. The main control board 600 may be connected to the microwave module 100 to control the microwave module 100 to transmit a microwave signal and receive a microwave signal from the microwave control module 100 as a measurement signal. In addition, the main control board 600 may be connected to the upper computer 700 so as to transmit the relevant signals to the upper computer for subsequent processing of the measurement result, or provide control signals for the main control board 600 through the upper computer 700, for example, various working parameters may be set on the upper computer 700, and the working parameters may include a scanning distance range; the type, frequency and time of microwave beams emitted by the microwave module; the range of the rotating speed and the rotating angle of the driving structure; the incident angle of the reflection structure and the transmission beam or the adjusted angle or position information of the surface scanning device, etc. can also enter a debugging state by sending a debugging instruction through the upper computer 700. Wherein the connection of each part can be a wired connection or a wireless connection.

The main control board 600 may control the microwave module 100 to generate the microwave beam, and particularly may control the type, frequency, time, etc. of the generated microwave beam. For example, the microwave module 100 integrates at least one linearly polarized antenna structure and at least one circularly polarized antenna structure, and the main control board 600 controls the microwave module to generate a microwave beam, which may be a linearly polarized beam in a single direction or a circularly polarized beam in a single direction; or may be a hybrid beam of a plurality of linearly polarized beams mixed with a circularly polarized beam; or the linear polarization beam and the circular polarization beam can be switched, namely the linear polarization beam and the circular polarization beam are switched at a certain time interval or according to a certain rule. The frequency of the microwave beam can be in the frequency range of 60-300 GHz. The emission time of the microwave beam may be set, for example, according to the rotation and/or oscillation of the reflecting structure, or may be preset, for example, according to a fixed time interval or according to a certain variation rule, and the preset emission time may be matched with the rotation and/or oscillation of the reflecting structure. The main control board 600 may receive measurement information formed after the microwave module 100 receives the microwave beam. As an example, the microwave module 100 may process the received incident beam and obtain measurement information, where the measurement information may include echo waveform, measurement distance, echo waveform characteristics, amplitude, width, and other information.

The main control board 600 may control the angle, time, etc. of rotation of the driving mechanism 300. And the moving distance, time, etc. of the driving mechanism 300 can be further controlled during the three-dimensional scanning. The main control board 600 may also obtain the angle/position information of the driving mechanism. As an alternative embodiment, the main control board 600 may also obtain angle/position information obtained by directly measuring the reflection structure.

Finally, whether in the process of two-dimensional scanning or three-dimensional scanning, the main control board 600 may obtain the two-dimensional scanning measurement result or the three-dimensional scanning measurement result by using the measurement information (e.g., distance information) of each measurement point and the angle/position information corresponding to each measurement information. In this disclosure, preferably, the main control board 600 may transmit the relevant information to the upper computer for processing by the upper computer, so as to obtain a final measurement result. The upper computer 700 can obtain the position coordinate information of each measuring point based on the measuring information and the angle/position information of each measuring point according to an algorithm, integrate the position coordinate information to form a two-dimensional curve graph of the material surface profile, and display the two-dimensional curve graph in a display interface of the upper computer. For three-dimensional scanning, the upper computer 700 may obtain position coordinate information of each measurement point based on the measurement information and angle/position information of each measurement point according to an algorithm, and each two-dimensional graph of the position coordinate information, and combine each two-dimensional graph according to the angle/position of the surface scanning apparatus or the above-mentioned movement information (movement speed, movement direction) of the moving mechanism and/or the incident angle adjustment information of the reflection structure and the transmission beam to realize display of a three-dimensional form.

Fig. 5 shows a schematic structural diagram of a main control board and a microwave module according to an embodiment of the present disclosure.

As shown in fig. 5, the main control board 600 may include a power supply module 601, and the power supply module 601 may be connected to an external power source or have a power source on its own, and supply the converted voltage to the power supply module 101 of the microwave module 100. The power supply module 601 may supply power to the main control board 600, may supply power to the driving mechanism 300, may supply power to the displacement mechanism, and the like.

The process control module 602 may receive various parameters/instructions from the host computer 700 through the communication module 603, for example, parameters/instructions related to the control of the driving mechanism 300 may be transmitted to the driving mechanism 300, and parameters/instructions related to the microwave module 100 may be transmitted to the microwave module 100. The process control module 602 may receive a detection signal such as angle/position information from the driving mechanism 300 and transmit it to the upper computer 700 through the communication module 603, and may also receive a measurement signal from the microwave module 100 and transmit it to the upper computer 700 through the communication module 603. In addition, the processing control module 602 may also provide, for example, a control signal received from the upper computer 700 to the displacement mechanism or a detection signal of the displacement mechanism to the upper computer 700.

The communication module 603 of the main control board 600 and the communication module 102 of the microwave module 100 may perform information transmission, and may adopt a wired communication or a wireless communication mode. The communication between the communication module 603 of the main control board 600 and the upper computer 700 may adopt wired communication or wireless communication. The wireless communication technology can be LORA, ZIGBEE, WIFI, NB-IOT and the like, and the wired communication technology can be RS232 cables, RS485 cables, network cables and the like.

The microwave module 100 may include a power supply module 101, a communication module 102, a processor 103, a phase-locked loop 104, a signal transmitting module 105, an antenna module 106, a signal receiving module 107, a mixer 108, an intermediate frequency amplifier 109, and an AD collector 110. The antenna module 106 may transmit a transmit beam and receive an incident beam, and may adjust the beam angle. The power module 101 may provide power to the various components of the microwave module 100.

The signal transmitting module 105 is connected to the mixer 108, the antenna module 106, the phase-locked loop 104 and the processor 103, the processor 103 controls the type and frequency of the microwave beam to be transmitted by the signal transmitting module 105, the transmitted microwave signal is output to the mixer 108 and is emitted from the antenna module to form a transmitted beam to reach the reflecting structure 200. The phase-locked loop 104 adjusts according to the output signal of the processor 103 to control the signal frequency and phase of the signal transmitting module 105, so as to achieve the purpose of controlling the type and frequency of the microwave beam. The signal receiving module 107 is connected to the antenna module and the mixer 108, and the incident beam is received by the signal receiving module 107 via the antenna module 106 and is input to the mixer 108. The mixer 108 is configured to mix the microwave signal transmitted by the signal transmitting module 105 with the incident beam received by the signal receiving module 107, and output the mixed microwave signal to the intermediate frequency amplifier 109. The intermediate frequency amplifier 109 amplifies the mixed signal output from the mixer 108 and outputs the amplified signal to the AD collector 110. The AD collector 110 collects the amplified mixed signal and outputs a digital signal to the processor 103. The processor 103 acquires, processes and analyzes the digital signal output by the AD collector 110, and outputs the processing result to the main control board 600 through the communication module 102.

According to a further embodiment of the present disclosure, a material form measuring method is also provided. The material form measuring method can adopt the reflection type continuous radar scanning device and/or the material three-dimensional form measuring system to realize the construction of the two-dimensional form or the three-dimensional form of the material.

FIG. 6 illustrates a measurement method according to one embodiment. As shown in fig. 6, the measurement method S100 may include the following.

A transmitting step: forming a transmission beam through a microwave module;

repeating the transmitting step, the rotating step, the reflecting step and the receiving step to form measuring signals of a plurality of measuring points of a two-dimensional scanning surface; and

a generation step: generating the material profile curve based on the measurement signals of the plurality of measurement points and the angle/position information of the reflecting structure.

In step S102, the reflection structure is rotated and is always in a rotating state during the measurement process, and the microwave module emits a transmission beam. The transmit beam is received by the reflective structure and an exit beam is formed in step S104. In step S106, the outgoing beam contacts the surface of the material, a reflected beam is formed, and the reflective structure in the rotating state reflects the reflected beam and forms an incident beam. In step S108, the microwave module may receive the incident beam. The measurement signal of the incident beam forming one measurement point is processed in step S110.

This is repeated to finally obtain measurement signals of a plurality of measurement points, and a two-dimensional graph may be constructed from the measurement signals of the plurality of measurement points in step S112. In generating the two-dimensional shape map, the two-dimensional shape map may be generated based on measurement signals of a plurality of measurement points and angle/position information of the reflection structure corresponding to each measurement point.

The process of two-dimensional morphology construction is shown in fig. 6. From the above description, the present disclosure may also construct a three-dimensional form of the material. As shown in fig. 7, a schematic diagram of a three-dimensional morphology construction method is shown. The three-dimensional shape construction method S200 may include the following steps. In step S202, the reflecting structure is rotated and the microwave module always rotates during the measurement process, and emits a transmitting beam, and in step S204, the transmitting beam is received by the reflecting structure and forms an emergent beam. In step S206, the outgoing beam contacts the surface of the material, forming a reflected beam and the reflecting structure reflects the reflected beam and forms an incident beam. In step S208, the microwave module may receive the incident beam. The measurement signal of the incident beam forming one measurement point is processed in step S210. This is repeated to obtain measurement signals of a plurality of measurement points, and finally, in step S212, measurement signals of a plurality of measurement points of one two-dimensional scanning surface are obtained. Then, in step S214, the scanning plane is switched to another two-dimensional scanning plane. In step S216, the reflection structure is rotated and the reflection structure is always in a rotating state during the measurement process, and the microwave module emits a transmission beam. The transmit beam is received by the reflective structure and an exit beam is formed in step S218. In step S220, the outgoing beam contacts the surface of the material, forming a reflected beam and the reflecting structure reflects the reflected beam and forms an incident beam. In step S222, the microwave module may receive the incident beam. The measurement signal of the incident beam forming one measurement point is processed in step S2224. This is repeated to obtain a measurement signal of another measurement point, and finally, in step S226, measurement signals of a plurality of measurement points of another two-dimensional scan plane are obtained. The steps S214 to S226 are repeated to finally obtain the measurement signals of the plurality of measurement points of the plurality of two-dimensional scanning surfaces. In step S228, a three-dimensional shape map is generated from the measurement signals of the plurality of measurement points of the plurality of two-dimensional scanning surfaces. When generating the three-dimensional shape map, the three-dimensional shape of the material profile is generated based on the measurement signals of the plurality of measurement points of the plurality of two-dimensional scanning surfaces and the movement information (movement speed, movement direction) of the displacement mechanism and/or the incident angle adjustment information of the reflection structure and the emission beam.

It should be noted that for the sake of brevity, what is described in relation to the reflective continuous radar scanning apparatus and the material three-dimensional form measurement system is not described in detail in the description of the method, but these may all be cited in the description of the method.

In the description herein, reference to the description of the terms "one embodiment/mode," "some embodiments/modes," "example," "specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment/mode or example is included in at least one embodiment/mode or example of the application. In this specification, the schematic representations of the terms used above are not necessarily intended to be the same embodiment/mode or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments/modes or examples. Furthermore, the various embodiments/aspects or examples and features of the various embodiments/aspects or examples described in this specification can be combined and combined by one skilled in the art without conflicting therewith.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present application, "plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

It will be understood by those skilled in the art that the foregoing embodiments are merely for clarity of illustration of the disclosure and are not intended to limit the scope of the disclosure. Other variations or modifications may occur to those skilled in the art, based on the foregoing disclosure, and are still within the scope of the present disclosure.

Claims

1. A reflective continuous rotation radar scanning device for measuring material and obtaining material information, comprising:

2. The reflective continuous rotation radar scanning device of claim 1,

optionally, the reflecting surface of the reflecting structure is at least one of a plane, a curved surface, a broken line surface, or a paraboloid;

optionally, the transmit beam is a narrow beam, and a beam angle of the narrow beam ≦ 3 °;

optionally, the microwave signals in the frequency range of 60-300 GHz are converged through a horn antenna or a lens antenna to form the narrow beam;

optionally, the microwave module can be controlled to generate different types and/or frequencies of transmit beams;

optionally, the transmission beam is a linear polarized beam in a single direction or a circularly polarized beam in a single direction; or a hybrid beam of a plurality of linearly polarized beams mixed with a circularly polarized beam; or a linearly polarized beam and a circularly polarized beam that can be switched;

optionally, the measurement signal comprises at least one of a measured distance, an incident beam waveform characteristic, an incident beam amplitude characteristic, and an incident beam width characteristic.

3. The reflective continuous rotation radar scanning device of claim 1,

optionally, in the time-sharing measurement, the microwave module emits a transmitting beam at a preset fixed time interval or at a time interval changing according to a preset rule each time, and in the measurement process each time, the driving mechanism drives the reflecting structure to rotate at a preset fixed rotating speed or a regularly changing rotating speed;

optionally, the device further comprises a detection device, wherein the detection device is used for detecting the angle/position information of the reflection structure;

optionally, two-dimensional information of the material surface profile is derived based on the angle/position information of the reflecting structure of each measuring point and the measuring signal.

4. The reflective continuous rotary radar scanning device as in any one of claims 1 to 3, further comprising a horn antenna or a lens antenna for converging at least said outgoing beam.

5. A material three-dimensional shape measurement system, comprising:

the device according to any one of claims 1 to 4, wherein the reflection structure and the incident angle of the emission beam are switched among different two-dimensional scanning planes by a displacement mechanism and/or by adjusting the incident angle of the reflection structure and the emission beam, so as to measure the surface of the material in the two-dimensional scanning planes, and finally, the three-dimensional measurement of the profile of the surface of the material is realized based on the measurement information of the two-dimensional scanning planes.

6. The material three-dimensional morphology measurement system of claim 5,

optionally, the displacement mechanism controls the radar scanning device to move in a direction forming a predetermined included angle with the two-dimensional scanning surfaces, so as to realize measurement of the surface of the material in the multiple two-dimensional scanning surfaces;

optionally, the predetermined included angle is 90 °;

optionally, incident angles of the reflection structure and the transmission beam are adjusted, and each incident angle corresponds to one two-dimensional scanning plane, so that the surface of the material in the multiple two-dimensional scanning planes is measured.

7. A method of material measurement, comprising:

a transmitting step: forming a transmission beam through a microwave module;

8. The method of claim 7,

optionally, the method further includes detecting angle/position information of the reflecting structure, and generating the material profile curve based on the measurement signals of the plurality of measurement points and the angle/position information of the reflecting structure corresponding to each measurement point of the plurality of measurement points;

optionally, the microwave module can be controlled to generate different types and/or frequencies of transmit beams.

9. The method of claim 7, wherein the transmit beam is a unidirectional linearly polarized beam or a unidirectional circularly polarized beam; or a hybrid beam of a plurality of linearly polarized beams mixed with a circularly polarized beam; or a linearly polarized beam and a circularly polarized beam that can be switched;

optionally, the measurement signal comprises at least one of a measured distance, an incident beam waveform characteristic, an incident beam amplitude characteristic, and an incident beam width characteristic;

optionally, in the measurement process of each measurement point, the microwave module emits a transmission beam at each time according to a preset fixed time interval or a time interval changing according to a preset rule, and the driving mechanism drives the reflection structure to be in a rotation state according to a preset fixed rotation speed or a regularly changing rotation speed.

10. The method according to any one of claims 7 to 9,

optionally, the method further comprises: a switching step of switching from one two-dimensional scanning surface to another two-dimensional scanning surface, and repeating the transmitting step, the rotating step, the reflecting step, the receiving step and the switching step to obtain measurement signals of a plurality of measurement points of a plurality of two-dimensional scanning surfaces; and a three-dimensional form generation step: generating a three-dimensional shape of the material profile based on measurement signals of a plurality of measurement points of the plurality of two-dimensional scan planes;

optionally, the method further comprises: and detecting movement information of the displacement mechanism and/or incident angle adjustment information of the reflection structure and the emission beam, and generating the three-dimensional shape of the material profile based on measurement signals of a plurality of measurement points, angle/position information of the reflection structure corresponding to each measurement point, and movement information of the displacement mechanism and/or incident angle adjustment information of the reflection structure and the incident beam.