CN114608493A - Strip steel zinc coating thickness measuring device and thickness measuring method - Google Patents
Strip steel zinc coating thickness measuring device and thickness measuring method Download PDFInfo
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- CN114608493A CN114608493A CN202210288989.5A CN202210288989A CN114608493A CN 114608493 A CN114608493 A CN 114608493A CN 202210288989 A CN202210288989 A CN 202210288989A CN 114608493 A CN114608493 A CN 114608493A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
- G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
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Abstract
The application belongs to the technical field of metallurgical production detection, and particularly relates to a strip steel galvanized layer thickness measuring device and a thickness measuring method. This belted steel galvanizing coat thickness measuring device is applicable to the thickness measurement of the galvanizing coat on the belted steel, and belted steel is around establishing the turn roll, and this thickness measuring device includes calibrator and two distancers, and the calibrator setting is around the outside of establishing the turn roll at belted steel, and the output of calibrator faces belted steel, and two distancers set up the both ends at the width direction of calibrator respectively, and the output of two distancers faces belted steel. The method and the device can improve the emission stability of the fluorescent signal emitted by the thickness gauge and reduce the measurement error of the thickness of the zinc coating.
Description
Technical Field
The application belongs to the technical field of metallurgical production detection, and particularly relates to a strip steel galvanized layer thickness measuring device and a thickness measuring method.
Background
At present, the most common nondestructive detection method for the thickness of a zinc coating used in the continuous hot-dip galvanizing industry is an X-ray fluorescence method, X rays are emitted to a zinc coating plate through an X-ray thickness gauge, and then fluorescence excited by an X-ray source is collected to measure the thickness of the zinc coating.
When the method is used for measurement, if the strip steel shakes greatly, the stability of a reflected fluorescence signal is influenced, and the thickness of a zinc coating has larger measurement errors.
Disclosure of Invention
In order to solve the technical problems, the application provides a device and a method for measuring the thickness of a galvanized layer of strip steel, and aims to improve the measurement of the thickness of the galvanized layer of strip steel at least to a certain extent.
The technical scheme of the application is as follows:
on the one hand, this application provides a belted steel galvanizing coat thickness measurement device, is applicable to the thickness measurement of the galvanizing coat on the belted steel, and its special character lies in, belted steel is around establishing the steering roll, the thickness measurement device includes:
the thickness gauge is arranged on the outer side of the steering roller around which the strip steel is wound, and the output end of the thickness gauge faces the strip steel;
and the two distance measuring devices are respectively arranged at two ends of the thickness measuring instrument in the width direction, and the output ends of the two distance measuring devices face the strip steel.
According to the thickness measuring device for the galvanized layer of the strip steel, the thickness measuring instrument of the thickness measuring device is arranged on the outer side of the turning roll wound by the strip steel, and the strip steel at the position can improve the shaking of the strip steel through the tensioning of the turning roll, so that the stability of the emission of a fluorescent signal emitted by the thickness measuring instrument can be improved, and the measurement error of the thickness of the galvanized layer is reduced.
In addition, because the distance measuring devices are arranged at the two ends of the thickness measuring instrument in the width direction, the distance between the thickness measuring instrument and the strip steel can be obtained in real time through the distance measuring devices, and then the jitter property of the strip steel can be confirmed, so that the thickness of the zinc coating of the strip steel can be obtained under the condition that the jitter property of the strip steel meets the requirement, the measurement error of the thickness of the zinc coating can be further reduced, and the practicability is good.
In some embodiments, the distance between the output of the thickness gauge and the strip is 12 ± 1.5 mm.
Preferably, the distance meter is a laser displacement sensor.
In some embodiments, the distance between the range finder and the strip is 150 ± 10 mm.
In some embodiments, the thickness measuring device further comprises an adjusting assembly, and the thickness gauge can move along the width direction of the steel strip through the adjusting assembly.
In some embodiments, the adjustment assembly comprises:
the support is fixedly connected with the thickness gauge, the support is arranged on the outer side of the strip steel, a connecting bulge and a guide bulge are arranged on the support facing the strip steel at one time, and the connecting bulge is provided with a through threaded hole along the width direction of the strip steel;
the screw rod is in threaded connection with the threaded hole, and one end of the screw rod is used for being connected with a driving piece;
the guide rail is arranged between the strip steel and the thickness gauge, one side of the guide rail, which faces the thickness gauge, is provided with a guide groove, and the guide protrusion is arranged in the guide groove in a sliding manner.
On the other hand, the application also provides a strip steel galvanized layer thickness measuring method which is characterized in that the thickness measuring method is carried out based on the strip steel galvanized layer thickness measuring device, and the thickness measuring method comprises the following steps:
obtaining initial system measurement parameters, the system measurement parameters including at least one of: the distance between the output end of the thickness gauge and the strip steel, the equipment size of the thickness gauge and the photon energy of a radiation source of the thickness gauge;
adjusting the system measurement parameters, and collecting the fluorescence intensity collected by the output end of the thickness gauge facing the beryllium window on the strip steel side;
and when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter.
In some embodiments, the adjusting the system measurement parameters and acquiring the fluorescence intensity collected at the beryllium window of the thickness gauge facing the strip steel side specifically includes:
repeating the following steps m times to obtain m fluorescence intensities correspondingly collected by the thickness gauge, wherein m is a positive integer greater than 1:
adjusting the system measurement parameters, and collecting the fluorescence intensity collected by the output end of the thickness gauge facing the beryllium window on the strip steel side;
when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter comprises:
and determining the system measurement parameter corresponding to the maximum fluorescence intensity in the m fluorescence intensities as the final measurement parameter.
In some embodiments, after the zinc layer thickness measurement, the thickness measurement method further comprises:
calculating evaluation parameters of the reflection fluorescence collected by the thickness gauge based on a Monte Carlo algorithm to obtain corresponding evaluation parameters, wherein the evaluation parameters comprise relative errors and/or quality factors;
and when the evaluation parameters meet the preset index requirements, determining that the thickness measurement of the zinc layer based on the final measurement parameters is reasonable.
In some embodiments, the source of the thickness gauge has a photon energy of 10 keV.
The method for measuring the thickness of the galvanized layer of the strip steel can realize convenient, quick and accurate determination of system parameters, and is favorable for improving the convenience and accuracy of measuring the thickness of the galvanized layer.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
In the drawings:
FIG. 1 is a schematic structural diagram of a strip steel galvanized layer thickness measuring device according to an embodiment of the application;
FIG. 2 is a schematic side view of FIG. 1;
FIG. 3 is a schematic view of a thickness gauge model for measuring the thickness of a zinc coating according to an embodiment of the present disclosure;
FIG. 4 is a schematic diagram of interaction of incident light provided by a radiation source with a galvanized sheet according to an embodiment of the present disclosure.
FIG. 5 is a schematic flow chart of a method for measuring a thickness of a zinc coating according to an embodiment of the present disclosure;
FIG. 6 is a comparative graph of K.alpha.energy spectra of zinc layers excited at different energies according to the examples provided in this application;
FIG. 7 is a graph showing the comparison of fluorescence intensity at different detector sizes and distances according to the embodiment of the present application.
Fig. 8(a) -8 (d) are graphs illustrating the linear relationship between the thickness of the galvanized layer and the incident photon count at several different distances and incident photon energies from different radiation sources according to the embodiments of the present application.
Reference numerals:
the thickness gauge comprises a thickness gauge-1, a range finder-2, a support-3, a connecting bulge-31, a guide bulge-32, a screw-4, a guide rail-5, a guide groove-51, a strip steel-6 and a steering roller-7.
Detailed Description
The technical solutions in the embodiments of the present application will be described clearly and completely with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that all the directional indications in the embodiments of the present application are only used to explain the relative position relationship, the motion situation, and the like between the components in a certain posture, and if the certain posture is changed, the directional indication is changed accordingly.
The following disclosure provides many different embodiments, or examples, for implementing different features of the application. In order to simplify the disclosure of the present application, specific example components and arrangements are described below. Of course, they are merely examples and are not intended to limit the present application. Moreover, the present application may repeat reference numerals and/or letters in the various examples, which have been repeated for purposes of simplicity and clarity and do not in themselves dictate a relationship between the various embodiments and/or arrangements discussed. In addition, examples of various specific processes and materials are provided herein, but one of ordinary skill in the art may recognize the application of other processes and/or the use of other materials.
The application is described below with reference to specific embodiments in conjunction with the following drawings:
the embodiment of the application provides a device and a method for measuring the thickness of a galvanized layer of strip steel, and aims to improve the measurement existing during the thickness measurement of the galvanized layer of the strip steel to at least a certain extent.
First, the embodiment of the application discloses a device for measuring the thickness of a galvanized layer of strip steel, which is suitable for measuring the thickness of the galvanized layer on the strip steel 6. Fig. 1 is a schematic structural diagram of a strip steel galvanized layer thickness measuring device according to an embodiment of the present application, and fig. 2 is a schematic side view of fig. 1. With reference to fig. 1 and 2, the strip steel 6 suitable for the strip steel galvanized layer thickness measuring device in the embodiment of the present application is wound on the turning roll, and the thickness measuring device includes a thickness meter 1 and two distance meters 2, wherein the thickness meter 1 is disposed on the outer side of the turning roll wound on the strip steel 6, the output end of the thickness meter 1 faces the strip steel 6, the two distance meters 2 are respectively disposed at the two ends of the thickness meter 1 in the width direction, and the output ends of the two distance meters face the strip steel 6.
According to the thickness measuring device for the galvanized layer of the strip steel, the thickness measuring instrument 1 of the thickness measuring device is arranged on the outer side of the turning roll wound by the strip steel 6, and the strip steel 6 at the position can improve the shaking phenomenon of the strip steel 6 through the tensioning of the turning roll, so that the emission stability of a fluorescent signal emitted by the thickness measuring instrument 1 can be improved, and the measurement error of the thickness of the galvanized layer is reduced.
As a preferable mode of the embodiment of the present application, the strip galvanizing thickness measuring device is installed upstream of the turning roll 7, but of course, in other embodiments, the strip galvanizing thickness measuring device may be installed downstream of the turning roll 7, which is not limited herein.
In addition, because the range finders 2 are arranged at the two ends of the thickness gauge 1 in the width direction, the distance between the thickness gauge 1 and the strip steel 6 can be acquired in real time through the range finders 2, and then the jitter property of the strip steel 6 can be confirmed, so that the thickness of the galvanized layer of the strip steel 6 can be acquired under the condition that the jitter property of the strip steel 6 meets the requirement, the measurement error of the thickness of the galvanized layer can be further reduced, and the practical applicability is good.
For the embodiment of the present application, the distance between the output end of the thickness gauge 1 and the strip steel 6 may be 12 ± 1.5mm, and the output end of the thickness gauge 1 emits X-rays toward the galvanized sheet and then collects fluorescence excited by the X-ray source so that the thickness of the galvanized layer can be measured.
The range finder 2 of this application embodiment can select to use laser displacement sensor, and laser displacement sensor can be in real time to belted steel 6 transmission laser to obtain the distance between 1 of calibrator and belted steel 6 in real time, and then can confirm the jitter nature of belted steel 6, can obtain the thickness of belted steel 6's galvanizing coat like this under the condition that the jitter nature of belted steel 6 meets the requirements, can further reduce the measuring error of the thickness of galvanizing coat.
In the embodiment of the present application, the distance between the distance measuring device 2 and the strip steel 6 may be 150 ± 10 mm.
The distance measuring device 2 and the thickness measuring instrument 1 can be pre-assembled components, can facilitate assembly of the distance measuring device and the thickness measuring instrument on a construction site, and have good practicability.
Furthermore, the thickness measuring device of the embodiment of the application further comprises an adjusting assembly, and the thickness gauge 1 can move along the width direction of the strip steel 6 through the adjusting assembly so as to adapt to the measurement of the thickness of the zinc coating on the strip steel 6 with different widths.
With reference to fig. 1 and 2, the adjusting assembly of the embodiment of the present application includes a support 3, a lead screw 4 and a guide rail 5, wherein, the support 3 is fixedly connected with the thickness gauge 1, the support 3 is disposed on the outer side of the strip steel 6, the support 3 is provided with a connecting protrusion 31 and a guiding protrusion 32 once towards the strip steel 6, the connecting protrusion 31 is provided with a through threaded hole along the width direction of the strip steel 6, the lead screw 4 is screwed in the threaded hole, one end of the lead screw 4 is used for being connected with a driving part, the guide rail 5 is fixedly disposed between the strip steel 6 and the thickness gauge 1, the guide rail 5 is provided with a guide groove 51 along one side of the guide rail 5 towards the thickness gauge 1, and the guiding protrusion 32 is slidably disposed in the guide groove. The screw rod 4 can be controlled to rotate by the driving piece, so that the support 3 can be driven to move along the length direction of the guide rail 5, the thickness gauge 1 can be driven to move along the length direction of the guide rail 5, and then the thickness gauge 1 can move along the width direction of the strip steel 6, so that the thickness of a zinc coating on the strip steel 6 with different widths can be measured.
The driving part of the embodiment of the application can be a motor provided with a speed reducer, so that the rotating speed of the lead screw 4 is stable, and the thickness measuring device can stably move.
In other embodiments, the device for driving the thickness gauge 1 to move may also be other linear reciprocating mechanisms, such as a rack and pinion, and the like, without limitation.
In addition, based on the strip steel galvanizing coat thickness measuring device, the application also provides a strip steel galvanizing coat thickness measuring method.
Fig. 3 is a schematic diagram of a thickness gauge model for measuring the thickness of a zinc coating according to an embodiment of the present application. As shown in fig. 3, an annular ionization chamber filled with xenon (because of its low ionization energy) is provided at a height from the strip h as a thickness gauge. The inner diameter, the outer diameter and the height of the ionization chamber can be set according to system customization, for example, the inner diameter and the outer diameter can be respectively 2.5cm and 20cm, the height of the ionization chamber is 15cm, and the like. The bottom of the ionization chamber (i.e. the thickness gauge) close to one side of the strip steel can be a beryllium window with the thickness of 0.01 cm. A ray source (such as an X-ray source) is arranged at the center of one side of the ionization chamber, which is far away from the strip steel, and is used as monochromatic energy photons, the ray source is the output end of the thickness gauge, and the energy emitted by the ray source can be called photon energy to irradiate the zinc coating of the strip steel in a conical shape. As shown in FIG. 3, the radius of the illumination spot is L/2, and L is the diameter of the cone bottom, i.e., the maximum diameter. The annular ionization chamber can effectively increase the window area of the thickness gauge, improve the detection efficiency and reduce the statistical error.
The embodiment of the application analyzes the irradiated substance (zinc coating) based on the intensity and energy of the Ka radiation or the Kbeta radiation captured/collected by the thickness gauge, in other words, the thickness gauge can be used for measuring the thickness of the zinc coating in the strip steel. Specifically, the thickness gauge can be calibrated by using a pre-manufactured standard plate (standard galvanized plate) to obtain a standard measurement curve of the relationship between the voltage/current and the thickness of the galvanized layer corresponding to each of the plurality of standard plates. And comparing the voltage/current signals of the zinc coating to be measured with corresponding points in the standard measurement curve by taking the plurality of standard measurement standard curves as the basis, so as to obtain the thickness of the zinc coating in the strip steel to be measured.
FIG. 4 is a schematic diagram of interaction between incident light provided by a radiation source and a strip steel according to an embodiment of the present disclosure. As in fig. 4, the thickness gauge measures the thickness of the galvanized layer by collecting the intensity of fluorescence emitted by the X-ray source. When these X-rays are absorbed by the zinc atoms of the zinc coating, photons having a specific energy are released from the atoms. The number of photons reflected (referred to simply as the photon count) varies depending on the thickness of the zinc layer.
Based on the above discussion, please refer to fig. 5, and fig. 5 is a schematic flow chart of a zinc coating thickness measuring method according to an embodiment of the present application. As shown in fig. 5, the thickness measuring method includes the following implementation steps:
s1, obtaining initial system measurement parameters, wherein the system measurement parameters comprise at least one of the following: the distance between the output end of the thickness gauge and the strip steel, the equipment size of the thickness gauge and the photon energy of a ray source of the thickness gauge.
The system measurement parameters described herein may be pre-custom configured by the system or by the user, which may include, but are not limited to, any one or a combination of more of the following: the installation distance h of the thickness gauge, the equipment size of the thickness gauge and the photon energy of the ray source. Wherein the thickness gauge may be an annular ionization chamber filled with xenon gas, and the equipment dimensions of the thickness gauge include the inside and outside diameters (i.e., inside and outside diameters) of the thickness gauge.
S2, adjusting system measurement parameters, and collecting the fluorescence intensity collected by the beryllium window of which the output end of the thickness gauge faces the strip steel side;
and S3, when the fluorescence intensity reaches the preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as the final measurement parameter.
According to the embodiment of the application, the system measurement parameters can be adjusted, the fluorescence intensity collected by the thickness gauge during each adjustment is collected, and the final measurement parameters of the system are determined according to the fluorescence intensity.
Further, in this embodiment of the present application, step S2 may be repeatedly performed m times to obtain m fluorescence intensities collected corresponding to m system measurement parameters, where m is a positive integer greater than 1. Further, the method selects the maximum fluorescence intensity from the m fluorescence intensities, and determines the system measurement parameter corresponding to the maximum fluorescence intensity as the final measurement parameter of the system.
Further, the embodiments of the present application may adjust/mount corresponding devices in the system according to the final measurement parameters, for example, mount the thickness gauge according to the mounting distance h (e.g. 4cm) of the thickness gauge in the final measurement parameters, select and mount a thickness gauge with corresponding dimensions according to the device dimensions (e.g. inner and outer diameters of 2.5cm and 20cm, respectively) of the thickness gauge in the final measurement parameters, and the like, and the embodiments of the present application are not limited.
Further, in order to verify the effectiveness of the zinc coating thickness measuring scheme, the embodiment of the application can calculate the evaluation parameters of the reflection fluorescence collected by the thickness gauge based on a monte carlo algorithm to obtain corresponding evaluation parameters, wherein the evaluation parameters comprise relative errors and/or quality factors. When the evaluation parameters meet the preset index requirements, determining that the thickness measurement of the galvanized layer based on the final measurement parameters is reasonable, namely determining that the current thickness measurement scheme is reasonable; otherwise, it is not reasonable to determine the current thickness measuring scheme.
In specific implementation, the embodiment of the present application adopts a Monte Carlo (Monte Carlo) method based on a technique called random sampling to verify the validity of the thickness measurement scheme. Specifically, the photon number F1 of the interface of the fluorescence thickness meter is counted first based on the monte carlo method, that is, the photon number F1 collected by the beryllium window of the thickness meter is counted, and a specific calculation formula (1) is as follows:
wherein r is the position of the particle when passing through the curved surface of the (galvanized plate), E is the energy of the particle when passing through the curved surface, t is the time (shake, 10-8s) of the particle when passing through the curved surface, mu is the direction cosine of the particle when passing through the curved surface, and A is the area (cm 2).
The embodiment of the application can also evaluate whether a physical model (thickness gauge model) of the thickness gauge scheme can effectively excite the fluorescence of the zinc element and penetrate through the zinc coating layer or not relative to the error and the quality factor (gauge of unit). Wherein, the calculation formula (2) of the relative error R and the quality factor FOM is as follows:
wherein P (x) is a probability density function of a random process of the reflected fluorescence received by the thickness gauge, xiFor the contribution of the ith history extracted from P (x), N isThe total number of particles, t is the calculated time (shake, 10-8s),
the average contribution (weight) of the N particles, the relative error R, and the quality factor FOM.
When the design parameters of the system (namely the final measurement parameters of the system) are determined, the fluorescence intensity collected by the beryllium window can be used as the basis for determining the energy of incident source photons, the installation distance of the thickness gauge and the equipment size of the thickness gauge, and whether the thickness of the zinc coating and the photon count F1 have a good linear relation or not is used as the basis for verifying and determining the final measurement parameters of the system.
Further, to eliminate the influence of long-time use and other factors, the thickness gauge of the embodiment of the present application needs to be calibrated once every 6-12 hours, in other words, the embodiment of the present application can periodically and repeatedly perform the steps S1-S3 of the present application to determine the final measurement parameters of the system.
To assist in better understanding of the embodiments of the present application, examples are provided below. FIG. 6 shows a comparison of the fluorescence energy spectra excited by different photon energies of the radiation source. As shown in fig. 6: and the energy spectrum contrast of the zinc (Zn) K alpha excited by X-rays at photon energy of 10kev, 20kev, 30kev and 40 kev. In the graph, curve 1 shows the curve of the change of K α with respect to the fluorescence intensity at a photon energy of 10 kev. Curve 2 shows the curve of the change in K α versus fluorescence intensity at 20kev photon energy. Curve 3 shows the K.alpha.versus fluorescence intensity at a photon energy of 30 kev. Curve 4 shows the K.alpha.versus fluorescence intensity at a photon energy of 40 kev.
Also, the following tables 1 to 3 show the verification results when the number of particles is 1 × 108 at a photon energy of 30 kev. Wherein, table 1 is a photon generation statistical table, table 2 is a photon loss statistical table, and table 3 is a photon activity table in each layer.
TABLE 1 photon generation statistics
TABLE 2 photon loss statistics Table
TABLE 3 photon Activity Table in layers
As can be seen from tables 1 and 2, the number of photons generated by the X-ray source is 1X 108, and the total number of photons generated and lost is equal to the total energy in the case of 30keV energy per photon, which indicates that all photons participate in the transport process and are recorded. Wherein bremsstrahlung photons are generated with electron pairs; the primary fluorescence is fluorescence generated by the coating or the substrate; the secondary fluorescence is the fluorescence excited again when the primary fluorescence enters other grid cells; escape is the number of photons that reach outside the region of interest (outside the simulation space) and are terminated.
As can be seen from Table 3, the number of photons entering the cell 1 is greater than that generated by the radiation source, which indicates that all X-rays generated by the radiation source irradiate the galvanized sheet and excite the atoms of the coating to generate X-ray fluorescence; the number of photons entering the grid cell 2 shows that X rays not only effectively penetrate through a zinc coating, but also partially penetrate through a galvanized steel sheet; the grid cells 3 and 4 are provided with photons (the photons are characteristic X-rays), the ionization chamber generates more photons, and because part of the photons can enter from the side of the ionization chamber and do not pass through the beryllium window, the counting of the photon flow of the beryllium window is more accurate and effective. The number of photons entering the cell 5 is the greatest because either the X-rays from the source or the fluorescent light from the zinc coating and the substrate steel plate pass through the air before entering the other cell. The above photons move in each cell in good agreement with the optical path in the thickness measuring schemes shown in fig. 2 and 3 described above in this application.
The reliability of the above results is examined below with TFC counting and count convergence statistics. Table 4 is a count fluctuation table. R is typically required according to a Monte Carlo-based Algorithm (MCNP) program<0.05 to obtain a generally reliable confidence interval, the relative error R is shown in Table 4<0.003; the relative error R tends to decrease, and
in direct proportion, where N is the total number of particles, and for an undesired count, R increases as the total number of counts increases. The relative average deviation of the quality factor (figure of merit) is less than 0.01, and the counting quality is very high because the quality factor approaches a constant value. The above criteria are all in accordance with the judgment standard of MCNP program error, which shows that the physical model precision of the thickness measuring scheme is higher, and the fluorescence of zinc element can be effectively excited and penetrates through the coating.
TABLE 4 count fluctuation Table (TFC)
After determining that the measurement model can effectively excite the fluorescence of the zinc element and penetrate through the coating, the most appropriate ray source energy is searched. The characteristic X-ray energy of the zinc (Zn) element K α is 8.63 kev. Therefore, the energy of the incident monochromatic photons (i.e., the photon energy of the radiation source) must be greater than 8.63 kev. For ease of calculation, the application may set the minimum monochromatic photon energy to 10 kev.
FIG. 6 compares the energy spectra of 10keV, 20keV, 30keV and 40keV, and it can be seen from FIG. 6 that the fluorescence intensity of Zn K.alpha.generated by 10keV monochromatic photons is the highest. Therefore, the most suitable theoretical integral value of the source energy should be 10keV, where the maximum Zn K.alpha.fluorescence intensity is obtained.
In the embodiment of the application, the distance (h) of the thickness gauge is another important factor in the model construction process. The distance between the thickness gauge and the strip steel is directly related to the sensitivity and the measurement precision of the thickness gauge.
Referring to fig. 7, fig. 7 is a comparative diagram of energy spectra of a zinc layer K α excited at different energies according to an embodiment of the present application. The beryllium window in fig. 7 is the Zn K α intensity comparison data (nps is 107) acquired at a distance of 1cm to 10cm, respectively, and table 5 is the case of the parameters used for curves a to d in fig. 7.
TABLE 5 parameter table corresponding to each curve
As can be seen from fig. 7 and table 5: when the inner diameter of the thickness gauge is larger, the smaller the incident light angle is, the lower the collected fluorescence intensity is; when the inner diameter of the thickness gauge is smaller and the incident light angle is the smallest, the acquired fluorescence intensity is the largest. And when the distance (namely the installation distance) h of the thickness gauge is between 2 and 4cm, the fluorescence intensity reaches the maximum value. When the thickness gauge is close to the zinc coating, part of fluorescence enters the blind zone of the inner diameter of the thickness gauge, so that the fluorescence cannot be collected. When the distance of the thickness gauge is gradually increased, part of the fluorescence escapes from the outside of the thickness gauge. In consideration of the actual production condition, the larger detection distance can effectively reduce the risk of errors and instrument damage caused by strip steel shaking. Therefore, in the measurement model, the most suitable thickness gauge distance h should be 4 cm. Wherein, DIR refers to the cosine value of the included angle between the reflection direction of the monochromatic photons and the Y-axis direction.
The zinc layer thickness gauge of the continuous hot galvanizing production line uses a standard measurement curve as a basis, and compares the measured voltage or current signal with a corresponding point in the standard curve to obtain a corresponding zinc layer thickness value. In the calibration process, the zinc layer thickness gauge returns to the calibration position on one side of the O-shaped frame, and the manufactured standard plate is used for calibrating the standard curve. Therefore, the measuring curve plays an important role in the zinc layer thickness gauge. Since the MCNP program cannot simulate electrical signals, it is necessary to be able to establish a measurement curve of the zinc layer thickness values versus the number of X-ray fluorescence photons.
On the basis of determining the energy of a ray source and the detection distance in the manner, the zinc coating with the medium thickness of 40-180 g.m < -2 > is measured. FIGS. 8(a) - (c) show the relationship between the zinc coating thickness (proportional to the zinc layer weight per unit area in FIG. 5) and the Zn Ka photon count at an incident photon energy of 10keV, respectively. When the distance between the thickness gauge and the thickness gauge is 3-4 cm, a better linear relation can be established between the thickness gauge and the thickness gauge. Meanwhile, when the inside diameter of the thickness gauge is 0.5cm and DIR is 1, the linear relationship is preferable, and the linear correlation coefficient is 0.9994.
Fig. 8(d) is comparative data of 20keV monochromatic photons, and since the Zn K α fluorescence generated by the high-energy X-ray is less, the Zn K α fluorescence is further weakened after passing through the thick zinc plating layer, and cannot show a weak variation tendency. The results further demonstrate a suitable incident photon energy of 10 keV.
By implementing the embodiment of the application, the application obtains initial system measurement parameters, and the system measurement parameters comprise at least one of the following: the installation distance of the thickness gauge, the equipment size of the thickness gauge and the photon energy of the ray source; adjusting the system measurement parameters, and collecting the fluorescence intensity collected on a beryllium window close to the galvanized plate side in the thickness gauge; and when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter. In the scheme, the fluorescence intensity collected by the thickness gauge at present is collected by adjusting the system measurement parameters, and the system measurement parameters at the moment can be determined as the final measurement parameters when the fluorescence intensity reaches the preset intensity upper limit value. Therefore, the system parameters are conveniently, quickly and accurately determined, and convenience and accuracy in measuring the thickness of the galvanized layer are improved.
As a preferable scheme of the embodiment of the application, the installation distance of the thickness gauge is 4cm, the photon energy of the radiation source is 10keV, the thickness gauge is an annular ionization chamber filled with xenon, the equipment size of the thickness gauge comprises the inner diameter and the outer diameter of the thickness gauge, the inner diameter of the thickness gauge is 2.5cm, and the outer diameter of the thickness gauge is 20 cm.
The embodiment of the application has at least the following technical effects or advantages: the fluorescence intensity collected by the thickness gauge at present is collected by adjusting system measurement parameters, and the system measurement parameters at the moment can be determined as final measurement parameters when the fluorescence intensity reaches a preset intensity upper limit value. Therefore, the system parameters are conveniently, quickly and accurately determined, and convenience and accuracy in measuring the thickness of the galvanized layer are improved.
In this application, unless expressly stated or limited otherwise, the terms "connected," "secured," and the like are to be construed broadly, and for example, "secured" may be a fixed connection, a removable connection, or an integral part; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.
In the description of the present application, it is to be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the present application and for simplicity in description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed in a particular orientation, and be operated in a particular manner, and are not to be construed as limiting the present application.
In addition, descriptions in this application as to "first", "second", etc. are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit to the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present application.
In the description of the present application, unless otherwise expressly specified or limited, the first feature "on" or "under" the second feature may include the first and second features being in direct contact, or may include the first and second features not being in direct contact but being in contact with each other through another feature therebetween. Also, the first feature "on," "above" and "over" the second feature may include the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
In the description herein, reference to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples described in this specification can be combined and combined by those skilled in the art.
While the preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all alterations and modifications as fall within the scope of the application.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present application without departing from the spirit and scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.
Claims (10)
1. The utility model provides a belted steel galvanizing coat thickness measurement device, is applicable to the thickness measurement of the galvanizing coat on the belted steel, its characterized in that, belted steel is around establishing the steering roll, the thickness measurement device includes:
the thickness gauge is arranged on the outer side of the steering roller around which the strip steel is wound, and the output end of the thickness gauge faces the strip steel;
and the two distance measuring devices are respectively arranged at two ends of the thickness measuring instrument in the width direction, and the output ends of the two distance measuring devices face the strip steel.
2. The device for measuring the thickness of a galvanized layer of steel strip as claimed in claim 1, wherein the distance between the output end of the thickness gauge and the steel strip is 12 ± 1.5 mm.
3. The thickness measuring device for the galvanized layer of the strip steel as claimed in claim 1, wherein the distance measuring device is a laser displacement sensor.
4. The device for measuring the thickness of a galvanized layer of steel strip as claimed in claim 3, wherein the distance between the distance measuring device and the steel strip is 150 +/-10 mm.
5. The device for measuring the thickness of the galvanized layer of the strip steel as claimed in any one of claims 1 to 4, wherein the thickness measuring device further comprises an adjusting assembly, and the thickness gauge can move along the width direction of the strip steel through the adjusting assembly.
6. The strip steel galvanizing device of claim 5, wherein the adjusting assembly includes:
the support is fixedly connected with the thickness gauge, the support is arranged on the outer side of the strip steel, a connecting bulge and a guide bulge are arranged on the support facing the strip steel at one time, and the connecting bulge is provided with a through threaded hole along the width direction of the strip steel;
the screw rod is in threaded connection with the threaded hole, and one end of the screw rod is used for being connected with a driving piece;
the guide rail is arranged between the strip steel and the thickness gauge, one side of the guide rail, which faces the thickness gauge, is provided with a guide groove, and the guide protrusion is arranged in the guide groove in a sliding manner.
7. A method for measuring the thickness of a galvanized layer of a strip steel, which is performed based on the device for measuring the thickness of a galvanized layer of a strip steel according to any one of claims 1 to 6, and which comprises:
obtaining initial system measurement parameters, the system measurement parameters including at least one of: the distance between the output end of the thickness gauge and the strip steel, the equipment size of the thickness gauge and the photon energy of a radiation source of the thickness gauge;
adjusting the system measurement parameters, and collecting the fluorescence intensity collected by the output end of the thickness gauge facing the beryllium window on the strip steel side;
and when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter.
8. The method for measuring the thickness of the galvanized layer of the strip steel as claimed in claim 7, wherein the adjusting the system measurement parameters and the collecting the fluorescence intensity collected from the beryllium window of the strip steel side, which is faced by the output end of the thickness gauge, specifically comprises:
repeating the following steps m times to obtain m fluorescence intensities correspondingly collected by the thickness gauge, wherein m is a positive integer greater than 1:
adjusting the system measurement parameters, and collecting the fluorescence intensity collected by the output end of the thickness gauge facing the beryllium window on the strip steel side;
when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter comprises:
and determining the system measurement parameter corresponding to the maximum fluorescence intensity in the m fluorescence intensities as the final measurement parameter.
9. The method for measuring the thickness of a galvanized layer of steel strip according to claim 7, wherein after the measurement of the thickness of the zinc layer, the method for measuring the thickness of the galvanized layer further comprises the following steps:
calculating evaluation parameters of the reflection fluorescence collected by the thickness gauge based on a Monte Carlo algorithm to obtain corresponding evaluation parameters, wherein the evaluation parameters comprise relative errors and/or quality factors;
and when the evaluation parameters meet the preset index requirements, determining that the zinc layer thickness measurement based on the final measurement parameters is reasonable.
10. The method for measuring the thickness of the galvanized layer of the strip steel according to any one of claims 7 to 9, wherein the photon energy of a radiation source of the thickness measuring instrument is 10 keV.
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| CN109798851A (en) * | 2018-12-26 | 2019-05-24 | 日照钢铁控股集团有限公司 | A kind of non-contact type steel strip measurer for thickness |
| CN113074646A (en) * | 2021-03-19 | 2021-07-06 | 武汉钢铁有限公司 | Method for measuring thickness of paint layer of zinc-aluminum-magnesium coating color coated sheet |
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| CN202092607U (en) * | 2011-06-01 | 2011-12-28 | 攀钢集团有限公司 | Device for measuring thickness of galvanized layer of band steel |
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