CN114659452A - Parameter determination method, device, equipment and medium for measuring thickness of zinc coating - Google Patents
Parameter determination method, device, equipment and medium for measuring thickness of zinc coating Download PDFInfo
- Publication number
- CN114659452A CN114659452A CN202210288978.7A CN202210288978A CN114659452A CN 114659452 A CN114659452 A CN 114659452A CN 202210288978 A CN202210288978 A CN 202210288978A CN 114659452 A CN114659452 A CN 114659452A
- Authority
- CN
- China
- Prior art keywords
- detector
- measurement
- fluorescence intensity
- galvanized
- parameters
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0683—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating measurement during deposition or removal of the layer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The invention discloses a method, a device, equipment and a medium for determining a galvanized layer thickness measurement parameter, wherein the method is applied to a galvanized layer thickness measurement system, the system comprises a ray source, a galvanized plate and a detector arranged above the galvanized plate, and the method comprises the following steps: acquiring initial system measurement parameters; adjusting the system measurement parameters, and acquiring the fluorescence intensity collected on a beryllium window close to the galvanized plate side in the detector; and when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter. By adopting the method and the device, the technical problem of inaccurate measurement of the thickness of the zinc coating caused by the fact that the measurement cannot be accurately approximated to a real measurement environment in the prior art can be solved.
Description
Technical Field
The invention relates to the technical field of metallurgical production detection, in particular to a method, a device, equipment and a medium for determining parameters of a galvanized layer thickness layer.
Background
The method for detecting the coating mainly comprises the following steps: wedge cutting method, light cutting method, electrolytic method, thickness difference measuring method, weighing method, X-ray fluorescence method, beta-ray reflection method, capacitance method, magnetic measuring method, eddy current measuring method, etc. Most of the methods except the last five methods need to damage products or product surfaces, belong to destructive detection, and are complicated in measurement means, slow in speed and mostly suitable for sampling inspection. The latter five categories are non-destructive, in which capacitive methods can only detect the thickness of the insulating coating of very thin conductors. The magnetic measurement method requires the measuring head to contact with the measured object, and the eddy current measurement method is mainly applied to the measurement of various non-metal coatings on metal substrates. Only X-ray and beta-ray reflectometry allow contactless non-destructive measurements.
At present, the X-ray fluorescence method is most commonly used in the continuous hot galvanizing industry. The X-ray thickness gauge emits X-rays to the galvanized sheet, and then fluorescence excited by the X-ray source is collected to measure the galvanized layer. However, the theoretical research on the zinc layer weight measurement in the domestic continuous hot galvanizing industry is insufficient at present, the actual physical measurement environment cannot be approached, namely, the related measurement parameters cannot be accurately determined, and a satisfactory measurement result cannot be obtained.
Therefore, it is necessary to provide a more accurate parameter determination scheme for measuring the thickness of the galvanized layer, so as to achieve accurate measurement of the thickness of the galvanized layer.
Disclosure of Invention
The embodiment of the application provides a method for determining the parameters of the thickness measurement of the galvanized layer, and solves the technical problem that the thickness measurement of the galvanized layer is inaccurate due to the fact that the method cannot be accurately approximated to a real measurement environment in the prior art.
In one aspect, the present application provides a method for determining a parameter of a galvanized layer thickness measurement, which is applied to a galvanized layer thickness measurement system, where the system includes a radiation source, a galvanized sheet, and a detector installed above the galvanized sheet, and the method includes:
obtaining initial system measurement parameters, the system measurement parameters including at least one of: the installation distance of the detector, the equipment size of the detector and the photon energy of the ray source;
adjusting the system measurement parameters, and acquiring the fluorescence intensity collected on a beryllium window close to the galvanized plate side in the detector;
and when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter.
Optionally, the adjusting the system measurement parameters, and the acquiring the fluorescence intensity collected on the beryllium window close to the galvanized plate side in the detector includes:
repeating the following steps m times to obtain the fluorescence intensities correspondingly acquired by m system measurement parameters, wherein m is a positive integer greater than 1:
adjusting the system measurement parameters, and collecting the fluorescence intensity collected on a beryllium window close to the galvanized plate side in the detector;
when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter comprises:
and determining the system measurement parameter corresponding to the maximum fluorescence intensity in the m fluorescence intensities as the final measurement parameter.
Optionally, the method further comprises:
and adjusting corresponding devices in the galvanized layer thickness measuring system according to the final measuring parameters so as to measure the thickness of the zinc layer in the galvanized sheet.
Optionally, after the zinc layer thickness measurement, the method further comprises:
calculating evaluation parameters of the reflected fluorescence collected by the detector based on a Monte Carlo algorithm to obtain corresponding evaluation parameters, wherein the evaluation parameters comprise relative errors and/or quality factors;
and when the evaluation parameters meet the preset index requirements, determining that the thickness measurement of the zinc layer based on the final measurement parameters is reasonable.
Optionally, the detector is mounted at a distance of 4 cm.
Optionally, the photon energy of the radiation source is 10 keV.
Optionally, the detector is an annular ionization chamber filled with xenon gas, the apparatus size of the detector comprises an inner diameter and an outer diameter of the detector, the inner diameter of the detector is 2.5cm, and the outer diameter of the detector is 20 cm.
On the other hand, the present application provides a parameter determination device for measuring a thickness of a galvanized layer through an embodiment of the present application, which is applied to a system for measuring a thickness of a galvanized layer, the system includes a radiation source, a galvanized sheet and a detector installed above the galvanized sheet, the device includes an acquisition module, an adjustment module and a determination module, wherein:
the obtaining module is configured to obtain an initial system measurement parameter, where the system measurement parameter includes at least one of: the installation distance of the detector, the equipment size of the detector and the photon energy of the ray source;
the adjusting module is used for adjusting the system measurement parameters and acquiring the fluorescence intensity collected on a beryllium window close to the galvanized plate side in the detector;
the determining module is configured to determine the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter when the fluorescence intensity reaches a preset intensity upper limit value.
On the other hand, the present application provides a terminal device according to an embodiment of the present application, where the terminal device includes: a processor, a memory, a communication interface, and a bus; the processor, the memory and the communication interface are connected through the bus and complete mutual communication; the memory stores executable program code; the processor executes a program corresponding to the executable program code by reading the executable program code stored in the memory, for performing the parameter determination method for measuring the thickness of the zinc coating layer as described above.
In another aspect, the present application provides a computer-readable storage medium storing a program that, when running on a terminal device, performs the method for determining a parameter of a zinc plating layer thickness measurement as described above, by an embodiment of the present application.
One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages: the present application obtains initial system measurement parameters, which include at least one of: the installation distance of the detector, the equipment size of the detector and the photon energy of the ray source; adjusting the system measurement parameters, and acquiring the fluorescence intensity collected on a beryllium window close to the galvanized plate side in the detector; and when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter. In the above scheme, the system measurement parameters are adjusted, the fluorescence intensity collected by the detector at present is collected, and the system measurement parameters at the moment can be determined as the final measurement parameters when the fluorescence intensity reaches the preset intensity upper limit value. Therefore, the system parameters are conveniently, quickly and accurately determined, and convenience and accuracy in measuring the thickness of the galvanized layer are improved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a galvanized layer thickness measurement system provided in an embodiment of the present application.
Fig. 2 is a schematic diagram of a thickness gauge model for measuring the thickness of a zinc coating layer according to an embodiment of the present application.
FIG. 3 is a schematic diagram of interaction of incident light provided by a radiation source with a galvanized sheet according to an embodiment of the present disclosure.
Fig. 4 is a schematic flow chart of a method for determining a parameter of a galvanized layer thickness measurement according to an embodiment of the present disclosure.
FIG. 5 is a comparative graph of K.alpha.energy spectra of zinc layers excited at different energies provided in examples of the present application.
FIG. 6 is a graph showing the comparison of fluorescence intensity for different detector sizes and distances according to the embodiment of the present application.
Fig. 7(a) -7 (d) are graphs showing the linear relationship between the thickness of the zinc-plated layer and the incident photon count at several different distances and at different incident photon energies from different radiation sources according to the embodiment of the present application.
Fig. 8 is a schematic structural diagram of a parameter determination device for measuring a thickness of a zinc coating according to an embodiment of the present application.
Fig. 9 is a schematic structural diagram of a terminal device according to an embodiment of the present application.
Detailed Description
The embodiment of the application provides a method for determining the parameters of the thickness measurement of the galvanized layer, and solves the technical problem that the thickness measurement of the galvanized layer is inaccurate due to the fact that the method cannot be accurately approximated to a real measurement environment in the prior art.
In order to solve the technical problems, the general idea of the embodiment of the application is as follows: obtaining initial system measurement parameters, the system measurement parameters including at least one of: the installation distance of the detector, the equipment size of the detector and the photon energy of the ray source; adjusting the system measurement parameters, and acquiring the fluorescence intensity collected on a beryllium window close to the galvanized plate side in the detector; and when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter.
In order to better understand the technical solution, the technical solution will be described in detail with reference to the drawings and the specific embodiments.
First, it is stated that the term "and/or" appearing herein is merely one type of associative relationship that describes an associated object, meaning that three types of relationships may exist, e.g., a and/or B may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, the character "/" herein generally indicates that the former and latter related objects are in an "or" relationship.
Fig. 1 is a schematic structural diagram of a system for measuring a thickness of a galvanized layer according to an embodiment of the present disclosure. The system 10 shown in fig. 1 includes: a thickness gauge 100, a zinc pot 200 and a galvanized sheet 300. Optionally, an expert system 400 and an industrial personal computer 500 may also be included. Wherein:
during the preparation of the galvanized sheet 300, the thickness gauge 100 may include a hot zinc layer thickness gauge 100 and a cold zinc layer thickness gauge 100. And the galvanized sheet 300 undergoes preparation stages such as an alloying stage, a final cooling stage, etc. during the preparation process. The hot zinc layer thickness gauge 100 is used for measuring the thickness of the hot zinc layer, and the cold zinc layer thickness gauge 100 is used for measuring the thickness of the cold zinc layer. The expert system 400 may be used to monitor and manage the entire process of manufacturing the galvanized sheet 300, and the industrial personal computer 500 may be used to adjust relevant parameters in the process of manufacturing or measuring the galvanized sheet 300, which is not limited in this application.
The thickness gauge 100 may include a detector and a radiation source, such as an X-ray source or other devices, mounted on the detector, which is not limited in this application. The detector can adopt an annular ionization chamber, and a zinc layer thickness gauge based on an X-ray fluorescence method generally adopts an X-ray tube and the ionization chamber as core components.
Please refer to fig. 2, which is a schematic diagram of a thickness gauge model for measuring a thickness of a galvanized layer according to an embodiment of the present application. As shown in fig. 2, an annular ionization chamber filled with xenon gas (because of its low ionization energy) is provided as a detector at a height h from a galvanized steel sheet (also referred to as a galvanized sheet). The inner diameter, the outer diameter and the height of the ionization chamber can be set according to system self-definition, for example, the inner diameter and the outer diameter can be respectively 2.5cm and 20cm, the height of the ionization chamber is 15cm, and the like. The bottom of the ionization chamber (i.e., detector) on the side near the galvanized sheet can be a beryllium window of 0.01cm thickness. A radiation source (such as an X-ray source) is arranged at the center of one side of the ionization chamber, which is far away from the strip steel, and is used as monochromatic energy photons, and the emitted energy can be called photon energy to irradiate the zinc coating of the zinc coating plate in a conical shape. As shown in FIG. 2, the radius of the illumination spot is L/2, and L is the diameter of the cone bottom, i.e., the maximum diameter. The annular ionization chamber can effectively increase the window area of the detector, improve the detection efficiency and reduce the statistical error.
The present application analyzes an irradiated material (zinc coating) based on the intensity and energy of K α radiation or K β radiation captured/collected by the thickness gauge 100, in other words, the present application can measure the thickness of a zinc coating in a galvanized sheet using the thickness gauge. Specifically, the thickness gauge 100 may be calibrated by using a pre-manufactured standard plate (standard galvanized plate) to obtain a standard measurement curve of a relationship between voltage/current and a thickness of the galvanized layer corresponding to each of the plurality of standard plates. And comparing the voltage/current signals of the galvanized sheet to be measured with corresponding points in the standard measurement curve by taking the plurality of standard measurement standard curves as the basis, so as to obtain the thickness of the zinc layer in the galvanized sheet to be measured.
Please refer to fig. 3, which is a schematic diagram illustrating interaction between incident light provided by a radiation source and a galvanized sheet according to an embodiment of the present disclosure. As in fig. 3, the detector measures the thickness of the galvanized layer by collecting the intensity of the fluorescence emitted by the X-ray source. When these X-rays are absorbed by zinc atoms of the zinc coating, photons having a specific energy are released from the atoms. The number of photons reflected (referred to simply as the photon count) varies depending on the thickness of the zinc layer.
Based on the above embodiments, please refer to fig. 4, which is a schematic flow chart of a method for determining a galvanized layer thickness measurement according to an embodiment of the present application. The method shown in fig. 4 is applied to the zinc coating thickness measuring system described in fig. 1-3, and comprises the following implementation steps:
s401, obtaining an initial system measurement parameter, wherein the system measurement parameter comprises at least one of the following items: the installation distance of the detector, the equipment size of the detector and the photon energy of the ray source.
The system measurement parameters described herein may be pre-custom configured by the system or by the user, which may include, but are not limited to, any one or a combination of more of the following: the installation distance h of the detector, the equipment size of the detector and the photon energy of the ray source. Wherein the detector may be an annular ionization chamber filled with xenon gas, and the apparatus dimensions of the detector include the inner and outer diameters (i.e., inner and outer diameters) of the detector.
S402, adjusting the system measurement parameters, and collecting the fluorescence intensity collected on the beryllium window close to the galvanized plate side in the detector.
And S403, when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter.
The system measurement parameters can be adjusted, the fluorescence intensity collected by the detector during each adjustment is collected, and the final measurement parameters of the system are determined according to the fluorescence intensity.
In one embodiment, the present application can repeatedly perform step S402 m times to obtain m fluorescence intensities corresponding to m measured parameters of the system, where m is a positive integer greater than 1. Further, the method selects the maximum fluorescence intensity from the m fluorescence intensities, and determines the system measurement parameter corresponding to the maximum fluorescence intensity as the final measurement parameter of the system.
In an alternative embodiment, the present application may adjust/mount corresponding devices in the system according to the final measurement parameters, for example, mount the detector according to a mounting distance h (e.g. 4cm) of the detector in the final measurement parameters, select and mount the detector with corresponding size according to the device size (e.g. 2.5cm and 20cm for inner and outer diameters, respectively) of the detector in the final measurement parameters, and so on, and the present application is not limited thereto.
After the galvanized layer thickness measuring system is installed, the thickness measuring instrument in the system can be used for measuring the thickness of the zinc layer in the galvanized sheet, and the specific measuring embodiment can be described with reference to fig. 2, which is not repeated herein.
In an optional embodiment, in order to verify the effectiveness of the zinc coating thickness measurement scheme, the evaluation parameters of the reflected fluorescence collected by the detector are calculated based on a monte carlo algorithm, so as to obtain corresponding evaluation parameters, wherein the evaluation parameters comprise relative errors and/or quality factors. When the evaluation parameters meet the preset index requirements, determining that the zinc layer thickness measurement based on the final measurement parameters is reasonable, namely determining that the current thickness measurement scheme is reasonable; otherwise, it is not reasonable to determine the current thickness measuring scheme.
In a specific implementation, the application adopts a Monte Carlo (Monte Carlo) method based on a random sampling technology to verify the effectiveness of the thickness measuring scheme. Specifically, the photon number F1 of the fluorescence detector interface is counted first based on the monte carlo method, that is, the photon number F1 collected by the beryllium window of the detector is counted, and a specific calculation formula (1) is as follows:
wherein r is the position of the particle when passing through the curved surface of the galvanized plate, E is the energy of the particle when passing through the curved surface, t is the time (shake, 10-8s) of the particle when passing through the curved surface, mu is the direction cosine of the particle when passing through the curved surface, and A is the area (cm)2)。
The application can also evaluate whether a physical model (thickness gauge model) of the thickness gauge scheme can effectively excite the fluorescence of zinc element and penetrate the zinc coating layer or not relative to the error and quality factor (gauge of merit). Wherein, the calculation formula (2) of the relative error R and the quality factor FOM is as follows:
wherein P (x) is thickness measurementProbability density function of a random course of reflected fluorescence received by the instrument, xiFor the contribution of the ith history extracted from P (x), N is the total number of particles, t is the calculation time (shake, 10-8s),
the average contribution (weight) of the N particles, the relative error is R and the quality factor is FOM.
When the design parameters of the system are determined (namely the final measurement parameters of the system are determined), the intensity of the fluorescence collected by the beryllium window can be used as the basis for determining the incident source photon energy, the installation distance of the detector and the equipment size of the detector, and whether the thickness of the zinc coating has a good linear relation with the photon count F1 is used as the basis for verifying and determining the final measurement parameters of the system.
Optionally, to eliminate the influence of long-time use and other factors, the thickness gauge (detector and radiation source) of the present application needs to be calibrated once every 6-12 hours, in other words, the present application can periodically and repeatedly execute the steps S401-403 of the present application to determine the final measurement parameters of the system.
To assist in better understanding of the embodiments of the present application, examples are provided below. FIG. 5 shows a comparison of the fluorescence energy spectra excited by different photon energies of the radiation source. As shown in fig. 5: and the energy spectrum contrast of the zinc (Zn) K alpha excited by X-rays at photon energy of 10kev, 20kev, 30kev and 40 kev. In the graph, curve 1 shows the curve of the change of K α with respect to the fluorescence intensity at a photon energy of 10 kev. Curve 2 shows the K.alpha.versus fluorescence intensity at 20kev photon energy. Curve 3 shows the K.alpha.versus fluorescence intensity at a photon energy of 30 kev. Curve 4 shows the K.alpha.versus fluorescence intensity at a photon energy of 40 kev.
Also, the following tables 1 to 3 show the verification results when the number of particles is 1 × 108 at a photon energy of 30 kev. Wherein, table 1 is a photon generation statistical table, table 2 is a photon loss statistical table, and table 3 is a photon activity table in each layer.
TABLE 1 photon generation statistics
TABLE 2 photon loss statistics Table
TABLE 3 photon Activity Table in layers
As can be seen from tables 1 and 2, the number of photons generated by the X-ray source is 1X 108, and the total number of photons generated and lost is equal to the total energy in the case of 30keV energy per photon, which indicates that all photons participate in the transport process and are recorded. Wherein bremsstrahlung photons are generated with electron pairs; the primary fluorescence is fluorescence generated by the coating or the substrate; the secondary fluorescence is the fluorescence excited again when the primary fluorescence enters other grid cells; escape is the number of photons that reach outside the region of interest (outside the simulation space) and are terminated.
As can be seen from Table 3, the number of photons entering the cell 1 is greater than that generated by the radiation source, which indicates that all X-rays generated by the radiation source irradiate the galvanized sheet and excite the atoms of the coating to generate X-ray fluorescence; the number of photons entering the grid cell 2 shows that X rays not only effectively penetrate through a zinc coating, but also partially penetrate through a galvanized steel sheet; the grid cells 3 and 4 are provided with photons (the photons are characteristic X-rays), the ionization chamber generates more photons, and because part of the photons can enter from the side of the ionization chamber and do not pass through the beryllium window, the counting of the photon flow of the beryllium window is more accurate and effective. The number of photons entering the cell 5 is the greatest because either the X-rays from the source or the fluorescent light from the zinc coating and the substrate steel plate pass through the air before entering the other cell. The above photons move in each cell in good agreement with the optical path in the thickness measuring schemes shown in fig. 2 and 3 described above in this application.
The reliability of the above results is examined below with TFC counting and count convergence statistics. Table 4 is a count fluctuation table. According to one algorithm based on Monte Carlo (MCNP) programs, R < 0.05 is generally required to obtain confidence intervals for general reliability, with relative errors R < 0.003 as can be seen from Table 4; the relative error R tends to decrease, and
in direct proportion, where N is the total number of particles, and for an undesired count, R increases as the total number of counts increases. The relative average deviation of the quality factor (figure of merit) is less than 0.01, and the counting quality is very high because the quality factor approaches a constant value. The above criteria are all in accordance with the judgment standard of MCNP program error, which shows that the physical model precision of the thickness measuring scheme is higher, and the fluorescence of zinc element can be effectively excited and penetrates through the coating.
TABLE 4 count fluctuation Table (TFC)
After determining that the measurement model can effectively excite the fluorescence of the zinc element and penetrate through the coating, the most appropriate ray source energy is searched. The characteristic X-ray energy of the zinc (Zn) element K α is 8.63 kev. Therefore, the energy of the incident monochromatic photons (i.e., the photon energy of the radiation source) must be greater than 8.63 kev. For ease of calculation, the application may set the minimum monochromatic photon energy to 10 kev.
FIG. 5 compares the energy spectra of 10keV, 20keV, 30keV and 40keV, and it is known from FIG. 5 that the fluorescence intensity of Zn K.alpha.generated by a monochromatic photon of 10keV is the highest. Therefore, the most suitable theoretical integral value of the source energy should be 10keV, where the maximum Zn K.alpha.fluorescence intensity is obtained.
In the embodiment of the present application, the distance (h) of the detector is another important factor in the model construction process. The distance between the detector and the galvanized sheet (strip steel) is directly related to the sensitivity and the measurement precision of the detector.
Fig. 6 is a schematic diagram showing comparison of K α energy spectra of zinc layers excited at different energies according to an embodiment of the present application. As shown in fig. 6, the data is obtained by comparing the Zn K α intensity of beryllium window at a distance of 1cm to 10cm (nps ═ 107), and table 5 shows the parameters used for curves a to d in fig. 6.
TABLE 5 parameter table corresponding to each curve
As can be seen from fig. 5 and table 5: when the inner diameter of the detector is larger, the smaller the incident light angle is, the lower the collected fluorescence intensity is; when the inner diameter of the detector is small and the incident light angle is minimum, the acquired fluorescence intensity is maximum. And when the distance h of the detector (namely the installation distance) is between 2 and 4cm, the fluorescence intensity reaches the maximum value. When the detector approaches the zinc coating, part of the fluorescence enters the inner diameter blind zone of the detector, so that the fluorescence cannot be collected. As the detector distance gradually increases, part of the fluorescence escapes from the outside of the detector. In consideration of the actual production condition, the larger detection distance can effectively reduce the risk of errors and instrument damage caused by strip steel shaking. Therefore, in the measurement model, the most suitable detector distance h should be 4 cm. Wherein, DIR refers to the cosine value of the included angle between the reflection direction of the monochromatic photons and the Y-axis direction.
The zinc layer thickness gauge of the continuous hot galvanizing production line uses a standard measurement curve as a basis, and compares the measured voltage or current signal with a corresponding point in the standard curve to obtain a corresponding zinc layer thickness value. In the calibration process, the zinc layer thickness gauge returns to the calibration position at one side of the O-shaped frame, and the manufactured standard plate is used for calibrating the standard curve. Therefore, the measuring curve plays an important role in the zinc layer thickness gauge. Since the MCNP program cannot simulate electrical signals, it is necessary to be able to establish a measurement curve of the zinc layer thickness values versus the number of X-ray fluorescence photons.
On the basis of determining the ray source energy and the detection distance in the above mode, measuring 40-180 g.m-2Zinc coating of moderate thickness. FIGS. 7(a) - (c) show the thickness of the zinc coating (proportional to the weight of the zinc coating per unit area in FIG. 5) and the Zn Ka photon energy at 10keV incident photon energy, respectivelyThe relationship between the counts. When the distance between the detectors is 3-4 cm, the detectors and the detectors can establish a better linear relation. Meanwhile, when the detector inner diameter is 0.5cm and DIR is 1, the linear relation is best, and the linear correlation coefficient is 0.9994.
Fig. 7(d) is comparative data of 20keV monochromatic photons, and since the Zn K α fluorescence generated by the high-energy X-ray is less, the Zn K α fluorescence is further weakened after passing through the thick zinc plating layer, and cannot show a weak variation tendency. The results further demonstrate that 10keV is a more suitable incident photon energy.
By implementing the embodiment of the application, the application obtains initial system measurement parameters, and the system measurement parameters comprise at least one of the following: the installation distance of the detector, the equipment size of the detector and the photon energy of the ray source; adjusting the system measurement parameters, and collecting the fluorescence intensity collected on a beryllium window close to the galvanized plate side in the detector; and when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter. In the above scheme, the system measurement parameters are adjusted, the fluorescence intensity collected by the detector at present is collected, and the system measurement parameters at the moment can be determined as the final measurement parameters when the fluorescence intensity reaches the preset intensity upper limit value. Therefore, the system parameters are conveniently, quickly and accurately determined, and convenience and accuracy in measuring the thickness of the galvanized layer are improved.
Based on the same inventive concept, another embodiment of the present application provides a device and a terminal device corresponding to the method for determining a galvanized layer thickness measurement in the embodiment of the present application.
Fig. 8 is a schematic structural diagram of a device for determining a parameter of a galvanized layer thickness measurement according to an embodiment of the present application. The apparatus 80 shown in fig. 8 is applied to a galvanized layer thickness measuring system, the system includes a radiation source, a galvanized plate and a detector installed above the galvanized plate, the apparatus 80 includes an obtaining module 801, an adjusting module 802 and a determining module 803, wherein:
the obtaining module 801 is configured to obtain an initial system measurement parameter, where the system measurement parameter includes at least one of: the installation distance of the detector, the equipment size of the detector and the photon energy of the ray source;
the adjusting module 802 is configured to adjust the system measurement parameters, and acquire the fluorescence intensity collected on the beryllium window close to the galvanized plate side in the detector;
the determining module 803 is configured to determine the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter when the fluorescence intensity reaches a preset intensity upper limit value.
Optionally, the adjusting module 802 is specifically configured to:
repeating the following steps m times to obtain the fluorescence intensities correspondingly acquired by m system measurement parameters, wherein m is a positive integer greater than 1:
adjusting the system measurement parameters, and acquiring the fluorescence intensity collected on a beryllium window close to the galvanized plate side in the detector;
the determining module 803 is specifically configured to:
and determining the system measurement parameter corresponding to the maximum fluorescence intensity in the m fluorescence intensities as the final measurement parameter.
Optionally, the adjusting module 802 is further configured to:
and adjusting corresponding devices in the galvanized layer thickness measuring system according to the final measurement parameters so as to measure the thickness of the zinc layer in the galvanized sheet.
Optionally, the apparatus further comprises a processing module 804, after the zinc layer thickness measurement, wherein the processing module 804 is configured to:
calculating evaluation parameters of the reflected fluorescence collected by the detector based on a Monte Carlo algorithm to obtain corresponding evaluation parameters, wherein the evaluation parameters comprise relative errors and/or quality factors;
and when the evaluation parameters meet the preset index requirements, determining that the zinc layer thickness measurement based on the final measurement parameters is reasonable.
Optionally, the detector is mounted at a distance of 4 cm.
Optionally, the photon energy of the radiation source is 10 keV.
Optionally, the detector is an annular ionization chamber filled with xenon gas, the apparatus size of the detector comprises an inner diameter and an outer diameter of the detector, the inner diameter of the detector is 2.5cm, and the outer diameter of the detector is 20 cm.
Please refer to fig. 9, which is a schematic structural diagram of a terminal device according to an embodiment of the present application. The terminal device 90 shown in fig. 9 includes: at least one processor 901, a communication interface 902, a user interface 903 and a memory 904, wherein the processor 901, the communication interface 902, the user interface 903 and the memory 904 may be connected through a bus or in other ways, and the embodiment of the present invention is exemplified by being connected through the bus 905. Wherein, the first and the second end of the pipe are connected with each other,
The communication interface 902 may be a wired interface (e.g., an ethernet interface) or a wireless interface (e.g., a cellular network interface or using a wireless local area network interface) for communicating with other terminals or websites. In this embodiment of the present invention, the communication interface 902 is specifically configured to obtain the track parameter.
The user interface 903 may be a touch panel, including a touch screen and a touch screen, for detecting an operation instruction on the touch panel, and the user interface 903 may also be a physical button or a mouse. The user interface 903 may also be a display screen for outputting, displaying images or data.
Since the terminal device described in this embodiment is a terminal device used for implementing the method in this embodiment, based on the method described in this embodiment, a person skilled in the art can understand the specific implementation manner of the terminal device in this embodiment and various variations thereof, so that a detailed description of how to implement the method in this embodiment by the terminal device is omitted here. The terminal device adopted by a person skilled in the art to implement the method in the embodiment of the present application is within the scope of the protection intended by the present application.
One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages: the present application obtains initial system measurement parameters, which include at least one of: the installation distance of the detector, the equipment size of the detector and the photon energy of the ray source; adjusting the system measurement parameters, and acquiring the fluorescence intensity collected on a beryllium window close to the galvanized plate side in the detector; and when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter. In the above scheme, the system measurement parameters are adjusted, the fluorescence intensity collected by the detector at present is collected, and the system measurement parameters at the moment can be determined as the final measurement parameters when the fluorescence intensity reaches the preset intensity upper limit value. Therefore, the system parameters can be conveniently, quickly and accurately determined, and the convenience and the accuracy of the thickness measurement of the galvanized layer can be improved.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (10)
1. A parameter determination method for measuring the thickness of a galvanized layer is characterized by being applied to a galvanized layer thickness measuring system, wherein the system comprises a ray source, a galvanized plate and a detector arranged above the galvanized plate, and the method comprises the following steps:
obtaining initial system measurement parameters, the system measurement parameters including at least one of: the installation distance of the detector, the equipment size of the detector and the photon energy of the ray source;
adjusting the system measurement parameters, and acquiring the fluorescence intensity collected on a beryllium window close to the galvanized plate side in the detector;
and when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter.
2. The method of claim 1, wherein the adjusting the system measurement parameters to collect fluorescence intensity collected on a beryllium window on the side of the detector near the galvanized sheet comprises:
repeating the following steps m times to obtain the fluorescence intensities correspondingly acquired by m system measurement parameters, wherein m is a positive integer greater than 1:
adjusting the system measurement parameters, and acquiring the fluorescence intensity collected on a beryllium window close to the galvanized plate side in the detector;
when the fluorescence intensity reaches a preset intensity upper limit value, determining the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter includes:
and determining the system measurement parameter corresponding to the maximum fluorescence intensity in the m fluorescence intensities as the final measurement parameter.
3. The method of claim 1, further comprising:
and adjusting corresponding devices in the galvanized layer thickness measuring system according to the final measurement parameters so as to measure the thickness of the zinc layer in the galvanized sheet.
4. The method of claim 3, wherein after said zinc layer thickness measurement, said method further comprises:
calculating evaluation parameters of the reflected fluorescence collected by the detector based on a Monte Carlo algorithm to obtain corresponding evaluation parameters, wherein the evaluation parameters comprise relative errors and/or quality factors;
and when the evaluation parameters meet the preset index requirements, determining that the zinc layer thickness measurement based on the final measurement parameters is reasonable.
5. The method of claim 1, wherein the probe is mounted at a distance of 4 cm.
6. The method of claim 1, wherein the source has a photon energy of 10 keV.
7. The method of claim 1, wherein the detector is an annular ionization chamber filled with xenon gas, the apparatus dimensions of the detector include an inner diameter and an outer diameter of the detector, the inner diameter of the detector is 2.5cm, and the outer diameter of the detector is 20 cm.
8. The utility model provides a parameter determination device of galvanizing coat thickness measurement, its characterized in that is applied to galvanizing coat thickness measurement system, the system includes ray source, galvanized sheet and installs the detector in the galvanized sheet top, the device includes acquisition module, adjustment module and confirms the module, wherein:
the obtaining module is configured to obtain an initial system measurement parameter, where the system measurement parameter includes at least one of: the installation distance of the detector, the equipment size of the detector and the photon energy of the ray source;
the adjusting module is used for adjusting the system measurement parameters and acquiring the fluorescence intensity collected on a beryllium window close to the galvanized plate side in the detector;
the determining module is configured to determine the system measurement parameter corresponding to the fluorescence intensity reaching the intensity upper limit value as a final measurement parameter when the fluorescence intensity reaches a preset intensity upper limit value.
9. A terminal device, characterized in that the terminal device comprises: a processor, a memory, a communication interface, and a bus; the processor, the memory and the communication interface are connected through the bus and complete mutual communication; the memory stores executable program code; the processor executes a program corresponding to the executable program code by reading the executable program code stored in the memory for performing the parameter determination method for zinc coating thickness measurement as set forth in any one of claims 1 to 7 above.
10. A computer-readable storage medium, characterized in that the computer-readable storage medium stores a program that executes the method for determining a parameter of a zinc coating thickness measurement according to any one of claims 1 to 7 when the program is run on a terminal device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210288978.7A CN114659452A (en) | 2022-03-23 | 2022-03-23 | Parameter determination method, device, equipment and medium for measuring thickness of zinc coating |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210288978.7A CN114659452A (en) | 2022-03-23 | 2022-03-23 | Parameter determination method, device, equipment and medium for measuring thickness of zinc coating |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114659452A true CN114659452A (en) | 2022-06-24 |
Family
ID=82031637
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210288978.7A Pending CN114659452A (en) | 2022-03-23 | 2022-03-23 | Parameter determination method, device, equipment and medium for measuring thickness of zinc coating |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114659452A (en) |
-
2022
- 2022-03-23 CN CN202210288978.7A patent/CN114659452A/en active Pending
Non-Patent Citations (1)
| Title |
|---|
| 徐巍: "连续热镀锌生产线带钢锌层重量测量模型与控制方法研究", 中国博士学位论文全文数据库 (工程科技Ⅰ辑) * |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP2638558B1 (en) | Determining changes in the x-ray emission yield of an x-ray source | |
| EP3076873B1 (en) | System for generating spectral computed tomography projection data | |
| US11246547B2 (en) | Compensation for charge sharing between detector pixels in a pixilated radiation detector | |
| CN109239757B (en) | Device and method for measuring and diagnosing distribution of intense pulse gamma radiation dose field | |
| US9036778B2 (en) | System and method for measuring the thickness of a zinc layer on steel and for measuring the iron concentration in a zinc layer | |
| JP6685996B2 (en) | Method for measuring mass thickness of target sample for electron microscope | |
| Qi et al. | Measurement of the neutron beam profile of the Back-n white neutron facility at CSNS with a Micromegas detector | |
| CN116817805B (en) | Pole piece coating edge thinning and measuring method | |
| CN114659452A (en) | Parameter determination method, device, equipment and medium for measuring thickness of zinc coating | |
| US7092486B2 (en) | System and method for the measurement of the layer thickness of a multi-layer pipe | |
| JP6357479B2 (en) | Material identification method | |
| Pires et al. | Establishment of radiation qualities for mammography according to the IEC 61267 and TRS 457 | |
| KR102001217B1 (en) | Method of calibrating an x-ray detector | |
| US9182363B2 (en) | Instrument and method of measuring the concentration of a target element in a multi-layer thin coating | |
| Dubuque et al. | Backscatter factors in the mammographic energy range | |
| JPH10221047A (en) | Fluorescent x-ray film thickness analyzer and method | |
| Tanimura et al. | Construction of monoenergetic neutron calibration fields using 45Sc (p, n) 45Ti reaction at JAEA | |
| CN111781632A (en) | Neutron-gamma ray combined detection device and method | |
| Klann et al. | Treatment of shielding in real-time source tracking software | |
| CN114608493A (en) | Strip steel zinc coating thickness measuring device and thickness measuring method | |
| EP3035082B1 (en) | Method for measuring x-ray energy of an accelerator in an inspection system | |
| Dirican et al. | Alpha particle counting system at SANAEM. Preliminary measurements as a part of validation studies | |
| JP6358045B2 (en) | X-ray analysis method for surface-coated fine particles and X-ray analyzer for surface-coated fine particles | |
| CA3172062C (en) | Method and system for inspecting a structure across a cover layer covering the structure | |
| CN113805217B (en) | Method and system for determining number of Li-6 atomic nuclei |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |