CN114578153B - Crystal oscillator oscillation detection circuit - Google Patents
Crystal oscillator oscillation detection circuit Download PDFInfo
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- CN114578153B CN114578153B CN202210094632.3A CN202210094632A CN114578153B CN 114578153 B CN114578153 B CN 114578153B CN 202210094632 A CN202210094632 A CN 202210094632A CN 114578153 B CN114578153 B CN 114578153B
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- 239000013078 crystal Substances 0.000 title claims abstract description 112
- 238000001514 detection method Methods 0.000 title claims abstract description 55
- 230000010355 oscillation Effects 0.000 title claims abstract description 33
- 230000007958 sleep Effects 0.000 claims description 19
- 239000002699 waste material Substances 0.000 abstract description 5
- 238000002474 experimental method Methods 0.000 abstract description 4
- 230000006641 stabilisation Effects 0.000 abstract description 4
- 238000011105 stabilization Methods 0.000 abstract description 4
- 238000012795 verification Methods 0.000 description 5
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
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Abstract
The application provides a crystal oscillator oscillation detection circuit, which comprises a first detection circuit and a second detection circuit, wherein the first detection circuit and the second detection circuit are used for detecting that a high-frequency crystal oscillator is from oscillation starting to stable; the first detection circuit detects the vibration frequency of the high-frequency crystal oscillator for multiple times by utilizing the RC clock in the first time, and stops detecting when the difference between the two vibration frequencies in any time period in the first time is the minimum value; dividing the frequency of the high-frequency crystal oscillator with the vibration frequency in a stable state; the second detection circuit detects the frequency division vibration frequency of the high-frequency crystal oscillator by utilizing the RC clock pair for multiple times in the second time, and stops detecting when the frequency division vibration frequency of the high-frequency crystal oscillator in any period in the second time is different by a minimum value. From the above description, it can be seen that the RC clock is used to accurately calculate the time point from starting to complete stabilization of the high-frequency crystal oscillator, repeated experiments are not needed to obtain the starting time, so that resource waste is avoided to the greatest extent, and the probability of chip halt is reduced.
Description
Technical Field
The present disclosure relates to the field of integrated circuits, and more particularly to a crystal oscillator oscillation detection circuit.
Background
The working period of the chip can be divided into a sleep period and a wake-up period, and a high-frequency crystal oscillator sleeps in the sleep period, and a low-frequency RC oscillator (RC oscillator, a frequency-selective network consisting of resistors and capacitive elements and generating low-frequency signals) provides a time reference for the sleep period of the chip. In the wake-up period, the high-frequency crystal oscillator (XTAL, external Crystal Oscillator, external high-frequency crystal oscillator) starts to oscillate to be stable, and provides a time reference with extremely high accuracy for the chip.
However, a certain time is needed from the start of the high-frequency crystal oscillator to the stable state, and the chip can start to work after the high-frequency crystal oscillator starts to vibrate stably, otherwise, the chip is likely to be halted. Most of the existing schemes estimate the starting time (T) through repeated tests, so that the chip begins to work after a period of fixed delay. The defect of the solution is that the time required for starting to stabilize is different due to different crystal oscillator quality, so that the crystal oscillator can reach a stable state before the time T, and the working time of a chip is wasted; it is also possible that after the time T, the crystal oscillator still does not reach a stable state, and the chip begins to work to cause a dead halt; and each development board requires extensive testing to estimate time T.
Disclosure of Invention
The application provides a crystal oscillator oscillation detection circuit, which can ensure the working stability of a chip to the greatest extent, avoid the chip from causing dead halt,
a crystal oscillator oscillation detection circuit comprising: the first detection circuit and the second detection circuit are used for detecting the vibration of the high-frequency crystal oscillator from starting to stabilizing; wherein,,
the first detection circuit detects the vibration frequency of the high-frequency crystal oscillator for multiple times by utilizing an RC clock in a first time, and stops detecting when the difference between the two vibration frequencies in any time period in the first time is a minimum value;
dividing the frequency of the high-frequency crystal oscillator with the vibration frequency in a stable state;
the second detection circuit detects the frequency division vibration frequency of the high-frequency crystal oscillator by utilizing the RC clock pair for multiple times in a second time, and stops detecting when the frequency division vibration frequency of the high-frequency crystal oscillator in any time period in the second time is different by a minimum value.
In a specific embodiment, the first time and the second time are time references of the chip from a sleep period to a wake period.
In a specific embodiment, the first detection circuit includes: a low frequency oscillator;
the low-frequency oscillator is connected with the RC clock and tracks the vibration frequency of the high-frequency crystal oscillator in the first time.
In a specific embodiment, the low frequency oscillator is continuously operated during the sleep period of the chip.
In a specific embodiment, when the vibration frequency of the high-frequency crystal oscillator in the first time is not in a stable state, the chip enters a sleep period, and after a third time, the chip is powered up to restart the high-frequency crystal oscillator.
In a specific embodiment, the duration of the third time is extended with the number of times the frequency of vibration is not stationary during the first time.
In a specific embodiment, the high-frequency crystal oscillator with the vibration frequency in a stable state is divided by opening a phase-locked loop through the chip.
In a specific embodiment, the second detection circuit includes: a frequency division clock;
and the frequency division clock is connected with the RC clock and tracks the frequency division vibration frequency of the high-frequency crystal oscillator in the second time.
In a specific embodiment, when the frequency of the divided vibration of the high-frequency crystal oscillator in the second time is not in a stable state, the divided clock is turned off, and the high-frequency crystal oscillator is divided again.
In a specific implementation manner, when the frequency of the frequency division vibration of the high-frequency crystal oscillator is not in a stable state for a plurality of times in the second time, the chip enters a sleep period, and after the third time is spaced, the chip is powered on to restart the high-frequency crystal oscillator.
In the implementation of the method, the RC clock is utilized to measure and calculate the starting frequency of the high-frequency crystal oscillator, and whether the high-frequency crystal oscillator reaches a stable state is judged; and the phase-locked loop is utilized to generate high-frequency crystal oscillator frequency division, and RC clock measuring and calculating frequency division is utilized to carry out secondary verification. Therefore, the RC clock is utilized to accurately calculate the time point from starting to complete stabilization of the high-frequency crystal oscillator, repeated experiments are not needed to obtain the starting time, resource waste is avoided to the greatest extent, and the chip crash probability is reduced.
Drawings
Fig. 1 is a schematic state diagram of a chip from a sleep period to a wake period according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a high-frequency crystal oscillator oscillation starting time provided in an embodiment of the present application;
fig. 3 is a flowchart of a crystal oscillator oscillation detection circuit provided in an embodiment of the present application.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the present application more apparent, the present application will be described in further detail with reference to the accompanying drawings.
The application scene of the crystal oscillator oscillation detection circuit of the embodiment of the application is described first, a certain time is needed from the start of the high-frequency crystal oscillator to the stable state, the chip can start to work after the high-frequency crystal oscillator starts to oscillate stably, and otherwise, the chip is likely to crash. Most of the existing schemes estimate the starting time (T) through repeated tests, so that the chip begins to work after a period of fixed delay. The defect of the solution is that the time required for starting to stabilize is different due to different crystal oscillator quality, so that the crystal oscillator can reach a stable state before the time T, and the working time of a chip is wasted; it is also possible that after the time T, the crystal oscillator still does not reach a stable state, and the chip begins to work to cause a dead halt; and each development board requires extensive testing to estimate time T. Therefore, in the embodiment of the application, the RC clock is utilized to accurately calculate the time point from starting to complete stabilization of the high-frequency crystal oscillator, repeated experiments are not needed to obtain the starting time, resource waste is avoided to the greatest extent, and the chip crash probability is reduced.
Firstly, the embodiment of the application detects the vibration of the high-frequency crystal oscillator (XTAL) from the starting state to the stable state by means of the low-frequency oscillator combined with the RC clock, and detects the counted vibration frequency of the high-frequency crystal oscillator (XTAL) from the starting state to the stable state for N times at the first time (T1); the high-frequency crystal oscillator (XTAL) after the vibration frequency is stable is subjected to frequency division. And (3) counting the frequency division vibration frequency for M times continuously after frequency division in the second time (T2) until the frequency division vibration frequency is stable, and starting the chip to operate.
Referring to fig. 1-2, the crystal oscillator oscillation detection circuit in the present application is used for calculating the oscillation frequency of the high-frequency crystal oscillator (XTAL) by using the RC oscillator that continuously works, and if the oscillation frequency is within a reasonable range, it is determined that the high-frequency crystal oscillator (XTAL) has achieved stable oscillation starting, and the chip begins to work. In order to ensure the reliability of stable starting of the high-frequency crystal oscillator (XTAL), repeated verification is carried out for a plurality of times so as to ensure the working stability of the chip to the greatest extent.
The single maximum time reference from the sleep period to the wake period of the chip is the first time (T1) plus the second time (T2), however, when the high-frequency crystal oscillator (XTAL) is detected to vibrate in the first time (T1) or the second time (T2) or to vibrate abnormally separately, the first time (T1) and the second time (T2) are repeatedly detected, so that the chip is ensured to operate in a stable state. Meanwhile, after the high-frequency crystal oscillator (XTAL) operates stably in the first time (T1), the frequency division of the high-frequency crystal oscillator (XTAL) is not needed after the detection of the first time (T1) is completed, so that the detection time is shortened. Similarly, after the frequency division vibration frequency of the high-frequency crystal oscillator (XTAL) is stable in the second time (T2), the chip is started after the second time (T2) is detected, so that the rated time detection caused by different quality is shortened, and the waste of starting time is avoided.
Referring to fig. 3, fig. 3 is a flowchart of a crystal oscillator oscillation detection circuit provided in an embodiment of the application. The crystal oscillator oscillation detection circuit comprises a first detection circuit and a second detection circuit which are used for detecting that a high-frequency crystal oscillator (XTAL) is from oscillation starting to stable. The first detection circuit detects the vibration frequency of the high-frequency crystal oscillator (XTAL) continuously for N times by using the RC clock in the first time (T1), and stops detecting when the two vibration frequencies in any period in the first time (T1) differ by a minimum value. The first detection circuit includes: a low frequency oscillator; the low frequency oscillator is continuously operated during the sleep period of the chip. The low frequency oscillator is connected with the RC clock and tracks the vibration frequency of the high frequency crystal oscillator (XTAL) in the first time (T1).
When any two adjacent vibration frequencies of the high-frequency crystal oscillator (XTAL) at the first time (T1) differ by a minimum value, the vibration frequency of the high-frequency crystal oscillator (XTAL) is determined to be stable. However, when the vibration frequency of the high-frequency crystal oscillator (XTAL) in the first time (T1) is not in a stable state, the chip enters a sleep period, and after a third time, the chip is powered up to restart the high-frequency crystal oscillator (XTAL).
As can be seen from the above description, when the frequency difference between two adjacent vibration frequencies in any period of the first time (T1) is the smallest, it is determined that the high-frequency crystal oscillator (XTAL) is in a stable running state, so that the high-frequency crystal oscillator (XTAL) can be subjected to frequency division detection again, and the detection duration is reduced. However, after the vibration frequency of the high-frequency crystal oscillator (XTAL) in the first time (T1) is detected, if the vibration frequency in the first time (T1) cannot meet the requirement for multiple times continuously, the starting of the high-frequency crystal oscillator (XTAL) is considered to be abnormal, the chip is allowed to enter the sleep period again at this time, the third time (duration of the sleep period) is increased along with the continuous abnormal times, and the high-frequency crystal oscillator (XTAL) is restarted after the third time is ended.
With continued reference to fig. 3, after the counted vibration frequency of the high frequency crystal oscillator (XTAL) reaches the requirement in the first time (T1), a second verification is added. The second verification adopts a high-frequency crystal oscillator (XTAL) with stable vibration frequency to divide the frequency by opening a phase-locked loop through a chip. The second detection circuit utilizes the frequency division vibration frequency of the high-frequency crystal oscillator (XTAL) of the RC clock pair to continuously detect M times in the second time (T2); the second detection circuit includes: a frequency division clock; the frequency division clock is connected with the RC clock and tracks the frequency division vibration frequency of the high-frequency crystal oscillator (XTAL) in the second time (T2).
When the frequency difference between the two frequency-divided vibration frequencies in any period within the second time (T2) is the minimum value, the second detection circuit stops detecting, and then the frequency-divided vibration frequency of the high-frequency crystal oscillator (XTAL) is judged to be stable, and the chip starts to start. However, when the frequency of the divided vibration of the high-frequency crystal oscillator (XTAL) is not in a stable state in the second time (T2), the divided clock is turned off and the high-frequency crystal oscillator (XTAL) is divided again. When the frequency division vibration frequency of the high-frequency crystal oscillator (XTAL) in the second time (T2) is not in a stable state, the chip enters a dormant period, and the chip is electrified to restart the high-frequency crystal oscillator (XTAL) after a third time interval.
As can be seen from the above description, when the frequency difference between the adjacent two sub-vibration frequencies in any period of the second time (T2) is the smallest, it is determined that the high-frequency crystal oscillator (XTAL) is in a stable operation state, so that the chip can operate and work, and the detection duration is reduced. However, after the detection of the frequency division vibration frequency of the high-frequency crystal oscillator (XTAL) in the second time (T2) is completed, the frequency division vibration frequency in the second time (T2) is continuously and repeatedly turned off, and the phase-locked loop is restarted after a period of time to re-judge the stability of the new frequency division clock. And when the frequency division clock does not reach a stable value after the repeated cycle detection, enabling the chip to enter a sleep period again, and waking up again after the third time is finished, so that the high-frequency crystal oscillator (XTAL) restarts.
In the implementation of the application, the RC clock is utilized to measure and calculate the starting frequency of the high-frequency crystal oscillator (XTAL) and judge whether the high-frequency crystal oscillator (XTAL) reaches a stable state or not; and the phase-locked loop is utilized to generate high-frequency crystal oscillator (XTAL) frequency division, and RC clock measures and calculates the frequency division to carry out secondary verification. Therefore, the RC clock is utilized to accurately calculate the time point from starting oscillation to complete stabilization of the high-frequency crystal oscillator (XTAL), repeated experiments are not needed to obtain the starting oscillation time, the resource waste is avoided to the greatest extent, and the chip crash probability is reduced.
The foregoing is merely specific embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily think about changes or substitutions within the technical scope of the present application, and the changes or substitutions are intended to be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (9)
1. The crystal oscillator oscillation detection circuit is characterized by comprising a first detection circuit and a second detection circuit, wherein the first detection circuit and the second detection circuit are used for detecting that the high-frequency crystal oscillator is from oscillation starting to stable; wherein,,
the first detection circuit detects the vibration frequency of the high-frequency crystal oscillator for multiple times by utilizing an RC clock in a first time, and stops detecting when the difference between the two vibration frequencies in any time period in the first time is a minimum value;
dividing the frequency of the high-frequency crystal oscillator with the vibration frequency in a stable state;
the second detection circuit detects the frequency division vibration frequency of the high-frequency crystal oscillator by utilizing the RC clock pair for multiple times in a second time, and stops detecting when the frequency division vibration frequency of the high-frequency crystal oscillator in any time period within the second time differs by a minimum value;
the first time and the second time are time references of the chip from the sleep period to the wake period.
2. The crystal oscillator oscillation detection circuit of claim 1, wherein the first detection circuit comprises: a low frequency oscillator;
the low-frequency oscillator is connected with the RC clock and tracks the vibration frequency of the high-frequency crystal oscillator in the first time.
3. The crystal oscillator oscillation detection circuit of claim 2, wherein the low frequency oscillator is continuously operated during a sleep period of the chip.
4. The crystal oscillator oscillation detection circuit of claim 3, wherein the chip enters a sleep period when the frequency of the high-frequency crystal oscillator is not in a steady state in the first time, and the chip is powered up to restart the high-frequency crystal oscillator after a third time.
5. The crystal oscillator oscillation detection circuit of claim 4, wherein the duration of the third time increases with a number of times the frequency of oscillation within the first time is not stationary.
6. The crystal oscillator oscillation detection circuit of claim 4, wherein the high-frequency crystal oscillator whose oscillation frequency is in a stationary state is divided by the chip opening phase-locked loop.
7. The crystal oscillator oscillation detection circuit of claim 6, wherein the second detection circuit comprises: a frequency division clock;
and the frequency division clock is connected with the RC clock and tracks the frequency division vibration frequency of the high-frequency crystal oscillator in the second time.
8. The crystal oscillator oscillation detection circuit of claim 7, wherein the divided clock is turned off and the high-frequency crystal oscillator is divided again when the divided oscillation frequency of the high-frequency crystal oscillator in the second time is not in a stationary state.
9. The crystal oscillator oscillation detection circuit of claim 8, wherein the chip enters a sleep period when the divided oscillation frequency of the high-frequency crystal oscillator is not in a stationary state for a plurality of times within the second time, and the chip is powered up to restart the high-frequency crystal oscillator after the third time is spaced.
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