CN114545186A - Multi-junction solar cell external quantum efficiency test system and test method - Google Patents
Multi-junction solar cell external quantum efficiency test system and test method Download PDFInfo
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- 229910000530 Gallium indium arsenide Inorganic materials 0.000 claims description 11
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Abstract
The invention discloses a multi-junction solar cell external quantum efficiency test system and a test method. The light path adjusting structure is used for adjusting an emergent light path of the light source, acquiring monochromatic light with a specific wavelength required by testing and controlling the beam radius of the monochromatic light; the first focusing lens is used for converting monochromatic light into parallel light; the laser is arranged on the side surface of an emergent light path of the light source and used for irradiating the multi-junction solar cell to be detected; the amplifier is electrically connected with the sample to be detected, and the processor is electrically connected with the amplifier. According to the requirements of the multi-junction solar cell during testing, the laser is arranged outside the light path to saturate the sub-cells with different band gaps in the solar cell structure, so that the complete spectral response of the multi-junction solar cell can be obtained.
Description
Technical Field
The invention relates to the technical field of photoelectric device testing, in particular to a multi-junction solar cell external quantum efficiency testing system and a testing method.
Background
In recent years, the solar photovoltaic power generation industry has grown rapidly, and the development of high-performance solar cells has become an important issue. For solar cells, an important and irreplaceable means of characterizing their device performance and understanding the spectral response of the cell is external quantum efficiency measurement. When monochromatic light with different wavelengths emitted from a monochromator is incident on the surface of a solar cell in an external quantum efficiency test, factors such as reflection and absorption of photons with different energy, collection efficiency of photon-generated carriers and the like of the solar cell can cause different short-circuit current densities to be generated under the condition of the same irradiance, and the ratio of the measured short-circuit current density to the irradiance, namely the ratio of collected electrons to the incident photon number can reflect the spectral response of a device to be measured.
In the prior art, a quantum efficiency testing system exists, which can carry out external quantum efficiency testing on a unijunction solar cell with a non-laminated structure, but cannot complete the testing on a multijunction solar cell. Because the current density of the multijunction solar cell is limited by the minimum current density of the sub-cell, when the current density of other sub-cells is greater than that of the test sub-cell, the corresponding spectrum of the tested sub-cell can be reflected. The conventional quantum efficiency testing system is applied to testing a multi-junction solar cell, and the condition that the output current signal belongs to which junction solar cell cannot be judged can occur.
The information disclosed in this background section is only for enhancement of understanding of the general background of the invention and should not be taken as an acknowledgement or any form of suggestion that this information forms the prior art already known to a person skilled in the art.
Disclosure of Invention
The invention aims to provide a multijunction solar cell external quantum efficiency testing system which can realize measurement of multijunction solar cell external quantum efficiency without limitation.
In order to achieve the above object, an embodiment of the present invention provides a multijunction solar cell external quantum efficiency testing system, which includes a light source, an optical path adjusting structure, a first focusing lens, a sample carrying structure, a laser, an amplifier, and a processor.
The light source provides illumination to enable the multi-junction solar cell to be tested to generate spectral response; the light path adjusting structure, the first focusing lens and the sample bearing structure are sequentially arranged on an emergent light path of the light source, and the light path adjusting structure is at least used for adjusting the emergent light path of the light source, acquiring monochromatic light with a specific wavelength required by testing and controlling the beam radius of the monochromatic light; the first focusing lens is at least used for converting monochromatic light obtained by the light path adjusting structure into parallel light; the sample bearing structure is used for fixing a sample to be tested, and the sample to be tested comprises a multi-junction solar cell to be tested; the laser is arranged on the side surface of an emergent light path of the light source, and comprises a plurality of lasers with different central wavelengths and is used for irradiating the multijunction solar cell to be tested and saturating other sub-cells of the multijunction solar cell except the sub-cell to be tested; the amplifier is electrically connected with the sample to be detected and used for amplifying the pulse current signal generated by the sample to be detected; and the processor is electrically connected with the amplifier and used for processing the pulse current signal to obtain the information of the sample to be detected.
In one or more embodiments of the present invention, the optical path adjusting structure includes a reflector, a beam splitter, and a diaphragm, and the reflector, the beam splitter, and the diaphragm are sequentially disposed on an outgoing optical path of the light source, where the beam splitter is disposed on a front focal plane of the first focusing lens.
In one or more embodiments of the invention, the amplifier is a lock-in amplifier, the beam splitter is a monochromator, and the light source is a xenon lamp.
In one or more embodiments of the present invention, the system for testing external quantum efficiency of a multijunction solar cell further includes a chopper, which is disposed on an exit light path between the light path adjusting structure and the first focusing lens, and is configured to convert continuous light emitted from the light source into pulsed light.
In one or more embodiments of the present invention, the multijunction solar cell external quantum efficiency test system further includes a second focusing lens, which is disposed on the light emitting path of the light source and behind the first focusing lens, and is configured to focus the pulsed light onto the surface of the sample to be tested.
In one or more embodiments of the present invention, the sample to be tested further includes a standard detector, and before testing the multi-junction solar cell to be tested, the standard detector is calibrated.
In one or more embodiments of the invention, the standard detector comprises a Si detector, a short wave InGaAs detector, an intrinsic InGaAs detector.
In one or more embodiments of the present invention, the sample supporting structure includes a sample clamp and a liftable sample support, the sample clamp is disposed on the liftable sample support, and the sample clamp is configured to fix the sample to be tested.
The embodiment of the invention also provides a method for testing the external quantum efficiency of the multi-junction solar cell, which comprises the following steps:
s1, enabling a light beam emitted by the light source to sequentially pass through the reflector, the light splitter, the diaphragm, the chopper, the first focusing lens and the second focusing lens and then irradiate the light beam on the standard detector, exciting the standard detector to enable the standard detector to generate response pulse current, amplifying the pulse current signal by the amplifier, receiving the pulse current signal amplified by the amplifier by the processor, and acquiring a standard response signal curve of the standard detector;
s2, replacing the standard detector with a multi-junction solar cell to be tested, turning on the laser and combining the lasers with different central wavelengths in the laser, so that the lasers can saturate other sub-cells except the sub-cell to be tested in the multi-junction solar cell, and the other sub-cells generate high saturation current;
s3, enabling light beams emitted by a light source to sequentially pass through a reflector, a light splitter, a diaphragm, a chopper, a first focusing lens and a second focusing lens and then irradiate on a multi-junction solar cell to be detected, exciting the multi-junction solar cell to generate response pulse current, wherein the response pulse current is the response pulse current of a sub-cell to be detected in the multi-junction solar cell, an amplifier amplifies a pulse current signal, and a processor receives the pulse current signal amplified by the amplifier and compares the pulse current signal with a current signal of a standard detector to obtain a spectral response curve of the sub-cell to be detected in the multi-junction solar cell;
and S4, sequentially measuring all the sub-cells in the multi-junction solar cell according to the step S3, and integrating the spectral response curves of all the sub-cells into one coordinate axis to obtain the external quantum efficiency response curve of the whole multi-junction solar cell.
In one or more embodiments of the present invention, the laser with multiple different central wavelengths of the laser may be freely combined when in use, so as to only saturate the sub-cells in the non-test state except the sub-cell to be tested in the multijunction solar cell according to the requirement, so that the current signal output by the multijunction solar cell under the irradiation of the light source belongs to the sub-cell to be tested.
Compared with the prior art, the multi-junction solar cell external quantum efficiency testing system provided by the embodiment of the invention has the advantages that according to the requirements of the multi-junction solar cell during testing, the lasers are arranged outside the light path, and the lasers with different central wavelengths in the external lasers are freely replaced and combined, so that the saturation of all the different band gap sub-cells which are not to be tested is realized, the multi-junction solar cell external quantum efficiency testing is completed, and the complete spectral response of the multi-junction solar cell is obtained.
Drawings
Fig. 1 is a schematic structural diagram of an external quantum efficiency testing system for a multi-junction solar cell according to an embodiment of the present invention;
FIG. 2 is a graph of the external quantum efficiency of a triple junction GaInP/GaAs/InGaAs solar cell in accordance with an embodiment of the present invention.
Detailed Description
The following detailed description of the present invention is provided in conjunction with the accompanying drawings, but it should be understood that the scope of the present invention is not limited to the specific embodiments.
Throughout the specification and claims, unless explicitly stated otherwise, the word "comprise", or variations such as "comprises" or "comprising", will be understood to imply the inclusion of a stated element or component but not the exclusion of any other element or component.
An embodiment of the invention provides a multi-junction solar cell external quantum efficiency test system, which can test External Quantum Efficiency (EQE) of a multi-junction solar cell with a laminated structure in a laser saturation mode.
As shown in fig. 1, the multijunction solar cell external quantum efficiency testing system includes a light source 1, an optical path adjusting structure 2, a first focusing lens 4, a laser 6, a sample carrying structure 7, an amplifier 9, and a processor 10. The light source 1 is used to provide illumination. The light path adjusting structure 2, the first focusing lens 4 and the sample bearing structure 7 are sequentially arranged on the emergent light path of the light source 1. The light path adjusting structure 2 is at least used for adjusting an emergent light path of the light source 1, obtaining monochromatic light with a specific wavelength required by a test and controlling the beam radius of the monochromatic light. The first focusing lens 4 is at least used for converting the monochromatic light obtained by the optical path adjusting structure 2 into parallel light. The sample bearing structure 7 is used for fixing a sample 8 to be tested, and the sample 8 to be tested comprises a multi-junction solar cell to be tested and a standard detector. The laser 6 is arranged on the side of the emitting light path of the light source 1, and the laser 8 comprises various lasers with different central wavelengths and is used for irradiating the multijunction solar cell to be tested and saturating other sub-cells of the multijunction solar cell except the sub-cell to be tested. The amplifier 9 is electrically connected to the sample 8 to be measured, and is used for amplifying the pulse current signal generated by the sample 8 to be measured. The processor 10 is electrically connected to the amplifier 9, and is configured to process the pulse current signal to obtain information of the sample 8.
The light path adjusting structure 2 comprises a reflector 21, a beam splitter 22 and a diaphragm 23, the reflector 21, the beam splitter 22 and the diaphragm 23 are sequentially arranged on the emergent light path of the light source 1, wherein the beam splitter 22 is arranged on the front focal plane of the first focusing lens 4, that is, the light emitted from the light source 1 sequentially passes through the reflector 21, the beam splitter 22, the diaphragm 23, the first focusing lens 4 and the sample bearing structure 7. The reflector 21 reflects the light emitted from the light source 1 to an entrance slit of the beam splitter 22, the beam splitter 22 is used for obtaining monochromatic light with a specific wavelength, and the diaphragm 23 controls the beam radius of the monochromatic light to ensure that the beam completely enters the first focusing lens 4. Preferably, the light source 1 may be a xenon lamp. In one embodiment, the beam splitter 22 can be a monochromator, preferably, the beam splitter 22 is a grating monochromator, and the first focusing lens 4 is used for converting the monochromatic light emitted from the exit slit of the grating monochromator into parallel light.
The sample bearing structure 7 comprises a liftable sample support 71 and a sample clamp 72, the sample clamp 72 is fixed on the liftable sample support 71, and the sample clamp 72 is used for fixing a sample 8 to be tested.
In one embodiment, the sample 8 to be tested is a semiconductor photoelectric material, and includes a standard detector and a multi-junction solar cell to be tested. Before testing the multi-junction solar cell, the standard detector needs to be tested and calibrated. The standard detectors comprise Si detectors, short-wave InGaAs detectors and intrinsic InGaAs detectors. The multijunction solar cell to be tested is formed by connecting a plurality of sub-cells in series, for example, the multijunction solar cell to be tested is a five-junction solar cell, namely, the multijunction solar cell to be tested has five sub-cells, each junction sub-cell has different response wave bands to a spectrum, and all the sub-cell responses are superposed to form the complete spectral response of the multijunction solar cell.
In a particular embodiment, the laser 6 comprises lasers of a plurality of different center wavelengths. The laser 6 is arranged on the side face of the light path, when the spectral response of a certain sub-cell of the multi-junction solar cell is tested, the emergent laser is directly emitted on the surface of the multi-junction solar cell, the current density of the multi-junction solar cell is limited by the minimum current density of the sub-cell, when the current density of other sub-cells is greater than the current density of the test sub-cell, the spectrum of the sub-cell to be tested is reflected correspondingly, the laser saturation of the sub-cell not to be tested can be realized by combining the lasers with different central wavelengths in the laser 6, and the output response signal belongs to the sub-cell to be tested. When calibrating the standard probe, the power supply of the laser 6 is off, i.e. no laser saturation is required when testing the standard probe.
The multijunction solar cell external quantum efficiency test system in the present embodiment further includes a chopper 3 and a second focusing lens 5. The chopper 3 is arranged on an emergent light path between the light path adjusting structure 2 and the first focusing lens 4, and the second focusing lens 5 is arranged on the emergent light path of the light source 1 and behind the first focusing lens 4. That is, the light emitted from the light source 1 passes through the reflector 21, the beam splitter 22, the diaphragm 23, the chopper 3, the first focusing lens 4, the second focusing lens 5, and the sample bearing structure 7 in sequence. The chopper 3 can convert continuous light emitted from the light source 1 into pulsed light. The second focusing lens 5 focuses the pulse light on the surface of the sample 8 to be detected, and excites the sample 8 to be detected to generate response pulse current.
In order to improve the quality of the signal, the amplifier 9 is a lock-in amplifier in this embodiment. The positive electrode and the negative electrode of the sample 8 to be detected are connected with the amplifier 9, the amplifier 9 amplifies a pulse current signal generated by the sample 8 to be detected and sends the amplified pulse current signal to the processor 10, and the processor 10 processes the current signal so as to obtain related information of the sample 8 to be detected, wherein the related information comprises spectral characteristics. Preferably, the processor 10 may be a computer.
The following describes in detail the testing process of the multi-junction solar cell external quantum efficiency testing system in this embodiment.
Taking the multi-junction solar cell to be tested as a five-junction solar cell as an example, when testing a certain sub-cell of the five-junction solar cell, firstly, a standard detector with the same response waveband as that of the sub-cell to be tested is measured. The standard detector is fixed on a sample clamp 72, a P pole and an N pole of the standard detector are connected with an amplifier 9 through a wire, a proper measuring range is selected on the amplifier 9, a light path is adjusted, a reflector 21 reflects light emitted by a light source 1 to an inlet slit of a light splitter 22, a diaphragm 23 controls the radius of a monochromatic light beam to ensure that the light beam completely enters a first focusing lens 4, a chopper 3 converts continuous light emitted by the light source 1 into pulsed light, the first focusing lens 4 is used for converting the monochromatic light emitted from the outlet slit of the light splitter 22 into parallel light, a second focusing lens 5 focuses the parallel pulsed light on the surface of the standard detector, and the standard detector is excited to generate response pulse current. The amplifier 9 amplifies the pulse current signal generated by the standard detector and sends the amplified pulse current signal to the processor 10, and the processor 10 processes and records the current signal of the standard detector to obtain a standard response signal curve of the standard detector.
And (3) taking off the standard detector, fixing the five-junction solar cell on the sample clamp 72, connecting the P pole and the N pole of the five-junction solar cell with the amplifier 9 through leads, and selecting a proper measuring range on the amplifier 9. The light path is adjusted, and the lasers with different central wavelengths in the laser 6 are combined, so that the opened lasers can saturate the sub-cells except the sub-cell to be tested, and the lasers are focused on the surface of the five-junction solar cell, so that all the sub-cells which are not to be tested in the five-junction solar cell are saturated, and high saturation current is generated. The reflector 21 reflects light emitted by the light source 1 to an entrance slit of the light splitter 22, the diaphragm 23 controls the radius of a monochromatic light beam to ensure that the light beam completely enters the first focusing lens 4, the chopper 3 converts continuous light emitted by the light source 1 into pulsed light, the first focusing lens 4 is used for converting the monochromatic light emitted by the exit slit of the light splitter 22 into parallel light, and the second focusing lens 5 focuses the parallel pulsed light on the surface of the five-junction solar cell to excite the five-junction solar cell to generate response pulse current. The five-junction solar cell finally outputs a sub-cell current signal with the lowest response, namely a current signal of the unsaturated sub-cell to be detected, the amplifier 9 amplifies a pulse current signal generated by the sub-cell to be detected and sends the amplified pulse current signal to the processor 10, and the processor 10 compares the current signal of the sub-cell to be detected with the current signal of the standard detector to obtain a spectral response curve of the sub-cell to be detected. After all the sub-cells are sequentially measured, the spectral response curves of all the sub-cells are integrated in one coordinate axis, and a complete external quantum efficiency response curve of the multi-junction solar cell is obtained.
The invention also provides a multi-junction solar cell external quantum efficiency testing method, which comprises the following steps: s1, a light beam emitted by the light source 1 sequentially passes through the reflector 21, the light splitter 22, the diaphragm 23, the chopper 3, the first focusing lens 4 and the second focusing lens 5 and then irradiates on the standard detector, the standard detector is excited to generate response pulse current, the amplifier 9 amplifies a pulse current signal, the processor 10 receives the pulse current signal amplified by the amplifier 9 and obtains a standard response signal curve of the standard detector; s2, replacing the standard detector with a multi-junction solar cell to be tested, turning on the laser 6 and combining the lasers with different central wavelengths in the laser 6, so that the lasers can saturate other sub-cells except the sub-cell to be tested in the multi-junction solar cell, and the other sub-cells generate high saturation current; s3, a light beam emitted by a light source 1 sequentially passes through a reflector 21, a light splitter 22, a diaphragm 23, a chopper 3, a first focusing lens 4 and a second focusing lens 5 and then irradiates on a multijunction solar cell to be detected, the multijunction solar cell is excited to generate a response pulse current, the response pulse current is the response pulse current of a sub-cell to be detected in the multijunction solar cell, an amplifier 9 amplifies a pulse current signal, and a processor 10 receives the pulse current signal amplified by the amplifier 9 and compares the pulse current signal with a current signal of a standard detector to obtain a spectral response curve of the sub-cell to be detected in the multijunction solar cell; and S4, sequentially measuring all the sub-cells in the multi-junction solar cell according to the step S3, and integrating the spectral response curves of all the sub-cells into one coordinate axis to obtain the external quantum efficiency response curve of the whole multi-junction solar cell.
When in use, the lasers with different central wavelengths of the laser 6 can be freely combined so as to only saturate the sub-cells in other non-test states except the sub-cell to be tested in the multi-junction solar cell according to requirements, so that the current signal output by the multi-junction solar cell under the irradiation of the light source belongs to the sub-cell to be tested.
As shown in FIG. 2, a three-junction GaInP/GaAs/InGaAs solar cell is taken as an example: the GaInP top cell mainly absorbs monochromatic light of about 300-700nm, the GaAs middle cell mainly absorbs monochromatic light of about 600-900nm, and the InGaAs bottom cell mainly absorbs monochromatic light of about 800-1400 nm. Under illumination, each junction sub-cell generates spectral response and outputs current, but finally, the current signal which is output by the whole solar cell and can be collected is the minimum current in all the sub-cells, namely, only the current signal of the sub-cell with the weakest response can be obtained, the current signal is compared with a standard detector, an external quantum efficiency curve of the junction sub-cell can be obtained, and the current density of the junction sub-cell is calculated according to the external quantum efficiency curve. In order to measure the response of each junction of the subcells in the stack, it is necessary to make it the lowest response junction of all subcells under test, i.e. saturate the other subcells with laser to make their subcell output current stronger. For example, when testing a 300-wavelength and 700 nm-wavelength GaInP top cell, laser irradiation is required to saturate GaAs and InGaAs subcells and let them output larger current, otherwise, because the GaAs and InGaAs subcells have lower response in this wavelength band, the output current signal must be one of them, and the spectral response of the real GaInP top cell cannot be obtained. After all the sub-cells are measured in sequence, the external quantum efficiency response of all the sub-cells is drawn in one coordinate axis, and then the complete external quantum efficiency response curve of one multi-junction solar cell can be obtained, as shown in fig. 2.
Compared with the prior art, the multi-junction solar cell external quantum efficiency testing system provided by the embodiment of the invention has the advantages that according to the requirements of the multi-junction solar cell during testing, the lasers are arranged outside the light path, and the lasers with different central wavelengths in the external lasers are freely replaced and combined, so that the saturation of all the different band gap sub-cells which are not to be tested is realized, the multi-junction solar cell external quantum efficiency testing is completed, and the complete spectral response of the multi-junction solar cell is obtained.
The foregoing descriptions of specific exemplary embodiments of the present invention have been presented for purposes of illustration and description. It is not intended to limit the invention to the precise form disclosed, and obviously many modifications and variations are possible in light of the above teaching. The exemplary embodiments were chosen and described in order to explain certain principles of the invention and its practical application to enable one skilled in the art to make and use various exemplary embodiments of the invention and various alternatives and modifications as are suited to the particular use contemplated. It is intended that the scope of the invention be defined by the claims and their equivalents.
Claims (10)
1. A multi-junction solar cell external quantum efficiency test system, comprising:
the light source provides illumination, and at least enables the multi-junction solar cell to be detected to generate spectral response;
the light path adjusting structure is arranged on an emergent light path of the light source and at least used for adjusting the emergent light path of the light source, acquiring monochromatic light with a specific wavelength required by a test and controlling the beam radius of the monochromatic light;
the first focusing lens is arranged on the emergent light path of the light source and behind the light path adjusting structure and at least used for converting monochromatic light acquired by the light path adjusting structure into parallel light;
the sample bearing structure is arranged on the emergent light path of the light source and behind the first focusing lens and used for fixing a sample to be detected, and the sample to be detected comprises a multi-junction solar cell to be detected;
the laser is arranged on the side surface of an emergent light path of the light source, comprises a plurality of lasers with different central wavelengths and is used for irradiating the multi-junction solar cell to be tested;
the amplifier is electrically connected with the sample to be detected and used for amplifying the pulse current signal generated by the sample to be detected; and
and the processor is electrically connected with the amplifier and used for processing the pulse current signal to acquire the information of the sample to be detected.
2. The system according to claim 1, wherein the optical path adjusting structure comprises a reflector, a beam splitter and a diaphragm, and the reflector, the beam splitter and the diaphragm are sequentially disposed on the outgoing optical path of the light source.
3. The multi-junction solar cell external quantum efficiency test system of claim 2, wherein the amplifier is a lock-in amplifier, the beam splitter is a monochromator, and the light source is a xenon lamp.
4. The multijunction solar cell external quantum efficiency test system of claim 1, further comprising a chopper disposed on an exit light path between the light path adjusting structure and the first focusing lens for converting continuous light exiting from the light source into pulsed light.
5. The multijunction solar cell external quantum efficiency testing system of claim 4, further comprising a second focusing lens disposed on the light exit path of the light source and behind the first focusing lens for focusing the pulsed light onto the surface of the sample to be tested.
6. The multijunction solar cell external quantum efficiency test system of claim 1, wherein the sample under test further comprises a standard detector, and the standard detector is calibrated before testing the multijunction solar cell under test.
7. The multijunction solar cell external quantum efficiency test system of claim 6, wherein the standard detector comprises a Si detector, a short-wave InGaAs detector, an intrinsic InGaAs detector.
8. The system according to claim 1, wherein the sample support structure comprises a sample holder and a liftable sample holder, the sample holder is disposed on the liftable sample holder, and the sample holder is used for fixing the sample to be tested.
9. A multi-junction solar cell external quantum efficiency test method is characterized by comprising the following steps:
s1, enabling a light beam emitted by the light source to sequentially pass through the reflector, the light splitter, the diaphragm, the chopper, the first focusing lens and the second focusing lens and then irradiate the light beam on the standard detector, exciting the standard detector to enable the standard detector to generate response pulse current, amplifying the pulse current signal by the amplifier, receiving the pulse current signal amplified by the amplifier by the processor, and acquiring a standard response signal curve of the standard detector;
s2, replacing the standard detector with a multi-junction solar cell to be tested, turning on the laser and combining the lasers with different central wavelengths in the laser, so that the lasers can saturate other sub-cells except the sub-cell to be tested in the multi-junction solar cell, and the other sub-cells generate high saturation current;
s3, enabling light beams emitted by a light source to sequentially pass through a reflector, a light splitter, a diaphragm, a chopper, a first focusing lens and a second focusing lens and then irradiate on a multi-junction solar cell to be detected, exciting the multi-junction solar cell to generate response pulse current, wherein the response pulse current is the response pulse current of a sub-cell to be detected in the multi-junction solar cell, an amplifier amplifies a pulse current signal, and a processor receives the pulse current signal amplified by the amplifier and compares the pulse current signal with a current signal of a standard detector to obtain a spectral response curve of the sub-cell to be detected in the multi-junction solar cell;
and S4, sequentially measuring all the sub-cells in the multi-junction solar cell according to the step S3, and integrating the spectral response curves of all the sub-cells into one coordinate axis to obtain the external quantum efficiency response curve of the whole multi-junction solar cell.
10. The method according to claim 9, wherein the lasers with different central wavelengths of the laser device can be freely combined during use, so as to saturate only the sub-cells in non-testing states except the sub-cell to be tested in the multi-junction solar cell according to the requirement, and thus the current signal output by the multi-junction solar cell under the irradiation of the light source belongs to the sub-cell to be tested.
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| CN117353660A (en) * | 2023-11-21 | 2024-01-05 | 北京卓立汉光仪器有限公司 | Multi-junction battery spectral responsivity test method and device |
| CN117353660B (en) * | 2023-11-21 | 2024-05-28 | 北京卓立汉光仪器有限公司 | Multi-junction battery spectral responsivity test method and device |
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