CN112737504B - Micro-area multispectral response photoelectric tester for multi-junction solar cell - Google Patents
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- 238000012360 testing method Methods 0.000 claims abstract description 65
- 230000003287 optical effect Effects 0.000 claims abstract description 42
- 238000003384 imaging method Methods 0.000 claims abstract description 14
- 238000012545 processing Methods 0.000 claims abstract description 13
- 238000000034 method Methods 0.000 claims abstract description 11
- 230000001360 synchronised effect Effects 0.000 claims abstract description 5
- 239000000523 sample Substances 0.000 claims description 16
- 238000010521 absorption reaction Methods 0.000 claims description 10
- 230000005284 excitation Effects 0.000 claims description 10
- 238000001228 spectrum Methods 0.000 claims description 9
- 238000005286 illumination Methods 0.000 claims description 8
- 230000005540 biological transmission Effects 0.000 claims description 5
- 238000006073 displacement reaction Methods 0.000 claims description 4
- 238000000605 extraction Methods 0.000 claims description 4
- 229910052736 halogen Inorganic materials 0.000 claims description 4
- 150000002367 halogens Chemical class 0.000 claims description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 4
- 229910052721 tungsten Inorganic materials 0.000 claims description 4
- 239000010937 tungsten Substances 0.000 claims description 4
- 230000003321 amplification Effects 0.000 claims description 3
- 238000004364 calculation method Methods 0.000 claims description 3
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 3
- 230000010287 polarization Effects 0.000 claims description 3
- 229910052724 xenon Inorganic materials 0.000 claims description 3
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 claims description 3
- 230000005693 optoelectronics Effects 0.000 claims 2
- 239000000835 fiber Substances 0.000 claims 1
- 238000010998 test method Methods 0.000 claims 1
- 238000012544 monitoring process Methods 0.000 abstract description 3
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 239000013078 crystal Substances 0.000 description 7
- 238000011160 research Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- 238000011161 development Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000002086 nanomaterial Substances 0.000 description 3
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- 238000012512 characterization method Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000000799 fluorescence microscopy Methods 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000006386 neutralization reaction Methods 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 238000004626 scanning electron microscopy Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- LAJZODKXOMJMPK-UHFFFAOYSA-N tellurium dioxide Chemical compound O=[Te]=O LAJZODKXOMJMPK-UHFFFAOYSA-N 0.000 description 1
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Abstract
The invention discloses a micro-area photoelectric tester of a multi-junction solar cell, which comprises a tunable laser module, a laser processing module, an optical chopper, a bias white light module, a filter plate group, a double-light-path optical microscope, a scanning module, a microscopic electrical fixture, a power supply and electrical testing unit and a standard cell. The tunable laser and laser processing module provides signal light for multi-junction cell micro-area testing, the signal light is modulated through the light beam chopping module, the bias white light module and the filter plate group provide bias light, the signal laser and the bias light are focused on the solar cell through the double-light-path optical microscope, the testing process is monitored through synchronous real-time imaging of the camera, and the microscopic electrical clamp is connected with the power supply and the electrical testing unit to provide testing of bias voltage and electrical signals. The instrument is characterized in that other shielding systems are not needed, real-time synchronous monitoring can be achieved, high precision and high speed are achieved, and the photovoltaic conversion characteristic test of the micro-area of the multi-junction solar cell with submicron spatial resolution and multispectral response can be achieved without damage.
Description
Technical Field
The invention relates to aMicro-area multispectral response photoelectric tester for multi-junction solar cellBelong toSolar energy Battery micro-zone testingThe technical field is as follows.
Background
With the overall promotion of carbon neutralization in various countries around the world, clean and renewable energy sources are paid much attention and supported by various countries around the world, wherein the development of solar cell technology is particularly rapid in recent years, the efficiency of the traditional cell is continuously optimized, a new material cell is continuously provided, and the research scale of a cell device is smaller and smaller. Because the efficiency limit of a single-junction cell is only 33%, most incident light energy cannot be effectively utilized and can be converted into other forms of energy such as heat energy, the development of a multi-junction cell is a necessary way for the research of a high-efficiency solar cell, a series of multi-junction cells such as a multi-junction gallium arsenide cell, a perovskite multi-junction cell, an organic multi-junction cell, a perovskite-silicon multi-junction cell and the like are proposed at present, the development is rapid, the experimental efficiency of the multi-junction solar cell reaches 47.1% by 4 months in 2020 (143 times of light condensation condition), and the strong development potential of the multi-junction solar cell is shown. At present, the photoelectric performance characterization of the multi-junction solar cell mostly stays in a macro scale, such as a macro multi-junction cell volt-ampere characteristic test, a quantum efficiency test and the like, and the test result of the macro scale reflects the average condition of the photoelectric performance of a larger area (generally larger than a millimeter scale), so that the research range of the multi-junction solar cell is limited.
Nanophotonics has been rapidly developed over the last two decades. Research shows that the efficiency of the multi-junction cell can be further improved by the light trapping structure on the micro-nano scale; defects and crystal grains existing in the film battery are usually in a micro-nano scale, and the establishment of the micro-nano scale defects and the influence of the crystal grain structure on the electrical characteristics of the device is of great importance for further designing better materials and process systems in the future. In addition, the common wavelength dependence of the photoresponse of the micro-nano structure is high, so that the photoelectric characteristics of the multi-junction battery can be really analyzed by a multi-spectral response testing means.
The microscopic characterization technology of the multi-junction cell mainly comprises a scanning electron microscopy and a cathode ray fluorescence imaging, the testing means provides shape information, material defect information and luminescence information on a microscopic scale, however, an electron beam can damage the surface of a device, and only the surface performance of the device can be analyzed due to the limited penetration depth of the electron beam.
Therefore, the micro-area nondestructive photoelectric testing technology of the multi-junction solar cell (the multi-junction solar cell is formed by connecting two or more sub-cells in series, and is a solar cell formed by connecting a plurality of PN junctions in series) still needs to be developed. Laser beam induced photocurrent is a nondestructive method for single junction solar cells, and in the technology, laser is generally used as signal excitation, and the photocurrent response of the device is recorded point by scanning the laser, so as to finally form a photocurrent image of a scanning area. If laser is introduced into a microscopic system, the spatial resolution of laser beam induced photocurrent imaging or scanning photocurrent spectrum can be greatly improved, the current micro-area laser induced photocurrent imaging technology can only be used for single junction batteries, the existing multi-junction batteries have the particularity that the junction sub-batteries are connected in series, the total current of a device is determined by the sub-battery with the lowest current, and therefore only a single beam of laser cannot meet the current matching condition of the batteries, and the micro-area test for accurately testing the multi-junction batteries cannot be realized. In order to realize the accurate extraction of the micro-area photoelectric signal of the multi-junction cell, the following technical problems need to be solved:
(1) in a microscopic system, a new scheme for testing a micro-area needs to be provided, so that the accurate test of the photocurrent signal of each junction sub-cell is realized. When testing the photocurrent of the sub-cell to be tested, the local area of other sub-cells needs to reach the current saturation condition, and the whole device needs to reach the proper bias condition.
(2) How to achieve simultaneous monitoring of the laser and the real-time position of the sample in microscopic testing? If white light illumination is adopted, additional bias current is brought by the white light illumination, even if a scheme of a current amplifier and a phase lock is adopted subsequently, the bias current also causes that the measuring range of the instruments needs to be selected in a large range, and the testing precision is sacrificed or even the instruments cannot be tested.
(3) The general wavelength dependence of the photoresponse of the micro-nano structure is high, so that a multispectral response micro-region testing means of the multi-junction battery is still to be developed.
Disclosure of Invention
The technical problem is as follows: the invention aims to provide a micro-area multispectral response photoelectric tester for a multi-junction solar cell, which solves the problems that how to design and realize a photoelectric performance tester with resolution reaching submicron order, aiming at the multi-junction solar cell, and the test requirements of synchronously monitoring the relative position of laser and a sample in real time, high precision, rapidness, nondestructive detection and the like are difficult to meet.
The technical scheme is as follows: the invention provides a micro-area multispectral response photoelectric tester for a multijunction solar cell, which utilizes the simultaneous micro-area focusing of signal light and bias light, selectively excites specific sub-cells by setting the filtering characteristics of a filter plate group, so that all the sub-cells except the sub-cell to be tested reach the current limiting condition, realizes the zero bias or slight reverse bias of the sub-cell to be tested by bias voltage, if the intensity of the control signal light is small, the bias light intensity is slightly large, the testing precision cannot be influenced, and the filtered bias light can be used as illumination, so that the photoelectric performance test of the multijunction cell and the real-time observation of the relative position of laser and a sample can be simultaneously realized, and further, a white light laser and an acousto-optic crystal are combined, and the wide-spectrum response of the cell and the micron-scale quantum efficiency can be researched. The resolution of the instrument can reach submicron level, other electromagnetic shielding systems are not needed, nondestructive detection is achieved, and an effective research scheme is provided for micro-area research of multi-junction batteries.
The invention relates to a micro-area multispectral response photoelectric tester for a multijunction solar cell, which comprises a tunable laser module, a laser processing module, an optical chopper, a bias white light module, a filter plate group, a double-light-path optical microscope, a scanning module, a microscopic electrical fixture, a power supply and electrical testing unit and a standard cell, wherein the tunable laser module is connected with the laser processing module; the tunable laser module and the laser processing module provide signal laser for the multijunction solar cell micro-area test, and the signal laser is modulated through an optical chopper; the bias white light module and the filter plate group provide bias light, signal laser and the bias light are simultaneously focused on a battery to be tested or a standard battery through the double-light-path optical microscope, excitation of optical signals is simultaneously realized, the micro-area test process of the solar battery is monitored in a mode of synchronous real-time imaging of a camera, the movement of the laser or the battery is realized through the scanning module, the multi-junction solar battery or the standard battery is fixed by the micro-electrical clamp, the positive electrode and the negative electrode of the multi-junction solar battery or the standard battery are in good electrical contact with the micro-electrical clamp, and the micro-electrical clamp is connected with the power supply and the electrical test unit to provide bias voltage and electrical signal test.
The testing process of the photoelectric tester comprises the following steps:
the first step is as follows: signal laser and bias light adjustment: firstly, fixing a multi-junction battery or a standard battery on a micro-electrical fixture to form good electrical contact, simultaneously focusing signal laser and bias light on the surface of a multi-junction solar battery through a reflector group and a micro objective of a double-optical-path optical microscope, and calling a certain sub-battery to be tested as a sub-battery to be tested; in order to accurately measure the photocurrent of the sub-battery to be measured, the light intensity and the wavelength range of the bias light are adjusted to enable other sub-batteries to have current response; adjusting the intensity of the signal laser to enable the sub-battery to be tested to reach a current limiting condition;
the second step is that: adjusting bias voltage: testing the photovoltage of the multi-junction solar cell under bias light irradiation through a power supply and an electrical test unit; providing bias voltage through a power supply and an electrical test unit to enable the sub-battery or the standard battery to be tested to reach zero bias;
the third step: when the quantum efficiency of the micro-area of the sub-battery to be tested is tested, the wavelength scanning of signal laser is further carried out through the tunable laser module, the current of the standard battery under different scanning wavelengths is firstly tested, then the signal laser is moved to the micro-scale area to be tested of the multi-junction solar battery through the scanning module, the photocurrent of the sub-battery to be tested during the wavelength scanning is extracted through the power supply and the electrical testing unit, and the quantum efficiency spectrum of the sub-battery to be tested is obtained through calculation;
when the photoelectric current imaging test of the microcell of the subcell is carried out, the scanning module is further used for realizing the spatial scanning of the signal laser on the sample, the photoelectric current data during the scanning is extracted through the power supply and the electric test unit, and the photoelectric current data of different spatial positions are made into photoelectric current images.
The tunable laser module is a white laser and an acousto-optic crystal and can output monochromatic lasers with different wavelengths.
The laser processing module is a beam collimating mirror, a polarizing film, a diaphragm, an optical filter or a combination thereof, so that the indexes of the processed signal laser such as divergence angle, monochromaticity, single polarization and the like are better.
The chopping frequency range of the optical chopper is between 100 Hz and 30000 Hz, and the optical chopper is used for modulating signal laser.
The bias white light module is as follows: a halogen tungsten lamp, a xenon lamp or a wide spectrum white light LED, the power range is 5W to 1000W.
The filter plate group is a high-pass filter, a low-pass filter, a band-stop filter or a combination of the high-pass filter, the low-pass filter, the band-pass filter and the band-stop filter, the transmission waveband of the filter plate group is designed for each junction sub-cell waveband of the multi-junction solar cell, when the sub-cell to be tested is tested, the absorption waveband of the sub-cell to be tested is the absorption or reflection waveband of the filter plate group, and the absorption wavebands of other sub-cells are transmission wavebands.
The double-light-path optical microscope is an infinite optical microscope system with a space light introducing function or a laser optical fiber introducing function, can simultaneously realize microscopic white light illumination and laser excitation, and a reflector group of the double-light-path optical microscope consists of partially transparent and partially reflective reflectors, wherein the magnification range of a microscope objective lens is 10-100 times, and a camera is a CCD (charge coupled device) or CMOS (complementary metal oxide semiconductor) imaging device.
The scanning module is an electric displacement table, a galvanometer or a digital micro-mirror device, and realizes the function of scanning the laser on the multi-junction solar cell.
The microscopic electrical fixture (8) is a four-wire electrical fixture or a four-wire electrical probe, the four wires are positive and negative electrodes of current and voltage respectively, and the electrode structure of the microscopic electrical fixture can form good electrical contact with the multijunction solar cell.
The electrical testing module is a current preamplifier, a phase-locked amplifier and a digital source meter, and realizes the functions of weak current amplification, extraction of modulated electrical signals under the excitation of modulated optical signals, bias voltage supply and data reading.
Has the advantages that:
1. a micro-area multispectral response photoelectric tester of a multi-junction solar cell on a submicron scale is provided, a double-light-path micro-area confocal excitation and illumination scheme of signal laser and bias light is adopted, the relative positions of laser and a sample can be synchronously monitored in real time, and high-precision, quick and nondestructive testing of quantum efficiency and photocurrent imaging of the micro-area multi-junction solar cell is realized.
2. The method for efficiently introducing the bias light and the bias voltage of the multi-junction solar cell on the micro-nano scale is provided, signal modulation is introduced on the basis, other shielding systems are not needed, and the photoelectric response of each junction sub-cell of the multi-junction cell in the sub-micron region can be accurately analyzed.
3. A scheme for multi-junction cell micro-region multi-wavelength response test is provided, the spectrum dimension of the test is increased on the basis of the space dimension, and an effective method is provided for comprehensive analysis of cell performance.
Drawings
Fig. 1 is a schematic diagram of a micro-area multi-spectral response photo-electric tester of the proposed multi-junction solar cell.
Fig. 2 is a flow chart of micro-region multi-spectral response photoelectric testing of a multi-junction solar cell.
Fig. 3 is a schematic diagram of the scanning path of the laser over the sample.
Fig. 4 is a schematic diagram of the testing principle of the triple junction solar cell.
The figure shows that: the device comprises a tunable laser module 1, a white light laser 11, an acousto-optic crystal 12, a laser processing module 2, a beam collimating mirror 21, a polarizer 22, a diaphragm 23, a light filter 24, an optical chopper 3, a bias white light module 4, a filter plate group 5, a dual-optical-path optical microscope 6, a reflector group 61, a microscope objective 62, a scanning module 7, a microscope electrical fixture 8, a power supply and electrical testing unit 9, a current preamplifier 91, a lock-in amplifier 92, a digital source meter 93, a standard battery 10, a first standard battery 101, a second standard battery 102 and a third standard battery 103.
Detailed Description
The technical solution of the present invention is further described below with reference to the accompanying drawings.
As shown in fig. 1, the micro-area multispectral response photoelectric tester for the multijunction solar cell of the present invention comprises a tunable laser module 1, a laser processing module 2, an optical chopper 3, a bias white light module 4, a filter sheet set 5, a dual-optical-path optical microscope 6, a scanning module 7, a microscopic electrical fixture 8, a power supply and electrical test unit 9, and a standard cell 10; the tunable laser module 1 and the laser processing module 2 provide signal laser for the multijunction solar cell micro-area test, and the signal laser is modulated by the optical chopper 3; the bias white light module 4 and the filter plate group 5 provide bias light, signal laser and the bias light are simultaneously focused on a battery to be tested or a standard battery 10 through the dual-optical-path optical microscope 6, excitation of optical signals is simultaneously realized, the micro-area test process of the solar battery is monitored in a synchronous real-time imaging mode through the camera 63, movement of the laser or the battery is realized through the scanning module 7, the multi-junction solar battery or the standard battery 10 is fixed by the micro-electrical clamp 8, the anode and the cathode of the multi-junction solar battery or the standard battery are in good electrical contact with the micro-electrical clamp 8, and the micro-electrical clamp 8 is connected with the power supply and the electrical test unit 9 to provide bias voltage and electrical signal test.
The tunable laser module 1 is composed of a white laser 11 and an acousto-optic crystal 12, and can output monochromatic lasers with different wavelengths. The laser processing module 2 can be a beam collimator 21, a polarizer 22, a diaphragm 23, a filter 24 or a combination of these elements, so that the indexes of divergence angle, monochromaticity, single polarization and the like of the processed signal laser are better. The chopping frequency range of the optical chopper 3 is between 100 Hz and 30000 Hz, and is used for modulating signal laser. The bias white light module 4 can be a halogen tungsten lamp, a xenon lamp or a wide spectrum white light LED with a power range of 5W to 1000W. The filter sheet group 5 is a high-pass, low-pass, band-stop filter or a combination thereof, the transmission waveband is designed for the waveband of the multi-junction sub-battery, when the sub-battery with a specific junction is tested, the absorption waveband of the junction sub-battery is free of the stopband of the filter, and the absorption wavebands of other junction sub-batteries are passbands. The double-light-path optical microscope 6 is an infinite optical microscope system with a space light introducing function or a laser optical fiber introducing function, can simultaneously introduce white light illumination and laser illumination, has a microscope objective with a magnification range of 10-100 times, and has a camera 63 which is a CCD or CMOS imaging device. The scanning module 7 can be an electric displacement table, a galvanometer or a digital micro-mirror device, and realizes the function of scanning the laser on the battery sample. The microscopic electrical fixture 8 is selected from an electrical fixture of a four-wire method (current and voltage positive and negative electrodes respectively) or an electrical probe of the four-wire method, and the electrode structure of the microscopic electrical fixture can form good electrical contact with a battery to be tested. The electrical testing module 9 is composed of a current preamplifier 91, a phase-locked amplifier 92 and a digital source meter 93, and realizes the functions of weak current amplification, extraction of modulated electrical signals under the excitation of modulated optical signals, bias voltage supply and data reading. The standard cell 10 is a calibrated, aged standard cell device whose spectral response is as consistent as possible with the multijunction cell to be tested.
The operation of the apparatus is described below with reference to fig. 3:
the system can realize the micro-area quantum efficiency test and the photocurrent imaging of each junction sub-cell of the multi-junction solar cell.
During testing, in order to make the sub-battery to be tested reach the current limiting condition,
the first step is as follows: signal laser and bias light adjustment: adjusting the wavelength range of the bias light to enable the current of other junction sub-cells to reach saturation; subsequently, bias voltage adjustment is performed:
the second step is that: and providing bias voltage through the power supply and the electrical test unit to ensure that the sub-battery to be tested reaches zero bias.
The third step: when the quantum efficiency of the micro-area of the sub-battery to be tested is tested, the wavelength scanning of signal laser is further carried out through the tunable laser module, the current of the standard battery under different scanning wavelengths is firstly tested, then the signal laser is moved to the micro-nano structure area interested by the multi-junction solar battery by using the scanning system, the photocurrent of the sub-battery to be tested during the wavelength scanning is tested and extracted, and the quantum efficiency spectrum of the sub-battery to be tested is obtained through calculation.
When the photocell micro-area photocurrent imaging test is carried out, the signal laser is further carried out spatial scanning on the sample through the scanning system, the scanning path can be snakelike scanning, as shown in figure 3, photocurrent data during scanning is extracted through the power supply and the electrical test unit, and the photocurrent data of different spatial positions are drawn into photocurrent images.
Example 1:
as shown in fig. 4, the tunable laser module 1 is composed of a white light laser and a tellurium dioxide crystal, single-wavelength laser generated by the module is collimated by a beam collimator 2 and then modulated by an optical chopper 3, and the chopping frequency of the chopper is 500 hz. The power of the bias white light module 4 formed by the halogen tungsten lamp is 50 watts, and the white light generated by the bias white light module and the laser enter the double-light-path optical microscope 6 together after passing through the filter plate group 5. The sample is a three-junction gallium arsenide solar cell, the microscopic electrical clamp 8 is fixed on the sample table, the microscopic electrical clamp 8 adopts a four-wire electrical clamp, and the positive and negative electrodes of the cell are in good electrical contact with the electrical clamp. When the sub-battery with a specific junction is tested, the absorption wave band of the junction battery is the stop band of the color filter by adjusting the filter sheet group 5, the absorption wave bands of other two junctions of batteries are the pass bands, and then the scanning module 7 formed by the electric displacement table is controlled to adjust the laser light spot to the sub-battery to be tested. The power supply provides bias voltage for the microscopic electrical fixture 8, when the laser scans a sample, a weak photo-generated current signal generated by the sample is extracted by a power supply and electrical testing unit 9 which is composed of a current preamplifier 91, a phase-locked amplifier 92 and a digital source meter 93: the current preamplifier 91 converts the voltage signal into a voltage signal, and the voltage signal is input into a lock-in amplifier 92, and data is read out by a digital source meter 93.
Claims (7)
1. A micro-area multispectral response photoelectric tester for a multi-junction solar cell is characterized by comprising a tunable laser module (1), a laser processing module (2), an optical chopper (3), a bias white light module (4), a filter plate group (5), a dual-optical-path optical microscope (6), a scanning module (7), a microscopic electrical fixture (8), a power supply and electrical testing unit (9) and a standard cell (10); the tunable laser module (1) and the laser processing module (2) provide signal laser for the multijunction solar cell micro-area test, and the signal laser is modulated by the optical chopper (3); the bias white light module (4) and the filter plate group (5) provide bias light, the signal laser and the bias light are simultaneously focused on a battery to be tested or a standard battery (10) through the dual-optical-path optical microscope (6), the excitation of optical signals is simultaneously realized, the micro-area test process of the solar battery is monitored in a synchronous real-time imaging mode through the camera (63), the movement of the laser or the battery is realized through the scanning module (7), the multi-junction solar battery or the standard battery (10) is fixed by the microscopic electrical fixture (8), the positive and negative electrodes of the multi-junction solar battery or the standard battery are in good electrical contact with the microscopic electrical fixture (8), and the microscopic electrical fixture (8) is connected with the power supply and electrical test unit (9) to provide the test of bias voltage and electrical signals;
the laser processing module (2) is a beam collimating mirror, a polarizing film, a diaphragm, an optical filter or a combination thereof, so that the indexes of the processed signal laser such as divergence angle, monochromaticity, single polarization and the like are better;
the chopping frequency range of the optical chopper (3) is between 100 Hz and 30000 Hz, and the optical chopper is used for modulating signal laser;
the bias white light module (4) is as follows: a halogen tungsten lamp, a xenon lamp or a wide spectrum white light LED, the power range is 5W to 1000W.
2. The micro-area multi-spectral response photovoltaic tester for a multijunction solar cell according to claim 1, wherein the photovoltaic tester test procedure is:
the first step is as follows: signal laser and bias light adjustment: firstly, fixing a multi-junction cell or a standard cell (10) on a micro-electrical clamp (8) to form good electrical contact, and simultaneously focusing signal laser and bias light on the surface of the multi-junction solar cell through a reflector group (61) and a micro objective lens (62) of a double-optical-path optical microscope (6), wherein the multi-junction solar cell is formed by connecting two or more sub-cells in series, is a multi-junction solar cell formed by connecting a plurality of PN junctions in series, and one sub-cell to be tested is called as a sub-cell to be tested; in order to accurately measure the photocurrent of the sub-battery to be measured, the light intensity and the wavelength range of the bias light are adjusted to enable other sub-batteries to have current response; adjusting the intensity of the signal laser to enable the sub-battery to be tested to reach a current limiting condition;
the second step is that: adjusting bias voltage: the photoelectric voltage of the multi-junction solar cell under bias light irradiation is tested through a power supply and electrical test unit (9); bias voltage is provided by a power supply and electrical test unit (9), so that the sub-battery or standard battery (10) to be tested reaches zero bias;
the third step: when the quantum efficiency of the micro-area of the sub-battery to be tested is tested, the wavelength scanning of signal laser is further carried out through the tunable laser module (1), the current of the standard battery (10) under different scanning wavelengths is firstly tested, then the signal laser is moved to the micro-scale area to be tested of the multi-junction solar battery by using the scanning module (7), the photocurrent of the sub-battery to be tested during the wavelength scanning is extracted through the power supply and the electrical testing unit (9), and the quantum efficiency spectrum of the sub-battery to be tested is obtained through calculation;
when the photoelectric current imaging test of the microcell of the subcell is carried out, the scanning module (7) is further used for realizing the spatial scanning of the signal laser on the sample, the power supply and the electric test unit (9) are used for extracting the photoelectric current data during the scanning, and the photoelectric current data of different spatial positions are made into photoelectric current images.
3. The micro-region multispectral response optoelectronic tester for a multijunction solar cell according to claim 1, wherein the filter sheet set (5) is a high-pass filter, a low-pass filter, a band-stop filter or a combination thereof, the transmission band of the filter sheet set is designed for each junction sub-cell band of the multijunction solar cell, when testing the sub-cell to be tested, the absorption band of the sub-cell to be tested is the absorption or reflection band of the filter sheet set, and the absorption bands of the other sub-cells are transmission bands.
4. The micro-area multispectral response photoelectric tester for the multijunction solar cell according to claim 1, wherein the dual-light-path optical microscope (6) is an infinite optical microscope system with a space light introducing function or a laser fiber introducing function, and can simultaneously realize microscopic white light illumination and laser excitation, a reflector group (61) of the dual-light-path optical microscope is formed by partially transparent and partially reflective reflectors, a microscope objective (62) has a magnification ranging from 10 times to 100 times, and a camera (63) is a CCD or CMOS imaging device.
5. The micro-area multispectral response photovoltaic tester for the multijunction solar cell according to claim 1, wherein the scanning module (7) is an electric displacement table, a galvanometer or a digital micro-mirror device, and realizes the function of scanning laser on the multijunction solar cell.
6. The micro-area multispectral response optoelectronic tester for a multijunction solar cell according to claim 1, wherein the microscopic electrical fixture (8) is a four-wire electrical fixture or a four-wire electrical probe, the four wires are positive and negative current and voltage respectively, and the electrode structure of the four-wire electrical fixture can form good electrical contact with the multijunction solar cell.
7. The micro-area multispectral response photovoltaic tester for the multijunction solar cell according to claim 1, wherein the electrical test module (9) is a current preamplifier, a phase-locked amplifier and a digital source meter, and has the functions of weak current amplification, extraction of modulated electrical signals under the excitation of modulated optical signals, bias voltage supply and data reading.
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| JP2020058190A (en) * | 2018-10-03 | 2020-04-09 | 日清紡メカトロニクス株式会社 | Mobile Raman analyzer |
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| JP2020058190A (en) * | 2018-10-03 | 2020-04-09 | 日清紡メカトロニクス株式会社 | Mobile Raman analyzer |
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