CN108462469B - Solar cell loss parameter measurement and analysis system and use method - Google Patents
Solar cell loss parameter measurement and analysis system and use method Download PDFInfo
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- 238000005259 measurement Methods 0.000 title claims abstract description 42
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- 238000002310 reflectometry Methods 0.000 claims abstract description 13
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- 238000013461 design Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000003595 spectral effect Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
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- 239000000969 carrier Substances 0.000 description 1
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- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
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- 238000009776 industrial production Methods 0.000 description 1
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- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
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- H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
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Abstract
A solar cell loss parameter measurement and analysis system and a using method thereof comprise a test light source, a convex lens, a chopper, a monochromator, a filtering system and a dark box; a standard sample test board, an integrating sphere and a temperature control sample room are arranged in the dark box, and the temperature control sample room is collinear with the filtering system; two guide rails are arranged between the light filtering system and the dark box; a first reflective mirror and a second reflective mirror, and a third reflective mirror and a fourth reflective mirror are respectively fixed on the guide rail; when the guide rail slides to the position where the first reflector is collinear with the temperature control sample chamber, reflected light of the second reflector enters the standard sample test platform; when the guide rail slides to the position where the third reflector is collinear with the temperature control sample chamber, the reflected light of the fourth reflector enters the integrating sphere; the standard sample test platform, the integrating sphere, the temperature control sample room and the chopper are respectively connected with the control system through the phase-locked amplifier. The invention can measure the standard solar cell panel and the solar cell panel to be measured, does not need to replace a measuring sample, and can obtain parameters such as reflectivity, quantum efficiency and the like.
Description
Technical Field
The invention relates to a solar cell parameter measuring system and a using method, in particular to a solar cell loss parameter measuring and analyzing system and a using method.
Background
With the rapid development of the photovoltaic industry, the cost of the solar cell is continuously reduced, and the photovoltaic power generation becomes an effective way for replacing the traditional fossil energy and relieving the energy crisis. Due to the limitations of the current industrial production process level, the current mass production of battery devices still has the problem of electrical loss in different degrees, which is different from the theoretical limit of conversion efficiency. Therefore, how to accurately find the cause of the battery loss through the characterization measurement also finds the key for improving the battery conversion efficiency. The quantum efficiency of the solar cell is a key index for measuring the performance of the solar cell device. By measuring the short-circuit current of the solar cell under monochromatic light scanning in a certain waveband, the corresponding quantum efficiency can be obtained so as to reflect the photoelectric conversion efficiency of the solar cell under different wavelengths. However, in the conventional solar cell characterization method, the measured result can only comprehensively feed back the performance of the whole cell device, which is the result of the comprehensive accumulation of various loss effects, but the specific reason of the loss of the solar cell cannot be obtained. It is therefore difficult to improve the battery manufacturing technique in a targeted manner. And further, the recombination behavior of current carriers in different interfaces and bodies of the battery device is analyzed by combining the reflectivity and the I-V characteristic curve, and the region where the battery loss occurs is found, so that the method has guiding significance for the improvement of the battery preparation process and the structure design.
Secondly, most of the existing test platform designs are single-light-path systems, which can only obtain data of a certain quantum efficiency of a sample to be tested, but cannot simultaneously obtain and process other related data of the cell under the same experimental condition, such as surface reflectivity, open-circuit voltage, short-circuit current, filling factor and the influence of temperature on the solar cell; and the analysis module and the graphic processing module are not provided for analyzing and feeding back the reason of the battery loss according to the measurement result. For the quantum efficiency and IV test part, although measurement approaches such as an alternating current method, a multi-step method and the like exist, the standard sample and the sample to be tested still need to be measured respectively in the methods, and the system influence caused by environment change in the measurement process due to sample replacement or time sequence cannot be eliminated. In addition, the influence of different illumination and temperature environments on the performance of the solar cell is a consideration factor for people to select the solar cell in different areas. The traditional test system has no corresponding measurement structure and design, and cannot realize the influence of temperature difference on parameters such as the quantum efficiency of the solar cell, which is also a defect.
Disclosure of Invention
The invention aims to provide a solar cell loss parameter measurement and analysis system and a using method, wherein the solar cell loss parameter measurement and analysis system can measure the quantum efficiency of a solar cell panel and can measure and analyze parameters such as surface reflectivity, open-circuit voltage, short-circuit current, filling factor and the like.
The invention solves the technical problems in the prior art by adopting the following technical scheme: a solar cell loss parameter measurement and analysis system comprises a test light source, a convex lens, a chopper, a monochromator and a filtering system, wherein the test light source, the convex lens, the chopper, the monochromator and the filtering system are positioned on the same light path; the measurement and analysis system also comprises a dark box and a phase-locked amplifier; the test light source, the convex lens, the chopper, the monochromator, the filtering system and the dark box are sequentially arranged on the test bed; the side wall of the dark box is provided with a light inlet slit at the position collinear with the light ray incidence ends of the standard sample test platform, the integrating sphere and the temperature control sample chamber, and the temperature control sample chamber and the light filtering system are arranged in a collinear way; two parallel slide rails are arranged between the filtering system and the camera bellows, guide rails are connected in the slide rails in a sliding manner, and the guide rails comprise a first light path adjusting guide rail and a second light path adjusting guide rail which are arranged between the filtering system and the camera bellows; reflectors are fixed on the first light path adjusting guide rail and the second light path adjusting guide rail, and the reflectors and the light filtering system are located on the same plane; the reflector comprises a first reflector and a second reflector which are fixed on the first light path adjusting guide rail, and a third reflector and a fourth reflector which are fixed on the second light path adjusting guide rail; the reflecting surfaces of the first reflector and the third reflector face the light filtering system; the reflecting surfaces of the second reflecting mirror and the fourth reflecting mirror face the first reflecting mirror and the third reflecting mirror respectively; when the first light path adjusting guide rail slides to the position where the first reflector is collinear with the temperature control sample chamber, reflected light of the second reflector is incident into a light incident end of the standard sample test board; when the second light path adjusting guide rail slides to the position where the third reflector is collinear with the temperature control sample chamber, reflected light of the fourth reflector is incident into a light incident hole of the integrating sphere; a bias light source and a standard light source are arranged on the side wall of the dark box; the light output ends of the standard sample test board, the integrating sphere and the temperature control sample chamber and the signal output end of the chopper are respectively connected with the phase-locked amplifier; the monochromator and the phase-locked amplifier are respectively connected with the control system.
The first reflector and the third reflector are obliquely fixed on the guide rail, and the first reflector, the third reflector and the collimated light output by the light filtering system form an angle of 45 degrees; the first reflective mirror and the second reflective mirror are arranged in parallel, and the third reflective mirror and the fourth reflective mirror are arranged in parallel; the distance between the first reflector and the second reflector is equal to the distance between the temperature control sample room and the standard sample test bench; the distance between the third reflector and the fourth reflector is equal to the distance between the integrating sphere and the temperature control sample chamber.
The control system comprises a central processing module, an instrument control module, a data acquisition module, a data analysis module and a graphic processing module; the instrument control module, the data acquisition module, the data analysis module and the graphic processing module are respectively connected with the central processing module; the instrument control module is in control connection with a grating stepping motor of the monochromator; and the signal output end of the phase-locked amplifier is connected with the data acquisition module.
The bias light source is arranged above the light inlet ends of the standard sample test platform and the temperature control sample chamber, and the standard light source is arranged above the light outlet end of the temperature control sample chamber.
And a light intensity and illumination tester is arranged at the light output end of the standard light source.
The filtering system is a filtering wheel consisting of a plurality of light intensity attenuation sheets.
A use method of a solar cell loss parameter measurement and analysis system comprises the following steps:
s1, calibrating the light path: sliding a first light path adjusting guide rail and a second light path adjusting guide rail of a solar cell loss parameter measuring and analyzing system to a position where a light filtering system and a reflector are not collinear, namely an initial position; and the light emitted by the test light source is emitted into the temperature control sample chamber through the convex lens, the chopper, the monochromator and the filtering system in sequence;
s2, placing a standard solar panel: placing a standard solar cell panel on a standard sample test bench;
s3, parameter measurement:
a1, surface reflectance measurement: placing the solar cell panel to be tested into an integrating sphere, controlling the first light path adjusting guide rail and the second light path adjusting guide rail to slide until only the third reflector is collinear with the filtering system and the temperature control sample chamber, starting a test light source, and controlling the wavelength of a monochromator to be 400-1200 nm by using a control system; controlling the attenuation amplitude of the light filtering system to the light intensity to be 1% -100%; the testing light emitted by the testing light source sequentially passes through the convex lens, the chopper, the monochromator, the filtering system, the third reflector and the fourth reflector, then the collimated monochromatic light is emitted to the light ray of the integrating sphere to be emitted into the hole, and then the collimated monochromatic light is input into the control system through the light ray output end of the integrating sphere through the phase-locked amplifier to obtain surface reflectivity data;
a2, quantum efficiency measurement: keeping starting the test light source, and controlling the wavelength of the monochromator to be 400nm-1200nm by using a control system; controlling the attenuation amplitude of the light filtering system to the light intensity to be 1% -100%; moving the solar cell panel to be tested from the integrating sphere to the temperature control sample chamber, and turning on a bias light source above the standard sample test platform and the temperature control sample chamber to enable the bias light source to emit to the standard sample test platform and the temperature control sample chamber respectively; the first light path adjusting guide rail and the second light path adjusting guide rail are controlled to slide to the collinear state of only the first reflector, the filtering system and the temperature control sample chamber, so that the testing light emitted by the testing light source sequentially passes through the convex lens, the chopper, the monochromator, the filtering system, the first reflector and the second reflector, then the collimated monochromatic light is emitted to the standard sample test board through the light inlet slit, and the spectrum of the testing light source is adjusted and analyzed by the control system to generate the wavelength and spectrum response relation of the standard solar panel; controlling the first light path adjusting guide rail and the second light path adjusting guide rail to slide to the initial positions so that collimated light emitted by the light filtering system directly irradiates the temperature control sample chamber, adjusting the spectrum of a test light source to generate the wavelength and spectrum response relation of the solar panel to be tested through the control system, and obtaining quantum efficiency data of the solar panel to be tested by the control system through comparing the wavelength and spectrum response relation of the standard solar panel with the wavelength and spectrum response relation of the solar panel to be tested and obtaining a curve for drawing the quantum efficiency and the wavelength;
a3, IV characteristic curve measurement: turning off the test light source and the bias light source; the standard light source is turned on, and the light intensity and illumination tester is controlled to adjust the illumination of the standard light source to 200-2Controlling the temperature of the temperature-controlled sample chamber to-40-60 +/-1 ℃, and measuring the electricity in the temperature-controlled sample chamber under different illumination and temperatures of the light sourceThe open-circuit voltage and the short-circuit current of the circuit system convert the switch of the circuit system into an I-V curve circuit, measure I-V characteristic curves under different illumination and temperature conditions, and obtain the filling factor through a data analysis module in the control system.
S4, data summarization and analysis: processing and summarizing the surface reflectivity data, the quantum efficiency data and the I-V characteristic curve obtained in the step S3 through a control system, uniformly outputting the surface reflectivity, the open-circuit voltage, the short-circuit current, the filling factor and the quantum efficiency of the solar cell panel to be detected, summarizing the data and drawing a curve; and finally, giving the reason for generating the battery loss to the summary result through a data analysis module in the control system.
The invention has the beneficial effects that: the invention adopts the double-light path design to simultaneously measure the standard solar cell panel and the solar cell panel to be measured, thereby saving the step of changing the measurement sample midway, and simultaneously recording various parameters such as reflectivity, quantum efficiency and the like in one-time light splitting scanning measurement of the light source. The method avoids the inaccuracy of the measurement result caused by environmental change and system disturbance in the measurement process such as sample replacement, time sequence measurement and the like. Therefore, the using method is more concise. Simultaneously under control system's cooperation, this system can measure solar cell panel surface reflection degree, open circuit voltage, short circuit current, fill factor to measure different temperatures, illumination intensity to solar cell panel's influence, compensatied the not enough of current device, provided abundanter reference data, very meaningful to analysis solar cell performance, the concrete factor that obtains the battery loss and produce, improve solar cell production technology.
Drawings
Fig. 1 is a schematic diagram of the system connection structure of the present invention.
Fig. 2 is a schematic diagram of the module connections of the control system of the present invention.
FIG. 3 is a schematic diagram of the state of the optical path during the surface reflectance measurement according to the present invention.
FIG. 4 is a diagram illustrating the state of the first optical path in the quantum efficiency measurement according to the present invention.
FIG. 5 is a diagram showing the state of the optical path in the second state of the quantum efficiency measurement according to the present invention.
FIG. 6 is a schematic diagram of the optical path state during the fill factor measurement according to the present invention.
In the figure, 1-test light source, 2-bias light source, 3-convex lens, 4-chopper, 5-monochromator, 6-filtering system, 7-temperature control sample room, 8-standard light source, 9-control system, 10-phase-locked amplifier, 11-integrating sphere, 12-standard sample test bench, 13-first light path adjusting guide rail, 14-second light path adjusting guide rail, 15-first reflector, 16-second reflector, 17-third reflector, 18-fourth reflector, 19-light inlet slit, 20-dark box, 21-light intensity illuminance tester, 22-solar cell panel to be tested, 23-standard solar cell panel, 91-central processing module, 92-instrument control module, 93-data acquisition module, 94-graphics processing module, 95-data analysis module.
Detailed Description
The invention is described below with reference to the accompanying drawings and the detailed description:
fig. 1 is a schematic diagram of a system connection structure of a solar cell loss parameter measurement and analysis system according to the present invention. A solar cell loss parameter measurement and analysis system comprises a test light source 1, a convex lens 3, a chopper 4, a monochromator 5 and a filter system 6, wherein the test light source 1, the convex lens 3, the chopper 4, the monochromator 5 and the filter system 6 are positioned on the same light path to realize wavelength splitting, and the filter system 6 is a filter wheel consisting of a plurality of light intensity attenuators.
The measurement and analysis system also comprises a dark box 20 and a phase-locked amplifier 10; a test light source 1, a convex lens 3, a chopper 4, a monochromator 5, a filtering system 6 and a dark box 20 are sequentially placed on a test bed; a standard sample test bench 12, an integrating sphere 11 and a temperature control sample chamber 7 are sequentially arranged in the dark box 20 in a parallel mode, a light inlet slit 19 is formed in the side wall of the dark box 20 corresponding to the standard sample test bench 12, the integrating sphere 11 and the temperature control sample chamber 7, and the temperature control sample chamber 7 and the filtering system 6 are arranged in a collinear mode; two parallel slide rails are arranged between the filtering system 6 and the camera bellows 20, and are connected with guide rails in a sliding manner, preferably, the guide rails can be controlled by a stepping motor to slide on the slide rails, and the guide rails comprise a first light path adjusting guide rail 13 and a second light path adjusting guide rail 14 which are sequentially arranged between the filtering system 6 and the camera bellows 20; reflectors are fixed on the first light path adjusting guide rail 13 and the second light path adjusting guide rail 14 and are positioned on the same plane with the filtering system 6; the reflective mirrors include a first reflective mirror 15, a second reflective mirror 16, a third reflective mirror 17, and a fourth reflective mirror 18, wherein the first reflective mirror 15 and the second reflective mirror 16 are fixed on the first optical path adjusting guide 13 in parallel with each other. Similarly, the third mirror 17 and the fourth mirror 18 are fixed to the second optical path adjustment guide 14 in parallel with each other. Meanwhile, the collimated light beams output by the first reflective mirror 15, the third reflective mirror 17 and the filtering system are obliquely fixed on the guide rail at an angle of 45 degrees, the reflecting surfaces of the first reflective mirror 15 and the third reflective mirror 17 face the filtering system 6, the reflecting surfaces of the second reflective mirror 16 and the fourth reflective mirror 18 face the first reflective mirror 15 and the third reflective mirror 17 respectively, so that the collimated light beams incident on the first reflective mirror 15 and the third reflective mirror 17 are reflected and then respectively incident on the second reflective mirror 16 and the fourth reflective mirror 18 at an incident angle of 45 degrees along the guide rail direction, and the final reflected light beams are horizontally incident into the dark box 20 after the reflection action of the second reflective mirror 16 and the fourth reflective mirror 18. The first light path adjusting guide rail 13 and the second light path adjusting guide rail 14 drive the reflector to slide on the slide rail, so that smooth switching of the system on two light paths is realized.
In order to ensure that the collimated light is accurately emitted into the test area through the reflector, the distance between the first reflector 15 and the second reflector 16 is equal to the distance between the temperature control sample room 7 and the standard sample test bench 12; the distance between the third reflector 17 and the fourth reflector 18 is equal to the distance between the integrating sphere 11 and the temperature control sample chamber 7; when the first light path adjusting guide rail 13 slides to the position where the first reflecting mirror 15 is collinear with the temperature control sample chamber 7, the reflected light of the second reflecting mirror 16 is collinear with the light incidence point of the standard sample test bench 12; when the second light path adjusting guide rail 14 slides to the position where the third reflector 17 is collinear with the temperature control sample chamber 7, the reflected light of the fourth reflector 18 is collinear with the light incident hole of the integrating sphere 11; a bias light source 2 and a standard light source 8 are arranged on the side wall of the camera bellows 20, wherein the bias light source 2 is arranged above the light inlet ends of the standard sample test platform 12 and the temperature control sample room 7, the standard light source 8 is arranged above the light outlet end of the temperature control sample room 7, a light intensity and illumination tester 21 is arranged at the light ray output end of the standard light source 8, the light intensity and illumination tester 21 is used for controlling the illumination intensity of the solar cell panel 22 to be tested, and meanwhile, the temperature of the solar cell panel 22 to be tested can be controlled by a circuit system of the temperature control sample room 7; the light output ends of the standard sample test platform 12, the integrating sphere 11 and the temperature control sample room 7 are respectively connected with a phase-locked amplifier 10, the signal output end of the chopper 4 is connected with the phase-locked amplifier 10, and the monochromator 5 and the phase-locked amplifier 10 are respectively connected with the control system 9.
FIG. 2 is a block diagram of the control system of the present invention. The control system 9 comprises a central processing module 91, an instrument control module 92, a data acquisition module 93, a data analysis module 95 and a graphic processing module 94; the instrument control module 92, the data acquisition module 93, the data analysis module 95 and the graphic processing module 94 are respectively connected with the central processing module 91; the instrument control module 92 is in control connection with a grating stepping motor of the monochromator 5; in order to improve the degree of automation and the convenience of operation, the instrument control module is also in control connection with a stepping motor for controlling the guide rail, a bias light source, a standard light source, a light intensity and illumination tester, a circuit system in a temperature control sample chamber and the like; the signal output end of the lock-in amplifier 10, the signal output end of the chopper 4, the bias light source, the standard light source, the light intensity and illumination tester, and the circuit system in the temperature control sample chamber, etc. can be connected with the data acquisition module 93, so as to control the parameters of them through the central processing module 91.
The basic principle of the solar cell loss parameter measurement and analysis system is as follows:
in the invention, a test light source 1 and a monochromator 5 provide monochromatic light for output, a light filtering system 6 can realize light intensity adjustment, and a lock-in amplifier 10 is used for reading signals of a solar panel and inputting the signals into a control system 9. The solar cell panel 22 to be measured and the standard solar cell panel 23 are both placed in the dark box 20 for measurement, and the calibrated standard solar cell panel 23 is used as a reference, and meanwhile, the solar cell panel 22 to be measured is measured. The intensity of the light reflected by the surface of the solar cell panel and the short-circuit current obtained by converting the intensity of the light are collected and processed, and a basis for analyzing the quantum efficiency of the solar cell panel is provided. In the testing process, light emitted by the testing light source 1 passes through the chopper 4 and then is changed into modulated light with certain frequency and then is emitted into the monochromator 5, meanwhile, the chopper 4 outputs a frequency reference signal to the lock-in amplifier 10, the lock-in amplifier 10 inputs the frequency reference signal into the control system 9, and the instrument control module 92 of the lock-in amplifier is controlled by the control system 9 to control the grating stepping motor of the monochromator 5 so as to generate monochromatic light with certain wavelength. The monochromatic light forms monochromatic modulation light to be emitted into a temperature control sample room 7 in a dark box 20 after a secondary spectrum is filtered by a filtering system 6, and meanwhile, a bias light source 2 irradiates a standard solar cell panel 23 and inputs information into a control system 9 through a phase-locked amplifier 10 to be used as reference data. The control system 9 calls the data acquisition module 93 and the data analysis module 95 to acquire and analyze the information transmitted by the phase-locked amplifier 10, so as to calculate and generate data such as corresponding wavelength and spectral response relation, surface reflectivity and the like, and the graph processing module 94 makes a curve on the generated data and outputs a loss analysis result.
A use method of a solar cell loss parameter measurement and analysis system comprises the following steps:
s1, calibrating the light path: sliding a first light path adjusting guide rail 13 and a second light path adjusting guide rail 14 of the solar cell loss parameter measuring and analyzing system to a position where the light filtering system 6 and the reflector are not collinear, namely an initial position; light rays emitted by the test light source 1 are emitted into a temperature control sample room 7 through a convex lens 3, a chopper 4, a monochromator 5 and a filtering system 6 in sequence;
s2, placing the standard solar panel 23: placing a standard solar panel 23 on a standard sample test bench 12;
s3, parameter measurement:
1. surface reflectance measurements (as shown in fig. 3): the solar cell panel 22 to be tested is put into the integrating sphere 11, and the first light path adjusting guide rail 13 and the second light path adjusting guide rail 14 are controlled to slide until only the third reflector 17 is collinear with the filtering system 6 and the temperature control sample chamber 7 (as shown in fig. 3). The testing light source 1 is started, so that the testing light emitted by the testing light source 1 sequentially passes through the convex lens 3, the chopper 4, the monochromator 5, the light filtering system 6, the third reflector 17 and the fourth reflector 18, then the collimated monochromatic light is emitted into the light ray incidence hole of the integrating sphere 11 through the light incidence slit 19 on the dark box 20, then the collimated monochromatic light is input into the data acquisition module 93 in the control system 9 through the light ray output end of the integrating sphere 11 through the lock-in amplifier 10, and the central processing module 91 calls the data analysis module 95 according to the signals acquired by the data acquisition module 93 to obtain the surface reflectivity measurement result.
2. Quantum efficiency measurements (as shown in fig. 4-5): starting a test light source 1, moving a solar cell panel 22 to be tested from an integrating sphere 11 to a temperature control sample chamber 7, and starting a bias light source 2 above a standard sample test platform 12 and the temperature control sample chamber 7 so as to enable the bias light source 2 to emit to the standard sample test platform 12 and the temperature control sample chamber 7 respectively; the first optical path adjustment guide 13 and the second optical path adjustment guide 14 are controlled to slide until only the first mirror 15 is in line with the filter system 6 and the temperature-controlled sample chamber 7 (as shown in fig. 4), so that the test light emitted by the test light source 1 sequentially passes through the convex lens 3, the chopper 4, the monochromator 5, the filter system 6, the first reflector 15 and the second reflector 16, then the collimated monochromatic light is emitted to the standard sample test bench 12 through the light inlet slit 19, since the light output ends of the standard sample test stations 12 are connected to the control system 9 through the lock-in amplifiers 10, therefore, the spectrum of the testing light source 1 is continuously adjusted, the control system 9 will collect the signal from the light output end of the standard sample testing platform 12 through the data collecting module 93, the wavelength and spectral response relation of the standard solar panel can be obtained after the wavelength and spectral response relation is sent to the central processing module 91 and is analyzed and processed by the central processing module 91 and the data analysis module 95; then, controlling the first light path adjusting guide rail 13 and the second light path adjusting guide rail 14 to slide to initial positions (as shown in fig. 5), so that collimated light emitted by the light filtering system 6 directly irradiates the temperature control sample chamber 7, adjusting the spectrum of the test light source 1, generating the wavelength and spectrum response relation of the solar panel to be tested through the control system 9, and the control system 9 obtains the quantum efficiency of the solar panel to be tested by comparing the wavelength and spectrum response relation of the standard solar panel with the wavelength and spectrum response relation of the solar panel to be tested, and obtaining a curve for drawing the quantum efficiency and wavelength;
in the process of surface reflectance measurement and quantum efficiency measurement, the wavelength of the monochromator 5 is preferably controlled to 300nm to 1200nm by the control system 9; the attenuation amplitude of the light intensity by the light filtering system 6 is controlled to be 1% -100%, and the preferred attenuation amplitude of the light intensity is controlled to be 20%; specifically, the data acquisition module 93 in the control system 9 acquires a frequency signal from the chopper 4, and the central control module controls the wavelength range of the monochromator 5 through the instrument control module 92 according to the frequency signal.
3. IV characteristic curve measurement (as shown in fig. 6): turning off the test light source 1 and the bias light source 2; the standard light source 8 is turned on, the light intensity and illumination tester 21 is controlled to adjust the illumination of the standard light source 8 to 200-2000W/m2Controlling the temperature of the temperature control sample room 7 to be-40-60 +/-1 ℃, measuring the open-circuit voltage and the short-circuit current of a circuit system in the temperature control sample room 7 under different light source illumination and temperatures, converting a switch of the circuit system into an I-V curve circuit, measuring an I-V characteristic curve under standard illumination, and obtaining a filling factor through a data analysis module 95 in the control system 9.
The preferred embodiment:
turning off the test light source 1 and the bias light source 2; the standard light source 8 is started, and the light intensity illumination tester is controlled to adjust the illumination of the standard light source 8 to 1000W/m2Controlling the temperature of the temperature control sample room 7 to reach 25 ℃, and measuring open-circuit voltage and short-circuit current in the circuit system; then the temperature is exchanged to reach 30 ℃, the circuit switch is converted into an I-V curve circuit, the I-V curve of 30 ℃ under the standard illumination is measured, and the phase-locked amplifier 10 and the control system 9 acquire and process data. Adjusting the illumination of the standard light source 8 to 2000W/m2The temperature is changed to 35 ℃, the circuit switch is converted into an I-V curve circuit, the I-V curve of 35 ℃ under standard illumination is measured, and the measured I-V curve and the measured filling factor are input into a control system 9 through a phase-locked amplifier 10 and processed to obtain the I-V curve and the filling factor.
S4, data summarization: the central processing module 91 in the control system 9 calls the data analysis module 95 to process and summarize the surface reflectivity data, the quantum efficiency data and the I-V characteristic curve obtained in S4, and uniformly outputs the analysis of the cause results generated by the surface reflectivity, the open-circuit voltage, the short-circuit current, the fill factor, the quantum efficiency and the battery loss of the solar cell panel 22 to be measured, and summarizes the data and draws a curve. The summary result is ultimately given by the data analysis module 95 in the control system 9 as the cause of the battery loss.
The foregoing is a more detailed description of the present invention in connection with specific preferred embodiments and is not intended to limit the practice of the invention to these embodiments. For those skilled in the art to which the invention pertains, several simple deductions or substitutions can be made without departing from the spirit of the invention, and all shall be considered as belonging to the protection scope of the invention.
Claims (4)
1. A solar cell loss parameter measurement and analysis system comprises a test light source, a convex lens, a chopper, a monochromator, a filtering system, a camera bellows and a lock-in amplifier, wherein the test light source, the convex lens, the chopper, the monochromator, the filtering system and the camera bellows are sequentially arranged on a test bench and positioned on the same light path; the monochromator and the phase-locked amplifier are respectively connected with the control system; the device is characterized in that a standard sample test bench, an integrating sphere and a temperature control sample chamber are sequentially arranged in a dark box in a parallel mode, a light inlet slit is formed in the side wall of the dark box at the position collinear with the light ray incidence ends of the standard sample test bench, the integrating sphere and the temperature control sample chamber, and the temperature control sample chamber and a light filtering system are arranged in a collinear mode; two parallel slide rails are arranged between the filtering system and the camera bellows, guide rails are connected in the slide rails in a sliding manner, and the guide rails comprise a first light path adjusting guide rail and a second light path adjusting guide rail which are arranged between the filtering system and the camera bellows; reflectors are fixed on the first light path adjusting guide rail and the second light path adjusting guide rail, and the reflectors and the light filtering system are located on the same plane; the reflector comprises a first reflector and a second reflector which are fixed on the first light path adjusting guide rail, and a third reflector and a fourth reflector which are fixed on the second light path adjusting guide rail; the reflecting surfaces of the first reflector and the third reflector face the light filtering system; the reflecting surfaces of the second reflecting mirror and the fourth reflecting mirror face the first reflecting mirror and the third reflecting mirror respectively; when the first light path adjusting guide rail slides to the position where the first reflector is collinear with the temperature control sample chamber, reflected light of the second reflector is incident into a light incident end of the standard sample test board; when the second light path adjusting guide rail slides to the position where the third reflector is collinear with the temperature control sample chamber, reflected light of the fourth reflector is incident into a light incident hole of the integrating sphere; a bias light source and a standard light source are arranged on the side wall of the camera bellows, the bias light source is arranged above the light inlet ends of the standard sample test board and the temperature control sample chamber, the standard light source is arranged above the light outlet end of the temperature control sample chamber, and the light output end of the standard light source is provided with a light intensity and illumination tester; the light output ends of the standard sample test board, the integrating sphere and the temperature control sample chamber and the signal output end of the chopper are respectively connected with the phase-locked amplifier;
in the testing process, light emitted by a testing light source is changed into modulated light with a certain frequency through a chopper and then is emitted into a monochromator, meanwhile, the chopper outputs a frequency reference signal to a phase-locked amplifier, the phase-locked amplifier inputs the frequency reference signal into a control system, and an instrument control module of the phase-locked amplifier is controlled by the control system to control a grating stepping motor of the monochromator, so that monochromatic light with a certain wavelength of 300nm-1200nm is generated; the monochromatic light forms monochromatic modulation light to be emitted into a temperature control sample chamber in a dark box after a secondary spectrum is filtered by a light filtering system, and meanwhile, a bias light source irradiates a standard solar panel and inputs information into a control system through a phase-locked amplifier to be used as reference data; the control system calls the data acquisition module and the data analysis module to acquire and analyze the information transmitted by the phase-locked amplifier, so that the corresponding wavelength and spectrum response relation and surface reflectivity data are generated through operation, the generated data are curved through the graphic processing module, and a loss analysis result is output.
2. The solar cell loss parameter measurement and analysis system of claim 1, wherein the first reflector and the third reflector are obliquely fixed on the guide rail, and the collimated light output by the first reflector, the third reflector and the light filtering system forms an angle of 45 degrees; the first reflective mirror and the second reflective mirror are arranged in parallel, and the third reflective mirror and the fourth reflective mirror are arranged in parallel; the distance between the first reflector and the second reflector is equal to the distance between the temperature control sample room and the standard sample test bench; the distance between the third reflector and the fourth reflector is equal to the distance between the integrating sphere and the temperature control sample chamber.
3. The solar cell loss parameter measurement and analysis system according to claim 1, wherein the control system comprises a central processing module, an instrument control module, a data acquisition module, a data analysis module and a graphic processing module; the instrument control module, the data acquisition module, the data analysis module and the graphic processing module are respectively connected with the central processing module; the instrument control module is in control connection with a grating stepping motor of the monochromator; and the signal output end of the phase-locked amplifier is connected with the data acquisition module.
4. The system of claim 1, wherein the filter system is a filter wheel comprising a plurality of light attenuation plates.
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| CN111063625B (en) * | 2019-12-16 | 2024-03-08 | 凯盛光伏材料有限公司 | Solar thin film photovoltaic module sub-band detection method |
| CN111664938A (en) * | 2020-06-11 | 2020-09-15 | 江南大学 | Method and device for measuring high-intensity monochromatic light irradiation |
| CN113809987A (en) * | 2021-08-25 | 2021-12-17 | 常州亚玛顿股份有限公司 | Method for improving quantum efficiency test accuracy of photovoltaic device |
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