CN108462469A - A kind of solar cell loss parameter measurement analysis system and application method - Google Patents
A kind of solar cell loss parameter measurement analysis system and application method Download PDFInfo
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- CN108462469A CN108462469A CN201810181884.3A CN201810181884A CN108462469A CN 108462469 A CN108462469 A CN 108462469A CN 201810181884 A CN201810181884 A CN 201810181884A CN 108462469 A CN108462469 A CN 108462469A
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- 238000004458 analytical method Methods 0.000 title claims abstract description 36
- 238000005259 measurement Methods 0.000 title claims abstract description 31
- 238000000034 method Methods 0.000 title claims abstract description 26
- 230000006727 cell loss Effects 0.000 title claims abstract description 10
- 239000013068 control sample Substances 0.000 claims abstract description 67
- 238000012360 testing method Methods 0.000 claims abstract description 52
- 239000000523 sample Substances 0.000 claims abstract description 43
- 238000002310 reflectometry Methods 0.000 claims abstract description 20
- 230000003287 optical effect Effects 0.000 claims description 54
- 238000005286 illumination Methods 0.000 claims description 26
- 238000012545 processing Methods 0.000 claims description 16
- 238000007405 data analysis Methods 0.000 claims description 15
- 230000004044 response Effects 0.000 claims description 12
- 230000003595 spectral effect Effects 0.000 claims description 12
- 238000002347 injection Methods 0.000 claims description 8
- 239000007924 injection Substances 0.000 claims description 8
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- 238000006243 chemical reaction Methods 0.000 claims description 6
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- 238000005516 engineering process Methods 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 230000002123 temporal effect Effects 0.000 description 2
- 241001269238 Data Species 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
- H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
A kind of solar cell loss parameter measurement analysis system and application method, including testing light source, convex lens, chopper, monochromator, filter system and camera bellows；There are standard sample testboard, integrating sphere, temperature control sample room in camera bellows, and temperature control sample room is conllinear with filter system；Two guide rails are equipped between filter system and camera bellows；Guide rail is respectively fixed with the first reflective mirror and the second reflective mirror, third reflective mirror and the 4th reflective mirror；When guide rail slide into the first reflective mirror it is conllinear with temperature control sample room when, the reflection light of the second reflective mirror injects standard sample testboard；When guide rail slide into third reflective mirror it is conllinear with temperature control sample room when, the reflection light of the 4th reflective mirror injects integrating sphere；Standard sample testboard, integrating sphere, temperature control sample room and chopper are connected by lock-in amplifier with control system respectively.The present invention can measure standard solar cells plate and solar panel to be measured, and nothing needs to change measurement sample, while the parameters such as reflectivity, quantum efficiency can be obtained.
Description
Technical field
The present invention relates to solar cell parameter measurement system and application method, parameter is lost in especially a kind of solar cell
Measuring and analysis system and application method.
Background technology
With the rapid development of photovoltaic industry, solar cell cost constantly declines, and photovoltaic generation becomes substitution conventional fossil
One effective way of the energy, alleviating energy crisis.Due to the limitation of current industrial production technological level, produce in enormous quantities at present
Battery device there are still different degrees of electrical losses problems, have gap with the theoretical limit of transfer efficiency.Therefore, how to lead to
It crosses characterization and measures the reason of accurately finding battery loss generation, also just have found the key for improving battery conversion efficiency.Sun electricity
The quantum efficiency in pond is to weigh a key index of solar cell device performance.By under the monochromatic optical scanning in certain wave band
Measurement to the short circuit current of solar cell can obtain corresponding quantum efficiency, to reflect it at different wavelengths
Photoelectric conversion efficiency.However, conventional solar cell characterizes method, the result measured can only broadly feed back entire battery device
The performance of part is the comprehensive accumulation of various loss effects as a result, can not but obtain the concrete reason of solar cell loss.Therefore
Also it is difficult to targetedly improve battery preparation technology.In turn, in conjunction with reflectivity, I-V characteristic curve, analysis battery device is not
Same interface, carrier in body material complex act, find the region that battery loss occurs, to the improvement of battery preparation technique,
Structure design has directive significance.
Secondly, existing most of Testing Platforms are mostly single light path system, can only obtain a certain amount of sample to be tested
The data of sub- efficiency, and can not other related datas of acquisition and treatment of battery under same experiment condition, such as table simultaneously
Face reflectivity, open-circuit voltage, short circuit current, fill factor, and influence of the temperature for solar cell；With less analysis
The reason of module feeds back battery loss with pattern process module to measurement result analysis.For quantum efficiency and IV test departments
Point, though having alternating current method, multistep processes etc. measures approach, still needs in these methods and distinguish standard sample and sample to be tested
It measures, cannot exclude replacement sample or temporal sequencing leads to the systematic influence brought in measurement process environmental change.
In addition, the influence of different illumination, temperature environment to battery performance, be the considerations of different regions people select solar cell because
Element.Legacy test system does not have corresponding measurement structure and design, cannot achieve about temperature difference to solar cell amount
The influence of the parameters such as sub- efficiency, this is also an existing defect.
Invention content
The quantum efficiency of solar panel can not only be measured but also can be to its table the object of the present invention is to provide a kind of
The solar cell loss parameter that the parameters such as face reflectivity, open-circuit voltage, short circuit current, fill factor are measured and analyzed is surveyed
Measure analysis system and application method.
The present invention solves technical solution used by prior art problem：A kind of solar cell loss parameter measurement analysis
System, including testing light source, convex lens, chopper, monochromator and filter system, and make testing light source, convex lens, copped wave
Device, monochromator and filter system are located in same light path；The measuring and analysis system further includes camera bellows and lock-in amplifier；It surveys
Examination light source, convex lens, chopper, monochromator, filter system and camera bellows are placed on testing stand successively；With parallel arranged in camera bellows
Mode successively be equipped with standard sample testboard, integrating sphere and temperature control sample room, camera bellows side wall with standard sample testboard,
Integrating sphere and the light of temperature control sample room are injected on the conllinear position in end and offer light inlet slot, and make the temperature control sample room
Collinearly it is arranged with filter system；It is equipped with two sliding rails disposed in parallel between filter system and camera bellows, is slidably connected in sliding rail
Guide rail, the guide rail include that the first optical path adjusting guide rail being set between filter system and camera bellows and the second optical path adjusting are led
Rail；It is fixed with reflective mirror on first optical path adjusting guide rail and the second optical path adjusting guide rail, and makes the reflective mirror and filter system
It is generally aligned in the same plane；The reflective mirror include the first reflective mirror being fixed on the first optical path adjusting guide rail and the second reflective mirror,
The third reflective mirror and the 4th reflective mirror being fixed on the second optical path adjusting guide rail；First reflective mirror, third reflective mirror it is reflective
Face is towards filter system；The reflecting surface of second reflective mirror and the 4th reflective mirror is respectively facing the first reflective mirror and third is reflective
Mirror；And make when the first optical path adjusting guide rail slide into the first reflective mirror it is conllinear with temperature control sample room when, the second reflective mirror it is anti-
Penetrate the light injection end that light injects standard sample testboard；When the second optical path adjusting guide rail slides into third reflective mirror and temperature control
When sample room is conllinear, the reflection light of the 4th reflective mirror injects the light injection aperture of integrating sphere；The side wall of the camera bellows is equipped with
Bias light source and standard sources；The letter of standard sample testboard, the light output end of integrating sphere and temperature control sample room and chopper
Number output end is connected with lock-in amplifier respectively；Monochromator, lock-in amplifier are connected with control system respectively.
First reflective mirror, third reflective mirror is oblique is fixed on guide rail, and makes the first reflective mirror, third reflective mirror
Collimated ray with filter system output is in 45 degree of angles；First reflective mirror is arranged in parallel with the second reflective mirror, third is reflective
Mirror is arranged in parallel with the 4th reflective mirror；The distance between first reflective mirror and the second reflective mirror and temperature control sample room and standard sample
The distance of testboard is equal；The distance between third reflective mirror and the 4th reflective mirror and integrating sphere and phase at a distance from temperature control sample room
Deng.
Control system includes central processing module, instrument controlling module, data acquisition module, data analysis module and figure
Shape processing module；Instrument controlling module, data acquisition module, data analysis module and pattern process module respectively with centre
Module is managed to be connected；The control connection of the grating stepper motor of the instrument controlling module and monochromator；The signal of lock-in amplifier is defeated
Outlet is connected with data acquisition module.
The bias light source is set to above standard sample testboard and the light inlet of temperature control sample room, standard sources setting
Above the light extraction end of temperature control sample room.
The light output end of the standard sources is equipped with light intensity illumination tester.
Filter system is the optical filter wheel of several light intensity attenuation pieces composition.
A kind of application method of solar cell loss parameter measurement analysis system, includes the following steps：
S1, calibration light path：Solar cell is lost to the first optical path adjusting guide rail and the second light path of parameter measurement analysis system
It adjusts guide rail and slides into filter system and the not conllinear position of reflective mirror, i.e. initial position；And the light for making testing light source send out
Line passes through convex lens, chopper, monochromator, filter system and injects temperature control sample room successively；
S2, standard solar cells plate is placed：Standard solar cells plate is placed on standard sample testboard；
S3, parameter measurement：
A1, surface reflectivity measure：Solar panel to be measured is put into integrating sphere, the first optical path adjusting guide rail and the are controlled
It is conllinear with filter system and temperature control sample room that two optical path adjusting guide rails slide into only third reflective mirror, opens testing light source, utilizes
The wavelength control of monochromator is 400nm-1200n by control system；It is 1%- to the attenuation amplitude of light intensity to control filter system
100%；So that the test light that sends out of testing light source successively planoconvex lens, chopper, monochromator, filter system through third reflective mirror,
By in the light injection aperture of collimated monochromatic light directive integrating sphere after 4th reflective mirror, then passed through by the light output end of integrating sphere
Lock-in amplifier input control system obtains surface reflectivity data；
A2, quantum efficiency measure：Keep it turning on testing light source, using control system by the wavelength control of monochromator be 400nm-
1200n；It is 1%-100% to the attenuation amplitude of light intensity to control filter system；Solar panel to be measured is moved from integrating sphere
To temperature control sample room, standard sample testboard is opened with the bias light source above temperature control sample room so that bias light source distinguishes directive
Standard sample testboard and temperature control sample room；It controls the first optical path adjusting guide rail and the second optical path adjusting guide rail slides into only first
Reflective mirror is conllinear with filter system and temperature control sample room so that the test light that sends out of testing light source successively planoconvex lens, chopper,
Collimated monochromatic light is passed through light inlet slot directive standard sample by monochromator, filter system after the first reflective mirror, the second reflective mirror again
Product testboard, adjusting testing light source spectrum generate being closed with spectral response for the wavelength of standard solar panels after control system analysis
System；It controls the first optical path adjusting guide rail and the second optical path adjusting guide rail slides into the initial position, so that filter system is sent out
Collimated ray direct irradiation to temperature control sample room, adjust the wave that testing light source spectrum generates solar panels to be measured through control system
Length and spectral response relationship, control system pass through the wavelength to standard solar panels and spectral response relationship and solar energy to be measured
The wavelength of plate obtains the quantum efficiency data of solar panels to be measured with the comparison of spectral response relationship, and obtains drawing quantum efficiency
With wavelength curve；
A3, IV characteristic curve measure：Close testing light source and bias light source；Standard sources is opened, light intensity illumination tester is controlled
To adjust standard sources illumination in 200-2000W/m2 ranges, the temperature of control temperature control sample room reaches -40-60 ± 1 DEG C, and
Different light illuminations and at a temperature of measure the open-circuit voltage and short circuit current of circuit system in temperature control sample room, by circuit system
Switch conversion is I-V curve circuit, the I-V characteristic curve under different illumination and temperature condition is measured, through the number in control system
Fill factor is obtained according to analysis module.
S4, data summarization and analysis：S3 is obtained by control system surface reflectivity data, quantum efficiency data and
I-V characteristic curve carries out processing and summarizes, it is unified export solar panel surface reflectivity to be measured, open-circuit voltage, short circuit current,
Fill factor, quantum efficiency, and to data summarization and draw curve；Eventually by the data analysis module in control system to converging
Overall result provides battery loss Producing reason.
The beneficial effects of the present invention are：The present invention using double light design can simultaneously to standard solar cells plate with
Solar panel to be measured measures, and save midway and change the step of measuring sample, while can be primary to light source
It is divided in scanning survey, while each parameter such as record reflectivity, quantum efficiency.It avoids and replaces sample, temporal priority is surveyed
The measurement result that environmental change, the system disturbance that amount sequence etc. generates in measurement process are brought is inaccurate.Therefore application method
It is more succinct.Simultaneously under the mating reaction of control system, this system can be to solar panel surface reflection degree, open circuit
Voltage, short circuit current, fill factor measure, and measure the influence of different temperatures, intensity of illumination for solar panel,
The deficiency for compensating for existing apparatus provides more rich reference data, for analysis solar cell properties, obtains battery damage
It is very significant to consume the material elements generated, improvement manufacture of solar cells technique.
Description of the drawings
Fig. 1 is the system attachment structure schematic diagram of the present invention.
Fig. 2 is the module connection diagram of control system in the present invention.
Fig. 3 is optical path states schematic diagram when surface reflectivity of the present invention measures.
Fig. 4 is the optical path states schematic diagram of state one when quantum efficiency of the present invention measures.
Fig. 5 is the optical path states schematic diagram of state two when quantum efficiency of the present invention measures.
Fig. 6 is optical path states schematic diagram when fill factor of the present invention measures.
In figure, 1- testing light sources, 2- bias light sources, 3- convex lenses, 4- choppers, 5- monochromators, 6- filter systems, 7- temperature
Control sample room, 8- standard sources, 9- control systems, 10- lock-in amplifiers, 11- integrating spheres, 12- standard samples testboard, 13-
First optical path adjusting guide rail, the second optical path adjustings of 14- guide rail, the first reflective mirrors of 15-, the second reflective mirrors of 16-, 17- thirds are reflective
Mirror, the 4th reflective mirrors of 18-, 19- light inlet slots, 20- camera bellows, 21- light intensity illumination testers, 22- solar panels to be measured,
23- standard solar cells plate, 91- central processing modules, 92- instrument controllings module, 93- data acquisition modules, at 94- figures
Manage module, 95- data analysis modules.
Specific implementation mode
Below in conjunction with the drawings and the specific embodiments, the present invention will be described：
Fig. 1 is the system attachment structure schematic diagram that parameter measurement analysis system is lost in a kind of solar cell of the present invention.One kind is too
Positive energy battery loss parameter measurement analysis system, including testing light source 1, convex lens 3, chopper 4, monochromator 5 and the system that filters
System 6, and testing light source 1, convex lens 3, chopper 4, monochromator 5 and filter system 6 is made to be located in same light path to realize wave
Long light splitting, wherein filter system 6 is the optical filter wheel being made of several light intensity attenuation pieces.
Measuring and analysis system further includes camera bellows 20 and lock-in amplifier 10；Testing light source 1, convex lens 3, chopper 4, monochrome
Instrument 5, filter system 6 and camera bellows 20 are placed on testing stand successively；It is equipped with standard in camera bellows 20 successively in a manner of parallel arranged
Sample test platform 12, integrating sphere 11 and temperature control sample room 7 correspond to standard sample testboard 12, integrating sphere on 20 side wall of camera bellows
11 and temperature control sample room 7 position on offer light inlet slot 19, and temperature control sample room 7 and filter system 6 is made collinearly to be arranged；
It is equipped with two sliding rails disposed in parallel between filter system 6 and camera bellows 20, slidably connects guide rail in sliding rail, it is preferable that guide rail
It it can be slided on sliding rail by step motor control, guide rail includes be set in turn between filter system 6 and camera bellows 20
One optical path adjusting guide rail 13 and the second optical path adjusting guide rail 14；On first optical path adjusting guide rail 13 and the second optical path adjusting guide rail 14
It is fixed with reflective mirror, and reflective mirror is made to be generally aligned in the same plane with filter system 6；Reflective mirror includes that the first reflective mirror 15, second is anti-
Light microscopic 16, third reflective mirror 17 and the 4th reflective mirror 18, wherein the first reflective mirror 15 and the second reflective mirror 16 are fixed on the first light
Road adjusts on guide rail 13 and is mutually parallel.Similarly, third reflective mirror 17 and the 4th reflective mirror 18 are fixed on the second optical path adjusting
On guide rail 14 and it is mutually parallel.Meanwhile first reflective mirror 15, third reflective mirror 17 and the collimated ray of filter system output are in 45
Degree angle is oblique be fixed on guide rail and the first reflective mirror 15, third reflective mirror 17 reflective surface towards 6 direction of filter system,
The reflecting surface of second reflective mirror 16 and the 4th reflective mirror 18 is respectively facing the first reflective mirror 15 and third reflective mirror 17, so as to inject
First reflective mirror 15 injects the respectively along guide rail direction with after the collimated ray reflection on third reflective mirror 17 with 45 degree of incidence angles
Two reflective mirrors 16 and the 4th reflective mirror 18, make after the reflex of the second reflective mirror 16 and the 4th reflective mirror 18 it is final
Reflection light level is injected in camera bellows 20.First optical path adjusting guide rail 13 and the second optical path adjusting guide rail 14 drive speculum in cunning
Sliding on rail realizes smooth switching of the system in two light paths.
To ensure that collimated ray accurately injects test zone through reflective mirror, between the first reflective mirror 15 and the second reflective mirror 16
Distance and temperature control sample room 7 it is equal at a distance from standard sample testboard 12；Third reflective mirror 17 and the 4th reflective mirror 18 it
Between distance and integrating sphere 11 it is equal at a distance from temperature control sample room 7；And to slide into the when the first optical path adjusting guide rail 13
When one reflective mirror 15 is conllinear with temperature control sample room 7, the light of the reflection light and standard sample testboard 12 of the second reflective mirror 16
It is conllinear to inject point；When the second optical path adjusting guide rail 14 slide into third reflective mirror 17 it is conllinear with temperature control sample room 7 when, the 4th is reflective
The reflection light of mirror 18 is conllinear with the light injection aperture of integrating sphere 11；The side wall of camera bellows 20 is equipped with bias light source 2 and standard light
Source 8, wherein bias light source 2 is set to above standard sample testboard 12 and the light inlet of temperature control sample room 7, and standard sources 8 is set
It is placed in above the light extraction end of temperature control sample room 7, the light output end of standard sources 8 is equipped with light intensity illumination tester 21, and light intensity is shone
Degree tester 21 is used to treat the control of the intensity of illumination of shoot the sun energy solar panel 22, meanwhile, the own circuit in temperature control sample room 7
System may be implemented to treat the temperature control of shoot the sun energy solar panel 22；Standard sample testboard 12, integrating sphere 11 and temperature control sample
The light output end of product room 7 is connected with lock-in amplifier 10 respectively, signal output end and the lock-in amplifier 10 of the chopper 4
It is connected, monochromator 5 is connected with control system 9 respectively with lock-in amplifier 10.
Fig. 2 is the module connection diagram of control system of the present invention.Control system 9 includes central processing module 91, instrument
Control module 92, data acquisition module 93, data analysis module 95 and pattern process module 94；Instrument controlling module 92, number
It is connected respectively with central processing module 91 according to acquisition module 93, data analysis module 95 and pattern process module 94；Instrument control
Molding block 92 and the grating stepper motor control of monochromator 5 connect；To improve the degree of automation and operation ease, instrument controlling
Module also with the electricity in the control stepper motor of guide rail, bias light source, standard sources, light intensity illumination tester and temperature control sample room
The controls such as road system connect；The signal output end of lock-in amplifier 10, the signal output end of chopper 4, bias light source, standard light
Circuit system in source, light intensity illumination tester and temperature control sample room etc. can be connected with data acquisition module 93, in order to logical
It crosses central processing module 91 and state modulator is carried out to them.
A kind of basic principle of solar cell loss parameter measurement analysis system of the present invention is as follows：
Monochromatic light output is provided by testing light source 1 and monochromator 5 in the present invention, filter system 6 can realize that light intensity regulating, locking phase are put
Big device 10 is for reading in signal and the input control system 9 of solar panel.By solar panel 22 to be measured and mark
Quasi- solar panel 23 is placed in camera bellows 20 and measures, 23 conduct of standard solar cells plate of use calibrated mistake
With reference to, while treating shoot the sun energy solar panel 22 and measuring.To the light intensity and its turn of solar panel surface reflection
The short circuit current for changing gained is collected, handles, and provides the foundation of analysis solar panel quantum efficiency.In test process
In, the light that testing light source 1 projects becomes having after chopper 4 modulation light of certain frequency to inject monochromator 5, cuts simultaneously
Wave device 4 exports a frequency reference signal to lock-in amplifier 10, which can be inputted and be controlled by lock-in amplifier 10
System 9 processed, and its instrument controlling module 92 is controlled by control system 9,5 grating stepper motor of monochromator is controlled, generate one
The monochromatic light of standing wave length.After the monochromatic light filters out second order spectrum by filter system 6, forms monochromatic modulation light and inject in camera bellows 20
Temperature control sample room 7, while bias light source 2 can be irradiated standard solar cells plate 23 and information is passed through lock-in amplifier
As with reference to data in 10 input control systems 9.Data acquisition module 93, data analysis module 95 are called by control system 9
The information that lock-in amplifier 10 transmits is acquired and is analyzed to which operation generates respective wavelength and spectral response relationship, surface
The data of generation are made curve, output loss analysis result by the data such as reflectivity by pattern process module 94.
A kind of application method of solar cell loss parameter measurement analysis system, includes the following steps：
S1, calibration light path：Solar cell is lost to the first optical path adjusting guide rail 13 and the second light of parameter measurement analysis system
Road adjusts guide rail 14 and slides into filter system 6 and the not conllinear position of reflective mirror, i.e. initial position；And testing light source 1 is made to send out
The light gone out passes through convex lens 3, chopper 4, monochromator 5, filter system 6 and injects temperature control sample room 7 successively；
S2, standard solar cells plate 23 is placed：Standard solar cells plate 23 is placed on standard sample testboard 12；
S3, parameter measurement：
1, surface reflectivity measures（As shown in Figure 3）：Solar panel 22 to be measured is put into integrating sphere 11, the first light is controlled
Road adjusts guide rail 13 and the second optical path adjusting guide rail 14 slides into only third reflective mirror 17 and filter system 6 and temperature control sample room 7
Collinearly（As shown in Figure 3）.Open testing light source 1 so that the test light that sends out of testing light source 1 successively planoconvex lens 3, chopper 4,
Collimated monochromatic light is passed through the entering light on camera bellows 20 by monochromator 5, filter system 6 after third reflective mirror 17, the 4th reflective mirror 18
Slit 19 is injected in the light injection aperture of integrating sphere 11, then defeated through lock-in amplifier 10 by the light output end of integrating sphere 11
Enter the data acquisition module 93 in control system 9, central processing module 91 is according to 93 collected signal tune of data acquisition module
With obtaining surface reflectivity measurement result in data analysis module 95.
2, quantum efficiency measures（As illustrated in figures 4-5）：Testing light source 1 is opened, by solar panel 22 to be measured from integral
Be moved to temperature control sample room 7 in ball 11, open the bias light source 2 of standard sample testboard 12 and 7 top of temperature control sample room so that
Bias light source 2 distinguishes directive standard sample testboard 12 and temperature control sample room 7；Control the first optical path adjusting guide rail 13 and the second light
It is conllinear with filter system 6 and temperature control sample room 7 that road adjusting guide rail 14 slides into only the first reflective mirror 15（As shown in Figure 4）, so that
The test light that testing light source 1 is sent out successively planoconvex lens 3, chopper 4, monochromator 5, filter system 6 again through the first reflective mirror 15,
By collimated monochromatic light by 19 directive standard sample testboard 12 of light inlet slot after second reflective mirror 16, since standard sample is tested
The light output end of platform 12 is connected by lock-in amplifier 10 with control system 9, therefore the light of constantly regulate testing light source 1
Spectrum, control system 9 can collect what the light output end from standard sample testboard 12 was sent out by data acquisition module 93
Signal, and central processing module 91 is sent it to, after central processing module 91 calls 95 analyzing processing of data analysis module
Can be obtained the wavelength of standard solar panels with spectral response relationship；Then, the first optical path adjusting guide rail 13 and second is controlled
Optical path adjusting guide rail 14 slides into initial position（As shown in Figure 5）, so that the collimated ray direct irradiation that filter system 6 is sent out is extremely
Temperature control sample room 7, the spectrum for adjusting testing light source 1 produces the wavelength of solar panels to be measured through control system 9 and spectrum is rung
It should be related to, the wavelength with spectral response relationship and solar panels to be measured that control system 9 passes through the wavelength to standard solar panels
Comparison with spectral response relationship obtains the quantum efficiency of solar panels to be measured, and obtains drawing quantum efficiency and wavelength curve；
During surface reflectivity measures and quantum efficiency measures, preferably by control system 9 by the wavelength control of monochromator 5
It is made as 300nm-1200n；It is 1%-100% to the attenuation amplitude of light intensity to control filter system 6, preferably the attenuation amplitude control of light intensity
It is 20%；Specifically, the data acquisition module 93 in control system 9 collects the frequency signal from chopper 4, center control
Module controls the wave-length coverage of monochromator 5 according to the frequency signal by instrument controlling module 92.
3, IV characteristic curves measure（As shown in Figure 6）：Close testing light source 1 and bias light source 2；Open standard sources 8, control
Light intensity illumination tester 21 processed is to adjust 8 illumination of standard sources in 200-2000W/m2 ranges, the temperature of control temperature control sample room 7
Reach -40-60 ± 1 DEG C, and different light illuminations and at a temperature of measure the open-circuit voltage of circuit system in temperature control sample room 7 with
The switch conversion of circuit system is I-V curve circuit, measures the I-V characteristic curve under standard illumination by short circuit current, through control
Data analysis module 95 in system 9 obtains fill factor.
Preferred embodiment：
Close testing light source 1 and bias light source 2；Standard sources 8 is opened, control light intensity illumination tester is to adjust standard sources 8
The temperature of illumination 1000W/m2, control temperature control sample room 7 reach 25 DEG C, and the open-circuit voltage in measuring circuit system and short circuit electricity
Stream；Then exchanging temperature makes temperature reach 30 DEG C, and contactor is transformed into I-V curve circuit, measures 30 under standard illumination
DEG C I-V curve, and acquired by lock-in amplifier 10 and control system 9 and handle data.Adjustment 8 illumination of standard sources arrives
2000W/m2, exchanging temperature makes temperature reach 35 DEG C, and contactor is transformed into I-V curve circuit, is measured under standard illumination
35 DEG C of I-V curve, and obtain I-V curve and fill factor by being handled in 10 input control system 9 of lock-in amplifier.
S4, data summarization：Call data analysis module 95 to being obtained in S4 by the central processing module 91 in control system 9
To surface reflectivity data, quantum efficiency data and I-V characteristic curve carry out processing and summarize, and unified export solar energy to be measured
22 surface reflectivity of solar panel, open-circuit voltage, short circuit current, fill factor, quantum efficiency and battery loss Producing reason knot
Fruit is analyzed, and to data summarization and draws curve.Summarized results is given eventually by the data analysis module 95 in control system 9
Go out battery loss Producing reason.
The above content is combine specific optimal technical scheme it is made for the present invention be further described, and it cannot be said that
The specific implementation of the present invention is confined to these explanations.For those of ordinary skill in the art to which the present invention belongs, exist
Under the premise of not departing from present inventive concept, a number of simple deductions or replacements can also be made, all shall be regarded as belonging to the present invention's
Protection domain.
Claims (7)
1. a kind of solar cell be lost parameter measurement analysis system, including testing light source, convex lens, chopper, monochromator with
And filter system, and testing light source, convex lens, chopper, monochromator and filter system is made to be located in same light path；Its feature
It is, the measuring and analysis system further includes camera bellows and lock-in amplifier；Testing light source, convex lens, chopper, monochromator, filter
Photosystem and camera bellows are placed on testing stand successively；In camera bellows in a manner of parallel arranged successively be equipped with standard sample testboard,
Integrating sphere and temperature control sample room, camera bellows side wall are penetrated in the light with standard sample testboard, integrating sphere and temperature control sample room
Enter to hold and offer light inlet slot on conllinear position, and the temperature control sample room is made collinearly to be arranged with filter system；Filter system
It is equipped with two sliding rails disposed in parallel between camera bellows, guide rail is slidably connected in sliding rail, the guide rail includes being set to optical filtering
The first optical path adjusting guide rail between system and camera bellows and the second optical path adjusting guide rail；First optical path adjusting guide rail and the second light path
It adjusts and is fixed with reflective mirror on guide rail, and the reflective mirror is made to be generally aligned in the same plane with filter system；The reflective mirror includes solid
Due to the first reflective mirror and the second reflective mirror, the third that is fixed on the second optical path adjusting guide rail on the first optical path adjusting guide rail
Reflective mirror and the 4th reflective mirror；First reflective mirror, third reflective mirror reflective surface towards filter system；Second reflective mirror and
The reflecting surface of four reflective mirrors is respectively facing the first reflective mirror and third reflective mirror；And to slide into when the first optical path adjusting guide rail
When first reflective mirror is conllinear with temperature control sample room, the reflection light of the second reflective mirror injects the light injection of standard sample testboard
End；When the second optical path adjusting guide rail slide into third reflective mirror it is conllinear with temperature control sample room when, the reflection light of the 4th reflective mirror
Inject the light injection aperture of integrating sphere；The side wall of the camera bellows is equipped with bias light source and standard sources；Standard sample testboard,
The signal output end of the light output end and chopper of integrating sphere and temperature control sample room is connected with lock-in amplifier respectively；It is monochromatic
Instrument, lock-in amplifier are connected with control system respectively.
2. parameter measurement analysis system is lost in a kind of solar cell according to claim 1, which is characterized in that described the
One reflective mirror, third reflective mirror is oblique is fixed on guide rail, and makes the first reflective mirror, third reflective mirror and filter system output
Collimated ray be in 45 degree of angles；First reflective mirror and the second reflective mirror be arranged in parallel, third reflective mirror and the 4th reflective mirror
It is arranged in parallel；The distance between first reflective mirror and the second reflective mirror and temperature control sample room and phase at a distance from standard sample testboard
Deng；The distance between third reflective mirror and the 4th reflective mirror and integrating sphere are equal at a distance from temperature control sample room.
3. parameter measurement analysis system is lost in a kind of solar cell according to claim 1, which is characterized in that control system
System includes central processing module, instrument controlling module, data acquisition module, data analysis module and pattern process module；Instrument
Device control module, data acquisition module, data analysis module and pattern process module are connected with central processing module respectively；Institute
The grating stepper motor control for stating instrument controlling module and monochromator connects；The signal output end of lock-in amplifier is acquired with data
Module is connected.
4. parameter measurement analysis system is lost in a kind of solar cell according to claim 1, which is characterized in that described
Bias light source is set to above standard sample testboard and the light inlet of temperature control sample room, and standard sources is set to temperature control sample room
Light extraction end above.
5. parameter measurement analysis system is lost in a kind of solar cell according to claim 1, which is characterized in that the mark
The light output end in quasi-optical source is equipped with light intensity illumination tester.
6. parameter measurement analysis system is lost in a kind of solar cell according to claim 1, which is characterized in that filter system
System is the optical filter wheel of several light intensity attenuation pieces composition.
7. a kind of application method of solar cell loss parameter measurement analysis system according to claim 1, feature
It is, includes the following steps：
S1, calibration light path：Solar cell is lost to the first optical path adjusting guide rail and the second light path of parameter measurement analysis system
It adjusts guide rail and slides into filter system and the not conllinear position of reflective mirror, i.e. initial position；And the light for making testing light source send out
Line passes through convex lens, chopper, monochromator, filter system and injects temperature control sample room successively；
S2, standard solar cells plate is placed：Standard solar cells plate is placed on standard sample testboard；
S3, parameter measurement：
A1, surface reflectivity measure：Solar panel to be measured is put into integrating sphere, the first optical path adjusting guide rail and the are controlled
It is conllinear with filter system and temperature control sample room that two optical path adjusting guide rails slide into only third reflective mirror, opens testing light source, utilizes
The wavelength control of monochromator is 400nm-1200n by control system；It is 1%- to the attenuation amplitude of light intensity to control filter system
100%；So that the test light that sends out of testing light source successively planoconvex lens, chopper, monochromator, filter system through third reflective mirror,
By in the light injection aperture of collimated monochromatic light directive integrating sphere after 4th reflective mirror, then passed through by the light output end of integrating sphere
Lock-in amplifier input control system obtains surface reflectivity data；
A2, quantum efficiency measure：Keep it turning on testing light source, using control system by the wavelength control of monochromator be 400nm-
1200n；It is 1%-100% to the attenuation amplitude of light intensity to control filter system；Solar panel to be measured is moved from integrating sphere
To temperature control sample room, standard sample testboard is opened with the bias light source above temperature control sample room so that bias light source distinguishes directive
Standard sample testboard and temperature control sample room；It controls the first optical path adjusting guide rail and the second optical path adjusting guide rail slides into only first
Reflective mirror is conllinear with filter system and temperature control sample room so that the test light that sends out of testing light source successively planoconvex lens, chopper,
Collimated monochromatic light is passed through light inlet slot directive standard sample by monochromator, filter system after the first reflective mirror, the second reflective mirror again
Product testboard, adjusting testing light source spectrum generate being closed with spectral response for the wavelength of standard solar panels after control system analysis
System；It controls the first optical path adjusting guide rail and the second optical path adjusting guide rail slides into the initial position, so that filter system is sent out
Collimated ray direct irradiation to temperature control sample room, adjust the wave that testing light source spectrum generates solar panels to be measured through control system
Length and spectral response relationship, control system pass through the wavelength to standard solar panels and spectral response relationship and solar energy to be measured
The wavelength of plate obtains the quantum efficiency data of solar panels to be measured with the comparison of spectral response relationship, and obtains drawing quantum efficiency
With wavelength curve；
A3, IV characteristic curve measure：Close testing light source and bias light source；Standard sources is opened, light intensity illumination tester is controlled
To adjust standard sources illumination in 200-2000W/m2 ranges, the temperature of control temperature control sample room reaches -40-60 ± 1 DEG C, and
Different light illuminations and at a temperature of measure the open-circuit voltage and short circuit current of circuit system in temperature control sample room, by circuit system
Switch conversion is I-V curve circuit, the I-V characteristic curve under different illumination and temperature condition is measured, through the number in control system
Fill factor is obtained according to analysis module；
S4, data summarization and analysis：Surface reflectivity data, quantum efficiency data and the I-V that S3 is obtained by control system
Characteristic curve carries out processing and summarizes, and unification output solar panel surface reflectivity to be measured, short circuit current, is filled out open-circuit voltage
The factor, quantum efficiency are filled, and to data summarization and draws curve；Eventually by the data analysis module in control system to summarizing
As a result battery loss Producing reason is provided.
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| CN201810181884.3A CN108462469B (en) | 2018-03-06 | 2018-03-06 | Solar cell loss parameter measurement and analysis system and use method |
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| CN109827936A (en) * | 2019-03-19 | 2019-05-31 | 南京佳诺霖光电科技有限公司 | A kind of time correlation fluorescence test apparatus |
| CN111063625A (en) * | 2019-12-16 | 2020-04-24 | 凯盛光伏材料有限公司 | Sub-band detection method for solar thin-film photovoltaic module |
| CN111664938A (en) * | 2020-06-11 | 2020-09-15 | 江南大学 | Method and device for measuring high-intensity monochromatic light irradiation |
| CN113809987A (en) * | 2021-08-25 | 2021-12-17 | 常州亚玛顿股份有限公司 | Method for improving quantum efficiency test accuracy of photovoltaic device |
| CN114843369A (en) * | 2022-04-28 | 2022-08-02 | 晶科能源(海宁)有限公司 | Monitoring method of solar cell preparation process |
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