CN114529500A - 显示基板的缺陷检查方法 - Google Patents
显示基板的缺陷检查方法 Download PDFInfo
- Publication number
- CN114529500A CN114529500A CN202111208310.9A CN202111208310A CN114529500A CN 114529500 A CN114529500 A CN 114529500A CN 202111208310 A CN202111208310 A CN 202111208310A CN 114529500 A CN114529500 A CN 114529500A
- Authority
- CN
- China
- Prior art keywords
- display substrate
- image
- black
- interest
- defect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007547 defect Effects 0.000 title claims abstract description 157
- 239000000758 substrate Substances 0.000 title claims abstract description 104
- 238000000034 method Methods 0.000 title claims abstract description 66
- 238000007689 inspection Methods 0.000 title claims abstract description 60
- 238000009826 distribution Methods 0.000 claims abstract description 35
- 239000000470 constituent Substances 0.000 claims abstract description 5
- 238000006243 chemical reaction Methods 0.000 claims description 9
- 238000001914 filtration Methods 0.000 claims description 6
- 230000009467 reduction Effects 0.000 claims description 6
- 230000010354 integration Effects 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 6
- 230000008439 repair process Effects 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 230000002950 deficient Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000012795 verification Methods 0.000 description 3
- 238000012656 cationic ring opening polymerization Methods 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000012552 review Methods 0.000 description 2
- 238000004904 shortening Methods 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
- G01N21/8903—Optical details; Scanning details using a multiple detector array
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/22—Matching criteria, e.g. proximity measures
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/11—Region-based segmentation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/90—Determination of colour characteristics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8861—Determining coordinates of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Life Sciences & Earth Sciences (AREA)
- Theoretical Computer Science (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Data Mining & Analysis (AREA)
- Signal Processing (AREA)
- Textile Engineering (AREA)
- Artificial Intelligence (AREA)
- Bioinformatics & Computational Biology (AREA)
- Evolutionary Computation (AREA)
- Quality & Reliability (AREA)
- Evolutionary Biology (AREA)
- General Engineering & Computer Science (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2020-0145321 | 2020-11-03 | ||
| KR1020200145321A KR20220060080A (ko) | 2020-11-03 | 2020-11-03 | 표시 기판의 결함 검사 방법 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114529500A true CN114529500A (zh) | 2022-05-24 |
Family
ID=81607030
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111208310.9A Pending CN114529500A (zh) | 2020-11-03 | 2021-10-18 | 显示基板的缺陷检查方法 |
Country Status (2)
| Country | Link |
|---|---|
| KR (1) | KR20220060080A (ko) |
| CN (1) | CN114529500A (ko) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2024063471A1 (ko) * | 2022-09-19 | 2024-03-28 | 주식회사 엘지에너지솔루션 | 제품의 외관 검사 장치 및 방법 |
| CN116977117B (zh) * | 2023-09-25 | 2023-12-08 | 深圳市松青锌镁铝精密压铸有限公司 | 一种精密部件的加工智能分析方法及系统 |
-
2020
- 2020-11-03 KR KR1020200145321A patent/KR20220060080A/ko active Search and Examination
-
2021
- 2021-10-18 CN CN202111208310.9A patent/CN114529500A/zh active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| KR20220060080A (ko) | 2022-05-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7978903B2 (en) | Defect detecting method and defect detecting device | |
| CN114529500A (zh) | 显示基板的缺陷检查方法 | |
| JP2006520482A (ja) | ディスプレイの光学検査のための方法およびシステム | |
| JPWO2013175703A1 (ja) | 表示装置の検査方法、および表示装置の検査装置 | |
| KR101261016B1 (ko) | 평판패널 기판의 자동광학검사 방법 및 그 장치 | |
| WO2023108545A1 (en) | Method for constructing defect detection model of micro led array panel, apparatures for dectectig pixel defect and devices | |
| CN111982925A (zh) | 检测方法及检测装置 | |
| KR101068356B1 (ko) | 화상처리를 이용한 디스플레이 패널의 픽셀 불량 검사 방법 | |
| JP5466099B2 (ja) | 外観検査装置 | |
| KR101409568B1 (ko) | 표시패널 검사장치 및 그 검사방법 | |
| JP2005345290A (ja) | 筋状欠陥検出方法及び装置 | |
| CN103630542B (zh) | 缺陷检测装置、缺陷修正装置及缺陷检测方法 | |
| JP4163199B2 (ja) | 検査装置、検査方法 | |
| JP6184746B2 (ja) | 欠陥検出装置、欠陥修正装置および欠陥検出方法 | |
| KR20140082333A (ko) | 평판디스플레이의 얼룩 검사 방법 및 장치 | |
| US11120544B2 (en) | Display panel inspection system, inspection method of display panel and display panel using the same | |
| JP5239275B2 (ja) | 欠陥検出方法および欠陥検出装置 | |
| CN114354622A (zh) | 显示屏的缺陷检测方法、装置、设备和介质 | |
| CN110672631B (zh) | 面板缺陷拍照方法和面板缺陷拍照装置 | |
| KR20120074702A (ko) | 윤곽선 검출을 위한 대각선 스캔방법 | |
| CN112734719A (zh) | 一种图像传感器的坏点检测方法、存储介质以及拍摄装置 | |
| CN112598652A (zh) | 一种基于梯度变换的液晶屏边缘断线检测方法 | |
| JPH0979946A (ja) | 表示装置の検査装置 | |
| US11538149B2 (en) | Spot detection device, spot detection method, and display device | |
| KR101940762B1 (ko) | 표시모듈용 자동검사장비 및 이를 이용한 이미지품질 검사방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |