CN114424242A - 学习处理装置及检查装置 - Google Patents

学习处理装置及检查装置 Download PDF

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CN114424242A
CN114424242A CN202080065129.4A CN202080065129A CN114424242A CN 114424242 A CN114424242 A CN 114424242A CN 202080065129 A CN202080065129 A CN 202080065129A CN 114424242 A CN114424242 A CN 114424242A
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inspection
neural network
learning
network model
data
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CN202080065129.4A
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Chinese (zh)
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和田谦
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Xingdeke Technology Co ltd
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Xingdeke Technology Co ltd
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/82—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using neural networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9018—Dirt detection in containers
    • G01N21/9027—Dirt detection in containers in containers after filling
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/045—Combinations of networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/774—Generating sets of training patterns; Bootstrap methods, e.g. bagging or boosting
    • G06V10/7747—Organisation of the process, e.g. bagging or boosting
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/776—Validation; Performance evaluation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8883—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges involving the calculation of gauges, generating models
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • Computing Systems (AREA)
  • Software Systems (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Databases & Information Systems (AREA)
  • Medical Informatics (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Biomedical Technology (AREA)
  • Biochemistry (AREA)
  • Computational Linguistics (AREA)
  • Data Mining & Analysis (AREA)
  • Molecular Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biophysics (AREA)
  • Immunology (AREA)
  • Signal Processing (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN202080065129.4A 2019-09-17 2020-09-16 学习处理装置及检查装置 Pending CN114424242A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019168127 2019-09-17
JP2019-168127 2019-09-17
PCT/JP2020/035141 WO2021054376A1 (ja) 2019-09-17 2020-09-16 学習処理装置及び検査装置

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CN114424242A true CN114424242A (zh) 2022-04-29

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US (1) US12217495B2 (https=)
EP (1) EP4016057A4 (https=)
JP (1) JP7212792B2 (https=)
CN (1) CN114424242A (https=)
WO (1) WO2021054376A1 (https=)

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US12170849B2 (en) 2022-02-04 2024-12-17 Applied Materials, Inc. Pulsed illumination for fluid inspection

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DE102021112479A1 (de) 2021-05-12 2022-11-17 Espera-Werke Gmbh Verfahren zum Betrieb eines Etikettiersystems
WO2023176393A1 (ja) * 2022-03-14 2023-09-21 キヤノン株式会社 認識装置、認識処理方法、及びプログラム
JP7799518B2 (ja) * 2022-03-14 2026-01-15 キヤノン株式会社 認識装置、認識処理方法、及びプログラム
AU2024258103A1 (en) * 2023-04-17 2025-10-09 Synergie Medicale Brg Inc. Methods, systems, and computer program product for validating a drug product while being held by a drug product packaging system prior to packaging

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CN108805259A (zh) * 2018-05-23 2018-11-13 北京达佳互联信息技术有限公司 神经网络模型训练方法、装置、存储介质及终端设备
WO2018216629A1 (ja) * 2017-05-22 2018-11-29 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
CN109242820A (zh) * 2017-07-10 2019-01-18 发那科株式会社 机器学习装置、检查装置以及机器学习方法
JP2019087181A (ja) * 2017-11-10 2019-06-06 アズビル株式会社 画像検査装置および方法
US20190228522A1 (en) * 2018-01-22 2019-07-25 Hitachi High-Technologies Corporation Image Evaluation Method and Image Evaluation Device

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EP1886257A1 (en) * 2005-05-11 2008-02-13 Optosecurity Inc. Method and system for screening luggage items, cargo containers or persons
JP7030056B2 (ja) 2016-01-28 2022-03-04 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッド 試料容器と試料の特徴付けのための方法及び装置
WO2018136262A1 (en) * 2017-01-20 2018-07-26 Aquifi, Inc. Systems and methods for defect detection
JP7113657B2 (ja) 2017-05-22 2022-08-05 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
US20190096135A1 (en) * 2017-09-26 2019-03-28 Aquifi, Inc. Systems and methods for visual inspection based on augmented reality
JP6727176B2 (ja) 2017-09-27 2020-07-22 富士フイルム株式会社 学習支援装置、学習支援装置の作動方法、学習支援プログラム、学習支援システム、および端末装置
KR20230135069A (ko) * 2020-12-18 2023-09-22 스트롱 포스 브이씨엔 포트폴리오 2019, 엘엘씨 밸류 체인 네트워크를 위한 로봇 플릿 관리 및 적층제조

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WO2018216629A1 (ja) * 2017-05-22 2018-11-29 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
CN109242820A (zh) * 2017-07-10 2019-01-18 发那科株式会社 机器学习装置、检查装置以及机器学习方法
JP2019087181A (ja) * 2017-11-10 2019-06-06 アズビル株式会社 画像検査装置および方法
US20190228522A1 (en) * 2018-01-22 2019-07-25 Hitachi High-Technologies Corporation Image Evaluation Method and Image Evaluation Device
CN108710941A (zh) * 2018-04-11 2018-10-26 杭州菲数科技有限公司 用于电子设备的神经网络模型的硬加速方法和装置
CN108805259A (zh) * 2018-05-23 2018-11-13 北京达佳互联信息技术有限公司 神经网络模型训练方法、装置、存储介质及终端设备

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12170849B2 (en) 2022-02-04 2024-12-17 Applied Materials, Inc. Pulsed illumination for fluid inspection

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WO2021054376A1 (ja) 2021-03-25
EP4016057A4 (en) 2023-09-06
US20220343640A1 (en) 2022-10-27
EP4016057A1 (en) 2022-06-22
US12217495B2 (en) 2025-02-04
JP7212792B2 (ja) 2023-01-25
JPWO2021054376A1 (https=) 2021-03-25

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