JP7212792B2 - 学習処理装置及び検査装置 - Google Patents

学習処理装置及び検査装置 Download PDF

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JP7212792B2
JP7212792B2 JP2021546938A JP2021546938A JP7212792B2 JP 7212792 B2 JP7212792 B2 JP 7212792B2 JP 2021546938 A JP2021546938 A JP 2021546938A JP 2021546938 A JP2021546938 A JP 2021546938A JP 7212792 B2 JP7212792 B2 JP 7212792B2
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謙 和田
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Syntegon Technology KK
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    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/82—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using neural networks
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    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
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    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
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    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
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    • G01N21/9027—Dirt detection in containers in containers after filling
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
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    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/774—Generating sets of training patterns; Bootstrap methods, e.g. bagging or boosting
    • G06V10/7747—Organisation of the process, e.g. bagging or boosting
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
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    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/776—Validation; Performance evaluation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8883—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges involving the calculation of gauges, generating models
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
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  • Analytical Chemistry (AREA)
  • Biophysics (AREA)
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  • Signal Processing (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2021546938A 2019-09-17 2020-09-16 学習処理装置及び検査装置 Active JP7212792B2 (ja)

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JP2019168127 2019-09-17
JP2019168127 2019-09-17
PCT/JP2020/035141 WO2021054376A1 (ja) 2019-09-17 2020-09-16 学習処理装置及び検査装置

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JPWO2021054376A1 JPWO2021054376A1 (https=) 2021-03-25
JPWO2021054376A5 JPWO2021054376A5 (https=) 2022-05-26
JP7212792B2 true JP7212792B2 (ja) 2023-01-25

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US (1) US12217495B2 (https=)
EP (1) EP4016057A4 (https=)
JP (1) JP7212792B2 (https=)
CN (1) CN114424242A (https=)
WO (1) WO2021054376A1 (https=)

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DE102021112479A1 (de) 2021-05-12 2022-11-17 Espera-Werke Gmbh Verfahren zum Betrieb eines Etikettiersystems
US12170849B2 (en) 2022-02-04 2024-12-17 Applied Materials, Inc. Pulsed illumination for fluid inspection
WO2023176393A1 (ja) * 2022-03-14 2023-09-21 キヤノン株式会社 認識装置、認識処理方法、及びプログラム
JP7799518B2 (ja) * 2022-03-14 2026-01-15 キヤノン株式会社 認識装置、認識処理方法、及びプログラム
AU2024258103A1 (en) * 2023-04-17 2025-10-09 Synergie Medicale Brg Inc. Methods, systems, and computer program product for validating a drug product while being held by a drug product packaging system prior to packaging

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JP2018198053A (ja) 2017-05-22 2018-12-13 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
JP2019061578A (ja) 2017-09-27 2019-04-18 富士フイルム株式会社 学習支援装置、学習支援装置の作動方法、学習支援プログラム、学習支援システム、および端末装置

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US7676062B2 (en) * 2002-09-03 2010-03-09 Automotive Technologies International Inc. Image processing for vehicular applications applying image comparisons
EP1886257A1 (en) * 2005-05-11 2008-02-13 Optosecurity Inc. Method and system for screening luggage items, cargo containers or persons
JP7030056B2 (ja) 2016-01-28 2022-03-04 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッド 試料容器と試料の特徴付けのための方法及び装置
WO2018136262A1 (en) * 2017-01-20 2018-07-26 Aquifi, Inc. Systems and methods for defect detection
WO2018216629A1 (ja) 2017-05-22 2018-11-29 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
JP6705777B2 (ja) 2017-07-10 2020-06-03 ファナック株式会社 機械学習装置、検査装置及び機械学習方法
US20190096135A1 (en) * 2017-09-26 2019-03-28 Aquifi, Inc. Systems and methods for visual inspection based on augmented reality
JP7074460B2 (ja) 2017-11-10 2022-05-24 アズビル株式会社 画像検査装置および方法
JP7002949B2 (ja) * 2018-01-22 2022-01-20 株式会社日立ハイテク 画像評価方法及び画像評価装置
CN108710941A (zh) 2018-04-11 2018-10-26 杭州菲数科技有限公司 用于电子设备的神经网络模型的硬加速方法和装置
CN108805259A (zh) * 2018-05-23 2018-11-13 北京达佳互联信息技术有限公司 神经网络模型训练方法、装置、存储介质及终端设备
KR20230135069A (ko) * 2020-12-18 2023-09-22 스트롱 포스 브이씨엔 포트폴리오 2019, 엘엘씨 밸류 체인 네트워크를 위한 로봇 플릿 관리 및 적층제조

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JP2019061578A (ja) 2017-09-27 2019-04-18 富士フイルム株式会社 学習支援装置、学習支援装置の作動方法、学習支援プログラム、学習支援システム、および端末装置

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WO2021054376A1 (ja) 2021-03-25
EP4016057A4 (en) 2023-09-06
US20220343640A1 (en) 2022-10-27
CN114424242A (zh) 2022-04-29
EP4016057A1 (en) 2022-06-22
US12217495B2 (en) 2025-02-04
JPWO2021054376A1 (https=) 2021-03-25

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