CN114355226A - Method, device, equipment and medium for improving power supply dynamic response test precision - Google Patents
Method, device, equipment and medium for improving power supply dynamic response test precision Download PDFInfo
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Abstract
The invention provides a method, a device, equipment and a readable medium for improving the dynamic response test precision of a power supply, wherein the method comprises the following steps: calculating the frequency and the duty ratio of the voltage to be measured and judging whether the calculated frequency and the calculated duty ratio can ensure that the change rate of the current is unchanged; responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, converting the data information of the current and sending the data information to a signal generator to drive a load board; the upper computer controls the oscilloscope to test the voltage and the current; the upper computer reads waveform data measured by the oscilloscope and calculates the frequency and the duty ratio of the current according to the waveform data; and adjusting the frequency and the duty ratio of the power supply to be detected, and repeatedly executing the steps until finding out the worst frequency and the worst duty ratio of the power supply. By using the scheme of the invention, the stability of the current change rate in the dynamic response test in the whole test frequency range can be ensured, the test accuracy is improved, and the test efficiency can be improved.
Description
Technical Field
The present invention relates to the field of computers, and more particularly, to a method, an apparatus, a device and a readable medium for improving power supply dynamic response test accuracy.
Background
The dynamic response of the power supply is an important index for evaluating the power supply quality of the power supply, and is taken as an example of a DC/DC power supply for supplying power to a CPU and a south bridge. Within the rated current range, the voltage fluctuation when the load current changes needs to be ensured not to exceed the requirement. In order to measure various indexes of a power supply conveniently, an electronic load is generally used to replace a real load and is connected to a power supply output end, the current change rate of the commonly used universal electronic load is 2.5A/us at most, the requirement of power supply tests of the periphery of most chips can be met, but the requirement of the current change rate of power supply of cores of chips such as a CPU (Central processing Unit) and a south bridge cannot be met.
When testing such a high-standard power supply, a small electronic load (hereinafter referred to as a load board) controlled by a special analog signal is required, the load board generally uses a signal generator to provide a driving signal, the driving signal is converted into a load current according to a certain conversion ratio, the magnitude of the load current is determined by the voltage level of the driving signal, and the frequency duty ratio of the load current is the same as that of the driving signal.
In order to simulate the real load condition, during the dynamic response test of the power supply, the maximum current span required by the chip is usually selected as the upper and lower limits of the current change of the load board during the test, and then the frequency and the duty ratio (hereinafter referred to as frequency points) of the current change of the load board are adjusted by the signal generator, so as to respectively find the maximum value and the minimum value of the voltage of the power supply output fluctuation, and the corresponding frequency duty ratio is the two frequency points (hereinafter referred to as worst frequency points) of the worst power supply performance. The worst frequency point is searched by using a manual frequency sweeping mode, a signal generator and an oscilloscope need to be continuously adjusted, and the defects of inaccurate frequency point searching and low efficiency exist in a large amount of manual operation.
Disclosure of Invention
In view of this, an object of the embodiments of the present invention is to provide a method, an apparatus, a device, and a readable medium for improving power supply dynamic response test precision, which can ensure that a current change rate in a dynamic response test is stable in a whole test frequency range, improve test accuracy, and improve test efficiency.
Based on the above purpose, a method for improving the dynamic response test precision of a power supply of the embodiment of the invention includes the following steps:
calculating the frequency and the duty ratio of the voltage to be measured and judging whether the calculated frequency and the calculated duty ratio can ensure that the change rate of the current is unchanged;
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, converting the data information of the current and sending the data information to a signal generator to drive a load board;
the upper computer controls the oscilloscope to test the voltage and the current;
the upper computer reads waveform data measured by the oscilloscope and calculates the frequency and the duty ratio of the current according to the waveform data;
and adjusting the frequency and the duty ratio of the power supply to be detected, and repeatedly executing the steps until finding out the worst frequency and the worst duty ratio of the power supply.
According to an embodiment of the present invention, further comprising:
responding to the fact that the frequency and the duty ratio obtained through calculation cannot guarantee that the change rate of the current is unchanged, and calculating the current span through the frequency and the duty ratio obtained through calculation and the current change rate;
the voltage minimum value is measured in a first current range, and the voltage maximum value is measured in a second current range, wherein the first current range is an interval from the current maximum value to the current span, and the second current range is an interval from the current minimum value to the current span.
According to an embodiment of the present invention, calculating the current span by the calculated frequency and duty cycle and the current change rate includes:
using the formula: and calculating the current span by using the Istep-Ts-Duty-SlewRate, wherein Istep is the current span, Ts is the period of the current voltage to be measured, Duty is the Duty ratio of the current voltage to be measured, and SlewRate is the current change rate.
According to an embodiment of the present invention, converting and sending data information of the present current to the signal generator to drive the load board in response to the calculated frequency and duty ratio to ensure that the rate of change of the current is constant comprises:
in response to the calculated frequency and duty ratio, the change rate of the current can be guaranteed to be unchanged, and the high-low value, the frequency, the duty ratio and the current change rate of the current are converted into the high-low level, the frequency, the duty ratio and the rise-fall time of a pulse signal in a signal generator;
and sending the converted high and low levels, frequency, duty ratio and rise and fall time to a signal generator to drive a load board.
In another aspect of the embodiments of the present invention, there is also provided an apparatus for improving the accuracy of a dynamic response test of a power supply, the apparatus including:
the judging module is configured to calculate the frequency and the duty ratio of the voltage to be measured and judge whether the calculated frequency and the calculated duty ratio can ensure that the change rate of the current is unchanged;
the conversion module is configured to respond to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, convert the data information of the current and send the data information to the signal generator to drive the load board;
the test module is configured to control the oscilloscope to test voltage and current by the upper computer;
the calculation module is configured to read waveform data measured by the oscilloscope by the upper computer and calculate the frequency and the duty ratio of the current according to the waveform data;
and the adjusting module is configured to adjust the frequency and the duty ratio of the power supply to be detected, and repeatedly execute the steps until finding out the worst frequency and the worst duty ratio of the power supply.
According to one embodiment of the invention, the computing module is further configured to:
responding to the fact that the frequency and the duty ratio obtained through calculation cannot guarantee that the change rate of the current is unchanged, and calculating the current span through the frequency and the duty ratio obtained through calculation and the current change rate;
the voltage minimum value is measured in a first current range, and the voltage maximum value is measured in a second current range, wherein the first current range is an interval from the current maximum value to the current span, and the second current range is an interval from the current minimum value to the current span.
According to one embodiment of the invention, the computing module is further configured to:
using the formula: and calculating the current span by using the Istep-Ts-Duty-SlewRate, wherein Istep is the current span, Ts is the period of the current voltage to be measured, Duty is the Duty ratio of the current voltage to be measured, and SlewRate is the current change rate.
According to one embodiment of the invention, the conversion module is further configured to:
in response to the calculated frequency and duty ratio, the change rate of the current can be guaranteed to be unchanged, and the high-low value, the frequency, the duty ratio and the current change rate of the current are converted into the high-low level, the frequency, the duty ratio and the rise-fall time of a pulse signal in a signal generator;
and sending the converted high and low levels, frequency, duty ratio and rise and fall time to a signal generator to drive a load board.
In another aspect of an embodiment of the present invention, there is also provided a computer apparatus including:
at least one processor; and
a memory storing computer instructions executable on the processor, the instructions when executed by the processor implementing the steps of any of the methods described above.
In another aspect of the embodiments of the present invention, there is also provided a computer-readable storage medium storing a computer program, which when executed by a processor implements the steps of any one of the above-mentioned methods.
The invention has the following beneficial technical effects: according to the method for improving the dynamic response test precision of the power supply, provided by the embodiment of the invention, the frequency and the duty ratio of the voltage to be tested are calculated, and whether the calculated frequency and the calculated duty ratio can ensure that the change rate of the current is unchanged or not is judged; responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, converting the data information of the current and sending the data information to a signal generator to drive a load board; the upper computer controls the oscilloscope to test the voltage and the current; the upper computer reads waveform data measured by the oscilloscope and calculates the frequency and the duty ratio of the current according to the waveform data; the technical scheme of adjusting the frequency and the duty ratio of the power supply to be tested and repeatedly executing the steps until the worst frequency and the worst duty ratio of the power supply are found out can ensure the stability of the current change rate in the dynamic response test in the whole test frequency range, improve the test accuracy and improve the test efficiency.
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In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other embodiments can be obtained by using the drawings without creative efforts.
FIG. 1 is a schematic flow chart diagram of a method for improving power supply dynamic response test accuracy according to one embodiment of the present invention;
FIG. 2 is a diagram illustrating a system architecture for improving power supply dynamic response test accuracy according to an embodiment of the present invention;
FIG. 3 is a diagram illustrating an apparatus for improving power supply dynamic response test accuracy according to an embodiment of the invention;
FIG. 4 is a schematic diagram of a computer device according to one embodiment of the present invention;
fig. 5 is a schematic diagram of a computer-readable storage medium according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the following embodiments of the present invention are described in further detail with reference to the accompanying drawings.
In view of the above, a first aspect of embodiments of the present invention proposes an embodiment of a method for improving accuracy of testing dynamic response of a power supply. Fig. 1 shows a schematic flow diagram of the method.
As shown in fig. 1, the method may include the steps of:
s1, calculating the frequency and the duty ratio of the voltage to be measured and judging whether the calculated frequency and the calculated duty ratio can ensure that the change rate of the current is unchanged.
The method needs to establish a test environment, as shown in fig. 2, the input end of a power supply to be tested is connected to a superior power supply, the output end of the power supply to be tested is connected to a load board, the drive signal input of the load board is connected to the output of a signal generator, the voltage and current detection ends are connected to an oscilloscope, and an upper computer is connected to the oscilloscope and the signal generator through a GPIB. The upper computer program needs to set a frequency sweep frequency range, frequency sweep precision, a current high-low value and a current change rate, the upper computer program controls the signal generator and the oscilloscope to automatically complete frequency sweep test, the power supply voltage maximum value of each frequency point is obtained, test data are stored, and the worst frequency point is obtained through comparison.
In order to ensure that the current change rate is kept unchanged when different frequency points are tested, before an upper computer sends a command to a signal generator, whether the frequency Duty ratio of the current frequency point to be tested can meet the requirement of the current change rate is calculated, if the following measurement is continuously executed, the current change rate can be kept unchanged by reducing the current span Istep, and the current span is calculated by using a formula of Ts Duty SlewRate, wherein Ts is the period (us) of the current frequency point, Duty is the Duty ratio (%) of the current frequency point, and SlewRate is the current change rate (A/us). The current span decreases so that the rise-fall time decreases to maintain the rate of change of current, and as the test frequency gradually increases, Istep decreases accordingly. For example, the current range is 10A-20A, and the original simultaneous measurement of the maximum and minimum values of the voltage directly at the current of 10A-20A is changed into two measurements, namely, the measurement of the minimum value of the voltage at the current range [20A-Istep, 20A ] and the measurement of the maximum value of the voltage at the current [10A, 10A + Istep ].
And S2, responding to the calculated frequency and duty ratio to ensure that the current change rate is unchanged, and converting and sending data information of the current to the signal generator to drive the load board.
And if the calculated frequency and duty ratio can ensure that the change rate of the current is unchanged, converting the high and low values, the frequency, the duty ratio and the current change rate of the current into the high and low levels, the frequency, the duty ratio and the rise and fall time of a pulse signal in the signal generator, and then sending the converted high and low levels, the frequency, the duty ratio and the rise and fall time to the signal generator to drive a load board.
And S3, the upper computer controls the oscilloscope to test the voltage and the current.
And S4, the upper computer reads the waveform data measured by the oscilloscope, and calculates the frequency and the duty ratio of the current according to the waveform data.
And the upper computer reads the waveform data of the current in the oscilloscope, filters the data by using a digital second-order band-pass filter, and calculates to obtain the accurate frequency and duty ratio of the current.
S5, adjusting the frequency and the duty ratio of the power supply to be tested, and repeatedly executing the steps until finding the worst frequency and the worst duty ratio of the power supply.
And adjusting the frequency and the duty ratio of the power supply to be tested, and repeatedly carrying out the test until the worst frequency and the duty ratio of the power supply are found out.
By the technical scheme, the stability of the current change rate in the dynamic response test in the whole test frequency range can be ensured, the test accuracy is improved, and the test efficiency can be improved.
In a preferred embodiment of the present invention, the method further comprises:
responding to the fact that the frequency and the duty ratio obtained through calculation cannot guarantee that the change rate of the current is unchanged, and calculating the current span through the frequency and the duty ratio obtained through calculation and the current change rate;
the voltage minimum value is measured in a first current range, and the voltage maximum value is measured in a second current range, wherein the first current range is an interval from the current maximum value to the current span, and the second current range is an interval from the current minimum value to the current span. For example, the current range is 10A-20A, and the original simultaneous measurement of the maximum and minimum values of the voltage directly at the current of 10A-20A is changed into two measurements, namely, the measurement of the minimum value of the voltage at the current range [20A-Istep, 20A ] and the measurement of the maximum value of the voltage at the current [10A, 10A + Istep ].
In a preferred embodiment of the present invention, calculating the current span by the calculated frequency and duty cycle and current change rate comprises:
using the formula: and calculating the current span by using the Istep-Ts-Duty-SlewRate, wherein Istep is the current span, Ts is the period of the current voltage to be measured, Duty is the Duty ratio of the current voltage to be measured, and SlewRate is the current change rate.
In a preferred embodiment of the present invention, the converting and sending the data information of the present current to the signal generator to drive the load board in response to the calculated frequency and duty ratio to ensure that the rate of change of the current is constant comprises:
in response to the calculated frequency and duty ratio, the change rate of the current can be guaranteed to be unchanged, and the high-low value, the frequency, the duty ratio and the current change rate of the current are converted into the high-low level, the frequency, the duty ratio and the rise-fall time of a pulse signal in a signal generator;
and sending the converted high and low levels, frequency, duty ratio and rise and fall time to a signal generator to drive a load board.
The invention brings the following beneficial effects:
1. the load current is controlled through the upper computer control program, so that the stability of the current change rate in the whole test frequency range in the dynamic response test is ensured, and the test accuracy is improved.
2. Accurate measurement of current frequency and duty cycle is achieved through a program algorithm.
3. And the upper computer is adopted for automatic frequency sweep test, so that the test efficiency is improved.
It should be noted that, as will be understood by those skilled in the art, all or part of the processes in the methods of the above embodiments may be implemented by instructing relevant hardware through a computer program, and the above programs may be stored in a computer-readable storage medium, and when executed, the programs may include the processes of the embodiments of the methods as described above. The storage medium may be a magnetic disk, an optical disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), or the like. The embodiments of the computer program may achieve the same or similar effects as any of the above-described method embodiments.
Furthermore, the method disclosed according to an embodiment of the present invention may also be implemented as a computer program executed by a CPU, and the computer program may be stored in a computer-readable storage medium. The computer program, when executed by the CPU, performs the above-described functions defined in the method disclosed in the embodiments of the present invention.
In view of the above object, according to a second aspect of the embodiments of the present invention, there is provided an apparatus for improving the accuracy of a dynamic response test of a power supply, as shown in fig. 3, the apparatus 200 includes:
the judging module is configured to calculate the frequency and the duty ratio of the voltage to be measured and judge whether the calculated frequency and the calculated duty ratio can ensure that the change rate of the current is unchanged;
the conversion module is configured to respond to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, convert the data information of the current and send the data information to the signal generator to drive the load board;
the test module is configured to control the oscilloscope to test voltage and current by the upper computer;
the calculation module is configured to read waveform data measured by the oscilloscope by the upper computer and calculate the frequency and the duty ratio of the current according to the waveform data;
and the adjusting module is configured to adjust the frequency and the duty ratio of the power supply to be detected, and repeatedly execute the steps until finding out the worst frequency and the worst duty ratio of the power supply.
In a preferred embodiment of the invention, the calculation module is further configured to:
responding to the fact that the frequency and the duty ratio obtained through calculation cannot guarantee that the change rate of the current is unchanged, and calculating the current span through the frequency and the duty ratio obtained through calculation and the current change rate;
the voltage minimum value is measured in a first current range, and the voltage maximum value is measured in a second current range, wherein the first current range is an interval from the current maximum value to the current span, and the second current range is an interval from the current minimum value to the current span.
In a preferred embodiment of the invention, the calculation module is further configured to:
using the formula: and calculating the current span by using the Istep-Ts-Duty-SlewRate, wherein Istep is the current span, Ts is the period of the current voltage to be measured, Duty is the Duty ratio of the current voltage to be measured, and SlewRate is the current change rate.
In a preferred embodiment of the present invention, the conversion module is further configured to:
in response to the calculated frequency and duty ratio, the change rate of the current can be guaranteed to be unchanged, and the high-low value, the frequency, the duty ratio and the current change rate of the current are converted into the high-low level, the frequency, the duty ratio and the rise-fall time of a pulse signal in a signal generator;
and sending the converted high and low levels, frequency, duty ratio and rise and fall time to a signal generator to drive a load board.
In view of the above object, a third aspect of the embodiments of the present invention provides a computer device. Fig. 4 is a schematic diagram of an embodiment of a computer device provided by the present invention. As shown in fig. 4, an embodiment of the present invention includes the following means: at least one processor 21; and a memory 22, the memory 22 storing computer instructions 23 executable on the processor, the instructions when executed by the processor implementing the method of:
calculating the frequency and the duty ratio of the voltage to be measured and judging whether the calculated frequency and the calculated duty ratio can ensure that the change rate of the current is unchanged;
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, converting the data information of the current and sending the data information to a signal generator to drive a load board;
the upper computer controls the oscilloscope to test the voltage and the current;
the upper computer reads waveform data measured by the oscilloscope and calculates the frequency and the duty ratio of the current according to the waveform data;
and adjusting the frequency and the duty ratio of the power supply to be detected, and repeatedly executing the steps until finding out the worst frequency and the worst duty ratio of the power supply.
In a preferred embodiment of the present invention, the method further comprises:
responding to the fact that the frequency and the duty ratio obtained through calculation cannot guarantee that the change rate of the current is unchanged, and calculating the current span through the frequency and the duty ratio obtained through calculation and the current change rate;
the voltage minimum value is measured in a first current range, and the voltage maximum value is measured in a second current range, wherein the first current range is an interval from the current maximum value to the current span, and the second current range is an interval from the current minimum value to the current span.
In a preferred embodiment of the present invention, calculating the current span by the calculated frequency and duty cycle and current change rate comprises:
using the formula: and calculating the current span by using the Istep-Ts-Duty-SlewRate, wherein Istep is the current span, Ts is the period of the current voltage to be measured, Duty is the Duty ratio of the current voltage to be measured, and SlewRate is the current change rate.
In a preferred embodiment of the present invention, the converting and sending the data information of the present current to the signal generator to drive the load board in response to the calculated frequency and duty ratio to ensure that the rate of change of the current is constant comprises:
in response to the calculated frequency and duty ratio, the change rate of the current can be guaranteed to be unchanged, and the high-low value, the frequency, the duty ratio and the current change rate of the current are converted into the high-low level, the frequency, the duty ratio and the rise-fall time of a pulse signal in a signal generator;
and sending the converted high and low levels, frequency, duty ratio and rise and fall time to a signal generator to drive a load board.
In view of the above object, a fourth aspect of the embodiments of the present invention proposes a computer-readable storage medium. FIG. 5 is a schematic diagram illustrating an embodiment of a computer-readable storage medium provided by the present invention. As shown in fig. 5, the computer-readable storage medium 31 stores a computer program 32 that, when executed by a processor, performs the method of:
calculating the frequency and the duty ratio of the voltage to be measured and judging whether the calculated frequency and the calculated duty ratio can ensure that the change rate of the current is unchanged;
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, converting the data information of the current and sending the data information to a signal generator to drive a load board;
the upper computer controls the oscilloscope to test the voltage and the current;
the upper computer reads waveform data measured by the oscilloscope and calculates the frequency and the duty ratio of the current according to the waveform data;
and adjusting the frequency and the duty ratio of the power supply to be detected, and repeatedly executing the steps until finding out the worst frequency and the worst duty ratio of the power supply.
In a preferred embodiment of the present invention, the method further comprises:
responding to the fact that the frequency and the duty ratio obtained through calculation cannot guarantee that the change rate of the current is unchanged, and calculating the current span through the frequency and the duty ratio obtained through calculation and the current change rate;
the voltage minimum value is measured in a first current range, and the voltage maximum value is measured in a second current range, wherein the first current range is an interval from the current maximum value to the current span, and the second current range is an interval from the current minimum value to the current span.
In a preferred embodiment of the present invention, calculating the current span by the calculated frequency and duty cycle and current change rate comprises:
using the formula: and calculating the current span by using the Istep-Ts-Duty-SlewRate, wherein Istep is the current span, Ts is the period of the current voltage to be measured, Duty is the Duty ratio of the current voltage to be measured, and SlewRate is the current change rate.
In a preferred embodiment of the present invention, the converting and sending the data information of the present current to the signal generator to drive the load board in response to the calculated frequency and duty ratio to ensure that the rate of change of the current is constant comprises:
in response to the calculated frequency and duty ratio, the change rate of the current can be guaranteed to be unchanged, and the high-low value, the frequency, the duty ratio and the current change rate of the current are converted into the high-low level, the frequency, the duty ratio and the rise-fall time of a pulse signal in a signal generator;
and sending the converted high and low levels, frequency, duty ratio and rise and fall time to a signal generator to drive a load board.
Furthermore, the methods disclosed according to embodiments of the present invention may also be implemented as a computer program executed by a processor, which may be stored in a computer-readable storage medium. Which when executed by a processor performs the above-described functions defined in the methods disclosed in embodiments of the invention.
Further, the above method steps and system elements may also be implemented using a controller and a computer readable storage medium for storing a computer program for causing the controller to implement the functions of the above steps or elements.
Those of skill would further appreciate that the various illustrative logical blocks, modules, circuits, and algorithm steps described in connection with the disclosure herein may be implemented as electronic hardware, computer software, or combinations of both. To clearly illustrate this interchangeability of hardware and software, various illustrative components, blocks, modules, circuits, and steps have been described above generally in terms of their functionality. Whether such functionality is implemented as software or hardware depends upon the particular application and design constraints imposed on the overall system. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the disclosed embodiments of the present invention.
In one or more exemplary designs, the functions may be implemented in hardware, software, firmware, or any combination thereof. If implemented in software, the functions may be stored on or transmitted over as one or more instructions or code on a computer-readable medium. Computer-readable media includes both computer storage media and communication media including any medium that facilitates transfer of a computer program from one place to another. A storage media may be any available media that can be accessed by a general purpose or special purpose computer. By way of example, and not limitation, such computer-readable media can comprise RAM, ROM, EEPROM, CD-ROM or other optical disk storage, magnetic disk storage or other magnetic storage devices, or any other medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a general-purpose or special-purpose computer, or a general-purpose or special-purpose processor. Also, any connection is properly termed a computer-readable medium. For example, if the software is transmitted from a website, server, or other remote source using a coaxial cable, fiber optic cable, twisted pair, Digital Subscriber Line (DSL), or wireless technologies such as infrared, radio, and microwave, then the coaxial cable, fiber optic cable, twisted pair, DSL, or wireless technologies such as infrared, radio, and microwave are included in the definition of medium. Disk and disc, as used herein, includes Compact Disc (CD), laser disc, optical disc, Digital Versatile Disc (DVD), floppy disk, blu-ray disc where disks usually reproduce data magnetically, while discs reproduce data optically with lasers. Combinations of the above should also be included within the scope of computer-readable media.
The foregoing is an exemplary embodiment of the present disclosure, but it should be noted that various changes and modifications could be made herein without departing from the scope of the present disclosure as defined by the appended claims. The functions, steps and/or actions of the method claims in accordance with the disclosed embodiments described herein need not be performed in any particular order. Furthermore, although elements of the disclosed embodiments of the invention may be described or claimed in the singular, the plural is contemplated unless limitation to the singular is explicitly stated.
It should be understood that, as used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly supports the exception. It should also be understood that "and/or" as used herein is meant to include any and all possible combinations of one or more of the associated listed items.
The numbers of the embodiments disclosed in the embodiments of the present invention are merely for description, and do not represent the merits of the embodiments.
It will be understood by those skilled in the art that all or part of the steps for implementing the above embodiments may be implemented by hardware, or may be implemented by a program instructing relevant hardware, and the program may be stored in a computer-readable storage medium, and the above-mentioned storage medium may be a read-only memory, a magnetic disk or an optical disk, etc.
Those of ordinary skill in the art will understand that: the discussion of any embodiment above is meant to be exemplary only, and is not intended to intimate that the scope of the disclosure, including the claims, of embodiments of the invention is limited to these examples; within the idea of an embodiment of the invention, also technical features in the above embodiment or in different embodiments may be combined and there are many other variations of the different aspects of the embodiments of the invention as described above, which are not provided in detail for the sake of brevity. Therefore, any omissions, modifications, substitutions, improvements, and the like that may be made without departing from the spirit and principles of the embodiments of the present invention are intended to be included within the scope of the embodiments of the present invention.
Claims (10)
1. A method for improving the dynamic response test precision of a power supply is characterized by comprising the following steps:
calculating the frequency and the duty ratio of the voltage to be measured and judging whether the calculated frequency and the calculated duty ratio can ensure that the change rate of the current is unchanged;
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, converting the data information of the current and sending the data information to a signal generator to drive a load board;
the upper computer controls the oscilloscope to test the voltage and the current;
the upper computer reads the waveform data measured by the oscilloscope and calculates the frequency and the duty ratio of the current according to the waveform data;
and adjusting the frequency and the duty ratio of the power supply to be detected, and repeatedly executing the steps until finding out the worst frequency and the worst duty ratio of the power supply.
2. The method of claim 1, further comprising:
responding to the fact that the frequency and the duty ratio obtained through calculation cannot guarantee that the change rate of the current is unchanged, and calculating the current span through the frequency and the duty ratio obtained through calculation and the current change rate;
measuring the voltage minimum value in a first current range and measuring the voltage maximum value in a second current range, wherein the first current range is an interval from the current maximum value to the current span to the current maximum value, and the second current range is an interval from the current minimum value to the current span.
3. The method of claim 2, wherein calculating the current span from the calculated frequency and duty cycle and current rate of change comprises:
using the formula: and calculating the current span by using the Istep-Ts-Duty-SlewRate, wherein Istep is the current span, Ts is the period of the current voltage to be measured, Duty is the Duty ratio of the current voltage to be measured, and SlewRate is the current change rate.
4. The method of claim 1, wherein the step of converting and sending the data information of the current to the signal generator to drive the load board in response to the calculated frequency and duty ratio to ensure that the current has a constant rate of change comprises:
in response to the calculated frequency and duty ratio, the change rate of the current can be guaranteed to be unchanged, and the high-low value, the frequency, the duty ratio and the current change rate of the current are converted into the high-low level, the frequency, the duty ratio and the rise-fall time of a pulse signal in a signal generator;
and sending the converted high and low levels, frequency, duty ratio and rise and fall time to a signal generator to drive a load board.
5. An apparatus for improving accuracy of testing dynamic response of a power supply, the apparatus comprising:
the judging module is configured to calculate the frequency and the duty ratio of the voltage to be measured and judge whether the calculated frequency and the calculated duty ratio can ensure that the change rate of the current is unchanged;
the conversion module is configured to respond to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, convert the data information of the current and send the data information to the signal generator to drive the load board;
the test module is configured to control the oscilloscope to test voltage and current by the upper computer;
the computing module is configured to read waveform data measured by the oscilloscope by the upper computer and compute the frequency and the duty ratio of current according to the waveform data;
and the adjusting module is configured to adjust the frequency and the duty ratio of the power supply to be detected, and repeatedly execute the steps until finding out the worst frequency and the worst duty ratio of the power supply.
6. The apparatus of claim 5, wherein the computing module is further configured to:
responding to the fact that the frequency and the duty ratio obtained through calculation cannot guarantee that the change rate of the current is unchanged, and calculating the current span through the frequency and the duty ratio obtained through calculation and the current change rate;
measuring the voltage minimum value in a first current range and measuring the voltage maximum value in a second current range, wherein the first current range is an interval from the current maximum value to the current span to the current maximum value, and the second current range is an interval from the current minimum value to the current span.
7. The apparatus of claim 6, wherein the computing module is further configured to:
using the formula: and calculating the current span by using the Istep-Ts-Duty-SlewRate, wherein Istep is the current span, Ts is the period of the current voltage to be measured, Duty is the Duty ratio of the current voltage to be measured, and SlewRate is the current change rate.
8. The apparatus of claim 5, wherein the conversion module is further configured to:
in response to the calculated frequency and duty ratio, the change rate of the current can be guaranteed to be unchanged, and the high-low value, the frequency, the duty ratio and the current change rate of the current are converted into the high-low level, the frequency, the duty ratio and the rise-fall time of a pulse signal in a signal generator;
and sending the converted high and low levels, frequency, duty ratio and rise and fall time to a signal generator to drive a load board.
9. A computer device, comprising:
at least one processor; and
a memory storing computer instructions executable on the processor, the instructions when executed by the processor implementing the steps of the method of any one of claims 1 to 4.
10. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 4.
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