CN114355226B - Method, device, equipment and medium for improving dynamic response test precision of power supply - Google Patents
Method, device, equipment and medium for improving dynamic response test precision of power supply Download PDFInfo
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Abstract
The invention provides a method, a device, equipment and a readable medium for improving the dynamic response test precision of a power supply, wherein the method comprises the following steps: calculating the frequency and the duty ratio of the voltage to be measured and judging whether the calculated frequency and duty ratio can ensure that the change rate of the current is unchanged; responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, converting the data information of the current and transmitting the data information to a signal generator to drive a load board; the upper computer controls the oscilloscope to test the voltage and the current; the upper computer reads waveform data measured by the oscilloscope and calculates the frequency and the duty ratio of the current according to the waveform data; and adjusting the frequency and the duty ratio of the power supply to be measured, and repeatedly executing the steps until the worst frequency and the worst duty ratio of the power supply are found. By using the scheme of the invention, the stability of the current change rate in the dynamic response test in the whole test frequency range can be ensured, the test accuracy is improved, and the test efficiency can be improved.
Description
Technical Field
The present invention relates to the field of computers, and more particularly, to a method, apparatus, device, and readable medium for improving the accuracy of dynamic response testing of power supplies.
Background
The dynamic response of the power supply is an important index for evaluating the power supply quality of the power supply, and takes a DC/DC power supply for supplying power to a CPU and a south bridge as an example. In the rated current range, voltage fluctuation in the case of load current change needs to be ensured not to exceed the requirement. In order to conveniently measure various indexes of the power supply, an electronic load is usually used for replacing a real load to be connected to the output end of the power supply, and the current change rate of the common general electronic load is 2.5A/us at the highest, so that the requirements of peripheral power supply tests of most chips can be met, but the current change rate requirements of core power supply of chips such as a CPU (Central processing Unit), a south bridge and the like cannot be met.
When testing such a high standard power supply, a small electronic load (hereinafter referred to as a load board) controlled by a special analog signal is required, the load board generally uses a signal generator to provide a driving signal, the driving signal is converted into a load current according to a certain conversion ratio, the magnitude of the load current is determined by the voltage of the driving signal, and the frequency duty ratio of the load current is the same as that of the driving signal.
In order to simulate the real load condition, during the dynamic response test of the power supply, the maximum current span required by the chip is generally selected as the upper limit and the lower limit of the current change of the load board during the test, then the frequency and the duty ratio (hereinafter referred to as frequency points) of the current change of the load board are adjusted through the signal generator, and the maximum value and the minimum value of the voltage of the output fluctuation of the power supply are respectively found, wherein the corresponding frequency duty ratio is the two frequency points (hereinafter referred to as worst frequency points) of the power supply with the worst performance. The worst frequency point is searched by using a manual frequency sweeping mode, a signal generator and an oscilloscope are required to be continuously adjusted, and a large number of manual operations have the defects of imprecise frequency point searching and low efficiency.
Disclosure of Invention
Therefore, an object of the embodiments of the present invention is to provide a method, apparatus, device, and readable medium for improving the dynamic response test precision of a power supply, which can ensure the stability of the current change rate in the dynamic response test within the whole test frequency range, improve the test accuracy, and improve the test efficiency.
Based on the above object, a method for improving the dynamic response test precision of a power supply according to an embodiment of the present invention includes the following steps:
calculating the frequency and the duty ratio of the voltage to be measured and judging whether the calculated frequency and duty ratio can ensure that the change rate of the current is unchanged;
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, converting the data information of the current and transmitting the data information to a signal generator to drive a load board;
the upper computer controls the oscilloscope to test the voltage and the current;
the upper computer reads waveform data measured by the oscilloscope and calculates the frequency and the duty ratio of the current according to the waveform data;
and adjusting the frequency and the duty ratio of the power supply to be measured, and repeatedly executing the steps until the worst frequency and the worst duty ratio of the power supply are found.
According to one embodiment of the present invention, further comprising:
responding to the calculated frequency and duty cycle to ensure that the change rate of the current is unchanged, and calculating the current span through the calculated frequency and duty cycle and the current change rate;
the voltage minimum is measured in a first current range, and the voltage maximum is measured in a second current range, wherein the first current range is a section of the current maximum minus the current span to the current maximum, and the second current range is a section of the current minimum to the current minimum plus the current span.
According to one embodiment of the present invention, calculating the current span by calculating the frequency and duty cycle and the current change rate includes:
the formula is used: istep=ts×duty×slewrate, wherein Istep is a current span, ts is a period of the current voltage to be measured, duty is a Duty ratio of the current voltage to be measured, and SlewRate is a current change rate.
According to one embodiment of the present invention, converting and transmitting data information of a present current to a signal generator to drive a load board in response to the calculated frequency and duty ratio can ensure that a rate of change of the current is constant includes:
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, and converting the current high-low value, frequency, duty ratio and current change rate into the high-low level, frequency, duty ratio and rising and falling time of the pulse signals in the signal generator;
and sending the converted high-low level, frequency, duty ratio and rising and falling time to a signal generator to drive the load board.
In another aspect of the embodiment of the present invention, there is also provided an apparatus for improving dynamic response test accuracy of a power supply, the apparatus including:
the judging module is configured to calculate the frequency and the duty ratio of the voltage to be detected and judge whether the calculated frequency and duty ratio can ensure that the change rate of the current is unchanged;
the conversion module is configured to respond to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, convert the data information of the current and send the data information to the signal generator to drive the load board;
the test module is configured to control the oscilloscope to test the voltage and the current by the upper computer;
the calculation module is configured to read waveform data measured by the oscilloscope by the upper computer and calculate the frequency and the duty ratio of the current according to the waveform data;
the adjusting module is configured to adjust the frequency and the duty ratio of the power supply to be measured, and repeatedly executes the steps until the worst frequency and the worst duty ratio of the power supply are found.
According to one embodiment of the invention, the computing module is further configured to:
responding to the calculated frequency and duty cycle to ensure that the change rate of the current is unchanged, and calculating the current span through the calculated frequency and duty cycle and the current change rate;
the voltage minimum is measured in a first current range, and the voltage maximum is measured in a second current range, wherein the first current range is a section of the current maximum minus the current span to the current maximum, and the second current range is a section of the current minimum to the current minimum plus the current span.
According to one embodiment of the invention, the computing module is further configured to:
the formula is used: istep=ts×duty×slewrate, wherein Istep is a current span, ts is a period of the current voltage to be measured, duty is a Duty ratio of the current voltage to be measured, and SlewRate is a current change rate.
According to one embodiment of the invention, the conversion module is further configured to:
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, and converting the current high-low value, frequency, duty ratio and current change rate into the high-low level, frequency, duty ratio and rising and falling time of the pulse signals in the signal generator;
and sending the converted high-low level, frequency, duty ratio and rising and falling time to a signal generator to drive the load board.
In another aspect of the embodiments of the present invention, there is also provided a computer apparatus including:
at least one processor; and
and a memory storing computer instructions executable on the processor, the instructions when executed by the processor performing the steps of any of the methods described above.
In another aspect of the embodiments of the present invention, there is also provided a computer-readable storage medium storing a computer program which, when executed by a processor, implements the steps of any of the methods described above.
The invention has the following beneficial technical effects: according to the method for improving the dynamic response test precision of the power supply, provided by the embodiment of the invention, the frequency and the duty ratio of the voltage to be tested are calculated, and whether the calculated frequency and duty ratio can ensure that the change rate of the current is unchanged is judged; responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, converting the data information of the current and transmitting the data information to a signal generator to drive a load board; the upper computer controls the oscilloscope to test the voltage and the current; the upper computer reads waveform data measured by the oscilloscope and calculates the frequency and the duty ratio of the current according to the waveform data; the frequency and the duty ratio of the power supply to be tested are adjusted, and the steps are repeatedly executed until the technical scheme of the worst frequency and the worst duty ratio of the power supply are found, so that the stability of the current change rate in the dynamic response test in the whole test frequency range can be ensured, the test accuracy is improved, and the test efficiency can be improved.
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In order to more clearly illustrate the embodiments of the invention or the technical solutions in the prior art, the drawings that are necessary for the description of the embodiments or the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the invention and that other embodiments may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic flow chart of a method of improving the accuracy of dynamic response testing of a power supply in accordance with one embodiment of the invention;
FIG. 2 is a schematic diagram of a system architecture for improving the accuracy of dynamic response testing of a power supply according to one embodiment of the present invention;
FIG. 3 is a schematic diagram of an apparatus for improving the dynamic response test accuracy of a power supply according to one embodiment of the invention;
FIG. 4 is a schematic diagram of a computer device according to one embodiment of the invention;
fig. 5 is a schematic diagram of a computer-readable storage medium according to one embodiment of the invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the following embodiments of the present invention will be described in further detail with reference to the accompanying drawings.
With the above object in view, in a first aspect, an embodiment of a method for improving power dynamic response test accuracy is provided. Fig. 1 shows a schematic flow chart of the method.
As shown in fig. 1, the method may include the steps of:
s1, calculating the frequency and the duty ratio of the voltage to be measured, and judging whether the calculated frequency and duty ratio can ensure that the change rate of the current is unchanged.
The method of the invention needs to be built in a test environment, as shown in fig. 2, the input end of a power supply to be tested is connected to an upper power supply, the output end of the power supply is connected with a load board, the driving signal input of the load board is connected to the output of a signal generator, the voltage and current detection end is connected to an oscilloscope, and the upper computer is connected to the oscilloscope and the signal generator through GPIB. The upper computer program is required to set a frequency range of the frequency sweep, frequency sweep precision, a current high-low value and a current change rate, and the upper computer program controls the signal generator and the oscilloscope to automatically complete frequency sweep test, so that the power supply voltage maximum value of each frequency point is obtained, test data are stored, and the worst frequency point is obtained through comparison.
In order to ensure that the current change rate is kept unchanged when testing different frequency points, before the upper computer sends a command to the signal generator, firstly, calculating whether the frequency Duty ratio of the current frequency point to be tested can meet the current change rate requirement, if so, continuously executing the following measurement, if not, keeping the current change rate unchanged by reducing the current span Istep, and calculating the current span by using the formula istep=ts. The decreasing current span reduces the rise and fall time, thereby maintaining the current rate of change, and as the test frequency increases gradually, istep decreases accordingly. For example, the current varies from 10A to 20A, and the maximum and minimum voltages are measured directly at the same time when the current is 10A to 20A, namely, the voltage minimum is measured at the current range [20A-Istep,20A ] and the voltage maximum is measured at the current [10A,10A+Istep ].
S2, responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, converting the data information of the current and transmitting the data information to a signal generator to drive the load board.
If the calculated frequency and duty ratio can ensure that the change rate of the current is unchanged, converting the current high-low value, frequency, duty ratio and current change rate into the high-low level, frequency, duty ratio and rising and falling time of a pulse signal in the signal generator, and then transmitting the converted high-low level, frequency, duty ratio and rising and falling time to the signal generator to drive the load board.
And S3, the upper computer controls the oscilloscope to test the voltage and the current.
And S4, the upper computer reads waveform data measured by the oscilloscope and calculates the frequency and the duty ratio of the current according to the waveform data.
The upper computer reads waveform data of current in the oscilloscope, and uses a digital second-order band-pass filter to filter, so as to calculate and obtain accurate frequency and duty ratio of the current.
S5, adjusting the frequency and the duty ratio of the power supply to be tested, and repeatedly executing the steps until the worst frequency and the worst duty ratio of the power supply are found.
And (3) adjusting the frequency and the duty ratio of the power supply to be tested, and repeating the test until the worst frequency and the worst duty ratio of the power supply are found.
By the technical scheme, the stability of the current change rate in the dynamic response test in the whole test frequency range can be ensured, the test accuracy is improved, and the test efficiency can be improved.
In a preferred embodiment of the present invention, further comprising:
responding to the calculated frequency and duty cycle to ensure that the change rate of the current is unchanged, and calculating the current span through the calculated frequency and duty cycle and the current change rate;
the voltage minimum is measured in a first current range, and the voltage maximum is measured in a second current range, wherein the first current range is a section of the current maximum minus the current span to the current maximum, and the second current range is a section of the current minimum to the current minimum plus the current span. For example, the current varies from 10A to 20A, and the maximum and minimum voltages are measured directly at the same time when the current is 10A to 20A, namely, the voltage minimum is measured at the current range [20A-Istep,20A ] and the voltage maximum is measured at the current [10A,10A+Istep ].
In a preferred embodiment of the invention, calculating the current span by calculating the frequency and duty cycle and the current rate of change comprises:
the formula is used: istep=ts×duty×slewrate, wherein Istep is a current span, ts is a period of the current voltage to be measured, duty is a Duty ratio of the current voltage to be measured, and SlewRate is a current change rate.
In a preferred embodiment of the present invention, converting and transmitting data information of the present current to the signal generator to drive the load board in response to the calculated frequency and duty ratio can ensure that the rate of change of the current is constant comprises:
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, and converting the current high-low value, frequency, duty ratio and current change rate into the high-low level, frequency, duty ratio and rising and falling time of the pulse signals in the signal generator;
and sending the converted high-low level, frequency, duty ratio and rising and falling time to a signal generator to drive the load board.
The invention has the following beneficial effects:
1. the upper computer control program is used for controlling the load current, so that the stability of the current change rate in the whole test frequency range in the dynamic response test is ensured, and the test accuracy is improved.
2. Accurate measurement of the current frequency and the duty cycle is achieved through a program algorithm.
3. The upper computer is adopted for automatic sweep frequency test, so that the test efficiency is improved.
It should be noted that, it will be understood by those skilled in the art that all or part of the procedures in implementing the methods of the above embodiments may be implemented by a computer program to instruct related hardware, and the above program may be stored in a computer readable storage medium, and the program may include the procedures of the embodiments of the above methods when executed. Wherein the storage medium may be a magnetic disk, an optical disk, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), or the like. The computer program embodiments described above may achieve the same or similar effects as any of the method embodiments described above.
Furthermore, the method disclosed according to the embodiment of the present invention may also be implemented as a computer program executed by a CPU, which may be stored in a computer-readable storage medium. When executed by a CPU, performs the functions defined above in the methods disclosed in the embodiments of the present invention.
In view of the above object, a second aspect of the embodiments of the present invention provides an apparatus for improving power dynamic response testing precision, as shown in fig. 3, an apparatus 200 includes:
the judging module is configured to calculate the frequency and the duty ratio of the voltage to be detected and judge whether the calculated frequency and duty ratio can ensure that the change rate of the current is unchanged;
the conversion module is configured to respond to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, convert the data information of the current and send the data information to the signal generator to drive the load board;
the test module is configured to control the oscilloscope to test the voltage and the current by the upper computer;
the calculation module is configured to read waveform data measured by the oscilloscope by the upper computer and calculate the frequency and the duty ratio of the current according to the waveform data;
the adjusting module is configured to adjust the frequency and the duty ratio of the power supply to be measured, and repeatedly executes the steps until the worst frequency and the worst duty ratio of the power supply are found.
In a preferred embodiment of the invention, the computing module is further configured to:
responding to the calculated frequency and duty cycle to ensure that the change rate of the current is unchanged, and calculating the current span through the calculated frequency and duty cycle and the current change rate;
the voltage minimum is measured in a first current range, and the voltage maximum is measured in a second current range, wherein the first current range is a section of the current maximum minus the current span to the current maximum, and the second current range is a section of the current minimum to the current minimum plus the current span.
In a preferred embodiment of the invention, the computing module is further configured to:
the formula is used: istep=ts×duty×slewrate, wherein Istep is a current span, ts is a period of the current voltage to be measured, duty is a Duty ratio of the current voltage to be measured, and SlewRate is a current change rate.
In a preferred embodiment of the invention, the conversion module is further configured to:
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, and converting the current high-low value, frequency, duty ratio and current change rate into the high-low level, frequency, duty ratio and rising and falling time of the pulse signals in the signal generator;
and sending the converted high-low level, frequency, duty ratio and rising and falling time to a signal generator to drive the load board.
Based on the above object, a third aspect of the embodiments of the present invention proposes a computer device. Fig. 4 is a schematic diagram of an embodiment of a computer device provided by the present invention. As shown in fig. 4, an embodiment of the present invention includes the following means: at least one processor 21; and a memory 22, the memory 22 storing computer instructions 23 executable on the processor, the instructions when executed by the processor performing the method of:
calculating the frequency and the duty ratio of the voltage to be measured and judging whether the calculated frequency and duty ratio can ensure that the change rate of the current is unchanged;
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, converting the data information of the current and transmitting the data information to a signal generator to drive a load board;
the upper computer controls the oscilloscope to test the voltage and the current;
the upper computer reads waveform data measured by the oscilloscope and calculates the frequency and the duty ratio of the current according to the waveform data;
and adjusting the frequency and the duty ratio of the power supply to be measured, and repeatedly executing the steps until the worst frequency and the worst duty ratio of the power supply are found.
In a preferred embodiment of the present invention, further comprising:
responding to the calculated frequency and duty cycle to ensure that the change rate of the current is unchanged, and calculating the current span through the calculated frequency and duty cycle and the current change rate;
the voltage minimum is measured in a first current range, and the voltage maximum is measured in a second current range, wherein the first current range is a section of the current maximum minus the current span to the current maximum, and the second current range is a section of the current minimum to the current minimum plus the current span.
In a preferred embodiment of the invention, calculating the current span by calculating the frequency and duty cycle and the current rate of change comprises:
the formula is used: istep=ts×duty×slewrate, wherein Istep is a current span, ts is a period of the current voltage to be measured, duty is a Duty ratio of the current voltage to be measured, and SlewRate is a current change rate.
In a preferred embodiment of the present invention, converting and transmitting data information of the present current to the signal generator to drive the load board in response to the calculated frequency and duty ratio can ensure that the rate of change of the current is constant comprises:
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, and converting the current high-low value, frequency, duty ratio and current change rate into the high-low level, frequency, duty ratio and rising and falling time of the pulse signals in the signal generator;
and sending the converted high-low level, frequency, duty ratio and rising and falling time to a signal generator to drive the load board.
Based on the above object, a fourth aspect of the embodiments of the present invention proposes a computer-readable storage medium. Fig. 5 is a schematic diagram showing an embodiment of a computer-readable storage medium provided by the present invention. As shown in fig. 5, the computer-readable storage medium 31 stores a computer program 32 that, when executed by a processor, performs the following method:
calculating the frequency and the duty ratio of the voltage to be measured and judging whether the calculated frequency and duty ratio can ensure that the change rate of the current is unchanged;
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, converting the data information of the current and transmitting the data information to a signal generator to drive a load board;
the upper computer controls the oscilloscope to test the voltage and the current;
the upper computer reads waveform data measured by the oscilloscope and calculates the frequency and the duty ratio of the current according to the waveform data;
and adjusting the frequency and the duty ratio of the power supply to be measured, and repeatedly executing the steps until the worst frequency and the worst duty ratio of the power supply are found.
In a preferred embodiment of the present invention, further comprising:
responding to the calculated frequency and duty cycle to ensure that the change rate of the current is unchanged, and calculating the current span through the calculated frequency and duty cycle and the current change rate;
the voltage minimum is measured in a first current range, and the voltage maximum is measured in a second current range, wherein the first current range is a section of the current maximum minus the current span to the current maximum, and the second current range is a section of the current minimum to the current minimum plus the current span.
In a preferred embodiment of the invention, calculating the current span by calculating the frequency and duty cycle and the current rate of change comprises:
the formula is used: istep=ts×duty×slewrate, wherein Istep is a current span, ts is a period of the current voltage to be measured, duty is a Duty ratio of the current voltage to be measured, and SlewRate is a current change rate.
In a preferred embodiment of the present invention, converting and transmitting data information of the present current to the signal generator to drive the load board in response to the calculated frequency and duty ratio can ensure that the rate of change of the current is constant comprises:
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, and converting the current high-low value, frequency, duty ratio and current change rate into the high-low level, frequency, duty ratio and rising and falling time of the pulse signals in the signal generator;
and sending the converted high-low level, frequency, duty ratio and rising and falling time to a signal generator to drive the load board.
Furthermore, the method disclosed according to the embodiment of the present invention may also be implemented as a computer program executed by a processor, which may be stored in a computer-readable storage medium. The above-described functions defined in the methods disclosed in the embodiments of the present invention are performed when the computer program is executed by a processor.
Furthermore, the above-described method steps and system units may also be implemented using a controller and a computer-readable storage medium storing a computer program for causing the controller to implement the above-described steps or unit functions.
Those of skill would further appreciate that the various illustrative logical blocks, modules, circuits, and algorithm steps described in connection with the disclosure herein may be implemented as electronic hardware, computer software, or combinations of both. To clearly illustrate this interchangeability of hardware and software, various illustrative components, blocks, modules, circuits, and steps have been described above generally in terms of their functionality. Whether such functionality is implemented as software or hardware depends upon the particular application and design constraints imposed on the overall system. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present disclosure.
In one or more exemplary designs, the functions may be implemented in hardware, software, firmware, or any combination thereof. If implemented in software, the functions may be stored on or transmitted over as one or more instructions or code on a computer-readable medium. Computer-readable media includes both computer storage media and communication media including any medium that facilitates transfer of a computer program from one location to another. A storage media may be any available media that can be accessed by a general purpose or special purpose computer. By way of example, and not limitation, such computer-readable media can comprise RAM, ROM, EEPROM, CD-ROM or other optical disk storage, magnetic disk storage or other magnetic storage devices, or any other medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a general purpose or special purpose computer or general purpose or special purpose processor. Further, any connection is properly termed a computer-readable medium. For example, if the software is transmitted from a website, server, or other remote source using a coaxial cable, fiber optic cable, twisted pair, digital Subscriber Line (DSL), or wireless technologies such as infrared, radio, and microwave, then the coaxial cable, fiber optic cable, twisted pair, DSL, or wireless technologies such as infrared, radio, and microwave are included in the definition of medium. Disk and disc, as used herein, includes Compact Disc (CD), laser disc, optical disc, digital Versatile Disc (DVD), floppy disk, blu-ray disc where disks usually reproduce data magnetically, while discs reproduce data optically with lasers. Combinations of the above should also be included within the scope of computer-readable media.
The foregoing is an exemplary embodiment of the present disclosure, but it should be noted that various changes and modifications could be made herein without departing from the scope of the disclosure as defined by the appended claims. The functions, steps and/or actions of the method claims in accordance with the disclosed embodiments described herein need not be performed in any particular order. Furthermore, although elements of the disclosed embodiments may be described or claimed in the singular, the plural is contemplated unless limitation to the singular is explicitly stated.
It should be understood that as used herein, the singular forms "a", "an", and "the" are intended to include the plural forms as well, unless the context clearly supports the exception. It should also be understood that "and/or" as used herein is meant to include any and all possible combinations of one or more of the associated listed items.
The foregoing embodiment of the present invention has been disclosed with reference to the number of embodiments for the purpose of description only, and does not represent the advantages or disadvantages of the embodiments.
It will be understood by those skilled in the art that all or part of the steps for implementing the above embodiments may be implemented by hardware, or may be implemented by a program for instructing relevant hardware, and the program may be stored in a computer readable storage medium, where the storage medium may be a read-only memory, a magnetic disk or an optical disk, etc.
Those of ordinary skill in the art will appreciate that: the above discussion of any embodiment is merely exemplary and is not intended to imply that the scope of the disclosure of embodiments of the invention, including the claims, is limited to such examples; combinations of features of the above embodiments or in different embodiments are also possible within the idea of an embodiment of the invention, and many other variations of the different aspects of the embodiments of the invention as described above exist, which are not provided in detail for the sake of brevity. Therefore, any omission, modification, equivalent replacement, improvement, etc. of the embodiments should be included in the protection scope of the embodiments of the present invention.
Claims (6)
1. The method for improving the dynamic response test precision of the power supply is characterized by comprising the following steps of:
the method comprises the steps of building a test environment, connecting an input end of a power supply to be tested to an upper-level power supply, connecting an output end of the power supply to be tested to a load board, connecting a driving signal input of the load board to an output of a signal generator, connecting a voltage and current detection end to an oscilloscope, and connecting an upper computer to the oscilloscope and the signal generator through GPIB;
calculating the frequency and the duty ratio of the voltage to be measured and judging whether the calculated frequency and duty ratio can ensure that the change rate of the current is unchanged;
if the current change rate is unchanged, continuing to perform the following measurement, and if the current change rate is unchanged, keeping the current change rate unchanged by reducing the current span Istep, using the formula: istep=ts×duty×slewrate, wherein Istep is a current span, ts is a period of the current voltage to be measured, duty is a Duty ratio of the current voltage to be measured, and SlewRate is a current change rate;
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, converting the data information of the current and transmitting the data information to a signal generator to drive a load board;
the upper computer controls the oscilloscope to test the voltage and the current, measures the minimum voltage in a first current range, and measures the maximum voltage in a second current range, wherein the first current range is a section from the maximum current to the maximum current by subtracting the current span, and the second current range is a section from the minimum current to the minimum current plus the current span;
the upper computer reads waveform data measured by the oscilloscope and calculates the frequency and the duty ratio of the current according to the waveform data;
and adjusting the frequency and the duty ratio of the power supply to be measured, and repeatedly executing the steps until the worst frequency and the worst duty ratio of the power supply are found.
2. The method of claim 1, wherein converting and transmitting data information of the present current to the signal generator to drive the load board in response to the calculated frequency and duty cycle to ensure a constant rate of change of the current comprises:
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, and converting the current high-low value, frequency, duty ratio and current change rate into the high-low level, frequency, duty ratio and rising and falling time of the pulse signals in the signal generator;
and sending the converted high-low level, frequency, duty ratio and rising and falling time to a signal generator to drive a load board.
3. An apparatus for improving the accuracy of dynamic response testing of a power supply, said apparatus comprising:
the building module is configured to connect the input end of the power supply to be tested to the upper power supply, the output end of the power supply to be tested is connected with the load board, the driving signal input of the load board is connected to the output of the signal generator, the voltage and current detection end is connected to the oscilloscope, and the upper computer is connected to the oscilloscope and the signal generator through the GPIB;
the judging module is configured to calculate the frequency and the duty ratio of the voltage to be detected and judge whether the calculated frequency and duty ratio can ensure that the change rate of the current is unchanged;
the calculation module is configured to continuously perform the following measurement if the change rate of the current is unchanged, and to keep the change rate of the current unchanged by reducing the current span Istep if the change rate of the current is not changed, using the formula: istep=ts×duty×slewrate, wherein Istep is a current span, ts is a period of the current voltage to be measured, duty is a Duty ratio of the current voltage to be measured, and SlewRate is a current change rate;
the conversion module is configured to respond to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, convert the data information of the current and send the data information to the signal generator to drive the load board;
the test module is configured to test voltage and current by the upper computer control oscilloscope, measures a voltage minimum value in a first current range, and measures a voltage maximum value in a second current range, wherein the first current range is a section from the current maximum value minus the current span to the current maximum value, and the second current range is a section from the current minimum value to the current minimum value plus the current span;
the reading module is configured to read the waveform data measured by the oscilloscope by the upper computer and calculate the frequency and the duty ratio of the current according to the waveform data;
and the adjusting module is configured to adjust the frequency and the duty ratio of the power supply to be tested, and repeatedly execute each module in the device for improving the dynamic response test precision of the power supply until the worst frequency and the worst duty ratio of the power supply are found.
4. The apparatus of claim 3, wherein the conversion module is further configured to:
responding to the calculated frequency and duty ratio to ensure that the change rate of the current is unchanged, and converting the current high-low value, frequency, duty ratio and current change rate into the high-low level, frequency, duty ratio and rising and falling time of the pulse signals in the signal generator;
and sending the converted high-low level, frequency, duty ratio and rising and falling time to a signal generator to drive a load board.
5. A computer device, comprising:
at least one processor; and
a memory storing computer instructions executable on the processor, which when executed by the processor, perform the steps of the method of any one of claims 1-2.
6. A computer readable storage medium storing a computer program, characterized in that the computer program when executed by a processor implements the steps of the method of any one of claims 1-2.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105699912A (en) * | 2012-06-21 | 2016-06-22 | 九尊城网络科技（深圳）有限公司 | Power supply load test device |
| CN108776293A (en) * | 2018-09-21 | 2018-11-09 | 河北工业大学 | The test method of organic electroluminescence device alternating temperature multiple-pulse transient current response |
| CN110032483A (en) * | 2019-04-15 | 2019-07-19 | 苏州浪潮智能科技有限公司 | A kind of method, apparatus and medium adjusting test parameter |
| CN111209654A (en) * | 2019-12-29 | 2020-05-29 | 苏州浪潮智能科技有限公司 | PDN frequency impedance test system and method |
| CN111257788A (en) * | 2020-03-08 | 2020-06-09 | 苏州浪潮智能科技有限公司 | Dynamic test method, system, equipment and medium of power supply |
-
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- 2021-11-19 CN CN202111399186.9A patent/CN114355226B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105699912A (en) * | 2012-06-21 | 2016-06-22 | 九尊城网络科技（深圳）有限公司 | Power supply load test device |
| CN108776293A (en) * | 2018-09-21 | 2018-11-09 | 河北工业大学 | The test method of organic electroluminescence device alternating temperature multiple-pulse transient current response |
| CN110032483A (en) * | 2019-04-15 | 2019-07-19 | 苏州浪潮智能科技有限公司 | A kind of method, apparatus and medium adjusting test parameter |
| CN111209654A (en) * | 2019-12-29 | 2020-05-29 | 苏州浪潮智能科技有限公司 | PDN frequency impedance test system and method |
| CN111257788A (en) * | 2020-03-08 | 2020-06-09 | 苏州浪潮智能科技有限公司 | Dynamic test method, system, equipment and medium of power supply |
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