CN114355089B - Electromagnetic environment effect boundary testing method for electronic system - Google Patents
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Abstract
The invention discloses an electromagnetic environment effect boundary test method for an electronic system, which comprises the following steps of S1, carrying out a sensitive threshold stability test on the tested electronic system; s2, setting five types of basic signals, and performing sensitivity threshold test on the tested electronic system by using the five types of basic signals respectively; s3, performing time correlation analysis and expansion test on the tested electronic system, and judging the time correlation sensitive type and the corresponding most sensitive signal of the tested electronic system; s4, performing bandwidth correlation analysis and expansion test on the tested electronic system, and judging the bandwidth correlation sensitive type and the corresponding most sensitive signal of the tested electronic system; and S5, combining the most sensitive signal corresponding to the time-related sensitive type with the bandwidth-related sensitive type and the corresponding most sensitive signal, and testing the tested electronic system by using the combined sensitive signal to generate a sensitive threshold value curve T6. The invention can comprehensively examine the boundary problem of the system and provides a basis for the electromagnetic environment adaptability judgment of the electronic system in an unknown environment.
Description
Technical Field
The present invention relates to electromagnetic environment testing, and more particularly, to a method for testing electromagnetic environment effect boundaries of an electronic system.
Background
With the wide application of new technologies such as 5G, Internet of things, artificial intelligence and the like in the society, the electromagnetic environment of an electronic information system is increasingly complex, the caused electromagnetic compatibility problem is increased day by day, and challenges are provided for the design, development and use of the electronic information system. The problem of electromagnetic environment effect generated by an electronic information system in an electromagnetic environment is not well solved, and serious self-interference and mutual interference problems can be generated, so that the performance of the electronic information system is influenced.
For an electronic information system in the design and development stage, the electromagnetic environment effect boundary is clearly known, the environment in which the electronic information system can work can be clearly described, and the performance can be achieved.
The current electromagnetic compatibility test of the electronic information system mainly adopts single signal test, has the problem that the boundary of the system can not be comprehensively inspected, and can not provide basis for the electromagnetic environment adaptability of the electronic information system in unknown environment.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provide the method for testing the electromagnetic environment effect boundary of the electronic system, which can comprehensively examine the problem of the system boundary and provide a basis for judging the electromagnetic environment adaptability of the electronic system in an unknown environment.
The purpose of the invention is realized by the following technical scheme: a method for electromagnetic environment effect boundary testing for an electronic system, comprising the steps of:
s1, carrying out a sensitivity threshold stability test on a tested electronic system;
the step S1 includes:
s101, presetting a frequency point and a signal waveform of a stability test signal;
s102, setting time nodes for stability testing as follows:
continuously testing for three times at the beginning of the test, wherein each time interval is 1 minute, and testing the short-time stability of the sensitive state;
the test is carried out every 2 hours after the test is started, so that the stability of the sensitive state in the test is ensured;
carrying out one test after the test is finished;
s103, testing the tested electronic system under the set time nodes by using the stability test signal, and recording the sensitivity threshold values measured under each time node as A1, A2 and … An; wherein n represents the number of total tests;
s104, judging the stability of the sensitive threshold:
first of all, calculate
Where i ∈ [1, n ]]，
Is the average of a1, a2, … An;
if the MAD is less than or equal to 2dB, the sensitivity threshold is considered to be relatively stable, the step S2 is entered, and if the MAD is less than or equal to 2dB, the step S101 is returned.
S2, setting five types of basic signals, and performing sensitivity threshold test on the tested electronic system by using the five types of basic signals respectively to obtain sensitivity threshold test curves T1-T5;
the step S2 includes the steps of:
s201, setting five types of basic signals, namely:
the 1 st type signal adopts a single-frequency signal of which the modulation mode is single-frequency continuous wave;
the 2 nd type signal adopts a modulation mode of pulse amplitude modulation, the duty ratio is 50 percent, and the pulse frequency is 1 kHz;
the 3 rd type signal adopts a modulation mode of pulse amplitude modulation, the duty ratio is 10 percent, and the pulse frequency is 1 kHz;
the modulation mode adopted by the 4 th signal is sinusoidal frequency modulation, the frequency deviation is 0.1 time of the medium frequency bandwidth, and the baseband frequency is 10 kHz;
the 5 th type of signals adopt a sinusoidal frequency modulation mode, frequency deviation is 0.9 times of medium frequency bandwidth, and baseband frequency is 10 kHz;
s202, for the type 1 signal, at each frequency point in a test frequency range, applying the type 1 signal of the frequency point to the tested electronic system, carrying out sensitivity threshold test to obtain a sensitivity threshold under each frequency point of the type 1 signal, and drawing to obtain a sensitivity threshold test curve T1; in the sensitive threshold test curve T1, the abscissa of each point is a frequency point within the test frequency range, and the ordinate is a sensitive threshold corresponding to the frequency point;
s203, replacing the first class signals with class 2-5 signals respectively, and repeating the step S202 after each replacement to obtain sensitive threshold test curves T2, T3, T4 and T5 which respectively represent the sensitive threshold test curves corresponding to the class 2,3,4 and 5 signals.
S3, performing time correlation analysis and expansion test on the tested electronic system, and judging the time correlation sensitive type and the corresponding most sensitive signal of the tested electronic system;
the step S3 includes the following sub-steps:
s301, according to the sensitivity threshold test curves T1, T2 and T3, carrying out the following preliminary judgment:
if T1> T3> T2, the sensitive type is a peak type, no time correlation exists, time correlation analysis is not needed to be carried out continuously, and the most sensitive signal is a type 2 signal;
if T3> T1> T2 or T3> T2> T1 does not determine the sensitive type and does not determine whether time correlation exists, the step S302 is entered, and an item expansion test is carried out;
for any curve Ti and Tj, the value ranges of i and j are {1,2,3,4 and 5} and i is not equal to j; if any frequency point in the test frequency range meets the following requirements: the sensitivity threshold value of the frequency point corresponding to the curve Ti is larger than the sensitivity threshold value of the frequency point corresponding to the curve Tj; then Ti > Tj is considered;
s302, selecting a test signal as a pulse amplitude modulation signal, wherein the pulse frequency is 1kHz, the duty ratio is 10% -90%, a point is taken every 10%, and under 9 different duty ratios, performing a sensitive threshold test on the tested electronic system by using the test signal to obtain a threshold curve Ta1-Ta 9:
observing the sudden change condition of the threshold curve, if the magnitude values from Ta1 to Ta9 are uniformly and monotonically decreased, judging that the sensitive type is a power type, and performing subsequent time correlation test is not needed, wherein the most sensitive signal is a type 1 signal;
if the mutation performance between the Ta1 and Ta9 values is reduced, the time correlation is judged, the duty ratio value corresponding to the mutation position at the time is recorded, and the duty ratio value is recorded as the critical duty ratio on the basis of the higher duty ratio;
s303, multi-pulse period testing: selecting the test signal as a pulse amplitude modulation signal, respectively taking 500 microseconds and 2 milliseconds for a pulse period, and respectively testing the critical duty ratios as alpha 1 and alpha 2 according to the duty ratio scanning test method in the step S302;
if the absolute value of alpha 1-alpha 0 is less than 10% and the absolute value of alpha 2-alpha 0 is less than 10%, the method is determined as a time-based comparison type; the most sensitive signal is pulse amplitude modulation, the pulse frequency is 1kHz, and the duty ratio is alpha + 5%;
if α 1<α0<Alpha 2, and the value fluctuation exceeds 10 percent, the model is judged to be an undisturbed time type, and the critical undisturbed time t L 1ms (1- α 0); the most sensitive signals are: pulse amplitude modulation, pulse period 2t L The duty ratio is 60%;
if α 1>α0>Alpha 2, and the value fluctuation exceeds 10 percent, the method is judged to be of the disturbing time type, and the critical disturbing time t is H α 0 for 1 ms; the most sensitive signals are: pulse amplitude modulation, pulse period 2t H And the duty cycle is 60%.
S4, performing bandwidth correlation analysis and expansion test on the tested electronic system, and judging the bandwidth correlation sensitive type and the corresponding most sensitive signal of the tested electronic system;
the step S4 includes the following sub-steps:
s401, according to the test curves of T1, T4 and T5, carrying out the following preliminary sensitivity type judgment:
if T1> T4> T5, the signal is in positive correlation of bandwidth and in a broadband type;
if T1< T4< T5, the signal is of a bandwidth negative correlation and narrow-band type;
if the change is not monotonous, the fluctuation of the magnitude is less than 3dB, and no correlation exists;
if the variation is not monotone, the fluctuation of the magnitude is more than 3dB, the step S402 is entered;
s402, setting a test signal as a sine frequency modulation signal, setting a base band frequency to be 10kHz, and setting frequency deviation as the following multiple of a medium frequency bandwidth: 0.01, 0.03, 0.1, 0.3, 1, 3 and 10, and carrying out sensitive threshold test on the tested electronic system under different frequency offsets to obtain a threshold curve Tc1-Tc 7;
if Tc1-Tc7 monotonically rises, then it is determined as a narrow band;
if Tc1-Tc7 monotonically decreases, the determination is broad-band type;
if Tc1-Tc7 firstly falls and then rises, the frequency offset is determined to be of a specific bandwidth type, and the frequency offset corresponding to the lowest magnitude is marked as B;
s403, determining the most sensitive signal according to the sensitive type:
for the uncorrelated type, no frequency modulation needs to be applied
For the broadband type, the most sensitive signal is applied with sine frequency modulation, and the frequency deviation is 10 times of the intermediate frequency bandwidth;
for the narrow-band type, the most sensitive signal is applied with sine frequency modulation, and the frequency deviation is 0.01 times of the medium-frequency bandwidth;
for a particular bandwidth type, the most sensitive signal is to apply a sinusoidal frequency modulation with a frequency offset of B.
And S5, combining the most sensitive signal corresponding to the time-related sensitive type with the bandwidth-related sensitive type and the corresponding most sensitive signal to obtain a final combined sensitive signal, and testing the tested electronic system by using the combined sensitive signal to generate a sensitive threshold value curve T6.
The invention has the beneficial effects that: the invention comprehensively examines the system boundary, can deduce the electromagnetic environment effect mechanism of the electronic system through the test result and obtain the quantitative sensitivity criterion, and provides a basis for the adaptability prediction of the electronic system in the unknown environment.
Drawings
FIG. 1 is a flow chart of a method of the present invention;
FIG. 2 is a schematic diagram of a time correlation analysis process;
fig. 3 is a schematic diagram of a bandwidth correlation analysis and expansion test flow.
Detailed Description
The technical solutions of the present invention are further described in detail below with reference to the accompanying drawings, but the scope of the present invention is not limited to the following.
As shown in fig. 1, a method for testing electromagnetic environment effect boundary of electronic system includes the following steps:
s1, performing a sensitive threshold stability test on a tested electronic system;
the step S1 includes:
s101, presetting a frequency point and a signal waveform of a stability test signal;
s102, setting time nodes for stability testing as follows:
continuously testing for three times at the beginning of the test, wherein each time interval is 1 minute, and testing the short-time stability of the sensitive state;
the test is carried out every 2 hours after the test is started, so that the stability of the sensitive state in the test is ensured;
carrying out one test after the test is finished;
s103, testing the tested electronic system under the set time nodes by using the stability test signal, and recording the sensitivity threshold values measured under each time node as A1, A2 and … An; wherein n represents the number of total tests;
s104, judging the stability of the sensitive threshold:
first, calculate
Where i ∈ [1, n ]]，
Is the average of a1, a2, … An;
if the MAD is less than or equal to 2dB, the sensitivity threshold value is considered to be relatively stable, the step S2 is entered, and if the MAD is less than or equal to 2dB, the step S101 is returned.
The sensitive threshold value refers to the level of an interference signal causing equipment, a subsystem and a system to be abnormal; wherein causing the equipment, subsystem and system exception comprises: causing the device, subsystem, system to exhibit minimal identifiable undesirable responses and causing the device, subsystem, system performance to degrade.
The system sensitivity threshold is highly susceptible to operating conditions, operating environments and test arrangements. To ensure the validity of the data, it should be determined that the sensitivity threshold remains relatively stable under a set of test conditions; if the sensitivity threshold is unstable, changing the working environment and the test arrangement, and carrying out the stability test of the sensitivity threshold again until the sensitivity threshold is relatively stable;
s2, setting five types of basic signals, and performing sensitive threshold test on the tested electronic system by using the five types of basic signals respectively to obtain a sensitive threshold test curve T1-T5;
the step S2 includes the steps of:
s201, setting five types of basic signals as shown in table 1, wherein the 1 st signal is a single-frequency continuous wave, is a reference signal in the microwave radio frequency field, and has complete interference time occupation and lowest bandwidth occupation. The 2 nd and 3 rd signals are pulse amplitude modulated and have different time occupancy and extremely low bandwidth occupancy, and the time correlation of sensitive effects can be deduced by comparing the 1,2 and 3 signals. The 4 th and 5 th signals are sine frequency modulation and have full time occupation and different bandwidth occupation, and the bandwidth correlation of the sensitive effect can be deduced by comparing the 1 st, 4 th and 5 th signals. Because the bandwidth correlation only possibly occurs in a radio frequency front-end system, the 4 th and 5 th signals are only applied to the radio frequency front-end system and are not used for a non-radio frequency system or a non-radio frequency test point (such as rear-end cable injection and the like); similarly, the non-radio frequency system or the test point does not need to perform bandwidth correlation analysis.
TABLE 1 five basic sensitivity test signals
S202, for the type 1 signal, at each frequency point in a test frequency range, applying the type 1 signal of the frequency point to the tested electronic system, carrying out sensitivity threshold test to obtain a sensitivity threshold under each frequency point of the type 1 signal, and drawing to obtain a sensitivity threshold test curve T1; in the sensitive threshold test curve T1, the abscissa of each point is a frequency point within the test frequency range, and the ordinate is a sensitive threshold corresponding to the frequency point;
s203, replacing the first class signals with class 2-5 signals respectively, and repeating the step S202 after each replacement to obtain sensitive threshold test curves T2, T3, T4 and T5 which respectively represent the sensitive threshold test curves corresponding to the class 2,3,4 and 5 signals.
S3, performing time correlation analysis and expansion test on the tested electronic system, and judging the time correlation sensitive type and the corresponding most sensitive signal of the tested electronic system;
as shown in fig. 2, the step S3 includes the following sub-steps:
s301, according to the sensitivity threshold test curves T1, T2 and T3, carrying out the following preliminary judgment:
if T1> T3> T2, the sensitive type is a peak type, no time correlation exists, time correlation analysis is not needed to be carried out continuously, and the most sensitive signal is a type 2 signal;
if the T3 is more than T1, T2 or T3, T2 and T1, the sensitive type is not determined, and whether time correlation exists is not determined, the step S302 is carried out, and an item expansion test is carried out;
in the embodiment of the present application, a specific determination method is shown in table 2 below:
TABLE 2 basic determination of sensitivity effect type (time dependence) of the system under test
For the peak type, time correlation analysis does not need to be continued, and no additional criterion parameter exists. The most sensitive signal can be directly output as a type 2 signal.
For any curve Ti and Tj, the value ranges of i and j are {1,2,3,4 and 5} and i is not equal to j; if any frequency point in the test frequency range meets the following requirements: the sensitivity threshold value of the frequency point corresponding to the curve Ti is larger than the sensitivity threshold value of the frequency point corresponding to the curve Tj; then Ti > Tj is considered;
s302, selecting the test signal as a pulse amplitude modulation signal, wherein the pulse frequency is 1kHz, the duty ratio is 10% -90%, a point is taken every 10%, and the sensitive threshold test is carried out on the tested electronic system by using the test signal under 9 different duty ratios (according to the mode of the step S202) to obtain a threshold curve Ta1-Ta 9:
observing the sudden change condition of the threshold curve, if the magnitude values from Ta1 to Ta9 are uniformly and monotonically decreased, judging that the sensitive type is a power type, and performing subsequent time correlation test is not needed, wherein the most sensitive signal is a type 1 signal;
if the mutation performance between the Ta1 and Ta9 values is reduced, the time correlation is judged, the duty ratio value corresponding to the mutation position at the time is recorded, and the duty ratio value is recorded as the critical duty ratio on the basis of the higher duty ratio; for example, if a sudden change occurs between Ta6 and Ta7, the critical duty cycle α 0 is recorded as 70%. And continuing to perform subsequent time correlation tests.
S303, multi-pulse period testing: selecting the test signal as a pulse amplitude modulation signal, respectively taking 500 microseconds and 2 milliseconds for a pulse period, and respectively testing the critical duty ratios as alpha 1 and alpha 2 according to the duty ratio scanning test method in the step S302;
if the | alpha 1-alpha 0| < 10% and the | alpha 2-alpha 0| < 10%, determining that the time accounts for the proportion type; the most sensitive signal is pulse amplitude modulation, the pulse frequency is 1kHz, and the duty ratio is alpha + 5%;
if α 1<α0<Alpha 2, and the value fluctuation exceeds 10 percent, the model is judged to be an undisturbed time type, and the critical undisturbed time t L 1ms (1- α 0); the most sensitive signals are: pulse amplitude modulation, pulse period 2t L The duty ratio is 60%;
if α 1>α0>Alpha 2, and the value fluctuation exceeds 10 percent, the method is judged to be of the disturbing time type, and the critical disturbing time t is H 1ms α 0; the most sensitive signals are: pulse amplitude modulation, pulse period 2t H And the duty cycle is 60%.
Other cases are not within the scope of the present invention and the present invention is not applicable.
In the examples of the present application, the analysis results are shown in table 3 below:
TABLE 3 time correlation analysis valid data results
S4, performing bandwidth correlation analysis and expansion test on the tested electronic system, and judging the bandwidth correlation sensitive type and the corresponding most sensitive signal of the tested electronic system;
as shown in fig. 3, the step S4 includes the following sub-steps:
s401, according to the test curves of T1, T4 and T5, carrying out the following preliminary sensitivity type judgment:
if T1> T4> T5, the signal is in positive correlation of bandwidth and in a broadband type;
if T1< T4< T5, the signal is of a bandwidth negative correlation and narrow-band type;
if the change is not monotonous, the fluctuation of the magnitude is less than 3dB, and no correlation exists;
if the variation is not monotone, the fluctuation of the magnitude is more than 3dB, the step S402 is entered;
if other conditions occur, the invention is not applicable;
s402, setting the test signal as a sine frequency modulation signal, setting the baseband frequency to be 10kHz, and setting the frequency deviation as the following multiple of the intermediate frequency bandwidth: 0.01, 0.03, 0.1, 0.3, 1, 3 and 10, carrying out sensitive threshold test on the tested electronic system under different frequency offsets (according to the mode of the step S202) to obtain a threshold curve Tc1-Tc 7;
if Tc1-Tc7 monotonically rises, then it is determined as a narrow band;
if Tc1-Tc7 monotonically decreases, the determination is broad band type;
if Tc1-Tc7 firstly falls and then rises, the frequency offset is determined to be of a specific bandwidth type, and the frequency offset corresponding to the lowest magnitude is marked as B;
other cases are not within the scope of the present invention and the present invention is not applicable.
S403, determining the most sensitive signal according to the sensitive type:
for the uncorrelated type, no frequency modulation needs to be applied
For the broadband type, the most sensitive signal is applied with sine frequency modulation, and the frequency deviation is 10 times of the intermediate frequency bandwidth;
for the narrow-band type, the most sensitive signals are subjected to sine frequency modulation, and the frequency deviation is 0.01 times of the medium-frequency bandwidth;
for a particular bandwidth type, the most sensitive signal is to apply a sinusoidal frequency modulation with a frequency offset of B.
The details are shown in table 4 below:
table 4 time correlation analysis valid data results
| Type of sensitivity | Most sensitive signal |
| No correlation | No frequency modulation needs to be applied; |
| wide band type | Applying sinusoidal frequency modulation with frequency deviation of 10 times of intermediate frequency bandwidth |
| Narrow band type | Applying sinusoidal frequency modulation with frequency deviation of 0.01 times of intermediate frequency bandwidth |
| Specific bandwidth type | Applying sinusoidal frequency modulation with frequency offset of B |
| Others are | Not applicable to the present invention |
And S5, combining the most sensitive signal corresponding to the time-related sensitive type with the bandwidth-related sensitive type and the corresponding most sensitive signal to obtain a final combined sensitive signal, and testing the tested electronic system by using the combined sensitive signal (according to the mode of the step S202) to generate a sensitive threshold value curve T6.
In the examples of the present application, the bulk process is as follows:
1) determining the sensitive type 1 of the system/equipment and the corresponding most sensitive signal 1 (see table 3) according to the time correlation analysis and the extended test result;
2) determining the sensitivity type 2 of the system/equipment and the corresponding most sensitive signal 2 (see table 4) according to the bandwidth correlation analysis and the expansion test result;
3) according to the sensitive types 1 and 2 and the corresponding most sensitive signals 1 and 2, the final sensitive signals are formed by combination, for example, a certain system time correlation analysis and expansion test result shows that the system time correlation analysis and expansion test result shows that the system time correlation and expansion test result shows that the system most sensitive signals are narrow-band type, and most sensitive signals of the system time correlation analysis and expansion test result show that the system most sensitive signals are the system time correlation type and most sensitive signals are: the frequency modulation pulse amplitude modulation, the pulse frequency is 1kHz, the duty ratio is alpha + 5%, and the frequency deviation is 0.01 time of the medium frequency bandwidth.
While the foregoing description shows and describes a preferred embodiment of the invention, it is to be understood, as noted above, that the invention is not limited to the form disclosed herein, but is not intended to be exhaustive or to exclude other embodiments and may be used in various other combinations, modifications, and environments and may be modified within the scope of the inventive concept described herein by the above teachings or the skill or knowledge of the relevant art. And that modifications and variations may be effected by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (4)
1. An electromagnetic environment effect boundary test method for an electronic system, characterized by: the method comprises the following steps:
s1, carrying out a sensitivity threshold stability test on a tested electronic system;
the step S1 includes:
s101, presetting a frequency point and a signal waveform of a stability test signal;
s102, setting time nodes for stability testing as follows:
continuously testing for three times at the beginning of the stability test, wherein each time interval is 1 minute, and testing the short-time stability of the sensitive state;
the stability test is carried out every 2 hours after the stability test is started, so that the stability of the sensitive state in the test process is ensured;
performing a stability test again when the stability test is finished;
s103, testing the tested electronic system under the set time nodes by using the stability test signal, and recording the sensitivity threshold values measured under each time node as A1, A2 and … An; wherein n represents the number of total tests;
s104, judging the stability of the sensitive threshold:
first, calculate
Where i ∈ [1, n ]]，
Is the average of a1, a2, … An;
if the MAD is less than or equal to 2dB, the sensitivity threshold value is considered to be relatively stable, the step S2 is entered, and if the MAD is less than or equal to 2dB, the step S101 is returned;
s2, setting five types of basic signals, and performing sensitivity threshold test on the tested electronic system by using the five types of basic signals respectively to obtain sensitivity threshold test curves T1-T5;
s3, performing time correlation analysis and expansion test on the tested electronic system, and judging the time correlation sensitive type and the corresponding most sensitive signal of the tested electronic system;
s4, performing bandwidth correlation analysis and expansion test on the tested electronic system, and judging the bandwidth correlation sensitive type and the corresponding most sensitive signal of the tested electronic system;
and S5, combining the most sensitive signal corresponding to the time-related sensitive type with the most sensitive signal corresponding to the bandwidth-related sensitive type to obtain a final combined sensitive signal, and testing the tested electronic system by using the combined sensitive signal to generate a sensitive threshold value curve T6.
2. The method of claim 1, wherein the method comprises the steps of: the step S2 includes the steps of:
s201, setting five types of basic signals, namely:
the 1 st type signal adopts a single-frequency signal of which the modulation mode is single-frequency continuous wave;
the 2 nd type signal adopts a modulation mode of pulse amplitude modulation, the duty ratio is 50 percent, and the pulse frequency is 1 kHz;
the 3 rd type signal adopts a modulation mode of pulse amplitude modulation, the duty ratio is 10 percent, and the pulse frequency is 1 kHz;
the modulation mode adopted by the type 4 signal is sine frequency modulation, the frequency deviation is 0.1 time of the medium frequency bandwidth, and the baseband frequency is 10 kHz;
the modulation mode adopted by the 5 th signal is sine frequency modulation, the frequency deviation is 0.9 times of the medium frequency bandwidth, and the baseband frequency is 10 kHz;
s202, for the type 1 signal, at each frequency point in a test frequency range, applying the type 1 signal of the frequency point to the tested electronic system, carrying out sensitivity threshold test to obtain a sensitivity threshold under each frequency point of the type 1 signal, and drawing to obtain a sensitivity threshold test curve T1; in the sensitive threshold test curve T1, the abscissa of each point is a frequency point within the test frequency range, and the ordinate is a sensitive threshold corresponding to the frequency point;
s203, replacing the signals of the 1 st class with signals of the 2 nd to 5 th classes respectively, and repeating the step S202 after each replacement to obtain sensitive threshold test curves T2, T3, T4 and T5 which respectively represent the sensitive threshold test curves corresponding to the signals of the 2 nd, 3 rd, 4 th and 5 th classes.
3. The method of claim 1, wherein the method comprises the steps of: the step S3 includes the following sub-steps:
s301, according to the sensitivity threshold test curves T1, T2 and T3, carrying out the following preliminary judgment:
if T1> T3> T2, the sensitive type is a peak type, no time correlation exists, time correlation analysis is not needed to be carried out continuously, and the most sensitive signal is a type 2 signal;
if the T3 is greater than T1 is greater than T2 or T3 is greater than T2 is greater than T1, the sensitive type is not determined, and whether the time correlation exists is not determined, the step S302 is entered for carrying out an expansion test;
for any curve Ti and Tj, the value ranges of i and j are {1,2,3,4 and 5} and i is not equal to j; if any frequency point in the test frequency range meets the following requirements: the sensitivity threshold value of the frequency point corresponding to the curve Ti is larger than the sensitivity threshold value of the frequency point corresponding to the curve Tj; then Ti > Tj is considered;
s302, selecting a test signal as a pulse amplitude modulation signal, wherein the pulse frequency is 1kHz, the duty ratio is 10% -90%, a point is taken every 10%, and under 9 different duty ratios, performing a sensitive threshold test on the tested electronic system by using the test signal to obtain a threshold curve Ta1-Ta 9:
observing the sudden change condition of the threshold curve, if the magnitude values from Ta1 to Ta9 are uniformly and monotonically decreased, judging that the sensitive type is a power type, and performing subsequent time correlation test is not needed, wherein the most sensitive signal is a type 1 signal;
if the mutation reduction occurs between a Ta1 value and a Ta9 value, the time correlation is judged, the duty ratio value corresponding to the mutation position at the time is recorded, and the duty ratio value is recorded as a critical duty ratio alpha 0 by taking the duty ratio with higher value as the standard;
s303, multi-pulse period testing: selecting the test signal as a pulse amplitude modulation signal, respectively taking 500 microseconds and 2 milliseconds for pulse period, and respectively testing the critical duty ratios as alpha 1 and alpha 2 according to the duty ratio scanning test method in the step S302;
if the | alpha 1-alpha 0| < 10% and the | alpha 2-alpha 0| < 10%, determining that the time accounts for the proportion type; the most sensitive signal is pulse amplitude modulation, the pulse frequency is 1kHz, and the duty ratio is alpha + 5%;
if α 1<α0<Alpha 2, and the value fluctuation exceeds 10 percent, the model is judged to be an undisturbed time type, and the critical undisturbed time t L 1ms (1- α 0); the most sensitive signals are: pulse amplitude modulation, pulse period 2t L The duty ratio is 60%;
if α 1>α0>Alpha 2, and the value fluctuation exceeds 10 percent, the method is judged to be of the disturbing time type, and the critical disturbing time t is H 1ms α 0; the most sensitive signals are: pulse amplitude modulation, pulse period 2t H And the duty cycle is 60%.
4. The method of claim 1, wherein the method comprises the following steps: the step S4 includes the following sub-steps:
s401, according to the test curves of T1, T4 and T5, carrying out the following preliminary sensitivity type judgment:
if T1> T4> T5, the signal is a positive correlation of the bandwidth and a broadband type;
if T1< T4< T5, the signal is of a bandwidth negative correlation and narrow band type;
if the change is not monotonous, the fluctuation of the magnitude is less than 3dB, and no correlation exists;
if the variation is not monotone, the fluctuation of the magnitude is more than 3dB, the step S402 is entered;
s402, setting a test signal as a sine frequency modulation signal, setting a base band frequency to be 10kHz, and setting frequency deviation as the following multiple of a medium frequency bandwidth: 0.01, 0.03, 0.1, 0.3, 1, 3 and 10, and carrying out sensitive threshold test on the tested electronic system under different frequency offsets to obtain a threshold curve Tc1-Tc 7;
if Tc1-Tc7 monotonically increases, the sample is determined to be narrow-band;
if Tc1-Tc7 monotonically decreases, the determination is broad band type;
if Tc1-Tc7 firstly falls and then rises, the frequency offset is determined to be of a specific bandwidth type, and the frequency offset corresponding to the lowest magnitude is marked as B;
s403, determining the most sensitive signal according to the sensitive type:
for the uncorrelated type, no frequency modulation needs to be applied;
for the broadband type, the most sensitive signal is to apply sinusoidal frequency modulation, and the frequency deviation is 10 times of the medium frequency bandwidth;
for the narrow-band type, the most sensitive signal is applied with sine frequency modulation, and the frequency deviation is 0.01 times of the medium-frequency bandwidth;
for a particular bandwidth type, the most sensitive signal is to apply a sinusoidal frequency modulation with a frequency offset of B.
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