CN114264925A - Quantum dot light-emitting diode testing device and calibration method thereof - Google Patents
Quantum dot light-emitting diode testing device and calibration method thereof Download PDFInfo
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
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- 229920000647 polyepoxide Polymers 0.000 description 1
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Abstract
The invention relates to the technical field of electronic device testing equipment, and provides a quantum dot light-emitting diode testing device and a calibration method thereof, wherein the quantum dot light-emitting diode testing device comprises a base body for placing a quantum dot light-emitting diode, a cover body covered on the base body, a plurality of adjusting parts arranged on the cover body, and a mounting plate arranged between the cover body and the base body and used for mounting a detection device, the mounting plate is connected with each adjusting part, each adjusting part is respectively used for driving the mounting plate to move towards the direction close to or away from the quantum dot light-emitting diode, the mounting plate in the quantum dot light-emitting diode testing device can carry out parallelism adjustment, thereby effectively eliminating the difference of the relative positions of the detection device and the quantum dot light-emitting diode in different quantum dot light-emitting diode testing devices caused by low manufacturing precision and ensuring the consistency of different quantum dot light-emitting diode testing devices, so as to ensure the accuracy of the performance test of the quantum dot light-emitting diode.
Description
Technical Field
The invention relates to the technical field of electronic device testing equipment, in particular to a quantum dot light-emitting diode testing device and a calibration method thereof.
Background
Quantum dot light emitting diodes are thin-layer devices made of a plurality of extremely small semiconductor nanocrystals, which have better energy saving performance and higher luminous efficiency than organic light emitting diodes, and thus are widely used in the fields of illumination and display.
At present, in order to ensure the product quality, a testing device is generally required to be used for carrying out performance testing on the quantum dot light emitting diode, and a detecting device is generally fixedly arranged in the testing device, in the testing process, the relative position factor of the detecting device and the quantum dot light-emitting diode in the testing device can directly influence the accuracy of the performance test, however, because the traditional testing device has lower manufacturing precision, in different testing devices, the relative positions of the detecting device and the quantum dot light-emitting diode are different, so that different testing results can be generated when the same quantum dot light-emitting diode is used for performance testing by different testing devices, in order to improve the testing efficiency, a plurality of testing devices are usually adopted to respectively perform performance testing on the quantum dot light-emitting diodes, and finally the accuracy of the performance testing of the quantum dot light-emitting diodes in the same production batch is low.
Disclosure of Invention
The invention aims to provide a quantum dot light-emitting diode testing device and a calibration method thereof, and aims to solve the technical problem that the performance test accuracy of a quantum dot light-emitting diode is low due to the fact that the consistency of different testing devices is low.
In order to achieve the purpose, the invention adopts the technical scheme that: a quantum dot light-emitting diode testing device comprises a base used for placing quantum dot light-emitting diodes, a cover body covered on the base, a plurality of adjusting pieces arranged on the cover body, and a mounting plate arranged between the cover body and the base and used for mounting a detection device, wherein the mounting plate is connected with the adjusting pieces, and each adjusting piece is respectively used for driving the mounting plate to move towards the direction close to or far away from the quantum dot light-emitting diodes.
The quantum dot light-emitting diode testing device provided by the embodiment of the invention at least has the following beneficial effects: through operating each regulating part, each regulating part drives the mounting panel respectively and removes towards the direction of being close to or keeping away from quantum dot emitting diode to the depth of parallelism of regulation mounting panel, thereby effectively eliminate because of the low difference that causes the relative position of detecting device among the different quantum dot emitting diode testing arrangement and quantum dot emitting diode of manufacturing precision, guarantee different quantum dot emitting diode testing arrangement's uniformity, with the accuracy of ensureing quantum dot emitting diode capability test.
In one embodiment, each of the adjusting members is of a cylindrical structure and is rotatably connected to the cover body around an axis, each of the adjusting members is provided with a threaded portion, the mounting plate is provided with a plurality of threaded holes, and the threaded portion of each of the adjusting members is in threaded connection with the corresponding threaded hole.
In one embodiment, the cover body is provided with a plurality of through holes, each adjusting piece is rotatably arranged in the corresponding through hole, and each adjusting piece is provided with an operating part which extends out of the quantum dot light-emitting diode testing device from the corresponding through hole.
In one embodiment, each of the adjusting members is arranged in an annular array structure.
In one embodiment, the testing apparatus further includes a connector disposed on a surface of the mounting plate facing the base, and the detector is mounted on the mounting plate through the connector.
In one embodiment, the base has a first receiving slot for receiving the qd-led;
and/or a second accommodating groove for accommodating the mounting plate is formed in the cover body.
In one embodiment, the base is provided with a first groove disposed around the first accommodating groove, the cover is provided with a first boss disposed around the second accommodating groove, and the first boss is embedded in the first groove;
or, the base body is provided with a second boss arranged around the first accommodating groove, the cover body is provided with a second groove arranged around the second accommodating groove, and the second boss is embedded in the second groove.
In one embodiment, a side portion of the cover body is hinged to the seat body.
In order to achieve the above object, the present invention further provides a calibration method of the testing apparatus for a quantum dot light emitting diode, including the following steps:
s100, providing a standard quantum dot light-emitting diode testing device, a quantum dot light-emitting diode testing device to be calibrated and a quantum dot light-emitting diode;
s200, placing the quantum dot light-emitting diode in the standard quantum dot light-emitting diode testing device for testing, and measuring a standard photocurrent value Is0 of the quantum dot light-emitting diode;
s300, placing the quantum dot light-emitting diode into the quantum dot light-emitting diode testing device to be calibrated for testing, and measuring a first luminous current value Is1 of the quantum dot light-emitting diode;
s400, if the absolute phase difference rate between the first photocurrent value Is1 and the standard photocurrent value Is0 Is greater than a preset phase difference rate, sequentially operating each adjusting piece until the absolute phase difference rate between the measured photocurrent value Isn of the quantum dot light-emitting diode and the standard photocurrent value Is0 Is less than or equal to the preset phase difference rate.
By adopting the calibration method to calibrate different quantum dot light-emitting diode testing devices, the difference of the relative positions of the detecting device and the quantum dot light-emitting diode in the different quantum dot light-emitting diode testing devices caused by low manufacturing precision is effectively eliminated, the consistency of the different quantum dot light-emitting diode testing devices is ensured, and the accuracy of the performance test of the quantum dot light-emitting diode is effectively ensured.
In one embodiment, in step S400, each of the adjusting members is operated according to the following principle:
setting the number of adjusting pieces of the testing device of the quantum dot light-emitting diode to be calibrated to be N, wherein N is more than or equal to 2; if the absolute phase difference rate between the first photocurrent value Is1 and the standard photocurrent value Is0 Is greater than a preset phase difference rate, operating any one of the adjusting pieces until the variation Δ Is1 of the first photocurrent value of the quantum dot light-emitting diode Is equal to (Is0-Is1)/n, and measuring a second photocurrent value Is2 of the quantum dot light-emitting diode; if the absolute phase difference rate between the second photocurrent value Is2 and the standard photocurrent value Is0 Is greater than a preset phase difference rate, operating the next adjusting piece until the second photocurrent value variation Δ Is2 of the quantum dot light-emitting diode Is equal to (Is0-Is2)/n, and measuring a third photocurrent value Is3 of the quantum dot light-emitting diode; if the absolute phase difference rate between the third photocurrent value Is3 and the standard photocurrent value Is0 Is greater than the preset phase difference rate, the above operations are executed in a cyclic manner until the absolute phase difference rate between the measured photocurrent value Isn of the quantum dot light emitting diode and the standard photocurrent value Is0 Is less than or equal to the preset phase difference rate.
In one embodiment, in step S400, the predetermined phase difference rate is 5%.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.
Fig. 1 is a schematic structural diagram of a quantum dot light emitting diode testing apparatus according to an embodiment of the present invention;
FIG. 2 is an exploded view of the quantum dot light emitting diode testing apparatus shown in FIG. 1;
FIG. 3 is a front view of the QED LED testing apparatus shown in FIG. 1;
FIG. 4 is a cross-sectional view taken along line A-A of the quantum dot light emitting diode testing device shown in FIG. 3;
FIG. 5 is a schematic structural diagram of an adjustment member provided in accordance with an embodiment of the present invention;
FIG. 6 is a schematic view of a connection structure between a mounting board and a detecting device according to an embodiment of the present invention;
fig. 7 is a flowchart of a calibration method of a quantum dot light emitting diode testing apparatus according to an embodiment of the present invention.
Wherein, in the figures, the respective reference numerals:
10. the base body 11, the first containing groove 12, the first groove 20, the cover body 21, the through hole 22, the second containing groove 23, the first boss 30, the adjusting piece 31, the threaded portion 32, the operating portion 40, the mounting plate 41, the threaded hole 50, the detecting device 60 and the connecting piece.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are illustrative and intended to be illustrative of the invention and are not to be construed as limiting the invention.
In the description of the present invention, it is to be understood that the terms "upper", "lower", "inside", "outside", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are only for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
Example one
Referring to fig. 1 to 4, a testing apparatus for a quantum dot led includes a base 10 for placing the quantum dot led, a cover 20 covering the base 10, a plurality of adjusting members 30 disposed on the cover 20, and a mounting plate 40 disposed between the cover 20 and the base 10 and used for mounting a detecting device 50 (such as a silicon photodiode), wherein the detecting device 50 is mounted on a surface of the mounting plate 40 facing the quantum dot led, the mounting plate 40 is connected to each of the adjusting members 30, and each of the adjusting members 30 is used for driving the mounting plate 40 to move toward or away from the quantum dot led.
Through operating each regulating part 30, each regulating part 30 drives the mounting panel 40 respectively and moves towards the direction of being close to or keeping away from quantum dot emitting diode to the depth of parallelism of regulation mounting panel 40, thereby effectively eliminate because of the low difference that causes the relative position of detecting device 50 and the quantum dot emitting diode in the different quantum dot emitting diode testing arrangement of manufacturing precision, guarantee the uniformity of different quantum dot emitting diode testing arrangements, with the accuracy of ensureing the performance test of quantum dot emitting diode.
Specifically, as shown in fig. 1 to 4, each adjusting member 30 is perpendicular to the mounting plate 40, and when the parallelism of the mounting plate 40 is adjusted, each adjusting member 30 drives the corresponding portion of the mounting plate 40 to move toward or away from the quantum dot light emitting diode, until the parallelism of the mounting plate 40 meets the standard requirement.
It should be noted that the standard requirement for the parallelism of the mounting board 40 is specifically that an absolute phase difference rate between a measured light current value of the quantum dot light emitting diode and a standard light current value is less than or equal to a preset phase difference rate, where the preset phase difference rate may be set according to an actual test requirement, such as 5%, 8%, 10%, and the like.
In the present embodiment, please refer to fig. 2, the adjusting member 30 is a cylindrical structure and is rotatably connected to the cover, the adjusting member 30 is provided with a threaded portion 31, the mounting plate 40 is provided with a plurality of threaded holes 41, and the threaded portion 31 of the adjusting member 30 is in threaded connection with the corresponding threaded hole 41. When the parallelism of the mounting plate 40 is adjusted, only the adjusting pieces 30 need to be rotated respectively, so that the thread parts 31 of the adjusting pieces 30 rotate in the corresponding threaded holes 41, and the mounting plate 40 moves along with the adjusting pieces until the parallelism of the mounting plate 40 reaches the standard requirement.
Specifically, as shown in fig. 2, a plurality of through holes 21 are formed in the cover 20, each adjusting member 30 is rotatably disposed in the corresponding through hole 21, each adjusting member 30 is provided with an operating portion 32, and the operating portion 32 extends out of the quantum dot led testing apparatus from the corresponding through hole 21. After the cover body 20 and the seat body 10 are closed, the user can operate the operation portion 32 of each adjusting member 30 to rotate each adjusting member 30 in the through hole 21, so as to adjust the parallelism of the mounting plate 40, and the adjusting operation is more convenient.
In the present embodiment, please refer to fig. 1 and fig. 2, each adjusting member 30 is disposed in a ring-shaped array structure. Through adopting above-mentioned technical scheme, can control each regulating part 30's regulation stroke better, make the depth of parallelism regulation operation of mounting panel 40 become more accurate and more convenient.
For example, the mounting plate 40 has a square structure, and the adjusting members 30 are uniformly arranged along a circumference centered on the center of the mounting plate 40 (for example, there are four adjusting members 30, and four adjusting members 30 are correspondingly connected to four corners of the mounting plate 40), at this time, the adjusting members 30 are operated with the same adjusting stroke, and the moving amount of the mounting plate 40 is equal after each pair of adjusting members 30 is operated, so that the parallelism adjusting operation of the mounting plate 40 becomes more accurate and convenient.
Of course, the structure of the mounting plate 40 includes a plurality of structures, and the number of the adjusting members 30 may be different according to actual needs, for example, the mounting plate 40 is a circular structure, the number of the adjusting members 30 is six, and the six adjusting members 30 are uniformly arranged around the center of the circle of the mounting plate 40; for another example, the mounting plate 40 has a regular triangle structure, and there are three adjusting members 30, and three adjusting members 30 are correspondingly connected to three corners of the mounting plate 40.
In this embodiment, please refer to fig. 6, the testing apparatus for a quantum dot light emitting diode further includes a connecting member 60 disposed on a surface of the mounting plate 40 facing the base 10, and the detecting device 50 is mounted on the mounting plate 40 through the connecting member 60, so as to effectively fix the detecting device 50.
Specifically, in order to simplify the production cost of the testing apparatus for the quantum dot light emitting diode and facilitate the detachment and replacement of the detecting device 50, the connecting member 60 is an adhesive member, such as a double-sided tape, a foam tape, a cloth-based tape, or the like.
In this embodiment, please refer to fig. 1 to 4, a first receiving groove 11 for receiving the quantum dot light emitting diode is formed on the base 10; and/or, the cover body 20 is provided with a second receiving groove 22 for receiving the mounting plate 40. The position of the quantum dot light emitting diode can be effectively limited by placing the quantum dot light emitting diode in the first accommodating groove 11 of the base 10, the phenomenon that the quantum dot light emitting diode shifts in the performance test process to cause the relative position of the quantum dot light emitting diode and the detecting device 50 to change is avoided, the accuracy of the detecting device 50 of the quantum dot light emitting diode is more effectively ensured, similarly, the position of the mounting plate 40 can be effectively limited by placing the mounting plate 40 in the second accommodating groove 22 of the cover 20, the phenomenon that the mounting plate 40 shifts in the performance test process to cause the relative position of the quantum dot light emitting diode and the detecting device 50 to change is avoided, and the accuracy of the detecting device 50 of the quantum dot light emitting diode is more effectively ensured.
Specifically, as shown in fig. 1 to 4, the base 10 is provided with a first groove 12 disposed around the first receiving groove 11, the cover 20 is provided with a first boss 23 disposed around the second receiving groove 22, and the first boss 23 is embedded in the first groove 12; or, the base 10 is provided with a second boss (not shown) disposed around the first receiving groove 11, the cover 20 is provided with a second groove (not shown) disposed around the second receiving groove 22, and the second boss is embedded in the second groove. After the cover body 20 and the base body 10 are covered, the first receiving groove 11 of the base body 10 and the second receiving groove 22 of the cover body 20 are enclosed by the concave-convex matching structure to form a closed testing space, thereby effectively preventing external factors such as illumination from entering the testing space to affect the accuracy of the performance test of the quantum dot light-emitting diode.
In the present embodiment, please refer to fig. 1 to 4, a side portion of the cover 20 is hinged to the base 10. Through adopting above-mentioned technical scheme, make the operation of opening and close of lid 20 more convenient, effectively improve above-mentioned quantum dot light emitting diode testing arrangement's the convenient degree of use.
Example two
The present embodiment differs from the first embodiment in that the type of construction of the adjustment element 30 is different.
In this embodiment, the adjusting member 30 is an air pressure rod connected to an external air pressure device, and the amount of expansion and contraction of the air pressure rod is controlled by controlling the pressure value of the external air pressure device, so that the parallelism of the mounting plate 40 is adjusted, the degree of automation is high, and the adjusting operation is more convenient and faster.
EXAMPLE III
The present embodiment differs from the first embodiment in that the type of construction of the adjustment element 30 is different.
In this implementation, regulating part 30 is the hydraulic stem that is connected with external hydraulic equipment, and the flexible volume of hydraulic stem is controlled through the pressure value of controlling external hydraulic equipment to this is adjusted the depth of parallelism of mounting panel 40, and degree of automation is high, and it is more convenient to adjust the operation.
Please refer to fig. 7, a calibration method of the testing apparatus for a qd-led includes the following steps:
s100, providing a standard quantum dot light-emitting diode testing device, a quantum dot light-emitting diode testing device to be calibrated and a quantum dot light-emitting diode, wherein the quantum dot light-emitting diode is in a stable performance state;
s200, placing the quantum dot light-emitting diode in a standard quantum dot light-emitting diode testing device for testing, and testing to obtain a standard photocurrent value Is0 of the quantum dot light-emitting diode;
s300, placing the quantum dot light-emitting diode in a quantum dot light-emitting diode testing device to be calibrated for testing, and measuring a first light current value Is1 of the quantum dot light-emitting diode;
s400, if the absolute phase difference rate between the first photocurrent value Is1 and the standard photocurrent value Is0 Is greater than the preset phase difference rate, sequentially operating the adjusting pieces 30 until the absolute phase difference rate between the measured photocurrent value Isn of the quantum dot light-emitting diode and the standard photocurrent value Is0 Is less than or equal to the preset phase difference rate, namely | (Is0-Isn)/Isn |, Is less than or equal to the preset phase difference rate.
By adopting the calibration method to calibrate different quantum dot light-emitting diode testing devices, the difference of the relative positions of the detecting device and the quantum dot light-emitting diode in the different quantum dot light-emitting diode testing devices caused by low manufacturing precision is effectively eliminated, the consistency of the different quantum dot light-emitting diode testing devices is ensured, and the accuracy of the performance test of the quantum dot light-emitting diode is effectively ensured.
Specifically, when the quantum dot light-emitting diode testing device to be calibrated is calibrated, the standard quantum dot light-emitting diode testing device and the quantum dot light-emitting diode testing device to be calibrated are both electrically connected with external photocurrent measuring equipment, and the photocurrent measuring equipment is used for measuring the photocurrent value of the quantum dot light-emitting diode in real time.
Specifically, in step S400, each of the adjusters 30 is operated according to the following principle:
setting the number of the adjusting pieces 30 of the testing device of the quantum dot light-emitting diode to be calibrated to be N, wherein N is more than or equal to 2; if the absolute phase difference rate between the first photocurrent value Is1 and the standard photocurrent value Is0 Is greater than the preset phase difference rate, operating any one of the adjusting pieces 30 until the variation Δ Is1 of the first photocurrent value of the quantum dot light-emitting diode Is equal to (Is0-Is1)/n, and measuring a second photocurrent value Is2 of the quantum dot light-emitting diode; if the absolute phase difference rate between the second photocurrent value Is2 and the standard photocurrent value Is0 Is greater than the preset phase difference rate, operating the next adjusting piece 30 until the second photocurrent value variation Δ Is2 of the quantum dot light-emitting diode Is equal to (Is0-Is2)/n, and measuring a third photocurrent value Is3 of the quantum dot light-emitting diode; if the absolute phase difference rate between the third photocurrent value Is3 and the standard photocurrent value Is0 Is greater than the preset phase difference rate, the above operations are executed in a cyclic manner until the absolute phase difference rate between the measured photocurrent value Isn of the quantum dot light emitting diode and the standard photocurrent value Is0 Is less than or equal to the preset phase difference rate.
Specifically, in step S400, the preset phase difference rate is 5%, and of course, the preset phase difference rate may also be set according to actual test requirements, such as 8%, 10%, and the like.
When the adjusting members 30 are of the type described in the first embodiment (i.e., each adjusting member 30 is provided with a threaded portion 31), the calibration method further comprises the steps of:
step S500, after the step S400 is completed, a solidified glue is coated between each adjusting member 30 and the mounting plate 40 to prevent the adjusting members 30 and the mounting plate 40 from moving relatively after the calibration operation is completed, wherein the solidified glue is easy to remove, and the cyclic calibration operation of the quantum dot light emitting diode testing device is realized, and the solidified glue is epoxy resin glue or UV glue.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (11)
1. The quantum dot light-emitting diode testing device is characterized by comprising a base body used for placing quantum dot light-emitting diodes, a cover body covered on the base body, a plurality of adjusting pieces arranged on the cover body, and a mounting plate arranged between the cover body and the base body and used for mounting a detection device, wherein the mounting plate is connected with each adjusting piece, and each adjusting piece is respectively used for driving the mounting plate to move towards the direction close to or far away from the quantum dot light-emitting diodes.
2. The quantum dot light-emitting diode testing device of claim 1, wherein: the regulating part is columnar structure and rotationally connect in on the lid, the regulating part is equipped with screw thread portion, a plurality of screw holes have been seted up to the mounting panel, the regulating part screw thread portion with correspond screw hole threaded connection.
3. The qd-led testing apparatus of claim 2, wherein: the cover body is provided with a plurality of through holes, the adjusting pieces are respectively and rotatably arranged in the corresponding through holes, the adjusting pieces are provided with operating parts, and the operating parts extend out of the quantum dot light-emitting diode testing device from the corresponding through holes.
4. The quantum dot light-emitting diode testing device of claim 1, wherein: each adjusting piece is arranged in an annular array structure.
5. The quantum dot light-emitting diode testing device of claim 1, wherein: the testing device for the quantum dot light-emitting diode further comprises a connecting piece arranged on the surface of the base body, wherein the mounting plate faces the base body, and the detection device is arranged on the mounting plate through the connecting piece.
6. The quantum dot light-emitting diode testing device of claim 1, wherein: the base body is provided with a first accommodating groove for accommodating the quantum dot light-emitting diode;
and/or a second accommodating groove for accommodating the mounting plate is formed in the cover body.
7. The quantum dot light-emitting diode testing device of claim 6, wherein: the base body is provided with a first groove arranged around the first accommodating groove, the cover body is provided with a first boss arranged around the second accommodating groove, and the first boss is embedded in the first groove;
or, the base body is provided with a second boss arranged around the first accommodating groove, the cover body is provided with a second groove arranged around the second accommodating groove, and the second boss is embedded in the second groove.
8. The qd-led testing apparatus according to any one of claims 1 to 7, wherein: one side part of the cover body is hinged with the seat body.
9. A method of calibrating a quantum dot light emitting diode testing apparatus according to any one of claims 1 to 8, wherein: the method comprises the following steps:
s100, providing a standard quantum dot light-emitting diode testing device, a quantum dot light-emitting diode testing device to be calibrated and a quantum dot light-emitting diode;
s200, placing the quantum dot light-emitting diode in the standard quantum dot light-emitting diode testing device for testing, and measuring a standard photocurrent value Is0 of the quantum dot light-emitting diode;
s300, placing the quantum dot light-emitting diode into the quantum dot light-emitting diode testing device to be calibrated for testing, and measuring a first luminous current value Is1 of the quantum dot light-emitting diode;
s400, if the absolute phase difference rate between the first photocurrent value Is1 and the standard photocurrent value Is0 Is greater than a preset phase difference rate, sequentially operating each adjusting piece until the absolute phase difference rate between the measured photocurrent value Isn of the quantum dot light-emitting diode and the standard photocurrent value Is0 Is less than or equal to the preset phase difference rate.
10. The calibration method of the quantum dot light-emitting diode testing device according to claim 9, wherein in step S400, each of the adjusting members is operated according to the following principle:
setting the number of adjusting pieces of the testing device of the quantum dot light-emitting diode to be calibrated to be N, wherein N is more than or equal to 2; if the absolute phase difference rate between the first photocurrent value Is1 and the standard photocurrent value Is0 Is greater than a preset phase difference rate, operating any one of the adjusting pieces until the variation Δ Is1 of the first photocurrent value of the quantum dot light-emitting diode Is equal to (Is0-Is1)/N, and measuring a second photocurrent value Is2 of the quantum dot light-emitting diode; if the absolute phase difference rate between the second photocurrent value Is2 and the standard photocurrent value Is0 Is greater than a preset phase difference rate, operating the next adjusting piece until the second photocurrent value variation Δ Is2 of the quantum dot light-emitting diode Is equal to (Is0-Is2)/N, and measuring a third photocurrent value Is3 of the quantum dot light-emitting diode; if the absolute phase difference rate between the third photocurrent value Is3 and the standard photocurrent value Is0 Is greater than the preset phase difference rate, the above operations are executed in a cyclic manner until the absolute phase difference rate between the measured photocurrent value Isn of the quantum dot light emitting diode and the standard photocurrent value Is0 Is less than or equal to the preset phase difference rate.
11. The method for calibrating a quantum dot light-emitting diode testing device according to claim 9, wherein: in step S400, the preset phase difference rate is 5%.
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| CN116429382B (en) * | 2023-06-13 | 2023-08-25 | 山东新东光电科技有限公司 | LED flexible screen luminous performance testing device |
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