CN114252757B - Multi-module testing system and method of automatic testing system - Google Patents
Multi-module testing system and method of automatic testing system Download PDFInfo
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- CN114252757B CN114252757B CN202111356845.0A CN202111356845A CN114252757B CN 114252757 B CN114252757 B CN 114252757B CN 202111356845 A CN202111356845 A CN 202111356845A CN 114252757 B CN114252757 B CN 114252757B
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- 238000012360 testing method Methods 0.000 title claims abstract description 106
- 238000000034 method Methods 0.000 title claims abstract description 13
- 230000003750 conditioning effect Effects 0.000 claims abstract description 47
- 238000004132 cross linking Methods 0.000 claims description 24
- 230000003044 adaptive effect Effects 0.000 claims description 17
- 230000005405 multipole Effects 0.000 claims description 12
- 230000000712 assembly Effects 0.000 claims description 10
- 238000000429 assembly Methods 0.000 claims description 10
- 238000000605 extraction Methods 0.000 claims description 9
- 238000012545 processing Methods 0.000 abstract description 2
- 230000006978 adaptation Effects 0.000 abstract 1
- 230000001105 regulatory effect Effects 0.000 abstract 1
- 238000013461 design Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000012812 general test Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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Abstract
The utility model provides a multimode test system and method of automatic test system, it is test system technical field that specific test system includes test resource end and is surveyed the object end, the object end includes adapter and a plurality of module structures that are surveyed, the module interface that is surveyed is used for pegging graft and is surveyed the module, the module that is surveyed passes through the adaptation regulating plate of adapter is connected test resource end, the adapter includes tristate linkage switch group switching circuit and a plurality of signal conditioning circuit, every the independent signal of module that is surveyed is through respective corresponding signal conditioning circuit connects test resource end, the crosslinked signal of module that is surveyed is through tristate linkage switch group switching circuit switches back is through signal conditioning circuit connects test resource end. Through the processing scheme of the application, the test system is high in power-on safety, good in reliability and wide in signal application range.
Description
Technical Field
The present disclosure relates to the field of test systems, and in particular, to a multi-module test system and method for an automatic test system.
Background
An Automatic Test System (ATS) is a generic name for a class of systems that automatically perform excitation, measurement, data processing, and display or output of test results using computer control. The ATS greatly improves the reliability, completeness and working efficiency of the test, simultaneously remarkably reduces the requirement of the test task on professional literacy of personnel, and is widely applied in the field of the test. Currently, ATS is being developed from a dedicated system to a comprehensive and generalized direction, so that a set of ATS can meet the test requirements of more objects under test (UUT). However, with the increase of general test objects, a foolproof design, i.e., an error protection design, an isolation design, a power-on safety design, a switch system protection design, etc., is one of the problems to be considered in the ATS design.
Disclosure of Invention
In view of the above, the application provides a multi-module testing system and method of an automatic testing system, which solve the problems in the prior art, and the testing system has high power-on safety, good reliability and wide signal application range.
On the one hand, the multi-module testing system of the automatic testing system adopts the following technical scheme:
the multi-module testing system of the automatic testing system comprises a testing resource end and a tested object end, wherein the tested object end comprises an adapter and a plurality of tested module structures, a tested module interface is used for being inserted into a tested module, the tested module is connected with the testing resource end through an adaptive conditioning board of the adapter, the adapter comprises a three-state linkage switch group switching circuit and a plurality of signal conditioning circuits, independent signals of each tested module are connected with the testing resource end through the corresponding signal conditioning circuits, and crosslinked signals of the tested module are connected with the testing resource end through the signal conditioning circuits after being switched by the three-state linkage switch group switching circuits.
Optionally, the three-state linkage switch group switching circuit comprises a plurality of groups of multi-pole linkage double-throw switch assemblies with the same logic, and hardware switching of the test mode and the crosslinking signal is realized by configuring switching logic of the multi-pole linkage double-throw switch assemblies and matching with module plugging.
Optionally, the multiple groups of multiple-pole linkage double-throw switch assemblies with the same logic comprise multiple-way on-way switches, the on-way switches are used for switching states, a common end of each on-way switch is directly connected with the cross-linked signals of the tested modules, and the switching ends are connected with the signal conditioning circuits corresponding to the tested modules.
Optionally, the multiple groups of multiple-pole linkage double-throw switch assemblies with the same logic further comprise a switching state extraction assembly for extracting the state of the upper switch.
Optionally, a microcontroller is further arranged on the adapter, and the microcontroller receives the on-off state of the switching state extraction component, integrates the ID and serial number information of the adaptive conditioning board, and sends the information to the testing resource end through the serial port bus.
Optionally, when a single module to be tested is tested, and only the corresponding module to be tested is connected to the adaptive conditioning board, the on-way switch is switched to a signal conditioning circuit corresponding to the module to be tested; when the two tested modules are connected, the two tested modules are simultaneously connected with the adaptive conditioning board, the upper switch is switched to an intermediate state, and the connection between the crosslinking signals of the two tested modules and the signal conditioning circuit is disconnected.
On the other hand, the multi-module testing method of the automatic testing system adopts the following technical scheme:
a multi-module test method for an automatic test system, based on the test system of claim, comprising the steps of:
step 1, plugging a tested module according to a required test mode, switching the state of a tri-state linkage switch group, and selecting the model and the test mode of a power supply of a tested processor on a test system software interface;
step 2, starting software, the software automatically calls the testing resource to detect the identity information of the adapter, and verifies whether the adapter is selected to be correct or not by combining with the identity information of the adapting conditioning plate,
and step 3, if the error is incorrect, prompting the error reason of the adapter, and exiting the process. If so, the software then detects an identity recognition circuit at the connector end of the tested module to recognize whether the occupying state and the identity of the module are correct; detecting the state of the three-state linkage switch group, judging whether the cross-linking signal switching is correct in the current test mode, if not, detecting again after adjustment, if so, indicating that the power-on can be safely performed, and starting the subsequent automatic test flow.
In summary, the present application includes the following beneficial technical effects:
1. and the detection of the power-on safety is perfect: the state after the cross-linking signal is switched forms closed loop detection, and mandatory guarantee is established for safe power-on under each test mode. Meanwhile, the microcontroller circuit can report the identity information of the adaptive conditioning plate, and the foolproof capacity of the adapter is enhanced;
2. simple structure, with low costs: the 'tri-state linkage switch group+microcontroller' architecture of the adapter end replaces the complex program-controlled switch network architecture of the ATE end, so that the number and configuration cost of valuable program-controlled switch cards are greatly reduced, and meanwhile, the complexity of wiring of the instrument end and software development of a test system is also reduced;
3. the reliability is high: the switch is distributed nearby on the adaptive conditioning board, so that the circuit resistance is small, the switching of a switch card and a discrete wire is not needed, the wiring path and switching times are reduced, and the reliability of signal testing is improved;
4. the crosslinking signal has wide application range: the micro-power and high-voltage signals can be routed through selecting a proper three-state multi-pole linkage double-throw switch without passing through an instrument end, so that the damage to the modularized test instrument is completely isolated.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a multi-module test system of the automated test system of the present application;
FIG. 2 is a schematic diagram of a three-state ganged switch signal switching circuit and a state extraction assembly of the present application;
FIG. 3 is a logic flow diagram of a test method of the present application.
Detailed Description
Embodiments of the present application are described in detail below with reference to the accompanying drawings.
Other advantages and effects of the present application will become apparent to those skilled in the art from the present disclosure, when the following description of the embodiments is taken in conjunction with the accompanying drawings. It will be apparent that the described embodiments are only some, but not all, of the embodiments of the present application. The present application may be embodied or carried out in other specific embodiments, and the details of the present application may be modified or changed from various points of view and applications without departing from the spirit of the present application. It should be noted that the following embodiments and features in the embodiments may be combined with each other without conflict. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments herein without making any inventive effort, are intended to be within the scope of the present application.
It is noted that various aspects of the embodiments are described below within the scope of the following claims. It should be apparent that the aspects described herein may be embodied in a wide variety of forms and that any specific structure and/or function described herein is merely illustrative. Based on the present application, one skilled in the art will appreciate that one aspect described herein may be implemented independently of any other aspect, and that two or more of these aspects may be combined in various ways. For example, an apparatus may be implemented and/or a method practiced using any number of the aspects set forth herein. In addition, such apparatus may be implemented and/or such methods practiced using other structure and/or functionality in addition to one or more of the aspects set forth herein.
It should also be noted that the illustrations provided in the following embodiments merely illustrate the basic concepts of the application by way of illustration, and only the components related to the application are shown in the drawings and are not drawn according to the number, shape and size of the components in actual implementation, and the form, number and proportion of the components in actual implementation may be arbitrarily changed, and the layout of the components may be more complicated.
In addition, in the following description, specific details are provided in order to provide a thorough understanding of the examples. However, it will be understood by those skilled in the art that the aspects may be practiced without these specific details.
The embodiment of the application provides a multi-module testing system of an automatic testing system.
The universal automatic test system for the power supply modules of the processors realizes the universal and automatic test of the power supply modules of various processors by replacing the adapter. In this embodiment, the power supply module of a certain type of processor includes three modules, namely, a module 1, a module 2 and a module 3, and signal crosslinking is performed between each module, wherein the crosslinking signals relate to digital, bus, on-off, analog, micropower and high voltage signals, and the test modes of the 3 modules are respectively designed by a test mode identification and power-on security foolproof method under the conditions of module 1 single test, module 2 single test, module 3 single test, module 1&2 combined test, module 2&3 combined test, and module 1&2&3 combined test.
As shown in FIG. 1, a multi-module test system of an automatic test system comprises a test resource end and a tested object end, wherein the test resource end mainly comprises a receiver, ATE hardware and test system software; the tested object end comprises an adapter and a plurality of tested module structures, and the tested module interface is used for plugging a tested module; in this embodiment of the present application, the tested object end mainly includes 3 tested modules and adapters.
The tested module is connected with the testing resource end through an adaptive conditioning board of the adapter, the adapter comprises a three-state linkage switch group switching circuit and a plurality of signal conditioning circuits, independent signals of each tested module are connected with the testing resource end through the corresponding signal conditioning circuits, and crosslinked signals of the tested module are connected with the testing resource end through the signal conditioning circuits after being switched by the three-state linkage switch group switching circuits.
And the adapter is also provided with a microcontroller, and the microcontroller receives the on-way switch state of the switching state extraction component, integrates the ID of the adaptive conditioning board and serial number information and sends the information to the test resource end through a serial bus.
The three-state linkage switch group and microcontroller framework in the application is mainly realized based on an adaptive conditioning board in the adapter. The tested module is arranged on the adaptive conditioning board through the connector, and independent signals of the tested module are directly connected with ATE resources through the adapter interface after passing through the signal conditioning circuit; the cross-linking signal of the tested module is connected with ATE resources through a signal conditioning circuit after being switched by a tri-state linkage switch group switching circuit. And after the switching state signal output by the three-state linkage switch group switching circuit is sampled by the microcontroller circuit, the information such as the integrated and adaptive conditioning board ID, serial number and the like is sent to the test system software through the serial port bus. The three-state linkage switch group switching circuit consists of 3 groups of multi-pole linkage double-throw switch groups with the same logic: the module 1&2 cross-linking signal switching switch group, the module 2&3 cross-linking signal switching switch group and the module 1&3 cross-linking signal switching switch group realize the hardware switching of test modes and cross-linking signals by reasonably configuring the switching logic of the switching groups and matching with the module plugging.
The three-state linkage switch group switching circuit comprises a plurality of groups of multi-pole linkage double-throw switch assemblies with the same logic, and hardware switching of test modes and crosslinking signals is realized by configuring the switching logic of the multi-pole linkage double-throw switch assemblies and matching with module plugging.
The multi-group multi-pole linkage double-throw switch assembly with the same logic comprises a multi-way switch, wherein the switch is used for switching states, the public end of the switch is directly connected with the cross-linked signals of the tested modules, and the switching end is connected with the signal conditioning circuits corresponding to the tested modules.
As shown in fig. 2, the multiple groups of multiple-pole linkage double-throw switch assemblies with the same logic further comprise a switching state extraction assembly for extracting the state of the upper switch.
As shown in fig. 2, a three-state four-pole double-throw linkage switch in the module 1&2 linkage signal switch group is taken as an example for explanation of the principle. The diagram relates to the switching of 3 cross-linking signals between the modules 1 and 2, the upper three-way switch is used for state switching, and the last three-way switch is used for switching state extraction. The common end of the upper three-way switch is directly connected with the cross-linking signals of the modules 1 and 2, and the switching end is connected with the respective conditioning circuit. When the module 1 single-test mode is adopted in the working process, the module 1 is inserted and the module 2 is pulled out, the switch group is cut up, and the crosslinking signal is connected to the conditioning circuit of the module 1; if the module 2 single-test mode is adopted, the module 2 is inserted and the module 1 is pulled out, the switch group is cut down, and the crosslinking signal is connected to a module 2 conditioning circuit; if the mode is the combined measurement mode of the modules 1 and 2, the modules 1 and 2 are inserted, and the cross-linking signal does not pass through the conditioning circuit in the switch set. The last switch changes the concept that only two states of 0 and 1 can be extracted from a public terminal in the past, and adopts a reverse tri-state extraction method to extract the states to two switching terminals. According to the method, the states corresponding to the three modes of module 1 single measurement, module 2 single measurement and module 1 and 2 combined measurement are 10, 01 and 00. And integrating the switching logic of each cross-linking signal switching switch group to form a test mode-switch group switching position logic table for software and testers to call.
In other embodiments, after the tested module is added, multiple groups of multi-pole linkage double-throw switch assemblies with the same logic in the three-state linkage switch group switching circuit are added appropriately along with the increase of the module.
When a single tested module is tested, and only the corresponding tested module is connected to the adaptive conditioning board, the on-way switch is switched to a signal conditioning circuit corresponding to the tested module; when the two tested modules are connected, the two tested modules are simultaneously connected with the adaptive conditioning board, the upper switch is switched to an intermediate state, and the connection between the crosslinking signals of the two tested modules and the signal conditioning circuit is disconnected.
The embodiment of the application also discloses a multi-module testing method of the automatic testing system, which comprises the following steps:
step 1, a tester inserts and pulls out a tested module according to a required test mode, switches the state of a tri-state linkage switch group, and selects the model and the test mode of the power supply of the tested processor on a test system software interface.
And 2, starting software, wherein the software automatically calls the testing resource to detect the identity information of the adapter, and verifies whether the adapter is selected to be correct or not by combining the identity information of the adapter conditioning board reported by the microcontroller bus.
And step 3, if the error is incorrect, prompting the error reason of the adapter, and exiting the process. If so, the software then detects an identity recognition circuit at the connector end of the tested module to recognize whether the occupying state and the identity of the module are correct; detecting the switch group state reported by the microcontroller bus, judging whether the cross-linking signal switching is correct or not in the current test mode, if not, detecting again after adjustment, if so, indicating that the power-on can be safely performed, and starting the subsequent automatic test flow.
The protection scope of the present application is not limited to the specific embodiments described above, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered in the protection scope of the present application, and various modifications and changes, such as changing the type and number of the modules to be tested, the number of multiple-pole double-throw linked switch blades, the power-on safety detection logic sequence, etc., are possible. Any modifications, equivalent substitutions, and improvements made without departing from the principles of the present invention are intended to be included within the scope of the claims of the present invention. . Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (2)
1. The multi-module testing system of the automatic testing system is characterized by comprising a testing resource end and a tested object end, wherein the testing resource end comprises a receiver, ATE hardware and testing system software, the tested object end comprises an adapter and a plurality of tested module interfaces, the tested module interfaces are used for being inserted into tested modules, the tested modules are connected with the testing resource end through an adaptive conditioning board of the adapter, the adapter comprises a three-state linkage switch group switching circuit and a plurality of signal conditioning circuits, independent signals of each tested module are connected with the testing resource end through the corresponding signal conditioning circuits, and crosslinked signals of the tested modules are connected with the testing resource end through the signal conditioning circuits after being switched by the three-state linkage switch group switching circuits;
the three-state linkage switch group switching circuit comprises a plurality of groups of multi-pole linkage double-throw switch assemblies with the same logic, and hardware switching of test modes and crosslinking signals is realized by configuring the switching logic of the multi-pole linkage double-throw switch assemblies and matching with module plugging;
the multi-group multi-pole linkage double-throw switch assembly with the same logic comprises a multi-way switch, wherein the switch is used for switching states, the public end of the switch is directly connected with the cross-linked signals of the tested modules, and the switching end is connected with the signal conditioning circuits corresponding to the tested modules;
the multi-group multi-pole linkage double-throw switch assembly with the same logic also comprises a switching state extraction assembly for extracting the state of the upper switch;
the adapter is also provided with a microcontroller, and the microcontroller receives the on-off state of the switching state extraction component, integrates the ID of the adaptive conditioning board and serial number information and sends the information to the test resource end through a serial port bus;
when a single tested module is tested, and only the corresponding tested module is connected to the adaptive conditioning board, the on-way switch is switched to a signal conditioning circuit corresponding to the tested module; when the two tested modules are connected, the two tested modules are simultaneously connected with the adaptive conditioning board, the upper switch is switched to an intermediate state, and the connection between the crosslinking signals of the two tested modules and the signal conditioning circuit is disconnected.
2. A multi-module testing method of an automatic testing system is characterized in that: the test system of claim 1 performs the steps of:
step 1, plugging a tested module according to a required test mode, switching the state of a tri-state linkage switch group, and selecting the model and the test mode of a power supply of a tested processor on a test system software interface;
step 2, starting software, the software automatically calls the testing resource to detect the identity information of the adapter, and verifies whether the adapter is selected to be correct or not by combining with the identity information of the adapting conditioning plate,
step 3, if not, prompting the error reason of the adapter, and exiting the process; if so, the software then detects an identity recognition circuit at the connector end of the tested module to recognize whether the occupying state and the identity of the module are correct; detecting the state of the three-state linkage switch group, judging whether the cross-linking signal switching is correct in the current test mode, if not, detecting again after adjustment, if so, indicating that the power-on can be safely performed, and starting the subsequent automatic test flow.
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