CN114170452A

CN114170452A - Signal quality evaluation method and device, computer device and computer readable storage medium

Info

Publication number: CN114170452A
Application number: CN202111388495.6A
Authority: CN
Inventors: 张军伟; 郭燕慧; 卞恺慧; 黄建新; 邹小兵; 聂华
Original assignee: Zhongke Controllable Information Industry Co Ltd
Current assignee: Zhongke Controllable Information Industry Co Ltd
Priority date: 2021-11-22
Filing date: 2021-11-22
Publication date: 2022-03-11
Anticipated expiration: 2041-11-22
Also published as: CN114170452B

Abstract

The application relates to a signal quality evaluation method and device, computer equipment and a computer readable storage medium, a DQ waveform diagram and a DQS waveform diagram corresponding to the DQ waveform diagram are obtained, and aiming at the DQ waveform diagram, the DQ waveform diagram is used as a reference clock signal to generate a DQ eye diagram based on the DQ waveform diagram. And calculating a reference level value of the DQ waveform diagram, and drawing a target eye diagram template in the DQ eye diagram according to the reference level value of the DQ waveform diagram and preset eye diagram template parameters. And evaluating the signal quality of the DQ wave pattern based on the position relation between the target eye pattern template and the DQ eye pattern. Because the DQS signal is a signal generated in real time, a more accurate reference clock signal can be provided, and therefore, the generated DQ eye diagram can be triggered based on the reference clock signal, and intersymbol interference and noise of the signal can be reflected. Furthermore, the DQ wave pattern is evaluated on the basis of the position relation between the target eye pattern template and the DQ eye pattern, so that the accuracy of evaluating the signal quality on the basis of the eye pattern is improved.

Description

Signal quality evaluation method and device, computer device and computer readable storage medium

Technical Field

The present application relates to the field of computer memory technologies, and in particular, to a signal quality evaluation method and apparatus, a computer device, and a computer-readable storage medium.

Background

DDR (DDR SDRAM) is a type of double data Rate Synchronous Random Access Memory. For a link system containing DDR, the performance of the link can be judged through a DDR eye pattern and an eye pattern template. The DDR signal is referred to as a DDR signal, and the DDR signal includes a DQS signal and a DQ signal. The DQS signal is a source clock signal for signal synchronization between the memory and the memory controller, and the DQ signal is the data signal data.

The Eye diagram (Data Eye) is formed by overlapping a plurality of random Data in a half period of a high-speed signal (including a signal of a high-speed input/output port), is obtained by sampling the Data signal at the input/output port through an oscilloscope and other instruments, and is measured by the maximum rectangle contained in the Eye diagram, and under a certain fixed frequency, the larger the Height (Data Eye Height) and the Width (Data Eye Width) of the rectangle are, the better the Eye diagram is. And the quality of the eye pattern is judged according to the eye pattern template, if the opening degree of the eye pattern is too small and the eye pattern template is touched, the signal quality is poor, and the function cannot be met.

The DDR eye includes a DQS eye and a DQ eye, where the DQS eye is an eye generated based on the DQS signal and the DQ eye is an eye generated based on the DQ signal.

When generating the DQS eye diagram and the DQ eye diagram, the conventional simulation software is triggered and generated based on a preset clock signal. However, the deviation exists between the preset clock signal and the actual clock signal, so that the generated DQ eye pattern ignores information such as inter-symbol crosstalk and noise, and the accuracy of the evaluation result of signal quality evaluation based on the eye pattern is low.

Disclosure of Invention

The embodiment of the application provides a signal quality evaluation method and device, computer equipment and a computer readable storage medium, which can improve the accuracy of signal quality evaluation based on an eye diagram.

In one embodiment, there is provided a signal quality assessment method, the method comprising:

obtaining a DQ waveform diagram and a DQS waveform diagram corresponding to the DQ waveform diagram;

for the DQ wave pattern, taking the DQS wave pattern as a reference clock signal, and generating a DQ eye pattern based on the DQ wave pattern;

calculating a reference level value of the DQ waveform diagram, and drawing a target eye diagram template in the DQ eye diagram according to the reference level value of the DQ waveform diagram and preset eye diagram template parameters;

and evaluating the signal quality of the DQ wave pattern based on the position relation between the target eye pattern template and the DQ eye pattern.

In the embodiment of the application, when the DQ eye pattern is generated based on the DQ waveform pattern, the DQS waveform pattern is used as a reference clock signal to trigger generation of the DQ eye pattern. Because the DQS signal is a signal generated in real time, a more accurate reference clock signal can be provided, and therefore, compared with a DQ eye pattern generated based on an ideal clock signal, the DQ eye pattern generated based on the reference clock signal triggering can reflect intersymbol interference and noise of the signal, namely, the actual situation of the signal is closer. Furthermore, the DQ wave pattern is evaluated on the basis of the position relation between the target eye pattern template and the DQ eye pattern, so that the accuracy of evaluating the signal quality on the basis of the eye pattern is improved.

In one embodiment, the generating a DQ eye pattern based on the DQ waveform pattern using the DQS waveform pattern as a reference clock signal includes:

acquiring the abscissa of each waveform demarcation point from the DQS oscillogram, and calculating the difference of the abscissas of the adjacent waveform demarcation points;

calculating an average waveform period in the DQS waveform diagram based on the difference of the abscissas;

and reconstructing the DQ wave pattern according to the average wave period to generate a DQ eye pattern corresponding to the DQ wave pattern.

In the embodiment of the present application, the abscissa of each waveform boundary point is obtained from the DQS waveform diagram, the difference between the abscissas of adjacent waveform boundary points is calculated, and the average waveform period in the DQS waveform diagram is calculated based on the difference between the abscissas. Here, the average waveform period calculated from the DQS waveform diagram is the reference clock signal. Then, the DQ waveform pattern is reconstructed from the average waveform period as a reference clock signal, and a DQ eye pattern corresponding to the DQ waveform pattern is generated. In this manner, the average waveform period calculated from the DQS waveform diagram is achieved and used as the reference clock signal. Because the DQS signal is a signal generated in real time, a more accurate reference clock signal can be provided, and therefore, compared with a DQ eye pattern generated based on an ideal clock signal, the DQ eye pattern generated based on the reference clock signal triggering can reflect intersymbol interference and noise of the signal, namely, the actual situation of the signal is closer.

In one embodiment, the reconstructing the DQ waveform map according to the average waveform period to generate a DQ eye map corresponding to the DQ waveform map includes:

for the DQ waveform map, obtaining a plurality of target DQ waveforms from the DQ waveform map according to the average waveform period;

and overlapping the plurality of target DQ waveforms to generate a DQ eye diagram corresponding to the DQ waveform diagram.

In the embodiment of the present application, after the average waveform period calculated from the DQS waveform diagram, the DQ waveform diagram is reconstructed according to the average waveform period by using the average waveform period as a reference clock signal, and a DQ eye diagram corresponding to the DQ waveform diagram is generated. In this manner, the average waveform period calculated from the DQS waveform diagram is achieved and used as the reference clock signal. Because the DQS signal is a signal generated in real time, a more accurate reference clock signal can be provided, and therefore, compared with a DQ eye pattern generated based on an ideal clock signal, the DQ eye pattern generated based on the reference clock signal triggering can reflect intersymbol interference and noise of the signal, namely, the actual situation of the signal is closer.

In one embodiment, the DQ waveform comprises a predetermined number of DQ sub-waveforms corresponding to a predetermined number of DQ signals of a transmission line; the calculating the reference level value of the DQ waveform diagram, and drawing a target eye diagram template in the DQ eye diagram according to the reference level value of the DQ waveform diagram and preset eye diagram template parameters, includes:

calculating a target level value of the DQ sub-waveform for each DQ sub-waveform included in the DQ waveform;

calculating a mean value of the target level values of the DQ wavelet diagrams, and taking the mean value as the target level value of the DQ wavelet diagrams;

calculating a coordinate value of a vertex of the target eye pattern template in the DQ eye pattern according to the target level value of the DQ waveform pattern and preset eye pattern template parameters;

and drawing the target eye pattern template in the DQ eye pattern based on the coordinate value of the vertex of the target eye pattern template in the DQ eye pattern.

In the embodiment of the present application, first, a target level value of a DQ waveform map may be calculated based on a target level value of each DQ sub waveform map. Then, a target eye pattern template can be drawn in the DQ eye pattern according to the target level value of the DQ waveform pattern and preset eye pattern template parameters. The generated DQ eye diagram is triggered by using the DQS waveform diagram as a reference clock signal, so that information such as intersymbol interference and noise of the signal can be better represented, namely, the actual situation of the signal is closer, and therefore, the accuracy of the calculated target level value of the DQ waveform diagram is improved. Furthermore, the accuracy of the finally drawn target eye pattern template is also improved. And then based on the position relation between the target eye pattern template and the DQ eye pattern, the DQ wave pattern is evaluated in signal quality, so that the accuracy of evaluating the signal quality based on the eye pattern is improved.

In one embodiment, the calculating target level values for the DQ sub-wave patterns for each DQ sub-wave pattern included within the DQ wave pattern comprises:

acquiring signal parameters of DQ sub-signals corresponding to each DQ sub-waveform pattern; the signal parameters comprise DDR working voltage, input high level percentage, input low level percentage and scanning voltage step length;

for each clock cycle of the DQ sub-oscillogram, scanning each voltage value in a voltage amplitude range from a high level to a low level by the scanning voltage step length, and calculating a first duration and a second duration in the clock cycle; the first duration is a time interval between crossing points of a rising edge of a DQ signal, a falling edge of a DQS signal, and a reference level value of the DQ sub-oscillogram in the clock cycle; the second duration is a time interval between crossing points of falling edges of DQS signals, falling edges of DQ signals and reference level values of the DQ sub-oscillogram in the clock cycle; the reference level value is a currently scanned voltage value;

and calculating a target level value of the DQ wavelet graph based on the first duration and the second duration under each voltage value.

In the embodiment of the present application, signal parameters of DQ sub-signals corresponding to each of the DQ sub-waveforms are obtained. And aiming at each clock cycle of the DQ sub-oscillogram, scanning each voltage value in a voltage amplitude range from a high level to a low level by the scanning voltage step length, and calculating a first duration and a second duration in the clock cycle. And calculating a target level value of the DQ wavelet graph based on the first duration and the second duration under each voltage value. The target level value of the DQ sub-oscillogram can be accurately calculated based on the manner of calculating the first time duration and the second time duration, and further, the target level value of the DQ oscillogram can be calculated based on the target level value of each DQ sub-oscillogram.

In one embodiment, said calculating a target level value for said DQ sub-waveform based on said first duration and said second duration for each of said voltage values comprises:

calculating the maximum value of the sum of the first duration and the second duration under each voltage value, and taking the maximum value of the sum of the first duration and the second duration as the eye width under the current scanning voltage value;

determining a maximum eye width from eye widths at each of the voltage values within the voltage amplitude range;

and setting a voltage value corresponding to the maximum eye width as a target level value of the DQ sub waveform pattern.

In this embodiment of the present application, a maximum value of a sum of the first duration and the second duration at each voltage value is calculated, and the maximum value of the sum of the first duration and the second duration is used as the eye width at the currently scanned voltage value. Determining a maximum eye width from the eye widths at the voltage values in the voltage amplitude range, and using the voltage value corresponding to the maximum eye width as the target level value of the DQ sub-waveform pattern. The target level value of the DQ sub-oscillogram can be accurately calculated based on the manner of calculating the first time duration and the second time duration, and further, the target level value of the DQ oscillogram can be calculated based on the target level value of each DQ sub-oscillogram.

In one embodiment, a signal quality assessment method is provided, further comprising:

and acquiring the preset eye pattern template parameters, wherein the preset eye pattern template parameters comprise the minimum eye height of the preset eye pattern template, the minimum eye width of the preset eye pattern template and a preset waveform period.

In one embodiment, the obtaining the DQ waveform map and the DQs waveform map corresponding to the DQ waveform map comprises:

acquiring DDR signals from a DDR chip, wherein the DDR signals comprise DQ signals and DQS signals corresponding to the DQ signals;

the DQ waveform diagram is generated based on the DQ signal, and the DQS waveform diagram corresponding to the DQ waveform diagram is generated based on the DQS signal.

In one embodiment, there is provided a signal quality assessment apparatus for use in a computer device, the apparatus comprising:

the device comprises a waveform diagram acquisition module, a data processing module and a data processing module, wherein the waveform diagram acquisition module is used for acquiring a DQ waveform diagram and a DQS waveform diagram corresponding to the DQ waveform diagram;

a DQ eye diagram generating module, configured to generate a DQ eye diagram based on the DQ waveform diagram by using the DQS waveform diagram as a reference clock signal for the DQ waveform diagram;

the target eye pattern template drawing module is used for calculating a reference level value of the DQ waveform pattern and drawing a target eye pattern template in the DQ eye pattern according to the reference level value of the DQ waveform pattern and preset eye pattern template parameters;

and the signal quality evaluation module is used for evaluating the signal quality of the DQ wave pattern based on the position relation between the target eye pattern template and the DQ eye pattern.

A computer device comprising a memory and a processor, the memory having stored therein a computer program which, when executed by the processor, causes the processor to carry out the steps of the signal quality assessment method as described above.

A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the signal quality assessment method as described above.

A computer program product comprising a computer program which, when being executed by a processor, carries out the steps of the signal quality assessment method as described above.

The signal quality evaluation method and device, the computer device and the computer readable storage medium obtain a DQ waveform diagram and a DQS waveform diagram corresponding to the DQ waveform diagram, and generate a DQ eye diagram based on the DQ waveform diagram by taking the DQS waveform diagram as a reference clock signal aiming at the DQ waveform diagram. And calculating a reference level value of the DQ waveform diagram, and drawing a target eye diagram template in the DQ eye diagram according to the reference level value of the DQ waveform diagram and preset eye diagram template parameters. And evaluating the signal quality of the DQ wave pattern based on the position relation between the target eye pattern template and the DQ eye pattern. When a DQ eye pattern is generated based on a DQ waveform pattern, the DQ eye pattern is generated by triggering the DQS waveform pattern as a reference clock signal. Because the DQS signal is a signal generated in real time, a more accurate reference clock signal can be provided, and therefore, compared with a DQ eye pattern generated based on an ideal clock signal, the DQ eye pattern generated based on the reference clock signal triggering can reflect intersymbol interference and noise of the signal, namely, the actual situation of the signal is closer. Furthermore, the DQ wave pattern is evaluated on the basis of the position relation between the target eye pattern template and the DQ eye pattern, so that the accuracy of evaluating the signal quality on the basis of the eye pattern is improved.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

FIG. 1 is a diagram of an exemplary embodiment of a signal quality assessment method;

FIG. 2 is a flow diagram of a method for signal quality assessment in one embodiment;

FIG. 3 is a diagram of a DQS waveform in one embodiment;

FIG. 4 is a schematic diagram of a single DQ wavelet in one embodiment;

FIG. 5 is a flowchart of a method for generating a DQ eye based on the DQ waveform of FIG. 2 using the DQS waveform as a reference clock signal;

FIG. 6 is a schematic of a DQ eye for one embodiment;

FIG. 7 is a schematic diagram of a DQS eye in one embodiment;

FIG. 8 is a flowchart of a method for calculating a reference level value of the DQ waveform of FIG. 2 and drawing a target eye pattern template in the DQ eye pattern according to the reference level value of the DQ waveform and predetermined eye pattern template parameters;

FIG. 9 is a diagram illustrating an eye template rendering process in one embodiment;

FIG. 10 is a schematic diagram of a signal quality assessment method in one particular embodiment;

fig. 11 is a block diagram showing the structure of a signal quality evaluating apparatus according to an embodiment;

FIG. 12 is a block diagram of a DQ eye diagram generation block of FIG. 11;

FIG. 13 is a diagram showing an internal configuration of a computer device according to an embodiment.

Detailed Description

In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

Fig. 1 is a schematic diagram of an application environment of a signal quality evaluation method in an embodiment. As shown in fig. 1, the application environment includes a computer device 120, where the computer device 120 includes a DDR chip 122 and a double data Synchronous Dynamic Random Access Memory (DDR SDRAM), which is abbreviated as DDR. The DDR signal includes DQS signal and DQ signal.

Computer device 120 may obtain a DQ waveform map and a DQs waveform map corresponding to the DQ waveform map; the abscissa of the DQ waveform diagram and the DQS waveform diagram is time, and the ordinate is a voltage value; aiming at the DQ wave pattern, taking the DQS wave pattern as a reference clock signal, and generating a DQ eye pattern based on the DQ wave pattern; calculating a reference level value of the DQ waveform diagram, and drawing a target eye diagram template in the DQ eye diagram according to the reference level value of the DQ waveform diagram and preset eye diagram template parameters; and evaluating the signal quality of the DQ wave pattern based on the position relation between the target eye pattern template and the DQ eye pattern.

The computer device 120 may be, but is not limited to, various servers, personal computers, notebook computers, smart phones, tablet computers, internet of things devices, and portable wearable devices, and the internet of things devices may be smart speakers, smart televisions, smart air conditioners, smart car-mounted devices, and the like. The portable wearable device can be a smart watch, a smart bracelet, a head-mounted device, and the like.

When generating the DQS eye diagram and the DQ eye diagram, the conventional simulation software is triggered and generated based on a preset clock signal. However, the deviation exists between the preset clock signal and the actual clock signal, so that the generated DQ eye pattern ignores information such as inter-symbol crosstalk and noise, and the accuracy of the evaluation result of signal quality evaluation based on the eye pattern is low. In order to solve the problem that the accuracy of an evaluation result of signal quality evaluation in the conventional method is low, the application provides a new signal quality evaluation method.

Fig. 2 is a flow diagram of a signal quality assessment method in one embodiment. The signal quality evaluation method in the present embodiment is described by taking the computer device in fig. 1 as an example. As shown in fig. 2, the signal quality evaluation method includes steps 220 to 280. Wherein,

step 220, obtain the DQ waveform diagram and the DQs waveform diagram corresponding to the DQ waveform diagram.

The computer equipment acquires DDR signals from the DDR chip, wherein the DDR signals comprise DQ signals and DQS signals corresponding to the DQ signals. The abscissa of the DQ waveform diagram and the DQS waveform diagram is time, and the ordinate is a voltage value. The DQS signal is a source clock signal for signal synchronization between the memory and the memory controller in the DDR chip, and the DQ signal is the data signal data. Typically, because a DDR chip has eight data lines, the DDR chip generates eight DQ sub-signals, which form a set of DQ signals. And the group of DQ signals share the same DQs signal.

Then, the computer device generates a set of DQ waveforms and DQs waveforms corresponding to the DQ waveforms, respectively, based on the acquired set of DQ signals and DQs signals corresponding to the set of DQ signals. Specifically, when a DQS waveform diagram is generated based on a DQS signal, the DQS waveform diagram is formed by setting the generation time of the DQS signal as abscissa and the voltage value of the DQS signal as ordinate. FIG. 3 is a diagram of a DQS waveform in one embodiment. The middle point of the adjacent high level and low level is obtained from the DQS sub-waveform diagram as each waveform dividing point, and the abscissa (i.e. time) of the middle point is taken as the abscissa of each waveform dividing point and is respectively marked as X₁，X₂，X₃，X₄…X_n。

When a set of DQ waveforms is generated based on a set of DQ signals, a DQ sub-waveform is formed for each DQ sub-signal by setting the generation time of the DQ sub-signal on the DQS waveform as the abscissa and the voltage value of the DQ sub-signal as the ordinate. FIG. 4 is a schematic diagram of a single DQ sub-waveform, a DQS waveform corresponding to the DQ sub-waveform, the DQ sub-waveform being centered primarily on the abscissa. The middle point of the adjacent high level and low level is obtained from the DQS sub-waveform diagram as each waveform dividing point, and the abscissa (i.e. time) of the middle point is taken as the abscissa of each waveform dividing point and is respectively marked as X₁，X₂，X₃，X₄…X_n. In FIG. 4, only the intervals are marked with X₁，X₃，X₅…X_n。

Step 240, regarding the DQ waveform diagram, the DQs waveform diagram is used as a reference clock signal to generate a DQ eye diagram based on the DQ waveform diagram.

When the traditional simulation software is used for generating the DQ eye diagram, the generation is triggered based on a preset clock signal. However, the deviation exists between the preset clock signal and the actual clock signal, so that the generated DQ eye pattern ignores information such as inter-symbol crosstalk and noise, and the accuracy of the evaluation result of signal quality evaluation based on the eye pattern is low.

Therefore, for each DQ sub-waveform pattern in the set of DQ waveform patterns, a set of DQ eye patterns is generated based on the DQ sub-waveform pattern using the DQs signal of the DQs waveform pattern corresponding to the DQ sub-waveform pattern as a reference clock signal. Since the DQS signal is a real-time generated signal with less deviation from the actual clock signal, a more accurate reference clock signal can be provided. Therefore, the DQ eye pattern generated based on the reference clock signal trigger can reflect the intersymbol interference and noise of the signal, namely, the actual situation of the signal is closer to the actual situation of the signal compared with the DQ eye pattern generated based on an ideal clock signal. Further, the accuracy of a set of DQ eye diagrams generated from DQ sub-waveform diagrams based on the DQS signal as a reference clock signal is improved.

And step 260, calculating a reference level value of the DQ waveform diagram, and drawing a target eye diagram template in the DQ eye diagram according to the reference level value of the DQ waveform diagram and preset eye diagram template parameters.

After the DQ eye pattern is generated, the target eye pattern template may be further rendered in the DQ eye pattern. Specifically, first, a reference level value of the DQ waveform pattern is calculated. For a set of DQ signals, a reference level value for each DQ sub-waveform corresponding to the set of DQ signals may be calculated. And calculating the reference level value of the DQ wave pattern based on the reference level value of each DQ sub wave pattern. Here, the specific calculation process is not limited, and for example, the reference level value of the DQ waveform map may be generated by calculating a weighted average of the reference level values of the respective DQ sub-waveform maps; or selecting the maximum value or the minimum value from the reference level values of the DQ sub-oscillograms as the reference level value of the DQ oscillogram; this is not limited in this application.

And secondly, calculating the position coordinate of the target eye pattern template in the DQ eye pattern according to the reference level value of the DQ waveform pattern and the preset eye pattern template parameter. The preset eye pattern template parameter may be preset by a preset specification, or may be an empirical value, which is not limited in the present application. The position coordinates of the target eye pattern template in the DQ eye pattern may be coordinates of a central point of the target eye pattern template, a size of the template, and the like, which is not limited in this application.

Finally, the target eye pattern template can be drawn in the DQ eye pattern based on the position coordinates of the target eye pattern template in the DQ eye pattern.

Step 280, performing signal quality evaluation on the DQ wave pattern based on the position relationship between the target eye pattern template and the DQ eye pattern.

The signal quality can be evaluated based on the eye pattern, and particularly, the quality of the eye pattern can be measured by the maximum rectangle which can be included in the eye pattern. For example, at a certain fixed signal frequency, the larger the Height (Data Eye Height) and Width (Data Eye Width) of the rectangle, the better the Eye diagram. And the quality of the eye pattern can be judged according to the eye pattern template, and if the eye pattern opening is too small and the eye pattern template is touched, the poor quality of the DDR signal is shown.

After the target eye pattern template is drawn in the DQ eye pattern, the DQ waveform pattern can be evaluated for signal quality based on the positional relationship between the target eye pattern template and the DQ eye pattern. Specifically, the quality of the eye pattern can be measured by the largest rectangle included in the eye pattern, and the quality of the DDR signal can also be measured based on whether the eye pattern template touches the eye pattern.

In the embodiment of the present application, a DQ waveform diagram and a DQs waveform diagram corresponding to the DQ waveform diagram are obtained, and for the DQ waveform diagram, the DQs waveform diagram is used as a reference clock signal, and a DQ eye diagram is generated based on the DQ waveform diagram. And calculating a reference level value of the DQ waveform diagram, and drawing a target eye diagram template in the DQ eye diagram according to the reference level value of the DQ waveform diagram and preset eye diagram template parameters. And evaluating the signal quality of the DQ wave pattern based on the position relation between the target eye pattern template and the DQ eye pattern. When a DQ eye pattern is generated based on a DQ waveform pattern, the DQ eye pattern is generated by triggering the DQS waveform pattern as a reference clock signal. Because the DQS signal is a signal generated in real time, a more accurate reference clock signal can be provided, and therefore, compared with a DQ eye pattern generated based on an ideal clock signal, the DQ eye pattern generated based on the reference clock signal triggering can reflect intersymbol interference and noise of the signal, namely, the actual situation of the signal is closer. Furthermore, the DQ wave pattern is evaluated on the basis of the position relation between the target eye pattern template and the DQ eye pattern, so that the accuracy of evaluating the signal quality on the basis of the eye pattern is improved.

In the previous embodiment, it was described that when generating a DQ eye pattern based on a DQ waveform pattern, the generation of the DQ eye pattern is triggered using the DQs waveform pattern as a reference clock signal. As shown in fig. 5, the detailed implementation step 240 in this embodiment of taking the DQS waveform as the reference clock signal and generating the DQ eye diagram based on the DQ waveform includes:

in step 242, the abscissa of each waveform demarcation point is obtained from the DQS waveform map and the difference between the abscissas of adjacent waveform demarcation points is calculated.

Referring to FIG. 3, for each DQS sub-waveform in a set of DQS waveforms, the midpoint between adjacent high and low levels is obtained from the DQS sub-waveform as each waveform boundary, and the abscissa (i.e., time) of the midpoint is used as the abscissa of each waveform boundaryMarks, each denoted as X₁，X₂，X₃，X₄…X_n. Then calculating the difference of the horizontal coordinates of the adjacent waveform dividing points, i.e. calculating X_i-X_i-1Wherein i takes on a value from 2 to n.

At step 244, an average waveform period in the DQS waveform diagram is calculated based on the difference in the abscissas.

The average waveform period UI in the DQS waveform diagram is calculated based on the difference in the abscissa by the following formula (1-1). Wherein,

step 246, reconstructing the DQ waveform pattern according to the average waveform period, and generating a DQ eye pattern corresponding to the DQ waveform pattern.

Specifically, the oscillogram is captured from the DQ oscillogram according to two average waveform periods UI, the abscissa of the captured oscillogram is reconstructed into-UI to + UI, and the ordinate is kept unchanged, so that the DQ eye diagram is generated through superposition. FIG. 6 is a diagram of a DQ eye diagram in one embodiment, with the abscissa being-UI- + UI and the ordinate being the voltage value.

On the other hand, the DQS waveform pattern may be reconstructed from the average waveform period to generate a DQS eye pattern corresponding to the DQS waveform pattern. And intercepting the waveform diagram from the DQS waveform diagram according to two average waveform periods UI, reconstructing the abscissa of the intercepted waveform diagram into-UI- + UI, and keeping the ordinate unchanged, thereby generating the DQS eye diagram in a superposition mode. FIG. 7 is a schematic diagram of a DQS eye in one embodiment, with the abscissa being-UI- + UI and the ordinate being the voltage value.

In the embodiment of the present application, the abscissa of each waveform boundary point is obtained from the DQS waveform diagram, the difference between the abscissas of adjacent waveform boundary points is calculated, and the average waveform period in the DQS waveform diagram is calculated based on the difference between the abscissas. Here, the average waveform period calculated from the DQS waveform diagram is the reference clock signal. Then, the DQ waveform pattern is reconstructed from the average waveform period, using the average waveform period as a reference clock signal, to generate a DQ eye pattern corresponding to the DQ waveform pattern. In this manner, the average waveform period calculated from the DQS waveform diagram is achieved and used as the reference clock signal. Because the DQS signal is a signal generated in real time, a more accurate reference clock signal can be provided, and therefore, compared with a DQ eye pattern generated based on an ideal clock signal, the DQ eye pattern generated based on the reference clock signal triggering can reflect intersymbol interference and noise of the signal, namely, the actual situation of the signal is closer.

In the previous embodiment, reconstructing the DQ waveform pattern according to the average waveform period to generate a DQ eye pattern corresponding to the DQ waveform pattern includes:

for a DQ waveform diagram, obtaining a plurality of target DQ waveforms from the DQ waveform diagram according to an average waveform period;

a plurality of target DQ waveforms are superimposed to generate a DQ eye corresponding to the DQ waveform.

Specifically, the oscillogram is captured from the DQ oscillogram according to two average waveform periods UI, and a plurality of target DQ waveforms are obtained. And reconstructing the abscissa of the plurality of intercepted target DQ waveforms into-UI- + UI, and keeping the ordinate unchanged, thereby generating a DQ eye diagram by superposition. FIG. 6 is a diagram of a DQ eye diagram in one embodiment, with the abscissa being-UI- + UI and the ordinate being the voltage value.

In one embodiment, the DQ waveform comprises a predetermined number of DQ sub-waveforms, the predetermined number of DQ sub-waveforms corresponding to a predetermined number of DQ signals of the transmission line. Then, as shown in fig. 8, the detailed implementation steps of step 260 in this embodiment, calculating a reference level value of the DQ waveform diagram, and drawing a target eye diagram template in the DQ eye diagram according to the reference level value of the DQ waveform diagram and preset eye diagram template parameters, include:

step 262, calculate target level values for the DQ sub-waveforms for each DQ sub-waveform included in the DQ waveform diagram.

Step 264, calculating the average value of the target level values of the DQ sub-oscillograms, and using the average value as the target level value of the DQ oscillogram.

Typically, because a DDR chip has eight data lines, the DDR chip generates eight DQ sub-signals, which form a set of DQ signals. A DQ sub-waveform is generated based on one DQ sub-signal, and thus a set of DQ signals corresponds to a set of DQ waveforms, i.e. a set of DQ waveforms comprises eight DQ sub-waveforms.

Specifically, a target level value of the DQ sub-waveform pattern is calculated for each DQ sub-waveform pattern included in the DQ waveform pattern, and the target level value is a current actual level value of a DQ sub-signal of the DQ sub-waveform pattern. And calculating the average value of the target level values of the DQ sub-oscillograms, and taking the average value as the target level value of the DQ oscillogram. For example, since a group of DQ bit patterns includes eight DQ bit patterns, an average of target level values of the eight DQ bit patterns is calculated, and the average is used as the target level value of the DQ bit pattern, which is a current actual level value of a DQ signal of the DQ bit pattern.

Step 266, calculating the coordinate value of the vertex of the target eye pattern template in the DQ eye pattern according to the target level value of the DQ waveform pattern and the preset eye pattern template parameter;

and step 268, drawing the target eye pattern template in the DQ eye pattern based on the coordinate value of the vertex of the target eye pattern template in the DQ eye pattern.

Specifically, a target level value of the DQ waveform diagram and a preset eye diagram template parameter are obtained. The preset eye pattern template parameters comprise the minimum eye height and the minimum eye width of the eye pattern. The minimum eye height VdIVW of the eye pattern is a value set by the eye pattern specification, and the minimum eye width TdIVW of the eye pattern is also a value set by the eye pattern specification. Further acquisition of the average waveform period UI of the DQ waveform map is required.

Then, the coordinate value of the vertex of the target eye pattern template in the DQ eye pattern can be calculated according to the target level value Vref _ DQ of the DQ waveform pattern and a preset eye pattern template parameter, wherein the target eye pattern template can also be called a mask. The formula for calculating the coordinate values of the vertexes of the target eye pattern template in the DQ eye pattern is shown as the following (1-2):

mask1＝(-0.5×TdIVW×UI,Vref_DQ+0.5×VdIVW)；

mask2＝(0.5×TdIVW×UI,Vref_DQ+0.5×VdIVW)；

mask3＝(0.5×TdIVW×UI,Vref_DQ-0.5×VdIVW)；

mask4＝(-0.5×TdIVW×UI,Vref_DQ-0.5×VdIVW)； (1-2)

wherein, mask1 is the coordinates of the top left vertex of the mask, mask2 is the coordinates of the top right vertex of the mask, mask3 is the coordinates of the bottom left vertex of the mask, and mask4 is the coordinates of the bottom right vertex of the mask. VdIVW is the minimum eye height of the eye diagram, TdIVW is the minimum eye width of the eye diagram, and UI is the average waveform period of the DQ waveform diagram.

Fig. 9 is a schematic diagram illustrating a process of drawing an eye pattern template according to an embodiment. Specifically, based on the coordinate value of the vertex of the target eye pattern template in the DQ eye pattern, the target eye pattern template can be drawn in the DQ eye pattern.

In the embodiment of the present application, first, a target level value of a DQ waveform map may be calculated based on a target level value of each DQ sub waveform map. Then, a target eye pattern template can be drawn in the DQ eye pattern according to the target level value of the DQ waveform pattern and the preset eye pattern template parameters. The generated DQ eye diagram is triggered by using the DQS waveform diagram as a reference clock signal, so that information such as intersymbol interference and noise of the signal can be better represented, namely, the actual situation of the signal is closer, and therefore, the accuracy of the calculated target level value of the DQ waveform diagram is improved. Furthermore, the accuracy of the finally drawn target eye pattern template is also improved. And then, based on the position relation between the target eye pattern template and the DQ eye pattern, the signal quality of the DQ wave pattern is evaluated, so that the accuracy of evaluating the signal quality based on the eye pattern is improved.

In the previous embodiment, step 862 is further detailed, and the specific implementation step of calculating the target level value of the DQ sub-waveform diagram for each DQ sub-waveform diagram included in the DQ waveform diagram includes:

acquiring signal parameters of DQ sub-signals corresponding to each DQ sub-waveform; the signal parameters comprise DDR working voltage, input high level percentage, input low level percentage and scanning voltage step length;

aiming at each clock cycle of the DQ sub-waveform graph, scanning each voltage value in a voltage amplitude range from a high level to a low level by a scanning voltage step length, and calculating a first duration and a second duration in the clock cycle; the first duration is a time interval between a rising edge of the DQ signal, a falling edge of the DQS signal, and a crossing point of a reference level value of the DQ sub-waveform pattern in a clock cycle; the second duration is the time interval between the falling edge of the DQS signal, the falling edge of the DQ signal and the crossing point of the reference level value of the DQ sub-waveform diagram in the clock cycle; the reference level value is a currently scanned voltage value;

and calculating a target level value of the DQ sub-oscillogram based on the first duration and the second duration under each voltage value.

Specifically, fig. 9 is a schematic diagram illustrating an embodiment of calculating a target level value of a DQ sub-waveform diagram. And acquiring signal parameters of the DQ sub-signals corresponding to each DQ sub-waveform graph, wherein the signal parameters comprise the working voltage VDD of the DDR chip, the input high level percentage Vref _ H, the low level percentage Vref _ L and the scanning voltage step Vref _ step. For example: assuming that VDD is 1200mV, Vref _ H is 40%, Vref _ L is 80%, and Vref _ step is 0.45mV, the voltage amplitude range from high level to low level of the DDR chip can be calculated to be 480mV to 960 mV.

Then, for each clock cycle of the DQ sub-waveform graph, each voltage value in the voltage amplitude range from the high level to the low level is scanned by the scanning voltage step length, and the first duration and the second duration are calculated in the clock cycle. For example, in the range of 480mV to 960mV, the first duration and the second duration are calculated in clock cycles by scanning in steps of 0.45 mV. Here, a clock cycle refers to a waveform period of a DQ sub-waveform pattern, i.e., a period in which one complete waveform appears.

Referring to FIG. 9, the first duration tDS is the time interval between the rising edge of the DQ signal, the falling edge of the DQS signal, and the crossing point of the reference level value Vref _ DQ of the DQ sub-waveform in a clock cycle. The second duration tDH is the time interval between the falling edge of the DQS signal, the falling edge of the DQ signal, and the crossing point of the reference level value Vref _ DQ of the DQ sub-waveform during a clock cycle. Here, the reference level value Vref _ DQ is a voltage value of the current scan. That is, each voltage value in the range of the voltage amplitude from the high level to the low level is scanned once, and a first time duration tDS and a second time duration tDH corresponding to each voltage value are calculated.

And finally, calculating a target level value of the DQ sub-oscillogram based on the first duration and the second duration under each voltage value. Specifically, the eye width at each voltage value is calculated based on the first time length and the second time length at each voltage value. The voltage value corresponding to the maximum eye width is used as the target level value of the DQ sub-waveform pattern. The target level values of the DQ sub-waveforms are averaged to obtain the target level values of the DQ waveforms.

In the embodiment of the present application, signal parameters of the DQ sub-signals corresponding to each DQ sub-waveform pattern are obtained. And aiming at each clock cycle of the DQ sub-waveform graph, scanning each voltage value in the voltage amplitude range from the high level to the low level by a scanning voltage step length, and calculating a first duration and a second duration in the clock cycle. And calculating a target level value of the DQ sub-oscillogram based on the first duration and the second duration under each voltage value. The target level value of the DQ sub-oscillogram can be accurately calculated based on the manner of calculating the first time duration and the second time duration, and further, the target level value of the DQ oscillogram can be calculated based on the target level value of each DQ sub-oscillogram.

In the previous embodiment, calculating the target level value of the DQ sub-waveform diagram based on the first duration and the second duration under each voltage value includes:

determining the maximum eye width from the eye widths under each voltage value in the voltage amplitude range;

the voltage value corresponding to the maximum eye width is set as the target level value of the DQ sub waveform pattern.

Specifically, for each clock cycle of the DQ sub-waveform diagram, each voltage value in a voltage amplitude range from a high level to a low level is scanned by a scanning voltage step, and a first duration and a second duration are calculated in the clock cycle. And calculating the maximum value of the sum of the first duration and the second duration under each voltage value, and taking the maximum value of the sum of the first duration and the second duration as the eye width under the current scanning voltage value.

Then, the maximum eye width is determined from the eye widths corresponding to all the voltage values within the range of the voltage amplitude from the high level to the low level. The voltage value corresponding to the maximum eye width is directly used as the target level value of the DQ sub waveform pattern. For example, when the voltage value corresponding to the maximum eye width is 800mV, 800mV is directly used as the target level value of the DQ sub waveform pattern.

In the embodiment of the application, the maximum value of the sum of the first duration and the second duration under each voltage value is calculated, and the maximum value of the sum of the first duration and the second duration is used as the eye width under the current scanning voltage value. The maximum eye width is determined from the eye widths at the respective voltage values within the voltage amplitude range, and the voltage value corresponding to the maximum eye width is set as the target level value of the DQ sub-waveform pattern. The target level value of the DQ sub-oscillogram can be accurately calculated based on the manner of calculating the first time duration and the second time duration, and further, the target level value of the DQ oscillogram can be calculated based on the target level value of each DQ sub-oscillogram.

In a specific embodiment, as shown in fig. 10, there is provided a signal quality evaluation method including:

step 1002, obtaining DDR signals from a DDR chip, wherein the DDR signals comprise DQ signals and DQS signals corresponding to the DQ signals;

step 1004, generating a DQ waveform diagram based on the DQ signal, and generating a DQS waveform diagram corresponding to the DQ waveform diagram based on the DQS signal;

step 1006, acquiring the abscissa of each waveform demarcation point from the DQs oscillogram aiming at the DQ oscillogram, and calculating the difference of the abscissas of adjacent waveform demarcation points;

step 1008, calculating an average waveform period in the DQS waveform based on the difference in the abscissa;

step 1010, obtaining a plurality of target DQ waveforms from the DQ waveform diagram according to the average waveform period;

step 1012, overlapping a plurality of target DQ waveforms to generate a DQ eye diagram corresponding to the DQ waveform diagram;

step 1014, calculating a target level value of the DQ sub-oscillogram for each DQ sub-oscillogram included in the DQ oscillogram;

specifically, step 1014 includes:

step 1014a, acquiring signal parameters of DQ sub-signals corresponding to each DQ sub-waveform;

1014b, aiming at each clock cycle of the DQ sub-waveform graph, scanning each voltage value in the voltage amplitude range from the high level to the low level by the scanning voltage step length, and calculating a first duration and a second duration in the clock cycle;

step 1014c, calculating a target level value of the DQ sub-waveform diagram based on the first duration and the second duration under each voltage value.

Step 1016, calculating an average value of the target level values of the DQ sub-oscillograms, and taking the average value as the target level value of the DQ oscillogram;

step 1018, calculating a coordinate value of a vertex of the target eye pattern template in the DQ eye pattern according to the target level value of the DQ waveform pattern and a preset eye pattern template parameter;

step 1020, drawing a target eye pattern template in the DQ eye pattern based on the coordinate value of the vertex of the target eye pattern template in the DQ eye pattern;

and step 1022, performing signal quality evaluation on the DQ wave pattern based on the position relationship between the target eye pattern template and the DQ eye pattern.

In the embodiments of the present application. And acquiring a DQ waveform diagram and a DQS waveform diagram corresponding to the DQ waveform diagram, regarding the DQ waveform diagram, taking the DQS waveform diagram as a reference clock signal, and generating a DQ eye diagram based on the DQ waveform diagram. And calculating a reference level value of the DQ waveform diagram, and drawing a target eye diagram template in the DQ eye diagram according to the reference level value of the DQ waveform diagram and preset eye diagram template parameters. And evaluating the signal quality of the DQ wave pattern based on the position relation between the target eye pattern template and the DQ eye pattern. When a DQ eye pattern is generated based on a DQ waveform pattern, the DQ eye pattern is generated by triggering the DQS waveform pattern as a reference clock signal. Because the DQS signal is a signal generated in real time, a more accurate reference clock signal can be provided, and therefore, compared with a DQ eye pattern generated based on an ideal clock signal, the DQ eye pattern generated based on the reference clock signal triggering can reflect intersymbol interference and noise of the signal, namely, the actual situation of the signal is closer. Furthermore, the DQ wave pattern is evaluated on the basis of the position relation between the target eye pattern template and the DQ eye pattern, so that the accuracy of evaluating the signal quality on the basis of the eye pattern is improved.

In one embodiment, as shown in fig. 11, there is provided a signal quality assessment apparatus 1100 for use with a computer device, the apparatus comprising:

a waveform obtaining module 1120, configured to obtain a DQ waveform and a DQs waveform corresponding to the DQ waveform; the abscissa of the DQ waveform diagram and the DQS waveform diagram is time, and the ordinate is a voltage value;

a DQ eye pattern generating module 1140, configured to generate a DQ eye pattern based on the DQ waveform pattern by using the DQs waveform pattern as a reference clock signal for the DQ waveform pattern;

the target eye pattern template drawing module 1160 is used for calculating a reference level value of the DQ waveform pattern, and drawing a target eye pattern template in the DQ eye pattern according to the reference level value of the DQ waveform pattern and preset eye pattern template parameters;

and the signal quality evaluation module 1180 is configured to perform signal quality evaluation on the DQ waveform diagram based on a position relationship between the target eye diagram template and the DQ eye diagram.

In one embodiment, as shown in fig. 12, the DQ eye pattern generation module 1140 includes:

a waveform dividing point calculating unit 1142, configured to obtain abscissa of each waveform dividing point from the DQS waveform diagram, and calculate a difference between the abscissas of adjacent waveform dividing points;

an average waveform period calculation unit 1144, configured to calculate an average waveform period in the DQS waveform diagram based on the difference of the abscissa;

a DQ waveform map reconstructing unit 1146, configured to reconstruct the DQ waveform map according to the average waveform period, and generate a DQ eye map corresponding to the DQ waveform map.

In an embodiment, the DQ waveform map reconstructing unit 1146 is further configured to obtain, for the DQ waveform map, a plurality of target DQ waveforms from the DQ waveform map according to an average waveform period; a plurality of target DQ waveforms are superimposed to generate a DQ eye corresponding to the DQ waveform.

In one embodiment, the DQ waveform comprises a predetermined number of DQ sub-waveforms, the predetermined number of DQ sub-waveforms corresponding to a predetermined number of DQ signals of the transmission line; a target eye template drawing module 1160, comprising:

a first target level value calculation unit for calculating a target level value of the DQ sub-waveform pattern for each DQ sub-waveform pattern included in the DQ waveform pattern;

a second target level value calculation unit for calculating a mean value of the target level values of the DQ sub-oscillogram, and taking the mean value as the target level value of the DQ oscillogram;

the coordinate value calculation unit is used for calculating the coordinate value of a vertex of the target eye pattern template in the DQ eye pattern according to the target level value of the DQ waveform pattern and the preset eye pattern template parameter;

and the drawing unit is used for drawing the target eye pattern template in the DQ eye pattern based on the coordinate value of the vertex of the target eye pattern template in the DQ eye pattern.

In one embodiment, the first target level value calculating unit is further configured to obtain signal parameters of the DQ sub-signals corresponding to the respective DQ sub-waveform patterns; the signal parameters comprise DDR working voltage, input high level percentage, input low level percentage and scanning voltage step length; aiming at each clock cycle of the DQ sub-waveform graph, scanning each voltage value in a voltage amplitude range from a high level to a low level by a scanning voltage step length, and calculating a first duration and a second duration in the clock cycle; the first duration is a time interval between a rising edge of the DQ signal, a falling edge of the DQS signal, and a crossing point of a reference level value of the DQ sub-waveform pattern in a clock cycle; the second duration is the time interval between the falling edge of the DQS signal, the falling edge of the DQ signal and the crossing point of the reference level value of the DQ sub-waveform diagram in the clock cycle; the reference level value is a currently scanned voltage value; and calculating a target level value of the DQ sub-oscillogram based on the first duration and the second duration under each voltage value.

In one embodiment, the first target level value calculating unit is further configured to calculate a maximum value of a sum of the first duration and the second duration at each voltage value, and use the maximum value of the sum of the first duration and the second duration as an eye width at the currently scanned voltage value; determining the maximum eye width from the eye widths under each voltage value in the voltage amplitude range; the voltage value corresponding to the maximum eye width is set as the target level value of the DQ sub waveform pattern.

In an embodiment, the coordinate value calculating unit is further configured to obtain preset eye pattern template parameters, where the preset eye pattern template parameters include a minimum eye height of the preset eye pattern template, a minimum eye width of the preset eye pattern template, and a preset waveform period.

In one embodiment, the oscillogram obtaining module is further configured to obtain a DDR signal from the DDR chip, where the DDR signal includes a DQ signal and a DQs signal corresponding to the DQ signal; a DQ waveform is generated based on the DQ signal, and a DQS waveform corresponding to the DQ waveform is generated based on the DQS signal.

It should be understood that, although the steps in the above-described flowcharts are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in the above figures may include multiple sub-steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, and the order of performing the sub-steps or stages is not necessarily sequential, but may be performed alternately or alternately with other steps or at least some of the sub-steps or stages of other steps.

The division of the modules in the signal quality estimation apparatus is only used for illustration, and in other embodiments, the signal quality estimation apparatus may be divided into different modules as needed to complete all or part of the functions of the signal quality estimation apparatus.

For specific limitations of the signal quality estimation apparatus, reference may be made to the above limitations of the signal quality estimation method, which are not described herein again. The respective modules in the above signal quality evaluation apparatus may be wholly or partially implemented by software, hardware, and a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.

In one embodiment, a computer device is further provided, which includes a memory and a processor, the memory stores a computer program, and the computer program, when executed by the processor, causes the processor to execute the steps of a signal quality evaluation method provided in the above embodiments.

In one embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as shown in fig. 13. The computer device includes a processor, a memory, and a network interface connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The database of the computer device is used for storing device inventory data. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement a signal quality assessment method.

The implementation of each module in the signal quality evaluation apparatus provided in the embodiments of the present application may be in the form of a computer program. The computer program may be run on a computer device. Program modules constituting the computer program may be stored on a memory of the computer device. Which when executed by a processor, performs the steps of the method described in the embodiments of the present application.

The embodiment of the application also provides a computer readable storage medium. One or more non-transitory computer-readable storage media containing computer-executable instructions that, when executed by one or more processors, cause the processors to perform the steps of the signal quality assessment method.

A computer program product containing instructions which, when run on a computer, cause the computer to perform a signal quality assessment method.

Any reference to memory, storage, database, or other medium used by embodiments of the present application may include non-volatile and/or volatile memory. Suitable non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM), which acts as external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms, such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), Enhanced SDRAM (ESDRAM), synchronous Link (Synchlink) DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and bus dynamic RAM (RDRAM).

The above examples of signal quality evaluation are only representative of several embodiments of the present application, and the description thereof is more specific and detailed, but not to be construed as limiting the scope of the present application. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims

1. A method of signal quality assessment, the method comprising:

2. The signal quality evaluation method of claim 1, wherein the generating a DQ eye diagram based on the DQ waveform diagram using the DQS waveform diagram as a reference clock signal comprises:

3. The signal quality evaluation method according to claim 2, wherein reconstructing the DQ waveform pattern according to the average waveform period to generate a DQ eye pattern corresponding to the DQ waveform pattern comprises:

4. The signal quality evaluation method of claim 1, wherein the DQ waveform pattern comprises a predetermined number of DQ sub-waveform patterns corresponding to a predetermined number of DQ signals of the transmission line; the calculating the reference level value of the DQ waveform diagram, and drawing a target eye diagram template in the DQ eye diagram according to the reference level value of the DQ waveform diagram and preset eye diagram template parameters, includes:

5. The signal quality evaluation method of claim 4, wherein the calculating target level values for the DQ sub-waveforms included in the DQ-waveforms comprises:

6. The signal quality evaluation method of claim 5, wherein said calculating a target level value for said DQ sub-waveform based on said first duration and said second duration for each of said voltage values comprises:

7. The signal quality assessment method of claim 4, wherein said method further comprises:

8. The signal quality evaluation method of claim 1, wherein the obtaining the DQ waveform diagrams and the DQS waveform diagrams corresponding to the DQ waveform diagrams comprises:

9. A signal quality assessment apparatus, for use in a computer device, the apparatus comprising:

10. A computer arrangement comprising a memory and a processor, the memory having stored thereon a computer program, characterized in that the computer program, when executed by the processor, causes the processor to carry out the steps of the signal quality assessment method according to any of claims 1 to 8.

11. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the signal quality assessment method according to any one of claims 1 to 8.

12. A computer program product comprising a computer program, characterized in that the computer program, when being executed by a processor, carries out the steps of the signal quality assessment method according to any one of claims 1 to 8.