CN114152567A - Test fixture for microscope and test method - Google Patents
Test fixture for microscope and test method Download PDFInfo
- Publication number
- CN114152567A CN114152567A CN202010933546.8A CN202010933546A CN114152567A CN 114152567 A CN114152567 A CN 114152567A CN 202010933546 A CN202010933546 A CN 202010933546A CN 114152567 A CN114152567 A CN 114152567A
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- test fixture
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- clamping
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- 238000012360 testing method Methods 0.000 title claims abstract description 55
- 238000010998 test method Methods 0.000 title claims abstract description 4
- 238000000034 method Methods 0.000 claims abstract description 6
- 239000002390 adhesive tape Substances 0.000 claims description 4
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009776 industrial production Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
The invention relates to a test fixture and a test method for a microscope, which are arranged in a microscope cabin and comprise the following steps: the method comprises the following steps that a plurality of clamping openings are formed, each clamping opening is provided with an adjusting device, the sizes and the depths of the clamping openings are different according to the cross sections of different samples to be detected, the adjusting devices are used for fixing the samples to be detected in the clamping openings, and the method comprises the following steps: the sample that will await measuring, based on the cross-section size of the sample that awaits measuring, select the double-layered mouth that size and degree of depth correspond from the test fixture, utilize the fixed sample that awaits measuring of adjusting device, arrange test fixture and sample that awaits measuring in the microscope cabin and observe, press from both sides the mouth through setting up a plurality of not unidimensional and degree of depth on the test fixture, effectively solved small sample itself thinner, less, be difficult to fix, and then cause observation difficulty and unsafe technical problem, in addition, if there are a plurality of not unidimensional samples that await measuring, can put into the double-layered mouth on the test fixture simultaneously and observe, observation efficiency has been improved.
Description
Technical Field
The invention belongs to the field of testing, and particularly relates to a testing clamp and a testing method for a microscope.
Background
At present, in the fields of physics, chemistry, geoscience, judicial science, materials science, industrial production and the like, a large amount of microscopic research needs to be carried out, and a microscope is a precise instrument for analyzing the shape of a high-resolution micro-area and can be used for observing the shape in the microscopic research.
In the research process, the cross sections of some samples need to be observed, and many samples are thin and small and are not easy to fix, so that the observation is difficult and the observation result is inaccurate.
Disclosure of Invention
In order to solve the technical problems that in the prior art, a small sample is thin and small and is not easy to fix, so that observation is difficult and an observation result is inaccurate, the invention provides a test fixture for a microscope, which is arranged in a microscope cabin and comprises: the clamping device comprises a plurality of clamping openings, a clamping device body and a clamping device body, wherein each clamping opening is provided with an adjusting device;
the clamping openings have different sizes and depths according to the sizes of the sections of different samples to be detected;
the adjusting device is used for fixing the sample to be detected in each clamping opening.
Preferably, the test fixture is of a rectangular structure;
the clamping openings are of strip-shaped structures, the strip-shaped structures are provided with different opening sizes and depths, and the clamping openings are arranged in parallel.
Preferably, each adjusting device is disposed at an edge of each corresponding clip opening, and includes: a clamp opening width adjusting knob; the opening size of each clamping opening is adjusted through the adjusting knob.
Preferably, the thickness of the cross section of the sample to be measured is less than 3 mm.
Preferably, an interface is arranged on a plane of the rectangular structure, which is in contact with the bottom end of the microscope cabin;
the test fixture is connected with the microscope sample stage through the interface.
Preferably, the bottom of each clamping opening is provided with a conductive adhesive.
Preferably, the conductive sticker comprises a conductive tape.
Based on the same inventive concept, the invention also provides a testing method by using the testing clamp for the microscope, which comprises the following steps: selecting a clamping opening with the corresponding size and depth from a test fixture for a sample to be tested based on the section size of the sample to be tested;
fixing a sample to be detected by using an adjusting device;
and placing the test fixture and the sample to be tested in a microscope cabin for observation.
Preferably, the fixing of the sample to be measured by using the adjusting device includes:
and adjusting the opening size of the clamping opening by using a width adjusting knob arranged at the edge of the clamping opening, and further fixing the sample to be detected in the clamping opening.
Preferably, the placing the test fixture and the sample to be tested in the microscope chamber for observation includes:
arranging the section to be observed of the sample to be detected in the clamping opening in an upward manner;
fixing the sample to be detected by using a conductive adhesive tape arranged at the bottom of the clamping opening;
and arranging the test fixture with the sample to be tested fixed in the microscope cabin for observation.
Compared with the prior art, the invention has the beneficial effects that:
1. the invention provides a test fixture for a microscope, which is arranged in a microscope cabin and comprises: the test fixture comprises a plurality of clamp openings, wherein each clamp opening is provided with an adjusting device, each clamp opening has different sizes and depths according to the cross section sizes of different samples to be tested, and the adjusting devices are used for fixing the samples to be tested arranged in the clamp openings.
2. The invention provides a testing method by using a testing clamp for a microscope, which comprises the following steps: the sample to be measured is based on the section size of the sample to be measured, the clamping opening corresponding to the size and the depth is selected from the test fixture, the sample to be measured is fixed by the adjusting device, the test fixture and the sample to be measured are placed in the microscope chamber for observation, if a plurality of samples to be measured with different sizes exist, the samples to be measured can be simultaneously placed in the clamping opening on the test fixture for observation, the repeated operation of opening the chamber door is omitted, and the observation efficiency is improved.
Drawings
FIG. 1 is a top view of a test fixture according to the present invention;
FIG. 2 is a side view of the test fixture of the present invention;
FIG. 3 is a diagram of the steps of the testing method of the present invention;
in the figure: 1-testing the fixture; 11-a nip; 12-a nip width adjustment knob; 2. 3-a sample to be tested; 4-interface for connecting the clamp with the microscope sample stage.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example 1
As shown in fig. 1 to 2, the present invention provides a test jig for a microscope, which is provided in a microscope chamber, and includes: a plurality of clamping openings 11, wherein each clamping opening 11 is provided with an adjusting device;
each clamping opening 11 has different sizes and depths according to the sizes of the sections of different samples 2 and 3 to be detected;
the adjusting device is used for fixing the samples 2 and 3 to be measured which are arranged in the clamping openings 11;
through set up a plurality of not unidimensional and degree of depth on test fixture 1 and press from both sides the mouth, effectively solved small sample itself thinner, less, be difficult to fix, and then cause observation difficulty and inaccurate technical problem.
Further, the test fixture 1 is of a rectangular structure;
the clamping openings 11 are strip-shaped structures, the strip-shaped structures are different in opening size and depth, and the clamping openings 11 are arranged in parallel;
wherein, each adjusting device is arranged at the edge of each corresponding clamping opening 11;
the method comprises the following steps: a nip width adjusting knob 12; the opening size of each clamping opening 11 is adjusted through the adjusting knob 12;
the thickness of the cross section of the sample to be detected is less than 2mm-5 mm;
further, the thickness of the cross section of the sample to be detected is less than 3 mm.
An interface 4 is arranged on a plane of the rectangular structure, which is in contact with the bottom end of the microscope cabin;
the test fixture 1 is connected with a microscope sample stage through the interface 4;
the bottom of each clamping opening 11 is provided with a conductive adhesive substance which comprises a conductive adhesive tape;
including, but not limited to, scanning electron microscopes, optical microscopes, and atomic force microscopes.
Example 2
As shown in fig. 3, based on the same inventive concept, the present invention further provides a testing method using a testing jig for a microscope, comprising:
selecting a clamping opening 11 with corresponding size and depth from the test fixture 1 for the samples 2 and 3 to be tested based on the section size of the sample to be tested;
fixing the samples 2 and 3 to be measured by using an adjusting device;
the test fixture 1 and the samples 2 and 3 to be measured are placed in a microscope chamber for observation, and if a plurality of samples 2 and 3 to be measured with different sizes exist, the samples can be simultaneously placed in the clamping opening 11 of the test fixture 1 for observation, so that the observation efficiency is improved.
Further, the fixing the sample to be measured by using the adjusting device includes:
the opening size of the clamping opening 11 is adjusted by utilizing a clamping opening width adjusting knob 12 arranged at the edge of the clamping opening 11, and then the samples 2 and 3 to be measured arranged in the clamping opening 11 are fixed.
Wherein, arrange test fixture 1 and 2, 3 samples to be measured in the microscope cabin and observe, include:
arranging the section to be observed of the sample 2, 3 to be measured in the clamping opening 11 upwards;
fixing the samples 2 and 3 to be detected by using a conductive adhesive tape arranged at the bottom of the nip 11;
the test fixture 1 with the samples 2, 3 to be tested fixed is arranged in the microscope cabin for observation.
In the description of the present invention, "a plurality" means two or more unless otherwise specified; the terms "upper", "lower", "left", "right", "inner", "outer", "front", "rear", "head", "tail", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are only for convenience in describing and simplifying the description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, should not be construed as limiting the invention. Furthermore, the terms "first," "second," "third," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "connected" and "connected" are to be interpreted broadly, e.g., as being fixed or detachable or integrally connected; can be mechanically or electrically connected; may be directly connected or indirectly connected through an intermediate. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Finally, it should be noted that the above-mentioned embodiments are only preferred embodiments of the present invention, and are not intended to limit the present invention, and those skilled in the art will appreciate that various modifications and changes can be made to the present invention. Any modification, equivalent replacement, improvement or the like made within the spirit and principle of the present invention is included in the scope of the claims of the present invention filed as filed.
Claims (10)
1. The utility model provides a test fixture for microscope, sets up in the microscope cabin, its characterized in that includes: the clamping device comprises a plurality of clamping openings, a clamping device body and a clamping device body, wherein each clamping opening is provided with an adjusting device;
the clamping openings have different sizes and depths according to the sizes of the sections of different samples to be detected;
the adjusting device is used for fixing the sample to be detected in each clamping opening.
2. The test fixture of claim 1, wherein the test fixture is a rectangular structure;
the clamping openings are of strip-shaped structures, the strip-shaped structures are provided with different opening sizes and depths, and the clamping openings are arranged in parallel.
3. The test fixture of claim 2, wherein each of the adjustment devices is disposed at a corresponding edge of each of the jaws, comprising: a clamp opening width adjusting knob; the opening size of each clamping opening is adjusted through the adjusting knob.
4. The test fixture of claim 1, wherein the thickness of the cross section of the sample to be tested is less than 3 mm.
5. The test fixture of claim 2, wherein an interface is provided on a plane where the rectangular structure contacts the bottom end of the microscope chamber;
the test fixture is connected with the microscope sample stage through the interface.
6. The test fixture of claim 1, wherein a conductive sticker is disposed on a bottom of each jaw.
7. The test fixture of claim 6, wherein the conductive sticker comprises a conductive tape.
8. A test method using a test fixture for a microscope is characterized by comprising the following steps:
selecting a clamping opening with the corresponding size and depth from a test fixture for a sample to be tested based on the section size of the sample to be tested;
fixing a sample to be detected by using an adjusting device;
and placing the test fixture and the sample to be tested in a microscope cabin for observation.
9. The method of claim 8, wherein the fixing the sample to be tested with the adjustment device comprises:
and adjusting the opening size of the clamping opening by using a width adjusting knob arranged at the edge of the clamping opening, and further fixing the sample to be detected in the clamping opening.
10. The method of claim 8, wherein the placing the test fixture and the sample to be tested in a microscope chamber for observation comprises:
arranging the section to be observed of the sample to be detected in the clamping opening in an upward manner;
fixing the sample to be detected by using a conductive adhesive tape arranged at the bottom of the clamping opening;
and arranging the test fixture with the sample to be tested fixed in the microscope cabin for observation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010933546.8A CN114152567A (en) | 2020-09-08 | 2020-09-08 | Test fixture for microscope and test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010933546.8A CN114152567A (en) | 2020-09-08 | 2020-09-08 | Test fixture for microscope and test method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114152567A true CN114152567A (en) | 2022-03-08 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010933546.8A Pending CN114152567A (en) | 2020-09-08 | 2020-09-08 | Test fixture for microscope and test method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114152567A (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102646566A (en) * | 2012-05-04 | 2012-08-22 | 上海集成电路研发中心有限公司 | Scanning electron microscope (SEM) sample fixture used in on line SEM observing and SEM sample observing method |
| CN209812116U (en) * | 2019-02-25 | 2019-12-20 | 河北华凯光子科技有限公司 | Batch test fixture for scintillator crystal strips |
-
2020
- 2020-09-08 CN CN202010933546.8A patent/CN114152567A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102646566A (en) * | 2012-05-04 | 2012-08-22 | 上海集成电路研发中心有限公司 | Scanning electron microscope (SEM) sample fixture used in on line SEM observing and SEM sample observing method |
| CN209812116U (en) * | 2019-02-25 | 2019-12-20 | 河北华凯光子科技有限公司 | Batch test fixture for scintillator crystal strips |
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