CN114114737A - Method for measuring physical properties of liquid crystal panel - Google Patents
Method for measuring physical properties of liquid crystal panel Download PDFInfo
- Publication number
- CN114114737A CN114114737A CN202111535983.5A CN202111535983A CN114114737A CN 114114737 A CN114114737 A CN 114114737A CN 202111535983 A CN202111535983 A CN 202111535983A CN 114114737 A CN114114737 A CN 114114737A
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- China
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- liquid crystal
- crystal panel
- crystal layer
- pulse voltage
- voltage
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Abstract
The invention relates to the field of a method for measuring physical properties of a liquid crystal panel, which comprises the following specific steps: applying a voltage of a source-drain conduction limit value of the liquid crystal panel to a gate electrode of the liquid crystal panel; writing pulse voltage into a liquid crystal layer in the liquid crystal panel, and keeping the potential of the source electrode at a ground level; the voltage holding ratio in the liquid crystal layer is measured by detecting a change in potential of the liquid crystal layer to which the pulse voltage is written, liquid crystal molecules in the liquid crystal layer are driven by an electric field formed by the driven pixel electrode and a common electrode provided corresponding to the pixel electrode, and the pulse voltage is applied to the common electrode. The method can accurately measure the physical properties of the liquid crystal panel, thereby evaluating the performance and quality of the liquid crystal panel.
Description
Technical Field
The invention relates to the technical field of liquid crystal panel physical property testing.
Background
The liquid crystal panel, therefore, the particularity of its circuit configuration, makes it difficult to actually measure various physical properties of the liquid crystal layer in the liquid crystal panel. Generally, in order to characterize the physical properties of the batch production, manufacturers will detect the physical properties by manufacturing the test liquid crystal cell, but the measurement results obtained by measuring various physical properties in the test liquid crystal cell will still be different from various physical properties in the liquid crystal panel as an actual product.
In the manufacturing process of the liquid crystal panel, liquid crystal is filled from the edge of the glass substrate, and the actual filling state of the liquid crystal is difficult to determine various physical property indexes of the liquid crystal by directly measuring from the edge because the cutting of the edge of the glass substrate cannot avoid the occurrence of burrs and unevenness (because of the defects of the existing amorphous cutting technology).
Disclosure of Invention
The invention aims to provide a method for measuring the physical properties of a liquid crystal panel, which can measure various physical properties of the liquid crystal layer of the liquid crystal panel and comprises the following steps:
applying a voltage of a source-drain on limit value to a gate electrode in the liquid crystal panel;
writing pulse voltage into a liquid crystal layer in the liquid crystal panel, and keeping the potential of the source electrode at a ground level;
detecting a change in potential of the liquid crystal layer to which the pulse voltage is written, and measuring a voltage holding ratio in the liquid crystal layer;
liquid crystal molecules in the liquid crystal layer are driven by an electric field formed by the driven pixel electrode and a common electrode provided corresponding to the pixel electrode, and a pulse voltage is applied to the common electrode.
Further, writing a pulse voltage to a liquid crystal layer in the liquid crystal panel and an auxiliary capacitor electrically connected in parallel to the liquid crystal layer, and maintaining the potential of the source at a ground level;
the change in the combined potential of the liquid crystal layer and the auxiliary capacitor, to which the pulse voltage is written, is detected, and the combined voltage holding ratio of the liquid crystal layer and the auxiliary capacitor is measured.
A pulse voltage applying circuit for writing a pulse voltage to a liquid crystal layer in the liquid crystal panel and maintaining a potential of the source at a ground level;
a potential change detection circuit for detecting a change in potential of the liquid crystal layer to which a pulse voltage is applied by the pulse voltage application circuit, and measuring (a voltage holding ratio of;
a gate potential holding unit for applying a voltage of a predetermined value to a gate electrode of the liquid crystal panel,
the liquid crystal molecules in the liquid crystal layer are driven by an electric field formed by the pixel electrode driven by the driving and a common electrode provided corresponding to the pixel electrode (pulse voltage is applied to the common electrode).
Preferably, the difference between the voltage of the predetermined value of the gate and the voltage of the source-drain conduction limit value of the liquid crystal panel is not more than ± 0.2V.
Further, the frequency variation of the pulse voltage is preferably sinusoidal.
Advantageous effects
The measuring method provided by the invention breaks through the method that the sample is generally adopted to measure and characterize the physical properties of the liquid crystal panels in batch production in the prior art, the physical properties of actual products are intuitively measured, the accuracy of a measurement conclusion is greatly improved, and the method does not need complex measuring equipment and has low measuring cost.
Detailed Description
The following describes the best mode for carrying out the present invention.
The invention aims to provide a method for measuring the physical properties of a liquid crystal panel, which can measure various physical properties of the liquid crystal layer of the liquid crystal panel and comprises the following steps:
applying a voltage of a source-drain on limit value to a gate electrode in the liquid crystal panel;
writing pulse voltage into a liquid crystal layer in the liquid crystal panel, and keeping the potential of the source electrode at a ground level;
the voltage holding ratio in the liquid crystal layer is measured by detecting (a change in potential of) the liquid crystal layer to which the pulse voltage is written,
liquid crystal molecules in the liquid crystal layer are driven by an electric field formed by the driven pixel electrode and a common electrode provided corresponding to the pixel electrode, and a pulse voltage is applied to the common electrode.
Further, writing a pulse voltage to a liquid crystal layer in the liquid crystal panel and an auxiliary capacitor electrically connected in parallel to the liquid crystal layer, and maintaining the potential of the source at a ground level;
the change in the combined potential of the liquid crystal layer and the auxiliary capacitor, to which the pulse voltage is written, is detected, and the combined voltage holding ratio of the liquid crystal layer and the auxiliary capacitor is measured.
A pulse voltage applying circuit for writing a pulse voltage to a liquid crystal layer in the liquid crystal panel and holding a potential of the source at a ground level;
a potential change detection circuit for detecting a change in potential of the liquid crystal layer to which a pulse voltage is applied by the pulse voltage application circuit, and measuring (a voltage holding ratio of;
a gate potential holding unit for applying a voltage of a predetermined value to a gate electrode of the liquid crystal panel,
the liquid crystal molecules in the liquid crystal layer are driven by an electric field formed by the pixel electrode driven by the driving and a common electrode provided corresponding to the pixel electrode (pulse voltage is applied to the common electrode).
The difference between the voltage of the specified grid value and the voltage of the conduction limit value between the source electrode and the drain electrode of the liquid crystal panel is not more than +/-0.2V.
The frequency variation of the pulsed voltage is preferably sinusoidal.
The frequency change can be used for monitoring the performance of the liquid crystal screen in actual use, when the voltage and the frequency are unstable, whether faults occur or not can cause irreversible damage to liquid crystals, and the faults are generally not considered in the conventional monitoring.
The liquid crystal panel comprises an array substrate, a CF substrate and liquid crystal arranged between the array substrate and the CF substrate. The array substrate forms an effective display area and a peripheral circuit area by performing processes of film formation, development, etching and the like on a glass substrate. And the peripheral circuit area of the array substrate comprises a module COF compression joint area and a short-circuit bar area. The COF compression joint area is used for compression joint of the driving IC on the array substrate when a rear module is assembled and is connected with the TFT, the data line and the scanning line on the array substrate. At least one line is arranged on the short-circuit bar area and is connected with the scanning lines or the data lines on the array substrate, so that the data lines or the scanning lines connected with the line can form a complete or partial short circuit. The line provided on the shorting bar region may also be connected to the gate of the TFT on the array substrate. The circuit arranged on the short-circuit bar area is mainly used for testing the circuit on the array substrate in the manufacturing process of the array substrate, and for picture detection of the box-section liquid crystal panel and the like.
However, after the above tests are all completed, the lines provided on the shorting bar region must be removed by laser to prevent the lines provided on the shorting bar region from shorting out other lines on the array substrate. The width of the shorting bar region is 150-350 um. Since the lines on the shorting bar region are removed by laser, during the module COF process of the back-end module assembly, the CO F and other components are not connected with other lines (mainly including the lines arranged in the shorting bar region) outside the module COF crimping region, so that a safety region does not need to be arranged at the periphery of the module COF crimping region, namely, compared with the liquid crystal panel in the prior art, the liquid crystal panel in the invention reduces the area of the safety region, thereby improving the utilization rate of the liquid crystal panel.
Further, the invention in various stages is included in the above-described embodiment, and various inventions can be extracted by an appropriate combination of a plurality of disclosed constituent elements. For example, even if some of the constituent elements shown in the embodiments are deleted, the problems described in the section of the problems to be solved by the invention can be solved, and in the case where the effects described in the section of the effects of the invention can be obtained, the configuration in which the constituent elements are deleted can be extracted as the invention.
Claims (5)
1. A method for measuring physical properties of a liquid crystal panel, which is used for measuring the physical properties of the liquid crystal panel,
comprising:
applying a voltage of a source-drain conduction limit value of the liquid crystal panel to a gate electrode of the liquid crystal panel;
writing pulse voltage into a liquid crystal layer in the liquid crystal panel, and keeping the potential of the source electrode at a ground level;
detecting a change in potential of the liquid crystal layer to which the pulse voltage is written, and measuring a voltage holding ratio in the liquid crystal layer,
liquid crystal molecules in the liquid crystal layer are driven by an electric field formed by the driven pixel electrode and a common electrode provided corresponding to the pixel electrode, and a pulse voltage is applied to the common electrode.
2. The method of measuring physical properties of a liquid crystal panel according to claim 1,
writing a pulse voltage to a liquid crystal layer in the liquid crystal panel and an auxiliary capacitor electrically connected in parallel to the liquid crystal layer, and maintaining a potential of the source at a ground level;
the change in the combined potential of the liquid crystal layer and the auxiliary capacitor, to which the pulse voltage is written, is detected, and the combined voltage holding ratio of the liquid crystal layer and the auxiliary capacitor is measured.
3. The method of claim 1, wherein the following measurement assistance means is adopted: a pulse voltage applying circuit for writing a pulse voltage into a liquid crystal layer in the liquid crystal panel and maintaining a potential of the source at a ground level;
a potential change detection circuit for detecting a change in potential of the liquid crystal layer to which a pulse voltage is applied by the pulse voltage application circuit, and measuring (a voltage holding ratio of;
a gate potential holding unit for applying a voltage of a predetermined value to a gate electrode of the liquid crystal panel,
the liquid crystal molecules in the liquid crystal layer are driven by an electric field formed by the pixel electrode driven by the driving and a common electrode provided corresponding to the pixel electrode (pulse voltage is applied to the common electrode).
4. The method of claim 1, wherein a difference between the voltage of the gate specification value and a source-drain turn-on limit value applied to the liquid crystal panel is not more than ± 0.2V.
5. The method of measuring physical properties of the liquid crystal panel according to claim 1, wherein the frequency variation of the pulse voltage is preferably sinusoidal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111535983.5A CN114114737A (en) | 2021-12-15 | 2021-12-15 | Method for measuring physical properties of liquid crystal panel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111535983.5A CN114114737A (en) | 2021-12-15 | 2021-12-15 | Method for measuring physical properties of liquid crystal panel |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114114737A true CN114114737A (en) | 2022-03-01 |
Family
ID=80365576
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111535983.5A Withdrawn CN114114737A (en) | 2021-12-15 | 2021-12-15 | Method for measuring physical properties of liquid crystal panel |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114114737A (en) |
-
2021
- 2021-12-15 CN CN202111535983.5A patent/CN114114737A/en not_active Withdrawn
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Application publication date: 20220301 |