CN108847170B - Display screen product detection method and detection device - Google Patents
Display screen product detection method and detection device Download PDFInfo
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- CN108847170B CN108847170B CN201810535033.4A CN201810535033A CN108847170B CN 108847170 B CN108847170 B CN 108847170B CN 201810535033 A CN201810535033 A CN 201810535033A CN 108847170 B CN108847170 B CN 108847170B
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Abstract
The invention discloses a detection method and a detection device for a display screen product. The display screen product detection method comprises the following steps: accessing a display screen to be detected; setting the test parameters of the test equipment to be set numerical values which enable the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen to have obvious difference; and after starting the test equipment according to the test parameters, identifying that the display screen contains dot-shaped spots according to the gray scale uneven picture and the dot matrix arrangement form displayed in the gray scale state. The scheme provided by the invention can quickly detect the Dot Mura problem of the display screen at normal temperature, reduce the verification cost at high temperature and low temperature and reduce the risk of bad products.
Description
Technical Field
The invention relates to the technical field of panel display, in particular to a display screen product detection method and a detection device.
Background
With the development of Display technology, various Display products, such as LCD (Liquid Crystal Display) and OLED (Organic Light Emitting Diode) displays, have appeared. In recent years, LCDs have been developed vigorously, and the types of TFT (Thin Film Transistor) LCD products have been increasing day by day, such as TN (Twisted Nematic) type, IPS (In-Plane Switching) type, VA (Vertical Alignment) type, FFS (Fringe Field Switching) type, ADS (Advanced super dimension Switching) type, and the like.
In the FFS structure product, a fringe electric field is generated between a top layer strip Com electrode (common electrode) and a bottom layer planar pixel electrode on an Array substrate, so that a liquid crystal plane rotates. The FFS technology has not only a wide viewing angle of IPS model products but also a higher transmittance, and is therefore often used for display products such as vehicles and consumer products. For vehicle products, LCD displays operate in high or low temperature environments, under which many undesirable problems are likely to occur, one of which is Dot Mura (Dot Mura). Dot Mura is a kind of dotted Mura occurring in a long-time operating state at a high temperature or a low temperature. Dot Mura does not belong to common Mura, and can be detected in high-temperature and low-temperature reliability tests after binding ICs (integrated circuits), and the high-temperature and low-temperature reliability tests are general sampling test items and are not conventional detection items. The defects caused by Dot Mura cannot be detected by a conventional quick detection method at normal temperature, and the defects can be displayed after the defects are made into modules and subjected to severe conditions such as high temperature, low temperature and the like, so that the defects can cause serious influence on terminal customers or market customers.
Therefore, the prior art cannot detect the Dot Mura problem at normal temperature, and brings certain risks to the product quality.
Disclosure of Invention
In view of the above, the present invention provides a method and an apparatus for detecting a display screen product, which can quickly detect the Dot Mura problem of the display screen at normal temperature, reduce the verification cost at high and low temperatures, and reduce the risk of product failure.
According to one aspect of the invention, a display screen product detection method is provided, which comprises the following steps:
accessing a display screen to be detected;
setting the test parameters of the test equipment to be set numerical values which enable the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen to have obvious difference;
and after starting the test equipment according to the test parameters, identifying that the display screen contains dot-shaped spots according to the gray scale uneven picture and the dot matrix arrangement form displayed in the gray scale state.
Optionally, the setting of the test parameters of the test equipment to the set values that make the voltage-current transfer characteristic curve difference between the normal gray scale position and the abnormal gray scale position of the display screen obvious includes:
the Gate scan voltage of the test equipment is set to 0-2V.
Optionally, the setting the Gate scan voltage of the test device to 0-2V includes:
the Gate odd line scanning high-frequency voltage of the test equipment is set to be 2V, the Gate odd line scanning low-frequency voltage is set to be 0V, the Gate even line scanning high-frequency voltage is set to be 2V, and the Gate even line scanning low-frequency voltage is set to be 0V.
Optionally, the setting the Gate scan voltage of the test device to 0-2V includes:
the Gate scan voltage of the test equipment was set to 1V.
Optionally, the test parameters of the test device are obtained according to the following method:
connecting the display screen containing the dot-shaped spots to test equipment to test a voltage-current transfer characteristic curve;
obtaining voltage and current transfer characteristic curves of the gray scale normal position and the gray scale abnormal position under different Gate scanning voltages for comparison;
and selecting the Gate scanning voltage as a test parameter when the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen are obviously different according to the comparison result.
According to another aspect of the present invention, there is provided a display screen product detection method, including:
connecting the display screen containing the dot-shaped spots to perform voltage and current transfer characteristic curve test;
obtaining voltage and current transfer characteristic curves of the gray scale normal position and the gray scale abnormal position under different Gate scanning voltages for comparison;
and selecting the Gate scanning voltage when the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen have obvious difference according to the comparison result, and using the Gate scanning voltage as a test parameter for testing the display screen by the test equipment.
Optionally, the selecting a Gate scanning voltage when the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen have obvious difference, and the selecting the Gate scanning voltage as a test parameter for testing the display screen by using the testing device includes:
and selecting the corresponding 0-2V Gate scanning voltage when the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen are obviously different, and using the selected voltage as a test parameter for testing the display screen by the test equipment.
According to another aspect of the present invention, there is provided a display screen product inspection apparatus, including:
the access module is used for accessing a display screen to be detected;
the parameter module is used for setting the test parameters of the test equipment into set values which enable the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen to have obvious difference;
and the identification module is used for identifying that the display screen contains dot-shaped spots according to the gray scale uneven picture and the dot matrix arrangement form displayed in the gray scale state after the test equipment is started according to the test parameters set by the parameter module.
Optionally, the parameter module sets a Gate scan voltage of the test device to 0-2V.
According to another aspect of the present invention, there is provided a display screen product inspection apparatus, including:
the access module is used for accessing a display screen containing point-shaped spots to test a voltage-current transfer characteristic curve;
the comparison module is used for obtaining voltage and current transfer characteristic curves of the gray scale normal position and the gray scale abnormal position under different Gate scanning voltages for comparison;
and the parameter selection module is used for selecting the Gate scanning voltage when the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen have obvious difference according to the comparison result of the comparison module, and the Gate scanning voltage is used as a test parameter for testing the display screen by the test equipment.
It can be found that, according to the technical scheme of the embodiment of the invention, when the display screen is detected, the test parameters of the test equipment are set to be set to the set values which enable the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen to have obvious difference, and then after the test equipment is started according to the test parameters, the display screen is identified to contain the dot-shaped spots according to the gray scale uneven picture and the dot matrix arrangement form displayed in the gray scale state. Because the output value of the current is greatly different if the set parameters enable the difference of the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen to be obvious, the gray scale difference displayed by the screen is obvious, namely the gray scale uneven picture displayed in the gray scale state and the Dot matrix arrangement form are also obvious, so that the display screen is easily found to contain Dot-shaped spots, the technical scheme of the embodiment of the invention can directly and quickly detect the Dot Mura (Dot-shaped spots) problem of the display screen at normal temperature without undergoing high-temperature and low-temperature reliability tests, thereby reducing the high-temperature and low-temperature verification cost, reducing the bad risk of products and avoiding causing serious influence on terminal customers or market customers.
Furthermore, according to the technical scheme of the embodiment of the invention, the Gate scanning voltage of the test equipment can be set to be 0-2V, the output value of the current Ids is greatly different, the gray scale difference displayed on a screen is obvious, and the Dot Mura problem is easily found. Preferably, the Gate scan voltage setting may also be set to 1V.
Further, according to the technical scheme of the embodiment of the invention, the Gate odd line scanning high-frequency voltage of the test equipment can be set to be 2V, the Gate odd line scanning low-frequency voltage can be set to be 0V, the Gate even line scanning high-frequency voltage can be set to be 2V, and the Gate even line scanning low-frequency voltage can be set to be 0V.
Further, the test parameters of the test equipment according to the embodiment of the present invention may be obtained according to the following manner: carrying out voltage and current transfer characteristic curve test on the display screen containing the dot-shaped spots; obtaining voltage and current transfer characteristic curves of the gray scale normal position and the gray scale abnormal position under different Gate scanning voltages for comparison; and selecting the Gate scanning voltage as a test parameter when the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen are obviously different according to the comparison result.
Drawings
The above and other objects, features and advantages of the present disclosure will become more apparent by describing in greater detail exemplary embodiments thereof with reference to the attached drawings, in which like reference numerals generally represent like parts throughout.
FIG. 1 is a schematic flow diagram of a display screen product inspection method according to one embodiment of the invention;
FIG. 2 is another schematic flow diagram of a display screen product inspection method according to an embodiment of the invention;
FIG. 3 is a schematic flow chart of a method for obtaining test parameters by performing a TR curve test in a display screen product inspection method according to an embodiment of the present invention;
FIG. 4 is a schematic comparison of TR curves according to one embodiment of the present invention;
FIG. 5 is a schematic diagram showing Dot Mura, according to one embodiment of the present invention;
FIG. 6 is a schematic diagram of a display screen product inspection device according to an embodiment of the present invention;
fig. 7 is a schematic structural diagram of a display screen product detection device according to an embodiment of the invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to specific embodiments and the accompanying drawings.
While the preferred embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
The invention provides a method for detecting a display screen product, which can quickly detect the Dot Mura problem of the display screen at normal temperature, reduce the verification cost at high temperature and low temperature and reduce the adverse risk of the product.
The technical solutions of the embodiments of the present invention are described in detail below with reference to the accompanying drawings.
Fig. 1 is a schematic flow chart of a display screen product inspection method according to an embodiment of the present invention. The display screen product detection method can be applied to a display screen product detection device.
Referring to fig. 1, the method includes:
in step 101, a display screen to be detected is accessed.
In step 102, setting the test parameters of the test equipment to be set values that make the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen have obvious difference.
Wherein the Gate scan voltage of the test device may be set to 0-2V. For example, the Gate odd line scan high frequency voltage of the test device may be set to 2V, the Gate odd line scan low frequency voltage may be set to 0V, the Gate even line scan high frequency voltage may be set to 2V, and the Gate even line scan low frequency voltage may be set to 0V.
In step 103, after the test device is started according to the test parameters, the display screen is identified to contain dot-shaped spots according to the gray scale uneven picture and dot matrix arrangement form displayed in the gray scale state.
After the test equipment is set to the test parameters, the output values of the currents at the normal gray scale position and the abnormal gray scale position of the display screen are greatly different, so that the gray scale difference displayed by the screen is obvious, namely, the gray scale uneven picture and the dot matrix arrangement form displayed in the gray scale state are also obvious, and the display screen is easy to find that the display screen contains dot spots.
It can be found that, according to the technical scheme of the embodiment of the invention, when the display screen is detected, the test parameters of the test equipment are set to be set to the set values which enable the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen to have obvious difference, and then after the test equipment is started according to the test parameters, the display screen is identified to contain the dot-shaped spots according to the gray scale uneven picture and the dot matrix arrangement form displayed in the gray scale state. Because the output value of the current is greatly different if the set parameters enable the difference of the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen to be obvious, the gray scale difference displayed by the screen is obvious, namely the gray scale uneven picture displayed in the gray scale state and the Dot matrix arrangement form are also obvious, so that the display screen is easily found to contain Dot-shaped spots, the technical scheme of the embodiment of the invention can directly and quickly detect the Dot Mura (Dot-shaped spots) problem at normal temperature without undergoing high-temperature and low-temperature reliability tests, thereby reducing the verification cost at high temperature and low temperature, reducing the bad risk of products and avoiding causing serious influence on terminal customers or market customers.
FIG. 2 is another schematic flow diagram of a display screen product inspection method according to an embodiment of the invention. The display screen product detection method can be applied to a display screen product detection device.
According to the invention, by utilizing the difference between Dot Mura Dot and TR (Transfer curve) around, the Gate scanning voltage is controlled in a region with larger TR difference through a quick detection machine, and when the point distinguished by TR is observed in a gray scale state, a picture with uneven gray scale and a Dot matrix are arranged, so that the problem of poor Dot Mura can be screened out.
According to the invention, the Dot Mura problem can be screened out in advance at normal temperature in a quick inspection process before COG (Chip On Glass) without high-temperature and low-temperature tests, namely the poor Dot Mura problem can be screened out at normal temperature, so that the high-temperature and low-temperature verification cost is reduced, the loss of terminal customers is avoided, the loss of IC and FPC (Flexible Printed Circuit) is reduced, and the reliability of TFT FFS (Flexible flat Flexible Printed Circuit) type products is improved.
Referring to fig. 2, the method includes:
in step 201, a display screen to be tested is accessed in a testing device.
The test equipment of the invention can be a quick-check machine equipment, for example, SRLT-2170 single-channel TFT tester equipment. The test equipment is developed for being suitable for the drive test of the TFT with medium and small size (designed with test points), can be suitable for the production and quality test of TFT LCD products, and can effectively and comprehensively control the display quality of the TFT display products. It should be noted that the fast inspection equipment may also be other types of equipment, such as SRLT-2804 general TFT tester.
In the step, the electric measuring frame is connected with an electric measuring machine, the display screen (panel) is placed in the electric measuring frame, the working state of the display screen after the display screen is bound with an IC (integrated circuit) is simply simulated, defective products caused by short circuit, short circuit and the like can be screened out, and common Mura and Dot Mura problems can be seen under a gray scale picture.
In step 202, the Gate scan voltage of the test equipment is set to 0-2V, and other experimentally selected test parameters are set at the same time.
Wherein, the Gate scan voltage of the test device may also be set to 1V.
In this step, the test parameters in the electrical test program of the test equipment may be set as shown in table 1 below:
| parameter name | Parameter value | Remarks for note |
| Frame | 8333us | Gate scan pulse time period |
| GWD-T | 3200us | Gate scanning forward pulse time |
| GOH-V | 2V | Gate odd line scanning high frequency voltage |
| GOL-V | 0V | Gate odd line scanning low-frequency voltage |
| GEH-V | 2V | Gate even line scanning high frequency voltage |
| GEL-V | 0V | Gate even line scanning low frequency voltage |
| VDRH | 8V | Date red signal line high frequency voltage |
| VDRL | 0V | Date red signal line high frequency voltage |
| VDGH | 8V | High-frequency voltage of Date green signal wire |
| VDGL | 0V | High-frequency voltage of Date green signal wire |
| VDBH | 8V | High-frequency voltage of Date blue signal line |
| VDBL | 0V | High-frequency voltage of Date blue signal line |
| Vcom | 0V | Voltage of common electrode |
TABLE 1
The parameter Frame can be fixed, and the Date signal line voltage can be set to 8V, so that the whole picture is lighter and better observed.
The test parameters set by the invention can be obtained by testing a voltage-current transfer characteristic curve. Referring to fig. 3, a schematic flow chart of a method for obtaining test parameters by performing a TR curve test in a display screen product inspection method according to an embodiment of the present invention is shown.
Referring to fig. 3, includes:
in step 301, a display screen with dot-shaped dots is connected to a test device to perform a voltage-current transfer characteristic curve test.
The invention can carry out TR test on Dot Mura products in advance, and test the TFT TR at the abnormal position of the gray scale and the curve pattern obtained by the TFT TR at the normal position. In the step, the Dot Mura product is accessed into a testing device to perform TR curve testing.
In step 302, voltage-current transfer characteristic curves of the gray scale normal position and the gray scale abnormal position under different Gate scanning voltages are obtained for comparison.
In this step, the Gate scanning voltages are sequentially and continuously adjusted, so that voltage and current transfer characteristic curves of the gray scale normal position and the gray scale abnormal position under different Gate scanning voltages can be obtained for comparison.
The normal driving Scan voltage mode is a pulse voltage mode, the low frequency is-7V, and the high frequency voltage is 17V. When Vgs (voltage between a grid electrode and a source electrode) is 17v under the normal temperature state, Ids (current between a drain electrode and a source electrode) of a normal area is 2.58E-6A, and Ids (current between a drain electrode and a source electrode) of an abnormal area is 7.21E-7A, the difference is less than one order of magnitude, and no obvious phenomenon generally exists in the area. However, when the device is operated in a high-temperature or low-temperature environment for a long time, the TR curve can shift due to the effect of the bias stress of the TR temperature. When the TFT operates at a high temperature, e.g., greater than 50 ℃, more electrons gain enough energy to transition to the conduction band tail while leaving holes at the valence band tail as the temperature increases; under the action of an external electric field, electrons or holes are transited from a band tail, namely, from one local state to another local state, so that the current is changed, and the TR characteristic curve is shifted. Similarly, when Vgs is equal to 17v, due to drift, Ids values of two curves are different from 1 order of magnitude in a normal temperature state, and become 1 to 2 orders of magnitude, in this case, a defect that an abnormal position gray scale is too dark and a normal position gray scale is too bright appears in a display screen.
Referring to fig. 4, a graph comparing TR curves according to an embodiment of the present invention is shown. In fig. 4, the abscissa is Vgs and the ordinate is Ids, the upper curve 41 of the two curves is a TR curve at the normal position of the TR gray scale, and the lower curve 42 is a TR curve at the position of the TR Dot Mura. As can be seen from fig. 4, the two TR curves are found to differ greatly (the range marked between the two dots in the figure) at Vgs of about 1V. When Vgs is 1V, Ids of gray-scale normal position is 1.29E-9A, and Ids of gray-scale abnormal position is 4.34E-11A. From the test data, the Ids values of the two curves are different by about 2 orders of magnitude in the range of Vgs 1 ± 1V (namely, Vgs 0-2V). When Vgs is within this range, the Ids output value is very different, the gray scale difference displayed on the screen is relatively obvious, in general, when Vgs is 17V, the curve is not obvious, and when Vgs is 1 ± 1V, the curve is obvious.
In step 303, according to the comparison result, the Gate scan voltage at the time when the voltage-current transfer characteristic curves at the normal gray scale position and the abnormal gray scale position of the display screen have obvious difference is selected as the test parameter.
In the step, according to the Ids values of the two curves in the range of Vgs 1 +/-1V (namely Vgs 0-2V), which are nearly 2 orders of magnitude different, the Ids output values are greatly different, and the gray scale difference displayed on a screen is obvious, so that the Vgs 0-2V is selected as a test parameter for direct subsequent use.
In step 203, after the test equipment is started according to the Gate scanning voltage of 0-2V, the display screen is identified to contain dot-shaped spots according to the gray scale uneven picture and dot matrix arrangement form displayed in the gray scale state.
In the step, the picture displayed by the screen is in a grid shape and arranged according to a certain rule according to the fact that Dot speckles are different from surrounding gray scales, so that the display screen can be identified to contain the Dot speckles according to the gray scale uneven picture and Dot matrix arrangement form displayed in the gray scale state. Referring to fig. 5, fig. 5 is a schematic diagram showing Dot Mura according to an embodiment of the present invention. In fig. 5, the normal screen display is a gray picture, which shows a picture with different gray scales due to different Ids output in the high temperature state, and the normal screen display is gray due to higher Ids; the abnormal position is black due to the lower Ids.
It can be found that the Gate scan voltage Vgs can be fixed within the range of 0 to 2 pulses because of the present invention. In the range, due to obvious Ids difference, different gray scales can be displayed at the normal position and the abnormal position, so that the defective product of Dot Mura can be screened out at normal temperature according to the gray scale uneven picture and Dot matrix arrangement form displayed at the gray scale state, verification at high temperature and low temperature is not needed, and the labor and material cost is saved; reliability of the FFS product at the end customer can also be improved.
The above description describes the method for detecting a display screen product of the present invention in detail, and the following description correspondingly describes the device for detecting a display screen product of the present invention.
Fig. 6 is a schematic structural diagram of a display screen product detection device according to an embodiment of the invention.
Referring to fig. 6, a display screen product inspection device 60 of the present invention includes: an access module 61, a parameter module 62, and an identification module 63.
And the access module 61 is used for accessing the display screen to be detected.
And the parameter module 62 is configured to set a test parameter of the test equipment to a set numerical value that makes a voltage-current transfer characteristic curve difference between a normal gray scale position and an abnormal gray scale position of the display screen obvious.
And the identification module 63 is configured to identify that the display screen contains dot-shaped spots according to a gray scale uneven picture and a dot matrix arrangement form displayed in a gray scale state after the test equipment is started according to the test parameters set by the parameter module 62.
Wherein the parameter module 62 may set a Gate scan voltage of the test device to 0-2V.
The parameter module 62 may set the Gate odd line scan high-frequency voltage of the testing device to 2V, set the Gate odd line scan low-frequency voltage to 0V, set the Gate even line scan high-frequency voltage to 2V, and set the Gate even line scan low-frequency voltage to 0V.
Fig. 7 is a schematic structural diagram of a display screen product detection device according to an embodiment of the invention.
Referring to fig. 7, a display screen product inspection device 70 of the present invention includes: access module 71, comparison module 72, parameter selection module 73.
And the access module 71 is used for accessing a display screen containing point-shaped spots to perform a voltage-current transfer characteristic curve test.
And the comparison module 72 is used for obtaining voltage and current transfer characteristic curves of the gray scale normal position and the gray scale abnormal position under different Gate scanning voltages for comparison.
And the parameter selection module 73 is configured to select, according to the comparison result of the comparison module 72, a Gate scan voltage when the voltage-current transfer characteristic curves at the normal gray scale position and the abnormal gray scale position of the display screen have obvious difference, and the Gate scan voltage is used as a test parameter for testing the display screen by the testing device.
The parameter selection module 73 may select the Gate scan voltage of 0-2V corresponding to the display screen at the gray scale normal position and the gray scale abnormal position when the voltage-current transfer characteristic curves have obvious difference, and the Gate scan voltage is used as a test parameter for testing the display screen by the test equipment.
It can be found that, according to the technical scheme of the embodiment of the invention, when the display screen is detected, the test parameters of the test equipment are set to be set to the set values which enable the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen to have obvious difference, and then after the test equipment is started according to the test parameters, the display screen is identified to contain the dot-shaped spots according to the gray scale uneven picture and the dot matrix arrangement form displayed in the gray scale state. Because the output value of the current is greatly different if the set parameters enable the difference of the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen to be obvious, the gray scale difference displayed by the screen is obvious, namely the gray scale uneven picture displayed in the gray scale state and the Dot matrix arrangement form are also obvious, so that the display screen is easily found to contain Dot-shaped spots, the technical scheme of the embodiment of the invention can directly and quickly detect the Dot Mura (Dot-shaped spots) problem of the display screen at normal temperature without undergoing high-temperature and low-temperature reliability tests, thereby reducing the high-temperature and low-temperature verification cost, reducing the bad risk of products and avoiding causing serious influence on terminal customers or market customers.
The technical solution according to the present invention has been described in detail above with reference to the accompanying drawings.
Those of ordinary skill in the art will understand that: the invention is not to be considered as limited to the specific embodiments thereof, but is to be understood as being modified in all respects, all changes and equivalents that come within the spirit and scope of the invention.
Claims (9)
1. A display screen product detection method is characterized by comprising the following steps:
accessing a display screen to be detected;
setting the test parameters of the test equipment to be set values which enable the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen to have obvious difference, wherein the test parameters of the test equipment are obtained according to the following modes: accessing a display screen containing dot-shaped spots to test equipment to test a voltage-current transfer characteristic curve, obtaining voltage-current transfer characteristic curves of a gray scale normal position and a gray scale abnormal position under different Gate scanning voltages to compare, and selecting the Gate scanning voltage when the voltage-current transfer characteristic curves of the gray scale normal position and the gray scale abnormal position of the display screen are obviously different as a test parameter according to a comparison result;
and after starting the test equipment according to the test parameters, identifying that the display screen contains dot-shaped spots according to the gray scale uneven picture and the dot matrix arrangement form displayed in the gray scale state.
2. The method as claimed in claim 1, wherein the setting of the test parameters of the test equipment to the set values for making the voltage-current transfer characteristic curves of the gray scale normal position and the gray scale abnormal position of the display screen have obvious difference comprises:
the Gate scan voltage of the test equipment is set to 0-2V.
3. The method of claim 2, wherein setting the Gate scan voltage of the test device to 0-2V comprises:
the Gate odd line scanning high-frequency voltage of the test equipment is set to be 2V, the Gate odd line scanning low-frequency voltage is set to be 0V, the Gate even line scanning high-frequency voltage is set to be 2V, and the Gate even line scanning low-frequency voltage is set to be 0V.
4. The method of claim 2, wherein setting the Gate scan voltage of the test device to 0-2V comprises:
the Gate scan voltage of the test equipment was set to 1V.
5. A display screen product detection method is characterized by comprising the following steps:
connecting the display screen containing the dot-shaped spots to perform voltage and current transfer characteristic curve test;
obtaining voltage and current transfer characteristic curves of the gray scale normal position and the gray scale abnormal position under different Gate scanning voltages for comparison;
and selecting the Gate scanning voltage when the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen have obvious difference according to the comparison result, and using the Gate scanning voltage as a test parameter for testing the display screen by the test equipment.
6. The method according to claim 5, wherein the selecting the Gate scanning voltage when the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen have obvious difference as the test parameter of the test equipment for testing the display screen comprises:
and selecting the corresponding 0-2V Gate scanning voltage when the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen are obviously different, and using the selected voltage as a test parameter for testing the display screen by the test equipment.
7. A display screen product detection device, comprising:
the access module is used for accessing a display screen to be detected;
the parameter module is used for setting the test parameters of the test equipment into set values which enable the voltage-current transfer characteristic curves of the display screen gray scale normal position and the gray scale abnormal position to have obvious difference, wherein the parameter module obtains the test parameters of the test equipment according to the following modes: accessing a display screen containing dot-shaped spots to test equipment to test a voltage-current transfer characteristic curve, obtaining voltage-current transfer characteristic curves of a gray scale normal position and a gray scale abnormal position under different Gate scanning voltages to compare, and selecting the Gate scanning voltage when the voltage-current transfer characteristic curves of the gray scale normal position and the gray scale abnormal position of the display screen are obviously different as a test parameter according to a comparison result;
and the identification module is used for identifying that the display screen contains dot-shaped spots according to the gray scale uneven picture and the dot matrix arrangement form displayed in the gray scale state after the test equipment is started according to the test parameters set by the parameter module.
8. The apparatus of claim 7, wherein:
the parameter module sets the Gate scanning voltage of the test equipment to 0-2V.
9. A display screen product detection device, comprising:
the access module is used for accessing a display screen containing point-shaped spots to test a voltage-current transfer characteristic curve;
the comparison module is used for obtaining voltage and current transfer characteristic curves of the gray scale normal position and the gray scale abnormal position under different Gate scanning voltages for comparison;
and the parameter selection module is used for selecting the Gate scanning voltage when the voltage-current transfer characteristic curves of the normal gray scale position and the abnormal gray scale position of the display screen have obvious difference according to the comparison result of the comparison module, and the Gate scanning voltage is used as a test parameter for testing the display screen by the test equipment.
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Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101231830A (en) * | 2007-01-26 | 2008-07-30 | 群康科技(深圳)有限公司 | Method for generating LCD device gamma correction table |
| CN101506863A (en) * | 2006-11-30 | 2009-08-12 | 夏普株式会社 | Display device, and driving method for display device |
| CN101765874A (en) * | 2008-05-28 | 2010-06-30 | 松下电器产业株式会社 | Display device, and manufacturing method and control method thereof |
| CN102855856A (en) * | 2012-08-30 | 2013-01-02 | 南京中电熊猫液晶显示科技有限公司 | Liquid crystal display and driving method for eliminating Mura thereof |
| CN105070273A (en) * | 2015-09-02 | 2015-11-18 | 深圳市华星光电技术有限公司 | Mura area brightness compensation method and Mura pixel point brightness design method |
| KR101608843B1 (en) * | 2014-11-05 | 2016-04-06 | 한밭대학교 산학협력단 | System and Method for Automatically Detecting a Mura Defect using Advanced Weber's Law |
| CN107680522A (en) * | 2017-09-30 | 2018-02-09 | 京东方科技集团股份有限公司 | A kind of display panel testing method and its device |
| WO2018048107A1 (en) * | 2016-09-12 | 2018-03-15 | (주)코텍 | Apparatus and method for designing light guide plate pattern |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102324238B1 (en) * | 2015-06-29 | 2021-11-10 | 삼성디스플레이 주식회사 | Inspection apparatus of inspecting mura defects and method of driving the same |
-
2018
- 2018-05-29 CN CN201810535033.4A patent/CN108847170B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101506863A (en) * | 2006-11-30 | 2009-08-12 | 夏普株式会社 | Display device, and driving method for display device |
| CN101231830A (en) * | 2007-01-26 | 2008-07-30 | 群康科技(深圳)有限公司 | Method for generating LCD device gamma correction table |
| CN101765874A (en) * | 2008-05-28 | 2010-06-30 | 松下电器产业株式会社 | Display device, and manufacturing method and control method thereof |
| CN102855856A (en) * | 2012-08-30 | 2013-01-02 | 南京中电熊猫液晶显示科技有限公司 | Liquid crystal display and driving method for eliminating Mura thereof |
| KR101608843B1 (en) * | 2014-11-05 | 2016-04-06 | 한밭대학교 산학협력단 | System and Method for Automatically Detecting a Mura Defect using Advanced Weber's Law |
| CN105070273A (en) * | 2015-09-02 | 2015-11-18 | 深圳市华星光电技术有限公司 | Mura area brightness compensation method and Mura pixel point brightness design method |
| WO2018048107A1 (en) * | 2016-09-12 | 2018-03-15 | (주)코텍 | Apparatus and method for designing light guide plate pattern |
| CN107680522A (en) * | 2017-09-30 | 2018-02-09 | 京东方科技集团股份有限公司 | A kind of display panel testing method and its device |
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