CN114113846A - System, method, device, processor and computer readable storage medium for realizing automatic test for voltage-controlled oscillator - Google Patents
System, method, device, processor and computer readable storage medium for realizing automatic test for voltage-controlled oscillator Download PDFInfo
- Publication number
- CN114113846A CN114113846A CN202111394678.9A CN202111394678A CN114113846A CN 114113846 A CN114113846 A CN 114113846A CN 202111394678 A CN202111394678 A CN 202111394678A CN 114113846 A CN114113846 A CN 114113846A
- Authority
- CN
- China
- Prior art keywords
- test
- controlled oscillator
- clamp
- processor
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
Abstract
The invention relates to a system for realizing automatic test aiming at a voltage-controlled oscillator, which comprises an automatic feeding device, wherein the automatic feeding device comprises a rotary base, a test No. 1 clamp and a test No. 2 clamp, two moving guide grooves are respectively arranged under the test No. 1 clamp, the moving guide grooves are arc-shaped to form the rotary base, the moving guide grooves close to the outer side are elastically controlled and are deflected by external force, and the moving guide grooves return to the original position when the external force disappears. The invention also relates to a method, a device, a processor and a computer readable storage medium for realizing the automatic test control for the voltage-controlled oscillator. By adopting the system, the method, the device, the processor and the computer readable storage medium for realizing the automatic test of the voltage-controlled oscillator, the time reuse is improved by adopting the design of double clamps, and the product angle is quickly and accurately positioned in a comparison mode for quantification; the jacks of the clamp are subjected to marginalization processing, so that the insertion efficiency is improved; the testing process is simple and efficient.
Description
Technical Field
The invention relates to the field of voltage-controlled oscillator measurement, in particular to the field of automatic voltage-controlled oscillator testing, and specifically relates to a system, a method, a device, a processor and a computer-readable storage medium for realizing automatic testing of a voltage-controlled oscillator.
Background
With the development of electronic technology, the application of quartz crystal oscillators in various fields is more and more extensive, and the quartz crystal oscillators are not only largely applied to communication, navigation, radar, space navigation and complete machines and equipment of frequency-scale time signal sources, but also widely applied to civil consumer products in recent years. The voltage controlled oscillator is one kind of quartz crystal oscillator and is mainly used in frequency modulation and phase locking technology. The frequency modulation circuit has the advantages of good transmission performance, strong anti-interference performance, power saving and the like, so that frequency modulation is adopted by many ground mobile communication devices and airborne communication devices, and the voltage-controlled oscillator is one of important components.
Voltage controlled oscillators are widely used in various instruments as a highly stable frequency source. The tunable frequency is an indispensable key component in various receivers and transponders. In these devices, in order to compensate for the effects of factors such as long-term aging of the oscillator, doppler shift between the transmitted and received signals, etc., a voltage-controlled oscillator is generally required to have a wide voltage control range; in addition, in order to adapt to working environments such as the field and the space, it is also required to have good frequency temperature stability in a wide temperature range.
Disclosure of Invention
The present invention is directed to overcoming the above-mentioned drawbacks of the prior art, and providing a system, a method, an apparatus, a processor, and a computer-readable storage medium thereof for implementing an automatic test for a voltage-controlled oscillator with high test efficiency, high throughput, and low cost.
To achieve the above object, the present invention provides a system, a method, a device, a processor and a computer readable storage medium thereof for performing an automated test on a voltage controlled oscillator, wherein the system, the method, the device, the processor and the computer readable storage medium thereof are as follows:
this system that realization was carried out automated test to voltage controlled oscillator, its key feature is, the system include automatic feeding device, automatic feeding part device include rotating base, test 1 number position anchor clamps, test 2 number position anchor clamps, test 1 number position anchor clamps under be equipped with two respectively and remove the guide slot, the removal guide slot be the arc, constitute rotating base, the removal guide slot that leans on the outside is elastic control, receives external force to produce the skew, returns the normal position when external force disappears.
Preferably, the automatic feeding part device further comprises a material tray, a mechanical arm and a photographing camera, the material tray is used for placing the measured piece, the mechanical arm is used for grabbing, moving and inserting the measured piece, and the photographing camera is used for comparing and calculating the position and the angle which need to be adjusted.
Preferably, the automatic feeding part device further comprises a quick-connection interface, and the test No. 1 position fixture or the test No. 2 position fixture is in contact with the quick-connection interface through rotation of the rotating base.
The method for realizing automatic test control aiming at the voltage-controlled oscillator by using the system is mainly characterized by comprising the following steps of:
(1) the manipulator grabs the tested piece from the material tray;
(2) the photographing camera compares the pictures according to a standard position preset by the system, and calculates the position and the angle which need to be adjusted;
(3) the manipulator rotates to adjust to an insertable angle, moves to the position of the clamp for testing the No. 2 position in parallel and moves downwards to insert the tested piece;
(4) rotating the rotary base by 180 degrees to reverse the position of the clamp;
(5) the moving device under the test No. 1 clamp controls the test No. 1 clamp to move leftwards to contact the quick-plugging interface, and the test No. 1 clamp moves rightwards to disconnect after the product is tested;
(6) the rotary base rotates 180 degrees, the manipulator takes down the tested piece of the test No. 2 clamp and places a new tested piece;
(7) and testing the tested piece of the clamp for testing the No. 1 position and the tested piece of the clamp for testing the No. 2 year old position synchronously, and continuously feeding and testing until the test is finished.
The device for realizing automatic test control aiming at the voltage-controlled oscillator is mainly characterized by comprising the following components:
a processor configured to execute computer-executable instructions;
and a memory storing one or more computer-executable instructions that, when executed by the processor, perform the steps of the above-described method for implementing automated test control for a voltage controlled oscillator.
The processor for implementing the automated test control for the voltage-controlled oscillator is mainly characterized in that the processor is configured to execute computer-executable instructions, and when the computer-executable instructions are executed by the processor, the steps of the method for implementing the automated test control for the voltage-controlled oscillator are implemented.
The computer-readable storage medium is primarily characterized in that a computer program is stored thereon, which computer program is executable by a processor for carrying out the steps of the above-described method for implementing an automated test control for a voltage-controlled oscillator.
By adopting the system, the method, the device, the processor and the computer readable storage medium for realizing the automatic test of the voltage-controlled oscillator, the time reuse is improved by adopting the design of double clamps, and when the test No. 1 bit is tested, the feeding of the No. 2 bit is synchronously carried out; the product angle is quickly and accurately positioned in a comparison mode, and quantification is carried out; the jacks of the clamp are subjected to marginalization processing, so that the insertion efficiency is improved; the testing process is simple and efficient.
Drawings
Fig. 1 is a schematic structural diagram of a system for implementing automated testing of a voltage-controlled oscillator according to the present invention.
Fig. 2 is a test flow chart of a method for implementing automated test control for a voltage controlled oscillator according to the present invention.
Detailed Description
In order to more clearly describe the technical contents of the present invention, the following further description is given in conjunction with specific embodiments.
The system for realizing the automatic test of the voltage-controlled oscillator comprises an automatic feeding device, wherein the automatic feeding device comprises a rotary base, a test No. 1 clamp and a test No. 2 clamp, two moving guide grooves are respectively arranged below the test No. 1 clamp and are arc-shaped to form the rotary base, the moving guide grooves close to the outer side are elastically controlled and are deflected by external force, and the moving guide grooves return to the original position when the external force disappears.
As a preferred embodiment of the present invention, the automatic feeding device further comprises a tray, a manipulator, and a camera, wherein the tray is used for placing the measured object, the manipulator is used for grabbing, moving, and inserting the measured object, and the camera compares and calculates the position and the angle to be adjusted.
As a preferred embodiment of the present invention, the automatic feeding part device further includes a quick-connect interface, and the test position 1 fixture or the test position 2 fixture is brought into contact with the quick-connect interface by rotation of the rotating base.
The method for realizing automatic test control aiming at the voltage-controlled oscillator by utilizing the system comprises the following steps:
(1) the manipulator grabs the tested piece from the material tray;
(2) the photographing camera compares the pictures according to a standard position preset by the system, and calculates the position and the angle which need to be adjusted;
(3) the manipulator rotates to adjust to an insertable angle, moves to the position of the clamp for testing the No. 2 position in parallel and moves downwards to insert the tested piece;
(4) rotating the rotary base by 180 degrees to reverse the position of the clamp;
(5) the moving device under the test No. 1 clamp controls the test No. 1 clamp to move leftwards to contact the quick-plugging interface, and the test No. 1 clamp moves rightwards to disconnect after the product is tested;
(6) the rotary base rotates 180 degrees, the manipulator takes down the tested piece of the test No. 2 clamp and places a new tested piece;
(7) and testing the tested piece of the clamp for testing the No. 1 position and the tested piece of the clamp for testing the No. 2 year old position synchronously, and continuously feeding and testing until the test is finished.
The device for realizing automatic test control for the voltage-controlled oscillator of the invention comprises:
a processor configured to execute computer-executable instructions;
and a memory storing one or more computer-executable instructions that, when executed by the processor, perform the steps of the above-described method for implementing automated test control for a voltage controlled oscillator.
The processor for implementing the automated test control for the voltage-controlled oscillator of the present invention is configured to execute computer-executable instructions, and when the computer-executable instructions are executed by the processor, the steps of the method for implementing the automated test control for the voltage-controlled oscillator are implemented.
The computer-readable storage medium of the present invention has stored thereon a computer program executable by a processor to perform the steps of the above-described method for implementing automated test control for a voltage controlled oscillator.
The invention aims to provide an automatic test device and a measurement method for testing a voltage-controlled oscillator.
The invention introduces a self-defined comparison algorithm, can quickly and accurately determine the angle and the position of the product, can insert in one step, and does not damage the product. The whole testing device consists of an upper computer, a program control power supply of the instrument, a signal source analyzer and an automatic feeding device. The program-controlled power supply and the signal source analyzer realize parameter setting, result reading and result storage.
As shown in figure 1, the automatic feeding device consists of a camera, a mechanical arm and a rotating disk (comprising two product testing clamps), wherein a left-right moving guide groove is arranged below a No. 1 testing clamp, one end close to the outer side has elastic control, the automatic feeding device can shift once when being subjected to external force, and the automatic feeding device returns when the external force disappears. The movement of the test fixture can be controlled to contact the quick connector.
The whole test procedure is shown in fig. 2.
The automatic feeding method comprises the following steps:
1. the manipulator grabs a measured piece from the material box;
2. after the camera takes a picture, the host compares the picture according to a standard position preset by the system, and calculates the position and the angle which need to be accurately adjusted by adopting a professional algorithm;
3. the host machine controls the rotation of the mechanical arm to be adjusted to an insertable angle;
4. the mechanical arm moves to the position of No. 2 in parallel and moves down to be inserted into a tested piece, and an Ok mounting signal is sent;
5. the rotary base rotates 180 degrees and the position of the clamp is reversed;
6. the moving device below the test No. 1 position controls the test fixture to move leftwards to contact the quick insertion port;
7. after the product on the test No. 1 clamp is tested, the clamp moves rightwards to disconnect;
8. rotating the rotary base by 180 degrees, taking down the product on the No. 2 position to be tested, and placing a new product;
9. simultaneously testing the products on the No. 1 position for synchronous testing;
10. waiting for the test work of the test No. 1 position and the installation work of the test No. 2 position to be completed;
11. the above loading and testing steps were repeated until all product tests were completed.
For a specific implementation of this embodiment, reference may be made to the relevant description in the above embodiments, which is not described herein again.
It is understood that the same or similar parts in the above embodiments may be mutually referred to, and the same or similar parts in other embodiments may be referred to for the content which is not described in detail in some embodiments.
It should be noted that the terms "first," "second," and the like in the description of the present invention are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. Further, in the description of the present invention, the meaning of "a plurality" means at least two unless otherwise specified.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing specific logical functions or steps of the process, and alternate implementations are included within the scope of the preferred embodiment of the present invention in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the present invention.
It should be understood that portions of the present invention may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory and executed by suitable instruction execution devices. For example, if implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, and the corresponding program may be stored in a computer readable storage medium, and when executed, the program includes one or a combination of the steps of the method embodiments.
In addition, functional units in the embodiments of the present invention may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a separate product, may also be stored in a computer readable storage medium.
The storage medium mentioned above may be a read-only memory, a magnetic or optical disk, etc.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
By adopting the system, the method, the device, the processor and the computer readable storage medium for realizing the automatic test of the voltage-controlled oscillator, the time reuse is improved by adopting the design of double clamps, and when the test No. 1 bit is tested, the feeding of the No. 2 bit is synchronously carried out; the product angle is quickly and accurately positioned in a comparison mode, and quantification is carried out; the jacks of the clamp are subjected to marginalization processing, so that the insertion efficiency is improved; the testing process is simple and efficient.
In this specification, the invention has been described with reference to specific embodiments thereof. It will, however, be evident that various modifications and changes may be made thereto without departing from the broader spirit and scope of the invention. The specification and drawings are, accordingly, to be regarded in an illustrative rather than a restrictive sense.
Claims (7)
1. The utility model provides a system for realize carrying out automated test to voltage controlled oscillator, a serial communication port, the system include automatic feeding device, automatic feeding part device include rotating basis, test 1 number position anchor clamps, test 2 number position anchor clamps, test 1 number position anchor clamps under be equipped with two respectively and remove the guide slot, the removal guide slot be the arc, constitute rotating basis, the removal guide slot that leans on the outside is elastic control, receives external force to produce the skew, returns the normal position when external force disappears.
2. The system for realizing the automated test of the voltage-controlled oscillator according to claim 1, wherein the automatic feeding part device further comprises a tray for placing the tested piece, a manipulator for grabbing, moving and inserting the tested piece, and a camera for photographing for comparing and calculating the position and angle to be adjusted.
3. The system for implementing automated testing of a voltage controlled oscillator according to claim 1, wherein the automatic loading portion further comprises a quick-connect interface, and the test position 1 fixture or the test position 2 fixture is in contact with the quick-connect interface by rotation of the rotating base.
4. A method for implementing automatic test control for a voltage controlled oscillator based on the system of claim 1, the method comprising the steps of:
(1) the manipulator grabs the tested piece from the material tray;
(2) the photographing camera compares the pictures according to a standard position preset by the system, and calculates the position and the angle which need to be adjusted;
(3) the manipulator rotates to adjust to an insertable angle, moves to the position of the clamp for testing the No. 2 position in parallel and moves downwards to insert the tested piece;
(4) rotating the rotary base by 180 degrees to reverse the position of the clamp;
(5) the moving device under the test No. 1 clamp controls the test No. 1 clamp to move leftwards to contact the quick-plugging interface, and the test No. 1 clamp moves rightwards to disconnect after the product is tested;
(6) the rotary base rotates 180 degrees, the manipulator takes down the tested piece of the test No. 2 clamp and places a new tested piece;
(7) and testing the tested piece of the clamp for testing the No. 1 position and the tested piece of the clamp for testing the No. 2 year old position synchronously, and continuously feeding and testing until the test is finished.
5. An apparatus for implementing automated test control for a voltage controlled oscillator, the apparatus comprising:
a processor configured to execute computer-executable instructions;
a memory storing one or more computer-executable instructions that, when executed by the processor, perform the steps of the method of implementing automated test control for a voltage controlled oscillator as set forth in claim 4.
6. A processor for implementing automated test control for a voltage controlled oscillator, the processor configured to execute computer-executable instructions that, when executed by the processor, perform the steps of the method of implementing automated test control for a voltage controlled oscillator as recited in claim 4.
7. A computer-readable storage medium, on which a computer program is stored which is executable by a processor for carrying out the steps of the method for automated test control of a voltage controlled oscillator as claimed in claim 4.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111394678.9A CN114113846A (en) | 2021-11-23 | 2021-11-23 | System, method, device, processor and computer readable storage medium for realizing automatic test for voltage-controlled oscillator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111394678.9A CN114113846A (en) | 2021-11-23 | 2021-11-23 | System, method, device, processor and computer readable storage medium for realizing automatic test for voltage-controlled oscillator |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114113846A true CN114113846A (en) | 2022-03-01 |
Family
ID=80440280
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111394678.9A Pending CN114113846A (en) | 2021-11-23 | 2021-11-23 | System, method, device, processor and computer readable storage medium for realizing automatic test for voltage-controlled oscillator |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114113846A (en) |
Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3878364D1 (en) * | 1987-09-17 | 1993-03-25 | Schlumberger Ind Sa | TEST HEAD MANIPULATOR FOR AUTOMATIC TESTING. |
| JP3057071B1 (en) * | 1999-01-14 | 2000-06-26 | アジアエレクトロニクス株式会社 | Wafer test equipment |
| KR20030008050A (en) * | 2001-07-12 | 2003-01-24 | 주식회사 하이닉스반도체 | Interface board for semiconductor test system |
| US7301326B1 (en) * | 2004-07-13 | 2007-11-27 | Intest Corporation | Modular interface |
| CN101802630A (en) * | 2007-10-05 | 2010-08-11 | 马尔帝电子系统有限公司 | Operating equipment with the electronic component that is used for, especially IC ' s of a plurality of belt cars that on endless track, guide |
| CN205771820U (en) * | 2016-05-23 | 2016-12-07 | 深圳市鹰眼在线电子科技有限公司 | The automatic charging device of wire binding machine and wire binding machine |
| CN205786695U (en) * | 2016-05-16 | 2016-12-07 | 法特迪精密科技（苏州）有限公司 | Seat is connected for the extensive automatization of chip and manual test |
| CN106443457A (en) * | 2016-08-25 | 2017-02-22 | 宁波蓝鲸自动化科技有限公司 | New energy fitting automatic performance test device |
| CN108007475A (en) * | 2016-10-27 | 2018-05-08 | 恩智浦美国有限公司 | MEMS devices test system and method |
| CN108776300A (en) * | 2018-08-04 | 2018-11-09 | 北方联创通信有限公司 | Four side stamp hole package module test fixtures and application method |
| CN109514424A (en) * | 2018-12-24 | 2019-03-26 | 沈阳海默数控机床有限公司 | A kind of grinding machine automatic charging system of processing and method |
| CN209727995U (en) * | 2018-12-19 | 2019-12-03 | 深圳市鑫艾睿科技有限公司 | A kind of precision measurement probe process equipment |
| CN111308325A (en) * | 2019-12-13 | 2020-06-19 | 山东才聚电子科技有限公司 | Chip detection system and method |
| CN212341253U (en) * | 2020-03-30 | 2021-01-12 | 珠海横琴佳浩智能科技有限公司 | Transformer detection device |
| CN212723164U (en) * | 2020-04-30 | 2021-03-16 | 深圳市银浩自动化设备有限公司 | Multi-station detection mechanism |
| CN112881831A (en) * | 2021-01-15 | 2021-06-01 | 上海创远仪器技术股份有限公司 | Method for realizing quantitative debugging of circulator |
-
2021
- 2021-11-23 CN CN202111394678.9A patent/CN114113846A/en active Pending
Patent Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3878364D1 (en) * | 1987-09-17 | 1993-03-25 | Schlumberger Ind Sa | TEST HEAD MANIPULATOR FOR AUTOMATIC TESTING. |
| JP3057071B1 (en) * | 1999-01-14 | 2000-06-26 | アジアエレクトロニクス株式会社 | Wafer test equipment |
| KR20030008050A (en) * | 2001-07-12 | 2003-01-24 | 주식회사 하이닉스반도체 | Interface board for semiconductor test system |
| US7301326B1 (en) * | 2004-07-13 | 2007-11-27 | Intest Corporation | Modular interface |
| CN101802630A (en) * | 2007-10-05 | 2010-08-11 | 马尔帝电子系统有限公司 | Operating equipment with the electronic component that is used for, especially IC ' s of a plurality of belt cars that on endless track, guide |
| CN205786695U (en) * | 2016-05-16 | 2016-12-07 | 法特迪精密科技（苏州）有限公司 | Seat is connected for the extensive automatization of chip and manual test |
| CN205771820U (en) * | 2016-05-23 | 2016-12-07 | 深圳市鹰眼在线电子科技有限公司 | The automatic charging device of wire binding machine and wire binding machine |
| CN106443457A (en) * | 2016-08-25 | 2017-02-22 | 宁波蓝鲸自动化科技有限公司 | New energy fitting automatic performance test device |
| CN108007475A (en) * | 2016-10-27 | 2018-05-08 | 恩智浦美国有限公司 | MEMS devices test system and method |
| CN108776300A (en) * | 2018-08-04 | 2018-11-09 | 北方联创通信有限公司 | Four side stamp hole package module test fixtures and application method |
| CN209727995U (en) * | 2018-12-19 | 2019-12-03 | 深圳市鑫艾睿科技有限公司 | A kind of precision measurement probe process equipment |
| CN109514424A (en) * | 2018-12-24 | 2019-03-26 | 沈阳海默数控机床有限公司 | A kind of grinding machine automatic charging system of processing and method |
| CN111308325A (en) * | 2019-12-13 | 2020-06-19 | 山东才聚电子科技有限公司 | Chip detection system and method |
| CN212341253U (en) * | 2020-03-30 | 2021-01-12 | 珠海横琴佳浩智能科技有限公司 | Transformer detection device |
| CN212723164U (en) * | 2020-04-30 | 2021-03-16 | 深圳市银浩自动化设备有限公司 | Multi-station detection mechanism |
| CN112881831A (en) * | 2021-01-15 | 2021-06-01 | 上海创远仪器技术股份有限公司 | Method for realizing quantitative debugging of circulator |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR101933723B1 (en) | Programmable protocol generator | |
| US20100277198A1 (en) | System and method for testing a characteristic impedance of an electronic component | |
| KR20080068785A (en) | Method for determining information about the internal workings of a chip based on electro-magnetic emissions therefrom | |
| JP2013506853A (en) | Oscilloscope and method and system for collecting and displaying signal waveform thereof | |
| CN103237108B (en) | For method of testing and the test terminal of mobile terminal | |
| US11137910B2 (en) | Fast address to sector number/offset translation to support odd sector size testing | |
| CN103575996B (en) | Antenna detection device | |
| CN114113846A (en) | System, method, device, processor and computer readable storage medium for realizing automatic test for voltage-controlled oscillator | |
| US11366021B2 (en) | Temperature detecting device, temperature detecting system and temperature detecting method | |
| CN103995202A (en) | Automatic signal testing method, device and system | |
| CN114325337A (en) | Test system and test method of radio frequency chip | |
| CN117388673A (en) | ATE equipment and chip testing method thereof, electronic equipment and storage medium | |
| CN112433101B (en) | Vehicle testing system and vehicle testing method | |
| CN105589828B (en) | A kind of method and apparatus that high-speed interface data send and receive | |
| CN104750101A (en) | Detection apparatus and method of digital signal processing module of airborne interrogator | |
| CN112290934B (en) | Controllable jitter clock generating device based on Bias-Tee signal synthesis | |
| CN113310673B (en) | Method and device for detecting repetition precision, computer equipment and storage medium thereof | |
| US11041904B2 (en) | Zero-pin test solution for integrated circuits | |
| CN114326925A (en) | Signal synchronous output method, device, equipment and medium | |
| US11237202B2 (en) | Non-standard sector size system support for SSD testing | |
| TWI412754B (en) | System and method for testing a characteristic impedance of a part | |
| Verhaevert et al. | A low-cost vector network analyzer: Design and realization | |
| CN213600832U (en) | High-precision chip test time cost analysis system | |
| CN107576867B (en) | Co-time base device suitable for comprehensive test of active clock mode device | |
| CN217981726U (en) | Quantum chip detects frock and detection device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |