CN114325337A - Test system and test method of radio frequency chip - Google Patents
Test system and test method of radio frequency chip Download PDFInfo
- Publication number
- CN114325337A CN114325337A CN202111666317.5A CN202111666317A CN114325337A CN 114325337 A CN114325337 A CN 114325337A CN 202111666317 A CN202111666317 A CN 202111666317A CN 114325337 A CN114325337 A CN 114325337A
- Authority
- CN
- China
- Prior art keywords
- radio frequency
- test
- chips
- port
- chip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 244
- 238000010998 test method Methods 0.000 title abstract description 11
- 238000000034 method Methods 0.000 claims description 24
- 238000011056 performance test Methods 0.000 claims description 24
- 230000005540 biological transmission Effects 0.000 claims description 13
- 238000005259 measurement Methods 0.000 claims description 4
- 238000005070 sampling Methods 0.000 claims description 4
- 230000015654 memory Effects 0.000 description 25
- 238000004519 manufacturing process Methods 0.000 description 9
- 238000004891 communication Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 230000006870 function Effects 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000004590 computer program Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000009533 lab test Methods 0.000 description 1
- 238000010295 mobile communication Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000011022 operating instruction Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Images
Landscapes
- Monitoring And Testing Of Transmission In General (AREA)
Abstract
The application relates to the technical field of chip testing, and discloses a test system and a test method of a radio frequency chip, wherein the test system of the radio frequency chip comprises the following steps: testing the machine table; the test board is connected with the test machine platform and the radio frequency instrument and used for placing one or more radio frequency chips; the radio frequency instrument is respectively connected to the test board and comprises a plurality of radio frequency test ports which are respectively connected with the radio frequency input port and the radio frequency output port of each radio frequency chip so as to test one or more radio frequency chips in parallel. By connecting the radio frequency input port and the radio frequency output port of one or more radio frequency chips with the test port of the radio frequency instrument, the one or more radio frequency chips can be tested in parallel, and therefore the test efficiency is improved.
Description
Technical Field
The embodiment of the application relates to the technical field of chip testing, in particular to a testing system and a testing method of a radio frequency chip.
Background
With the wide application of 5G communication and millimeter wave radar in the market, the working frequency range of the radio frequency chip is higher and higher. For example, millimeter wave radar chips can accurately determine the distance, speed and angle information of a target object, and have been widely applied to a plurality of fields such as automotive electronics, unmanned aerial vehicles and intelligent transportation.
However, the radio frequency chip has a high working frequency range, and enters a large-scale mass production stage, so that the requirement on automatic mass production testing equipment is very high. The mainstream ATE tester in the market at present is limited by the supported frequency band, and cannot completely meet the mass production test requirement of the radio frequency chip with higher working frequency (for example, more than 6 GHz).
Most of the existing mass production test schemes of the radio frequency chips select a high-performance radio frequency switch to be matched with an ATE (automatic test equipment) tester for testing through an externally-hung desk type radio frequency instrument, but the radio frequency switch has limited service life and is difficult to calibrate, so that the stability and consistency of mass production test cannot be completely guaranteed. And the desk type instrument has fewer radio frequency ports, and a plurality of test items or a plurality of chips can only be subjected to serial test even if a radio frequency switch is used. In addition, desk top meters are slow to respond, and the problem caused by the desk top meters is that the test time is increased, which means the test cost is increased.
Radio frequency and function tests are also directly carried out on the PXI system, the PXI function test capability is weak, so the radio frequency and function tests are mostly used for laboratory tests, and the stability and the universality of a software platform are not completely suitable for large-scale mass production tests.
In the process of implementing the embodiment of the application, the applicant finds that: the prior art has the technical problem of low chip testing efficiency.
Disclosure of Invention
The embodiment of the application provides a test system and a test method of a radio frequency chip, which aim to solve the technical problems of low chip test efficiency and high test cost in the prior art and improve the test efficiency.
In order to solve the above technical problem, an embodiment of the present application provides the following technical solutions:
in a first aspect, an embodiment of the present application provides a test system for a radio frequency chip, including:
testing the machine table;
the test board is connected with the test machine platform and the radio frequency instrument and used for placing one or more radio frequency chips;
the radio frequency instrument is respectively connected with the test board and comprises a plurality of radio frequency test ports which are respectively connected with the radio frequency input port and/or the radio frequency output port of each radio frequency chip so as to test one or more radio frequency chips in parallel.
In some embodiments, the radio frequency test port comprises:
the signal receiving port is used for receiving transmitting signals sent by one or more radio frequency chips, wherein each radio frequency output port of the radio frequency chips corresponds to one signal receiving port;
and the signal transmitting port is used for transmitting carrier signals to one or more radio frequency chips, wherein each radio frequency input port of the radio frequency chip corresponds to one signal transmitting port.
In some embodiments, the radio frequency input port and/or the radio frequency output port of each radio frequency chip is connected with the radio frequency transmitting port and/or the radio frequency receiving port of the corresponding radio frequency meter through the test board, wherein the number of the radio frequency output ports and/or the radio frequency input ports of the radio frequency chips is not greater than the number of the ports of the radio frequency meter.
In some embodiments, the rf test port includes a plurality of signal receiving ports, wherein each signal receiving port is connected to an rf output port of one rf chip.
In some embodiments of the present invention, the,
the signal receiving port is connected with a radio frequency output port of the radio frequency chip through a radio frequency cable;
the signal transmitting port is connected with the radio frequency input port of the radio frequency chip through a radio frequency cable.
In some embodiments, the radio frequency cable comprises a coaxial radio frequency cable.
In some embodiments of the present invention, the,
the test board is connected with the test board through a spring pin and used for supplying power to at least one radio frequency chip in the test board and obtaining an output result of the at least one radio frequency chip;
the test machine is connected with the radio frequency instrument through a network cable and used for driving the radio frequency instrument so as to complete input and sampling of radio frequency signals.
In some embodiments, the tester tools include ATE tester tools and the radio frequency meters include PXI radio frequency meters.
In a second aspect, an embodiment of the present application provides a method for testing a radio frequency chip, which is applied to the system for testing a radio frequency chip as in the first aspect, and the method includes:
receiving a test instruction;
and according to the test instruction, performing parallel test on one or more radio frequency chips on the test board to determine the test result of the one or more radio frequency chips.
In some embodiments, the step of performing the test on the one or more radio frequency chips on the test board according to the test instruction to determine the test result of the one or more radio frequency chips includes:
if the test instruction is a transmission performance test instruction, the test machine configures the radio frequency chips, simultaneously sends an SCPI instruction to set a measurement environment, and performs transmission performance test on one or more radio frequency chips on the test board to determine the transmission performance test result of the one or more radio frequency chips;
if the test instruction is a reception performance test instruction, an SCPI instruction is sent through the test machine, carrier signals with different frequencies are set for different radio frequency chips according to the SCPI instruction, and the reception performance test is carried out on one or more radio frequency chips on the test board so as to determine the reception performance test result of the one or more radio frequency chips.
In a third aspect, an embodiment of the present application provides a testing apparatus, including:
at least one processor; and
a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,
the memory stores instructions executable by the at least one processor to enable the at least one processor to perform a method of testing a radio frequency chip as in the second aspect.
In a fourth aspect, embodiments of the present application provide a non-volatile computer-readable storage medium, where computer-executable instructions are stored, and the computer-executable instructions are used to enable a robot to perform the method for testing the radio frequency chip according to the second aspect.
The beneficial effects of the embodiment of the application are that: different from the situation in the prior art, an embodiment of the present application provides a test system and a test method for a radio frequency chip, where the test system for the radio frequency chip includes: testing the machine table; the test board is connected with the test machine platform and the radio frequency instrument and used for placing one or more radio frequency chips; the radio frequency instrument is connected with the test board and comprises a plurality of radio frequency test ports which are respectively connected with the radio frequency input port and/or the radio frequency output port of each radio frequency chip so as to test one or more radio frequency chips in parallel. The radio frequency input port and the radio frequency output port of one or more radio frequency chips are connected with the test port of the radio frequency instrument through the test board, so that the one or more radio frequency chips can be tested in parallel, and the test efficiency is improved.
Drawings
One or more embodiments are illustrated in drawings corresponding to, and not limiting to, the embodiments, in which elements having the same reference number designation may be represented as similar elements, unless specifically noted, the drawings in the figures are not to scale.
Fig. 1 is a schematic structural diagram of a test system for a radio frequency chip according to an embodiment of the present disclosure;
fig. 2 is a schematic structural diagram of another test system for an rf chip according to an embodiment of the present disclosure;
fig. 3 is a schematic flowchart illustrating a method for testing a radio frequency chip according to an embodiment of the present disclosure;
fig. 4 is a schematic diagram of a hardware structure of a testing machine according to an embodiment of the present disclosure.
Detailed Description
To facilitate an understanding of the present application, the present application is described in more detail below with reference to the accompanying drawings and detailed description. It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for descriptive purposes only.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the present application. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments, but not all embodiments, of the technical solutions of the present application. All other embodiments obtained by a person skilled in the art without any inventive step based on the embodiments described in the present application are within the scope of the protection of the present application.
Example one
Referring to fig. 1, fig. 1 is a schematic structural diagram of a test system for a radio frequency chip according to an embodiment of the present disclosure;
as shown in fig. 1, the system 300 for testing an rf chip includes: a testing machine 100, a testing board 10 and a RF meter 200.
The test machine 100 is connected to the rf meter 200 through a network cable, and is configured to drive the rf meter 200 to complete input and sampling of the rf signal.
In the embodiment of the present application, the testing machine 100 is directly connected to the rf meter 200 through a network cable to drive the rf meter 200, so as to complete the input and sampling of the rf signal.
In the embodiment of the present application, the testing machine 100 is connected to the testing board 10 through pogo pins to provide power and digital logic control for the rf chip itself, for example: testing the driver chip, or reading or writing register values within the chip. The test machine is also used for obtaining the output result of the radio frequency chip. The output result is compared with an expected value stored in the testing machine 100, so as to determine whether the radio frequency chip is good or defective.
The test board 10 is connected with the test machine 100 and the radio frequency instrument 200 and used for placing one or more radio frequency chips, and the test board 10 comprises a radio frequency input port and a radio frequency output port for leading out one or more radio frequency chips for testing;
in the embodiment of the present application, the test board 10 serves as an intermediary for switching, and provides a radio frequency output port of a transmitting end and a radio frequency input port of a receiving end of one or more radio frequency chips, and the receiving end and the transmitting end of the radio frequency chip all need to be led out through the test board to be tested, so that no matter the radio frequency input port or the radio frequency output port of the radio frequency chip, the radio frequency input port or the radio frequency output port of the radio frequency chip is connected to a radio frequency meter through a radio frequency cable from a port of the test board respectively for testing, for example: the radio frequency instrument is directly connected to a radio frequency input port and a radio frequency output port of the radio frequency chip through a port of the test board by using a radio frequency cable, namely a receiving end and a transmitting end of the radio frequency chip.
The test board 10 connects the channel of the test machine with the pins of the radio frequency chip, and simultaneously leads out the radio frequency input port and the radio frequency output port of the radio frequency chip, and is connected to each port of the radio frequency instrument by a radio frequency cable. It can be understood that the test board 10 is required to connect the pin of the rf chip to the tester for testing, in addition to connecting the rf input port or the rf output port of the rf chip to the rf meter for testing. The testing machine comprises a plurality of testing machine channels, wherein the testing machine channels are testing resources and are used for driving or measuring the radio frequency chip to be tested.
The rf meter 200 is connected to the test board 100 and the test board 10, respectively, and the rf meter 200 includes a plurality of rf test ports, which are connected to the rf input port and the rf output port of each rf chip, respectively, so as to test one or more rf chips in parallel.
In the embodiment of the present application, the rf test port of the rf meter 200 includes:
the signal receiving port is used for receiving transmitting signals sent by one or more radio frequency chips, wherein each radio frequency output port of the radio frequency chips corresponds to one signal receiving port;
and the signal transmitting port is used for transmitting carrier signals to one or more radio frequency chips, wherein each radio frequency input port of the radio frequency chip corresponds to one signal transmitting port.
In the embodiment of the application, the signal receiving port is connected with the radio frequency output port through a radio frequency cable; the signal transmitting port is connected with the radio frequency input port through a radio frequency cable.
It can be understood that the rf cables are used to connect the rf meter and the test board, and one rf cable includes two ports, one port is connected to the rf meter, and the other port is connected to the rf input port or the rf output port on the test board. Therefore, the number of rf cables depends on the number of rf output ports or rf input ports of the rf chips on the test board, and the number of rf test ports of the rf meter.
In this embodiment, the rf meter 200 includes a PXI rf meter, and different PXI rf meter modules are configured for different rf input ports of the same rf chip, where the PXI rf meter has different independent modules, for example: different independent hardware boards. Because different hardware board card modules can be independently controlled, different carrier signals can be sent to the radio frequency chip at the same time, and different radio frequency input ports of the radio frequency chip can receive the carrier signals at the same time. By simultaneously configuring different PXI radio frequency instrument modules, different radio frequency input ports of the same radio frequency chip can simultaneously receive carrier signals, and parallel testing of a plurality of different radio frequency chips is facilitated.
In this embodiment of the present application, the tester 100 is used for testing a chip or a module, and includes an Automatic Test Equipment (ATE), that is, an ATE tester, or the tester includes a semiconductor chip tester and other testers, preferably, the tester 100 in this embodiment of the present application is an ATE tester, and the radio frequency instrument 200 includes a PXI radio frequency instrument, or the radio frequency instrument 200 includes a spectrometer, a vector network analyzer, an oscilloscope, a spectrum analyzer, a signal source, a power meter, a comprehensive tester and other instruments, preferably, the radio frequency instrument 200 in this embodiment of the present application is a PXI radio frequency instrument.
In this embodiment, the rf input port and/or the rf output port of each rf chip is connected to at least one rf transmitting port and/or at least one rf receiving port of the rf meter through the test board, where the number of the ports of the rf chip is not greater than the number of the rf output ports and/or the rf input ports, for example: each radio frequency chip comprises two radio frequency input ports, namely a first radio frequency input port and a second radio frequency input port.
The rf test port of the rf meter 200 includes a plurality of signal receiving ports, wherein each signal receiving port is connected to one rf input port of one rf chip.
Referring to fig. 2 again, fig. 2 is a schematic structural diagram of another testing system for a radio frequency chip according to an embodiment of the present disclosure;
as shown in fig. 2, TX is a radio frequency output port of the radio frequency chip, and RX1 and RX2 are a first radio frequency input port and a second radio frequency input port of the radio frequency chip, respectively. The radio frequency output port TX of each radio frequency chip is connected to one radio frequency test port of the PXI radio frequency instrument, and the radio frequency output ports of different radio frequency chips correspond to one radio frequency test port one by one, so that parallel test is facilitated; meanwhile, RX1 and RX2 are used as two different radio frequency input ports of the radio frequency chip and are respectively connected to different radio frequency test ports of the PXI radio frequency instrument, and each radio frequency input port of each radio frequency chip is correspondingly connected with one radio frequency test port of the PXI radio frequency instrument one to one, so that parallel test is facilitated.
In the embodiment of the application, the characteristic that the PXI architecture is used for flexibly configuring the instrument board card is utilized, a plurality of radio frequency test ports can be provided, and the ATE test platform has abundant numbers and power channels and supports parallel testing of a plurality of radio frequency chips, so that the test time is saved, and the mass production test cost is reduced. In addition, no matter the transmitting performance or the receiving performance of the radio frequency chip is tested, different radio frequency signal ports of different tested radio frequency chips are directly connected to different ports of the PXI radio frequency instrument through radio frequency cables without any device, so that the test is completely parallel while the mass production maintenance is facilitated.
Compared with a scheme of externally hanging a desk type radio frequency instrument or a scheme of directly using a PXI instrument for testing, the radio frequency chip testing system provided by the application can provide a plurality of independent radio frequency testing ports, has abundant numbers and power channels simultaneously, and meets the requirement of simultaneously testing one or more radio frequency chips. In addition, no matter the transmission performance or the receiving performance of the radio frequency chip is tested, different radio frequency signal ports of different radio frequency chips are directly connected to different ports of the PXI radio frequency instrument without any device, so that the complete parallel test is realized, the test time is reduced to a great extent, the test system is calibrated, the operation is simple and easy, and the subsequent mass production maintenance is facilitated.
Example two
Referring to fig. 3, fig. 3 is a schematic flowchart illustrating a method for testing a radio frequency chip according to an embodiment of the present disclosure;
the test method for the radio frequency chip is applied to the test system for the radio frequency chip of the above embodiment, and the main execution body of the test method for the radio frequency chip is a test machine, and specifically, the main execution body of the test method for the radio frequency chip is one or more processors of the test machine, where the test machine includes an ATE test machine.
As shown in fig. 3, the method for testing the rf chip includes:
step S301: receiving a test instruction;
specifically, the test machine receives the test instruction that the host computer sent, wherein, the host computer includes fixed terminal or mobile terminal, for example: smart mobile phone, computer or panel computer, host computer and test board communicate through fixed protocol, for example: the fixed protocol comprises a USB protocol, a serial communication protocol and a serial communication protocol. In the embodiment of the present application, the test instruction includes a transmission performance test instruction and a reception performance test instruction.
Step S302: and testing one or more radio frequency chips on the test board according to the test instruction so as to determine the test result of the one or more radio frequency chips.
Specifically, according to the test instruction, testing one or more radio frequency chips on the test board to determine the test result of the one or more radio frequency chips includes:
if the test instruction is a transmission performance test instruction, the test machine configures the radio frequency chips, simultaneously sends an SCPI instruction to set a measurement environment, and performs transmission performance test on one or more radio frequency chips on the test board to determine the transmission performance test result of the one or more radio frequency chips;
if the test instruction is a reception performance test instruction, an SCPI instruction is sent through the test machine, carrier signals with different frequencies are set for different radio frequency chips according to the SCPI instruction, and the reception performance test is carried out on one or more radio frequency chips on the test board so as to determine the reception performance test result of the one or more radio frequency chips.
The SCPI command is a Programmable instrument Standard Command (SCPI), the Test machine includes Automatic Test Equipment (ATE), that is, an ATE Test machine, and the radio frequency instrument includes a PXI radio frequency instrument.
It is understood that the SCPI instruction includes: operating instructions, such as: set operation (on/off signal output) to change the operating state of the instrument, or a polling instruction, for example: query operation to query the state of the instrument (e.g., read the output voltage value). Where the query command typically ends with a question mark. Some commands can be used for setting and inquiring the state of the instrument.
When the transmission performance of the radio frequency chips is tested, the radio frequency output ports of the radio frequency chips are directly connected to the ports of the PXI radio frequency instrument which is used as the function of the frequency spectrograph through the radio frequency cables. When the ATE test machine is used for configuring the chips, the SCPI instruction is sent at the same time to set the measurement environment, and different emission signals of a plurality of tested radio frequency chips are directly and independently measured.
When the receiving performance of the radio frequency chips is tested, a plurality of radio frequency input ports of the radio frequency chips are directly connected to a port of a PXI radio frequency instrument serving as a signal source through a radio frequency cable. And sending an SCPI instruction to set carrier signals with different frequencies for different radio frequency chips through an ATE tester. Different radio frequency input ports of the same radio frequency chip can receive carrier signals at the same time by simultaneously configuring different PXI radio frequency instrument modules.
In this embodiment of the present application, in order to implement stable communication between the radio frequency instrument and the test machine, the test method of the radio frequency chip further includes:
based on a test software environment, a VISA library is integrated into a test program, wherein communication between a test machine and a radio frequency instrument is realized, and an SCPI instruction is a communication language between the test machine and the radio frequency instrument, so that the test machine is used for informing the radio frequency instrument of measuring the radio frequency output of a radio frequency chip, or informing the radio frequency instrument of modifying other parameters.
In the embodiment of the application, the mature software development platform based on the ATE test machine integrates the VISA library into the software environment, so that the stability of the test result is ensured no matter whether the chip is configured or the PXI radio frequency instrument is driven for testing. Meanwhile, the PXI instrument can be matched with various standard ATE test machines (such as Teradyne J750 or Advantest 93K and other general ATE with large global machine loading), and a user can flexibly select the brand and the model of the ATE by combining various factors such as quality, cost and capacity, so that the test flexibility is improved.
In this embodiment, the method for testing the radio frequency chip further includes:
different PXI radio frequency instrument modules are configured for different radio frequency input ports of the same radio frequency chip, so that the different radio frequency input ports of the same radio frequency chip can receive carrier signals simultaneously.
In this embodiment, the method for testing the radio frequency chip further includes: and feeding back the transmitting performance test result of one or more radio frequency chips and/or the receiving performance test result of one or more radio frequency chips to the upper computer.
In the embodiment of the application, one or more radio frequency chips on the test board are tested in parallel to determine the test result of the one or more radio frequency chips, so that the one or more radio frequency chips can be tested in parallel, and the test efficiency is improved.
EXAMPLE III
Referring to fig. 4 again, fig. 4 is a schematic diagram of a hardware structure of a testing machine according to an embodiment of the present disclosure.
As shown in fig. 4, the testing machine 40 includes one or more processors 401 and a memory 402. In fig. 4, one processor 401 is taken as an example.
The processor 401 and the memory 402 may be connected by a bus or other means, such as the bus connection in fig. 4.
The processor 401 is configured to provide computing and control capabilities to control the testing machine 40 to perform corresponding tasks, for example, to control the testing machine 40 to perform a method for testing the rf chip in any of the above method embodiments, including: receiving a test instruction; and testing one or more radio frequency chips on the test board according to the test instruction so as to determine the test result of the one or more radio frequency chips. The test efficiency can be improved by performing parallel test on one or more radio frequency chips on the test board to determine the test result of one or more radio frequency chips.
The memory 402, which is a non-transitory computer readable storage medium, can be used to store non-transitory software programs, non-transitory computer executable programs, and modules, such as program instructions/modules corresponding to the testing method of the rf chip in the embodiment of the present application. The processor 401 may implement the method for testing the rf chip in any of the method embodiments described below by running non-transitory software programs, instructions, and modules stored in the memory 402. Specifically, the Memory 402 may include a Volatile Memory (VM), such as a Random Access Memory (RAM), wherein the RAM includes Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), Phase Change Random Access Memory (PRAM), and the like; the memory 402 may also include a non-volatile memory (NVM), such as: read-only memory (ROM), Flash memory (Flash memory), Hard Disk Drive (HDD) or Solid State Drive (SSD), embedded multimedia memory Card (eMMC), embedded Multi-Chip Package (eMCP), Universal Flash Storage (UFS) or other non-transitory Solid State memory device; the memory 402 may also comprise a combination of memories of the kind described above.
The memory 402 may include high speed random access memory and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid state storage device. In some embodiments, memory 402 may optionally include memory located remotely from processor 401, which may be connected to processor 401 via a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
One or more modules are stored in the memory 402 and when executed by the one or more processors 401, perform the method for testing the rf chip in any of the method embodiments described above, e.g., perform the steps illustrated in fig. 3 described above.
In this embodiment, the testing machine 40 may further include a wired or wireless network interface, a keyboard, an input/output interface, and other components to facilitate input and output, and the testing machine 40 may further include other components for implementing functions of the device, which is not described herein again.
The robot of the embodiment of the present application exists in various forms, including but not limited to, when performing the above-described steps shown in fig. 3: ATE tester, semiconductor chip tester, etc.
Embodiments of the present application further provide a computer-readable storage medium, such as a memory, including a program code, which is executable by a processor to perform the method for testing the rf chip in the above embodiments. For example, the computer-readable storage medium may be a Read-Only Memory (ROM), a Random Access Memory (RAM), a Compact Disc Read-Only Memory (CDROM), a magnetic tape, a floppy disk, an optical data storage device, and the like.
Embodiments of the present application also provide a computer program product including one or more program codes stored in a computer readable storage medium. The processor of the electronic device reads the program code from the computer-readable storage medium, and the processor executes the program code to perform the method steps of the test method for the radio frequency chip provided in the above embodiments.
It will be understood by those skilled in the art that all or part of the steps for implementing the above embodiments may be implemented by hardware, or may be implemented by hardware associated with program code, and the program may be stored in a computer readable storage medium, where the above mentioned storage medium may be a read-only memory, a magnetic or optical disk, etc.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a general hardware platform, and certainly can also be implemented by hardware. It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware related to instructions of a computer program, which can be stored in a computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. The storage medium may be a magnetic disk, an optical disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), or the like.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; within the context of the present application, features from the above embodiments or from different embodiments may also be combined, steps may be implemented in any order, and there are many other variations of the different aspects of the present application as described above, which are not provided in detail for the sake of brevity; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present application.
Claims (10)
1. A system for testing a radio frequency chip, comprising:
testing the machine table;
the test board is connected with the test machine platform and the radio frequency instrument and used for placing one or more radio frequency chips;
the radio frequency instrument is connected with the test board and comprises a plurality of radio frequency test ports, and the radio frequency test ports are respectively connected with the radio frequency input port and/or the radio frequency output port of each radio frequency chip so as to test one or more radio frequency chips in parallel.
2. The system of claim 1, wherein the radio frequency test port comprises:
the signal receiving port is used for receiving transmitting signals sent by one or more radio frequency chips, wherein each radio frequency output port of the radio frequency chips corresponds to one signal receiving port;
and the signal transmitting port is used for transmitting carrier signals to one or more radio frequency chips, wherein each radio frequency input port of the radio frequency chip corresponds to one signal transmitting port.
3. The system according to claim 1, wherein the rf input port and/or the rf output port of each rf chip is connected to the rf transmitting port and/or the rf receiving port of the corresponding rf meter through the test board, wherein the number of the rf output ports and/or the rf input ports of the rf chips is not greater than the number of the ports of the rf meter.
4. The system of claim 2, wherein the rf test port comprises a plurality of signal receiving ports, and each signal receiving port is connected to an rf output port of one of the rf chips.
5. The system of claim 2,
the signal receiving port is connected with a radio frequency output port of the radio frequency chip through a radio frequency cable;
the signal transmitting port is connected with a radio frequency input port of the radio frequency chip through a radio frequency cable.
6. The system of claim 5, wherein the radio frequency cable comprises a coaxial radio frequency cable.
7. The system of claim 1,
the test board is connected with the test board through a spring pin, and the test board is used for supplying power to at least one radio frequency chip in the test board and acquiring an output result of the at least one radio frequency chip;
the test machine is connected with the radio frequency instrument through a network cable and used for driving the radio frequency instrument so as to complete input and sampling of radio frequency signals.
8. The system of any of claims 1-7, wherein the tester platform comprises an ATE tester platform and the radio frequency instrumentation comprises PXI radio frequency instrumentation.
9. A method for testing a radio frequency chip, which is applied to a system for testing a radio frequency chip according to any one of claims 1 to 8, the method comprising:
receiving a test instruction;
and according to the test instruction, performing parallel test on one or more radio frequency chips on the test board to determine the test result of the one or more radio frequency chips.
10. The method of claim 9, wherein the test instructions include a transmission performance test instruction and a reception performance test instruction, and the performing a parallel test on one or more rf chips on the test board according to the test instructions to determine a test result of the one or more rf chips comprises:
if the test instruction is a transmission performance test instruction, the test machine configures the radio frequency chips, simultaneously sends an SCPI instruction to set a measurement environment, and performs transmission performance test on one or more radio frequency chips on the test board to determine the transmission performance test result of the one or more radio frequency chips;
if the test instruction is a reception performance test instruction, sending an SCPI instruction through the test machine, setting carrier signals with different frequencies for different radio frequency chips according to the SCPI instruction, and performing reception performance test on one or more radio frequency chips on the test board to determine the reception performance test result of the one or more radio frequency chips.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111666317.5A CN114325337A (en) | 2021-12-31 | 2021-12-31 | Test system and test method of radio frequency chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111666317.5A CN114325337A (en) | 2021-12-31 | 2021-12-31 | Test system and test method of radio frequency chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114325337A true CN114325337A (en) | 2022-04-12 |
Family
ID=81021560
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111666317.5A Pending CN114325337A (en) | 2021-12-31 | 2021-12-31 | Test system and test method of radio frequency chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114325337A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115656788A (en) * | 2022-12-23 | 2023-01-31 | 南京芯驰半导体科技有限公司 | Chip testing system, method, equipment and storage medium |
| CN117540493A (en) * | 2024-01-09 | 2024-02-09 | 天目山实验室 | Protection-bearing integrated optimization design method for aircraft protection structure |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107547144A (en) * | 2016-06-27 | 2018-01-05 | 中兴通讯股份有限公司 | Radio frequency test system |
| CN208013366U (en) * | 2018-01-11 | 2018-10-26 | 航天科工防御技术研究试验中心 | A kind of RF IC automatic testing equipment |
| CN110138465A (en) * | 2019-06-04 | 2019-08-16 | 山东华翼微电子技术股份有限公司 | A kind of non-contact card apparatus for testing chip, test method and non-contact card chip |
| CN111426940A (en) * | 2020-04-17 | 2020-07-17 | 矽典微电子(上海)有限公司 | Test system of radar chip |
| US20200302132A1 (en) * | 2019-03-20 | 2020-09-24 | International Business Machines Corporation | Radio frequency identification interface for interacting with a printed circuit board |
| CN112988489A (en) * | 2021-04-20 | 2021-06-18 | 易兆微电子(杭州)股份有限公司 | Method, device, equipment and storage medium for testing radio frequency chip |
-
2021
- 2021-12-31 CN CN202111666317.5A patent/CN114325337A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107547144A (en) * | 2016-06-27 | 2018-01-05 | 中兴通讯股份有限公司 | Radio frequency test system |
| CN208013366U (en) * | 2018-01-11 | 2018-10-26 | 航天科工防御技术研究试验中心 | A kind of RF IC automatic testing equipment |
| US20200302132A1 (en) * | 2019-03-20 | 2020-09-24 | International Business Machines Corporation | Radio frequency identification interface for interacting with a printed circuit board |
| CN110138465A (en) * | 2019-06-04 | 2019-08-16 | 山东华翼微电子技术股份有限公司 | A kind of non-contact card apparatus for testing chip, test method and non-contact card chip |
| CN111426940A (en) * | 2020-04-17 | 2020-07-17 | 矽典微电子(上海)有限公司 | Test system of radar chip |
| CN112988489A (en) * | 2021-04-20 | 2021-06-18 | 易兆微电子(杭州)股份有限公司 | Method, device, equipment and storage medium for testing radio frequency chip |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115656788A (en) * | 2022-12-23 | 2023-01-31 | 南京芯驰半导体科技有限公司 | Chip testing system, method, equipment and storage medium |
| CN117540493A (en) * | 2024-01-09 | 2024-02-09 | 天目山实验室 | Protection-bearing integrated optimization design method for aircraft protection structure |
| CN117540493B (en) * | 2024-01-09 | 2024-04-12 | 天目山实验室 | Protection-bearing integrated optimization design method for aircraft protection structure |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111426940B (en) | Test system of radar chip | |
| CN114325337A (en) | Test system and test method of radio frequency chip | |
| KR101970290B1 (en) | Test instrument having a configurable interface | |
| US20170163358A1 (en) | Front end module for automatic test equipment | |
| CN114325340B (en) | Test system and test method of radio frequency chip | |
| CN111432425B (en) | Test system and test method for network mode optimization of 3G/4G router | |
| CN106646053A (en) | Antenna testing device and method for batch production WiFi/Bluetooth products | |
| CN104754093A (en) | Test device, system and method | |
| CN111934788A (en) | Radio frequency index testing method and system of head-mounted equipment and related components | |
| CN110609183A (en) | IVI technology-based identification module and automatic test system of complete machine | |
| CN115291085A (en) | System and method for testing radio frequency packaged chip | |
| CN104780002A (en) | Miniaturized OTA testing system with multiple probes | |
| CN109581172A (en) | A kind of semiconductor devices RF index final test system and method | |
| CN112988489A (en) | Method, device, equipment and storage medium for testing radio frequency chip | |
| CN204578541U (en) | A kind of miniaturized OTA test macro with multiple probe | |
| CN105425060B (en) | A kind of interference detection method and detecting system of antenna coupling | |
| CN107707315B (en) | Wireless product edge signal measurement method based on IQxel | |
| CN116413533A (en) | Automatic line loss calibration method applied to module test fixture | |
| US9983258B2 (en) | ATE digital channel for RF frequency/power measurement | |
| CN113341300B (en) | Matrix key circuit automatic detection method, device, medium and equipment | |
| CN112737706B (en) | Test fixture radio frequency calibration system and method | |
| CN210075247U (en) | Power calibration device of radio frequency equipment | |
| CN114461558A (en) | Communication method and device for improving communication efficiency of ATE (automatic test equipment) and test machine system | |
| CN114050878A (en) | Method and device for automatically testing stray suppression of multi-channel radio frequency system | |
| CN209545600U (en) | Wireless communication module fixture line loss test macro |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |